CN102213637B - Impact test device and impact test method - Google Patents
Impact test device and impact test method Download PDFInfo
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- CN102213637B CN102213637B CN201010142193.6A CN201010142193A CN102213637B CN 102213637 B CN102213637 B CN 102213637B CN 201010142193 A CN201010142193 A CN 201010142193A CN 102213637 B CN102213637 B CN 102213637B
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- cantilever
- retaining piece
- sample
- fixture
- connecting hole
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Abstract
The invention relates to an impact test device, which comprises a support piece, a cantilever of which one end is arranged on the support piece and a fixed assembly which is arranged on the cantilever and is adjacent to the free end of the cantilever, wherein the fixed assembly is used for fixing samples. The invention also provides an impact test method for the impact test device.
Description
Technical field
The present invention relates to a kind of apparatus for impact testing and impact test methods.
Background technology
For the performance ensureing crash resistance energy in product handling process and use procedure and withstand shocks, product needs to carry out impulse test before dispatching from the factory.Namely by the shock-testing of limited number of time, record is carried out to be hit impact strength and attack time in process of sample, and analyze, so that the failure cause of analytic product impacting the surge waveform curve that the moment impact that is subject to of product produces.In addition, the surge waveform curve that this impact produces can also provide better test data to R&D process, plays a key effect to the shock resistance improving product.
Along with the development of electron trade, increasing product is toward compact future development, and the weight of product is thereupon more and more lighter, and performance requirement is more and more stricter.But because of compactization of product, when utilizing general test board to carry out impulse test to product, the duration producing shock wave when product is subject to impacting is only several milliseconds.In impulse test, the impact strength of impacting moment is able to effective raising by increasing board height, the duration of right percussive action depends primarily on the material property of the padded coaming of tester table, and can be confined in certain limit because of the damping characteristics of certain material, therefore the duration of significant prolongation percussive action cannot be carried out by improving material property.
Summary of the invention
In view of the foregoing, be necessary to provide a kind of being convenient to improve the apparatus for impact testing of shock-testing performance and adopt the impact test methods of this apparatus for impact testing.
A kind of apparatus for impact testing, it comprises support member, one end is arranged at the cantilever on this support member and is arranged at the fixation kit of the free end this cantilever being also close to this cantilever, this fixation kit is used for fixed sample, this fixation kit comprises retaining piece, fixture and regulating part, this retaining piece and this fixture are rod-like structure, this retaining piece offers multiple connecting hole, this fixture offers multiple fixed orifice corresponding with connecting hole, the nut that this regulating part comprises screw rod and matches with screw rod, this screw rod regulates the holding force to this sample by the fixed orifice that the connecting hole and this connecting hole that wear diverse location are corresponding, and by making this retaining piece and this fixture lock onto on this cantilever with this nut screw connection, and this sample clamping is between this retaining piece and this cantilever.
A kind of impact test methods, comprise the following steps: a kind of apparatus for impact testing is provided, it comprises support member, be arranged at the cantilever on this support member and be arranged on this cantilever and the fixation kit of the free end of this cantilever contiguous, this fixation kit comprises retaining piece, fixture and regulating part, this retaining piece and this fixture are rod-like structure, this retaining piece offers multiple connecting hole, this fixture offers multiple fixed orifice corresponding with connecting hole, the nut that this regulating part comprises screw rod and matches with screw rod, this screw rod regulates the holding force to this sample by the fixed orifice that the connecting hole and this connecting hole that wear diverse location are corresponding, and by making this retaining piece and this fixture lock onto on this cantilever with this nut screw connection, and this sample clamping is between this retaining piece and this cantilever, sample to be fixed on this cantilever by fixation kit and the free end of this cantilever contiguous and on this sample fixation of sensor, this apparatus for impact testing and the sample that is fixed thereon are impacted, and record sensor measurement to sample be subject to impacting the oscillating curve of moment.
