CN102045946B - Stamping method - Google Patents
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- CN102045946B CN102045946B CN2009103085706A CN200910308570A CN102045946B CN 102045946 B CN102045946 B CN 102045946B CN 2009103085706 A CN2009103085706 A CN 2009103085706A CN 200910308570 A CN200910308570 A CN 200910308570A CN 102045946 B CN102045946 B CN 102045946B
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Abstract
The invention discloses a stamping method, which comprises the following steps of: providing a stamping mould comprising a first punch die, a second punch die and a third punch die which are arranged sequentially; providing a stamping substrate comprising a first non-product area, a first product area, a second non-product area and a second product area which are arranged sequentially; performing primary stamping on the stamping substrate by utilizing the stamping mould to make the first punch die form a first test pattern in the first non-product area and make the third punch die form a second test pattern in the second non-product area; moving the stamping substrate subjected to the primary stamping; performing secondary stamping on the moved stamping substrate by adopting the stamping mould to make the first punch die form the second test pattern in the second non-product area; and detecting the relative positions of the second test pattern in the second non-product area and the first test pattern, thereby judging whether deviation between the primary stamping and the secondary stamping meets the requirement of deviation tolerance or not.
Description
Technical field
The present invention relates to the stamp technology, relate in particular to a kind of method of board substrate being carried out stamp.
Background technology
Printed circuit board (PCB) has obtained using widely because of having the packaging density advantages of higher.Application about the high density interconnected circuit plate sees also document Takahashi, A.Ooki, N.Nagai, A.Akahoshi; H.Mukoh, A.Wajima, M.Res.Lab.; High density multilayer printed circuit board for HITAC M-880, IEEETrans.on Components, Packaging; And Manufacturing Technology, 1992,1504): 418-425.
Surface and different interlayer applying coverlays at circuit board product come protective circuit.Need offer in the said diaphragm with conductive circuit pattern in the zone that need be in communication with the outside form opening.Therefore, in circuit board, before the applying coverlay, need carry out stamp to coverlay and form opening, to match with its circuit board that will fit.In order to improve the speed of coverlay stamp, the coverlay stamp is adopted the mode that perhaps rotation is dashed of dashing of jumping.Jump to dash be exactly adopt for the coverlay that is in web-like, be fixed in the stamp board, through the volume of rotation coverlay, to an end of coverlay to the continuous stamp of the other end.It then is after a stamp of coverlay finishes that rotation is dashed, and makes coverlay be plane Rotate 180 degree in parallel, carries out another time stamp again, thereby in coverlay, obtains symmetrical structure.In the prior art, two kinds of above-mentioned stamp methods are lacked the detection method of system, normally the product behind the stamp is fitted in circuit board after; Pass through visual detection; Could find that there is deviation in the coverlay that stamp obtains, then need the coverlay of fitting be removed, and the coverlay that meets the demands of the deviation of fitting again; Thereby lose time, influence board production efficient.
Summary of the invention
Therefore, be necessary to provide a kind of stamp method, just detect the deviation situation of stamp base material before can after stamp, fitting.
Below will a kind of stamp method be described with embodiment.
A kind of stamp method comprises step: punching mould is provided, and said punching mould comprises first punch die, second punch die and the 3rd punch die that sets gradually; The stamp base material is provided, and said stamp base material comprises the first non-product area, first product area, the second non-product area and second product area, and said first product area is between the first non-product area and the second non-product area; Utilize said punching mould that the stamp base material is carried out the stamp first time; So that first punch die forms first test pattern in the first non-product area of stamp base material; Second punch die forms first product pattern in product area, and the 3rd punch die forms second test pattern in the second non-product area; Stamp base material behind the mobile stamp for the first time; So that the second non-product area of the stamp base material after moving is positioned at the first non-product area position of the stamp base material before moving, second product area of the stamp base material after moving is positioned at the first product area position of the stamp base material before moving; Utilize said punching mould that the stamp base material after moving is carried out the stamp second time, so that first punch die also forms one first test pattern in the second non-product area of stamp base material, second punch die forms second product pattern in second product area; The relative position of first test pattern that forms in the second non-product area when detecting second test pattern that stamp for the first time forms in the second non-product area with stamp for the second time, thus whether the deviation of second product pattern that first product pattern that forms in first product area when judging stamp for the first time forms in second product area during with stamp for the second time satisfies the requirement of off normal tolerance.
