CN102175543B - Dynamic stability testing circuit of rectifier cabinet - Google Patents
Dynamic stability testing circuit of rectifier cabinet Download PDFInfo
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- CN102175543B CN102175543B CN201110027437.0A CN201110027437A CN102175543B CN 102175543 B CN102175543 B CN 102175543B CN 201110027437 A CN201110027437 A CN 201110027437A CN 102175543 B CN102175543 B CN 102175543B
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Abstract
The invention discloses a dynamic stability testing circuit of a rectifier cabinet. The testing circuit comprises two connecting wires led out of anode and cathode terminals of a direct current testing power supply and is characterized in that the connecting wire led out of the anode terminal of the direct current testing power supply is connected to a bridge arm D6; the connecting wire led out of the cathode terminal of the direct current testing power supply is connected to bridge arms D1 and D5 respectively; the tail ends of the three bridge arms D6, D1 and D5 are intersected at a position; the bridge arms D6, D1 and D5 consist of multiple groups of parallel branches respectively; and each group of parallel circuits consists of an inductor and a resistor which are connected in series. The circuit is simple and reliable and has low cost; the worst electric power distribution situation can be truly simulated under the short circuit condition of a rectifier, and the dynamic stability of the rectifier cabinet is verified equivalently; moreover, the short-circuit current direction of each bridge arm is determined, so that reverse failure current is avoided and the circuit safety is enhanced; and the phenomenon of damage to a semiconductor device in the testing process is avoided and the testing safety is enhanced.
Description
Technical field
The present invention relates to electric electronic current change technology field, be specifically related to a kind of dynamic stability hookup of rectifier cabinet.
Background technology
For a long time, the dynamic stability problem under power rectifier cabinet failure condition is the problem that user is concerned about most always.At aluminum electrolysis industry, once there are a lot of short circuit accidents.Once the fault of being short-circuited, if the physical strength of cabinet is not enough, will cause the gross distortion of rectifier, is difficult to restore electricity, thereby brings serious economic loss in the short time.The dynamic stability test of visible rectifier cabinet is extremely important.
But because heavy-duty rectifier short-circuit current is huge.Carrying out rectifier short-circuit test needs powerful short-circuit test platform, and the large electric current of high power relates to electromagnetism simultaneously, heating, the series of technical such as measurement and power system stability operation.This just means technical support that these test needs are powerful and huge fund input, also needs to bear larger experimental safe risk.For this test, most of user and producer take to avoid attitude.
Therefore, explore one cost-saving, improve experimental safe and again practicable test thinking be very necessary.
Summary of the invention
The dynamic stability hookup that the object of this invention is to provide a kind of rectifier cabinet, reaches both cost-saving, can improve again the object of experimental safe.
Technical scheme of the present invention is as follows:
A kind of dynamic stability hookup of rectifier cabinet, comprise two wiring of drawing from the positive and negative electrode terminals of DC test power supply, it is characterized in that: the connecting line of drawing from the positive terminal of DC test power supply is connected to brachium pontis D6, the connecting line of drawing from the negative terminals of DC test power supply is connected to respectively brachium pontis D1, D5 in parallel, three brachium pontis D6, D1, the end of D5 is compiled in a place; Described brachium pontis D1, D5, D6 form by many group parallel branches, and every group of parallel branch is by inductance and the resistance composition that is in series.
The dynamic stability hookup of described rectifier cabinet, is characterized in that: the electric current passing through in described brachium pontis D6 is huge short-circuit test electric current, and the electric current passing through in described brachium pontis D1, D5 is half of test current in D6 brachium pontis.
Beneficial effect of the present invention:
(1), worst electric power distribution situation under circuit structure energy real simulation rectifier short circuit condition of the present invention, the moving stability characteristic (quality) of rectifier cabinet has been verified in equivalence;
(2), the bridgc arm short sense of current of circuit of the present invention determines, do not have reverse fault electric current, improved the security of circuit;
(3), circuit of the present invention is simple, reliable, saved semiconductor devices, the investment of molten and pulse short-circuit test transformer soon;
(4), circuit structure of the present invention be difficult for being damaged in the process of the test phenomenon of semiconductor devices, improved the security of test.
Accompanying drawing explanation
Fig. 1 is circuit structure diagram of the present invention, and wherein (b) is the symmetrical equivalent circuit diagram of (a).
Fig. 2,3 is the circuit structure diagram of testing scheme 1,2 in embodiment.
Fig. 4 replaces the circuit structure diagram of silicon controlled testing program with diode.
Embodiment
Referring to Fig. 1, a kind of dynamic stability hookup of rectifier cabinet, comprise two wiring of drawing from the positive and negative electrode terminals of DC test power supply, the connecting line of drawing from the positive terminal of DC test power supply is connected to brachium pontis D6, the connecting line of drawing from the negative terminals of DC test power supply is connected to respectively brachium pontis D1, D5 in parallel, three brachium pontis D6, D1, the end of D5 is compiled in a place; Brachium pontis D1, D5, D6 all many group parallel branches form, and the experimental circuit of another full symmetric equivalence is by D3, D4, and D2 forms, and the impedance of every group of parallel branch itself represents with lumped parameter resistance and reactance.
