CN102347201A - Mansard ion source - Google Patents

Mansard ion source Download PDF

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Publication number
CN102347201A
CN102347201A CN2010102441104A CN201010244110A CN102347201A CN 102347201 A CN102347201 A CN 102347201A CN 2010102441104 A CN2010102441104 A CN 2010102441104A CN 201010244110 A CN201010244110 A CN 201010244110A CN 102347201 A CN102347201 A CN 102347201A
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CN
China
Prior art keywords
ion
ion source
bending part
micropore
angle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2010102441104A
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Chinese (zh)
Inventor
刘召贵
周春彗
潘翔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jiangsu Skyray Instrument Co Ltd
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Jiangsu Skyray Instrument Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Jiangsu Skyray Instrument Co Ltd filed Critical Jiangsu Skyray Instrument Co Ltd
Priority to CN2010102441104A priority Critical patent/CN102347201A/en
Publication of CN102347201A publication Critical patent/CN102347201A/en
Pending legal-status Critical Current

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Abstract

The invention discloses a mansard ion source, which comprises an ion source body, wherein an ion micropore channel is formed on the ion source body; the ion micropore channel comprises a first bending part and a second bending part; preferably, the ion micropore channel also comprises a third bending part. The mechanism of the invention is easy and convenient to manufacture and low in cost; furthermore, gas subjected to ionizing is transmitted through the bent ion micropore channel, a micropore cannot be blocked by deposited salt; therefore, the micropore is effectively prevented from being blocked by dirt.

Description

Broken line shape ion source
Technical field
The present invention relates to the mass spectrometer field, the concrete micro channel structure that relates to a kind of mass spectrometer ion source.
Background technology
Mass spectrometer is a kind of high sensitivity of detection material chemical composition, high-resolution instrument of being used for; It at first becomes gas ion with sample changeover; Through electric field or magnetic field ion is separated according to the size of mass-to-charge ratio (m/z) then; The intensity of measuring ion again forms mass spectrogram, according to mass spectrogram can be qualitative or quantitative obtain the material chemical composition.
Electrospray ionization source (ESI) is a kind of of mass spectrometer intermediate ion source, and ESI is made up of capillary (spray needle), high voltage source, the reverse electrode of working fluid sample, through cation and the anion of high voltage electric field in can separation solution; For example under positive ion mode, the relative reverse electrode of the spray needle of electron spray keeps very high positive potential, and negatively charged ions attracted to the other end of pin; Assembling a large amount of positive charge ions at semi-moon shaped liquid surface, repelling each other between them, and expanding away from the liquid surface of needle point; Liquid surface is tapered, is called Taylor awl, along with the drop at needle point place diminishes; Electric field strength strengthens gradually, and superfluous electric charge overcomes surface tension and forms very thin droplet, and finally the tip from the Taylor awl sputters out; The solvent of droplet evaporates gradually; Cracking takes place in electrical charge rejection power greater than surface tension, through repeatedly cracking, produced ion.Be electrophoresis process on the electron spray process nature.
In the electric spray ion source design in early days, after the sample ionsization, ion enters into vacuum chamber through a micropore, all is that the high temperature gas flow straight line that is being mingled with ion sprays into generally.That is to say that ion sprays facing to the micropore straight line.Yet in general sample more or less exist salinity, in fact, in some cases, in order to increase conductivity, can be autotelic in the solution the different types of salt of adding.These salt can be along with under the solution deposition that cools down in ionization process, and after the solvent evaporation in the solution, these salt branches are attached to the parts surface between ion source and the vacuum chamber.
So, when ion sprays facing to micropore, part solution can be deposited on micropore and near, like this after solution evaporates, slowly blocking microporous of the salt branch of separating out.The consequence that causes is exactly the performance of instrument, and especially signal strength signal intensity can step-down.Serious situation even can be blocking microporous causes not having fully signal, the instrument cisco unity malfunction.
Need the user of instrument to stop vacuum pump and clean micropore, clean micropore, restart vacuum pump again, also will retune at last.So just cause the service efficiency of instrument to reduce greatly.Under so a kind of situation, how to avoid that salinity is blocking microporous to have become the solution key of problem.
Summary of the invention
In order to overcome the deficiency of prior art, the object of the present invention is to provide a kind of broken line shape ion source, this ion source can effectively be avoided the micropore blocking problem.
For solving the problems of the technologies described above, realize above-mentioned technique effect, the present invention adopts following technical scheme:
A kind of broken line shape ion source comprises an ion source body, has the ion micro channel on the said ion source body, and said ion micro channel comprises first bending part and second bending part.
Preferably, said ion micro channel also comprises the 3rd bending part.
Further, the angle between said first bending part and said second bending part is an acute angle.
Preferably, the angle between said first bending part and said second bending part is 60 °.
Further, have two ion micro channels 2 on the said ion source body.
Further, the angle between said first bending part and the said ion source body is an acute angle.
Preferably, the angle between said first bending part and the said ion source body is 30 °.
Further, the angle between said second bending part and said the 3rd bending part is 90 °.
The present invention has following advantage:
Mechanism of the present invention makes simple and convenient, and is with low cost, and after the ion micro channel transmission of ionized gas through bending, the deposition of salinity just can not blocked micropore, thereby has effectively avoided foul blocking microporous.
Description of drawings
Fig. 1 is the structural representation of one embodiment of the invention.
Fig. 2 is the structural representation of another embodiment of the present invention.
Label declaration among the figure: 1. ion source body, 2. ion micro channel, 201. first bending parts, 202. second bending parts, 203. the 3rd bending parts.
Embodiment
Below in conjunction with accompanying drawing, the preferred embodiments of the present invention are carried out detailed introduction.
Embodiment 1:
See also shown in Figure 1ly, a kind of broken line shape ion source comprises an ion source body 1, has ion micro channel 2 on the said ion source body 1, and said ion micro channel 2 comprises first bending part 201 and second bending part 202.
Further, the angle between said first bending part 201 and said second bending part 202 is an acute angle.
Preferably, the angle between said first bending part 201 and said second bending part 202 is 60 °.
Further, have two ion micro channels 2 on the said ion source body 1.
Embodiment 2:
Referring to shown in Figure 2, a kind of broken line shape ion source comprises an ion source body 1, has ion micro channel 2 on the said ion source body 1, and said ion micro channel 2 comprises first bending part 201 and second bending part 202.
Preferably, said ion micro channel 2 also comprises the 3rd bending part 203.
Further, the angle between said first bending part 201 and the said ion source body 1 is an acute angle.
Preferably, the angle between said first bending part 201 and the said ion source body 1 is 30 °.
Further, the angle between said second bending part 202 and said the 3rd bending part 203 is 90 °.
More than the broken line shape ion source that the embodiment of the invention provided has been carried out detailed introduction; For one of ordinary skill in the art; Thought according to the embodiment of the invention; The part that on embodiment and range of application, all can change, therefore all any changes of making according to design philosophy of the present invention are all within protection scope of the present invention.

