CN110045222A - A kind of method for diagnosing faults of fan driving stage - Google Patents
A kind of method for diagnosing faults of fan driving stage Download PDFInfo
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- CN110045222A CN110045222A CN201910375530.7A CN201910375530A CN110045222A CN 110045222 A CN110045222 A CN 110045222A CN 201910375530 A CN201910375530 A CN 201910375530A CN 110045222 A CN110045222 A CN 110045222A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/34—Testing dynamo-electric machines
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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Abstract
The invention discloses a kind of method for diagnosing faults of fan driving stage, fan driving stage is equipped with low side metal-oxide-semiconductor and flash metal-oxide-semiconductor, low side metal-oxide-semiconductor is used for the switch control of inductive load continuous current circuit, flash metal-oxide-semiconductor is used for the switch control of driving circuit, method includes the following steps: fan is to power supply short circuit troubleshooting step: opening low side metal-oxide-semiconductor and close flash metal-oxide-semiconductor, to connect the continuous current circuit of fan, detect the source-drain voltage of low side metal-oxide-semiconductor: if source-drain voltage is greater than threshold value, then fan is to power supply short circuit failure, otherwise, fan fault-free；And/or fan shorted to earth troubleshooting step: it opens flash metal-oxide-semiconductor and closes low side metal-oxide-semiconductor, to connect the driving circuit of fan, detect the source-drain voltage of flash metal-oxide-semiconductor: if source-drain voltage is greater than threshold value, fan is shorted to earth failure, otherwise, fan fault-free.The present invention have diagnosis convenience and high-efficiency it is accurate, can small duty ratio fault detection, extend fan service life, improve fan and use safe technical characterstic.
Description
Technical field
The invention belongs to fan failure diagnostic techniques field more particularly to a kind of method for diagnosing faults of fan driving stage.
Background technique
Fan governor will generally bear biggish fan power, and the calorific value of controller device is very big.Especially in short circuit
Equal fault modes, calorific value are bigger.Excessive calorific value can reduce the service life of controller, can be in most tens millis when serious
Controller is damaged in the time of second.
The driving stage diagnosis of fan governor includes driving end to power supply short circuit, shorted to earth, these three failure moulds of opening a way
Formula.Diagnostic mode typically now is the direct-driving motor when there is driving request, at any driving condition, the meeting such as hardware chip
Quote response fault message.
This routine diagnosis mode, has the disadvantage that:
Calorific value is big in the process, accumulation of heat easy to form, reduces the service life or has damage risk.
Fan usually since driving duty ratio is 0, is gradually increased from static to during driving, until target or
Maximum duty cycle.Since duty ratio driving has certain period, then during the driving of small duty ratio, a duty ratio driving
Effective drive part time of waveform is very short, it is difficult to reach the time threshold that hardware chip diagnosis needs, in this case, even if
There are driving stage failure problems, can not also obtain malfunction.In this way small duty ratio drive during, heat will moment it is a large amount of
It is accumulative, it reduces the service life or has the risk of damage device.
Summary of the invention
Technical purpose of the invention is to provide a kind of method for diagnosing faults of fan driving stage, has diagnosis convenience and high-efficiency quasi-
Really, can small duty ratio fault detection, extend fan service life, improve fan use safe technical characterstic.
To solve the above problems, the technical solution of the present invention is as follows:
A kind of method for diagnosing faults of fan driving stage, the fan driving stage are equipped with low side metal-oxide-semiconductor and flash metal-oxide-semiconductor,
Switch control of the low side metal-oxide-semiconductor for the inductive load continuous current circuit of the fan, the flash metal-oxide-semiconductor are used for the wind
The switch control of the driving circuit of fan, the method for diagnosing faults the following steps are included:
Diagnosis algorithm of the fan to power supply short circuit failure:
It opens the low side metal-oxide-semiconductor and closes the flash metal-oxide-semiconductor, to connect the continuous current circuit of the fan, detect institute
State the low source-drain voltage in metal-oxide-semiconductor: if the source-drain voltage of metal-oxide-semiconductor is greater than threshold value while described low, the fan is to electricity
Source short trouble, otherwise, the fan fault-free；
And/or the diagnosis algorithm of the fan shorted to earth failure:
It opens the flash metal-oxide-semiconductor and closes the low side metal-oxide-semiconductor, to connect the driving circuit of the fan, detect institute
State the source-drain voltage of flash metal-oxide-semiconductor: if the source-drain voltage of the flash metal-oxide-semiconductor is greater than threshold value, the fan is short over the ground
Road failure, otherwise, the fan fault-free.
