CN101968437B - Atmosphere OH radical measuring system - Google Patents

Atmosphere OH radical measuring system Download PDF

Info

Publication number
CN101968437B
CN101968437B CN2010105085243A CN201010508524A CN101968437B CN 101968437 B CN101968437 B CN 101968437B CN 2010105085243 A CN2010105085243 A CN 2010105085243A CN 201010508524 A CN201010508524 A CN 201010508524A CN 101968437 B CN101968437 B CN 101968437B
Authority
CN
China
Prior art keywords
light source
reflection
reflecting
repeatedly
atmosphere
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2010105085243A
Other languages
Chinese (zh)
Other versions
CN101968437A (en
Inventor
刘文清
谢品华
阚瑞峰
司福祺
刘宇
胡仁志
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anhui Institute of Optics and Fine Mechanics of CAS
Original Assignee
Anhui Institute of Optics and Fine Mechanics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anhui Institute of Optics and Fine Mechanics of CAS filed Critical Anhui Institute of Optics and Fine Mechanics of CAS
Priority to CN2010105085243A priority Critical patent/CN101968437B/en
Publication of CN101968437A publication Critical patent/CN101968437A/en
Application granted granted Critical
Publication of CN101968437B publication Critical patent/CN101968437B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Abstract

The invention discloses an atmosphere OH radical measuring system, comprising a visible light source, a 308nm ultraviolet light laser source, reflecting mirrors, a semi-reflection pelliclemirror, a multi-reflection pool, and a spectrograph, wherein the reflecting mirror is arranged in front of a light path of the ultraviolet light laser source, the semi-reflection pelliclemirror is arranged in front of a light path of the visible light source, the spectrograph is arranged at the light outlet of the multi-reflection pool, the reflected light and the transmitted light of the semi-reflection pelliclemirror are incident into the light inlet of the multi-reflection pool, and are emergent from the light outlet of the multi-reflection pool after being reflected for a plurality of times in the multi-reflection pool, and the emergent light of the multi-reflection pool is incident into the spectrograph after being sequentially launched by the other reflecting mirror and focused by a focusing lens.

