CN102243104A - Device for measuring properties of polarized light in real time - Google Patents

Device for measuring properties of polarized light in real time Download PDF

Info

Publication number
CN102243104A
CN102243104A CN2011101651792A CN201110165179A CN102243104A CN 102243104 A CN102243104 A CN 102243104A CN 2011101651792 A CN2011101651792 A CN 2011101651792A CN 201110165179 A CN201110165179 A CN 201110165179A CN 102243104 A CN102243104 A CN 102243104A
Authority
CN
China
Prior art keywords
polarized light
cos
polarization
theta
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2011101651792A
Other languages
Chinese (zh)
Inventor
吴金才
王建宇
贾建军
何志平
舒嵘
杨世骥
张明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Institute of Technical Physics of CAS
Original Assignee
Shanghai Institute of Technical Physics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Institute of Technical Physics of CAS filed Critical Shanghai Institute of Technical Physics of CAS
Priority to CN2011101651792A priority Critical patent/CN102243104A/en
Publication of CN102243104A publication Critical patent/CN102243104A/en
Pending legal-status Critical Current

Links

Images

Landscapes

  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

The invention discloses a device for measuring properties of polarized light in real time. The device measures the properties of incident polarized light in real time through measurement of four paths of light power by an unpolarized light splitting prism, a half-wave plate, two polarized light splitting prisms and four photodetectors, and is applicable to a polarized optical system, the field of elliptic polarized measurement, a laser technology and other measurement and detection fields related to polarization. The polarized light is measured by different orthogonal bases and the azimuth angle and polarized extinction ratio information of the polarized light are acquired, so that the properties of the polarized light are measured; and because two groups of orthogonal bases acquire measurement data at the same time, real-time measurement is realized.

