CN102284513A - Collimating mechanism for convexity instrument - Google Patents
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Abstract
本发明涉及凸度仪用准直机构,属于核技术应用领域。所述准直机构包括两套相同结构的准直装置,每套准直装置包含3级准直器,从第一级到第三级准直器沿一个射线源的射线方向依次布置。该第一级准直器包括第一钨板;第二级准直器包括第二到第五钨板、两块安装板、底板、平板、固定块,该两块安装板置于平板上,两块安装板分别与第二到第五钨板相连,两块安装板与平板相连,两块安装板相连,平板与底板相连,平板与固定块之间压有弹簧;该第三级准直器包括第六钨板,第六钨板由顶丝固定;经过此三级准直,射线源发射的射线束成为准直射线束,解决凸度仪对射线源发射的射线束缺少准直功能的问题,提高了产品检测的精度。
The invention relates to a collimation mechanism for a convexity meter, and belongs to the field of nuclear technology application. The collimation mechanism includes two sets of collimation devices with the same structure, and each set of collimation devices includes 3-stage collimators, and the collimators from the first stage to the third stage are arranged sequentially along the radiation direction of a radiation source. The first-level collimator includes a first tungsten plate; the second-level collimator includes second to fifth tungsten plates, two mounting plates, a bottom plate, a flat plate, and a fixing block, and the two mounting plates are placed on the flat plate, The two mounting plates are respectively connected with the second to the fifth tungsten plates, the two mounting plates are connected with the flat plate, the two mounting plates are connected, the flat plate is connected with the bottom plate, and a spring is pressed between the flat plate and the fixed block; the third level collimation The device includes the sixth tungsten plate, and the sixth tungsten plate is fixed by the top wire; after this three-level collimation, the ray beam emitted by the ray source becomes a collimated ray beam, which solves the problem that the convexity instrument lacks the collimation function for the ray beam emitted by the ray source Problems, improve the accuracy of product detection.
Description
技术领域 technical field
本发明属于核技术应用领域,特别涉及检测钢厂轧钢生产线钢带的凸度仪用准直机构。The invention belongs to the application field of nuclear technology, and in particular relates to an alignment mechanism for a convexity instrument for detecting steel strips in a rolling production line of a steel mill.
背景技术 Background technique
凸度仪是钢厂板带材生产和控制的关键设备,能够瞬时连续地测量钢带的横截面厚度分布。凸度仪的结构,如图1所示,主体结构为一C形架11,被测钢带12从C形架上下臂之间穿过,射线源13位于C形架上臂内部,射线源为两台X光机,两台X光机完全相同,相隔一段距离放置;射线探测器14位于C形架下臂内部,包含两排探测器阵列,每排探测器阵列沿直线分布,包含几百个独立的射线探测器单元。两排探测器阵列分别对应两台X光机。The crown meter is the key equipment for the production and control of steel strips, which can instantaneously and continuously measure the cross-sectional thickness distribution of steel strips. The structure of the crown meter, as shown in Figure 1, the main structure is a C-
两台X光机同时向下发射X射线,来自两个射线源的X射线从两个不同角度穿过被测钢带12,利用两排探测器分别测量两束X射线的衰减程度。Two X-ray machines emit X-rays downward at the same time, and the X-rays from two ray sources pass through the
此凸度仪选用COMET MXR-225/02/FB型X光机,此X光机发出的射线束为一椭圆锥束,其长轴的立体角为90°,短轴的立体角为30°。而探测器相对X光机的立体角仅为45°×0.34°,远小于X光机发出的射线束角度,因此需要通过准直器对X光机发出的射线束进行准直。准直器不仅是为了辐射安全把由射线源发出的多余的射线屏蔽,更重要的是,多余的射线会产生大量的散射线,这些散射线进入探测器,增加探测器的噪声,降低设备的测量精度。对射线束进行准直,是很多射线测量设备都必须考虑的环节。The convexity meter uses COMET MXR-225/02/FB X-ray machine. The X-ray beam emitted by this X-ray machine is an elliptical cone beam. The solid angle of the long axis is 90°, and the solid angle of the short axis is 30°. . The solid angle of the detector relative to the X-ray machine is only 45°×0.34°, which is much smaller than the angle of the ray beam emitted by the X-ray machine. Therefore, a collimator is required to collimate the ray beam emitted by the X-ray machine. The collimator not only shields the redundant rays emitted by the ray source for radiation safety, but more importantly, the redundant rays will generate a large number of scattered rays, which enter the detector, increase the noise of the detector, and reduce the noise of the device. measurement accuracy. Collimating the ray beam is a link that must be considered in many ray measuring equipment.