Description

Atmosphere OH free radical measuring system
Technical field
The present invention relates to the environmental monitoring field, especially the aeromerric moasurenont field is specially a kind of atmosphere OH free radical measuring system.
Background technology
Aeromerric moasurenont has great importance to environmental protection.The OH free radical is a most important oxygenant in the atmosphere; Nearly all trace gas that can be oxidized is mainly through being transformed and removed with the OH free radical reaction in the atmosphere of troposphere, and the OH free radical reaction is in the troposphere nature and anthropogenic discharge's micro constitutent to be provided to transform and the important mechanisms of removing.Therefore, the surveying work of OH free radical is significant for environmental protection, but does not also carry out device or system that atmosphere OH free radical is measured in the prior art.
Summary of the invention
The purpose of this invention is to provide a kind of atmosphere OH free radical measuring system, can realize the measurement of OH free radical in the atmosphere, to solve still unmatchful atmosphere OH free radical is measured in the prior art the device or the problem of system.
In order to achieve the above object, the technical scheme that the present invention adopted is:
Atmosphere OH free radical measuring system; It is characterized in that: the ultraviolet laser light source that includes visible light source and 308nm; Said ultraviolet laser light source light path the place ahead is provided with the catoptron of reflecting surface towards the ultraviolet laser light source; Said visible light source light path the place ahead is provided with the half-reflecting half mirror of transmission plane towards visible light source; The reflecting surface of said half-reflecting half mirror and half-reflecting half mirror parallel with said catoptron is relative with the reflecting surface of said catoptron; The emergent light of said ultraviolet laser light source is through behind the reflecting surface of mirror reflects to half-reflecting half mirror, and again by said half-reflection and half-transmission mirror reflection, the emergent light that said visible light source sends is by said half-reflecting half mirror transmission; Also include repeatedly reflection tank; Said repeatedly reflection tank light-emitting window is provided with spectrometer; The emergent light of the emergent light of the ultraviolet laser light source of said half-reflection and half-transmission mirror reflection, the visible light source of half-reflecting half mirror transmission is incident to repeatedly the light inlet of reflection tank respectively through common optical axis after the aperture group; Repeatedly repeatedly reflecting the back from the repeatedly light-emitting window outgoing of reflection tank in the reflection tank, repeatedly the emergent light of reflection tank is incident to said spectrometer by another catoptron emission, a condenser lens after focusing on successively.
Described atmosphere OH free radical measuring system is characterized in that: said visible light source adopts the 670nm red light semiconductor laser.
Described atmosphere OH free radical measuring system is characterized in that: said ultraviolet laser light source adopts ti sapphire laser.
Described atmosphere OH free radical measuring system is characterized in that: said aperture group is made up of two apertures that are total to central shaft.
Described atmosphere OH free radical measuring system is characterized in that: said spectrometer is through USB line and computing machine communication.
Described atmosphere OH free radical measuring system, it is characterized in that: said repeatedly reflection tank is uncovered.
The present invention is through OH free radical its concentration of absorptiometry at the 308nm place, and employing red laser light source has solved difficult problems such as the invisible adjustment difficulty of 308nm laser as indication, adjustment light source.
The present invention has realized the measurement to atmosphere OH free radical.The present invention can be used for studying reaction, conversion and the purge mechanism of multiple crucial trace gas composition (dusty gas, greenhouse gases etc.) in atmosphere; Grasp troposphere atmospheric oxidn capacity; And the main rule of troposphere, China area Atmospheric Chemistry, for Atmospheric Chemistry research, pollution (weather) model provide input data and checking.
Description of drawings
Fig. 1 is a system architecture diagram of the present invention.
Embodiment
As shown in Figure 1.Atmosphere OH free radical measuring system includes the ultraviolet laser light source 1 of visible light source 3 and 308nm, and visible light source 3 adopts the 670nm red light semiconductor lasers, and ultraviolet laser light source 1 adopts the 308nm ti sapphire laser.Ultraviolet laser light source 1 light path the place ahead is provided with the catoptron 2 of reflecting surface towards the ultraviolet laser light source; Visible light source 3 light path the place aheads are provided with the half-reflecting half mirror 4 of transmission plane towards visible light source 3; The reflecting surface of the parallel and half-reflecting half mirror 4 of half-reflecting half mirror 4 and catoptron 2 is relative with the reflecting surface of catoptron 2; After the emergent light of ultraviolet laser light source 1 reflexes to the reflecting surface of half-reflecting half mirror 4 through catoptron 2; By half-reflecting half mirror 4 reflections, the emergent light that visible light source 3 sends is by half-reflecting half mirror 4 transmissions again; Also include repeatedly reflection tank 7, repeatedly reflection tank 7 is uncovered.Repeatedly reflection tank 7 light-emitting windows are provided with spectrometer 10; The emergent light of the emergent light of the ultraviolet laser light source 1 of half-reflecting half mirror 4 reflections, the visible light source 3 of half-reflecting half mirror transmission 4 is incident to repeatedly the light inlet of reflection tank 7 respectively through common optical axis after the aperture group; Repeatedly repeatedly reflecting the back from the repeatedly light-emitting window outgoing of reflection tank 7 in the reflection tank 7, repeatedly the emergent light of reflection tank 7 is incident to spectrometer 10 by another catoptron 8 emissions, a condenser lens after focusing on 9 successively.The aperture group is made up of two apertures 5,6 that are total to central shaft.Spectrometer 10 is through USB line 12 and computing machine 11 communications.
The present invention adopts ruddiness as indication, adjustment light source, and guarantees itself and ultraviolet 308nm laser coaxial.The laser that the ultraviolet source 1 of employing 308nm ti sapphire laser sends is getting into aperture 5,6 behind the sheet 4 through partly returning half thoroughly after catoptron 2 reflections; Adopt laser that the visible light source 3 of 670nm red light semiconductor laser sends returning half and also getting into aperture 5,6 after passing through sheet 4 simultaneously through more than half; Ruddiness is indication, adjustment light source, and guarantees that through 5,6 it is coaxial with ultraviolet 308nm Ultra-Violet Laser, and the light after coaxial gets into repeatedly in the reflection tank 7; Approximately through (the about 2km of light path) behind 100 secondary reflections; Through catoptron 8, condenser lens 9 backs are received by spectrometer 10, after accomplishing spectra collection, digitizing, import in the computing machine 11 through USB line 12.

