CN102006160B - Jitter generator for generating jittering clock signals - Google Patents
Jitter generator for generating jittering clock signals Download PDFInfo
- Publication number
- CN102006160B CN102006160B CN 201010520862 CN201010520862A CN102006160B CN 102006160 B CN102006160 B CN 102006160B CN 201010520862 CN201010520862 CN 201010520862 CN 201010520862 A CN201010520862 A CN 201010520862A CN 102006160 B CN102006160 B CN 102006160B
- Authority
- CN
- China
- Prior art keywords
- control signal
- clock
- generator
- signal
- jitter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
Abstract
The invention provides a jitter generator for generating jittering clock signals, comprising a jittering control signal generator and a jittering clock generator, wherein the jittering control signal generator is used for selecting one digital code from a plurality of candidate digital codes at different time points and respectively outputting a plurality of different selected digital codes; the jitteirng clock generator is coupled to the jittering control signal generator and used for generating the jittering clock signals; and the jitteirng clock generator is used for respectively dynamically adjusting the jittering clock signals according to a plurality of different digital codes.
Description
The present invention is dividing an application of following patent application: application number: 200710160159.X, the applying date: on December 24th, 2007, denomination of invention: the shake generator that is used for producing dithering clock signal
Technical field
The present invention relates to a kind of shake generator (jitter generator), particularly, relate to a kind of dithering clock signal that produces to be applied in built-in self-test (built-in-self-test, shake generator BIST) in the chip.
Background technology
In digital communication system, receiver is to weigh an important parameter of whole system performance for the tolerance of timing jitter (timing jitter), particularly in communication system at a high speed.So-called time jitter refers to when skew institute has taken place in the position that data or rising edge clock signal/trailing edge should occur and causes (that is phase deviation), thereby (bit error rate BER) rises may to make the error rate of receiver.Known solution usually by the clock in the receiver and data also primary circuit (clock and data recovery CDR) reduces shake for the influence of receiver.
Therefore, how the shake tolerance (jitter tolerance) of test receiver is an important problem always.Common test structure utilizes a shake generator to contain the frequency signal of time jitter, and a string test data position at random inputed to a D flip-flop (D-type flip-flop), and this D flip-flop triggers by this frequency signal that contains time jitter and operates; Like this, just exportable a string data bit with time jitter of this D flip-flop.The data bit crossfire that then again this is had time jitter inputs to receiver, output and the test data bit streams of input of receiver is compared to learn the shake tolerance of receiver.
Yet a good shake generator must be controlled the frequency of shake and the size of jitter amplitude; Wherein, jitter amplitude refers to the size of data or clock signal phase skew, and the frequency of shake refers to the number of times that phase deviation takes place.Although existing ready-made tester can satisfy this demand on the market at present, yet this kind tester is expensive, also is unfavorable for batch testing.Another kind of alternative then is to utilize signal generator and frequency mixer modulation to go out to have the frequency signal of shake, and this method cost is lower.
Summary of the invention
The object of the present invention is to provide a kind of shake generator that can be used for the built-in self-test in the chip, the machine cost during with the saving batch testing.
One embodiment of the present of invention provide a kind of shake generator (jitter generator) that is used for producing a jitter clock (jittered clock) signal, and it comprises a jitter control signal generator and a jitter clock generator.This jitter control signal generator is used for selecting a digital code in different time points in a plurality of candidate numbers codes, and exports selected a plurality of different digital code respectively; And this jitter clock generator is coupled to this jitter control signal generator, be used for producing this dithering clock signal, wherein this jitter clock generator is dynamically adjusted this dithering clock signal according to these a plurality of different digital codes respectively, wherein this clock lock circuit is a delay lock loop, and this delay lock loop comprises: phase comparator is used for producing comparative result according to this clock input signal and this clock feedback signal; The control signal generator is coupled to this phase comparator, is used for producing control signal according to this comparative result; And delay circuit, be coupled to this phase comparator and this control signal generator, postpone this clock input signal to produce this clock feedback signal, comprising: first Postponement module is used for producing this dithering clock signal according to the first retardation control signal in this Section Point; And second Postponement module, be coupled between this first node and this Section Point, be used for the foundation second retardation control signal to produce this clock feedback signal in this first node, and wherein a phase-adjusting circuit produces this first, second retardation control signal respectively according to this control signal and this dither control signal.