Compared with prior art; The stamp method that the present technique scheme provides; Only need to reach the punch die with corresponding second test pattern of first test pattern at the punching mould setting and first test pattern; Concern and detect successively carrying out first test pattern that stamp forms position for twice, thereby just whether the deviation between twice stamp of decidable satisfies the requirement of off normal tolerance with second test pattern.The deviation detecting method of present technique scheme can prevent that the stamp product that the off normal tolerance does not meet the demands from flowing in the follow-up procedure for producing, and has the advantages that processing procedure is simple and be convenient to operate.
Description of drawings
Fig. 1 is the sketch map of the punching mould that provides of present technique scheme first embodiment.
Fig. 2 is the sketch map of the stamp base material that provides of present technique scheme first embodiment.
Fig. 3 be present technique scheme first embodiment provide to the stamp base material sketch map behind the stamp for the first time.
Fig. 4 be present technique scheme first embodiment provide to the stamp base material sketch map that for the second time the off normal tolerance meets the demands behind the stamp.
Fig. 5 be present technique scheme first embodiment provide to the stamp base material sketch map that for the second time the off normal tolerance does not meet the demands behind the stamp.
Fig. 6 be present technique scheme first embodiment provide to stamp base material another sketch map that for the second time the off normal tolerance does not meet the demands behind the stamp.
Fig. 7 is the sketch map of the punching mould that provides of present technique scheme second embodiment.
Fig. 8 is the sketch map of the stamp base material that provides of present technique scheme second embodiment.
Fig. 9 be present technique scheme second embodiment provide to the stamp base material sketch map behind the stamp for the first time.
Figure 10 be present technique scheme second embodiment provide to the stamp base material sketch map behind the stamp for the second time.
Embodiment
The detection method of the stamp deviation that the present technique scheme is provided below in conjunction with accompanying drawing and a plurality of embodiment is described further.
A kind of stamp method that present technique scheme first embodiment provides, said stamp method can be applied to the stamp base material is jumped the detection of the deviation of dashing, and this stamp method comprises step:
See also Fig. 1, the first step provides punching mould 100.
Punching mould 100 comprises first punch die 110, second punch die 120 and the 3rd punch die 130 that sets gradually.First punch die 110 is used to form first test pattern, and second punch die 120 is used to form product pattern, and the 3rd punch die 130 is used to form second test pattern.
In the present embodiment, first punch die 110 has equal diameters and the equal angles setting of four cross sections for circular 111, four first punching pines 111 of four first punching pines, and promptly four first punching pin 111 centers are symmetrical set.The 3rd punch die 130 has a cross section and is the second circular punching pin 131.The center of each first punching pin 111 and the distance of symmetrical centre are equal to radius, first punching pin, 111 radiuses and the off normal tolerance sum of second punching pin 131.Said off normal tolerance can confirm according to the precision of actual fabrication circuit board, its can for ± 0.05 millimeter, ± 0.07 millimeter or be ± 0.10 millimeter.First punching pin 111 can equate with the diameter of second punching pin 131, also can not wait.
Second step saw also Fig. 2, and stamp base material 200 is provided.Stamp base material 200 can be coverlay etc.Stamp base material 200 comprises a plurality of product area and the non-product area of alternately arranging that are provided with along its length direction, and the line at the center of the center of first punch die 110 and the 3rd punch die 130 is parallel to the length direction of stamp base material 200.In the present embodiment; Stamp base material 200 comprises the non-product area of the first non-product area 210 that is arranged in order, first product area 220, second 230, second product area 240; Promptly first product area 220 is between the first non-product area 210 and the second non-product area 230, and second product area 240 is adjacent with the second non-product area 230.The size of first product area 220 and second product area 240 and second punch die 120 big or small corresponding, the size of first non-product area 210, the second non-product area 230 is big or small corresponding with first punch die 110 and the 3rd punch die 130.
