CN102230950B - Method for diagnosing apparatus internal electromagnetic interference failure - Google Patents
Method for diagnosing apparatus internal electromagnetic interference failure Download PDFInfo
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- CN102230950B CN102230950B CN 201110065833 CN201110065833A CN102230950B CN 102230950 B CN102230950 B CN 102230950B CN 201110065833 CN201110065833 CN 201110065833 CN 201110065833 A CN201110065833 A CN 201110065833A CN 102230950 B CN102230950 B CN 102230950B
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Abstract
The invention relates to a method for diagnosing apparatus internal electromagnetic interference failures. The method comprises the following steps: virtualising a normal working instrument with a computer and establishing a simulation model of internal electromagnetic interference failure of the instrument; observing the change situation of each parameter inside the instrument before and after the interference and determining the failed key parameters of the instrument can be detected; establishing an apparatus internal electromagnetic interference failure model in a shielded environment, analyzing the parameter information collected by a near field probe and determining the failure degree of the instrument; adopting a signal analytical method combining fusion wavelet transformation and independent component to analyze apparatus internal electromagnetic interference signals, classifying the failed models based on signal characteristic and failure degree and extracting key parameters to form a parameter database of the failed models; carrying out a dynamic feedback adjustment towards the failed model parameter database and continuously improving the method for diagnosing electromagnetic interference failures . According to the method, apparatus internal interferences are focused in the detection and the real-time property and accuracy of diagnosis in low frequency and high frequency areas of the signals.
Description
Technical field
The invention belongs to the technical field of electronic data acquisition and processing, particularly a kind of method of carrying out internal electromagnetic interference failure diagnosis.
Background technology
Along with the continuous increase that people require Quality of electronic products, the reliability of electronic equipment becomes an important parameter index.Failure analysis is as the important step that guarantees reliability of electronic equipment work, and study hotspot is electromagnetic interference (EMI) and the diagnostic method that causes electronic device to lose efficacy at present.Yet existing EMI failure diagnosis all concentrates the diagnosis external electromagnetic interference on the impact of electronic devices and components, and has ignored the electromagnetic interference (EMI) of the electronic device inside of some high integration.Simultaneously, existing failure diagnosis technology emphasizes particularly on different fields a little, wherein the Fourier transform failure analytical approach can only be done the macroscopic view diagnosis, the wavelet transformation failure analytical approach can not be processed the electromagnetic interference signal of broadband, Independent component analysis effect when processing the undesired signal in indefinite source is relatively poor, can not take into account the high request of instrument electromagnetic interference (EMI) failure diagnosis real-time, reliability.In addition, various electromagnetic interference (EMI) failure models have similarity, can sorted generalization sum up its useful parameter in order to use when inquiring about in the future, improve the speed of failure diagnosis, and there is no at present this type of database.Therefore, provide a kind of electronic device internal electromagnetic of diagnosing fast, accurately to disturb the method for failure degree to necessitate.
Summary of the invention
The present invention is based on above-mentioned background, can not satisfy simultaneously the problem of real-time and reliability requirement for diagnosing apparatus internal electromagnetic interference failure, propose a kind of internal electromagnetic that merges wavelet transformation and isolated component method analytic signal and modeling and disturbed the diagnostic method that lost efficacy.The method is classified according to the different qualities of electromagnetic interference signal, sets up corresponding failure mechanism model, has realized the diagnosis fast and accurately to the electronic device inefficacy.
A kind of diagnostic method that lost efficacy by the instrument internal electromagnetic interference (EMI) of wavelet transformation and isolated component modeling, comprise the following steps: with the instrument of a normal operation of computer virtual and set up its internal electromagnetic and disturb the realistic model that lost efficacy, the situation of change of instrument internal parameters before and after observation is disturbed is determined the key parameter that the energy detecting instrument lost efficacy; Set up instrument internal electromagnetic interference (EMI) failure model in the shielding environment, analyze the parameter information that near field probes gathers, the failure degree of judgement instrument; Adopt the KLR signal approach analytical instrument internal electromagnetic undesired signal that merges wavelet transformation and isolated component, failure model is pressed signal characteristic and failure degree classification, and extract the parameter database that key parameter forms failure model; The failure model parameter database of setting up is carried out dynamic feedback adjusting, the failure diagnosis method of Continual Improvement electromagnetic interference (EMI).
The method of carrying out instrument internal electromagnetic interference (EMI) failure simulation under virtual state comprises the following steps: adopt Multisim software to disturb failure model to be converted into computer simulation model internal electromagnetic; With contingent various complex electromagnetic environments, electromagnetic interference (EMI) that inductance, electric capacity as integrated in instrument inside is mutual etc. is loaded into one by one and carries out Analysis of Failure Mechanism on this model.
The method of setting up actual shielding environment disturbs for add the feeromagnetic metal cover of ground connection in the instrument outside internal electromagnetic that only has instrument self in cover.
The near field probes of this collection internal electromagnetic undesired signal and the detection range of tested instrument are in 10 centimetres.
The method that improves the near field probes precision is at the probe built-in low noise amplifier of front end and line impedance stabilization net work.
Analyze actual acquisition to the internal electromagnetic undesired signal time adopt the following step: the frequency of the aliasing electromagnetic interference signal that judgement collects, if low frequency signal, directly with the wavelet transformation under different scale, each isolated component is carried out the refinement analysis, seek the time of origin of each component frequency with different shift factors, produced overproof electromagnetic interference (EMI) with which parts of determining instrument and caused instrument to lose efficacy; If signal is high-frequency signal, first carry out feature extraction and model analysis with the isolated component method, until substantially recover signal source original independent signal component as can be known, and then carry out wavelet analysis.
Compared to prior art, the advantage of the diagnostic method that described electromagnetic interference (EMI) lost efficacy is to carry out signal analysis by combined with wavelet transformed and isolated component method, makes this failure diagnosis method at low frequency and the high-frequency region of signal, higher resolution be arranged.Simultaneously, instrument internal electromagnetic interference (EMI) failure model is classified by the feature of undesired signal and the failure degree of instrument, and extract the parameter database that key parameter arranges the formation failure model, for later failure diagnosis provides reference data, improve the real-time of failure degree judgement.In addition, this method has adopted low noise amplifier built-in and the near field probes of line impedance stabilization net work, has higher sensitivity, more can realize accurate location to the near-field interference source than diagnostic method in the past.
Description of drawings
Fig. 1 is the schematic flow sheet of the failure diagnosis method disturbed of the internal electromagnetic of the embodiment of the present invention.
Fig. 2 sets up by carrying out virtual emulation the schematic flow sheet that actual electromagnetic is disturbed failure model in the embodiment of the present invention.
Fig. 3 is the schematic diagram of Fig. 1 measurement mechanism used.
Fig. 4 analyzes the schematic flow sheet of actual acquisition signal in conjunction with wavelet analysis and isolated component method in the embodiment of the present invention.
Embodiment
The present invention is described in further detail below in conjunction with accompanying drawing.
See also Fig. 1, a kind of diagnostic method that lost efficacy based on the instrument internal electromagnetic interference (EMI) of wavelet transformation and the modeling of isolated component method that the embodiment of the present invention provides mainly is comprised of following steps.
Step 1: provide the electronic device of a normal operation as tested instrument, and simulate its duty with computing machine.
Adopting Multisim software in the present embodiment is computer simulation model with the normal operation model conversation of electronic device 1.
Step 2: adopt Multisim software to set up instrument 1 internal electromagnetic under virtual environment and disturb the realistic model that lost efficacy, see also Fig. 2, with contingent various complex electromagnetic environments, electromagnetic interference (EMI) that inductance, electric capacity as integrated in instrument inside is mutual etc., one by one, integrally be carried on this model, carry out the Analysis of Failure Mechanism under virtual environment.Observation is subject to the situation of change of instrument internal parameters before and after electromagnetic interference (EMI), determines to affect the key parameter of instrument failure degree.
Step 3: the structure instrument internal electromagnetic interference (EMI) failure model under the shielding environment: see also Fig. 3, adopt mild carbon steel to build radome 2, inwall pastes polyethylene film 3 insulation, and connecting instrument 1 with special wire 4 derives radome 2 external grounds.Near field probes 5 is placed in radome, and the critical parameter information in the scope of ten centimetres, distance instrument in acquisition step two reaches analyser 6, the failure degree of judgement instrument.
In the present embodiment, in order to improve the degree of accuracy of diagnostic method, at the built-in low noise amplifier 7 of near field probes front end, improve the sensitivity of near field probes, the connection line impedance stable network 8 of popping one's head in again, to the power input filtering from AC power, self the circuit conducted noise of preventing from popping one's head in is gathered by mistake.
Step 4: in the present embodiment, analyser 6 is in conjunction with instrument failure degree information, adopt the signal analysis method analytical instrument internal electromagnetic undesired signal that merges wavelet transformation and isolated component, the failure model of instrument internal electromagnetic interference (EMI) is classified by feature and the instrument failure degree of undesired signal, and extract the parameter database that key parameter forms failure model
In the present embodiment, step 4 is further comprising the steps:
The frequency of the aliasing electromagnetic interference signal that judgement collects, if low frequency signal, directly by the calculation functions such as flexible and translation on time and frequency, each isolated component is carried out multiscale analysis with the wavelet transformation under different scale, seek the time of origin of each component frequency with different shift factors, produced overproof electromagnetic interference (EMI) with which parts of determining instrument and caused instrument to lose efficacy;
If signal is high-frequency signal, first carry out feature extraction and model analysis with the isolated component method, until substantially recover signal source original independent signal component as can be known, and then carry out wavelet analysis;
Classification is summed up internal electromagnetic and is disturbed failure model and extract key parameter formation database, makes when carrying out failure diagnosis in the future and can find fast respective type, improves the speed of diagnosis.
Step 5: failure diagnosis method performance evaluation research, namely the database that forms is carried out dynamic feedback adjusting and control, the failure diagnosis method of Continual Improvement electromagnetic interference (EMI).
In addition, those skilled in the art also can do other variations in spirit of the present invention, and certainly, the variation that these are done according to spirit of the present invention is within all should being included in the present invention's scope required for protection.
Claims (6)
1. the diagnostic method that lost efficacy of an instrument internal electromagnetic interference (EMI), it comprises the following steps:
With the instrument of a normal operation of computer virtual and set up its internal electromagnetic and disturb the realistic model that lost efficacy, observe the situation of change of instrument internal parameters before and after being disturbed, determine the key parameter that can detecting instrument loses efficacy;
Set up instrument internal electromagnetic interference (EMI) failure model in the shielding environment, near field probes is placed in described shielding environment, is used for gathering described key parameter, analyzes the key parameter that near field probes gathers, the failure degree of judgement instrument;
Adopt the signal analysis method analytical instrument internal electromagnetic undesired signal that merges wavelet transformation analysis method and isolated component method, failure model is pressed signal characteristic and failure degree classification, and extract the parameter database that key parameter forms failure model;
The failure model parameter database of setting up is carried out dynamic feedback adjusting, the failure diagnosis method of Continual Improvement electromagnetic interference (EMI).
2. the diagnostic method that lost efficacy of instrument internal electromagnetic interference (EMI) as claimed in claim 1 is characterized in that: described with a normal operation of computer virtual instrument and set up its internal electromagnetic and disturb the realistic model of inefficacy to comprise the following steps:
Adopt will the work internal electromagnetic interference failure model of instrument of Multisim software to be converted into computer simulation model;
The inductance that instrument internal is integrated, the mutual contingent electromagnetic interference (EMI) of electric capacity are loaded into one by one and carry out Analysis of Failure Mechanism on this model.
3. the diagnostic method that lost efficacy of instrument internal electromagnetic interference (EMI) as claimed in claim 1 is characterized in that: the method for setting up described shielding environment disturbs for add the feeromagnetic metal cover of ground connection in the instrument outside internal electromagnetic that only has instrument self in cover.
4. the diagnostic method that lost efficacy of instrument internal electromagnetic interference (EMI) as claimed in claim 1 is characterized in that: described near field probes to the detection range of described instrument in 10 centimetres.
5. the diagnostic method that lost efficacy of instrument internal electromagnetic interference (EMI) as claimed in claim 1, is characterized in that: at the built-in low noise amplifier of described near field probes front end and line impedance stabilization net work, be used for improving the precision of described near field probes.
6. the diagnostic method that lost efficacy of instrument internal electromagnetic interference (EMI) as claimed in claim 1, it is characterized in that: the signal analysis method analytical instrument internal electromagnetic undesired signal concrete steps that wavelet transformation analysis method and isolated component method are merged in described employing are as follows:
The frequency of the aliasing electromagnetic interference signal that judgement collects, if low frequency signal, directly with the wavelet transformation under different scale, each isolated component is carried out the refinement analysis, seek the time of origin of each component frequency with different shift factors, produced overproof electromagnetic interference (EMI) with which parts of determining instrument and caused instrument to lose efficacy;
If signal is high-frequency signal, first carry out feature extraction and model analysis with the isolated component method, until substantially recover signal source original independent signal component as can be known, and then carry out wavelet analysis.
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| CN 201110065833 CN102230950B (en) | 2011-03-18 | 2011-03-18 | Method for diagnosing apparatus internal electromagnetic interference failure |
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| CN 201110065833 CN102230950B (en) | 2011-03-18 | 2011-03-18 | Method for diagnosing apparatus internal electromagnetic interference failure |
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| CN103197183B (en) * | 2013-01-11 | 2015-08-19 | 北京航空航天大学 | A kind of method revising Independent component analysis uncertainty in electromagnetic interference (EMI) separation |
| CN111353410B (en) * | 2020-02-25 | 2023-04-28 | 北京师范大学珠海分校 | Electromagnetic interference analysis method, device, equipment and storage medium |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1132745A2 (en) * | 2000-03-08 | 2001-09-12 | Matsushita Electric Industrial Co., Ltd. | Electromagnetic interference analysis method and apparatus |
| CN101493486A (en) * | 2009-02-17 | 2009-07-29 | 中兴通讯股份有限公司 | Apparatus and method for diagnosing electromagnetic interference |
| CN101701986A (en) * | 2009-10-27 | 2010-05-05 | 中国舰船研究设计中心 | System for pre-testing and diagnosing electro magnetic interference of electronic equipment and method thereof |
| CN101819252A (en) * | 2009-11-23 | 2010-09-01 | 电子科技大学 | Analog-circuit fault diagnosis method |
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1132745A2 (en) * | 2000-03-08 | 2001-09-12 | Matsushita Electric Industrial Co., Ltd. | Electromagnetic interference analysis method and apparatus |
| CN101493486A (en) * | 2009-02-17 | 2009-07-29 | 中兴通讯股份有限公司 | Apparatus and method for diagnosing electromagnetic interference |
| CN101701986A (en) * | 2009-10-27 | 2010-05-05 | 中国舰船研究设计中心 | System for pre-testing and diagnosing electro magnetic interference of electronic equipment and method thereof |
| CN101819252A (en) * | 2009-11-23 | 2010-09-01 | 电子科技大学 | Analog-circuit fault diagnosis method |
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