CN102345158A - Pulling method of mono-crystalline crystal bar for improving COP (Coefficient Of Performance) - Google Patents

Pulling method of mono-crystalline crystal bar for improving COP (Coefficient Of Performance) Download PDF

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Publication number
CN102345158A
CN102345158A CN2011102319253A CN201110231925A CN102345158A CN 102345158 A CN102345158 A CN 102345158A CN 2011102319253 A CN2011102319253 A CN 2011102319253A CN 201110231925 A CN201110231925 A CN 201110231925A CN 102345158 A CN102345158 A CN 102345158A
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China
Prior art keywords
crystal bar
cop
quartz crucible
mono
heat
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CN2011102319253A
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Chinese (zh)
Inventor
韩建超
尚海波
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SHANGHAI HEJING SILICON MATERIAL CO Ltd
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SHANGHAI HEJING SILICON MATERIAL CO Ltd
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Priority to CN2011102319253A priority Critical patent/CN102345158A/en
Publication of CN102345158A publication Critical patent/CN102345158A/en
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Abstract

The invention discloses a pulling method of a mono-crystalline crystal bar for improving COP (Coefficient Of Performance). The method comprises the following steps of: fusing silicon in a quartz crucible; pulling a mono-crystalline crystal bar by using seed crystal; arranging an upper thermal insulation cylinder and a lower thermal insulation cylinder around the quartz crucible; arranging a flow guide cylinder above the quartz crucible, wherein the upper thermal insulation cylinder is provided with 1-7 carbon felt layers. By adopting the pulling method of the mono-crystalline crystal bar, the COP in the crystal bar can be improved, the reject ratio of the crystal bar is reduced, and the production cost is saved.

Description

Improve the monocrystalline crystal bar drawing method of COP
Technical field
The present invention relates to the monocrystalline crystal bar drawing method of a kind of COP of improvement.
Background technology
Crystalline primary partical defective COP is the important factor that influences the silicon chip quality.Different according to the specification of particle, the silicon chip quality can be divided into third gear, first grade is that particle more than or equal to 0.2um is less than 15; Second grade is less than 5 more than or equal to the 0.3um particle; Third gear is less than 10 more than or equal to 0.3um.Along with progressively raising to the silicon chip specification of quality, require to weigh silicon chip and all should meet above-mentioned requirements according to each grade standard, and crystal bar along its length each section all should meet the requirements.During existing drawing method crystal pulling, COP is higher, causes the crystal bar fraction defective high, has increased production cost.
Summary of the invention
The objective of the invention is in order to overcome deficiency of the prior art, the monocrystalline crystal bar drawing method of a kind of COP of improvement is provided.
For realizing above purpose, the present invention realizes through following technical scheme:
Improve the monocrystalline crystal bar drawing method of COP, molten silicon in quartz crucible utilizes seed crystal pulling monocrystal crystal bar; Be provided with heat-preservation cylinder and following heat-preservation cylinder around quartz crucible; Described quartz crucible top is provided with guide shell, it is characterized in that last heat-preservation cylinder is provided with layer 1-7 carbon felt.
Preferably, said heat-preservation cylinder down comprises insulation inner core and following insulation urceolus down; The said urceolus of insulation down is a curing carbon fiber.
Preferably, described guide shell is double-deck barrel.
Preferably, between the described double-deck barrel with air communication.
The method of the pulling monocrystal crystal bar among the present invention can be improved the COP in the crystal bar, has reduced the fraction defective of crystal bar, saves production cost.
Description of drawings
The axial sectional view of crystal bar drawing device that Fig. 1 uses for the present invention.
Embodiment
Below in conjunction with accompanying drawing the present invention is carried out detailed description:
The comparative example 1:
Use existing heat-preservation cylinder, heat-preservation cylinder is curing carbon fiber from top to bottom.Guide shell adopts one deck barrel.
Like the device of Fig. 1 for the pulling monocrystal that uses among the present invention.As shown in Figure 1, be provided with heat-preservation cylinder in the stove tube 1.Heat-preservation cylinder comprises heat-preservation cylinder 21 and following heat-preservation cylinder 22.Last heat-preservation cylinder 21 outer walls are surrounded by the carbon felt, and every layer of carbon felt thickness is 6.38mm.Guide shell 3 adopts the two layered cylinder wall construction, is in communication with the outside between the double-deck barrel.
According to the listed processing parameter pulling monocrystal crystal bar of table 1.
Table 1
Figure BDA0000083082530000031
Draw crystal bar when last heat-preservation cylinder carbon carpet veneer number is respectively 1 layer, 3 layers and 5 layers, every crystal bar is divided into isometric 2 sections from head end to tail end, be machined to polished section after, with AWIS3100 measure CO P.Do not consider the influence of LPD in the data analysis.Test COP average data is as shown in table 2.Per-cent in table 2 and the table 3 is meant: the per-cent of COP in all COP of different sizes.
Table 2
Figure BDA0000083082530000032
Can find out that from table 2 behind the minimizing carbon felt number, crystal bar COP makes moderate progress.
The crystal bar COP that uses individual layer guide shell and double-deck guide shell to produce is divided into two sections from head end to tail end, and test its fraction defective data to such as table 3: two kinds of production equipments of following data test are except that guide shell barrel number of plies difference, and all the other parameters are all identical.
Can find out from table 3, compare with the individual layer guide shell that double-deck guide shell COP fraction defective is low, especially second section monocrystalline COP fraction defective will be well below the individual layer guide shell.
Embodiment among the present invention only is used for that the present invention will be described, does not constitute the restriction to the claim scope, and other substituting of being equal in fact that those skilled in that art can expect are all in protection domain of the present invention.