An embodiment according to the present invention, the fan driving stage are additionally provided with constant-current source, the constant-current source and the fan
It is electrically connected far from ground terminal, the method for diagnosing faults is further comprising the steps of:
The diagnosis algorithm of the fan open-circuit fault:
Close the flash metal-oxide-semiconductor and the low side metal-oxide-semiconductor；
The constant-current source is opened, the first source-drain voltage of the flash metal-oxide-semiconductor is detected；
The constant-current source is closed, the second source-drain voltage of the flash metal-oxide-semiconductor is detected；
Determine: described if first source-drain voltage is more than threshold value and second source-drain voltage is less than threshold value
Fan is open-circuit fault, otherwise, the fan fault-free.
An embodiment according to the present invention, the fan driving stage further includes control module, and the method for diagnosing faults is specific
The following steps are included:
The control module sends a diagnosing sequence, and the diagnosing sequence controls the low side metal-oxide-semiconductor, flash metal-oxide-semiconductor, perseverance
Stream source it is on and off, carry out respectively the fan to power supply short circuit fault diagnosis, shorted to earth fault diagnosis, open circuit examine
It is disconnected；Wherein,
In failure diagnostic process, if the fan is to power supply short circuit failure or shorted to earth failure or open circuit event
Barrier, then the control module jumps out the transmission of presently described diagnosing sequence, and closes driving power.
An embodiment according to the present invention, in failure diagnostic process, source and drain of the control module to the low side metal-oxide-semiconductor
Pole tension, the flash metal-oxide-semiconductor source-drain voltage detected, and the result of the detection is stored in the control module
Register in.
An embodiment according to the present invention, the diagnosis algorithm of the fan open-circuit fault specifically:
Close the flash metal-oxide-semiconductor and the low side metal-oxide-semiconductor；
Remove the corresponding feedback mark of the first source-drain voltage of flash metal-oxide-semiconductor described in the register of the control module
Note, opens the constant-current source, and read the corresponding feedback flag of the first source-drain voltage of the flash metal-oxide-semiconductor, to know
State the first source-drain voltage of flash metal-oxide-semiconductor；
The constant-current source is closed, removes the first source and drain of flash metal-oxide-semiconductor described in the register of the control module again
The corresponding fault flag of pole tension, and the corresponding feedback flag of the first source-drain voltage of the flash metal-oxide-semiconductor is read, to know
Second source-drain voltage of the flash metal-oxide-semiconductor；
Determine: described if first source-drain voltage is more than threshold value and second source-drain voltage is less than threshold value
Fan is open-circuit fault, otherwise, the fan fault-free.
An embodiment according to the present invention, the fan in the diagnosis algorithm of power supply short circuit failure, the low side metal-oxide-semiconductor
Opening time is 5 to 1000us；
In the diagnosis algorithm of the fan shorted to earth failure, the opening time of the flash metal-oxide-semiconductor is 5 to 1000us；
In the diagnosis algorithm of the fan open-circuit fault, the opening time of the constant-current source and shut-in time are 5-
1000ms。
The present invention due to using the technology described above, makes it have the following advantages that and actively imitate compared with prior art
Fruit:
(1) present invention passes through the source-drain voltage amount of the high and low side pipe of detection driving stage, the case where small duty ratio drives
Under, i.e., driving time be less than hardware chip diagnosis need time threshold in the case where, diagnosis fan whether to power supply short circuit, be
No shorted to earth: in diagnosis of the fan to power supply short circuit, no matter how small duty ratio be, once fan is to power supply short circuit, flash
Metal-oxide-semiconductor i.e. meeting overcurrent, that is, the source-drain voltage that will lead to flash metal-oxide-semiconductor increase；In the diagnosis of fan shorted to earth, no matter account for
How small sky than being, once fan shorted to earth, low side metal-oxide-semiconductor i.e. meeting overcurrent, that is, will lead to the source-drain voltage liter of low side metal-oxide-semiconductor