X光机中发出射线的部件为靶点,靶点并不是理想中的直径为0的一点,而是一个具有一定直径的圆盘,此X光机的靶点直径为5.5mm。靶点非理想点源带来的问题是,由圆形靶点发出的射线束经过准直后,在准直器后面,会形成三个区域,屏蔽区、半影区和全影区。屏蔽区指的是完全看不到靶点的区域,此区域无射线照射,位于最外两侧;半影区指的是可以看得到部分靶点的区域,此区域有射线照射,但强度较低,且分布不均匀,此区域位于屏蔽区和全影区之间;全影区指的是可以看到全部靶点的区域,此区域射线强度最强,分布均匀此区域位于最中间位置。因此,全影区的射线最利于测量。如图2所示,射线23与靶点21的左侧相切,与准直器22的准直缝的左侧上沿a点相接,射线24与靶点21的右侧相切,与准直缝的左侧下沿b点相接,另一侧完全对称,射线经准直后,c点左侧和f点右侧为屏蔽区,cd区域和ef区域为半影区,de区域为全影区。The part that emits rays in the X-ray machine is the target point. The target point is not an ideal point with a diameter of 0, but a disc with a certain diameter. The target point diameter of this X-ray machine is 5.5mm. The problem caused by the non-ideal point source of the target point is that after the ray beam emitted by the circular target point is collimated, three areas will be formed behind the collimator, the shielding area, the penumbra area and the total shadow area. The shielding area refers to the area where the target point cannot be seen at all. This area has no radiation exposure and is located on the outermost sides; the penumbra area refers to the area where part of the target point can be seen. This area is irradiated by radiation, but the intensity is relatively low. Low and unevenly distributed, this area is located between the shielding area and the total shadow area; the total shadow area refers to the area where all the target points can be seen, the intensity of rays in this area is the strongest, and the distribution is even. This area is located in the middle. Therefore, the ray in the total shadow area is most conducive to measurement. As shown in Figure 2, ray 23 is tangent to the left side of target point 21, and touches with point a on the left side of the collimating slit of collimator 22, and
此凸度仪要求,两排探测器阵列分别位于其所对应的X光机的全影区内。The convexity meter requires that the two rows of detector arrays are respectively located in the total shadow area of the corresponding X-ray machine.
同时,由于此凸度仪采用两套X光机-探测器组合,且两台X光机同时照射(某些类似设备采用交错照射的方式),所以,还要求任何一排探测器阵列只被其所对应的X光机照射,而不能被两外一台X光机照射。由于两排探测器之间的间距相对X光机的立体角仅为0.46°,因此对准直提出了非常高的要求。At the same time, since the convexity meter uses two sets of X-ray machine-detector combinations, and the two X-ray machines are irradiated at the same time (some similar equipment adopts the way of staggered irradiation), it is also required that any row of detector arrays is only It is irradiated by the corresponding X-ray machine, but cannot be irradiated by the other X-ray machine. Since the distance between the two rows of detectors is only 0.46° relative to the solid angle of the X-ray machine, very high requirements are placed on the collimation.
