CN102296582A - In situ test acquisition instrument with positioning function and positioning method - Google Patents
In situ test acquisition instrument with positioning function and positioning method Download PDFInfo
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- CN102296582A CN102296582A CN2011101533508A CN201110153350A CN102296582A CN 102296582 A CN102296582 A CN 102296582A CN 2011101533508 A CN2011101533508 A CN 2011101533508A CN 201110153350 A CN201110153350 A CN 201110153350A CN 102296582 A CN102296582 A CN 102296582A
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Abstract
The invention discloses an in situ acquisition instrument with a positioning function. A built-in GPS (global positioning system) module is added on the basis of a traditional in situ test acquisition instrument so as to ensure that the in situ acquisition instrument has the global positioning function, therefore, geographic coordinate data of exploratory holes can be acquired and recorded as well as stored, the geographic coordinate data of the exploratory holes and penetration resistance data measured by the acquisition instrument are derived when the data is output, terminal software can display the penetration data and data curves thereof and can also display the in situ test position coordinate position, thereby actually reflecting the deviation condition of an actual test position and a design position, being capable of effectively controlling the field construction quality without special measurement equipment for measurement, and improving the working efficiency. The invention also discloses a positioning method of the in situ test acquisition instrument.
Description
Technical field
The present invention relates to the method and system of in-situ test, relate in particular to a kind of in-situ test Acquisition Instrument and localization method thereof that possesses positioning function.
Background technology
In geotechnical investigation, in-situ test is one of important surveying method, the field operation test data adopts in-situ test Acquisition Instrument record, but the in-situ test Acquisition Instrument that uses does not have positioning function at present, the in-situ test position need adopt special measureing equipment to measure after field operation was implemented to finish, work is loaded down with trivial details like this, efficient is not high, and easily in indoor fraud, for the bigger instrument connection of some displacements, when field operation construction team occurring and practise fraud situation, just can not truly reflect the deviation of actual test position of field operation and design attitude.
Summary of the invention
Because the above-mentioned defective of prior art, technical problem to be solved by this invention provides a kind of global positioning function that has, and can gather and write down the in-situ test Acquisition Instrument and the localization method thereof of the geographical coordinate data of exploratory hole.
For achieving the above object, the invention provides a kind of in-situ test Acquisition Instrument that possesses positioning function, comprise AD converting unit, GPS module, display screen and single-chip microcomputer process chip; Described AD converting unit is used to receive analog signal and described analog signal conversion is become data signal, then described data signal is sent to described single-chip microcomputer process chip, described analog signal comprises penetration resistance data and the corresponding ground depth data thereof that the in-situ test probe sensor acquisition arrives; Described GPS module is used for collecting automatically satellite-signal, gather the geographical coordinate data of exploratory hole and the geographical coordinate data of described exploratory hole are sent to described single-chip microcomputer process chip; Described single-chip microcomputer process chip is used to handle the field operation test data, wherein said field operation test data comprises the geographical coordinate data of described exploratory hole, described penetration resistance data and corresponding ground depth data and Information Monitoring data, and described Information Monitoring data comprise engineering name, job number, exploratory hole hole number and design hole depth; Described display screen is connected with described single-chip microcomputer process chip, is used to show the described field operation test data of handling through the single-chip microcomputer process chip.
In the technique scheme, described AD converting unit is a multichannel AD converting unit.
In the technique scheme, described display screen is touch dot matrix display screen.
In the technique scheme, described touch dot matrix display screen also is used to show the data and curves of described field operation test data formation after described single-chip microcomputer process chip is handled.
In the technique scheme, described in-situ test Acquisition Instrument comprises that also data store card, and described data store card and are connected with described single-chip microcomputer process chip, are used to store described field operation test data after the single-chip microcomputer process chip is handled.
In the technique scheme, described in-situ test Acquisition Instrument complete machine adopts the design of 3.3V voltage.
In the technique scheme, described single-chip microcomputer process chip is 8 low-power consumption high-speed microprocessors.
In the technique scheme, described AD converting unit is 24 AD conversions of multiplication factor high-acruracy survey able to programme special integrated chip of U.S. ADI company.
In the technique scheme, the ARM7 kernel module that described GPS module is the RFIII process chip.