Claims (6)

1. atmosphere OH free radical measuring system; It is characterized in that: the ultraviolet laser light source that includes visible light source and 308nm; Said ultraviolet laser light source light path the place ahead is provided with the catoptron of reflecting surface towards the ultraviolet laser light source; Said visible light source light path the place ahead is provided with the half-reflecting half mirror of transmission plane towards visible light source; The reflecting surface of said half-reflecting half mirror and half-reflecting half mirror parallel with said catoptron is relative with the reflecting surface of said catoptron; The emergent light of said ultraviolet laser light source is through behind the reflecting surface of mirror reflects to half-reflecting half mirror, and again by said half-reflection and half-transmission mirror reflection, the emergent light that said visible light source sends is by said half-reflecting half mirror transmission; Also include repeatedly reflection tank; Said repeatedly reflection tank light-emitting window is provided with spectrometer; The emergent light of the emergent light of the ultraviolet laser light source of said half-reflection and half-transmission mirror reflection, the visible light source of half-reflecting half mirror transmission is incident to repeatedly the light inlet of reflection tank respectively through common optical axis after the aperture group; Repeatedly repeatedly reflecting the back from the repeatedly light-emitting window outgoing of reflection tank in the reflection tank, repeatedly the emergent light of reflection tank is incident to said spectrometer by another catoptron emission, a condenser lens after focusing on successively.
2. atmosphere OH free radical measuring system according to claim 1 is characterized in that: said visible light source adopts the 670nm red light semiconductor laser.
3. atmosphere OH free radical measuring system according to claim 1 is characterized in that: said ultraviolet laser light source adopts ti sapphire laser.
4. atmosphere OH free radical measuring system according to claim 1 is characterized in that: said aperture group is made up of two apertures that are total to central shaft.
5. atmosphere OH free radical measuring system according to claim 1 is characterized in that: said spectrometer is through USB line and computing machine communication.
6. atmosphere OH free radical measuring system according to claim 1, it is characterized in that: said repeatedly reflection tank is uncovered.
CN2010105085243A 2010-10-14 2010-10-14 Atmosphere OH radical measuring system Expired - Fee Related CN101968437B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2010105085243A CN101968437B (en) 2010-10-14 2010-10-14 Atmosphere OH radical measuring system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2010105085243A CN101968437B (en) 2010-10-14 2010-10-14 Atmosphere OH radical measuring system

Publications (2)

Publication Number Publication Date
CN101968437A CN101968437A (en) 2011-02-09
CN101968437B true CN101968437B (en) 2012-05-30

Family

ID=43547622

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2010105085243A Expired - Fee Related CN101968437B (en) 2010-10-14 2010-10-14 Atmosphere OH radical measuring system

Country Status (1)