The 3rd step; Consult Fig. 3; Utilize 100 pairs of stamp base materials of punching mould 200 to carry out the stamp first time; So that first punch die 110 forms first product pattern, 221, the second punch dies 130 at second non-product area 230 formation second test pattern 260 at first non-product area 210 formation first test pattern 250, the second punch dies 120 of stamp base material 200 in first product area 220.
The first non-product area 210 of first punch die 110 of punching mould 100 and stamp base material 200 is corresponding; Second punch die 120 is corresponding with first product area 220 of stamp base material 200, and the second non-product area 230 of the 3rd punch die 130 and stamp base material 200 is corresponding.Punching mould 100 is under the effect of stamp board (figure does not show) pressure; The first non-product area 210 at stamp base material 200 forms first test pattern 250; First product area 220 of stamp base material 200 forms first product pattern 221, and the second non-product area 230 of stamp base material 200 forms second test pattern 260.In the present embodiment, first test pattern 250 is the circular hole that 4 center symmetries and equal angles uniformly-spaced are provided with, and the symmetrical centre of 4 circular holes is defined as the center of first test pattern 250.Second test pattern 260 is a circular hole, and the center of circle of this circular hole is defined as the center of second test pattern 260.The spacing at the center of the center of first test pattern 250 and second test pattern 260 is defined as the distance between first test pattern 250 and second test pattern 260.
The 4th step; Consult Fig. 3; Move the stamp base material 200 behind the stamp for the first time along the direction of the line of centres of the center and the 3rd punch die 130 that are parallel to first punch die 110; Move the preceding first non-product area 210 positions so that second product area 230 of the stamp base material 200 after moving is positioned at, second product area 240 of the stamp base material 200 after moving is positioned at the position of moving preceding first product area 220 places.
In the present embodiment; The line at the center of the center of first punch die 110 and the 3rd punch die 130 is parallel to the length direction of stamp base material 200; Move the stamp base material 200 behind the stamp for the first time along the direction of the line of centres of center that is parallel to first punch die 110 and the 3rd punch die 130; And the distance that makes stamp base material 200 move equates with the distance of second test pattern 260 with first test pattern 250; Thereby make and move the preceding first non-product area 210 positions that second product area 240 of the stamp base material 200 after moving is positioned at the position of moving preceding first product area 220 places so that second product area 230 of the stamp base material 200 after moving is positioned at.
The 5th step; Consult Fig. 4; Utilize the stamp base material 200 after 100 pairs of punching moulds move to carry out the stamp second time; So that first punch die 110 forms first test pattern, 250, the second punch dies 120 at second product area, 240 formation, second product pattern 241 in the second non-product area 230 of stamp base material 200.
Through in the last step to the moving of stamp base material 200, make the second non-product area 230 of win punch die 110 and stamp base material 200 corresponding, second punch die 120 is corresponding with second product area 240 of stamp base material 200.Under the effect of the pressure of stamp board, first punch die 110 forms first test pattern, 250, the second punch dies 120 in the second non-product area 230 and forms second product pattern 241 in second product area 240.And stamp second test pattern 260 that forms and first test pattern 250 that the second time, stamp formed overlaps for the first time.
The 6th step; According to detecting the stamp base material 200 second non-product area relative position relation of first test pattern 250 that forms of second test pattern 260 that forms of stamp and stamp for the second time for the first time, thereby whether the deviation of second product pattern 241 that first product pattern 221 that forms in first product area 220 when judging stamp for the first time forms in second product area 240 during with stamp for the second time satisfies the requirement of off normal tolerance.