The present invention also provides a kind of localization method of in-situ test Acquisition Instrument, comprises the steps:
Start the in-situ test Acquisition Instrument, and input Information Monitoring, simultaneously the built-in GPS module in the described in-situ test Acquisition Instrument is collected satellite-signal automatically, gathers the geographical coordinate data of exploratory hole and the geographical coordinate data of described exploratory hole is sent to the single-chip microcomputer process chip, and described Information Monitoring comprises engineering name, job number, exploratory hole hole number and design hole depth;
Carry out in-situ test work: whenever go deep into ground Xcm by the in-situ test probe sensor and gather penetration resistance data, write down corresponding ground depth data simultaneously, and the described penetration resistance data of being gathered and the corresponding ground depth data mode with analog signal is sent in the AD converting unit, described X value is set according to different engineerings, and its scope is 8≤X≤12;
Described AD converting unit is a data signal with described analog signal conversion, and described data signal is sent to described single-chip microcomputer process chip handles;
The field operation test data is after described single-chip microcomputer process chip is handled, show that on the display screen that described in-situ test Acquisition Instrument carries described field operation test data comprises the geographical coordinate data of exploratory hole, described penetration resistance data and corresponding ground depth data and described Information Monitoring;
With the described field operation test data transmission of handling through the single-chip microcomputer process chip and be stored into client's computer.
In the technique scheme, described AD converting unit adopts multichannel AD converting unit.
In the technique scheme, described display screen is touch dot matrix display screen.
In the technique scheme, described in-situ test probe sensor whenever gos deep into ground 10cm and gathers penetration resistance data.
In the technique scheme, described field operation test data is stored in the data storage card that described in-situ test Acquisition Instrument carries after described single-chip microcomputer process chip is handled.
In the technique scheme, described field operation test data forms data and curves after described single-chip microcomputer process chip is handled, and described data and curves shows on described touch dot matrix display screen.
In the technique scheme, described data and curves is transferred to described client's computer.
In the technique scheme, described in-situ test Acquisition Instrument complete machine adopts the design of 3.3V voltage.
In the technique scheme, described single-chip microcomputer process chip adopts 8 low-power consumption high-speed microprocessors.
In the technique scheme, described GPS module adopts the ARM7 kernel module of RFIII process chip.
The present invention loads built-in GPS module on the basis of existing in-situ test Acquisition Instrument, make it have global positioning function, so just can collect the geographical coordinate data and the record of exploratory hole, storage is got off, geographical coordinate data and the measured penetration resistance data of Acquisition Instrument with exploratory hole when data are exported derive together, terminal software can not only show the penetration resistance data and and data and curves, can also show the in-situ test location coordinate information, the deviation situation that reflects actual test position and design attitude truly, can effectively control the field operation construction quality, and do not need to carry again special measureing equipment and measure, improved operating efficiency.
Be described further below with reference to the technique effect of accompanying drawing, to understand purpose of the present invention, feature and effect fully design of the present invention, concrete structure and generation.
Description of drawings
Fig. 1 is the workflow one-tenth figure of a preferred embodiment of the present invention.
The specific embodiment
As shown in Figure 1, the invention discloses a kind of in-situ test Acquisition Instrument that possesses positioning function, comprise that multichannel AD converting unit, single-chip microcomputer process chip, data store card, touch dot matrix display screen and GPS module; Described multichannel AD converting unit is used to receive analog signal and described analog signal conversion is become data signal, then described data signal is sent to described single-chip microcomputer process chip, described analog signal comprises penetration resistance data and the corresponding ground depth data thereof that the in-situ test probe sensor acquisition arrives; Described GPS module is used for collecting automatically satellite-signal, gather the geographical coordinate data of exploratory hole and the geographical coordinate data of described exploratory hole are sent to described single-chip microcomputer process chip; Described single-chip microcomputer process chip is used to handle the field operation test data and forms data and curves, wherein said field operation test data comprises the geographical coordinate data of described exploratory hole, described penetration resistance data and corresponding ground depth data and Information Monitoring data, and described Information Monitoring data comprise engineering name, job number, exploratory hole hole number and design hole depth.Described data store card and are connected with described single-chip microcomputer process chip, are used to store described field operation test data after the single-chip microcomputer process chip is handled; Described touch dot matrix display screen is connected with described single-chip microcomputer process chip, is used to show described field operation test data and the data and curves of handling through the single-chip microcomputer process chip thereof.
The invention also discloses a kind of localization method of in-situ test Acquisition Instrument, comprise the steps:
Start the in-situ test Acquisition Instrument, and input Information Monitoring, simultaneously the built-in GPS module in the described in-situ test Acquisition Instrument is collected satellite-signal automatically, gathers the geographical coordinate data of exploratory hole and the geographical coordinate data of described exploratory hole is sent to the single-chip microcomputer process chip, and described Information Monitoring comprises engineering name, job number, exploratory hole hole number and design hole depth.
Carry out in-situ test work: with in-situ test probe injection ground, described in-situ test probe whenever gos deep into ground 10cm, penetration resistance data of sensor acquisition on the probe, the corresponding ground depth data of record simultaneously, and the described penetration resistance data of being gathered and the corresponding ground depth data mode with analog signal is sent in the multichannel AD converting unit.
