CN101893482B - Combination device for infrared temperature measurement of high-voltage switch cabinet - Google Patents
Combination device for infrared temperature measurement of high-voltage switch cabinet Download PDFInfo
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- CN101893482B CN101893482B CN2010102352064A CN201010235206A CN101893482B CN 101893482 B CN101893482 B CN 101893482B CN 2010102352064 A CN2010102352064 A CN 2010102352064A CN 201010235206 A CN201010235206 A CN 201010235206A CN 101893482 B CN101893482 B CN 101893482B
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- switch cabinet
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- 238000009529 body temperature measurement Methods 0.000 title claims abstract description 7
- 238000003331 infrared imaging Methods 0.000 claims abstract description 15
- 229920003229 poly(methyl methacrylate) Polymers 0.000 claims description 17
- 239000004926 polymethyl methacrylate Substances 0.000 claims description 17
- 239000011521 glass Substances 0.000 abstract description 10
- 238000001514 detection method Methods 0.000 abstract 1
- 238000005259 measurement Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 1
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Abstract
The invention relates to a high-voltage switch cabinet of a transformer substation of a power system, and discloses a combination device for the infrared temperature measurement of the high-voltage switch cabinet. The combination device comprises an infrared imaging temperature measurer and an organic glass plate arranged on an observation window of the switch cabinet. The combination device is characterized in that: the organic glass plate is provided with a spherical universal joint which consists of a base and a sphere embedded into the base; through holes used for detection are sequentially reserved on the sphere, the base and the organic glass plate; and an emission barrel of the infrared imaging temperature measurer is inserted into the through hole of the sphere.
Description
Technical field
The present invention relates to the power system transformer substation high-tension switch cabinet, particularly a kind of combination device for infrared temperature measurement of high-voltage switch cabinet.
Background technology
At present, the high-tension switch cabinet of 10kV, 35kV substation operation, it is the integral structure that totally-enclosed bus connects, the contact contact inserts (the totally-enclosed pyrocondensation of bus drainage contact in the cabinet, forming a plurality of electrical equipments of cabinet connects), there is the temperature variation of a plurality of contacts and contact contact portion in cabinet inside, because of there not being corresponding reliable temperature rise temperature measuring equipment, the operations staff generally adopts the infrared imaging temperature measuring instrument to measure.But, the organic glass that the infrared imaging temperature measuring instrument can only be inlayed on the view window of high-tension switch cabinet cabinet back is tested, the measurement accuracy of the material of organic glass and thickness effect infrared imaging temperature measuring instrument, therefore, the elevation angle during test of infrared imaging temperature measuring instrument changes and causes that infrared ray passes through the variation in thickness of organic glass, make the measurement data of different survey crews or each time have randomness, cause measurement data can't correctly reflect the temperature actual change of contact or contact, have a strong impact on reliable, the safe operation of electric power network equipment.
Summary of the invention
The object of the present invention is to provide a kind of combination device for infrared temperature measurement of high-voltage switch cabinet, can eliminate organic glass and stop the measuring error that causes with the variation of the infrared imaging temperature measuring instrument elevation angle, really reflect the actual temperature of interior contact of high-tension switch cabinet or contact.
In order to achieve the above object, the present invention is achieved by the following technical solutions.
A kind of combination device for infrared temperature measurement of high-voltage switch cabinet, comprise the infrared imaging temperature measuring instrument and be arranged on poly (methyl methacrylate) plate on the view window of switch cubicle, it is characterized in that, described poly (methyl methacrylate) plate is provided with universal ball joint, universal ball joint is made of base and the spheroid that is embedded in the base, offer the through hole that is used to survey on spheroid, base, the poly (methyl methacrylate) plate successively, the emission gun barrel of infrared imaging temperature measuring instrument inserts in the described through hole of spheroid; The diameter of the described through hole on described base, the poly (methyl methacrylate) plate is greater than the diameter of the described through hole on the spheroid; But the described through hole of described poly (methyl methacrylate) plate is outside equipped with the cover plate of this through hole of switch.
Poly (methyl methacrylate) plate on the view window of the present invention's switch cubicle is provided with universal ball joint, universal ball joint is made of base and the spheroid that is embedded in the base, offer the through hole that is used to survey on spheroid, base, the poly (methyl methacrylate) plate successively, the emission gun barrel of infrared imaging temperature measuring instrument inserts in the through hole of spheroid, can eliminate organic glass and stop the measuring error that causes with the variation of the infrared imaging temperature measuring instrument elevation angle, the actual temperature of contact or contact in the real reflection high-tension switch cabinet, simultaneously can play the security protection effect, guarantee the safe distance of personal zone of action.
Description of drawings
Below in conjunction with the drawings and specific embodiments the present invention is described in further details.
Fig. 1 is a structural representation of the present invention.