In the present embodiment, the relative position relation of first test pattern 250 that the mode that can adopt range estimation forms in the second non-product area 240 during with stamp for the second time second test pattern 260 that forms in the second non-product area 240 during stamp the first time detects.See also Fig. 3; When the first time stamp when for the second time the deviation of stamp satisfies requiring of off normal tolerance; A circular hole of second test pattern 260 of stamp formation for the first time is non-intersect with 250 4 circular holes of first resolution chart of stamp formation for the second time, and promptly four circular holes of first test pattern 250 of stamp formation for the second time are around a circular hole of second test pattern 260 that stamp the forms first time.
See also Fig. 5 and Fig. 6; When the first time stamp when for the second time the deviation of stamp does not satisfy requiring of off normal tolerance, one or more in 250 4 circular holes of first resolution chart of forming of circular hole of second test pattern 260 that forms of stamp and stamp for the second time intersects for the first time.Certainly, for the first time a circular hole of second test pattern 260 that forms of stamp can not satisfy the off normal tolerance in the middle of not being positioned at four circular holes of first test pattern 250 that stamp for the second time forms yet.
Be appreciated that the stamp base material 200 that present embodiment provides can comprise a plurality of product area that are arranged alternately and non-product area, thereby detect the requirement whether deviation between the product pattern that adjacent two product area form satisfies the off normal tolerance.For example; Also make the 3rd non-product area be positioned at the second non-product area position of the stamp base material before moving during stamp base material 200 after moving stamp for the first time; Utilize said punching mould that the stamp base material 200 after moving is carried out the second time during stamp; Also form second test pattern in the 3rd non-product area; Said stamp method also comprises step after the 3rd non-product area forms second test pattern: the line direction along the center of the center and second punch die that are parallel to first punch die moves the stamp base material; Make that moving three products zone, back is positioned at the position of moving preceding second product area, the 3rd non-product area after moving is positioned at the position of moving the preceding second non-product area place; Utilize punching mould that the stamp base material is carried out stamp for the third time, make second punch die form the three products pattern, make the punch die of winning form first test pattern in the 3rd non-product area in the three products zone; Detect stamp for the second time at second test pattern that the 3rd non-product area forms and the relative position of stamp between first test pattern that the 3rd non-product area forms for the third time, thereby whether second product pattern that forms in second product area when judging stamp for the second time satisfies the requirement of off normal tolerance during with stamp for the third time in the deviation of the three products pattern of the regional formation of three products.
A kind of stamp method that present technique scheme second embodiment provides, this method can be applied to rotate the detection of off normal tolerance behind the stamp.
See also Fig. 7, the first step provides punching mould 300.
In the present embodiment, first punch die 310 has equal diameters and the equal angles setting of four cross sections for circular 311, four first punching pines 311 of four first punching pines, and promptly four first punching pin 311 centers are symmetrical set.The 3rd punch die 330 has a cross section and is the second circular punching pin 331.The center of each first punching pin 311 and the distance of symmetrical centre are equal to radius, first punching pin, 311 radiuses and the off normal tolerance sum of second punching pin 331.Said off normal tolerance can confirm according to the precision of actual fabrication circuit board, its can for ± 0.05 millimeter, ± 0.07 millimeter or be ± 0.10 millimeter.First punching pin 311 can equate with the diameter of second punching pin 331, also can not wait.
See also Fig. 8, stamp base material 400 is provided.Stamp base material 400 can be coverlay etc.Stamp base material 400 comprises the first non-product area 410, first product area, 420, the second non-product area 430 and second product area 440 that is arranged in order.First product area 420 and second product area 440 are between the first non-product area 410 and the second non-product area 430, and first product area 420 and second product area 440 are symmetrical set about stamp base material 400 centers.The size of first product area 420 is big or small corresponding with second punch die 320, and the size of first non-product area 410, the second non-product area 430 is big or small corresponding with first punch die 310 and the 3rd punch die 330.
The 3rd step; See also Fig. 9; Utilize 300 pairs of stamp base materials of punching mould 400 to carry out the stamp first time; So that first punch die 310 forms first product pattern, 421, the three punch dies 330 at second non-product area 430 formation second test pattern 460 at first non-product area 410 formation first test pattern 450, the second punch dies 320 of stamp base material 300 in first product area 420.