It is high；So can not be limited by the time threshold that hardware chip diagnosis needs, directly be passed through in the case where small duty ratio drives
Physical parameter reacts the failure problems of circuit, reached diagnosis convenience and high-efficiency it is accurate, can small duty ratio fault detection, extend fan
Service life, raising fan use safe technical effect；
(2) present invention goes down to detect whether fan is open circuit by the case where Push And Release of constant-current source, wherein constant-current source is simultaneously
It is not intended to driving fan, the split line state of constant-current source combination flash metal-oxide-semiconductor is judged: in the feelings that high-low side metal-oxide-semiconductor is closed
Under condition, if fan is open circuit, when constant-current source is opened, because constant-current source is equivalent to ground wire without electric current flowing, then power supply and ground
Between flash metal-oxide-semiconductor source-drain electrode between i.e. very big voltage difference can be presented, that is, will detect that the first source-drain voltage is greater than
The threshold value of setting, when constant-current source is closed, flash metal-oxide-semiconductor is power supply on one side, and another side is hanging because fan is opened a way, so
It will detect that the second source-drain voltage of flash metal-oxide-semiconductor is less than the threshold value of setting；And the present invention passes through the first source-drain electrode electricity
The dual diagnosis of pressure and the second source-drain voltage, it is ensured that the accuracy for diagnosis of opening a way has reached that diagnosis convenience and high-efficiency is accurate, prolongs
Long fan service life, raising fan use safe technical effect；
(3) present invention can be automatically to the drive of fan to carry out fan failure diagnosis by control module transmission diagnosing sequence
Dynamic grade carries out automatic fault diagnosis, without personnel go control high-low side metal-oxide-semiconductor, constant-current source it is on and off, secondly, examining
Diagnosing sequence can be jumped out when measuring failure automatically, and closes driving power, to play timely safeguard protection, has reached diagnosis
Convenience and high-efficiency, operation automation, extension fan service life, raising fan use safe technical effect.
Detailed description of the invention
Fig. 1 is a kind of flow chart of the method for diagnosing faults of fan driving stage of the invention；
Fig. 2 is a kind of diagnostic signal procedure chart of the method for diagnosing faults of fan driving stage of the invention；
Fig. 3 is a kind of most simple applicable circuit figure of the method for diagnosing faults of fan driving stage of the invention.
Specific embodiment
Below in conjunction with the drawings and specific embodiments to a kind of method for diagnosing faults work of fan driving stage proposed by the present invention
It is further described.According to following explanation and claims, advantages and features of the invention will be become apparent from.
Referring to Fig. 1, the present embodiment provides a kind of method for diagnosing faults of fan driving stage, fan driving stage is equipped with low side
Metal-oxide-semiconductor and flash metal-oxide-semiconductor, switch control of the low side metal-oxide-semiconductor for the inductive load continuous current circuit of fan, flash metal-oxide-semiconductor are used for
The switch control of the driving circuit of fan, method for diagnosing faults the following steps are included:
Diagnosis algorithm of the fan to power supply short circuit failure: opening low side metal-oxide-semiconductor and closes flash metal-oxide-semiconductor, to connect fan
Continuous current circuit, detect the low source-drain voltage in metal-oxide-semiconductor: if the source-drain voltage of metal-oxide-semiconductor is greater than threshold value while low, fan is
To power supply short circuit failure, otherwise, fan fault-free；
And/or the diagnosis algorithm of fan shorted to earth failure: it opens flash metal-oxide-semiconductor and closes low side metal-oxide-semiconductor, to connect wind
The driving circuit of fan detects the source-drain voltage of flash metal-oxide-semiconductor: if the source-drain voltage of flash metal-oxide-semiconductor is greater than threshold value, fan is
Shorted to earth failure, otherwise, fan fault-free.
Now the present embodiment is described in detail:
Specifically, drive of the method for diagnosing faults of the fan driving stage of the present embodiment especially suitable for cooling fan of engine
The fault diagnosis of dynamic grade.