Another embodiment of the present invention provides a kind of shake generator that is used for producing a dithering clock signal, comprises a jitter control signal generator and a jitter clock generator.This jitter control signal generator is used for producing a dither control signal; And this jitter clock generator is coupled to this jitter control signal generator, it comprises a clock lock-in circuit, be used for carrying out a clock lock operation according to a clock input signal and a clock feedback signal, to produce this clock feedback signal in first node and to produce this dithering clock signal in Section Point, wherein this clock lock circuit is a phase-locked loop, and this phase-locked loop comprises: phase comparator is used for producing comparative result according to this clock input signal and this clock feedback signal; The control signal generator is coupled to this phase comparator, is used for producing control signal according to this comparative result; And ring oscillator, be coupled to this phase comparator and this control signal generator, be used for producing this clock feedback signal, comprising: anti-phase module; First Postponement module is used for according to the first retardation control signal to produce this dithering clock signal in this Section Point; And second Postponement module, be coupled between this first node and this Section Point, be used for the foundation second retardation control signal to produce this clock feedback signal in this first node, and wherein a phase-adjusting circuit produces this first, second retardation control signal respectively according to this control signal and this dither control signal.
Description of drawings
Fig. 1 is the functional block diagram of the shake generator of first embodiment of the invention;
The schematic diagram of the digital code that Fig. 2 exports for jitter control signal generator shown in Figure 1;
The schematic diagram of the dithering clock signal that Fig. 3 exports for shake generator shown in Figure 1;
Identical but the schematic diagram of a plurality of clock output signals that phase place is different of the frequency that Fig. 4 exports for multiphase clock generator shown in Figure 1;
Fig. 5 is the functional block diagram of the shake generator of second embodiment of the invention;
Fig. 6 is the functional block diagram of the shake generator of third embodiment of the invention;
Fig. 7 is the functional block diagram of phase interpolation delay lock loop shown in Figure 6;
Fig. 8 is the functional block diagram of the shake generator of fourth embodiment of the invention;
Fig. 9 is the functional block diagram of phase interpolation phase-locked loop shown in Figure 8;
Figure 10 is the functional block diagram of the shake generator of fifth embodiment of the invention; And
Figure 11 is the functional block diagram of the shake generator of sixth embodiment of the invention.
Embodiment
Please refer to Fig. 1, Figure 1 shows that the functional block diagram of the shake generator 10 of first embodiment of the invention.Shake generator 10 comprises jitter clock generator 100 and jitter control signal generator 110, and jitter clock generator 100 then comprises a multiphase clock generator 102 and a phase selector 104.Jitter control signal generator 110 is used for selecting at least one group of digital code in different time points in many group candidate numbers codes, and export selected a plurality of different digital code respectively, in the present embodiment, (direct digital frequency synthesizer DDFS) 112 is realized jitter control signal generator 110 by a direct digital frequency synthesizer.Direct Digital Frequency Synthesizers 112 is a kind of assembly that is used for producing digitized random waveform, and its operating principle is for knowing known to this operator, so correlative detail does not repeat them here.According to chattering frequency control signal J
FreqAnd jitter amplitude control signal J
AmpCan control Direct Digital Frequency Synthesizers 112 and produce required digital waveform signal in regular turn, with this digital waveform signal as digital code SEL (as shown in Figure 2).Jitter clock generator 100 is used for producing dithering clock signal J
Out, and dynamically adjust dithering clock signal J according to digital code SEL
Out(as shown in Figure 3).In the present embodiment, jitter clock generator 100 is made up of multiphase clock generator 102 and phase selector 104; Wherein, multiphase clock generator 102 is according to clock input signal CLK
InTo produce a plurality of candidate's clock output signal CLK
Out (n), these a plurality of clock output signal CLK wherein
Out (n)For frequency is identical but the clock signal that phase place is different (in the present embodiment, n=0～3 also can produce the clock signal of four outs of phase, as shown in Figure 4).In the present embodiment, multiphase clock generator 102 is by a leggy phase-locked loop (multi-phase phase locked loop, multi-phase PLL) 106 realizes, please note, this only is used for exemplary illustration, be not to be used as restrictive condition of the present invention, that is any frequency that produces is identical but circuit a plurality of clock signals that phase place is different all may be utilized to realize desired multiphase clock generator 102.Phase selector 104 is coupled to multiphase clock generator 102 and phase place and selects control signal generator 110, is used for the digital code SEL that exports according to jitter control signal generator 110, from n candidate's clock output signal CLK
Out (n)The middle specific clock output signal of selecting is to produce dithering clock signal J
OutBecause Direct Digital Frequency Synthesizers 112 can produce the digital signal of different amplitudes in different time points, that is exports different digital code SEL; Thus, phase selector 104 also is not quite similar in the phase place of the selected clock output signal of each time point, therefore just can produce the frequency signal J with time jitter
Out(as shown in Figure 3).