Fig. 2 is the structural representation of poly (methyl methacrylate) plate.
Embodiment
With reference to Fig. 1, on the poly (methyl methacrylate) plate on the view window of switch cubicle 1, be embedded with four screws 2 (particular location is with reference to Fig. 2), by the fixing base 3 of universal ball joint of four screws 2 and corresponding four nuts, base 3 and the spheroid 4 that is embedded in the base 3 constitute universal ball joint, offer the through hole that is used to survey successively on spheroid 4, base 3, the poly (methyl methacrylate) plate 1, the emission gun barrel of infrared imaging temperature measuring instrument 5 inserts in the through hole of spheroid 4, can change its pitching, left and right angle by spheroid 4, convenient location temperature detecting location.In addition, the diameter of the through hole on base 3, the poly (methyl methacrylate) plate 1 can enlarge the investigative range of infrared imaging temperature measuring instrument 1 greater than the through hole on the spheroid 4.
With reference to Fig. 2, but the poly (methyl methacrylate) plate 1 on the view window of switch cubicle is provided with the cover plate 6 of its corresponding through hole of switch, the switching function of cover plate 6 by being arranged on its upper left corner bearing pin and the dog screw in the lower right corner realize, this bearing pin is fixed on the machine glass plate 1, this dog screw machine glass plate 1 that is threaded.
Claims (1)
1. combination device for infrared temperature measurement of high-voltage switch cabinet, comprise the infrared imaging temperature measuring instrument and be arranged on poly (methyl methacrylate) plate on the view window of switch cubicle, it is characterized in that, described poly (methyl methacrylate) plate is provided with universal ball joint, universal ball joint is made of base and the spheroid that is embedded in the base, offer the through hole that is used to survey on spheroid, base, the poly (methyl methacrylate) plate successively, the emission gun barrel of infrared imaging temperature measuring instrument inserts in the described through hole of spheroid; The diameter of the described through hole on described base, the poly (methyl methacrylate) plate is greater than the diameter of the described through hole on the spheroid; But the described through hole of described poly (methyl methacrylate) plate is outside equipped with the cover plate of this through hole of switch.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010102352064A CN101893482B (en) | 2010-07-23 | 2010-07-23 | Combination device for infrared temperature measurement of high-voltage switch cabinet |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010102352064A CN101893482B (en) | 2010-07-23 | 2010-07-23 | Combination device for infrared temperature measurement of high-voltage switch cabinet |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101893482A CN101893482A (en) | 2010-11-24 |
| CN101893482B true CN101893482B (en) | 2011-12-21 |
Family
ID=43102742
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010102352064A Active CN101893482B (en) | 2010-07-23 | 2010-07-23 | Combination device for infrared temperature measurement of high-voltage switch cabinet |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101893482B (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9217869B2 (en) | 2013-02-05 | 2015-12-22 | Fluke Corporation | Viewing window assembly for single-sided installation |
| CN103759834A (en) * | 2014-01-24 | 2014-04-30 | 安徽工程大学 | High-voltage switch cabinet contact temperature detection device and method |
| CN103983362B (en) * | 2014-04-29 | 2019-07-02 | 骆福忠 | A kind of infrared window |
| CN109269676A (en) * | 2018-11-07 | 2019-01-25 | 国网河南省电力公司郑州供电公司 | Based on metal switch cabinet inside temperature measurement system front end sensor device |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102004046676A1 (en) * | 2004-09-24 | 2006-04-20 | Zf Friedrichshafen Ag | Ball joint with sealing bellows |
| DE102005018663A1 (en) * | 2005-04-21 | 2006-11-02 | Zf Friedrichshafen Ag | ball joint |
| US7270007B2 (en) * | 2005-06-03 | 2007-09-18 | Serrano Norman S | Apparatus and method for reducing vibration |
| JP2007230507A (en) * | 2006-03-03 | 2007-09-13 | Honda Motor Co Ltd | Suspension system of vehicle, and ball stud used for suspension system |
| US7768270B2 (en) * | 2006-08-24 | 2010-08-03 | Itrobotics, Inc. | In-pipe coating integrity monitor for very long pipes |
| JP2008223818A (en) * | 2007-03-09 | 2008-09-25 | Somic Ishikawa Inc | Ball joint |
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2010
- 2010-07-23 CN CN2010102352064A patent/CN101893482B/en active Active
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| Publication number | Publication date |
|---|---|
| CN101893482A (en) | 2010-11-24 |
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| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: STATE ELECTRIC NET CROP. Effective date: 20130118 |
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| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20130118 Address after: Xianyang City, Shaanxi Province, 712000 West Road No. 30 Patentee after: Xianyang Power Supply Bureau Patentee after: State Grid Corporation of China Address before: Xianyang City, Shaanxi Province, 712000 West Road No. 30 Patentee before: Xianyang Power Supply Bureau |