The present embodiment passes through the source-drain voltage amount of the high and low side pipe of detection driving stage, the case where small duty ratio drives
Under, i.e., driving time be less than hardware chip diagnosis need time threshold in the case where, diagnosis fan whether to power supply short circuit, be
No shorted to earth: in diagnosis of the fan to power supply short circuit, no matter how small duty ratio be, once fan is to power supply short circuit, flash
Metal-oxide-semiconductor i.e. meeting overcurrent, that is, the source-drain voltage that will lead to flash metal-oxide-semiconductor increase；In the diagnosis of fan shorted to earth, no matter account for
How small sky than being, once fan shorted to earth, low side metal-oxide-semiconductor i.e. meeting overcurrent, that is, will lead to the source-drain voltage liter of low side metal-oxide-semiconductor
It is high；So can not be limited by the time threshold that hardware chip diagnosis needs, directly be passed through in the case where small duty ratio drives
Physical parameter reacts the failure problems of circuit, reached diagnosis convenience and high-efficiency it is accurate, can small duty ratio fault detection, extend fan
Service life, raising fan use safe technical effect.
More preferably, fan driving stage is additionally provided with constant-current source, and constant-current source is electrically connected with the separate ground terminal of fan, fault diagnosis
Method is further comprising the steps of:
The diagnosis algorithm of fan open-circuit fault: flash metal-oxide-semiconductor and low side metal-oxide-semiconductor are closed；Constant-current source is opened, flash is detected
First source-drain voltage of metal-oxide-semiconductor；Constant-current source is closed, the second source-drain voltage of flash metal-oxide-semiconductor is detected；Determine: if the first source
Drain voltage is more than threshold value and the second source-drain voltage is less than threshold value, then fan is open-circuit fault, otherwise, fan fault-free.
Specifically, multiple threshold values are referred in the present embodiment, these threshold values are the type and metal-oxide-semiconductor according to used metal-oxide-semiconductor
Characteristic under overcurrent condition and normal operation is set.
Specifically, fan opens the diagnosis algorithm of power supply short circuit failure, diagnosis algorithm, the fan of fan shorted to earth failure
Without unique sequencing between the diagnosis algorithm three of road failure, diagnostic sequence can be freely arranged according to the actual situation.
The present embodiment goes down to detect whether fan is open circuit by the case where Push And Release of constant-current source, wherein constant-current source is simultaneously
It is not intended to driving fan, the split line state of constant-current source combination flash metal-oxide-semiconductor is judged: in the feelings that high-low side metal-oxide-semiconductor is closed
Under condition, if fan is open circuit, when constant-current source is opened, because constant-current source is equivalent to ground wire without electric current flowing, then power supply and ground
Between flash metal-oxide-semiconductor source-drain electrode between i.e. very big voltage difference can be presented, that is, will detect that the first source-drain voltage is greater than
The threshold value of setting, when constant-current source is closed, flash metal-oxide-semiconductor is power supply on one side, and another side is hanging because fan is opened a way, so
It will detect that the second source-drain voltage of flash metal-oxide-semiconductor is less than the threshold value of setting；And the present embodiment passes through the first source-drain electrode
The dual diagnosis of voltage and the second source-drain voltage, it is ensured that the accuracy for diagnosis of opening a way, reached diagnosis convenience and high-efficiency it is accurate,
Extend fan service life, raising fan uses safe technical effect.
More preferably, fan driving stage further includes control module, and method for diagnosing faults is specifically includes the following steps: control module
Send a diagnosing sequence, diagnosing sequence control low side metal-oxide-semiconductor, flash metal-oxide-semiconductor, constant-current source it is on and off, carry out wind respectively
Fan diagnoses power supply short circuit fault diagnosis, shorted to earth fault diagnosis, open circuit；Wherein, in failure diagnostic process, if fan
For to power supply short circuit failure or shorted to earth failure or open-circuit fault, then control module jumps out the hair of Current Diagnostic sequence
It send, and closes driving power.
Specifically, a kind of diagnosing sequence of the present embodiment is as shown in Figure 2, wherein 1. 2. opened to control low side metal-oxide-semiconductor,
3. being opened for control flash metal-oxide-semiconductor, 4. open for control constant-current source, is 5. closed for control constant-current source.
Specifically, referring to Fig. 2, after 1. sequence issues, i.e., low side metal-oxide-semiconductor is opened, in sequence 1. time-continuing process, if
At a time there is fan to power supply short circuit failure, then can detect fault-signal 6., i.e., the source-drain voltage of low side metal-oxide-semiconductor is big
In threshold value, then it is assumed that be to power supply short circuit failure.It is fan occur to power supply short circuit event at the end moment of sequence 1. in Fig. 2
Barrier is particularly the diagnosis process for simply illustrating diagnosing sequence, and in Fig. 2, the institute of the present embodiment is faulty to be occurred
At the end moment of diagnosing sequence.
