CN102136395A - Automatic device system - Google Patents

Automatic device system Download PDF

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Publication number
CN102136395A
CN102136395A CN2010106017652A CN201010601765A CN102136395A CN 102136395 A CN102136395 A CN 102136395A CN 2010106017652 A CN2010106017652 A CN 2010106017652A CN 201010601765 A CN201010601765 A CN 201010601765A CN 102136395 A CN102136395 A CN 102136395A
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China
Prior art keywords
relay
self
mcu
automatic device
coil
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Pending
Application number
CN2010106017652A
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Chinese (zh)
Inventor
王翀
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Guodian Nanjing Automation Co Ltd
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Guodian Nanjing Automation Co Ltd
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Priority to CN2010106017652A priority Critical patent/CN102136395A/en
Publication of CN102136395A publication Critical patent/CN102136395A/en
Pending legal-status Critical Current

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Abstract

The invention discloses an automatic device system, which comprises an MCU (microprogrammed control unit) of an automatic device, a plurality of relay drive loops connected with the MCU and a self-checking circuit of the drive loops. The automatic device system is characterized in that: the self-checking circuit comprises a starting relay K1 connected with the QD_EN signal end of the MCU; and connection between the negative end of a coil of a tested relay K2 in each relay drive loop and the ground end of a relay power supply is controlled by the starting relay K1. As the checking scope of the self-checking circuit of the automatic device system is enlarged to the coil side of the tested relay, the automatic device system has the advantages of easiness in realization, reliability in running, less cost, large effect, etc.