Described AD converting unit is a data signal with described analog signal conversion, and described data signal is sent to described single-chip microcomputer process chip handles.
The field operation test data forms data and curves after described single-chip microcomputer process chip is handled, and on the touch dot matrix display screen that described in-situ test Acquisition Instrument carries, show, to make things convenient for the field operation operating personnel to read, will be transported to client's computer through field operation test data and the data and curves thereof after described single-chip microcomputer process chip is handled simultaneously; Described field operation test data is after described single-chip microcomputer process chip is handled, be stored in the data storage card that described in-situ test Acquisition Instrument carries, described field operation test data comprises the geographical coordinate data of described exploratory hole, described penetration resistance data and corresponding ground depth data and described Information Monitoring data.
Described client's computer receives described field operation test data and data and curves thereof.
In above-mentioned two technical schemes, wherein in-situ test Acquisition Instrument complete machine chip adopts the 3.3V low voltage designs, has reduced Overall Power Consumption, and wherein the single-chip microcomputer process chip is 8 low-power consumption high-speed microprocessors; And the AD converting unit is 24 AD conversions of multiplication factor high-acruracy survey able to programme special integrated chip of U.S. ADI company, helps improving acquisition precision; GPS has partly adopted the small footprint modular of the ARM7 kernel of RFIII process chip, has to search soon the characteristics that positioning accuracy is high.
More than describe preferred embodiment of the present invention in detail.The ordinary skill that should be appreciated that this area need not creative work and just can design according to the present invention make many modifications and variations.Therefore, all technician in the art all should be in the determined protection domain by claims under this invention's idea on the basis of existing technology by the available technical scheme of logical analysis, reasoning, or a limited experiment.
Claims (19)
1. an in-situ test Acquisition Instrument that possesses positioning function comprises AD converting unit, GPS module, display screen and single-chip microcomputer process chip; Described AD converting unit is used to receive analog signal and described analog signal conversion is become data signal, then described data signal is sent to described single-chip microcomputer process chip, described analog signal comprises penetration resistance data and the corresponding ground depth data thereof that the in-situ test probe sensor acquisition arrives; Described GPS module is used for collecting automatically satellite-signal, gather the geographical coordinate data of exploratory hole and the geographical coordinate data of described exploratory hole are sent to described single-chip microcomputer process chip; Described single-chip microcomputer process chip is used to handle the field operation test data, wherein said field operation test data comprises the geographical coordinate data of described exploratory hole, described penetration resistance data and corresponding ground depth data and Information Monitoring data, and described Information Monitoring data comprise engineering name, job number, exploratory hole hole number and design hole depth; Described display screen is connected with described single-chip microcomputer process chip, is used to show the described field operation test data of handling through the single-chip microcomputer process chip.
2. the in-situ test Acquisition Instrument that possesses positioning function as claimed in claim 1, wherein, described AD converting unit is a multichannel AD converting unit.
3. the in-situ test Acquisition Instrument that possesses positioning function as claimed in claim 1, wherein, described display screen is touch dot matrix display screen.
4. the in-situ test Acquisition Instrument that possesses positioning function as claimed in claim 3, wherein, described touch dot matrix display screen also is used to show the data and curves of described field operation test data formation after described single-chip microcomputer process chip is handled.
5. the in-situ test Acquisition Instrument that possesses positioning function as claimed in claim 1, wherein, described in-situ test Acquisition Instrument comprises that also data store card, and described data store card and are connected with described single-chip microcomputer process chip, is used to store described field operation test data after the single-chip microcomputer process chip is handled.
6. the in-situ test Acquisition Instrument that possesses positioning function as claimed in claim 1, wherein, described in-situ test Acquisition Instrument complete machine adopts the design of 3.3V voltage.
7. the in-situ test Acquisition Instrument that possesses positioning function as claimed in claim 1, wherein, described single-chip microcomputer process chip is 8 low-power consumption high-speed microprocessors.
8. the in-situ test Acquisition Instrument that possesses positioning function as claimed in claim 1, wherein, described AD converting unit is 24 AD conversions of multiplication factor high-acruracy survey able to programme special integrated chip of U.S. ADI company.
9. the in-situ test Acquisition Instrument that possesses positioning function as claimed in claim 1, wherein, the ARM7 kernel module that described GPS module is the RFIII process chip.