More preferably, referring to Fig. 2, if sequence does not break down after 1. issuing, that is, fault-signal is not detected 6., then will continue to send out
2. sequence, is again turned on low side metal-oxide-semiconductor, whether reaffirm fan to power supply short circuit, if detection fault-signal is 7., i.e., low side
The source-drain voltage of metal-oxide-semiconductor is greater than threshold value, then it is assumed that is to power supply short circuit failure, is otherwise normal.
Specifically, referring to Fig. 2,3. sequence issues after, i.e. flash metal-oxide-semiconductor is opened, in sequence 3. time-continuing process, if
There is fan shorted to earth failure in a certain moment, then can detect fault-signal 8., i.e., the source-drain voltage of flash metal-oxide-semiconductor is greater than threshold
Value, then it is assumed that be shorted to earth failure.
Specifically, referring to Fig. 2,4. sequence issues after, i.e., constant-current source is opened, in sequence 4. time-continuing process, if at certain
Existing fan open-circuit fault is carved for the moment, then can detect fault-signal 9., is i.e. the first source-drain voltage is greater than threshold value；Then sequence is 5.
After sending, i.e., constant-current source is closed, and due to there is fan open-circuit fault in sequence 5. time-continuing process, then can detect fault-signal
10. i.e. the second source-drain voltage is less than threshold value；Determine: if 9. 10. fault-signal is detected with fault-signal, then it is assumed that be fan
Open-circuit fault.
Specifically, execute sequence 1. -4. during, after finding failure, for cooling fan of engine then immediately into
Enter limping mode, closes driving power, jump out sequence, driving power is then closed for general fan and jumps out diagnosing sequence.
More preferably, in failure diagnostic process, control module is to the source-drain voltage of low side metal-oxide-semiconductor, the source of flash metal-oxide-semiconductor
Drain voltage is detected, and the result that will test is stored in the register of control module.Specifically, referring to Fig. 2, failure letter
Number 6. -10. register in i.e. corresponding control module, for storing the source-drain voltage of low side metal-oxide-semiconductor, the source-drain electrode of flash metal-oxide-semiconductor
The testing result of voltage, to mark.
Specifically, when carrying out automation fault diagnosis by the register of control module, need to be related to above-mentioned register
Removing, storage and the reading of mark；Wherein, it needs to be purged the mark of register before each diagnosis, has avoided one
Secondary diagnosis interferes this diagnosis.
Specifically, the diagnosis algorithm of fan open-circuit fault specifically: close flash metal-oxide-semiconductor and low side metal-oxide-semiconductor；Remove control
The corresponding feedback flag of the first source-drain voltage of flash metal-oxide-semiconductor in the register of module opens constant-current source, and reads flash
The corresponding feedback flag of the first source-drain voltage of metal-oxide-semiconductor, to know the first source-drain voltage of flash metal-oxide-semiconductor；Close constant current
Source, removes the corresponding fault flag of the first source-drain voltage of flash metal-oxide-semiconductor in the register of control module again, and reads height
The corresponding feedback flag of the first source-drain voltage of side metal-oxide-semiconductor, to know the second source-drain voltage of flash metal-oxide-semiconductor；Determine: if
First source-drain voltage is more than threshold value and the second source-drain voltage is less than threshold value, then fan is open-circuit fault, and otherwise, fan is without reason
Barrier.
The present embodiment sends diagnosing sequence by control module can be automatically to the drive of fan to carry out fan failure diagnosis
Dynamic grade carries out automatic fault diagnosis, without personnel go control high-low side metal-oxide-semiconductor, constant-current source it is on and off, secondly, examining
Diagnosing sequence can be jumped out when measuring failure automatically, and closes driving power, to play timely safeguard protection, has reached diagnosis
Convenience and high-efficiency, operation automation, extension fan service life, raising fan use safe technical effect.
Specifically, for fan in the diagnosis algorithm of power supply short circuit failure, the opening time of low side metal-oxide-semiconductor is 5 to 1000us；
In the diagnosis algorithm of fan shorted to earth failure, the opening time of flash metal-oxide-semiconductor is 5 to 1000us；Fan open-circuit fault is examined
In disconnected step, the opening time of constant-current source and shut-in time are 5-1000ms.
More preferably, the opening time of the low side metal-oxide-semiconductor of the present embodiment is set as 100us, reaffirms fan to power supply event
The opening time of the low side metal-oxide-semiconductor of barrier may be set to 600us, and the opening time of flash metal-oxide-semiconductor is set as 100us, constant-current source
The time of opening and closing is set as 20ms.It is apparent that the setting of above-mentioned time is only a kind of setting of the present embodiment, for
Those skilled in the art can adjust the corresponding time according to the diagnostic requirements of time.
Referring to Fig. 3, the present embodiment is described in detail now in conjunction with principle:
Referring to Fig. 3, Fig. 3 is the most simple applicable circuit figure of the method for diagnosing faults of the present embodiment, wherein BAT is power supply, QH
For flash metal-oxide-semiconductor, QL is low side metal-oxide-semiconductor, and I is constant-current source.It is apparent that Fig. 3 be only the present embodiment be applicable in it is a kind of directly simple
Fan driving stage circuit diagram, be based on circuit diagram shown in Fig. 3, can expand for those skilled in the art more multiple
The driving stage circuit of fan miscellaneous, vdiverse in function, to meet the fan control demand in different technologies field, it is thus evident that these expansions
The method for opening up the equally applicable the present embodiment of circuit carries out the fault diagnosis of fan driving stage.
Referring to Fig. 3, flash metal-oxide-semiconductor QH effect is the work of driving fan motor, is the switch of controllable QH by GH；Low side
Metal-oxide-semiconductor QL main function is inductive load motor afterflow, is the switch of controllable QL by GL；Constant-current source acts on not driving fan
Motor, but open a way for fan driving stage and detect the constant current output of setting.
To the fault diagnosis of power supply short circuit: at this point, the QH open circuit of flash metal-oxide-semiconductor, low side metal-oxide-semiconductor QL access, if fan is to electricity
Source short trouble, then QL can overcurrent, its source-drain voltage of QL overcurrent be can increase more than setting threshold value, if fan to power supply not
Short circuit, then the source-drain voltage of QL is less than threshold value, so fan can be diagnosed to be whether to power supply short circuit failure.
The fault diagnosis of shorted to earth: at this point, flash metal-oxide-semiconductor QH access, low side metal-oxide-semiconductor QL open circuit, if fan is short over the ground
Road failure, then QH understands overcurrent, its source-drain voltage of QH overcurrent is the threshold value that can be increased more than setting, if fan is not short-circuit over the ground,
Then the source-drain voltage of QH be less than threshold value, so can be diagnosed to be fan whether shorted to earth failure.
The fault diagnosis of open circuit: at this point, flash metal-oxide-semiconductor QH and low side metal-oxide-semiconductor QL are breaking, if fan is open circuit: working as perseverance
When stream source is opened, since the electric current of the output of breaking constant-current source is different, it is equivalent to ground connection, so QH source-drain voltage is equivalent to electricity
The voltage in source, the value are greater than the threshold value of setting；When constant-current source is closed, since the separate power end of breaking QH is suspended, so
It is zero that QH source-drain voltage, which is equivalent to, the value be less than setting threshold value, therefore can diagnose place fan whether open-circuit fault.
Embodiments of the present invention are explained in detail above in conjunction with attached drawing, but the present invention is not limited to above-mentioned implementations
Mode.Even if to the present invention, various changes can be made, if these variations belong to the model of the claims in the present invention and its equivalent technologies
Within enclosing, then still fall within the protection scope of the present invention.
Claims (6)
1. a kind of method for diagnosing faults of fan driving stage, which is characterized in that the fan driving stage is equipped with low side metal-oxide-semiconductor and height
Side metal-oxide-semiconductor, switch control of the low side metal-oxide-semiconductor for the inductive load continuous current circuit of the fan, the flash metal-oxide-semiconductor are used
In the switch control of the driving circuit of the fan, the method for diagnosing faults the following steps are included:
Diagnosis algorithm of the fan to power supply short circuit failure:
It opens the low side metal-oxide-semiconductor and closes the flash metal-oxide-semiconductor, to connect the continuous current circuit of the fan, detect described low
In the source-drain voltage of metal-oxide-semiconductor: if the source-drain voltage of metal-oxide-semiconductor is greater than threshold value while described low, the fan is short to power supply
Road failure, otherwise, the fan fault-free；
And/or the diagnosis algorithm of the fan shorted to earth failure:
It opens the flash metal-oxide-semiconductor and closes the low side metal-oxide-semiconductor and detect the height to connect the driving circuit of the fan
The source-drain voltage of side metal-oxide-semiconductor: if the source-drain voltage of the flash metal-oxide-semiconductor is greater than threshold value, the fan is shorted to earth event
Barrier, otherwise, the fan fault-free.
