CN102218900B - Method for detecting overprint errors of photogravure press on the basis of field programmable gate array (FPGA) - Google Patents
Method for detecting overprint errors of photogravure press on the basis of field programmable gate array (FPGA) Download PDFInfo
- Publication number
- CN102218900B CN102218900B CN201110076300A CN201110076300A CN102218900B CN 102218900 B CN102218900 B CN 102218900B CN 201110076300 A CN201110076300 A CN 201110076300A CN 201110076300 A CN201110076300 A CN 201110076300A CN 102218900 B CN102218900 B CN 102218900B
- Authority
- CN
- China
- Prior art keywords
- pulse
- encoder
- signal
- fpga
- system clock
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Abstract
The invention discloses a method for detecting overprint errors of a photogravure press on the basis of a field programmable gate array (FPGA). The method comprises the following steps of: (1) taking a pulse signal after detecting a color code by two photoelectric eyes as a detecting pulse; (2) taking pulses A and B of an encoder as reference pulses and clock signals of an encoder pulse counter, taking a high-frequency clock in the FPGA as a clock signal of a system clock counter, and determining actual position values of the two photoelectric eyes according to an encoder pulse counter value corresponding to the detecting pulse, a system clock counter value, and system clock count value respectively corresponding to two pulses adjacent to the reference pulses respectively corresponding to two detecting pulses; and (3) determining the pulse count of the two photoelectric eyes within a time interval, wherein the arithmetic product of the pulse count and a pulse equivalent weight is an overprint deviation value. In the method, the high-frequency clock of the FPGA is used for subdividing the encoder to improve the resolution of the encoder so that the detection accuracy of the overprint errors is greatly improved and can meet photogravure registering requirements.
Description
Technical field
The present invention relates to intaglio press overprint error detection range, specifically is a kind of electronical line shaft intaglio press overprint error detection method based on FPGA.
Background technology
When the set type intaglio press carries out colored printing; In the multicolor overprint process, because a variety of causes, for example the depth of parallelism of deflector roll and pressure roller is poor, rotation is dumb and dynamic balancing is bad; The fluctuation of tension force, the became uneven and the thermal deformation of seal material certainly lead to registration deviation.The generation of this registration deviation is at random, and residual quantity also is indefinite, therefore must carry out real-time tracking, detection and adjusting to the chromatography situation of printing each colour cell, could guarantee printing quality.
At present, the domestic and international Photoelectric Detection modes that adopt detect registration deviation more, measurement processor single-chip microcomputer commonly used and dsp, and input can't parallel processing with processing.In addition, registration deviation detection algorithm commonly used has two kinds: encoder pulse count method, speed time method.The encoder pulse count method is measured the alternate position spike between two colour codes indirectly through detecting the encoder position signal, and testing circuit is simple, but accuracy of detection receives the restriction of encoder resolution, is difficult to satisfy the high speed and super precision requirement; Speed time method multiplies each other through the printing plate cylinder speed that high-frequency counter detects dichromatism timestamp interbody spacer and encoder detection; Thereby obtain the alternate position spike between two colour codes; Because the fluctuation of plate cylinder rotating speed in the printing process, deviation appears in tachometric survey, and it is bigger that registration deviation detects fluctuation.
Summary of the invention
The objective of the invention is to shortcoming, propose a kind of electronical line shaft intaglio press overprint error detection method, improve real-time and the accuracy of detection that detects greatly based on FPGA to above-mentioned chromatography deviation detecting method.
Technical scheme of the present invention is following: the overprint error detection based on FPGA comprises: photocell eye input and processing, code device signal detection and processing, overprint error calculate.
(1) photocell eye input and processing
After photocell eye detects colour code, produce pulse signal, send into the FPGA data input pin, signal is delayed time to disappear tremble processing, the concrete operations step is following:
1. scan round photocell eye signal input port, the rising edge of detection signal;
2. after detecting rising edge, the enabling counting device is to the duration counting of rising edge;
If 3. the rising edge duration reaches setting value, then think to have detected the photocell eye signal;
If 4. then thinking detected is dither signal, simultaneously with counter O reset, gets back to 1. less than setting value the rising edge duration.