综上,此凸度仪对准直的要求为:屏蔽多余的X射线;使探测器被其对应的X光机的射线束的全影区覆盖;把从两个X光机发出的射线区分开,使其仅照射其所对应的某一排探测器阵列,而不能照射另外一排探测器阵列。In summary, the requirements for collimation of this convexity meter are: to shield redundant X-rays; to make the detector covered by the total shadow area of the ray beam of its corresponding X-ray machine; to distinguish the rays emitted from the two X-ray machines On, so that it only illuminates a certain row of detector arrays corresponding to it, and cannot illuminate another row of detector arrays.
发明内容 Contents of the invention
本发明的目的是为改变现有的凸度仪设备对射线束缺少进行准直功能的问题,设计出一种凸度仪用准直机构,提高了产品检测的精度。The object of the present invention is to design a collimation mechanism for a convexity meter to improve the accuracy of product detection in order to change the problem that the existing convexity meter equipment lacks the collimation function of the ray beam.
本发明提出的凸度仪用准直机构,其特征在于,该准直机构包括两套相同结构的准直装置,每套准直装置包含有3级准直器,从第一级到第三级准直器沿一个射线源的射线方向依次布置。The collimation mechanism for the convexity meter proposed by the present invention is characterized in that the collimation mechanism includes two sets of collimation devices with the same structure, and each set of collimation devices contains 3-stage collimators, from the first stage to the third stage The first-stage collimators are arranged sequentially along the ray direction of a ray source.
该第一级准直器可包括中部开有矩形孔的第一钨板,该矩形孔的纵向对称轴与射线源发射的射线束的长轴重合。The first stage collimator may include a first tungsten plate with a rectangular hole in the middle, the longitudinal symmetry axis of the rectangular hole coincides with the long axis of the radiation beam emitted by the radiation source.
该第二级准直器可包括第二、第三、第四、第五块钨板,第一安装板,中间开有半圆槽的第二安装板,带有导轨和中心矩形孔的底板,安装在底板上带有中心矩形孔的平板,该平板的中心矩形孔与底板的中心矩形孔位置相对应,安装在底板上的固定块,该平板与固定块之间设有弹簧,用以使平板能在底板上水平移动;该第一、第二安装板对称竖立置于平板的中心矩形孔两侧,该第二钨板、第三钨板分别水平置于第一、第二安装板的顶面上,该第四钨板、第五钨板分别竖立置于第一、第二安装板的内侧面上,该第四钨板、第五钨板之间形成可调节宽度的准直缝。The second-stage collimator may include the second, third, fourth, and fifth tungsten plates, a first mounting plate, a second mounting plate with a semicircular groove in the middle, a bottom plate with guide rails and a central rectangular hole, Installed on the flat plate with a central rectangular hole on the bottom plate, the central rectangular hole of the flat plate corresponds to the central rectangular hole of the bottom plate, and the fixed block installed on the bottom plate, a spring is arranged between the flat plate and the fixed block to make the The flat plate can move horizontally on the base plate; the first and second mounting plates are symmetrically erected on both sides of the central rectangular hole of the flat plate, and the second tungsten plate and the third tungsten plate are placed horizontally on the sides of the first and second mounting plates respectively. On the top surface, the fourth tungsten plate and the fifth tungsten plate are placed upright on the inner sides of the first and second mounting plates respectively, and a collimating seam with adjustable width is formed between the fourth tungsten plate and the fifth tungsten plate .
该第三级准直器可包括第六钨板、该第六钨板两侧的上、下端面分别由顶丝固定。The third-level collimator may include a sixth tungsten plate, and the upper and lower end surfaces on both sides of the sixth tungsten plate are respectively fixed by top wires.
经过此三级准直后,由射线源发射的射线束在长轴方向上被有效屏蔽。短轴方向上,被准直成为仅照射与其相对应的沿直线排布的探测器阵列的准直射线束,且此射线束全部位于射线源靶点的全影区,而不会照射到另一排平行放置的探测器阵列,两排探测器阵列之间的间距相对射线源的立体角仅为0.46°,使凸度仪设备对射线源发射的射线束缺少进行准直功能的问题得以解决,提高了产品检测的精度。After the three-stage collimation, the ray beam emitted by the ray source is effectively shielded in the direction of the long axis. In the direction of the short axis, it is collimated into a collimated ray beam that only irradiates the corresponding detector array arranged in a straight line, and this ray beam is all located in the total shadow area of the target point of the ray source, and will not irradiate another Rows of detector arrays are placed in parallel, and the distance between the two rows of detector arrays is only 0.46° relative to the solid angle of the ray source, which solves the problem that the convexity meter equipment lacks the collimation function for the ray beam emitted by the ray source. The accuracy of product detection is improved.