2. the method for diagnosing faults of fan driving stage according to claim 1, which is characterized in that the fan driving stage is also
Equipped with constant-current source, the constant-current source is electrically connected with the separate ground terminal of the fan, and the method for diagnosing faults further includes following
Step:
The diagnosis algorithm of the fan open-circuit fault:
Close the flash metal-oxide-semiconductor and the low side metal-oxide-semiconductor；
The constant-current source is opened, the first source-drain voltage of the flash metal-oxide-semiconductor is detected；
The constant-current source is closed, the second source-drain voltage of the flash metal-oxide-semiconductor is detected；
Determine: if first source-drain voltage is more than threshold value and second source-drain voltage is less than threshold value, the fan
For open-circuit fault, otherwise, the fan fault-free.
3. the method for diagnosing faults of fan driving stage according to claim 2, which is characterized in that the fan driving stage is also
Including control module, the method for diagnosing faults specifically includes the following steps:
The control module sends a diagnosing sequence, and the diagnosing sequence controls the low side metal-oxide-semiconductor, flash metal-oxide-semiconductor, constant-current source
It is on and off, carry out respectively the fan to power supply short circuit fault diagnosis, shorted to earth fault diagnosis, open circuit diagnose；
Wherein,
In failure diagnostic process, if the fan be to power supply short circuit failure or shorted to earth failure or open-circuit fault,
Then the control module jumps out the transmission of presently described diagnosing sequence, and closes driving power.
4. the method for diagnosing faults of fan driving stage according to claim 3, which is characterized in that in failure diagnostic process
In, the control module detects the source-drain voltage of the low side metal-oxide-semiconductor, the source-drain voltage of the flash metal-oxide-semiconductor,
And the result of the detection is stored in the register of the control module.
5. the method for diagnosing faults of fan driving stage according to claim 4, which is characterized in that the fan open-circuit fault
Diagnosis algorithm specifically:
Close the flash metal-oxide-semiconductor and the low side metal-oxide-semiconductor；
The corresponding feedback flag of the first source-drain voltage for removing flash metal-oxide-semiconductor described in the register of the control module, beats
The constant-current source is opened, and reads the corresponding feedback flag of the first source-drain voltage of the flash metal-oxide-semiconductor, to know the flash
First source-drain voltage of metal-oxide-semiconductor；
The constant-current source is closed, removes the first source-drain electrode electricity of flash metal-oxide-semiconductor described in the register of the control module again
Corresponding fault flag is pressed, and reads the corresponding feedback flag of the first source-drain voltage of the flash metal-oxide-semiconductor, it is described to know
Second source-drain voltage of flash metal-oxide-semiconductor；
Determine: if first source-drain voltage is more than threshold value and second source-drain voltage is less than threshold value, the fan
For open-circuit fault, otherwise, the fan fault-free.
6. the method for diagnosing faults of fan driving stage described in -5 any one according to claim 1, which is characterized in that the wind
For fan in the diagnosis algorithm of power supply short circuit failure, the opening time of the low side metal-oxide-semiconductor is 5 to 1000us；
In the diagnosis algorithm of the fan shorted to earth failure, the opening time of the flash metal-oxide-semiconductor is 5 to 1000us；
In the diagnosis algorithm of the fan open-circuit fault, the opening time of the constant-current source and shut-in time are 5-1000ms.
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Denomination of invention: A Fault Diagnosis Method for Fan Driver Stage Effective date of registration: 20231009 Granted publication date: 20210810 Pledgee: Societe Generale Bank Co.,Ltd. Qingpu Branch of Shanghai Pledgor: SHANGHAI YUDIAN ELECTRONIC TECHNOLOGY Co.,Ltd. Registration number: Y2023980060288 |
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