CN102331615A - Optical system for detecting thickness of transparent material - Google Patents
Optical system for detecting thickness of transparent material Download PDFInfo
- Publication number
- CN102331615A CN102331615A CN2010102244869A CN201010224486A CN102331615A CN 102331615 A CN102331615 A CN 102331615A CN 2010102244869 A CN2010102244869 A CN 2010102244869A CN 201010224486 A CN201010224486 A CN 201010224486A CN 102331615 A CN102331615 A CN 102331615A
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- Prior art keywords
- lens
- optical system
- transparent material
- material thickness
- detection
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Abstract
The invention discloses an optical system for detecting the thickness of a transparent material, which can be used for detecting the transparent material with the thickness in the range of 0.02mm to 11mm. The optical system comprises three lenses. A first lens is a negative lens. A second lens is a positive lens. A third lens is a positive lens. The lenses are made of the same materials. The rear surface of the third lens is designed into an aspheric surface.
Description
[technical field]
The present invention relates to a kind of optical system that transparent material thickness detects that is used for, refer to a kind of optical system of utilizing the transparent material thickness detection of confocal principle especially.
[background technology]
In recent years, the fast development of pharmaceuticals industry, the demand of small-sized glass container increases rapidly, because domestic enterprise's production technology and equipment are backward relatively, it is bigger that its quality and developed country like product are compared gap, has a strong impact on high-end product production.Glass container wall thickness, shoulder curvature, container port size are the key character parameters that directly influences container mass.So in the glass container production run, these important parameters must detect.Have high temperature, red heat in the glass container production, fragility is big and is difficult for the characteristics that the employing contact method is measured, must adopt the noncontact online measuring technique to realize the measurement of each parameter.
At present, adopt contact type measurement mostly,, very easily scratch device, cause economic loss, and speed is slow, have no idea to carry out on-line measurement though precision is high for the detection of transparent material thickness.For the glass material that under high temperature, red heat environment, carries out production and processing, have no idea at all to accomplish that real time and on line monitoring detects.
In the non-contact detecting of some transparent materials, more commonly use imaging method and laser scanning method, the system architecture more complicated causes source of error more, and measuring speed is slower, is difficult to effectively improve measure quality.
[summary of the invention]
The object of the invention is to provide a kind of optical system that transparent material thickness detects that is used for, and it is not only simple in structure, and source of error is few, and precision is high, and measuring speed is fast, and measurement range is bigger.
According to above-mentioned purpose of the present invention, the present invention provides a kind of and is used for the optical system that transparent material thickness detects, and the light of each wavelength at the disc of confusion diameter of image planes imaging all less than 0.095mm.This optical system is made up of three lens, and wherein first lens are negative lenses, and second lens are positive lenss, and the 3rd lens are positive lenss, and the material that these lens adopt is identical.
A back face of the 3rd lens of above-mentioned optical system has been designed to aspheric surface.
The material refractive index that three lens of above-mentioned optical system adopt is identical, is 1.81.
Compared to prior art, the present invention is used for the shape of optical system through rationally utilizing material and distributing eyeglass that transparent material thickness detects, and can reduce the aberration of system, improves measuring accuracy.
[description of drawings]
Fig. 1 originally is used for the optical system configuration composition that transparent material thickness detects.
[embodiment]
The optical system that is used for the detection of transparent material thickness of the present invention adopts white light incident, and behind photosystem, the light of different wave length converges in the difference of optical axis, and this scope is measurement range.The measurement range that is used for the optical system of transparent material thickness detection of the present invention can reach 11.8mm, and the light of each wavelength is 0.019mm-0.095mm at the diameter of the disc of confusion that image planes formed images, and conjugate distance is from being 170mm.
Above-mentioned optical system is made up of three lens, and wherein first lens 10 are negative lenses, and second lens 20 are positive lenss, and the 3rd lens 30 are positive lenss, and the glass material that these lens adopted is identical.Refractive index (Nd) is 1.8052.For aberration correction, be designed to aspheric surface to a back face of the 3rd lens, not only reduced the number of lens, also improved measuring accuracy.
Claims (5)
1. one kind is used for the optical system that transparent material thickness detects, and it can be promoted to micron order to measuring accuracy.This optical system mainly comprises three lens, it is characterized in that: system is made up of three lens, and first lens are negative lenses, and second lens are positive lenss, and the 3rd lens are positive lenss.
2. the optical system that is used for the detection of transparent material thickness as claimed in claim 1, it is characterized in that: a back face of the 3rd lens has been designed to aspheric surface.
3. the optical system that is used for the detection of transparent material thickness as claimed in claim 1, it is characterized in that: the refractive index of first lens is 1.81.
4. the optical system that is used for the detection of transparent material thickness as claimed in claim 1, it is characterized in that: the refractive index of second lens is 1.81.
5. the optical system that is used for the detection of transparent material thickness as claimed in claim 1, it is characterized in that: the refractive index of the 3rd lens is 1.81.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN2010102244869A CN102331615A (en) | 2010-07-13 | 2010-07-13 | Optical system for detecting thickness of transparent material |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2010102244869A CN102331615A (en) | 2010-07-13 | 2010-07-13 | Optical system for detecting thickness of transparent material |
Publications (1)
Publication Number | Publication Date |
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CN102331615A true CN102331615A (en) | 2012-01-25 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN2010102244869A Pending CN102331615A (en) | 2010-07-13 | 2010-07-13 | Optical system for detecting thickness of transparent material |
Country Status (1)
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CN (1) | CN102331615A (en) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006153851A (en) * | 2004-11-08 | 2006-06-15 | Matsushita Electric Ind Co Ltd | Confocal optical device and spherical aberration correcting method |
CN101762238A (en) * | 2010-01-25 | 2010-06-30 | 长春理工大学 | Thickness detection method and device for transparent material |
CN201811718U (en) * | 2010-07-13 | 2011-04-27 | 徐熙平 | Optical system for detecting thickness of glass |
-
2010
- 2010-07-13 CN CN2010102244869A patent/CN102331615A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006153851A (en) * | 2004-11-08 | 2006-06-15 | Matsushita Electric Ind Co Ltd | Confocal optical device and spherical aberration correcting method |
CN101762238A (en) * | 2010-01-25 | 2010-06-30 | 长春理工大学 | Thickness detection method and device for transparent material |
CN201811718U (en) * | 2010-07-13 | 2011-04-27 | 徐熙平 | Optical system for detecting thickness of glass |
Non-Patent Citations (2)
Title |
---|
BERTHOLD MICHELT等: "《玻璃容器厚度非接触检测》", 《玻璃与搪瓷》 * |
刘峰等: "《石英管壁厚光电检测技术研究》", 《长春理工大学学报(自然科学版)》 * |
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Addressee: Qiao Yang Document name: Notification to Make Rectification |
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Application publication date: 20120125 |