Please refer to Fig. 5, Figure 5 shows that the functional block diagram of the shake generator 20 of second embodiment of the invention.Shake generator 20 comprises a jitter clock generator 200 and a jitter control signal generator 210, wherein jitter clock generator 200 comprises a multiphase clock generator 202 and a phase selector 204, and jitter control signal generator 210 then comprises direct digital frequency synthesizer 212 and a decoder 214.The circuit framework of the 5th figure is roughly identical with Fig. 1, and unique place different with Fig. 1 is: the jitter control signal generator more than 210 in the middle of the 5th figure decoder 214; Decoder 214 is used for the digital waveform signal of Direct Digital Frequency Synthesizers 212 outputs is deciphered to convert to digital code SEL.
Note that the execution mode of the first embodiment of the present invention and the disclosed jitter control signal generator of second embodiment only for the example explanation, is not as restrictive condition of the present invention.Therefore, any can be according to chattering frequency control signal J
FreqAnd jitter amplitude control signal J
AmpAnd the execution mode that produces the dither control signal generation all belongs to scope of the present invention.
Please refer to Fig. 6, Fig. 6 is the functional block diagram of the shake generator 30 of third embodiment of the invention.Shake generator 30 comprises that is used for producing a dither control signal J
CtlJitter control signal generator 320 and one be used for according to dither control signal J
CtlTo produce dithering clock signal J
OutJitter clock generator 300.In the present embodiment, jitter control signal generator 320 comprises Direct Digital Frequency Synthesizers 322 and digital/analog converter (digital/analog converter, DAC) 324.By chattering frequency control signal J
FreqAnd jitter amplitude control signal J
AmpCan control Direct Digital Frequency Synthesizers 322 and synthesize required digital waveform signal, and this digital waveform signal can be exported a dither control signal J with continuous wave via the conversion of digital/analog converter 324
Ctl, that is dither control signal J
CtlBe analog signal.