(2) code device signal detects and handles
Encoder is installed on the motor output shaft that drives plate cylinder, is used to detect the position of colour code.Encoder A, B pulse disappear through time-delay earlier and tremble processing (the same), use FPGA system high-frequency clock then, and encoder is segmented, and the concrete operations step is following:
1. encoder A, B pulse disappear through time-delay earlier and tremble processings (the same), encoder A then, and the B pulse is carried out quadruple and is handled (promptly catching A, the rising and falling edges of B pulse, the resolution ratio of raising encoder), as the clock signal of encoder pulse count device;
2. select the clock signal of a system high-frequency clock as the system clock counter;
3. encoder Z pulse disappears through time-delay earlier and trembles processing (the same), and as the initial signal of sense cycle, reset encoder pulse count device and system clock counter, two counters begin counting;
4. when detecting photocell eye signal 1; Latch the value T2 of encoder pulse count device N1 and system clock counter; And photocell eye 1 pulse corresponding system clock Counter Value T1 of previous photoelectric encoder pulse when arriving (latched system clock value all when each photoelectric encoder pulse arrives; And previous value covered, when photocell eye 1 arrives, latch currency, be T1) when arriving with photocell eye 1 pulse after the corresponding system clock value T3 of photoelectric encoder pulse (when 1 arrival of photocell eye signal; Starting gate; Closed shutter when next encoder pulse signal arrives, signal strobe and code device signal made logic and operation after, as the latch signal of T3); When detecting photocell eye signal 2; Latch the value T5 of encoder pulse count device N2 and system clock counter, and photocell eye 2 pulses corresponding system clock value T4 of previous photoelectric encoder pulse when arriving (latched system clock value all when each photoelectric encoder pulse arrives, and previous value covered;, photocell eye 2 latchs currency when arriving; Be T4) and photocell eye 2 pulses when arriving after the corresponding system clock value T6 of photoelectric encoder pulse (when the photocell eye signal arrives, starting gate, closed shutter when next encoder pulse signal arrival; After signal strobe and code device signal made logic and operation, as the latch signal of T6);
(3) overprint error calculates
According to the encoder time difference close classification in (2); The umber of pulse that can get photoelectric encoder in the two photocell eye time intervals is N2+ (T5-T4)/(T6-T4)-N1-(T2-T1)/(T3-T1); Multiply by pulse equivalency again, be this look chromatography deviate, the phase sequence that two photocell eye pulses occur is the deviation symbol.
Beneficial effect of the present invention is embodied in: the parallel processing capability that utilizes FPGA; The detection of a plurality of signals is carried out with processing simultaneously; Improve the real-time and the accuracy that detect, utilized the FPGA high frequency clock that encoder is segmented, improved the resolution ratio of encoder; Thereby the overprint error accuracy of detection is improved greatly, can satisfy high speed and super precision gravure cover alignment request.
Description of drawings
Fig. 1 is the overprint error detection hardware structured flowchart that the present invention is based on FPGA.
Fig. 2 is the signal output of the two luminous point color mark sensors of the present invention
Fig. 3 is a registration deviation detection algorithm schematic diagram of the present invention, wherein,
N1: encoder pulse count value when photocell eye 2 pulses occur
N2: encoder pulse count value when photocell eye 1 pulse occurs
T1: the corresponding system clock value of previous photoelectric encoder pulse when photocell eye 2 pulses arrive
T2: the system clock value when photocell eye 2 pulses arrive
T3: system clock value that the photoelectric encoder pulse is corresponding after when photocell eye 2 pulses arrive
T4: the corresponding system clock value of previous photoelectric encoder pulse when photocell eye 1 pulse arrives
T5: the system clock value when photocell eye 1 pulse arrives
T6: system clock that the photoelectric encoder pulse is corresponding after when photocell eye 1 pulse arrives.
Fig. 4 is FPGA routine data flow process figure of the present invention.
The specific embodiment
Below in conjunction with accompanying drawing and embodiment the present invention is done further detailed explanation.
Two photocell eyes are made up of a light source, two collector lenses and two photodetectors.Light source is assembled through lens, after the reflector reflection, converges to photodetector surfaces through lens again, and is as shown in Figure 1.Two photocell eyes need strict adjustment at a distance of being 20mm during system calibrating.With the 2nd look printing element chromatography subsystem is example, is benchmark with the 1st look, and when the 2nd look chromatography was accurate, then the colour code of the 1st, 2 looks arrived two photocell eyes simultaneously, and the two pulse signals of sensor output does not have phase difference, so chromatography deviation e=0; And when register trouble; Then the colour code of the 1st, 2 looks can not arrive two photocell eyes simultaneously; If photocell eye 1 at first detects first colour code reflected signal; Pulse signal 1 prepulsing signal 2 then, this moment the registration deviation amount for just, i.e. the colour code of first and second look overgauge interval 20mm at interval; If photocell eye 2 receives pairing colour code signal prior to photocell eye 1, pulse signal 1 hysteresis pulse signal 2 then, at this moment registration deviation is for negative, and is as shown in Figure 2.
