CN102221815A - Cross test method of quartz watch movement - Google Patents
Cross test method of quartz watch movement Download PDFInfo
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- CN102221815A CN102221815A CN 201010148925 CN201010148925A CN102221815A CN 102221815 A CN102221815 A CN 102221815A CN 201010148925 CN201010148925 CN 201010148925 CN 201010148925 A CN201010148925 A CN 201010148925A CN 102221815 A CN102221815 A CN 102221815A
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Abstract
The invention relates to a cross test method of a quartz watch movement. The method is mainly used to solve a test efficiency problem. The scheme comprises the following steps that: a hardware system consists of a multichannel intelligence tester (multichannel intelligence testers) and a multi-plate test console; a test period T of every test system generally comprises four periods: plate installation time T1, test time T2, defective product marking time T3 and plate unloading time T4, wherein T equals to T1 plus T2 plus T3 plus T4 and T2 approximately equals T3 plus T4 plus T1. By using the scheme, two sets of test systems can be managed. When the test is performed by one set of the test systems, auxiliary works, such as marking, plate unloading, plate installation and the like, are performed by the other set of the test systems. The two systems do cross works in cycles. Test efficiency can be raised by times and test result can be verified crosswise.
Description
Technical field
The present invention relates to a kind of method of testing of Quartzcrystal watch movement.
Background technology
Whether at present, in the quartz watch production run, generally adopt microampere meter in a row, the state and the parameter of test Quartzcrystal watch movement: whether positive negative pulse stuffing is arranged, have and end a second function, whether quiescent current transfinites etc. if generally needing test.Time-consuming, effort, careless omission easily, erroneous judgement easily.
Summary of the invention
Technical scheme: constitute hardware system by multi-channel intelligent tester and many board tests platform, the test period T of every cover test macro generally comprises 4 periods: upper plate time T 1, test duration T2, defective products mark time T 3, lower plate time T 4, that is: T=T1+T2+T3+T4, and T2 ≈ T3+T4+T1.Manage two covers at the same time during test macros, when wherein one being enclosed within when testing, pack into less important works such as row labels, lower plate, upper plate to other one, go round and begin again two cover system cross-operation.
Test board is made of base plate, drop front, cylinder, base plate is used for the location and settles all flaps, drop front is used for fixing the flexibility test pin, by wire harness and testing needle, the corresponding terminal of node that needs on the movement to test and multi-channel intelligent tester is linked together.
The multi-channel intelligent tester generally comprises basic modules such as power supply, signals collecting, signal Processing, demonstration.
Advantage: improve testing efficiency, mutually the check test result.
Description of drawings
Accompanying drawing is the process flow chart of two cover test macros, on sequential, and the test duration T2 of a cover, corresponding another set of mark time T 3, lower plate time T 4, upper plate time T 1 are gone round and begun again.
Embodiment
Testing tool adopts the multi-channel intelligent tester, can test the dozens of movement simultaneously, and the general test time is in 5-10 second.Test board adopts many board tests platform.One overlaps test macro by board test platform more than, corresponding one or more multi-channel intelligent tester.2 cover test macros are settled in a test post, and cross-beta can significantly improve testing efficiency.
Claims (1)
1. the cross-beta method of a Quartzcrystal watch movement, constitute hardware system by multi-channel intelligent tester and many board tests platform, the test period T of every cover test macro generally comprises 4 periods: upper plate time T 1, test duration T2, defective products mark time T 3, lower plate time T 4, that is: T=T1+T2+T3+T4, and T2 ≈ T3+T4+T1, it is characterized in that: when managing two cover test macros simultaneously, when wherein one being enclosed within when testing, pack into less important works such as row labels, lower plate, upper plate to other one, go round and begin again two cover system cross-operation.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010148925 CN102221815A (en) | 2010-04-19 | 2010-04-19 | Cross test method of quartz watch movement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010148925 CN102221815A (en) | 2010-04-19 | 2010-04-19 | Cross test method of quartz watch movement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102221815A true CN102221815A (en) | 2011-10-19 |
Family
ID=44778391
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201010148925 Pending CN102221815A (en) | 2010-04-19 | 2010-04-19 | Cross test method of quartz watch movement |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102221815A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104460298A (en) * | 2013-09-16 | 2015-03-25 | 无锡百科知识产权有限公司 | Test method of timepiece movements |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2253286A (en) * | 1991-02-27 | 1992-09-02 | Tina Mary Douglas | Testing apparatus for timing devices |
| CH688533GA3 (en) * | 1995-04-07 | 1997-11-14 | Witschi Electronic Ag | Testing method for analogue quartz watch |
| JP2001343474A (en) * | 2000-06-02 | 2001-12-14 | Seiko Epson Corp | Electronic timepiece, control method for the electronic timepiece and inspection system for the electronic timepiece |
| CN1347521A (en) * | 1999-04-21 | 2002-05-01 | 康塞尔斯及制造Vlg有限公司 | Clockwork comprising microgenerator and testing method for clockworks |
-
2010
- 2010-04-19 CN CN 201010148925 patent/CN102221815A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2253286A (en) * | 1991-02-27 | 1992-09-02 | Tina Mary Douglas | Testing apparatus for timing devices |
| CH688533GA3 (en) * | 1995-04-07 | 1997-11-14 | Witschi Electronic Ag | Testing method for analogue quartz watch |
| CN1347521A (en) * | 1999-04-21 | 2002-05-01 | 康塞尔斯及制造Vlg有限公司 | Clockwork comprising microgenerator and testing method for clockworks |
| JP2001343474A (en) * | 2000-06-02 | 2001-12-14 | Seiko Epson Corp | Electronic timepiece, control method for the electronic timepiece and inspection system for the electronic timepiece |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104460298A (en) * | 2013-09-16 | 2015-03-25 | 无锡百科知识产权有限公司 | Test method of timepiece movements |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20111019 |