The first non-product area 410 of first punch die 310 of punching mould 300 and stamp base material 400 is corresponding; Second punch die 320 is corresponding with first product area 420 of stamp base material 420, and the second non-product area 430 of the 3rd punch die 330 and stamp base material 400 is corresponding.Punching mould 300 is under the effect of stamp board (figure does not show) pressure; The first non-product area 410 at stamp base material 400 forms first test pattern 450; First product area 420 of stamp base material 400 forms first product pattern 421, and the second non-product area 430 of stamp base material 400 forms second test pattern 460.In the present embodiment, first test pattern 450 is the circular hole that four center symmetries and equal angles uniformly-spaced are provided with, and the symmetrical centre of 4 circular holes is defined as the center of first test pattern 450.Second test pattern 460 is a circular hole, and the center of circle of this circular hole is defined as the center of second test pattern 460.
The 4th step; See also Figure 10; Make stamp base material 400 behind the stamp for the first time in the plane at its place around the center of punching mould 300 the Rotate 180 degree; So that being positioned at, the first non-product area 410 of the stamp base material 200 after rotating moves the preceding second non-product area 430 positions; The second non-product area 430 of the stamp base material 400 after moving is positioned at the position of moving the preceding first non-product area 410 places, moves the position that back second product area 440 is positioned at moving preceding first product area 420 places.
The 5th step; See also Figure 10; Utilize the stamp base material 400 after 300 pairs of punching moulds move to carry out the stamp second time; So that first punch die 310 forms second product pattern, 422, the three punch dies 330 at first non-product area 410 formation second test pattern 460 at second non-product area 430 formation first test pattern 450, the second punch dies 320 of stamp base material 400 in product area 420.
Through in the last step to the rotation of stamp base material 400; Make the second non-product area 430 of win punch die 310 and stamp base material 400 corresponding; Second punch die 320 is corresponding with second product area 440 of stamp base material 400, and the first non-product area 410 of second punch die 330 and stamp base material 400 is corresponding.Under the effect of the pressure of stamp board, first punch die 310 forms first test pattern, 450, the second punch dies 120 in the second non-product area 430 and forms second product pattern 422 in second product area 440.And; Stamp second test pattern 260 that forms and first test pattern 250 that the second time, stamp formed overlaps for the first time; First test pattern 250 of stamp formation for the first time overlaps with second test pattern 260 of stamp formation for the second time, first product pattern 421 of stamp formation for the first time and second product pattern, the 441 centers symmetry of stamp formation for the second time.
The 6th step; The relative position of first test pattern 450 that the relative position of first test pattern 450 that forms when detecting second test pattern 460 that stamp base material 400 forms during stamp in the first non-product area 410 for the first time with stamp for the second time and second test pattern 460 that forms in the second non-product area 420 during stamp for the first time form in the second non-product area 420 during with stamp for the second time, thus whether the deviation of second product pattern 441 that first product pattern 421 that forms in first product area 420 when judging stamp for the first time forms in second product area 440 during with stamp for the second time satisfies the requirement of off normal tolerance.
In the present embodiment, first test pattern 450 that the mode that can adopt range estimation forms second test pattern 460 that first time of forming, stamp formed and stamp for the second time and for the first time the relative position relation of second test pattern 460 that forms of first test pattern 450 that forms of stamp and stamp for the second time detect.When the first time stamp when for the second time the deviation of stamp satisfies requiring of off normal tolerance; A circular hole of second test pattern 460 of stamp formation for the second time is all non-intersect with 450 4 circular holes of first resolution chart of stamp formation for the first time, and promptly four circular holes of first test pattern 450 of stamp formation for the second time are around a circular hole of second test pattern 460 that stamp the forms first time; And a circular hole of second test pattern 460 of stamp formation for the first time is all non-intersect with four circular holes of first test pattern 450 of stamp formation for the second time.