Description

A kind of device of real-time measurement polarized light characteristic
Technical field
The present invention relates to a kind of measurement mechanism of polarized light characteristic, be specifically related to a kind of device of real-time measurement polarized light characteristic.
Background technology
Along with people are familiar with and deepening continuously of studying the polarisation of light phenomenon, polarization information is applied to the detection to target gradually.Be finally inversed by the relevant information of target to be measured by detection of a target polarization of reflected light information, but the measurement information amount of target to be measured can be increased three-dimensional again from original dimension, polarization information is used widely in fields such as atural object remote sensing, atmospheric exploration, undersea detection, astrosurveillance, medical diagnosis, target detection, Flame Image Process and Military Application.While reaching its maturity along with the single-photon detecting survey technology, high efficiency single-photon detector can be realized technically, the development of single-photon detecting survey technology causes the fast development of single photon polarization application, and the free space quantum secret communication based on polarization encoder is exactly one of a kind of important application of single photon polarization at present.
When carrying out the free space quantum key distribution, the carrier of quantum information is the polarization state of single photon, the encryption key distribution principle adopts the BB84 scheme, in this scheme, transmitting terminal is launched randomly and is in horizontal polarization, vertical polarization, + 45 degree polarizations, one of four kinds of states of-45 degree polarizations, receiving end throughput submodule reception S at random, P or+, the polarization single photon of-Ji, so just require emission, receive ATP outside the aligning that guarantees star-ground quantum link, also will guarantee star-ground quantum light polarization basic vector direction unanimity, the deviation of the alignment of polarization basic vector will cause the bit error rate to raise and influence the security of quantum key distribution.In actual optical system with taking aim in the process, slightly following of the relative motion of communication terminal, communication ends A TP taken aim at, the reasons such as alignment error of communication instrument, the capital causes the deviation of polarization basic vector between the transmitting-receiving two-end, how to revise the key that this variation becomes assurance star-ground quantum-key distribution success.Polarized light measurement field in reality, detection to polarized light basic vector direction all is to finish by the rotation of polaroid, so just require polaroid is rotated, the real-time of measurement result is relatively poor, also can't measure the polarization of single photon accurately simultaneously.
The present invention is based on the polarized light theory, adopt the different orthogonal base unknown polarizations light to be carried out the measurement of respective component, obtain the position angle and the polarization extinction ratio information of polarized light, thereby realize measurement to the characteristic of polarized light, owing to the measurement of two groups of orthogonal basiss is carried out simultaneously in this method, so can realize real-time measurement to polarization single photon information.
Summary of the invention
The device that the purpose of this invention is to provide a kind of real-time measurement polarized light characteristic, overcome existing polarimetry device long problem consuming time in measuring process, targetedly the basic vector direction of polarized light is measured, measuring process is real-time, if the Si detector of this device makes single-photon detector into, also can measure the basic vector direction of polarization single photon, the receiver module that also can be used as the quantum communications receiving end simultaneously uses, and the portability of test macro is stronger.
Apparatus of the present invention are as shown in Figure 1: device comprises unpolarized Amici prism 1, half-wave plate 2, polarization splitting prism 3, No. two polarization splitting prisms 4, detector 5, No. two detectors 6, No. three detectors 7, No. four detectors 8.Described unpolarized Amici prism 1 is 1: 1 polarization insensitive spectroscope; The service band of described half-wave plate 2 covers the wavelength of tested polarized light source, and bore is 25mm, and residing position, its position angle makes catoptrical detection base be non-S, P base; Described polarization splitting prism 3,4 service bands are consistent with half-wave plate 2; Described detector 5,6,7,8 adopts the Si detector.During device work, tested polarized light is respectively measured the detection that basic component carries out energy through entering into respectively on No. 4 detectors behind unpolarized Amici prism 1, half-wave plate 2 and the polarization splitting prism 3,4 to tested polarized light.
