CN101996112A - Disk array test method - Google Patents
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- CN101996112A CN101996112A CN2009101663538A CN200910166353A CN101996112A CN 101996112 A CN101996112 A CN 101996112A CN 2009101663538 A CN2009101663538 A CN 2009101663538A CN 200910166353 A CN200910166353 A CN 200910166353A CN 101996112 A CN101996112 A CN 101996112A
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Abstract
The invention provides a disk array test method which is used for a disk array in a computer system, and the disk array comprises a plurality of hard disks. The disk array test method comprises the following steps: reading the hard disk parameter of the register of a computer system, wherein the hard disk parameter is relevant to the number of the hard disks; according to the hard disk parameter, setting the address mapping register of the system chipset of the computer system so as to record the number of the hard disks; starting the option read only memory of the disk array, wherein the option read only memory comprises a test program code; according to the number recorded by the address mapping register, setting a variable in the test program code; performing the first test block of the test program code; judging the number of the hard disks according to the variable; and executing one of second test blocks of the test program code.
Description
Technical field
The invention relates to a kind of method of testing, and particularly relevant for a kind of disk array method of testing.
Background technology
Disk array (Redundant Array of Independent Disks; RAID) be in the large-scale computer system, indispensable storage device.The key concept of disk array is to become an array in conjunction with a plurality of small-sized and cheap disc drivers, to reach the usefulness performance that a big and expensive disc driver can't accomplish or the target of redundancy.The array of this disc driver will be presented in the computer system 1 with a single logic storage unit or disc driver.Disk array can be divided into RAID-0, RAID-1, RAID-1E, RAID-5, RAID-6, RAID-7, RAID-10 and RAID-50 or the like according to different forms.Disk array often is used on the server computer, and often uses identical hard disk as combination.
In the testing process for disk array, the common difference of the hard disk number that connects at disk array, the test program code that must write corresponding hard disk number.Yet such test mode if when the disk array testing process should move, the test program code of correspondence all must be revised, makes the elasticity reduction of testing process many, and therefore the cost of testing process is risen.
Therefore, how to design a new disk array method of testing, being applicable to different situations, and the test program code of the disk array of the hard disk of revising corresponding different numbers of must not expending time in is the industry problem demanding prompt solution.
Summary of the invention
Therefore, a purpose of the present invention is to provide a kind of disk array method of testing, being applicable to different situations, and the test program code of the disk array of the hard disk of revising corresponding different numbers of must not expending time in.
To achieve these goals, the invention provides a kind of disk array method of testing, be used for the disk array of computer system, disk array comprises a plurality of hard disks.The disk array method of testing comprises the following step: read the hard disk praameter of the buffer of computer system, wherein hard disk praameter is relevant with the number of hard disk; According to hard disk praameter, the address mapping buffer of the system chipset of setting computer system (Address mapregister) is with the number of recording disk; Open the options read only memory (Option ROM) of beginning disk array, wherein options read only memory comprises test program code; According to the variable in the number setting test program code of address mapping buffer record; Carry out first test block of test program code; And judge the number of hard disk according to variable, in a plurality of second test block of self testing procedure code, select one of them execution.
Wherein, above-mentioned buffer is the CMOS transistor buffer of system chipset, and system chipset is a South Bridge chip.
According to a particular embodiment of the invention, in the step of the address mapping buffer of initialization system chipset, be wherein at one that sets the address mapping buffer.
In one embodiment, above-mentioned variable stores an extension data of input/output system zone.
In another embodiment, above-mentioned each second test block comprises a plurality of trial functions.The trial function that selecteed second test block is comprised is the disk array that comprises the hard disk of corresponding above-mentioned number in order to test.
Application the invention has the advantages that by judging the number of hard disk, to select corresponding test block to carry out test in a test program code, must not change test program code with the difference of hard disk number, and reach above-mentioned purpose easily.
Description of drawings
For above and other objects of the present invention, feature, advantage and embodiment can be become apparent, appended the description of the drawings is as follows:
Fig. 1 is the calcspar of the computer system of one embodiment of the invention; And
Fig. 2 is the process flow diagram of the disk array method of testing of one embodiment of the invention.
