CN102297823B - Method and apparatus for measuring dynamic light scattering nano-particles based on bandpass filtering - Google Patents

Method and apparatus for measuring dynamic light scattering nano-particles based on bandpass filtering Download PDF

Info

Publication number
CN102297823B
CN102297823B CN 201110127051 CN201110127051A CN102297823B CN 102297823 B CN102297823 B CN 102297823B CN 201110127051 CN201110127051 CN 201110127051 CN 201110127051 A CN201110127051 A CN 201110127051A CN 102297823 B CN102297823 B CN 102297823B
Authority
CN
China
Prior art keywords
photodetector
laser
light
particle
laser instrument
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN 201110127051
Other languages
Chinese (zh)
Other versions
CN102297823A (en
Inventor
沈建琪
王华睿
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Shanghai for Science and Technology
Original Assignee
University of Shanghai for Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Shanghai for Science and Technology filed Critical University of Shanghai for Science and Technology
Priority to CN 201110127051 priority Critical patent/CN102297823B/en
Publication of CN102297823A publication Critical patent/CN102297823A/en
Application granted granted Critical
Publication of CN102297823B publication Critical patent/CN102297823B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Abstract

The invention discloses a method and an apparatus for measuring dynamic light scattering nano-particles based on bandpass filtering. According to the invention, lasers are radiated on nano-particles performing Brownian motions in a solution. The scattered lights of the particles are directly detected; or the scattered lights of the particles are interfered with part of the original lights, and are detected; or the scattered lights are fed-back into a laser-tube cavity, self mixing is occurred, and self mixing signals are detected. Signals output by a photoelectric detector are pre-amplified, and are simultaneously delivered into a circuit formed by components of an M route buffer, bandpass filters with different central frequencies, and an RMS root-mean-square processor, which are connected in series, such that signal root-mean-square values at different frequencies with a number of M are obtained. The values are sampled by an A/D collecting card, such that power spectrum density functions at different frequencies with a number of M are obtained. With the method and the apparatus provided by the invention, a problem in prior arts of poor robustness of inverse calculations caused by seriously ill-conditioned coefficient matrix is solved. With the method and the apparatus provided by the invention, requirements on data collecting speed, data collecting amount, storage amount and processing amount are reduced; data processing time is reduced; and rapid measuring of nano-particle sizes can be realized.