When using this apparatus for impact testing and impact test methods to carry out shock-testing to sample, by the buffer delay effect of cantilever, the duration extension of the impact being passed to sample can be made, be convenient to the test performance improving the board carrying out shock-testing.
Accompanying drawing explanation
Fig. 1 is the apparatus for impact testing of embodiment of the present invention and the assembly drawing of sample.
Fig. 2 is the parts explosion of apparatus for impact testing and sample in Fig. 1.
Fig. 3 is the process flow diagram of the impact test methods of application apparatus for impact testing of the present invention.
Fig. 4 is the curve map of application apparatus for impact testing of the present invention test gained.
Main element symbol description
| Apparatus for impact testing | 100 |
| Support member | 10 |
| Cantilever | 30 |
| Fixation kit | 50 |
| Free end | 31 |
| Fixed Division | 33 |
| Retaining piece | 51 |
| Regulating part | 53 |
| Fixture | 55 |
| Connecting hole | 511 |
| Screw rod | 531 |
| Nut | 533 |
| Fixed orifice | 551 |
| Sample | 200 |
| Fixed mount body | 201 |
| Linking arm | 203 |
Embodiment
Below in conjunction with the drawings and the specific embodiments, apparatus for impact testing of the present invention and impact test methods are described in further detail.This apparatus for impact testing can be used for testing hard disk fixed mount, CD-ROM drive etc., is described below for testing hard disk fixed mount.
Refer to Fig. 1 and Fig. 2, the fixation kit 50 that a kind of apparatus for impact testing 100 comprises support member 10, is arranged at the cantilever 30 on this support member 10 and is arranged on this cantilever 30.
Support member 10 is screw rod, and its one end is fixed on shock table or on a pedestal.Certainly, this support member 10 also can be a base structure, and is fixed on the support member 10 of base structure one end of cantilever 30.
Cantilever 30 has free end 31 and multiple Fixed Division 33.In present embodiment, cantilever 30 is rod-like structure, and its Fixed Division 33 is for being opened in the threaded hole on cantilever 30.Certainly, Fixed Division 33 also can be the projection protruding out formation from cantilever 30, and cantilever 30 is fixed on the support member 10 of base structure by the Fixed Division 33 of convex cylinder.And cantilever 30 also can be platy structure.
Fixation kit 50 comprises retaining piece 51, regulating part 53 and fixture 55.In present embodiment, retaining piece 51 is rod-like structure, it is offered multiple connecting hole 511.Regulating part 53 number is two, the nut 533 that each regulating part 53 comprises screw rod 531 and matches with screw rod 531.Fixture 55 is substantially identical with the structure of retaining piece 51, it offers multiple fixed orifice 551 corresponding with the connecting hole 511 on retaining piece 51.Be appreciated that retaining piece 51 and fixture 55 also can be platy structure; Regulating part 53 also can be other numbers such as, three, four.
During assembling, cantilever 30 to be sheathed on support member 10 by Fixed Division 33 and to be fixed by the clamping structure such as nut or pin (not shown) relative support 10.The fixture 55 of fixation kit 50 is fixed on the side of cantilever 30 and the free end 31 of contiguous cantilever 30, and the screw rod 531 of regulating part 53 passes the fixed orifice 551 on fixture 55 and locks with this fixture 55.From the opposite side of cantilever 30, retaining piece 51 is sheathed on the screw rod 531 of regulating part 53, and by nut 533 from retaining piece 51 away from fixture 55 side cover to screw rod 531.Be appreciated that fixation kit 50 also can be to be fixed on cantilever 30 and the clip of the free end 31 of contiguous cantilever 30.
Sample 200 is hard-disc fixing holder, and it comprises fixed mount body 201 and linking arm 203.
Please refer to Fig. 3 and Fig. 4, when carrying out shock-testing to sample 200, comprise the following steps:
S301: aforesaid apparatus for impact testing 100 is provided.