附图说明 Description of drawings
图1为凸度仪结构示意图。Figure 1 is a schematic diagram of the structure of the crown meter.
图2为射线准直器全影区、半影区示意图。Fig. 2 is a schematic diagram of the total shadow area and the penumbra area of the ray collimator.
图3为本发明的准直机构原理示意图。Fig. 3 is a schematic diagram of the principle of the collimation mechanism of the present invention.
图4为本发明实施例的第一级准直器结构示意图。Fig. 4 is a schematic structural diagram of a first-stage collimator according to an embodiment of the present invention.
图5为本发明实施例的第二级准直器结构示意图。Fig. 5 is a schematic structural diagram of a second-stage collimator according to an embodiment of the present invention.
图6为本发明实施例的第三级准直器结构示意图。FIG. 6 is a schematic structural diagram of a third-stage collimator according to an embodiment of the present invention.
具体实施方式 Detailed ways
下面结合附图及实施例对本发明做进一步的说明。The present invention will be further described below in conjunction with the accompanying drawings and embodiments.
实施例Example
本发明针对的凸度仪采用两套射线源-探测器阵列的组合,如图1所示,以垂直于C形架上臂端面16的方向为X方向,以垂直于C形架侧面17的方向为Y方向。在X方向如图3所示,图中,两台X光机在X方向的同一直线方向上相隔放置,探测器阵列沿X方向排布,两排探测器阵列35、36平行。The convexity meter aimed at by the present invention adopts the combination of two sets of ray source-detector arrays, as shown in Figure 1, the direction perpendicular to the
X光机发出的X射线束为一椭圆锥束,长轴沿X方向,短轴沿Y方向,角度为90°×30°。同样在X、Y方向上,探测器阵列相对X光机的立体角为45°×0.34°,如图3所示,在Y方向上,两排探测器阵列35、36之间的距离相对X光机的角度为0.46°。要求X光机发出的射线束经准直后,只照射在其相对应的探测器阵列上,而不能照射在另外一排探测器阵列上。并且,由于X光机的靶点具有一定直径(5.5mm),射线经准直后会形成全影区和半影区,还要求对应的探测器阵列全部位于全影区内。The X-ray beam emitted by the X-ray machine is an elliptical cone beam, the long axis is along the X direction, the short axis is along the Y direction, and the angle is 90°×30°. Also in the X and Y directions, the solid angle of the detector array relative to the X-ray machine is 45 ° * 0.34 °, as shown in Figure 3, in the Y direction, the distance between the two rows of detector arrays 35, 36 is relatively X The optomechanical angle is 0.46°. It is required that after collimation, the ray beam emitted by the X-ray machine is only irradiated on its corresponding detector array, and cannot be irradiated on another row of detector arrays. Moreover, since the target point of the X-ray machine has a certain diameter (5.5mm), the hologram and penumbra will be formed after the rays are collimated, and it is also required that the corresponding detector arrays are all located in the hologram.
如图3所示,X光机31、探测器阵列36为组合1,组合2与其以面38对称布置(图中未标出)。与之相对应,准直机构也有相同的两套,以面38对称布置。图3中所示的第1级准直器32、第2级准直器33、第3级准直器34为与组合1相对应的一套准直机构。As shown in FIG. 3 , the X-ray machine 31 and the detector array 36 are a combination 1, and the combination 2 is arranged symmetrically with the plane 38 (not shown in the figure). Correspondingly, there are two identical sets of collimation mechanisms, which are symmetrically arranged on the plane 38 . The first-stage collimator 32 , the second-stage collimator 33 , and the third-stage collimator 34 shown in FIG. 3 are a set of collimation mechanisms corresponding to combination 1 .