[primary clustering symbol description]
1: computer system 10: disk array
100: hard disk 11: hard disk praameter
12: system chipset 120: buffer
122: address mapping buffer 14: Basic Input or Output System (BIOS)
140: options read only memory 142: test program code
144: extend data of input/output system zone 16: Installed System Memory
201-206: step
Embodiment
Please refer to Fig. 1, be the calcspar of the computer system 1 of one embodiment of the invention.Computer system 1 comprises redundant array of inexpensive disks 10, system chipset 12, Basic Input or Output System (BIOS) (Basic Input/Outputsystem; BIOS) 14 and Installed System Memory 16.The key concept of redundant array of inexpensive disks 10 is to become an array in conjunction with a plurality of small-sized and cheap disc drivers, to reach the usefulness performance that a big and expensive disc driver can't accomplish or the target of redundancy.The array of this disc driver will be presented in the computer system 1 with a single logic storage unit or disc driver.Redundant array of inexpensive disks 10 can be divided into RAID-0, RAID-1, RAID-1E, RAID-5, RAID-6, RAID-7, RAID-10 and RAID-50 or the like according to different forms.Multi-form redundant array of inexpensive disks 10 has different relative merits.Yet do not limit the form of redundant array of inexpensive disks 10 in the present invention, therefore can select the redundant array of inexpensive disks 10 of suitable form according to the situation of different embodiment.
Redundant array of inexpensive disks 10 comprises four hard disks 100 in the present embodiment.In other embodiments, the hard disk number that redundant array of inexpensive disks 10 is comprised can be adjusted with different embodiment.System chipset 12 is South Bridge chip in the present embodiment.South Bridge chip is the chip that design is used for handling low speed signal, comprises most of interfacing equipment interfaces, multimedia controller and communication interface function.Periphery component interconnection (PeripheralComponent Interconnect for example; PCI) controller, advance the rank technology and connect (Advanced TechnologyAttachment; ATA) controller, universal serial bus (Universal Serial Bus; USB) controller, network controller, sound effect control device.In other embodiments, can replace with chip, and do not limit by the South Bridge chip in the present embodiment with similar functions.
Please be simultaneously with reference to Fig. 2, be the process flow diagram of the disk array method of testing of one embodiment of the invention.The disk array method of testing of present embodiment can be applicable to the redundant array of inexpensive disks 10 in the computer system 1 among Fig. 1.Please contrast Fig. 1 and Fig. 2 simultaneously, the disk array method of testing comprises the following step: in step 201, read the hard disk praameter 11 of the metal oxide semiconductor transistor buffer 120 of computer system 1, wherein hard disk praameter 11 is relevant with the number of hard disk.As mentioned above, Basic Input or Output System (BIOS) 14 will be detected the number of the hard disk 100 in the redundant array of inexpensive disks 10 when computer system 1 starts, so that the pairing hard disk praameter 11 of this number is stored in the buffer 120.Therefore, the hard disk praameter 11 of the metal oxide semiconductor transistor buffer 120 by reading computer system 1 can be learnt the number of hard disk 100.
Then in step 202, according to hard disk praameter 11, the address mapping buffer 122 of the system chipset 12 of setting computer system 1 is with the number of recording disk 100.In one embodiment, step 201 and 202 comes down to be carried out by Basic Input or Output System (BIOS) 14, and is by setting a number with recording disk 100 of address mapping buffer 122 in step 202.It is noted that, as with a record, can only be with 0 and 1 hard disk 100 numbers (four hard disks and six hard disks as the aforementioned) of representing two kinds of situations.Therefore, in other embodiments, if the desire support surpasses the redundant array of inexpensive disks 10 of the hard disk 100 of two kinds of numbers, more multidigit is come record.
In step 203, open the options read only memory 140 of beginning redundant array of inexpensive disks 10, wherein options read only memory 140 comprises test program code 142.Open the step of beginning options read only memory 140, come down to options read only memory 140 to be loaded the Installed System Memory 16 of computer system 1 by Basic Input or Output System (BIOS) 14.Then in step 204, set variable in the test program code 142 according to the number of the hard disk of address mapping buffer 122 records.Wherein, the data of variable are extension data of input/output system zone (the Extended Basic Input/Output systemdata area that is stored in the Basic Input or Output System (BIOS) 14 in the present embodiment; EBDA) in 144, so that test program code 142 when using variable, can obtain from extending data of input/output system zone 144 at any time apace.
In step 205, carry out first test block of test program code 142.In step 206,, in a plurality of second test block of self testing procedure code 142, select one of them execution according to the number of variable judgement hard disk 100.