In the present embodiment, jitter clock generator 300 is realized by phase interpolation delay lock loop (phase interpolated delay locked loop, PI DLL) 400.Please refer to Fig. 7, Fig. 7 is the functional block diagram of phase interpolation delay lock loop 400 shown in Figure 6.Phase interpolation delay lock loop 400 is a kind of clock lock circuit, is used for according to clock input signal CLK
InWith clock feedback signal CLK
FbThe operation of execution clock lock is to produce clock feedback signal CLK
FbAnd dithering clock signal J
OutComprise in the middle of the phase interpolation delay lock loop 400: phase comparator 402 is used for according to clock input signal CLK
InWith clock feedback signal CLK
FbProduce a comparative result; Control signal generator 404 is coupled to phase comparator 402, is used for producing control signal CTL according to comparative result; And delay circuit 406, be coupled to phase comparator 402 and control signal generator 404, be used for processing clock input signal CLK
InTo produce clock feedback signal CLK
FbAs shown in the figure, comprise in the middle of the delay circuit 406: first Postponement module 408 is used for according to the first retardation control signal CTL
lTo produce dithering clock signal J
OutAnd second Postponement module 410, be used for according to the second retardation control signal CTL
2To produce clock feedback signal CLK
FbIn the present embodiment, each Postponement module is by voltage controlled delay line (voltage control delay line, VCDL) realize, owing to utilize details that delay lock loop carries out clock lock operation for knowing known to the correlation technique person, do not repeat them here.It should be noted that the first retardation control signal CTL that present embodiment is central
1With the second retardation control signal CTL
2Difference be that one of them retardation control signal is by control signal CTL and dither control signal J
CtlAddition and getting, and another retardation control signal is by control signal CTL and dither control signal J
CtlSubtract each other and get, so the one-plus-one effect that subtracts an identical amount makes win Postponement module 408 and second Postponement module 410 effect altogether be equivalent to a Postponement module that comes the control lag amount according to control signal CTL, therefore two Postponement modules in the delay circuit 406 can't change the function of the script clock lock operation of phase interpolation delay lock loop, final feedback signal CLK
FbPhase place via clock lock operation still can with clock input signal CLK
InPhase place identical.Yet, from the dithering clock signal J of output between first Postponement module 408 and second Postponement module 410
OutJust with feedback signal CLK
Fb(that is clock input signal CLK
In) frequency is identical but phase place is different.Because dither control signal J
CtlBe the constantly continuous wave signal of change of an amplitude size, the constantly change of retardation that the Postponement module 408 of winning is produced, that is dithering clock signal J
OutWith clock input signal CLK
InConstantly change of phase difference, thereby make dithering clock signal J
OutEffect with time jitter.Note that in addition that in one embodiment control signal generator 404 can be implemented by a charge pumping (Charge Pump) and a low pass filter.
Please refer to Fig. 8, Fig. 8 is the functional block diagram of the shake generator 50 of fourth embodiment of the invention.Please compare with Fig. 6, both structures are roughly the same, and unique difference is that the jitter clock generator 500 of Fig. 8 passes through phase interpolation phase-locked loop (phase interpolated phase-locked loop, PI PLL) 600 and realizes.Please refer to Fig. 9, Fig. 9 is the functional block diagram of phase interpolation phase-locked loop 600 shown in Figure 8.Phase interpolation phase-locked loop 600 also is a kind of clock lock circuit, comprising: phase comparator 602 is used for according to clock input signal CLK
InWith clock feedback signal CLK
Fb0Produce a comparative result; Control signal generator 604 is coupled to phase comparator 602, is used for producing control signal CTL according to comparative result; Ring oscillator 606 is coupled to phase comparator 602 and control signal generator 604, is used for producing clock feedback signal CLK
FbAnd frequency divider 614, be used for to clock feedback signal CLK
FbCarry out divide operation, and output clock feedback signal CLK
Fb0Make the frequency of two clock feedback signals have multiple relation, clock input signal CLK
InWith clock feedback signal CLK
Fb0Between also have multiple relation.In addition, ring oscillator 606 comprises: anti-phase module 612; First Postponement module 608 is used for according to the first retardation control signal CTL
lTo produce dithering clock signal J
OutAnd second Postponement module 610, be used for according to the second retardation control signal CTL
2To produce clock feedback signal CLK
FbIn the present embodiment, each Postponement module is by voltage controlled delay line (voltage control delay line, VCDL) realize, owing to the details of utilizing phase-locked loop to carry out the clock lock operation is known by knowing correlation technique person, just repeat no more at this.It should be noted that the first retardation control signal CTL that present embodiment is central
1With the second retardation control signal CTL
2Difference be that one of them retardation control signal is by control signal CTL and dither control signal J
CtlAddition and getting, and another retardation control signal is by control signal CTL and dither control signal J
CtlSubtract each other and get, so the one-plus-one effect that subtracts an identical amount makes win Postponement module 608 and second Postponement module 610 effect altogether be equivalent to one to come the Postponement module of control lag amount according to control signal CTL, so two Postponement modules in the delay circuit 606 can't change the function that the clock lock of phase interpolation phase-locked loop is operated.Yet, from the dithering clock signal J of output between first Postponement module 608 and second Postponement module 610
OutJust with feedback signal CLK
FbFrequency is identical but phase place is different.Because dither control signal J
CtlBe the constantly continuous wave signal of change of an amplitude size, the constantly change of retardation that the Postponement module 608 of winning is produced, that is dithering clock signal J
OutWith clock input signal CLK
InConstantly change of phase difference, thereby make dithering clock signal J
OutEffect with time jitter.