该凸度仪用准直机构由两套相同结构的准直机构组成,每一套准直机构包含有3级准直器,从第一级到第三级沿一个射线源的射线方向依次布置。The collimation mechanism for the convexity meter consists of two sets of collimation mechanisms with the same structure, and each set of collimation mechanisms contains 3-level collimators, which are arranged sequentially along the ray direction of a radiation source from the first level to the third level .
所述第一级准直器的结构,如图4所示,为一块厚度为10mm的第一钨板,此厚度足以把X光机发出的射线完全阻挡。第一钨板的纵向开有15×60mm的矩形孔41,安装时,该矩形孔41的纵向对称轴与X光机射线束的长轴重合。射线束只能从此孔中通过,其余射线完全被阻挡。经过该级准直后,90°×30°的射线束减小为50°×10°。而X方向所需的角度为45°,不再对射线束在X方向上做进一步准直。该级准直与X光机的相对位置保持固定。The structure of the first-stage collimator, as shown in Figure 4, is a first tungsten plate with a thickness of 10mm, which is enough to completely block the rays emitted by the X-ray machine. The longitudinal direction of the first tungsten plate is provided with a
所述第二级准直器的结构,如图5a、5b、5c所示,包括厚度均为10mm的第二、第三、第四、第五块钨板51、52、53、54,纵向两侧的中部有通孔的第一安装板55,对应第一安装板上的通孔的位置上有螺纹孔的第二安装板56,带有导轨和中心矩形孔的底板513,带有中心矩形孔的平板57,该平板57的中心矩形孔与底板513的中心矩形孔的位置相对应,安装在底板513右侧的固定块518,如图5b所示,安装在底板513的左侧并顶住平板侧面的第一顶丝519,安装在平板57左侧并顶住第一安装板侧面的第二顶丝520,如图5a所示;在该底板513中心矩形孔纵向的一侧,还开有长孔516,在该平板57的中心矩形孔纵向两侧还开有长孔59,如图5c所示;该第一、第二安装板55、56对称竖立置于平板57中心矩形孔纵向的两侧,该第一、第二安装板55、56与平板57之间,分别通过穿过长孔59的螺栓58连接,该第一、第二安装板55、56之间,通过穿过第一安装板55上的通孔及第二安装板56上的螺栓孔的螺栓510连接,该螺栓510上穿有压缩弹簧511,该压缩弹簧511的两端分别顶在第一、第二安装板55、56的内侧面上;该平板57置于底板513之上,并可在底板513上沿导轨平移,该平板57与底板513之间,通过穿过长孔516的螺栓515连接;该第二钨板51、第三钨板52分别水平置于第一、第二安装板55、56的顶面上,该第二钨板51、第三钨板52用来阻挡短轴方向多余的射线,该第四钨板53、第五钨板54分别竖立置于第一、第二安装板55、56的内侧面上,该第四钨板53、第五钨板54之间形成图3中33、37之间的可调节宽度的准直缝,该准直缝沿X方向;该平板57与固定块518之间有四根弹簧517,该四根弹簧517的两端分别顶在平板57与固定块518的内侧面上,用以使平板能在底板上沿导轨向左水平移动,如图5b所示;平板57之上置有圆柱销512,纵向中部带有半圆槽的第二安装板56可围绕该圆柱销转动。The structure of the second-stage collimator, as shown in Figures 5a, 5b, and 5c, includes the second, third, fourth, and
第四钨板53、第五钨板54之间的准直缝的位置、宽度和角度都可以进行精准的调节。为了保证把整个第二级准直安装到设备上以后仍能方便的调节,所有的调节功能都在图5a所示的正面和底面进行。射线束经过此级准直后,其全影区恰好覆盖探测器阵列36,如图3所示。The position, width and angle of the collimating seam between the
准直缝的位置靠旋转第一顶丝519来实现。右旋第一顶丝519,使平板57带动准直缝向前沿导轨514平移;左旋519,平板57带动准直缝在弹簧517的压力下退后。顶丝螺距为1mm,顶丝旋转一周对应平板57平移1mm,因此可以通过控制顶丝的旋转角度,精确控制平板57也就是准直缝的位置。以下的调节均与此类似。The position of the collimating seam is realized by rotating the first top wire 519 . Rotate the first jacking wire 519 to the right to make the
准直缝的宽度靠两条螺栓510调节。两条螺栓同步调节。右旋两条螺栓,第一安装板55、第二安装板56被螺栓拉近,准直缝的宽度缩小;左旋两条螺栓,第一安装板55、第二安装板56在两根弹簧511的压力下张开,准直缝的宽度增大。The width of the collimating slit is adjusted by two
准直缝的角度靠两条顶丝520调节。该第二顶丝520由左右两条顶丝组成,该两条顶丝相反调节,右旋其中一个,则左旋另外一个,旋转角度相同。使得第一安装板55、第二安装板56作为一个整体绕圆柱销512旋转,准直缝的角度也随之改变。The angle of the collimating seam is adjusted by two jacking
准直缝的位置、宽度及角度调节完成后,从底板513之下,拧紧两条螺栓515,使平板57与底板513固定;拧紧四条螺栓58,使第一安装板55、第二安装板56与平板57固定。After adjusting the position, width and angle of the alignment seam, tighten two