Encoder A, B signal carry out the counting clock of quadruple (as shown in Figure 4) back as the encoder pulse count device after disappearing through delaying time and trembling processing; After encoder Z signal disappears through delaying time and trembles processing, as the reset signal of encoder pulse count device and system clock counter; After photocell eye 1 signal disappears through delaying time and trembles processing, as the latch signal of T1, T2, N1; After photocell eye 2 signals disappear through delaying time and tremble processing, as the latch signal of T4, T5, N2; When the photocell eye signal arrives, starting gate, closed shutter (as shown in Figure 4) when next encoder pulse signal arrives, signal strobe and code device signal made logic and operation after, as the latch signal of T3, T6.
From Fig. 3, can draw, photocell eye 1 actual position value is S1:
S1＝N1+(T2-T1)/(T3-T1)；
Photocell eye 2 actual position value are S2:
S2＝N2+(T5-T4)/(T6-T4)；
Then the umber of pulse at two photocell eyes photoelectric encoder in the time interval is: S2-S1;
If photoelectric encoder revolution 1 circle produces M pulse (P/R), then when the forme drum diameter is D, the pulse equivalency δ of photoelectric encoder
0For:
δ
0＝πD/4M
Then chromatography deviation e=δ
0(S2-S1).
Claims (5)
1. intaglio press overprint error detection method based on FPGA; Utilize FPGA that detected colour code signal of two photocell eyes and the pulse signal that the encoder that is installed on the motor output shaft that drives plate cylinder sends are handled; Obtain the umber of pulse of photoelectric encoder in the two photocell eye time intervals; Thereby detect overprint error, these method concrete steps are following:
(1) photocell eye input and processing
After two photocell eyes detect colour code, produce pulse signal respectively, and send into the FPGA system and delay time to disappear and tremble processing, as detecting pulse;
(2) code device signal detects and handles
At first, A pulse in the pulse that encoder is sent and B pulse disappear to tremble to handle with quadruple through time-delay earlier and handle, pulse as a reference, and the while is as the clock signal of the encoder pulse count device in the FPGA system;
Secondly, with arbitrary high frequency clock in the FPGA system as the clock signal of system clock counter;
Then; In sense cycle; According to two system clock Counter Value and two system clock count values that detect the pairing separately front and back of pulse two reference pulses that detect the pairing separately encoder pulse count device of pulse value, correspondence, confirm the actual position value S1 and the S2 of two photocell eyes;
(3) overprint error calculates
Obtain the umber of pulse N=S2-S1 of photoelectric encoder in the two photocell eye time intervals, the product of this umber of pulse and pulse equivalency is this look chromatography deviate;
Wherein, the actual position value S1 of said two photocell eyes and S2 confirm through following formula:
S?1=N1+(T2-T1)/(T3-T1)；
S2=N2+(T5-T4)/(T6-T4)；
In the formula; N1 and N2 are respectively sense cycle interior two the pairing encoder pulse count device of detection pulse values, T2 and T5 and are respectively two pairing system clock Counter Values of detection pulse in the sense cycle; When T1 and T3 detect the pulse arrival for one of them; The system clock count value of front and back two reference pulses that it is constantly corresponding, when T4 and T6 detect the pulse arrival for another, the system clock count value of front and back two reference pulses that it is constantly corresponding.
2. error detection method according to claim 1 is characterized in that, the Z pulse in the pulse that said encoder sends is as the initial signal of sense cycle, and encoder pulse count device and FPGA system clock counter are used to reset.
3. error detection method according to claim 1 and 2 is characterized in that, described photocell eye input is following with processing concrete operations step:
(1.1) scan round photocell eye signal input port, the rising edge of detection signal;
(1.2) after detecting rising edge, the enabling counting device is to the duration counting of rising edge;
(1.3) if the rising edge duration reaches setting value, then think to have detected the photocell eye signal;
(1.4),, get back to step (1.1) simultaneously with counter O reset if it is dither signal that the rising edge duration, then thinks detected less than setting value.