S302: by sample 200 by fixation kit 50 to be fixed on cantilever 30 contiguous cantilever 30 free end 31 place and on sample 200 fixation of sensor (not shown).The linking arm 203 of sample 200 is inserted between retaining piece 51 and cantilever 30, by the nut 533 of regulating part 53, the linking arm 203 of sample 200 is clamped by retaining piece 51 and cantilever 30.
S303: this apparatus for impact testing 100 and the sample 200 that is fixed thereon together are fallen from setting height, to be subject to predetermined impact, and record sensor measurement to sample 200 be subject to impacting the oscillating curve of moment.In shock-testing process, this apparatus for impact testing 100 to be positioned in shock-testing board (not shown) together with the sample 200 be fixed thereon and to fall along setting height.Falling moment, support member 10 is impacted, and this impact is passed to sample 200 through cantilever 30, and then makes sample 200 also be subject to certain impact.Before carrying out shock-testing, height set by it is the impact strength making the support member 10 of apparatus for impact testing 100 be subject to impact moment is 25g, the duration of shock pulse produced because being hit is 30 milliseconds (ms), and wherein g is acceleration of gravity constant 9.8 meters every square second (m/s2).Dotted line waveform in Fig. 4 is impacted produced surge waveform for support member 10, and solid line waveform is then for sample 200 is impacted produced surge waveform.Because of the impact of the factor such as environment and equipment, the impact strength that in real impact process of the test, support member 10 is subject to is 25.06g, and the duration is 30.50ms, the duration of the wave band namely in Fig. 4 between A, B 2.The impact strength being passed to sample 200 is 21.75g, and the duration is 54ms, i.e. duration of wave band between C, D in Fig. 4, duration extension 77%.Because the wave band only between C, D is impact the moment main waveform produced, therefore waveform is not afterwards considered.
In this shock-testing, because of the position of free end 31 contiguous on the cantilever 30 that sample 200 is fixed on apparatus for impact testing 100, certain delay is there is when making impact be passed to sample 200 from support member 10, and the elongation of the duration of shock wave, and then effectively extend the duration that sample 200 is subject to impacting the rear surge waveform produced, improve the test performance of the board carrying out shock-testing, and analyze data reliably for the processes such as follow-up research and development provide.
In this apparatus for impact testing 100, cantilever 30 arranging multiple Fixed Division 33, matches in the Fixed Division 33 different from cantilever 30 by support member 10, to regulate the size being passed to fixation kit 50 place, and then regulates the duration of the impact suffered by sample 200.This adjustment structure is simple, and convenient operation.
Be screwed by the different parts of nut 533 with screw rod 531 in fixation kit 50, the sample 200 of different size can be clamped.By screw rod 531 through connecting holes 511 different on different fixed orifice 551 on fixture 55 and retaining piece 51 to regulate the holding force to sample 200.
In addition, those skilled in the art also can do other change in spirit of the present invention, and certainly, these changes done according to the present invention's spirit, all should be included in the present invention's scope required for protection.
Claims (6)
1. an apparatus for impact testing, it comprises support member, it is characterized in that: this apparatus for impact testing also comprises the fixation kit that one end is arranged at the cantilever on this support member and is arranged at the free end this cantilever being also close to this cantilever, this fixation kit is used for fixed sample, this fixation kit comprises retaining piece, fixture and regulating part, this retaining piece and this fixture are rod-like structure, this retaining piece offers multiple connecting hole, this fixture offers multiple fixed orifice corresponding with connecting hole, the nut that this regulating part comprises screw rod and matches with screw rod, this screw rod regulates the holding force to this sample by the fixed orifice that the connecting hole and this connecting hole that wear diverse location are corresponding, and by making this retaining piece and this fixture lock onto on this cantilever with this nut screw connection, and this sample clamping is between this retaining piece and this cantilever.
2. apparatus for impact testing as claimed in claim 1, is characterized in that: this retaining piece sets the distance between this retaining piece and this cantilever by nut.
3. apparatus for impact testing as claimed in claim 1, it is characterized in that: the quantity of this regulating part is multiple, and each regulating part is separate to regulate the distance between this retaining piece different parts and this cantilever independently.
4. apparatus for impact testing as claimed in claim 1, wherein cantilever is arranged multiple Fixed Division coordinated with support member.
5. an impact test methods, comprises the following steps:
A kind of apparatus for impact testing is provided, it comprises support member, be arranged at the cantilever on this support member and be arranged on this cantilever and the fixation kit of the free end of this cantilever contiguous, this fixation kit comprises retaining piece, fixture and regulating part, this retaining piece and this fixture are rod-like structure, this retaining piece offers multiple connecting hole, this fixture offers multiple fixed orifice corresponding with connecting hole, the nut that this regulating part comprises screw rod and matches with screw rod, this screw rod regulates the holding force to this sample by the fixed orifice that the connecting hole and this connecting hole that wear diverse location are corresponding, and by making this retaining piece and this fixture lock onto on this cantilever with this nut screw connection, and this sample clamping is between this retaining piece and this cantilever,
Sample to be fixed on this cantilever by fixation kit and the free end of this cantilever contiguous, and on this sample fixation of sensor;
This apparatus for impact testing and the sample that is fixed thereon together are fallen from setting height, and record sensor measurement to sample be subject to impacting the oscillating curve of moment.
6. impact test methods as claimed in claim 5, is characterized in that: the distance between this retaining piece and cantilever is changed by this nut with the sample of fixing sizes.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010142193.6A CN102213637B (en) | 2010-04-08 | 2010-04-08 | Impact test device and impact test method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010142193.6A CN102213637B (en) | 2010-04-08 | 2010-04-08 | Impact test device and impact test method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102213637A CN102213637A (en) | 2011-10-12 |
| CN102213637B true CN102213637B (en) | 2015-04-01 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201010142193.6A Expired - Fee Related CN102213637B (en) | 2010-04-08 | 2010-04-08 | Impact test device and impact test method |
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| Country | Link |
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Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102788674B (en) * | 2012-07-18 | 2015-04-15 | 中国船舶重工集团公司第七○二研究所 | Standard mounting frame for checking mounting device of superstructure |
| CN105486452B (en) * | 2015-12-31 | 2018-11-13 | 张宇峰 | Shock wave tests comparison-type scaling method |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6178805B1 (en) * | 1997-07-22 | 2001-01-30 | Chrysler Corporation | Method and apparatus for side impact testing of motor vehicles at a sub-system level |
| CN2757119Y (en) * | 2004-12-31 | 2006-02-08 | 比亚迪股份有限公司 | Fall test table |
| CN2837811Y (en) * | 2005-11-01 | 2006-11-15 | 比亚迪股份有限公司 | Drop test bench |
| CN201233305Y (en) * | 2008-06-24 | 2009-05-06 | 比亚迪股份有限公司 | Battery automatic falling test device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100964502B1 (en) * | 2007-04-04 | 2010-06-21 | 주식회사 엘지화학 | Free-fall testing device |
-
2010
- 2010-04-08 CN CN201010142193.6A patent/CN102213637B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6178805B1 (en) * | 1997-07-22 | 2001-01-30 | Chrysler Corporation | Method and apparatus for side impact testing of motor vehicles at a sub-system level |
| CN2757119Y (en) * | 2004-12-31 | 2006-02-08 | 比亚迪股份有限公司 | Fall test table |
| CN2837811Y (en) * | 2005-11-01 | 2006-11-15 | 比亚迪股份有限公司 | Drop test bench |
| CN201233305Y (en) * | 2008-06-24 | 2009-05-06 | 比亚迪股份有限公司 | Battery automatic falling test device |
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| Publication number | Publication date |
|---|---|
| CN102213637A (en) | 2011-10-12 |
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