Description

Dynamic light scattering nano particle measuring method and device based on bandpass filtering
Technical field
The present invention relates to a kind of method and device of measuring nano particle, particularly a kind of dynamic light scattering nano particle measuring method and device based on bandpass filtering belong to field of measuring technique.Can be used for a plurality of fields that scientific research, biological medicine, the chemical industry energy, environmental protection etc. relate to nano particle production and process control.
Background technology
In dynamic light scattering nano particle measuring technique, general adopt digital correlator to obtain the autocorrelation function of scattered light signal or utilize the Power Spectrum Estimation Method to obtain the power spectral density function of scattered light signal, obtain thus the particle diameter distribution parameter of nano particle by inverse matrix.
The laser that laser instrument sends is formed on the nano particle that shines after the converging light in the solution by single or multiple lens combinations scattering occurs, and has comprised the particle diameter information of particle in the scattered light signal.
The detection of scattered light signal generally has three kinds of modes: one. after assembling, direct detection scattered light signal or process lens survey; Two. survey behind the part laser interference that scattered light signal and light source are sent; Three. scattered light is fed back in the laser cavity with the output of endovenous laser generation self-mixing modulated laser and by the photodetector detection that is arranged on the laser instrument rear end.
The scattered light signal of particle to be measured is processed through correlator and is obtained autocorrelation function:
(1)
Corresponding power spectral density function is:
(2)
Wherein, jIt is grain diameter stepping number
Figure 2011101270517100002DEST_PATH_IMAGE006
, corresponding different particle diameter steppings,
Figure 2011101270517100002DEST_PATH_IMAGE008
It is particle diameter stepping sum; x j jShelves grain diameter mean value;
Figure 2011101270517100002DEST_PATH_IMAGE010
jThe stepping width of shelves particle diameter; For power spectral density function, iIt is frequency channel number
Figure 2011101270517100002DEST_PATH_IMAGE012
, corresponding different frequencies,
Figure 2011101270517100002DEST_PATH_IMAGE014
It is total number of channels; For autocorrelation function, iIt is stepping sequence number correlation time
Figure 279072DEST_PATH_IMAGE012
, corresponding different correlation time,
Figure 16083DEST_PATH_IMAGE014
It is sum correlation time; Adopt detection mode for the moment, have
Figure 2011101270517100002DEST_PATH_IMAGE016
Adopt detection mode two or at 3 o'clock, have
Figure 2011101270517100002DEST_PATH_IMAGE018
qIt is Scattering of Vector; D j jThe particle diffusivity of shelves particle diameter has comprised nano particle diameter x j Information; ω i Be and iThe angular frequency relevant with Brownian movement on the passage;
Figure 2011101270517100002DEST_PATH_IMAGE020
jThe distribution of particles function of shelves particle diameter.Matrix form can be write respectively as in formula (1) and (2):
Figure 2011101270517100002DEST_PATH_IMAGE022
(3)
(4)
Wherein RAutocorrelation function Distribution of A Sequence vector, SPower spectrum density Distribution of A Sequence vector, TThe matrix of coefficients that autocorrelation function distributes, KThe matrix of coefficients that power spectrum density distributes, HIt is the particle size distribution column vector.
In the conventional method, the obtaining of particle size distribution, or derive from the inverting of autocorrelation signal, or derive from the power spectrum signal retrieve.During inverting, matrix TOr
Figure DEST_PATH_IMAGE026
Calculated vector by theory according to definition in formula (1) or (2) ROr
Figure DEST_PATH_IMAGE028
Be measuring amount, select suitable inversion method, obtain vector Concrete numerical value.Yet the inverting that no matter is based on autocorrelation signal also is based on the inverting of power spectrum signal, and matrix of coefficients all is Very Ill-conditioned, and as shown in Figure 5, small measuring-signal error will cause huge particle diameter distribution bias, even obtains wrong particle diameter distribution.This has limited the confidence level of grain diameter.Secondly, the estimation of the digital correlator of the processing requirements costliness of autocorrelation signal, the power spectrum of dynamic scattering light needs higher data collecting card (A/D card) sampling rate, larger computer stored resource and certain CPU processing time, to cost control and measure in real time unfavorable.
Summary of the invention
The present invention seeks on conventional dynamic light scattering nano particle measuring principle basis, by the analog bandpass filtering technology, original theory and signal processing mode to be improved.Solve the difficulty of original theory model coefficient matrix Very Ill-conditioned, improved the robustness of Inversion Calculation.Avoid the use of digital correlator, reduced requirement, saving signal processing time to the data capture card, realized economy, Quick Measurement to grain graininess.
Technical scheme of the present invention is: a kind of dynamic light scattering nano particle measuring method based on band-pass filtering is characterized in that method step is:
1. on the nano particle of the Ear Mucosa Treated by He Ne Laser Irradiation that is sent by laser instrument in the solution, the scattered light of particle is directly surveyed by photodetector, or with the part interference of light of original laser after surveyed by photodetector, or be fed back in the laser cavity and survey with the output of endovenous laser generation self-mixing modulated laser and by the photodetector that is arranged on the laser instrument rear end;
2. the signal that is detected by photodetector walks abreast successively after prime amplifier amplifies and sends into the bandpass filter at M routing cache device, different frequency center and the circuit that RMS r.m.s. processor is in series, obtain the signal root-mean-square valve at M different frequency place, sampled by the A/D capture card, the final power spectral density function that obtains M different frequency place can be expressed as with theoretical formula:
Figure DEST_PATH_IMAGE032
Figure 782877DEST_PATH_IMAGE012
(5)
Wherein, iIt is frequency channel number , corresponding different band passband rates, It is total number of channels; jIt is grain diameter stepping number
Figure 667153DEST_PATH_IMAGE006
, It is particle diameter stepping sum; x j jShelves grain diameter mean value;
Figure 583474DEST_PATH_IMAGE010
jThe stepping width of shelves particle diameter; Scattered light at particle directly arrives in the situation of photodetector, has
Figure 312395DEST_PATH_IMAGE016
, in the situation that arrives photodetector after the part interference of light of the scattered light of particle and original laser or the scattered light of particle be fed back in the situation of laser cavity internal modulation Laser output and have
Figure 328893DEST_PATH_IMAGE018
qIt is the value of Scattering of Vector; D j jThe particle diffusivity of shelves particle diameter has comprised nano particle diameter x j Information; ωThe angular frequency relevant with Brownian movement; iThe frequency response function of channel bandpass filter is applicable to the passive and active filter in each rank;
Figure 826870DEST_PATH_IMAGE020
jThe particle size distribution function of shelves particle diameter;
3. formula (5) is transformed into the form of matrix, is expressed as
Figure DEST_PATH_IMAGE036
, wherein, power spectrum density Distribution of A Sequence vector SBe one group of measuring amount, obtain the matrix of coefficients that power spectrum density distributes by the mimic channel actual measurement KIn formula (5) The definition theory calculates the solution matrix equation
Figure 34736DEST_PATH_IMAGE036
, obtain tested particle size distribution column vector H
A kind of device of realizing based on the dynamic light scattering nano particle measuring method of bandpass filtering, characteristics are, this device comprises laser instrument, measurement zone, photodetector and mimic channel, described mimic channel comprises a prime amplifier and the corresponding M routing cache of frequency channel sum M device, the circuit that the bandpass filter at different frequency center and RMS r.m.s. processor are in series, the light beam irradiates of being launched by laser instrument is to measurement zone, measurement zone endoparticle scattered light is received by photodetector, the signal of photodetector output is after prime amplifier amplifies, walk abreast and send into described M routing cache device, the circuit that the bandpass filter at different frequency center and RMS r.m.s. processor are in series, obtain the signal root-mean-square valve at a plurality of different frequencies place, sampled by the A/D capture card, finally obtain a plurality of power spectrum densities.
Beneficial effect of the present invention: solved the problem that matrix of coefficients Very Ill-conditioned in original model causes the Inversion Calculation poor robustness.Adopt mimic channel directly to obtain power spectrum density, reduced the requirement to aspects such as data picking rate, data acquisition amount, amount of data storage and data processing amounts, greatly shortened data processing time, can realize Quick Measurement.Can be used for a plurality of fields that scientific research, biological medicine, the chemical industry energy, environmental protection etc. relate to production and the process control of nano particle.
Description of drawings
Fig. 1 analog signal processing system;
Fig. 2 measurement mechanism embodiment 1 synoptic diagram of the present invention;
Fig. 3 measurement mechanism embodiment 2 synoptic diagram of the present invention;
Fig. 4 measurement mechanism embodiment 3 synoptic diagram of the present invention;
The original dynamic light scattering method of Fig. 5 matrix of coefficients KDistribution plan;
Fig. 6 has dynamic light scattering method matrix of coefficients now KDistribution plan.
Embodiment
The present invention adopts the analog bandpass filtering technology to realize record and the processing of the power spectrum density that the dynamic light scattering nano particle is measured, and implementation is described in detail by reference to the accompanying drawings.Its method implementation step is:
1, the nano particle of the Ear Mucosa Treated by He Ne Laser Irradiation that is sent by laser instrument 6 in measurement zone 7 solution, the scattered light of particle is directly surveyed by photodetector 8, see Fig. 2, or with the part interference of light that obtains original laser through beam splitting behind the beam splitter 9 after surveyed by photodetector 8, see Fig. 3, or the scattered light of particle is fed back in laser instrument 6 chambeies and endovenous laser generation self-mixing modulated laser is exported and by photodetector 8 detections that are arranged on the laser instrument rear end, see Fig. 4;