The concrete measuring process of measuring polarized light characteristic device in real time is as follows:
1, tested polarized light is divided into two-way through behind the unpolarized Amici prism 1, wherein transmitted light carries out polarization spectro behind half-wave plate 2, a polarization splitting prism 3, two-beam is separately surveyed by first and second number detector 5,6, what measured this moment is the polarized component of non-S, P base, in order to express easily, at this position angle of getting half-wave plate is 22.5 °, this moment first and second number detector 5,6 measured value be respectively tested polarized light+45 ° and-45 ° of component value E +, E -
2, tested polarized light is divided into two-way through behind the unpolarized Amici prism 1, its reflected light has also carried out polarization spectro after through No. two polarization splitting prisms 4, S separately, P component are surveyed by third and fourth number detector 7,8, and the measured value of third and fourth number detector 7,8 is counted E respectively s, E p
3, the stokes parameter of tested polarized light is S → = S 0 1 cos 2 α cos 2 θ cos 2 α sin 2 θ sin 2 α , Wherein θ is the position angle, and scope is 0≤θ≤π, and α is the ellipticity angle, and scope is
Figure BDA0000069049660000032
Then above measured value can be expressed as E s E p E + E - = S 0 4 1 + cos 2 α cos 2 θ 1 - cos 2 α cos 2 θ 1 + cos 2 α sin 2 θ 1 - cos 2 α sin 2 θ , Satisfy by calculating azimuth angle theta:
tan 2 θ = ( E s + E p ) ( E + - E - ) ( E s - E p ) ( E + + E - )
Wherein the scope of θ is passed through E +-E -And E s-E p+ ,-judge.Basis for estimation is as follows:
E +- E->0,E s-E p>0, 0 ≤ θ ≤ π 4 ;
E +-E ->0,E s-E p<0, π 4 ≤ θ ≤ π 2 ;
E +-E -<0,E s-E p<0, π 2 ≤ θ ≤ 3 π 4 ;
E +-E -<0,E s-E p>0, 3 π 4 ≤ θ ≤ π .
4,, can calculate ellipticity angle α and satisfy according to the azimuth angle theta that obtains:
cos 2 α = E s - E p E s + E p 1 cos 2 θ
Then the extinction ratio of polarized light is: ER = 1 tan 2 α = 1 + cos 2 α 1 - cos 2 α = 1 + E s - E p E s + E p 1 cos 2 θ 1 - E s - E p E s + E p 1 cos 2 θ .
The concrete principle of this method is as follows:
In optical theory, polarized light is divided into line polarisation, circularly polarized light and elliptically polarized light.The all available stokes parameter of any polarized light represents that random polarization light can be expressed as:
S → = S 0 1 cos 2 α cos 2 θ cos 2 α sin 2 θ sin 2 α - - - ( 1 )
S wherein 0The energy of representing tested polarized light, θ are represented the position angle of major axis, and establish
Figure BDA0000069049660000044
α is the ellipticity angle, and its scope is
Figure BDA0000069049660000045
Then the major axis orientation angle θ of polarized light, ellipticity angle α can be by measuring, and the information of polarized light is just definite fully.
Concrete condition is described below: the state of incident polarized light is S → = S 0 1 cos 2 α cos 2 θ cos 2 α sin 2 θ sin 2 α , After 1: 1 unpolarized Amici prism transmission, because the phase delay scope of polarization splitting prism transmission S, P light is in ± 3 °, the transmission matrix of its transmitted light can approximate representation be: 1 2 1,0,0,0 0,1,0,0 0,0,1,0 0,0,0,1 , This moment, transmitted light passed through half-wave plate again, and the transmission matrix that is in β angle half-wave plate is: 1,0,0,0 0 , cos 4 β , sin 4 β , 0 0 , sin 4 β , - cos 4 β , 0 0,0,0,1 , Then inciding polarization splitting prism polarized light state before is:
1,0,0,0 0 , cos 4 β , sin 4 β , 0 0 , sin 4 β , - cos 4 β , 0 0,0,0,1 1,0,0,0 0,1,0,0 0,0,1,0 0,0,0,1 S 0 2 1 cos 2 α cos 2 θ cos 2 α sin 2 θ sin 2 α = S 0 2 1 cos 4 β cos 2 α cos 2 θ + sin 4 β cos 2 α sin 2 θ sin 4 β cos 2 α cos 2 θ - cos 4 β cos 2 α sin 2 θ sin 2 α - - - ( 2 )
For convenience, getting the half-wave plate angle is 22.5 degree, and promptly this drive test amount base is ± 45 degree bases, and this moment, polarized light state was: S 0 2 1 cos 2 α sin 2 θ cos 2 α cos 2 θ sin 2 α , By polarization splitting prism this polarized light is carried out analyzing again, the analyzing matrix of S, P is respectively:
1 2 1,1,0,0 1,1,0,0 0,0,0,0 0,0,0,0 And 1 2 1 , - 1,0,0 - 1,1,0,0 0,0,0,0 0,0,0,0 - - - ( 3 )
Then this moment+,-the Ji analyzing after state be S 0 4 1 + cos 2 α sin 2 θ 1 + cos 2 α sin 2 θ 0 0 And S 0 4 1 - cos 2 α sin 2 θ 1 - cos 2 α sin 2 θ 0 0 .
Then+,-energy of port is respectively:
E + = S 0 ( 1 + cos 2 α sin 1 θ ) 4 E - = S 0 ( 1 - cos 2 α sin 2 θ ) 4 - - - ( 4 )
Same through after the unpolarized Amici prism reflection, because the phase delay of unpolarized Amici prism transmission S, P light is δ, the transmission matrix of its transmitted light can be expressed as: 1 2 1,0,0,0 0,1,0,0 0,0 , cos δ , sin δ 0,0 , - sin δ , cos δ , Then inciding polarization splitting prism polarized light state before is:
S 0 1 cos 2 α cos 2 θ cos δ cos 2 α sin 2 θ + sin δ sin 2 α - sin δ cos 2 α sin 2 θ + cos δ sin 2 α - - - ( 5 )
S, P analyzing matrix by polarization splitting prism carries out analyzing again, and the energy that obtains S, P port is respectively:
E S = S 0 ( 1 + cos 2 α cos 2 θ ) 4 E P = S 0 ( 1 - cos 2 α cos 2 θ ) 4 - - - ( 6 )
By formula 4 and formula 6, can find the solution the polarized light angle and obtain azimuth angle theta and satisfy:
tan 2 θ = ( E s + E p ) ( E + - E - ) ( E s - E p ) ( E + + E - ) - - - ( 7 )
Wherein the scope of θ is passed through E +-E -And E s-E p+ ,-judge.Basis for estimation is as follows:
E +-E ->0,E s-E p>0, 0 ≤ θ ≤ π 4 ;
E +-E ->0,E s-E p<0, π 4 ≤ θ ≤ π 2 ;
E +-E -<0,E s-E p<0, π 2 ≤ θ ≤ 3 π 4 ; - - - ( 8 )
E +-E -<0,E s-E p>0, 3 π 4 ≤ θ ≤ π .
According to azimuth angle theta, can calculate ellipticity angle α and satisfy:
cos 2 α = E s - E p E s + E p 1 cos 2 θ - - - ( 9 )
Then the extinction ratio of polarized light is: ER = 1 tan 2 α = 1 + cos 2 α 1 - cos 2 α = 1 + E s - E p E s + E p 1 cos 2 θ 1 - E s - E p E s + E p 1 cos 2 θ - - - ( 10 )
Promptly obtained the extinction ratio ER and the long axis direction θ of incident light this moment.
The advantage of this method is: 1) basic vector measuring method of the present invention is real-time, can just can obtain basic vector direction and extinction ratio data after measuring 4 tunnel light intensity; 2) property transformed of this proving installation is strong, if the Si detector of this device makes single-photon detector into, also can measure the basic vector direction of polarization single photon; 3) this proving installation is portable strong, if half-wave plate is in 22.5 when spending in this proving installation, this measurement mechanism is exactly a quantum receiver module, can directly apply in the receiving end of quantum communications.Compare with other polarized light measurement devices, the real-time of its measurement is stronger.
Description of drawings
Fig. 1 is an index path of measuring polarized light characteristic device in real time.
Embodiment
Be described in detail below in conjunction with the embodiment of accompanying drawing the inventive method.
The main devices that is adopted among the present invention is described below:
1) unpolarized Amici prism 1: it is the prism of BS017 that unpolarized Amici prism adopts the Thorlabs model, and its Specifeca tion speeification: service band is 700-1100nm; Transmission, reflection beam splitting ratio are 1: 1, and clear aperture is 20mm;
2) half-wave plate 2: half-wave plate adopts the achromatism half-wave plate of Thorlabs, and model is AHWP05M-980, its Specifeca tion speeification: service band is 700-1200nm; Phase delay accuracy λ/40-λ/230;
3) one, No. two polarization splitting prism 3,4: polarization splitting prism adopts the wideband polarization Amici prism of Thorlabs, and model is PBS202, its Specifeca tion speeification: service band is 620-1200nm; Tp: Ts>1000: 1; Caliber size is 20mm, and effective aperture is greater than 80% of bore.
4) one, two, three, No. four Si detector 5,6,7,8: detector adopts the product of Thorlabs company, and model is PM120D, its Specifeca tion speeification: service band is 400-1100nm; The power test scope is 50nw-50mw; Probe is the Si detector.
The main optical path synoptic diagram of the inventive method as shown in Figure 1, concrete condition is described below:
1, tested polarized light is divided into two-way through behind the unpolarized Amici prism 1, wherein transmitted light carries out polarization spectro behind half-wave plate 2, a polarization splitting prism 3, two-beam is separately surveyed by first and second number detector 5,6, what measured this moment is the polarized component of non-S, P base, in order to express easily, at this position angle of getting half-wave plate is 22.5 °, this moment first and second number detector 5,6 measured value be respectively tested polarized light+45 ° and-45 ° of component value E +, E -
2, tested polarized light is divided into two-way through behind the unpolarized Amici prism 1, its reflected light has also carried out polarization spectro after through No. two polarization splitting prisms 4, S separately, P component are surveyed by third and fourth number detector 7,8, and the measured value of third and fourth number detector 7,8 is counted E respectively s, E p
3,4 tunnel ENERGY E of Ce Lianging s, E p, E +, E -Satisfy following relation with azimuth angle theta:
tan 2 θ = ( E s + E p ) ( E + - E - ) ( E s - E p ) ( E + + E - )
Wherein the scope of θ is passed through E +-E -And E s-E p+ ,-judge.Basis for estimation is as follows:
E +-E ->0,E s-E p>0, 0 ≤ θ ≤ π 4 ;
E +-E ->0,E s-E p<0, π 4 ≤ θ ≤ π 2 ;
E +-E -<0,E s-E p<0, π 2 ≤ θ ≤ 3 π 4 ;
E +-E -<0,E s-E p>0, 3 π 4 ≤ θ ≤ π .
4, the azimuth angle theta that calculates more than the basis, can calculate ellipticity angle α and satisfy:
cos 2 α = E s - E p E s + E p 1 cos 2 θ
Then the extinction ratio of polarized light is: ER = 1 tan 2 α = 1 + cos 2 α 1 - cos 2 α = 1 + E s - E p E s + E p 1 cos 2 θ 1 - E s - E p E s + E p 1 cos 2 θ .