Description

Automatic device system
Technical field
The invention belongs to the industrial automation field, the relay that relates in a kind of automatics drives the loop, and especially relay drives the self-checking circuit in loop.
Background technology
In industrial automation arrangement, automatics mainly passes through the driving of relay is realized the output of switching value, and controls the operation of controlled system with this.For automatics, relay drives the loop and belongs to very important system unit, and its operating state is directly connected to fail safe, the reliability of control system and controlled system.
At present, the relay of automatics drives loop general using intelligence MCU and drives optocoupler by gate circuit, drives the actuating of relay then.Fig. 1 drives the loop and leaves the self-checking circuit circuit diagram for the 24V relay.
The self check process of leaving that relay drives the loop is: at first, MCU opens starting relay K1 by dragging down the QD_EN signal, and this moment, the adhesive of starting relay K1 contact was guided to VCC_RELAY with the 24V power supply; Subsequently, MCU raises DO_EN and the DO1 signal drives the D2 optocoupler, link up VCC_RELAY signal and DO1_DRV signal, the 24V signal is guided to V1, V2 diode, wherein, the V1 diode is used to drive measured relay K2 with the 24V signal, and the V2 diode outputs to feedback resistance R_FB in order to drive self check feedback optocoupler D3 with the 24V signal; After being driven, self check feedback optocoupler will drag down the DO_FB signal.MCU determines by the level of judging the DO_FB signal whether switching value drives the loop normal in this process.And, generally also need differentiate DO_EN, the DO1 variation of DO_FB signal level effectively time the respectively effectively or simultaneously.
But frame of broken lines is a repeating part among Fig. 1, usually in the automatic device system several frame of broken lines parts is as shown in Figure 1 arranged, and promptly automatic device system may exist a starting relay, one to leave the feedback optocoupler and several relays drive the loop.
Leave in the self check process, optocoupler D2, starting relay K1 open back 24V signal and also driven relay K 2 when driving self check feedback optocoupler D3.Because the responsiveness of optocoupler is general far away from relay.So for preventing in the testing process measured relay K2 by false triggering, MCU must read the DO_FB signal fast and turn-off optocoupler D2 subsequently fast after driving optocoupler D2, cause the adhesive of exit relay K2 contact in case optocoupler D2 driving time is long.
But in actual the use, the action of optocoupler, return time very easily are subjected to influence of temperature change.And, the MCU of automatics generally need handle complicated logic, algorithm and communication, MCU generally goes back the operation system, if MCU handles bad to the time beat that above-mentioned pin is controlled, read, very easily have influence on correctly the reading of DO_FB signal, and might cause the mistake outlet of measured relay K2.And the self check scope that traditional relay drives the loop is confined to the driving optocoupler of MCU pin to measured relay, and can not the measured relay coil effectively be checked, if opening circuit appears in the measured relay coil, then can't detect.
To sum up, the driving loop self checking method of traditional automatic device system exists certain risk and drawback.
Summary of the invention
Technical problem to be solved by this invention provides a kind of automatic device system, make self check scope that relay drives the loop from the MCU pin up to the measured relay coil, therefore can detect the broken string situation of measured relay coil fully.
For addressing the above problem, the invention provides a kind of automatic device system, the MCU that comprises automatics, several relays that link to each other with MCU drive the loop and drive the self-checking circuit in loop, it is characterized in that: described self-checking circuit comprises the starting relay K1 that links to each other with the QD_EN signal end of MCU, controls each relay by starting relay K1 and drives measured relay K2 coil negative terminal and being connected between relay power ground is held in loop.
Aforesaid automatic device system is characterized in that: being connected between the driving optocoupler control relay driving power by measured relay K2 and the measured relay K2 coil anode.
Aforesaid automatic device system is characterized in that: measured relay K2 coil is connected and is driven the loop self-checking circuit into relay.
Aforesaid automatic device system, it is characterized in that: described self-checking circuit comprises the self check feedback optocoupler D3 that links to each other with the DO_FB signal end of MCU, the contact of starting relay K1 connects the negative terminal of measured relay coil, and the other end of starting relay K1 connects the ground of relay driving power; The negative terminal of measured relay coil also links to each other with a resistor network, and resistor network connects the base stage and the emitter of triode, and the collector electrode of triode connects the negative electrode of feedback optocoupler.
The operation principle of automatic device system self-checking circuit of the present invention is: make the resistance R of the internal resistance r of measured relay coil much smaller than resistor network, when starting relay was in open mode, starting relay had disconnected being connected between measured relay coil negative terminal and the relay driving power ground.After the driving optocoupler of measured relay was energized, the relay driving power must link to each other with relay driving power ground via measured relay coil, resistor network.At this moment, as long as far low its minimum driving voltage of the dividing potential drop on the measured relay coil, can guarantee that measured relay can't move.This circuit has also been contained into self-checking circuit with the coil of measured relay, make self check scope that relay drives the loop from the MCU pin up to the measured relay coil, therefore can detect the broken string situation of measured relay coil fully.
Beneficial effect of the present invention:
The present invention adopts costs such as resistance, triode little, and the self-checking circuit that passing relay drives the loop has been improved in the loop that the high discrete component of stability is built.Improve stability, the reliability of self-checking circuit, enlarged the self check scope of self-checking circuit.
Description of drawings
Fig. 1 drives the loop and leaves the self-checking circuit circuit diagram for existing automatics relay;
Fig. 2 drives the loop and leaves the self-checking circuit circuit diagram for automatics relay of the present invention;
Fig. 3 is the equivalent circuit diagram of Fig. 2.
Embodiment
With the relay driving power is that the 24V situation is an example, and the present invention is further introduced.
The normal relay course of action is: MCU drags down QD_EN, short circuit FB_IN signal and-24 signals, and MCU raises DO_EN subsequently, the DO1 signal drives the D2 optocoupler, and with+24 introducing K2 relays, the K2 relay can move.
When relay drove the loop self check, MCU at first raised the QD_EN signal, disconnected FB_IN signal and-24 signals; MCU raises DO_EN, DO1 signal subsequently, drive the coil of D2 optocoupler with+24 introducing measured relay K2, if the resistance of K2 measured relay coil is r, as long as the r resistance is much smaller than R1+(R2//R3), can make that the dividing potential drop on the K2 measured relay coil is enough little, as long as far low its minimum driving voltage of the dividing potential drop on the K2 measured relay coil.No matter D2 optocoupler driving time how long, is not enough to all make that the K2 measured relay is driven.Because the K1 relay has disconnected FB_IN and-24 signals, so triode V1 is energized and feeds back optocoupler D3 then and also be energized, and the DO_FB signal is also dragged down immediately.The self-checking circuit equivalent circuit diagram of Fig. 2 as shown in Figure 3.
The present invention utilizes the closure of K1 starting relay contact to bypass the feedback circuit of R1, R2, R3 resistance formation, makes measured relay K2 can correctly be driven in normal operation; Coil dividing potential drop when utilizing the open circuit of starting relay K1 contact to make the relay circuit self check on the measured relay K2 is enough little, so that the pressure drop that obtains on the measured relay K2 coil is because of reaching its minimum specified operation voltage akinesia far away, and the pressure drop that obtains on R1, R2, the R3 resistor network makes triode V1 be driven, then driven self check feedback optocoupler D3, made that the DO_FB signal is dragged down.Because measured relay K2 can not export in the self check process by mistake, therefore, MCU can read DO_FB signal, the possibility that reduces to judge by accident calmly.And this self-checking circuit makes the coil situation of measured relay K2 also be detected.
The invention has the beneficial effects as follows:
Adopt costs such as resistance, triode little, the self-checking circuit that passing relay drives the loop has been improved in the loop that the high discrete component of stability is built.Improve stability, the reliability of self-checking circuit, enlarged the self check scope of self-checking circuit.
Below announced the present invention with preferred embodiment, so it is not in order to restriction the present invention, and all technical schemes that scheme obtained of taking to be equal to replacement or equivalent transformation all drop in protection scope of the present invention.Below disclose the present invention with preferred embodiment, so it is not in order to restriction the present invention, and all employings are equal to replaces or technical scheme that the equivalent transformation mode is obtained, all drops within protection scope of the present invention.