Yet the number of second test block is decided on the hard disk number of the redundant array of inexpensive disks 10 of support.In one embodiment, test program code 142 can have four hard disks and have the redundant array of inexpensive disks 10 of six hard disks in order to test, and therefore, test program code 142 will have two second test block.Test program code 142 will select to carry out one of them according to the hard disk number that in fact redundant array of inexpensive disks 10 has.Meaning promptly when redundant array of inexpensive disks 10 has four hard disks, is promptly carried out second test block of corresponding four hard disks, and when redundant array of inexpensive disks 10 has six hard disks, is promptly carried out second test block of corresponding six hard disks.In other embodiments, comply with the difference of the hard disk number of the redundant array of inexpensive disks 1 of supporting 0, can have the second different test block, and do not limit by present embodiment.
Comprise a plurality of trial functions (not illustrating) in each second test block.In one embodiment, first test block and second test block and nonessential execution in regular turn, and can carry out the trial function that is comprised alternately.Therefore, when the testing process of test program code 142 is carried out first test block, be that direct execution must not done any judgement, and when the testing process of test program code 142 is carried out the trial function that is positioned at second test block, promptly judge hard disk number that in fact redundant array of inexpensive disks 10 has and the trial function of selecting pairing second test block.
By the invention described above embodiment as can be known, use the number that the invention has the advantages that by the judgement hard disk,, must not change test program code with the difference of hard disk number to select corresponding test block to carry out test in a test program code.
Though the present invention discloses as above with embodiment; right its is not in order to qualification the present invention, any person skilled in the art, without departing from the spirit and scope of the present invention; when can being used for a variety of modifications and variations, so protection scope of the present invention is as the criterion when looking the scope that claims define.
Claims (7)
1. a disk array method of testing is characterized in that, is used for a disk array of a computer system, and this disk array comprises a plurality of hard disks, and this disk array method of testing comprises the following step:
Read a hard disk praameter of a buffer of this computer system, wherein this hard disk praameter is relevant with a number of these a plurality of hard disks;
According to this hard disk praameter, set an address mapping buffer of a system chipset of this computer system, to write down this number of these a plurality of hard disks;
Open an options read only memory of this disk array of beginning, wherein this options read only memory comprises a test program code;
Set a variable in this test program code according to this number of this address mapping buffer record;
Carry out one first test block of this test program code; And
Judge this numbers of this a plurality of hard disks according to this variable, in a plurality of second test block of this test program code, select one of them execution certainly.
2. disk array method of testing according to claim 1 is characterized in that, this buffer is a CMOS transistor buffer of this system chipset.
3. disk array method of testing according to claim 1 is characterized in that, this system chipset is a South Bridge chip.
4. disk array method of testing according to claim 1 is characterized in that, sets in the step of this address mapping buffer of this system chipset, is at one that sets this address mapping buffer.
5. disk array method of testing according to claim 1 is characterized in that, this variable is to be stored in one to extend the data of input/output system zone.
6. disk array method of testing according to claim 1 is characterized in that, respectively these a plurality of second test block comprise a plurality of trial functions.
7. disk array method of testing according to claim 6 is characterized in that, these a plurality of trial functions that selecteed this second test block is comprised are these disk arrays that comprise these a plurality of hard disks of corresponding this number in order to test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009101663538A CN101996112A (en) | 2009-08-24 | 2009-08-24 | Disk array test method |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009101663538A CN101996112A (en) | 2009-08-24 | 2009-08-24 | Disk array test method |
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| CN101996112A true CN101996112A (en) | 2011-03-30 |
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| CN2009101663538A Pending CN101996112A (en) | 2009-08-24 | 2009-08-24 | Disk array test method |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102568522A (en) * | 2011-12-31 | 2012-07-11 | 曙光信息产业股份有限公司 | Hardware performance test method and device |
| CN107943419A (en) * | 2017-11-23 | 2018-04-20 | 郑州云海信息技术有限公司 | A kind of SSD secure erase automated testing methods and device |
-
2009
- 2009-08-24 CN CN2009101663538A patent/CN101996112A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102568522A (en) * | 2011-12-31 | 2012-07-11 | 曙光信息产业股份有限公司 | Hardware performance test method and device |
| CN102568522B (en) * | 2011-12-31 | 2015-08-19 | 曙光信息产业股份有限公司 | The method of testing of hard disk performance and device |
| CN107943419A (en) * | 2017-11-23 | 2018-04-20 | 郑州云海信息技术有限公司 | A kind of SSD secure erase automated testing methods and device |
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Application publication date: 20110330 |