CN102230950A - Method for diagnosing apparatus internal electromagnetic interference failure - Google Patents
Method for diagnosing apparatus internal electromagnetic interference failure Download PDFInfo
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- CN102230950A CN102230950A CN2011100658332A CN201110065833A CN102230950A CN 102230950 A CN102230950 A CN 102230950A CN 2011100658332 A CN2011100658332 A CN 2011100658332A CN 201110065833 A CN201110065833 A CN 201110065833A CN 102230950 A CN102230950 A CN 102230950A
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Abstract
The invention relates to a method for diagnosing apparatus internal electromagnetic interference failures. The method comprises the following steps: virtualising a normal working instrument with a computer and establishing a simulation model of internal electromagnetic interference failure of the instrument; observing the change situation of each parameter inside the instrument before and after the interference and determining the failed key parameters of the instrument can be detected; establishing an apparatus internal electromagnetic interference failure model in a shielded environment, analyzing the parameter information collected by a near field probe and determining the failure degree of the instrument; adopting a signal analytical method combining fusion wavelet transformation and independent component to analyze apparatus internal electromagnetic interference signals, classifying the failed models based on signal characteristic and failure degree and extracting key parameters to form a parameter database of the failed models; carrying out a dynamic feedback adjustment towards the failed model parameter database and continuously improving the method for diagnosing electromagnetic interference failures . According to the method, apparatus internal interferences are focused in the detection and the real-time property and accuracy of diagnosis in low frequency and high frequency areas of the signals.
Description
Technical field
The invention belongs to the technical field of electronic data acquisition and processing, particularly a kind of method of carrying out internal electromagnetic interference failure diagnosis.
Background technology
Along with the continuous increase of people to the electronic product quality requirements, the reliability of electronic equipment becomes an important parameter index.Failure analysis is as the important step that guarantees reliability of electronic equipment work, studies at present that focus is electromagnetic interference (EMI) and the diagnostic method that causes electronic device to lose efficacy.Yet existing EMI failure diagnosis is all concentrated the influence of diagnosis external electromagnetic interference to electronic devices and components, and has ignored the electromagnetic interference (EMI) of the electronic device inside of some high integration.Simultaneously, existing failure diagnosis technology emphasizes particularly on different fields a little, wherein the Fourier transform failure analytical approach can only be done the macroscopic view diagnosis, the wavelet transformation failure analytical approach can not be handled the electromagnetic interference signal of broadband, independent component analysis method effect when handling the undesired signal in indeterminate source is relatively poor, can not take into account the high request of instrument electromagnetic interference (EMI) failure diagnosis real-time, reliability.In addition, various electromagnetic interference (EMI) failure models have similarity, can sorted generalization sum up its useful parameter so that use when inquiring about in the future, improve the speed of failure diagnosis, and there is no this type of database at present.Therefore, provide a kind of electronic device internal electromagnetic of diagnosing fast, accurately to disturb the method for failure degree to necessitate.
Summary of the invention
The present invention is based on above-mentioned background, can not satisfy the problem of real-time and reliability requirement simultaneously at instrument internal electromagnetic interference (EMI) failure diagnosis, propose a kind of internal electromagnetic that merges wavelet transformation and isolated component method analytic signal and modeling and disturbed the diagnostic method that lost efficacy.This method is classified according to the different qualities of electromagnetic interference signal, sets up corresponding failure mechanism model, has realized the diagnosis fast and accurately to the electronic device inefficacy.
A kind of diagnostic method that lost efficacy by the instrument internal electromagnetic interference (EMI) of wavelet transformation and isolated component modeling, may further comprise the steps: with the instrument of an operate as normal of computer virtual and set up its internal electromagnetic and disturb the realistic model that lost efficacy, the situation of change of instrument internal parameters before and after observation is disturbed is determined the key parameter that the energy detecting instrument lost efficacy; In the shielding environment, set up instrument internal electromagnetic interference (EMI) failure model, analyze the parameter information that near field probes is gathered, judge the failure degree of instrument; Adopt the signal analysis method analytical instrument internal electromagnetic undesired signal that merges wavelet transformation and isolated component, failure model is pressed signal characteristic and failure degree classification, and extract the parameter database that key parameter forms failure model; The failure model parameter database of being set up is carried out dynamic feedback adjusting, the failure diagnosis method of Continual Improvement electromagnetic interference (EMI).