In addition, in the third embodiment of the present invention, utilize shake size that the phase interpolation delay lock loop can produce for positive and negative 0. 5 unit intervals (unit interval, UI); This is because the delay lock loop 400 in Fig. 7 pins clock input signal CLK
InPhase place the time, via the back clock feedback signal CLK of two-stage voltage controlled delay line
FbRetardation can with clock input signal CLK
InPositive good job one-period.As shown in Figure 9, in the fourth embodiment of the present invention, the phase interpolation delay lock loop of third embodiment of the invention is replaced to the phase interpolation phase-locked loop, though function is identical, the jitter amplitude of its generation can not be subjected to the restriction of a unit interval; This be because in the phase interpolation phase-locked loop 600 how a frequency divider 614, make clock input signal CLK
InFrequency can be clock feedback signal CLK
FbIntegral multiple, so dithering clock signal J
OutThe shake stool and urine that produces can surpass a unit interval.
Please refer to Figure 10, Figure 10 is the functional block diagram of the shake generator 70 of fifth embodiment of the invention.Please compare with Fig. 6, both structures are roughly the same, and unique difference is that the jitter control signal generator 720 of Figure 10 is made up of oscillator 722 and variable gain amplifier 724.Oscillator 722 is used for according to chattering frequency control signal J
FreqWith generation oscillator signal SW, and variable gain amplifier 724 is coupled to oscillator 722, is used for according to jitter amplitude control signal J
AmpConvert oscillator signal SW to dither control signal J
CtlThe dither control signal J that present embodiment produces
CtlThe dither control signal J that produces with the 3rd embodiment among Fig. 6
CtlIdentical, be the constantly continuous wave signal of change of an amplitude size, can produce the range signal with time jitter by control phase interpolative delay locking ring 710.
Please refer to Figure 11, Figure 11 is the functional block diagram of the shake generator 80 of sixth embodiment of the invention.Please with Figure 10 relatively, both structures are roughly the same, unique difference is that the jitter clock generator 800 of Figure 11 realizes by phase interpolation phase-locked loop 810.Because the phase interpolation phase-locked loop 810 among Figure 11 is identical with the phase interpolation phase-locked loop 600 of Fig. 9, and jitter control signal generator 820 is identical with the jitter control signal generator 720 of Figure 10, so details of operation just repeats no more at this.
Dither circuit disclosed in this invention is beneficial to and is implemented in the chip to reach the purpose of built-in self-test, the machine cost in the time of can saving batch testing thus.As containing the circuit of transmitting terminal in the fruit chip simultaneously, then utilize method of the present invention when built-in self-test can with transmitting terminal shared portion hardware circuit (as leggy phase-locked loop, phase interpolation delay lock loop or phase interpolation phase-locked loop), with further saving chip area, reduce production costs.
The above only is embodiments of the invention, and all equalizations of doing according to claim of the present invention change and modify, and all should belong to covering scope of the present invention.