所述的第三级准直器,如图6所示,包括厚度为10mm的第六钨板61及钨板61两端相同的支撑部件,该第六钨板61的两侧分别由顶丝62、63固定。通过调节顶丝可以对第六钨板61两端的位置分别进行精确调节与固定,进而对第六钨板61的位置与在水平方向上的角度都可以精准的调节。第三级准直器的作用,如图3所示,阻挡由31发出、经33准直后,射向探测器阵列35的半影区。Described tertiary collimator, as shown in Figure 6, comprises the support member that thickness is the
经过此三级准直后,由X光机发出的射线束在长轴方向上被有效屏蔽。短轴方向上,被准直成为仅照射与其相对应的沿直线排布的探测器阵列的准直射线束,且此射线束全部位于X光机靶点的全影区,并且此准直射线束不会照射到另一排仅间隔0.46°的平行放置的探测器阵列。After this three-stage collimation, the ray beam emitted by the X-ray machine is effectively shielded in the direction of the long axis. In the short axis direction, it is collimated into a collimated ray beam that only irradiates the corresponding detector array arranged in a straight line, and the ray beam is all located in the total shadow area of the target point of the X-ray machine, and the collimated ray beam does not It will illuminate another row of parallel detector arrays separated by only 0.46°.
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Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103240283A (en) * | 2012-02-08 | 2013-08-14 | 宝山钢铁股份有限公司 | Automatic band steel width detecting method |
CN110389387A (en) * | 2019-06-06 | 2019-10-29 | 上琛安防科技(上海)有限公司 | Intelligent X-ray security detection equipment collimation, radiographic source and detection acquisition system |
CN111412845A (en) * | 2020-04-30 | 2020-07-14 | 宝信软件(武汉)有限公司 | Measuring method for measuring thickness of inclined target |
KR102405697B1 (en) * | 2021-04-28 | 2022-06-08 | 주식회사 씨엔아이 | Radiation detection instrument for non-destructive inspection |
KR102405693B1 (en) * | 2021-04-30 | 2022-06-08 | 주식회사 씨엔아이 | Radiation detection instrument for non-destructive inspection |
KR102405696B1 (en) * | 2021-04-28 | 2022-06-08 | 주식회사 씨엔아이 | Radiation detection instrument for non-destructive inspection |
KR20220148347A (en) * | 2021-04-28 | 2022-11-07 | 주식회사 씨엔아이 | Radiation detection instrument for non-destructive inspection |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56138208A (en) * | 1980-03-31 | 1981-10-28 | Toshiba Corp | Radiant ray thickness gauge |
US4406015A (en) * | 1980-09-22 | 1983-09-20 | Kabushiki Kaisha Daini Seikosha | Fluorescent X-ray film thickness gauge |
US4442535A (en) * | 1981-04-07 | 1984-04-10 | Seiko Instruments & Electronics Ltd. | Fluorescent X-ray film thickness gauge for very small areas |
CN87214943U (en) * | 1987-11-04 | 1988-06-08 | 核工业部大连应用技术研究所 | Target changeable type thickness gauge by isotope |
US5060247A (en) * | 1988-11-17 | 1991-10-22 | Seiko Instruments, Inc. | Fluorescent x-ray film thickness gauge |