Claims (1)

1. device of measuring in real time the polarized light characteristic, it comprises unpolarized Amici prism (1), half-wave plate (2), a polarization splitting prism (3), No. two polarization splitting prisms (4), a detector (5), No. two detectors (6), No. three detectors (7) and No. four detectors (8), it is characterized in that:
Described unpolarized Amici prism (1) is 1: 1 polarization insensitive spectroscope, S light and P reflection of light rate, transmissivity are differed less than 1%, simultaneously to the phase delay error range of S and P transmitted light within ± 3 °; The service band of described half-wave plate (2) covers the wavelength of tested polarized light source, and bore is 25mm, and residing position, its position angle makes catoptrical detection base be non-S, P base; The service band of a described polarization splitting prism (3) and No. two polarization splitting prisms (4) is consistent with half-wave plate (2); Described one, two, three, No. four detector (5,6,7,8) adopts the Si detector;
During measurement device, be divided into two-way behind the tested polarized light unpolarized Amici prism of process (1), its transmitted light carries out polarization spectro behind half-wave plate (2), a polarization splitting prism (3), and the two-beam that separates is surveyed by one, No. two detector (5,6) and received; Its reflected light has also carried out polarization spectro after through No. two polarization splitting prisms (4), and the S that separates, P component are surveyed by three, No. four detectors (7,8) and received; The luminous energy data that four detectors are received are carried out post-processed and are calculated the delustring bearing data when that obtains tested polarized light.
CN2011101651792A 2011-06-17 2011-06-17 Device for measuring properties of polarized light in real time Pending CN102243104A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2011101651792A CN102243104A (en) 2011-06-17 2011-06-17 Device for measuring properties of polarized light in real time

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2011101651792A CN102243104A (en) 2011-06-17 2011-06-17 Device for measuring properties of polarized light in real time

Publications (1)

Publication Number Publication Date
CN102243104A true CN102243104A (en) 2011-11-16

Family

ID=44961275

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2011101651792A Pending CN102243104A (en) 2011-06-17 2011-06-17 Device for measuring properties of polarized light in real time

Country Status (1)

Country Link
CN (1) CN102243104A (en)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102279052A (en) * 2011-06-21 2011-12-14 中国科学院上海技术物理研究所 Method for measuring characteristics of polarized light in real time
CN103776537A (en) * 2014-01-28 2014-05-07 华南师范大学 Polarized light Stokes parameter measuring device and optimization method thereof
CN104125057A (en) * 2013-04-25 2014-10-29 安徽问天量子科技股份有限公司 Optical apparatus of seawater polarization quantum key distribution
CN104897368A (en) * 2015-05-05 2015-09-09 上海大学 Real-time polarization maintaining fiber extinction ratio testing device
CN106500844A (en) * 2016-10-19 2017-03-15 武汉颐光科技有限公司 A kind of clematis stem road point amplitude high speed Stokes polarimeter and its measurement method of parameters
CN106643703A (en) * 2017-01-10 2017-05-10 曲阜师范大学 Polarized light navigation algorithm based on dielectric film polarization right-angle beam-splitting prism
CN107024417A (en) * 2017-05-02 2017-08-08 上海理工大学 Three dimensional particles field measurement device and method based on single-lens multi-pass optical field imaging
CN107833511A (en) * 2017-11-15 2018-03-23 中国工程物理研究院电子工程研究所 One kind optimization integrated form double light path laser ionisation effect simulation system
CN107886823A (en) * 2017-11-15 2018-04-06 中国工程物理研究院电子工程研究所 One kind optimization integrated form monochromatic light road laser ionization effect analog system
CN108036744A (en) * 2017-11-23 2018-05-15 华中科技大学 The large area dynamic measurement device and method of a kind of nano thin-film preparation process
CN109855737A (en) * 2017-11-30 2019-06-07 上海微电子装备(集团)股份有限公司 Measuring polarization state device and measurement method
CN112345078A (en) * 2020-10-27 2021-02-09 衡阳市智谷科技发展有限公司 Polarization measurement system based on light wave polarization state

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102080988A (en) * 2010-11-26 2011-06-01 中国科学院上海技术物理研究所 Device and method for detecting single photon polarization quantum state in real time

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102080988A (en) * 2010-11-26 2011-06-01 中国科学院上海技术物理研究所 Device and method for detecting single photon polarization quantum state in real time

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
覃兆宇等,: "偏振光斯托克斯参量的高速实时测量技术", 《光学学报》 *

Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102279052A (en) * 2011-06-21 2011-12-14 中国科学院上海技术物理研究所 Method for measuring characteristics of polarized light in real time
CN104125057A (en) * 2013-04-25 2014-10-29 安徽问天量子科技股份有限公司 Optical apparatus of seawater polarization quantum key distribution
CN104125057B (en) * 2013-04-25 2017-02-15 安徽问天量子科技股份有限公司 Optical apparatus of seawater polarization quantum key distribution
CN103776537A (en) * 2014-01-28 2014-05-07 华南师范大学 Polarized light Stokes parameter measuring device and optimization method thereof
CN103776537B (en) * 2014-01-28 2016-05-25 华南师范大学 A kind of measurement mechanism of polarised light stokes parameter and optimization method thereof
CN104897368B (en) * 2015-05-05 2018-08-07 上海大学 Polarization maintaining optical fibre extinction ratio real-time test device
CN104897368A (en) * 2015-05-05 2015-09-09 上海大学 Real-time polarization maintaining fiber extinction ratio testing device
CN106500844A (en) * 2016-10-19 2017-03-15 武汉颐光科技有限公司 A kind of clematis stem road point amplitude high speed Stokes polarimeter and its measurement method of parameters
CN106500844B (en) * 2016-10-19 2017-12-15 武汉颐光科技有限公司 A kind of six passages divide amplitude high speed Stokes polarimeter and its measurement method of parameters
CN106643703A (en) * 2017-01-10 2017-05-10 曲阜师范大学 Polarized light navigation algorithm based on dielectric film polarization right-angle beam-splitting prism
CN106643703B (en) * 2017-01-10 2020-01-31 曲阜师范大学 polarized light navigation method based on dielectric film polarized right-angle beam splitter prism
CN107024417A (en) * 2017-05-02 2017-08-08 上海理工大学 Three dimensional particles field measurement device and method based on single-lens multi-pass optical field imaging
CN107833511A (en) * 2017-11-15 2018-03-23 中国工程物理研究院电子工程研究所 One kind optimization integrated form double light path laser ionisation effect simulation system
CN107886823A (en) * 2017-11-15 2018-04-06 中国工程物理研究院电子工程研究所 One kind optimization integrated form monochromatic light road laser ionization effect analog system
CN107833511B (en) * 2017-11-15 2023-11-24 中国工程物理研究院电子工程研究所 Optimization integrated double-light-path laser ionization effect simulation system
CN107886823B (en) * 2017-11-15 2024-05-10 中国工程物理研究院电子工程研究所 Optimization integrated single-light-path laser ionization effect simulation system
CN108036744A (en) * 2017-11-23 2018-05-15 华中科技大学 The large area dynamic measurement device and method of a kind of nano thin-film preparation process
CN108036744B (en) * 2017-11-23 2019-06-11 华中科技大学 A kind of the large area dynamic measurement device and method of nano thin-film preparation process
CN109855737A (en) * 2017-11-30 2019-06-07 上海微电子装备(集团)股份有限公司 Measuring polarization state device and measurement method
CN112345078A (en) * 2020-10-27 2021-02-09 衡阳市智谷科技发展有限公司 Polarization measurement system based on light wave polarization state

Similar Documents

Publication Publication Date Title
CN102243104A (en) Device for measuring properties of polarized light in real time
CN102080988B (en) Device and method for detecting single photon polarization quantum state in real time
CN107576341B (en) Device and method for eliminating polarization fading in OFDR (offset frequency domain digital radiography)
CN102279052A (en) Method for measuring characteristics of polarized light in real time
CN102279094B (en) Apparatus and method for calibrating transmission axis of polaroid
CN104729402B (en) High-optical-subdivision grating interferometer based on plane mirrors
CN110631806B (en) Device and method for rapidly measuring phase delay amount of broadband wave plate
CN106597414A (en) Method for calibrating gain ratio of polarization lidar
CN202024877U (en) Device used for calibrating transmission axes of polaroid
CN104180776A (en) High-resolution roll angle measuring method and device based on heterodyne interferometric phase method
CN107782694A (en) Terahertz time-domain spectroscopy complete polarization electromagnetic scattering measuring system and acquisition methods
CN102426058B (en) Static interference imaging polarizer and method for acquiring polarization information of target
CN102620907B (en) Method for measuring phase delay angles of optical device
CN103017908A (en) Polarized light characteristic real-time measuring device and method based on four-way light splitting module
CN114324247A (en) Optical measurement method based on quantum weak measurement and dual-channel detection and application
CN102878953A (en) Precision angle measuring method and precision angle measuring device
CN101587011B (en) Method of measuring beat length of polarization maintaining optical fiber
CN102636333B (en) Device and method for measuring phase retardation and fast axis azimuth angle of wave plate in real time
US9841349B2 (en) Method for distributedly measuring polarization transmission matrices of optical fiber and system thereof
CN106908002B (en) A kind of measurement method based on spectral interference device
CN206514951U (en) The polarization spectrum characteristic measuring device of Terahertz material
US20190121048A1 (en) Optical fiber laying method by using archimedes spiral in optical frequency domain reflection
CN106813901A (en) The measurement apparatus and its measuring method of optics phase-delay quantity
CN106442336A (en) Polarization property testing method based on spectral analysis
CN102519712B (en) One-eighth wave plate phase retardation measurer and measuring method

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20111116