Deviation when not satisfying requiring of off normal tolerance when second product pattern 460 that first product pattern 450 that stamp forms forms with the stamp for the second time first time; For the second time at least one in 450 4 circular holes of second resolution chart of forming of circular hole of second test pattern 460 that forms of stamp and stamp for the first time intersects, and at least one intersects in four circular holes of first test pattern 450 that forms of circular hole of second test pattern 460 that forms of stamp and stamp for the second time for the first time.Not being positioned at when second test pattern that twice stamp forms in the middle of four circular holes of first test pattern of twice formation also is not satisfy tolerance.
In the present technique scheme, the shape of first punching pin of first punch die and the second punching pin cross section of second punch die also is not limited to the circle that present embodiment provides, and it also can be shapes such as regular polygon.The number of first punching pin also is not limited to 4, and they also can be for 3 or more than 4.In addition, first punch die can include only a punching pin, and second punch die comprises a plurality of punching pines.
The detection method of the stamp deviation that the present technique scheme provides; Only need to reach the punch die with corresponding second test pattern of first test pattern at the punching mould setting and first test pattern; Concern and detect successively carrying out first test pattern that stamp forms position for twice, thereby just whether the deviation between twice stamp of decidable satisfies the requirement of off normal tolerance with second test pattern.The deviation detecting method of present technique scheme can prevent that the stamp product that the off normal tolerance does not meet the demands from flowing in the follow-up procedure for producing, and has the advantages that processing procedure is simple and be convenient to operate.
It is understandable that, for the person of ordinary skill of the art, can make other various corresponding changes and distortion by technical conceive according to the present invention, and all these change the protection range that all should belong to claim of the present invention with distortion.
Claims (7)
1. stamp method comprises step:
Punching mould is provided; Said punching mould comprises first punch die, second punch die and the 3rd punch die that sets gradually; First punch die of said punching mould has a plurality of cross sections and is the first circular punching pin; Said a plurality of first punching pin is with respect to a symmetrical centre center symmetry; The equal diameters of said a plurality of first punching pines, said second punch die have a cross section and are the second circular punching pin, the center of each first punching pin and the spacing of said symmetrical centre equal first punching pin radius, second punching pin radius and off normal tolerance absolute value add and;
The stamp base material is provided, and said stamp base material comprises the first non-product area, first product area, the second non-product area and second product area, and said first product area is between the first non-product area and the second non-product area;
Utilize said punching mould that the stamp base material is carried out the stamp first time; So that first punch die forms first test pattern in the first non-product area of stamp base material; Second punch die forms first product pattern in product area, and the 3rd punch die forms second test pattern in the second non-product area;
Stamp base material behind the mobile stamp for the first time; So that the second non-product area of the stamp base material after moving is positioned at the first non-product area position of the stamp base material before moving, second product area of the stamp base material after moving is positioned at the first product area position of the stamp base material before moving;
Utilize said punching mould that the stamp base material after moving is carried out the stamp second time, so that first punch die also forms one first test pattern in the second non-product area of stamp base material, second punch die forms second product pattern in second product area;
The relative position of first test pattern that forms in the second non-product area when detecting second test pattern that stamp for the first time forms in the second non-product area with stamp for the second time; When at least one circular hole in a plurality of circular holes of the circular hole of second test pattern and first test pattern intersected, then stamp and the deviation of stamp did not for the second time satisfy the requirement of off normal tolerance for the first time;
When a plurality of circular holes of first test pattern circular hole around second test pattern; And a circular hole of second test pattern separates with a plurality of circular holes of first test pattern mutually, and then the deviation of second product pattern of first product pattern of stamp formation for the first time and stamp formation for the second time satisfies the requirement of off normal tolerance.
2. stamp method as claimed in claim 1; It is characterized in that; First punch die of said punching mould, second punch die and the 3rd punch die set gradually along the length direction of stamp base material; The line at the center of the center of first punch die and the 3rd punch die is parallel to the length direction of stamp base material, and the first non-product area of said stamp base material, first product area, the second non-product area and second product area also set gradually along the length direction of stamp base material.
3. stamp method as claimed in claim 2; It is characterized in that; Behind first time stamp, along the line direction translation stamp base material at the center of the center that is parallel to first punch die and second punch die, the distance that the stamp base material moves equals the center of first punch die and the spacing of the 3rd center of die.