Country Link
CN (1) CN101968437B (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102967604B (en) * 2012-11-06 2014-11-05 广州标旗电子科技有限公司 Reflectance spectrum measuring and sampling system and method used for jewel detection
CN103630510A (en) * 2013-11-29 2014-03-12 浙江工业大学 Method for qualitatively determining hydroxyl free radicals in gas-phase reaction system
CN103674911A (en) * 2013-12-02 2014-03-26 中国科学院安徽光学精密机械研究所 Fluorescent pool for atmosphere Hox free radical real-time measurement
CN104483270B (en) * 2014-12-19 2017-07-11 重庆川仪自动化股份有限公司 A kind of gas cell of ultraviolet difference analyzer
CN104655601A (en) * 2015-02-03 2015-05-27 中国科学院合肥物质科学研究院 OH free radical measurement calibration system by adopting fluorescence assay by gas expansion
CN106770071A (en) * 2016-11-29 2017-05-31 中国科学院合肥物质科学研究院 The measuring system and method for a kind of free radical
CN109802293B (en) * 2019-03-12 2020-07-28 西北核技术研究所 Laser external indicating light safe leading-in system and method
CN114200689A (en) * 2021-12-16 2022-03-18 安徽庆宇光电科技有限公司 Light path debugging method and system for motor vehicle pollution detection equipment

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101241076A (en) * 2008-03-12 2008-08-13 江苏大学 Hydroxy free radical concentration determination method
CN101413896A (en) * 2008-12-02 2009-04-22 上海理工大学 Method for measuring hydroxy free radical

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6087947A (en) * 1996-07-11 2000-07-11 Robert N. Hamburger Allergen detector system and method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101241076A (en) * 2008-03-12 2008-08-13 江苏大学 Hydroxy free radical concentration determination method
CN101413896A (en) * 2008-12-02 2009-04-22 上海理工大学 Method for measuring hydroxy free radical

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
任信荣等.大气OH自由基浓度的测定.《中国环境科学》.2001,第21卷(第2期),115-118. *
刘文清等.大气痕量气体测量的光谱学和化学技术.《量子电子学报》.2004,第21卷(第2期),202-210. *

Also Published As

Publication number Publication date
CN101968437A (en) 2011-02-09

Similar Documents

Publication Publication Date Title
CN101968437B (en) Atmosphere OH radical measuring system
CN202083627U (en) Optical fiber air DOAS measurement system based on Cassegrain telescope structure
EP1988382A3 (en) Fuel cell instrumentation system
CN205317651U (en) Portable long path cell
CN204203093U (en) A kind of total-reflection type long light path CO analyser
CN102253012B (en) Device and method for measuring extinction coefficient of black carbon aerosol
CN102221450B (en) Tracking-pointing deviation measurement device for laser system
CN103196879A (en) Laser-induced fluorescence spectrum detection device
CN202189010U (en) Optical detection system for spectrophotometer of automatic biochemistry analyzer
CN107389602A (en) A kind of spectroscopic system based on DLP technologies
CN102042876B (en) Remote online spectrum detection system
CN101936885B (en) Optical fiber transceiver integrated air differential optical absorption spectroscopy (DOAS) measuring system
CN202583062U (en) Measurement system provided with optical fibre structure and adopting differential optical absorption spectroscopy for pollution gas
CN203216636U (en) Optical system applied to fluorescent fiber temperature sensor
CN204044057U (en) A kind of miniature infrared automobile exhaust analyzer
CN202018419U (en) Gas detection platform adopting Herroitt multiple reflection sample room
CN101587053A (en) Double air channels sampling sensor
CN104359841A (en) Organic solution spectrophotometer
CN202886283U (en) Triple-waveband optical transmittance measuring instrument
CN2762115Y (en) CMOS environment monitoring spectrograph
CN2867340Y (en) Parasitic light eliminating and light-scattering device for spectrophotometer prism
CN202083633U (en) Miniature laser gas detection platform with multi-reflection sample chamber
CN201368769Y (en) Laser light power real-time on-line checking device of semiconductor laser
CN111413710B (en) Raman-polarization laser radar system for cloud phase detection and identification
CN207181290U (en) A kind of spectroscopic system based on DLP technologies

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20120530

Termination date: 20151014

EXPY Termination of patent right or utility model