10. the localization method of an in-situ test Acquisition Instrument comprises the steps:
Start the in-situ test Acquisition Instrument, and input Information Monitoring, simultaneously the built-in GPS module in the described in-situ test Acquisition Instrument is collected satellite-signal automatically, gathers the geographical coordinate data of exploratory hole and the geographical coordinate data of described exploratory hole is sent to the single-chip microcomputer process chip, and described Information Monitoring comprises engineering name, job number, exploratory hole hole number and design hole depth;
Carry out in-situ test work: whenever go deep into ground Xcm by the in-situ test probe sensor and gather penetration resistance data, write down corresponding ground depth data simultaneously, and the described penetration resistance data of being gathered and the corresponding ground depth data mode with analog signal is sent in the AD converting unit, described X value is set according to different engineerings, and its scope is 8≤X≤12;
Described AD converting unit is a data signal with described analog signal conversion, and described data signal is sent to described single-chip microcomputer process chip handles;
The field operation test data is after described single-chip microcomputer process chip is handled, show that on the display screen that described in-situ test Acquisition Instrument carries described field operation test data comprises the geographical coordinate data of described exploratory hole, described penetration resistance data and corresponding ground depth data and described Information Monitoring;
With the described field operation test data transmission of handling through the single-chip microcomputer process chip and be stored into client's computer.
11. the localization method of in-situ test Acquisition Instrument as claimed in claim 10, wherein, described AD converting unit adopts multichannel AD converting unit.
12. the localization method of in-situ test Acquisition Instrument as claimed in claim 10, wherein, described display screen is touch dot matrix display screen.
13. the localization method of in-situ test Acquisition Instrument as claimed in claim 10, wherein, described in-situ test probe sensor whenever gos deep into ground 10cm and gathers penetration resistance data.
14. the localization method of in-situ test Acquisition Instrument as claimed in claim 10, wherein, described field operation test data is stored in the data storage card that described in-situ test Acquisition Instrument carries after described single-chip microcomputer process chip is handled.
15. the localization method of in-situ test Acquisition Instrument as claimed in claim 12, wherein, described field operation test data forms data and curves after described single-chip microcomputer process chip is handled, and described data and curves shows on described touch dot matrix display screen.
16. the localization method of in-situ test Acquisition Instrument as claimed in claim 15 wherein, is transferred to described client's computer with described data and curves.
17. the localization method of in-situ test Acquisition Instrument as claimed in claim 10, wherein, described in-situ test Acquisition Instrument complete machine adopts the design of 3.3V voltage.
18. the localization method of in-situ test Acquisition Instrument as claimed in claim 10, wherein, described single-chip microcomputer process chip adopts 8 low-power consumption high-speed microprocessors.
19. the localization method of in-situ test Acquisition Instrument as claimed in claim 10, wherein, described GPS module adopts the ARM7 kernel module of RFIII process chip.
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| CN2011101533508A CN102296582A (en) | 2011-06-09 | 2011-06-09 | In situ test acquisition instrument with positioning function and positioning method |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102567526A (en) * | 2011-12-29 | 2012-07-11 | 国核电力规划设计研究院 | Method and system used for collecting and processing drilling information of geotechnical engineering |
| CN106645257A (en) * | 2016-12-15 | 2017-05-10 | 吉林大学 | Integrated device for in-situ testing of thermophysical property parameters of rock and soil |
| CN111474060A (en) * | 2020-04-30 | 2020-07-31 | 武汉大学 | Quick and automatic measuring device for engineering rock mechanical parameters and application method |
| CN112815896A (en) * | 2021-01-08 | 2021-05-18 | 国网山东省电力公司五莲县供电公司 | Join in marriage net reconnaissance pole apart from measuring apparatu |
| CN114371270A (en) * | 2021-12-03 | 2022-04-19 | 中铁第四勘察设计院集团有限公司 | In-situ test method and system |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102567526A (en) * | 2011-12-29 | 2012-07-11 | 国核电力规划设计研究院 | Method and system used for collecting and processing drilling information of geotechnical engineering |
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| CN111474060A (en) * | 2020-04-30 | 2020-07-31 | 武汉大学 | Quick and automatic measuring device for engineering rock mechanical parameters and application method |
| CN111474060B (en) * | 2020-04-30 | 2021-12-03 | 武汉大学 | Quick and automatic measuring device for engineering rock mechanical parameters and application method |
| CN112815896A (en) * | 2021-01-08 | 2021-05-18 | 国网山东省电力公司五莲县供电公司 | Join in marriage net reconnaissance pole apart from measuring apparatu |
| CN114371270A (en) * | 2021-12-03 | 2022-04-19 | 中铁第四勘察设计院集团有限公司 | In-situ test method and system |
| CN114371270B (en) * | 2021-12-03 | 2024-03-15 | 中铁第四勘察设计院集团有限公司 | In-situ test method and system |
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Application publication date: 20111228 |