4. stamp method as claimed in claim 2; It is characterized in that; Said stamp base material also comprises the 3rd non-product area and three products zone; The said the 3rd non-product area also makes the 3rd non-product area be positioned at the second non-product area position of the stamp base material before moving between second product area and three products zone during stamp base material after moving stamp for the first time, utilize said punching mould that the stamp base material after moving is carried out the second time during stamp; Also form second test pattern in the 3rd non-product area, said stamp method also comprises step after the 3rd non-product area forms second test pattern:
Line direction along the center of the center and second punch die that are parallel to first punch die moves the stamp base material; Make that moving three products zone, back is positioned at the position of moving preceding second product area, the 3rd non-product area after moving is positioned at the position of moving the preceding second non-product area place; Utilize punching mould that the stamp base material is carried out stamp for the third time, make second punch die form the three products pattern, make the punch die of winning form first test pattern in the 3rd non-product area in the three products zone;
Detect stamp for the second time at second test pattern that the 3rd non-product area forms and the relative position of stamp between first test pattern that the 3rd non-product area forms for the third time, thereby whether second product pattern that forms in second product area when judging stamp for the second time satisfies the requirement of off normal tolerance during with stamp for the third time in the deviation of the three products pattern of the regional formation of three products.
5. stamp method as claimed in claim 1; It is characterized in that; Said first punch die and the 3rd punch die are symmetrical set about the center of punching mould, and first product area of said stamp base material and second product area are all between the first non-product area and the second non-product area.
6. stamp method as claimed in claim 5; It is characterized in that; After first time stamp; Make the stamp base material in the plane at its place around the center of punching mould the Rotate 180 degree move preceding the second non-product area position so that the first non-product area of the stamp base material after rotating is positioned at, first product area after moving is positioned at the position that second product area before moving belongs to.
7. stamp method as claimed in claim 6; It is characterized in that; Said stamp method also comprises the relative position relation of second test pattern that the first non-product area that detects the stamp base material formed when first test pattern that stamp forms is with stamp for the second time in the first time, thereby whether the deviation of second product pattern that first product pattern that forms in product area when further judging stamp for the first time forms during with stamp for the second time satisfies the requirement of off normal tolerance.
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| CN2009103085706A CN102045946B (en) | 2009-10-21 | 2009-10-21 | Stamping method |
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| CN2009103085706A CN102045946B (en) | 2009-10-21 | 2009-10-21 | Stamping method |
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| CN102045946B true CN102045946B (en) | 2012-08-22 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107222973B (en) * | 2017-06-16 | 2020-02-14 | 苏州市华扬电子股份有限公司 | Method for rapidly producing qualified flexible circuit board |
| CN108381666A (en) * | 2017-08-29 | 2018-08-10 | 苏州东福电子科技股份有限公司 | Inclined method is rushed in a kind of quick inspection |
| CN108422489B (en) * | 2018-03-28 | 2021-02-19 | 苏州安洁科技股份有限公司 | Blade structure and jumping process |
| CN111761654A (en) * | 2020-05-28 | 2020-10-13 | 浙江格铭工艺品有限公司 | Panel detection device that punches for bamboo wooden plate |
| CN112616266A (en) * | 2020-12-25 | 2021-04-06 | 悦虎晶芯电路(苏州)股份有限公司 | Surface step type circuit board alignment inspection method and circuit board |
| CN113478572A (en) * | 2021-07-14 | 2021-10-08 | 江西华视光电有限公司 | COF double-cavity automatic punching structure |
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| CN101483976A (en) * | 2008-01-11 | 2009-07-15 | 精工爱普生株式会社 | Method for manufacturing flexible substrate and flexible substrate punching device |
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| CN101483976A (en) * | 2008-01-11 | 2009-07-15 | 精工爱普生株式会社 | Method for manufacturing flexible substrate and flexible substrate punching device |
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| JP特开2004-273992A 2004.09.30 |
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| CN102045946A (en) | 2011-05-04 |
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