Claims (4)

1. automatic device system, the MCU that comprises automatics, several relays that link to each other with MCU drive the loop and drive the self-checking circuit in loop, it is characterized in that: described self-checking circuit comprises the starting relay K1 that links to each other with the QD_EN signal end of MCU, controls each relay by starting relay K1 and drives measured relay K2 coil negative terminal and being connected between relay power ground is held in loop.
2. automatic device system according to claim 1 is characterized in that: being connected between the driving optocoupler control relay driving power by measured relay K2 and the measured relay K2 coil anode.
3. automatic device system according to claim 1 and 2 is characterized in that: measured relay K2 coil is connected and is driven the loop self-checking circuit into relay.
4. automatic device system according to claim 1 and 2, it is characterized in that: described self-checking circuit comprises the self check feedback optocoupler D3 that links to each other with the DO_FB signal end of MCU, the contact of starting relay K1 connects the negative terminal of measured relay coil, and the other end of starting relay K1 connects the ground of relay driving power; The negative terminal of measured relay coil also links to each other with a resistor network, and resistor network connects the base stage and the emitter of triode, and the collector electrode of triode connects the negative electrode of feedback optocoupler.
CN2010106017652A 2011-01-11 2011-01-11 Automatic device system Pending CN102136395A (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102751143A (en) * 2012-07-16 2012-10-24 苏州工业园区和顺电气股份有限公司 Control circuit for relay
CN102751142A (en) * 2012-07-16 2012-10-24 苏州工业园区和顺电气股份有限公司 Power supply control circuit for relay driving module
CN104466883A (en) * 2014-12-31 2015-03-25 国家电网公司 Relay protection outlet lockout circuit
CN108011786A (en) * 2016-11-01 2018-05-08 许扬杰 Intelligent domestic system and its device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101505571A (en) * 2009-02-23 2009-08-12 深圳创维-Rgb电子有限公司 Energy cut starting illuminating apparatus capable of timed self-inspection
CN102129227A (en) * 2010-12-23 2011-07-20 国电南京自动化股份有限公司 Driving loop for automatic device and starting loop thereof

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101505571A (en) * 2009-02-23 2009-08-12 深圳创维-Rgb电子有限公司 Energy cut starting illuminating apparatus capable of timed self-inspection
CN102129227A (en) * 2010-12-23 2011-07-20 国电南京自动化股份有限公司 Driving loop for automatic device and starting loop thereof

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102751143A (en) * 2012-07-16 2012-10-24 苏州工业园区和顺电气股份有限公司 Control circuit for relay
CN102751142A (en) * 2012-07-16 2012-10-24 苏州工业园区和顺电气股份有限公司 Power supply control circuit for relay driving module
CN102751143B (en) * 2012-07-16 2014-12-10 苏州工业园区和顺电气股份有限公司 Control circuit for relay
CN104466883A (en) * 2014-12-31 2015-03-25 国家电网公司 Relay protection outlet lockout circuit
CN104466883B (en) * 2014-12-31 2018-01-19 国家电网公司 A kind of relay protection outlet exclusive circuit
CN108011786A (en) * 2016-11-01 2018-05-08 许扬杰 Intelligent domestic system and its device

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SE01 Entry into force of request for substantive examination
EE01 Entry into force of recordation of patent licensing contract

Application publication date: 20110727

Assignee: Nanjing Guodian Nanjing Grid Automation Co., Ltd.

Assignor: Nanjing Automation Co., Ltd., China Electronics Corp.

Contract record no.: 2012320000943

Denomination of invention: Automatic device system

License type: Common License

Record date: 20120911

LICC Enforcement, change and cancellation of record of contracts on the licence for exploitation of a patent or utility model
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Application publication date: 20110727