Carrying out instrument internal electromagnetic interference (EMI) inefficacy method of emulation under the virtual state may further comprise the steps: adopt Multisim software to disturb failure model to be converted into computer simulation model internal electromagnetic; With contingent various complex electromagnetic environments,, be loaded into one by one and carry out Analysis of Failure Mechanism on this model as mutual electromagnetic interference (EMI) of the integrated inductance in instrument inside, electric capacity etc.
Setting up the method for actual shielding environment disturbs for adding the feeromagnetic metal cover of ground connection in the instrument outside, make the internal electromagnetic that only has instrument self in the cover.
The near field probes of this collection internal electromagnetic undesired signal and the detection range of tested instrument are in 10 centimetres.
The method that improves the near field probes precision is at probe built-in low noise amplifier of front end and line impedance stabilization net work.
Analyze actual acquisition to the internal electromagnetic undesired signal time adopt the following step: the frequency of judging the aliasing electromagnetic interference signal that collects, if low frequency signal, then directly each isolated component is carried out the refinement analysis with the wavelet transformation under the different scale, seek the time of origin of each component frequency with different shift factors, produced overproof electromagnetic interference (EMI) with which parts of determining instrument and caused instrument to lose efficacy; If signal is high-frequency signal, then earlier carry out feature extraction and model analysis with the isolated component method, up to recovering signal source original independent signal component as can be known substantially, and then carry out wavelet analysis.
Compared to prior art, the advantage of the diagnostic method that described electromagnetic interference (EMI) lost efficacy is to carry out signal analysis by combined with wavelet transformed and isolated component method, makes this failure diagnosis method at the low frequency and the high-frequency region of signal higher resolution be arranged all.Simultaneously, instrument internal electromagnetic interference (EMI) failure model is classified by the feature of undesired signal and the failure degree of instrument, and extract the parameter database that the key parameter arrangement forms failure model, for later failure diagnosis provides reference data, improve the real-time that failure degree is judged.In addition, this method has adopted low noise amplifier built-in and the near field probes of line impedance stabilization net work, has higher sensitivity, more can realize accurate location to the near-field interference source than diagnostic method in the past.
Description of drawings
Fig. 1 is the schematic flow sheet of the failure diagnosis method disturbed of the internal electromagnetic of the embodiment of the invention.
Fig. 2 is for setting up the schematic flow sheet that actual electromagnetic is disturbed failure model by carrying out virtual emulation in the embodiment of the invention.
Fig. 3 is the synoptic diagram of the used measurement mechanism of Fig. 1.
Fig. 4 is a schematic flow sheet of analyzing the actual acquisition signal in the embodiment of the invention in conjunction with wavelet analysis and isolated component method.
Embodiment
The present invention is described in further detail below in conjunction with accompanying drawing.
See also Fig. 1, a kind of diagnostic method that lost efficacy based on the instrument internal electromagnetic interference (EMI) of wavelet transformation and the modeling of isolated component method that the embodiment of the invention provides mainly is made up of following steps.
Step 1: the electronic device that an operate as normal is provided is as tested instrument, and simulates its duty with computing machine.
Adopting Multisim software in the present embodiment is computer simulation model with the operate as normal model conversation of electronic device 1.
Step 2: adopt Multisim software under virtual environment, to set up instrument 1 internal electromagnetic and disturb the realistic model that lost efficacy, see also Fig. 2, with contingent various complex electromagnetic environments, as mutual electromagnetic interference (EMI) of the integrated inductance in instrument inside, electric capacity etc., one by one, integrally be carried on this model, carry out the Analysis of Failure Mechanism under the virtual environment.Observation is subjected to the situation of change of electromagnetic interference (EMI) front and back instrument internal parameters, determines to influence the key parameter of instrument failure degree.