RU2327953C1 (en) * | 2006-11-14 | 2008-06-27 | Закрытое акционерное общество Научно-исследовательский институт интроскопии Московского научно-производственного объединения "Спектр" | Calibration stand for x-ray thickness gauge |
CN202119416U (en) * | 2011-05-16 | 2012-01-18 | 清华大学 | Alignment mechanism used for convexity instrument |
-
2011
- 2011-05-16 CN CN2011101262582A patent/CN102284513A/en active Pending
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56138208A (en) * | 1980-03-31 | 1981-10-28 | Toshiba Corp | Radiant ray thickness gauge |
US4406015A (en) * | 1980-09-22 | 1983-09-20 | Kabushiki Kaisha Daini Seikosha | Fluorescent X-ray film thickness gauge |
US4442535A (en) * | 1981-04-07 | 1984-04-10 | Seiko Instruments & Electronics Ltd. | Fluorescent X-ray film thickness gauge for very small areas |
CN87214943U (en) * | 1987-11-04 | 1988-06-08 | 核工业部大连应用技术研究所 | Target changeable type thickness gauge by isotope |
US5060247A (en) * | 1988-11-17 | 1991-10-22 | Seiko Instruments, Inc. | Fluorescent x-ray film thickness gauge |
RU2327953C1 (en) * | 2006-11-14 | 2008-06-27 | Закрытое акционерное общество Научно-исследовательский институт интроскопии Московского научно-производственного объединения "Спектр" | Calibration stand for x-ray thickness gauge |
CN202119416U (en) * | 2011-05-16 | 2012-01-18 | 清华大学 | Alignment mechanism used for convexity instrument |
Non-Patent Citations (1)
Title |
---|
程宏明等: "热轧凸度仪综述", 《仪器仪表学报》, vol. 30, no. 6, 30 June 2009 (2009-06-30), pages 81 - 85 * |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103240283A (en) * | 2012-02-08 | 2013-08-14 | 宝山钢铁股份有限公司 | Automatic band steel width detecting method |
CN103240283B (en) * | 2012-02-08 | 2015-01-21 | 宝山钢铁股份有限公司 | Automatic band steel width detecting method |
CN110389387A (en) * | 2019-06-06 | 2019-10-29 | 上琛安防科技(上海)有限公司 | Intelligent X-ray security detection equipment collimation, radiographic source and detection acquisition system |
CN111412845A (en) * | 2020-04-30 | 2020-07-14 | 宝信软件(武汉)有限公司 | Measuring method for measuring thickness of inclined target |
KR102405697B1 (en) * | 2021-04-28 | 2022-06-08 | 주식회사 씨엔아이 | Radiation detection instrument for non-destructive inspection |
KR102405696B1 (en) * | 2021-04-28 | 2022-06-08 | 주식회사 씨엔아이 | Radiation detection instrument for non-destructive inspection |
KR20220148347A (en) * | 2021-04-28 | 2022-11-07 | 주식회사 씨엔아이 | Radiation detection instrument for non-destructive inspection |
KR102549603B1 (en) * | 2021-04-28 | 2023-06-30 | 주식회사 씨엔아이 | Radiation detection instrument for non-destructive inspection |
KR102405693B1 (en) * | 2021-04-30 | 2022-06-08 | 주식회사 씨엔아이 | Radiation detection instrument for non-destructive inspection |
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