Claims (8)
1. shake generator that is used for producing dithering clock signal comprises:
Jitter control signal generator is used for producing dither control signal; And
The jitter clock generator, be coupled to this jitter control signal generator, comprise the clock lock circuit, be used for carrying out the clock lock operation according to clock input signal and clock feedback signal, to produce this clock feedback signal in first node and to produce this dithering clock signal in Section Point
Wherein this clock lock circuit is a delay lock loop, and this delay lock loop comprises:
Phase comparator is used for producing comparative result according to this clock input signal and this clock feedback signal;
The control signal generator is coupled to this phase comparator, is used for producing control signal according to this comparative result; And
Delay circuit is coupled to this phase comparator and this control signal generator, postpones this clock input signal to produce this clock feedback signal, comprising:
First Postponement module is used for producing this dithering clock signal according to the first retardation control signal in this Section Point; And
Second Postponement module, be coupled between this first node and this Section Point, be used for the foundation second retardation control signal to produce this clock feedback signal in this first node, and wherein a phase-adjusting circuit produces this first, second retardation control signal respectively according to this control signal and this dither control signal.
2. shake generator as claimed in claim 1, wherein this phase-adjusting circuit adds that with this control signal this dither control signal produces in this first, second retardation control signal, and this control signal is deducted this dither control signal produces in this first, second retardation control signal another.
3. shake generator as claimed in claim 1, wherein this jitter control signal generator comprises:
Direct Digital Frequency Synthesizers is used for producing a digital code according to chattering frequency control signal and jitter amplitude control signal; And
Digital/analog converter is coupled to this Direct Digital Frequency Synthesizers and this phase-adjusting circuit, is used for converting this digital code to this dither control signal.
4. shake generator as claimed in claim 1, wherein this jitter control signal generator comprises:
Oscillator is used for according to the chattering frequency control signal to produce oscillator signal; And
Variable gain amplifier is coupled to this oscillator, is used for converting this oscillator signal to this dither control signal according to the jitter amplitude control signal.
5. shake generator that is used for producing dithering clock signal comprises:
Jitter control signal generator is used for producing dither control signal; And
The jitter clock generator, be coupled to this jitter control signal generator, comprise the clock lock circuit, be used for carrying out the clock lock operation according to clock input signal and clock feedback signal, to produce this clock feedback signal in first node and to produce this dithering clock signal in Section Point
Wherein this clock lock circuit is a phase-locked loop, and this phase-locked loop comprises:
Phase comparator is used for producing comparative result according to this clock input signal and this clock feedback signal;
The control signal generator is coupled to this phase comparator, is used for producing control signal according to this comparative result; And
Ring oscillator is coupled to this phase comparator and this control signal generator, is used for producing this clock feedback signal, comprising:
Anti-phase module;
First Postponement module is used for according to the first retardation control signal to produce this dithering clock signal in this Section Point; And
Second Postponement module, be coupled between this first node and this Section Point, be used for the foundation second retardation control signal to produce this clock feedback signal in this first node, and wherein a phase-adjusting circuit produces this first, second retardation control signal respectively according to this control signal and this dither control signal.
6. shake generator as claimed in claim 5, wherein this phase-adjusting circuit adds that with this control signal this dither control signal produces in this first, second retardation control signal, and this control signal is deducted this dither control signal produces in this first, second retardation control signal another.
7. shake generator as claimed in claim 5, wherein this jitter control signal generator comprises:
Direct Digital Frequency Synthesizers is used for producing a digital code according to chattering frequency control signal and jitter amplitude control signal; And
Digital/analog converter is coupled to this Direct Digital Frequency Synthesizers and this phase-adjusting circuit, is used for converting this digital code to this dither control signal.