Step 3: the structure instrument internal electromagnetic interference (EMI) failure model under the shielding environment: see also Fig. 3, adopt mild carbon steel to build radome 2, inwall pastes polyethylene film 3 insulation, and connecting instrument 1 with special wire 4 derives radome 2 external grounds.Near field probes 5 is placed radome, and the critical parameter information in the scope of ten centimetres in distance instrument in the acquisition step two reaches analyser 6, judges the failure degree of instrument.
In the present embodiment, in order to improve the degree of accuracy of diagnostic method, at the built-in low noise amplifier 7 of near field probes front end, improve the sensitivity of near field probes, the connection line impedance stable network 8 of will popping one's head in again, to the power input filtering from AC power, self the circuit conducted noise of preventing to pop one's head in is gathered by mistake.
Step 4: in the present embodiment, analyser 6 is in conjunction with instrument failure degree information, adopt the signal analysis method analytical instrument internal electromagnetic undesired signal that merges wavelet transformation and isolated component, the failure model of instrument internal electromagnetic interference (EMI) is classified by the feature and the instrument failure degree of undesired signal, and extract the parameter database that key parameter forms failure model
In the present embodiment, step 4 further may further comprise the steps:
Judge the frequency of the aliasing electromagnetic interference signal that collects, if low frequency signal, then directly by the calculation functions such as flexible and translation on time and frequency each isolated component is carried out multiscale analysis with the wavelet transformation under the different scale, seek the time of origin of each component frequency with different shift factors, produced overproof electromagnetic interference (EMI) with which parts of determining instrument and caused instrument to lose efficacy;
If signal is high-frequency signal, then earlier carry out feature extraction and model analysis with the isolated component method, up to recovering signal source original independent signal component as can be known substantially, and then carry out wavelet analysis;
Classification is summed up internal electromagnetic and is disturbed failure model and extract key parameter formation database, makes when carrying out failure diagnosis in the future and can find respective type fast, improves the speed of diagnosis.
Step 5: failure diagnosis method performance evaluation research, promptly the database that forms is carried out dynamic feedback adjusting control, the failure diagnosis method of Continual Improvement electromagnetic interference (EMI).
In addition, those skilled in the art also can do other variations in spirit of the present invention, and certainly, the variation that these are done according to spirit of the present invention all should be included within the present invention's scope required for protection.
Claims (6)
1. the diagnostic method that lost efficacy of an instrument internal electromagnetic interference (EMI), it may further comprise the steps:
With the instrument of an operate as normal of computer virtual and set up its internal electromagnetic and disturb the realistic model that lost efficacy, observe the situation of change of instrument internal parameters before and after being disturbed, determine the key parameter that can detecting instrument loses efficacy;
In the shielding environment, set up instrument internal electromagnetic interference (EMI) failure model, analyze the parameter information that near field probes is gathered, judge the failure degree of instrument;
Adopt the signal analysis method analytical instrument internal electromagnetic undesired signal that merges wavelet transformation and isolated component, failure model is pressed signal characteristic and failure degree classification, and extract the parameter database that key parameter forms failure model;
The failure model parameter database of being set up is carried out dynamic feedback adjusting, the failure diagnosis method of Continual Improvement electromagnetic interference (EMI).
2. the diagnostic method that instrument internal electromagnetic interference (EMI) as claimed in claim 1 lost efficacy is characterized in that: carry out instrument internal electromagnetic interference (EMI) inefficacy method of emulation under the virtual state and may further comprise the steps:
Adopt Multisim software to disturb failure model to be converted into computer simulation model internal electromagnetic;
With contingent various complex electromagnetic environments,, be loaded into one by one and carry out Analysis of Failure Mechanism on this model as mutual electromagnetic interference (EMI) of the integrated inductance in instrument inside, electric capacity etc.
3. the diagnostic method that instrument internal electromagnetic interference (EMI) as claimed in claim 1 lost efficacy is characterized in that: the method for setting up actual shielding environment is disturbed for adding the feeromagnetic metal cover of ground connection in the instrument outside, make the internal electromagnetic that only has instrument self in the cover.