2, the signal that is detected by photodetector 8 walks abreast successively after prime amplifier 2 amplifies and sends into the bandpass filter 4 at M routing cache device 3, different frequency center and the circuit that RMS r.m.s. processor 5 is in series, obtain the signal root-mean-square valve at M different frequency place, sampled by the A/D capture card, the final power spectral density function that obtains M different frequency place can be expressed as with theoretical formula:
Figure 923057DEST_PATH_IMAGE032
Figure 805562DEST_PATH_IMAGE012
(5)
Wherein, iIt is frequency channel number
Figure 158046DEST_PATH_IMAGE012
, corresponding different band passband rates, It is total number of channels; jIt is particle diameter stepping number
Figure 476212DEST_PATH_IMAGE006
,
Figure 896829DEST_PATH_IMAGE008
It is particle diameter stepping sum; x j jShelves grain diameter mean value; jThe stepping width of shelves particle diameter; Scattered light at particle directly arrives in the situation of photodetector, has
Figure 420532DEST_PATH_IMAGE016
, in the situation that arrives photodetector after the part interference of light of the scattered light of particle and original laser or the scattered light of particle be fed back in the situation of laser cavity internal modulation Laser output and have
Figure 345762DEST_PATH_IMAGE018
qIt is the value of Scattering of Vector; D j jThe particle diffusivity of shelves particle diameter has comprised nano particle diameter x j Information; ωThe angular frequency relevant with Brownian movement; iThe frequency response function of channel bandpass filter is applicable to the passive and active filter in each rank;
Figure 67785DEST_PATH_IMAGE020
jThe particle size distribution function of shelves particle diameter;
3, formula (5) is transformed into the form of matrix, is expressed as
Figure 352136DEST_PATH_IMAGE036
, wherein, power spectrum density Distribution of A Sequence vector SBe one group of measuring amount, obtain the matrix of coefficients that power spectrum density distributes by mimic channel 1 actual measurement KIn formula (5) The definition theory calculates, as shown in Figure 6, and the solution matrix equation
Figure 730345DEST_PATH_IMAGE036
, obtain tested particle size distribution column vector H
A kind of device of realizing based on the dynamic light scattering nano particle measuring method of bandpass filtering, by Fig. 1-shown in Figure 4, characteristics are, this device comprises laser instrument 6, measurement zone 7, photodetector 8 and mimic channel 1, described mimic channel 1 comprises a prime amplifier 2 and the corresponding M routing cache of frequency channel sum M device 3, the circuit that the bandpass filter 4 at different frequency center and RMS r.m.s. processor 5 are in series, the light beam irradiates of being launched by laser instrument 6 is to measurement zone 7, measurement zone 7 endoparticle scattered lights are received by photodetector 8, the signal of photodetector 8 outputs is after prime amplifier 2 amplifies, walk abreast and send into described M routing cache device 3, the circuit that the bandpass filter 4 at different frequency center and RMS r.m.s. processor 5 are in series, obtain the signal root-mean-square valve at a plurality of different frequencies place, sampled by the A/D capture card, finally obtain power spectral density function.
The scattered light of embodiment 1(particle is directly surveyed by photodetector):
By shown in Figure 2, it comprises semiconductor laser 6, measurement zone 7, photodetector 8 and mimic channel 1.The light beam irradiates of being launched by laser instrument 6 is to measurement zone 7.Measurement zone 7 endoparticle scattered lights are received by photodetector 8, obtain power spectral density function by mimic channel 1 at last.
Surveyed by photodetector after the scattered light of embodiment 2(particle and the part interference of light of original laser):
By shown in Figure 3, it comprises semiconductor laser 6, beam splitter 9, measurement zone 7, photodetector 8 and mimic channel 1.Beam splitter 9 places between laser instrument 6 and the measurement zone 7, and the light beam by laser instrument 6 is launched is divided into two bundles by beam splitter 9.A branch of beam splitter that sees through shines measurement zone 7; A branch of rear as intrinsic light by the beam splitter reflection.Measurement zone 7 endoparticle scattered lights and the intrinsic interference of light are surveyed by photodetector 8, obtain power spectral density function by mimic channel 1 at last.
Modulated laser was exported and is surveyed by photodetector after embodiment 3(particle scattered light was fed back into self-mixing occurs in the laser cavity):
By shown in Figure 4, it comprises semiconductor laser 6, measurement zone 7, photodetector 8 and mimic channel 1.Photodetector 8 places laser instrument 6 back, by the light beam that laser instrument 6 is launched, shines measurement zone 7, and the particle rear orientation light is fed back in the laserresonator and original laser generation mixing.The backward output light of laser instrument is surveyed by photodetector 8, obtains power spectral density function by mimic channel 1 at last.

Claims (4)

1. dynamic light scattering nano particle measuring method based on bandpass filtering is characterized in that method step is:
The nano particle of the Ear Mucosa Treated by He Ne Laser Irradiation that is sent by laser instrument in the solution, the scattered light of particle is directly surveyed by photodetector, or with the part interference of light of original laser after surveyed by photodetector, or be fed back into and surveyed by photodetector after producing the self-mixing signal in the laser cavity;
The signal that is detected by the photodetector parallel bandpass filter at M routing cache device, different frequency center and circuit that RMS r.m.s. processor is in series sent into successively after prime amplifier amplifies, obtain the signal root-mean-square valve at M different frequency place, sampled by the A/D capture card, the final power spectral density function that obtains M different frequency place can be expressed as with theoretical formula:
Figure 2011101270517100001DEST_PATH_IMAGE002
(5)
Wherein, iIt is frequency channel number
Figure 2011101270517100001DEST_PATH_IMAGE004
,
Figure 2011101270517100001DEST_PATH_IMAGE006
It is total number of channels; jIt is grain diameter stepping number
Figure 2011101270517100001DEST_PATH_IMAGE008
,
Figure 2011101270517100001DEST_PATH_IMAGE010
It is grain diameter stepping sum; x j jShelves grain diameter mean value;
Figure 2011101270517100001DEST_PATH_IMAGE012
jThe stepping width of shelves particle diameter; Directly arriving at the scattered light of particle in the situation of photodetector has
Figure 2011101270517100001DEST_PATH_IMAGE014
, after the part interference of light of the scattered light of particle and original laser, arrive in the situation of photodetector or the scattered light of particle is fed back in the situation that the output of self-mixing modulated laser occurs in the laser cavity and has
Figure 2011101270517100001DEST_PATH_IMAGE016
qIt is the value of Scattering of Vector; D j jThe particle diffusivity of shelves particle diameter has comprised nano particle diameter x j Information; ωThe angular frequency relevant with Brownian movement;
Figure 2011101270517100001DEST_PATH_IMAGE018
iThe frequency response function of channel bandpass filter is applicable to the passive and active filter in each rank;
Figure DEST_PATH_IMAGE020
jThe distribution of particles function of shelves particle diameter;
Formula (5) is transformed into the form of matrix, obtains: , wherein, power spectrum density Distribution of A Sequence vector SBe one group of measuring amount, obtain the matrix of coefficients that power spectrum density distributes by the mimic channel actual measurement KIn formula (5)
Figure DEST_PATH_IMAGE024
The definition theory calculates the solution matrix equation
Figure 480099DEST_PATH_IMAGE022
, obtain tested particle size distribution column vector H
2. a realization is based on the device of the dynamic light scattering nano particle measuring method of bandpass filtering, be characterised in that, this device comprises laser instrument, measurement zone, photodetector and mimic channel, described mimic channel comprise a prime amplifier and with the corresponding M routing cache of frequency channel sum M device, the circuit that the bandpass filter at different frequency center and RMS r.m.s. processor are in series, the light beam irradiates of being launched by laser instrument is to measurement zone, measurement zone endoparticle scattered light is received by photodetector, the signal of photodetector output is after prime amplifier amplifies, walk abreast and send into described M routing cache device, the circuit that the bandpass filter at different frequency center and RMS r.m.s. processor are in series, obtain the signal root-mean-square valve at a plurality of different frequencies place, sampled by the A/D capture card, finally obtain power spectral density function.
3. realization according to claim 2 is based on the device of the dynamic light scattering nano particle measuring method of bandpass filtering, be characterised in that, between laser instrument and measurement zone, be equipped with beam splitter, the light beam of being launched by laser instrument, be divided into two bundles by beam splitter, a branch of beam splitter that sees through shines measurement zone; A branch of rear as intrinsic light by the beam splitter reflection, measurement zone endoparticle scattered light and the intrinsic interference of light are surveyed by photodetector, obtain power spectral density function by mimic channel at last.
4. realization according to claim 2 is based on the device of the dynamic light scattering nano particle measuring method of bandpass filtering, be characterised in that, photodetector places the laser instrument back, the light beam of being launched by laser instrument, shine measurement zone, the particle rear orientation light is fed back in the laser cavity and original laser generation mixing, and the backward output light of laser instrument is surveyed by photodetector, obtains power spectral density function by mimic channel at last.
CN 201110127051 2011-05-17 2011-05-17 Method and apparatus for measuring dynamic light scattering nano-particles based on bandpass filtering Expired - Fee Related CN102297823B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201110127051 CN102297823B (en) 2011-05-17 2011-05-17 Method and apparatus for measuring dynamic light scattering nano-particles based on bandpass filtering

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201110127051 CN102297823B (en) 2011-05-17 2011-05-17 Method and apparatus for measuring dynamic light scattering nano-particles based on bandpass filtering

Publications (2)

Publication Number Publication Date
CN102297823A CN102297823A (en) 2011-12-28
CN102297823B true CN102297823B (en) 2013-01-02

Family

ID=45358390

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 201110127051 Expired - Fee Related CN102297823B (en) 2011-05-17 2011-05-17 Method and apparatus for measuring dynamic light scattering nano-particles based on bandpass filtering

Country Status (1)

Country Link
CN (1) CN102297823B (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103499521B (en) * 2013-09-06 2015-10-21 清华大学 The measuring method of the crucial geometric feature of nano particle
CN104458514A (en) * 2014-12-04 2015-03-25 江苏师范大学 Rapid measurement method for particle diameter distribution of laser self-mixing-frequency nano particles
CN105092432B (en) * 2015-06-05 2018-06-15 清华大学 The measuring system of metal nanoparticle grain size
CN106370569A (en) * 2015-07-22 2017-02-01 天津同阳科技发展有限公司 Particulate matter online monitor signal pre-processing circuit based on Mie scattering
CN105092426B (en) * 2015-07-24 2017-11-28 清华大学 The measuring method of 90 degree of scattering spectrums of nano particle
EP3433599B1 (en) * 2016-03-21 2022-08-31 TRUMPF Photonic Components GmbH Laser sensor for ultra-fine particle size detection
BR112018073691A2 (en) 2016-05-19 2019-02-26 Koninklijke Philips N.V. particle sensor, air purifier, sensor housing or body-worn device, and method for determining a particle density of a particle flow with an unknown particle flow velocity vector
CN106940301B (en) * 2017-03-10 2019-10-11 华南师范大学 A kind of particle zeta potential measurement method and device based on asymmetric electric field
CN110987737B (en) * 2019-12-23 2021-02-05 华中科技大学 Aerosol particle spectrum and concentration measurement method based on light scattering response
CN113433038B (en) * 2021-05-31 2022-11-01 昆明理工大学 Novel selection method of mixed nano fluid particle combination

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4781460A (en) * 1986-01-08 1988-11-01 Coulter Electronics Of New England, Inc. System for measuring the size distribution of particles dispersed in a fluid
US6118532A (en) * 1997-03-28 2000-09-12 Alv-Laser Vertriebsgesellschaft Mbh Instrument for determining static and/or dynamic light scattering
CN1587998A (en) * 2004-09-09 2005-03-02 华南师范大学 Measurig device and its method for micron to submicron grade particlate matter refractive index
CN101118210A (en) * 2006-08-04 2008-02-06 株式会社岛津制作所 Light scattering detector

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4781460A (en) * 1986-01-08 1988-11-01 Coulter Electronics Of New England, Inc. System for measuring the size distribution of particles dispersed in a fluid
US6118532A (en) * 1997-03-28 2000-09-12 Alv-Laser Vertriebsgesellschaft Mbh Instrument for determining static and/or dynamic light scattering
CN1587998A (en) * 2004-09-09 2005-03-02 华南师范大学 Measurig device and its method for micron to submicron grade particlate matter refractive index
CN101118210A (en) * 2006-08-04 2008-02-06 株式会社岛津制作所 Light scattering detector

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
《用动态光散射现代谱估计法测量纳米颗粒》;扬晖等;《光学精密工程》;20100930;第18卷(第9期);1996-2001 *
扬晖等.《用动态光散射现代谱估计法测量纳米颗粒》.《光学精密工程》.2010,第18卷(第9期),

Also Published As

Publication number Publication date
CN102297823A (en) 2011-12-28

Similar Documents

Publication Publication Date Title
CN102297823B (en) Method and apparatus for measuring dynamic light scattering nano-particles based on bandpass filtering
CN105606194B (en) A kind of underwater signal real time extracting method based on laser orthogonal polarization interferometry technology
CN102879835B (en) A kind of measuring method of laser precipitation weather phenomenon and laser precipitation weather phenomenon instrument
KR20230156814A (en) System and method for particles measurement
CN102564909A (en) Laser self-mixing multi-physical parameter measurement method and device for atmospheric particulate
CN108286992A (en) Distribution type fiber-optic sound sensing device and method based on digital double chirped pulse modulation
CN106646426B (en) A kind of full optical fiber laser radar of multiple illuminators and single receiver telescope array
CN101806889B (en) Device for optimizing and modulating parameters of laser radar system and method
CN103792544A (en) Vibration-rotational Raman-Mie scattering multi-wavelength laser radar system and working method thereof
CN104215271B (en) Positioning method for disturbance position in distributed optical fiber disturbance monitoring system
CN205720537U (en) A kind of high-speed data acquisition for GIS partial discharge on-line monitoring and processing means
CN106483051B (en) A kind of device and mobile terminal for mobile terminal measurement atmosphere particle concentration
CN103712914A (en) Laser cavity ring-down spectrometer for simultaneous detection of aerosol extinction and scattering coefficients
CN104199044A (en) Dual-mode superspeed moving object movement speed measurement device and method
CN101666689A (en) Wavelength optimization-type high-performance distributed optical fiber sensing system and sensing method
CN101187617A (en) Transmittance pulsation method granule measuring method and its device
CN106197391A (en) Photon gyroscope based on weak measurement technology
CN102411006A (en) Device and method for checking crystal material
CN102262224A (en) Amplitude-modulated wave phase-locked laser ranging method and device
CN104570087A (en) Method for performing seismic data first break and event pickup extraction through instantaneous attributes
CN104777326B (en) There is the Particle counter that flow velocity monitors real time calibration automatically
CN106370569A (en) Particulate matter online monitor signal pre-processing circuit based on Mie scattering
CN104458514A (en) Rapid measurement method for particle diameter distribution of laser self-mixing-frequency nano particles
CN110208726A (en) For the detection system for the outside electromagnetic interference for influencing magnetic resonance system image quality
CN110987736B (en) Aerosol particle spectrum and concentration measuring device and method

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20130102

Termination date: 20150517

EXPY Termination of patent right or utility model