8. shake generator as claimed in claim 5, wherein this jitter control signal generator comprises:
Oscillator is used for according to the chattering frequency control signal to produce oscillator signal; And
Variable gain amplifier is coupled to this oscillator, is used for converting this oscillator signal to this dither control signal according to the jitter amplitude control signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010520862 CN102006160B (en) | 2007-12-24 | 2007-12-24 | Jitter generator for generating jittering clock signals |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010520862 CN102006160B (en) | 2007-12-24 | 2007-12-24 | Jitter generator for generating jittering clock signals |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200710160159 Division CN101471816B (en) | 2007-12-24 | 2007-12-24 | Dithering generator for generating dithering clock signal |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102006160A CN102006160A (en) | 2011-04-06 |
| CN102006160B true CN102006160B (en) | 2013-09-11 |
Family
ID=43813255
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201010520862 Active CN102006160B (en) | 2007-12-24 | 2007-12-24 | Jitter generator for generating jittering clock signals |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102006160B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107566199B (en) * | 2016-06-30 | 2021-06-01 | 上海诺基亚贝尔股份有限公司 | Signal processing device and method and electronic equipment comprising same |
| CN117217139B (en) * | 2023-11-09 | 2024-01-30 | 成都翌创微电子有限公司 | Clock generation method and system for digital chip verification |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1335681A (en) * | 2000-07-20 | 2002-02-13 | 三星电子株式会社 | Jitter tester and lock phase ring using with tested flutter |
| CN1586083A (en) * | 2001-11-09 | 2005-02-23 | 松下电器产业株式会社 | Display device, receiver, and test apparatus |
| CN1664956A (en) * | 2004-03-05 | 2005-09-07 | 海力士半导体有限公司 | Delay locked loop in semiconductor memory device and its clock locking method |
| CN1985459A (en) * | 2004-05-03 | 2007-06-20 | Dft微系统公司 | System and method for generating a jittered test signal |
-
2007
- 2007-12-24 CN CN 201010520862 patent/CN102006160B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1335681A (en) * | 2000-07-20 | 2002-02-13 | 三星电子株式会社 | Jitter tester and lock phase ring using with tested flutter |
| CN1586083A (en) * | 2001-11-09 | 2005-02-23 | 松下电器产业株式会社 | Display device, receiver, and test apparatus |
| CN1664956A (en) * | 2004-03-05 | 2005-09-07 | 海力士半导体有限公司 | Delay locked loop in semiconductor memory device and its clock locking method |
| CN1985459A (en) * | 2004-05-03 | 2007-06-20 | Dft微系统公司 | System and method for generating a jittered test signal |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102006160A (en) | 2011-04-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8892617B2 (en) | Jitter generator for generating jittered clock signal | |
| US11018675B2 (en) | Matrix phase interpolator for phase locked loop | |
| US6791379B1 (en) | Low jitter high phase resolution PLL-based timing recovery system | |
| US8170169B2 (en) | Serializer deserializer circuits | |
| US6794912B2 (en) | Multi-phase clock transmission circuit and method | |
| US7816963B1 (en) | Phase interpolator with adaptive delay adjustment | |
| US7583117B2 (en) | Delay lock clock synthesizer and method thereof | |
| US8634509B2 (en) | Synchronized clock phase interpolator | |
| US7825712B2 (en) | Multi-phase clock signal generating circuit having improved phase difference and a controlling method thereof | |
| US7372340B2 (en) | Precision frequency and phase synthesis with fewer voltage-controlled oscillator stages | |
| WO2005109642A1 (en) | Equiphase polyphase clock signal generator circuit and serial digital data receiver circuit using the same | |
| CN101471816B (en) | Dithering generator for generating dithering clock signal | |
| JPWO2009034881A1 (en) | Phase comparator and phase locked loop | |
| US7675333B2 (en) | Multi-phase delay locked loop with equally-spaced phases over a wide frequency range and method thereof | |
| US6501336B2 (en) | Self-calibration device and method for calibrating phase offset between output waveforms of ring osciliator | |
| CN112187229A (en) | High-precision pulse width modulation system and method | |
| CN102006160B (en) | Jitter generator for generating jittering clock signals | |
| CN109698697B (en) | Phase-locked loop device applied to FPGA chip and FPGA chip | |
| US20070040592A1 (en) | Semiconductor integrated circuit device | |
| EP1145440B1 (en) | Low jitter high phase resolution pll-based timing recovery system | |
| US7555091B1 (en) | System and method for providing a clock and data recovery circuit with a self test capability | |
| US8774325B2 (en) | Clock and data recovery circuits | |
| KR101298416B1 (en) | Clock data recovery circuit | |
| TW201334419A (en) | Delay lock loop circuit and delay lock method | |
| KR100998259B1 (en) | Multi phase signal generator and generation method for delay value control signal |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |