CN101943630A - Method for analyzing polarization-maintaining characteristic of optical element - Google Patents
Method for analyzing polarization-maintaining characteristic of optical element Download PDFInfo
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- CN101943630A CN101943630A CN2009100885911A CN200910088591A CN101943630A CN 101943630 A CN101943630 A CN 101943630A CN 2009100885911 A CN2009100885911 A CN 2009100885911A CN 200910088591 A CN200910088591 A CN 200910088591A CN 101943630 A CN101943630 A CN 101943630A
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Abstract
The invention relates to a method for analyzing the polarization-maintaining characteristic of an optical element. The method comprises the following steps of: forming a polarization unit by a first wideband wire polaroid and a first wideband quarter-wave plate, and forming a detection unit by a second wideband quarter-wave plate and a second wideband wide polaroid; sequentially arraying a laser, the polarization unit, the detection unit and an optical power meter on the same light path; regulating the polarization unit and the detection unit; inserting an optical element to be detected between the polarization unit and the detection unit; and reading the reading of the optical power meter, wherein if the optical element to be detected changes the polarization state of incident light, the reading of the optical power meter is increased, and if the optical element to be detected does not change the polarization state of the incident light, the reading of the optical power meter is not changed and still reflects the intensity of environment light.
Description
Technical field
The present invention relates to the magnetooptic spectroscopy field, be specially adapted in the OPTICAL PROPERTIES of semiconductor spintronics, need in sample, excite spinning polarized electron, perhaps survey the situation that spinning polarized electron and hole-recombination emitting fluorescence etc. in the sample relate to circularly polarized light.
Background technology
After giant magnetoresistance effect in 1988 is found in iron/chromium sandwich construction, over more than 20 year, being intended to utilize another intrinsic attribute of electronics to spin and playing the part of new branch of science-spintronics of electron charge similar role in the modern information technologies field, still is that industry member has all obtained amazing tremendous development in the laboratory.
Because near density of electronic states little a lot of than in the metal its Fermi level, semiconductor material has polarization spin life-span and the spin diffusion length in the metal material.Prior, through the exploration of decades, in field of semiconductor devices, people have accumulated a large amount of knowledge, have carried out a large amount of practices, have also had the device technology of various maturations.So semiconductor material becomes the optimal platform of spintronics research.
Spectral technique, one to the main means that are research semiconductor material character, also become one of the important research instrument in semiconductor spintronics field naturally.When utilizing the magneto-spectroscopy technology to carry out the research of semiconductor spintronics, often need to go out the electronics of spin polarization with exciting light pumping in sample, perhaps survey the fluorescence of outgoing after the electronics of spin polarization in the sample and the hole-recombination, this has just introduced circular polarization (left-handed or dextrorotation) light in light path.The polarization of circularly polarized light is normally defined the poor of two kinds of circularly polarized light intensity, with the merchant of two kinds of circularly polarized light intensity sums, this polarization usually and experimental result direct relation is arranged.And the circularly polarized light of particular polarization degree is after passing through a certain optical element, because optical element is to the absorption difference of two kinds of circularly polarized lights, this polarization tends to take place unexpected variation, thereby influences the accuracy of experimental result, even makes experimental result can't correctly reflect real physical process.This just requires us to adopt someway, analyzes optical element and whether changes and how to change the polarization of incident light state.
In semiconductor spintronics field, in the research that spin correlation transports, often adopt the experimental configuration of " polarizer-detecting device " to study certain binary states experimental subjects: to introduce the experimental subjects that is in certain state by " polarizer ", and the two states of this experimental subjects can reflect different signals on " detecting device ", thereby by monitoring the signal that " detecting device " read, can know the state that experimental subjects is located at " detecting device ", and the variation of state experimental subjects from " polarizer " to " detecting device " process.
Summary of the invention
Whether change and how to change the polarization of incident light state in order to analyze certain optical element, thereby avoid in the polarization optics experiment, false polarizations degree occurring, the present invention is based on " polarization-detection " thought, proposed a kind of easy, analyze the method how optical element changes the incident light polarization state intuitively.
The invention provides a kind of method of analyzing the optical element polarization property, comprise the steps:
Step 1: form polarisation unit by the first broadband linear polarizer and the first broadband quarter-wave wave plate, form detecting unit by the second broadband quarter-wave wave plate and the second broadband linear polarizer, on same light path, be aligned in sequence with laser instrument, polarisation unit, detecting unit and light power meter, to constitute detection system;
Step 2: regulate polarisation unit, promptly regulate the relative angle of the first broadband linear polarizer optical axis and the first broadband quarter-wave wave plate optical axis, make the incident light of laser emitting become the left-handed or right-circularly polarized light of perfact polarization;
Step 3: regulate detecting unit, promptly regulate the relative angle of the second broadband quarter-wave wave plate optical axis and the second broadband linear polarizer optical axis, its permission dextrorotation or the left circularly polarized light opposite with incident light polarization characteristic in the step 2 are passed through, then this moment, incident light can not arrive light power meter, thereby the reading of light power meter is the reflection of surround lighting;
Step 4: between polarisation unit and detecting unit, insert optical element to be measured;
Step 5: read the reading of light power meter, if optical element to be measured changes to some extent to the polarization of incident light state, the reading of light power meter will increase to some extent; If optical element to be measured does not change the polarization of incident light state, then the reading of light power meter is constant, still only reflects the environment light intensity.
The wherein first broadband linear polarizer of Cai Yonging and the second broadband linear polarizer, extinction ratio is 100000: 1 in can seeing near infrared wavelength coverage, with the accuracy that guarantees to be measured.
The wherein first broadband quarter-wave wave plate of Cai Yonging and the second broadband quarter-wave wave plate, achromatism in the wavelength coverage of 690-1200nm is to satisfy the accuracy of being measured in this wavelength coverage.
Wherein the laser instrument that is adopted is to be operated in any various laser instruments that need the wavelength of test.
Wherein the light power meter that is adopted is the silicon detector of band attenuator, and its detection sensitivity reaches the micromicrowatt magnitude in can seeing near infrared wavelength coverage, with the accuracy that guarantees to be surveyed.
The unexpected change that the present invention can prevent some optical element that the circularly polarized light polarization is brought in the magneto-optic experiment is perhaps taken into account these and is changed in experimental result, thereby improves the accuracy of experimental result, reflects real physical phenomenon.
Description of drawings
For further specifying content of the present invention and characteristics, the present invention is described in further detail below in conjunction with drawings and Examples, wherein:
Fig. 1 is based on polarization-detection technique, analyzes the structure diagram how optical element changes the required detection system of method of incident light polarization state.
Fig. 2 is a resulting measurement result among the embodiment that two broadband depolarization Amici prisms are measured.
Embodiment
Seeing also measuring system shown in Figure 1, involved in the present invention comprises:
One laser instrument 30 is used to provide the incident light of testing optical element 50 to be measured.
One " polarisation unit " 10 is made up of the first broadband linear polarizer 101 and the first broadband quarter-wave wave plate 102.Wherein the first broadband linear polarizer 101 plays purifying incident ray polarizability, and the first broadband quarter-wave wave plate 102 plays a part linear polarization incident light behind the purifying is converted into circularly polarized light.Whole " polarisation unit " 10 works to provide the circularly polarized light of certain (left-handed or dextrorotation) 100% polarization.
One " detecting unit " 20 is made up of the second broadband quarter-wave wave plate 202 and the second broadband linear polarizer 201.Wherein the second broadband quarter-wave wave plate 202 plays a part and will be converted into linearly polarized light by the circularly polarized light of optical element 50 after-polarization degree the unknowns to be measured, and the second broadband linear polarizer 201 plays analyzing.Whole " detecting unit " 20 plays a part only to allow and the light of the circularly polarized incident light inverted polarized that " polarisation unit " 10 provides passes through.
The wherein first broadband linear polarizer 101 and the second broadband linear polarizer 201, extinction ratio reaches 105: 1 in can seeing near infrared wavelength coverage, is enough to guarantee the accuracy of being measured.
The wherein first broadband quarter-wave wave plate 102 and the second broadband quarter-wave wave plate 202, achromatism in the wavelength coverage of 690-1200nm is to satisfy the accuracy of being measured in this wavelength coverage.
One laser instrument 30 can be to be operated in any various laser instruments that need the wavelength (wave band) of test.
One light power meter 40 is surveyed the light intensity of incident light after passing through the measuring system each several part.This light power meter 40 is the silicon detector of band attenuator, and its sensitivity reaches the micromicrowatt magnitude in can seeing near infrared wavelength coverage, is enough to guarantee the accuracy of being surveyed
And certain optical element 50 to be measured.
As embodiment, specifically measured the change situation of two different " broadband depolarization Amici prisms " to the incident light polarization state:
Implementation process is below described particularly:
At first, what make laser instrument 30 emergent light alignment light power meters 40 is subjected to the light silicon chip, fixs main optical path.Notice that the emergent light power of laser instrument 30 can not surpass the range of light power meter 40, in order to avoid damage light power meter 40.
In second step, in main optical path, insert the first broadband linear polarizer 101.Rotate the first broadband linear polarizer 101, make the reading of light power meter 40 reach maximum.This moment, the optical axis direction of the first broadband linear polarizer 101 was consistent with the initial line polarized light polarization direction of laser instrument 30 outgoing, and the linear polarization of emergent light obtains purifying (105: 1).Between the first broadband linear polarizer 101 and light power meter 40, insert the second broadband linear polarizer 201 again.Rotate the second broadband linear polarizer 201, make the reading of light power meter 40 reach minimum.This moment, the optical axis direction of the first broadband linear polarizer 101 and the second broadband linear polarizer 201 was orthogonal, and the emergent light of laser instrument 30 can't arrive light power meter 40, and the reading of light power meter 40 only is the reflection of surround lighting, common magnitude in several microwatts.
In the 3rd step, between two broadband linear polarizer 101 and 201, insert the first broadband quarter-wave wave plate 102.Rotate the first broadband quarter-wave wave plate 102, make the reading of light power meter 40 reach maximum.Fast, the slow axis of the optical axis of the first broadband linear polarizer 101 and the first broadband quarter-wave wave plate 102 press from both sides miter angle respectively at this moment, after 102, become the circularly polarized light that certain (left-handed or dextrorotation) 100% polarizes from 101 linearly polarized lights that come out, this circularly polarized light has 50% component can pass through the second broadband linear polarizer 201, arrives light power meter 40.Between the first broadband quarter-wave wave plate 102 and the second broadband linear polarizer 201, insert the second broadband quarter-wave wave plate 202 again.Rotate the second broadband quarter-wave wave plate 202, make the reading of light power meter 40 reach minimum.This moment, the quick shaft direction of the first broadband quarter-wave wave plate 102 and the second broadband quarter-wave wave plate 202 was consistent with the other side's slow-axis direction respectively, after 202, become the linearly polarized light of polarization direction from the circularly polarized light of 102 certain (left-handed or dextrorotation) of coming out, 100% polarization once more, thereby can not arrive light power meter 40 by the optical axis direction second broadband linear polarizer 201 vertical with 101 along the first broadband linear polarizer, 101 optical axis directions.So the reading of light power meter 40 and second step is the same at this moment, also only reflects ambient light intensity.
The 3rd the step finish after, just success is provided with " polarisation unit " 10 and " detecting unit " 20, that is: coming out from polarisation unit 10, be certain (left-handed or dextrorotation) circularly polarized light of 100% polarization, but 20 permissions of detecting unit is by alternative circularly polarized light.
In the 4th step, between " polarisation unit " 10 and " detecting unit " 20, insert optical element 50 to be measured, i.e. prism T or prism D.
The 5th step, read the reading of light power meter 40, the ambient light intensity of reading during with the 3rd step compares: if the reading of this moment is greater than the ambient light intensity of reading before, explanation from " polarisation unit " 10 come out 100% the polarization certain (left-handed or dextrorotation) circularly polarized light, after through prism T or prism D, partly become another kind of (dextrorotation or left-handed) circularly polarized light, and this part circularly polarized light can arrive light power meter 40 by " detecting unit " 20.
The result of actual measurement please refer to Fig. 2.As can be seen, have the circularly polarized light of ≈ 0.034% after by prism T, to change the polarization direction, and this numerical value of prism D has reached ≈ 0.071%.