4. the diagnostic method that instrument internal electromagnetic interference (EMI) as claimed in claim 1 lost efficacy is characterized in that: the near field probes of collection internal electromagnetic undesired signal and the detection range of tested instrument are in 10 centimetres.
5. as the diagnostic method of claims 1 described instrument internal electromagnetic interference (EMI) inefficacy, it is characterized in that: the method that improves the near field probes precision is at probe built-in low noise amplifier of front end and line impedance stabilization net work.
6. the diagnostic method that instrument internal electromagnetic interference (EMI) as claimed in claim 1 lost efficacy is characterized in that: adopt the following step when analyzing the internal electromagnetic undesired signal that actual acquisition arrives:
Judge the frequency of the aliasing electromagnetic interference signal that collects, if low frequency signal, then directly each isolated component is carried out the refinement analysis with the wavelet transformation under the different scale, seek the time of origin of each component frequency with different shift factors, produced overproof electromagnetic interference (EMI) with which parts of determining instrument and caused instrument to lose efficacy;
If signal is high-frequency signal, then earlier carry out feature extraction and model analysis with the isolated component method, up to recovering signal source original independent signal component as can be known substantially, and then carry out wavelet analysis.
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| CN 201110065833 CN102230950B (en) | 2011-03-18 | 2011-03-18 | Method for diagnosing apparatus internal electromagnetic interference failure |
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| CN 201110065833 CN102230950B (en) | 2011-03-18 | 2011-03-18 | Method for diagnosing apparatus internal electromagnetic interference failure |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103197183A (en) * | 2013-01-11 | 2013-07-10 | 北京航空航天大学 | Method for correcting uncertainty of independent component analytical method in electromagnetic interference separation |
| CN111353410A (en) * | 2020-02-25 | 2020-06-30 | 北京师范大学珠海分校 | Electromagnetic interference analysis method, device, equipment and storage medium |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| EP1132745A2 (en) * | 2000-03-08 | 2001-09-12 | Matsushita Electric Industrial Co., Ltd. | Electromagnetic interference analysis method and apparatus |
| CN101493486A (en) * | 2009-02-17 | 2009-07-29 | 中兴通讯股份有限公司 | Apparatus and method for diagnosing electromagnetic interference |
| CN101701986A (en) * | 2009-10-27 | 2010-05-05 | 中国舰船研究设计中心 | System for pre-testing and diagnosing electro magnetic interference of electronic equipment and method thereof |
| CN101819252A (en) * | 2009-11-23 | 2010-09-01 | 电子科技大学 | Analog-circuit fault diagnosis method |
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1132745A2 (en) * | 2000-03-08 | 2001-09-12 | Matsushita Electric Industrial Co., Ltd. | Electromagnetic interference analysis method and apparatus |
| CN101493486A (en) * | 2009-02-17 | 2009-07-29 | 中兴通讯股份有限公司 | Apparatus and method for diagnosing electromagnetic interference |
| CN101701986A (en) * | 2009-10-27 | 2010-05-05 | 中国舰船研究设计中心 | System for pre-testing and diagnosing electro magnetic interference of electronic equipment and method thereof |
| CN101819252A (en) * | 2009-11-23 | 2010-09-01 | 电子科技大学 | Analog-circuit fault diagnosis method |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103197183A (en) * | 2013-01-11 | 2013-07-10 | 北京航空航天大学 | Method for correcting uncertainty of independent component analytical method in electromagnetic interference separation |
| CN103197183B (en) * | 2013-01-11 | 2015-08-19 | 北京航空航天大学 | A kind of method revising Independent component analysis uncertainty in electromagnetic interference (EMI) separation |
| CN111353410A (en) * | 2020-02-25 | 2020-06-30 | 北京师范大学珠海分校 | Electromagnetic interference analysis method, device, equipment and storage medium |
| CN111353410B (en) * | 2020-02-25 | 2023-04-28 | 北京师范大学珠海分校 | Electromagnetic interference analysis method, device, equipment and storage medium |
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