Claims (8)

1. a broken line shape ion source comprises an ion source body (1), has ion micro channel (2) on the said ion source body (1), it is characterized in that: said ion micro channel (2) comprises first bending part (201) and second bending part (202).
2. broken line shape ion source according to claim 1 is characterized in that: said ion micro channel (2) also comprises the 3rd bending part (203).
3. broken line shape ion source according to claim 1 is characterized in that: the angle between said first bending part (201) and said second bending part (202) is an acute angle.
4. according to claim 1 or 3 described broken line shape ion sources, it is characterized in that: the angle between said first bending part (201) and said second bending part (202) is 60 °.
5. broken line shape ion source according to claim 1 is characterized in that: have two ion micro channels (2) on the said ion source body (1).
6. broken line shape ion source according to claim 2 is characterized in that: the angle between said first bending part (201) and the said ion source body (1) is an acute angle.
7. according to claim 2 or 6 described broken line shape ion sources, it is characterized in that: the angle between said first bending part (201) and the said ion source body (1) is 30 °.
8. broken line shape ion source according to claim 2 is characterized in that: the angle between said second bending part (202) and said the 3rd bending part (203) is 90 °.
CN2010102441104A 2010-08-04 2010-08-04 Mansard ion source Pending CN102347201A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2010102441104A CN102347201A (en) 2010-08-04 2010-08-04 Mansard ion source

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2010102441104A CN102347201A (en) 2010-08-04 2010-08-04 Mansard ion source

Publications (1)

Publication Number Publication Date
CN102347201A true CN102347201A (en) 2012-02-08

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN2010102441104A Pending CN102347201A (en) 2010-08-04 2010-08-04 Mansard ion source

Country Status (1)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2195138Y (en) * 1994-08-24 1995-04-19 东南大学 Enclosed gas discharge ion source for mass spectrograph
US20040011951A1 (en) * 2000-07-26 2004-01-22 Roger Giles Multi-inlet mass spectrometer
CN101432840A (en) * 2006-04-28 2009-05-13 应用材料股份有限公司 Front plate for an ion source
CN201788940U (en) * 2010-08-04 2011-04-06 江苏天瑞仪器股份有限公司 Fold-line-shaped ion source

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2195138Y (en) * 1994-08-24 1995-04-19 东南大学 Enclosed gas discharge ion source for mass spectrograph
US20040011951A1 (en) * 2000-07-26 2004-01-22 Roger Giles Multi-inlet mass spectrometer
CN101432840A (en) * 2006-04-28 2009-05-13 应用材料股份有限公司 Front plate for an ion source
CN201788940U (en) * 2010-08-04 2011-04-06 江苏天瑞仪器股份有限公司 Fold-line-shaped ion source

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Application publication date: 20120208