Above embodiment explanation, this " polarization-detection " method that the present invention proposes can be analyzed optical element really and whether change and how to change the polarization of incident light state, for the problem that influences experimental result owing to the not strict maintenance polarization of some optical element in the laboratory provides a kind of solution thinking and specific measures for implementation.
The above is preferred embodiment of the present invention only, is not in order to limit the right of applying for a patent of the present invention; Simultaneously above description should be understood and be implemented for the special personage who knows the present technique field, so other does not break away from the equivalence of being finished under the disclosed spirit and change or modification, all should be included in the claim scope of the present invention.
Claims (5)
1. a method of analyzing the optical element polarization property comprises the steps:
Step 1: form polarisation unit by the first broadband linear polarizer and the first broadband quarter-wave wave plate, form detecting unit by the second broadband quarter-wave wave plate and the second broadband linear polarizer, on same light path, be aligned in sequence with laser instrument, polarisation unit, detecting unit and light power meter, to constitute detection system;
Step 2: regulate polarisation unit, promptly regulate the relative angle of the first broadband linear polarizer optical axis and the first broadband quarter-wave wave plate optical axis, make the incident light of laser emitting become the left-handed or right-circularly polarized light of perfact polarization;
Step 3: regulate detecting unit, promptly regulate the relative angle of the second broadband quarter-wave wave plate optical axis and the second broadband linear polarizer optical axis, its permission dextrorotation or the left circularly polarized light opposite with incident light polarization characteristic in the step 2 are passed through, then this moment, incident light can not arrive light power meter, thereby the reading of light power meter is the reflection of surround lighting;
Step 4: between polarisation unit and detecting unit, insert optical element to be measured;
Step 5: read the reading of light power meter, if optical element to be measured changes to some extent to the polarization of incident light state, the reading of light power meter will increase to some extent; If optical element to be measured does not change the polarization of incident light state, then the reading of light power meter is constant, still only reflects the environment light intensity.
2. the method for analysis optical element polarization property according to claim 1, the wherein first broadband linear polarizer of Cai Yonging and the second broadband linear polarizer, extinction ratio is 100000: 1 in can seeing near infrared wavelength coverage, with the accuracy that guarantees to be measured.
3. the method for analysis optical element polarization property according to claim 1, the wherein first broadband quarter-wave wave plate of Cai Yonging and the second broadband quarter-wave wave plate, achromatism in the wavelength coverage of 690-1200nm is to satisfy the accuracy of being measured in this wavelength coverage.
4. the method for analysis optical element polarization property according to claim 1, wherein the laser instrument that is adopted is to be operated in any various laser instruments that need the wavelength of test.
5. the method for analysis optical element polarization property according to claim 1, the light power meter that is adopted wherein, be the silicon detector of band attenuator, its detection sensitivity reaches the micromicrowatt magnitude in can seeing near infrared wavelength coverage, with the accuracy that guarantees to be surveyed.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109827758A (en) * | 2019-03-20 | 2019-05-31 | 北京大盟创业科技有限公司 | The polarization extinction ratio test macro of polarization-maintaining passive device |
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| CN108318222B (en) * | 2017-01-17 | 2020-04-10 | 上海微电子装备（集团）股份有限公司 | Polaroid calibration device and method |
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| JP3812525B2 (en) * | 2002-09-20 | 2006-08-23 | 株式会社村田製作所 | Optical magnetic field sensor |
| CN101275834B (en) * | 2007-03-30 | 2011-05-25 | 黄宏嘉 | Passive bias optical fiber gyroscope and current sensor |
| CN100498347C (en) * | 2007-11-14 | 2009-06-10 | 哈尔滨工程大学 | Three state polarization detection method for eliminating linear birefringence influence of optical current transformer |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109827758A (en) * | 2019-03-20 | 2019-05-31 | 北京大盟创业科技有限公司 | The polarization extinction ratio test macro of polarization-maintaining passive device |
| CN109827758B (en) * | 2019-03-20 | 2020-11-03 | 北京大盟创业科技有限公司 | Polarization extinction ratio testing system of polarization-maintaining passive device |
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