4. error detection method according to claim 1 and 2 is characterized in that, the pulse equivalency δ of said photoelectric encoder
0For:
δ
0＝πD/4M
Wherein, M is the pulse number that photoelectric encoder revolution 1 circle produces, and D is the forme drum diameter.
5. error detection method according to claim 1 and 2 is characterized in that, the phase sequence that two photocell eye pulses occur is the deviation symbol of two photocell eyes.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110076300A CN102218900B (en) | 2011-03-29 | 2011-03-29 | Method for detecting overprint errors of photogravure press on the basis of field programmable gate array (FPGA) |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110076300A CN102218900B (en) | 2011-03-29 | 2011-03-29 | Method for detecting overprint errors of photogravure press on the basis of field programmable gate array (FPGA) |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102218900A CN102218900A (en) | 2011-10-19 |
| CN102218900B true CN102218900B (en) | 2012-09-26 |
Family
ID=44775721
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201110076300A Active CN102218900B (en) | 2011-03-29 | 2011-03-29 | Method for detecting overprint errors of photogravure press on the basis of field programmable gate array (FPGA) |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102218900B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104793565A (en) * | 2015-04-08 | 2015-07-22 | 重庆宏劲印务有限责任公司 | Icon grabbing positioning control system and method for printing |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102673123B (en) * | 2012-05-29 | 2014-04-09 | 江苏龙达转移印花纺织品有限公司 | Micro-difference automatic registration control device and registration method for environment-friendly transfer printing paper machine |
| CN102829708B (en) * | 2012-07-12 | 2015-05-06 | 武汉迈信电气技术有限公司 | Color code position information recording device and method based on FPGA (field programmable gate array) timestamp |
| CN103699139B (en) * | 2013-08-14 | 2017-04-12 | 上海海事大学 | High-resolution scanning control system and subdivision driving control method for same |
| CN104034425B (en) * | 2014-06-13 | 2016-02-24 | 西安交通大学 | A kind of output signal Acquisition Circuit for analog or digital formula color mark sensor |
| CN106660361B (en) * | 2015-04-21 | 2019-04-19 | 株式会社尼利可 | Register control method and device |
| CN105150670A (en) * | 2015-06-18 | 2015-12-16 | 刘邦超 | Printing register lock-up device based on FPGA and register lock-up method thereof |
| CN105196701B (en) * | 2015-10-14 | 2018-04-20 | 佛山市顺德区飞友自动化技术有限公司 | A kind of embossing for colored printing system punches real-time correction of error device |
| CN105842473B (en) * | 2016-03-30 | 2019-02-01 | 深圳华云数码有限公司 | A kind of rotary encoder speed-measuring method and its system |
| CN106739485B (en) * | 2016-12-13 | 2019-01-04 | 北京印刷学院 | A kind of printing machine longitudinal direction register on-line checking and method for diagnosing faults and device |
| CN110727216B (en) * | 2019-09-23 | 2022-04-29 | 重庆智能机器人研究院 | Data reading method and device of encoder and data reading device |
| CN110978777B (en) * | 2019-12-05 | 2021-06-25 | 浙江美格机械股份有限公司 | Method for automatically printing and registering colors by using printing roller without automatic registering and marking |
| CN112078230B (en) * | 2020-09-03 | 2022-04-19 | 武汉华茂自动化股份有限公司 | Fault-equipped operation method of automatic overprinting control system, electronic device and medium |
| CN112223908B (en) * | 2020-09-28 | 2022-07-01 | 广西真龙实业有限责任公司 | Multicolor printing overprinting auxiliary alignment process |
| JP2022085532A (en) * | 2020-11-27 | 2022-06-08 | 住友重機械工業株式会社 | Printer, printing method, and printing program |
| CN116945770B (en) * | 2023-09-07 | 2024-02-20 | 广州市普理司科技有限公司 | Multicolor overprinting control system of digital printer |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6137738A (en) * | 1999-11-30 | 2000-10-24 | Lucent Technologies, Inc. | Method for in-system programming of serially configured EEPROMS using a JTAG interface of a field programmable gate array |
| CN201264414Y (en) * | 2008-10-16 | 2009-07-01 | 西安德高印染自动化工程有限公司 | Rapid pre-registration apparatus for printer |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030145751A1 (en) * | 2002-02-06 | 2003-08-07 | Quad/Tech, Inc. | Color registration control system for a printing press |
-
2011
- 2011-03-29 CN CN201110076300A patent/CN102218900B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6137738A (en) * | 1999-11-30 | 2000-10-24 | Lucent Technologies, Inc. | Method for in-system programming of serially configured EEPROMS using a JTAG interface of a field programmable gate array |