The electric current passing through in brachium pontis D6 is huge short-circuit test electric current, and the electric current passing through in brachium pontis D1, D5 is half of test current in D6 brachium pontis.
Below in conjunction with accompanying drawing, the present invention is further illustrated:
The in the situation that of dc-side short-circuit, allow the damage of subelement (thyristor and fastp-acting fuse), therefore, original adoption, as the testing scheme 1 and 2 of Fig. 1 and 2, removes thyristor and replaces copper billet.
Through Computer Simulation, find, in testing scheme 1, bridgc arm short electric current is only half of actual value, and the electric power in the time of therefore cannot simulating short trouble distributes; In testing scheme 2, although can guarantee the peak value of short-circuit current,, on brachium pontis, there is reverse fault electric current, increased the weight of the failure condition of rectifier cabinet.Therefore, the two is all inappropriate.
For this reason, propose testing program as shown in Figure 3, that is: with diode and copper billet, replaced respectively controllable silicon and fastp-acting fuse.Wherein, Z1, Z5 and Z6 represent diode, and Np is brachium pontis parallel branch number, and this value is determined according to actual requirement of engineering.
In the testing program of Fig. 3, the short-circuit current waveform of brachium pontis is identical with real short-circuit process, can short trouble that is virtually reality like reality.But in test process, because stress such as concentrates at the reason, diode element is easy to damage.Therefore selection that neither be desirable.
In order to improve the security of process of the test, the present invention proposes the technology path of DC experiment scheme, as shown in Figure 1.
Through calculating, find, at angle of overlap, be greater than 60
0, i.e., in the situation of AC three-phase short circuit, B phase electric power is maximum.Therefore, during test, the object that the brachium pontis D6 of should usining examines as emphasis.
Claims (1)
1. the dynamic stability hookup of a rectifier cabinet, comprise two connecting lines of drawing from the positive and negative electrode terminals of DC test power supply, it is characterized in that: the connecting line of drawing from the positive terminal of DC test power supply is connected to brachium pontis D6, the connecting line of drawing from the negative terminals of DC test power supply is connected to respectively brachium pontis D1, D5 in parallel, three brachium pontis D6, D1, the end of D5 is compiled in a place; Described brachium pontis D1, D5, D6 form by many group parallel branches, and every group of parallel branch is by inductance and the resistance composition that is in series.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110027437.0A CN102175543B (en) | 2011-01-26 | 2011-01-26 | Dynamic stability testing circuit of rectifier cabinet |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110027437.0A CN102175543B (en) | 2011-01-26 | 2011-01-26 | Dynamic stability testing circuit of rectifier cabinet |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102175543A CN102175543A (en) | 2011-09-07 |
| CN102175543B true CN102175543B (en) | 2014-01-22 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201110027437.0A Active CN102175543B (en) | 2011-01-26 | 2011-01-26 | Dynamic stability testing circuit of rectifier cabinet |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0306319A1 (en) * | 1987-09-03 | 1989-03-08 | Sundstrand Corporation | Method for statically testing rotating rectifiers in brushless alternators |
| CN1480738A (en) * | 2003-07-22 | 2004-03-10 | 上海理工大学 | Constant current constant voltage method for testing convertor driven by pulses in quasi-sinusoidal power under room temperature |
| CN101078741A (en) * | 2007-06-26 | 2007-11-28 | 中国铝业股份有限公司 | Aluminum electrolysis rectifier cabinet equal current on-line detection method |
-
2011
- 2011-01-26 CN CN201110027437.0A patent/CN102175543B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0306319A1 (en) * | 1987-09-03 | 1989-03-08 | Sundstrand Corporation | Method for statically testing rotating rectifiers in brushless alternators |
| CN1480738A (en) * | 2003-07-22 | 2004-03-10 | 上海理工大学 | Constant current constant voltage method for testing convertor driven by pulses in quasi-sinusoidal power under room temperature |
| CN101078741A (en) * | 2007-06-26 | 2007-11-28 | 中国铝业股份有限公司 | Aluminum electrolysis rectifier cabinet equal current on-line detection method |
Non-Patent Citations (2)
| Title |
|---|
| 基于PSCAD的牵引供电系统建模与短路电流仿真;任韬，李夏青;《北京石油化工学院学报》;20100331;第18卷(第1期);第31-35页 * |
| 电励磁双凸极发电机的三相整流换相过程分析;戴卫力等;《中国电机工程学报》;20080715;第28卷(第20期);第111-117页 * |
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| CN102175543A (en) | 2011-09-07 |
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Address after: 230001 no.181 Gucheng Road, shiyangang Township, Hefei City, Anhui Province Patentee after: INSTITUTE OF PLASMA PHYSICS, CHINESE ACADEMY OF SCIENCES Address before: 230031 Shushan Lake Road, Anhui, China, No. 350, No. Patentee before: INSTITUTE OF PLASMA PHYSICS, CHINESE ACADEMY OF SCIENCES |
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