Claims (4)

1. improve the monocrystalline crystal bar drawing method of COP, molten silicon in quartz crucible utilizes seed crystal pulling monocrystal crystal bar; Be provided with heat-preservation cylinder and following heat-preservation cylinder around quartz crucible; Described quartz crucible top is provided with guide shell, it is characterized in that last heat-preservation cylinder is provided with layer 1-7 carbon felt.
2. the monocrystalline crystal bar drawing method that improves COP according to claim 1 is characterized in that, said heat-preservation cylinder down comprises insulation inner core and following insulation urceolus down; The said urceolus of insulation down is a curing carbon fiber.
3. the monocrystalline crystal bar drawing method that improves COP according to claim 1 is characterized in that described guide shell is double-deck barrel.
4. the monocrystalline crystal bar drawing method that improves COP according to claim 2 is characterized in that, between the described double-deck barrel with air communication.
CN2011102319253A 2011-08-14 2011-08-14 Pulling method of mono-crystalline crystal bar for improving COP (Coefficient Of Performance) Pending CN102345158A (en)

Priority Applications (1)

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CN2011102319253A CN102345158A (en) 2011-08-14 2011-08-14 Pulling method of mono-crystalline crystal bar for improving COP (Coefficient Of Performance)

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Application Number Priority Date Filing Date Title
CN2011102319253A CN102345158A (en) 2011-08-14 2011-08-14 Pulling method of mono-crystalline crystal bar for improving COP (Coefficient Of Performance)

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CN102345158A true CN102345158A (en) 2012-02-08

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201058893Y (en) * 2007-07-19 2008-05-14 任丙彦 Device for growing gallium-doped silicon monocrystal by czochralski method
CN201793810U (en) * 2010-09-30 2011-04-13 常州天合光能有限公司 Flow guide tube of direct pulling single crystal furnace
CN201908152U (en) * 2010-12-08 2011-07-27 宁晋晶兴电子材料有限公司 Improved straight pulling single crystal furnace
CN102212875A (en) * 2011-06-03 2011-10-12 无锡中能晶科光电科技股份有限公司 Thermal field system of silicon single crystal furnace
CN102400210A (en) * 2010-09-08 2012-04-04 北京有色金属研究总院 Method for adjusting defects in Czochralski silicon single crystal

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201058893Y (en) * 2007-07-19 2008-05-14 任丙彦 Device for growing gallium-doped silicon monocrystal by czochralski method
CN102400210A (en) * 2010-09-08 2012-04-04 北京有色金属研究总院 Method for adjusting defects in Czochralski silicon single crystal
CN201793810U (en) * 2010-09-30 2011-04-13 常州天合光能有限公司 Flow guide tube of direct pulling single crystal furnace
CN201908152U (en) * 2010-12-08 2011-07-27 宁晋晶兴电子材料有限公司 Improved straight pulling single crystal furnace
CN102212875A (en) * 2011-06-03 2011-10-12 无锡中能晶科光电科技股份有限公司 Thermal field system of silicon single crystal furnace

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Application publication date: 20120208