| CN201264414Y (en) * | 2008-10-16 | 2009-07-01 | 西安德高印染自动化工程有限公司 | Rapid pre-registration apparatus for printer |
Non-Patent Citations (1)
| Title |
|---|
| 孙建东.基于DSP的运动控制器设计与研究.《中国优秀硕士学位论文全文数据库》.2007, * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104793565A (en) * | 2015-04-08 | 2015-07-22 | 重庆宏劲印务有限责任公司 | Icon grabbing positioning control system and method for printing |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102218900A (en) | 2011-10-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102218900B (en) | Method for detecting overprint errors of photogravure press on the basis of field programmable gate array (FPGA) | |
| DK165763B (en) | Method for three-dimensional measurement of objects | |
| JP6264615B2 (en) | Photon counting imaging method and apparatus with immediate retrigger capability | |
| US20140091206A1 (en) | Proximity sensor and associated method, computer readable medium and firmware | |
| US20150210058A1 (en) | Method and apparatus for determining and setting an optimized operating distance between at least two cylinders involved in a printing process | |
| CN101893563B (en) | Phase measurement method of variable exposure time imaging phase shift | |
| US20190369247A1 (en) | Time of flight range finder for a structured light system | |
| CN109613517A (en) | A kind of anti-interference working method of TOF Lidar multimachine | |
| CN101425772B (en) | Dynamic data collection system and accurately positioning method for collection position | |
| CN103336405A (en) | Improved shutter delay measurement system | |
| CN113554637B (en) | Method and device for detecting dirt on camera cover plate | |
| CN113776442A (en) | Spectrum detection device, film thickness real-time monitoring method and system and vacuum coating machine | |
| CN100423075C (en) | Display device and projection type display device | |
| CN206459621U (en) | A kind of detecting system for Ceramic Tiles multiple parameters Indexs measure | |
| CN103913217B (en) | Based on the main shaft of hoister method for detecting vibration of PSD laser triangulation | |
| CN103295060A (en) | Silicon wafer counter and counting method | |
| JP6838532B2 (en) | Sensor device and measurement method | |
| CN106771326B (en) | A method of based on incremental optical-electricity encoder measuring speed | |
| TW201816520A (en) | Apparatus and method for measuring amplitude of scanning reflector | |
| CN112859101A (en) | Single photon ranging method based on polarization modulation | |
| CN102608348B (en) | Method for measuring rotating speed for irregular pulse signals | |
| US10890432B2 (en) | Digital displacement sensor and displacement measuring method thereof | |
| US11555751B2 (en) | Noncontact optical torque measurement of rotating component | |
| CN114137558B (en) | Control method and device for improving laser radar precision and laser radar system | |
| CN110275105A (en) | A kind of detection method and device based on virtual sine wave |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: WUHAN INTELLIGENT EQUIPMENT INDUSTRIAL INSTITUTE C Free format text: FORMER OWNER: HUAZHONG SCINECE AND TECHNOLOGY UNIV Effective date: 20150409 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: 430074 WUHAN, HUBEI PROVINCE TO: 430075 WUHAN, HUBEI PROVINCE |
|
| TR01 | Transfer of patent right |
Effective date of registration: 20150409 Address after: 430075 Hubei Province, Wuhan high tech Zone of East Lake City, New Road No. 999 Building 5 floor, block A of overseas talents Patentee after: WUHAN INTELLIGENT EQUIPMENT INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE CO., LTD. Address before: 430074 Hubei Province, Wuhan city Hongshan District Luoyu Road No. 1037 Patentee before: Huazhong University of Science and Technology |
|
| EE01 | Entry into force of recordation of patent licensing contract | ||
| EE01 | Entry into force of recordation of patent licensing contract |
Application publication date: 20111019 Assignee: Wuhan Baiyuan Huicheng Intelligent Technology Co., Ltd. Assignor: WUHAN INTELLIGENT EQUIPMENT INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE CO., LTD. Contract record no.: X2019420000001 Denomination of invention: Method for detecting overprint errors of photogravure press on the basis of field programmable gate array (FPGA) Granted publication date: 20120926 License type: Common License Record date: 20190813 |