CN101881810B - New key board automatic test equipment and test circuit thereof - Google Patents
New key board automatic test equipment and test circuit thereof Download PDFInfo
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- CN101881810B CN101881810B CN2010102214331A CN201010221433A CN101881810B CN 101881810 B CN101881810 B CN 101881810B CN 2010102214331 A CN2010102214331 A CN 2010102214331A CN 201010221433 A CN201010221433 A CN 201010221433A CN 101881810 B CN101881810 B CN 101881810B
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Abstract
The invention relates to new key board automatic test equipment, comprising a circuit board to be tested of a plurality of keys. The test equipment is characterized in that the bottom side of the circuit board to be test is mounted with a needle plate; an electrode thimble which connects the touch points to be tested of the circuit board to be test and a testing circuit is arranged on the needle plate; a hoistable pressing plate mechanism is arranged on the rack above the circuit board to be tested; and keys respectively in close contact with each group of the touch points on the upper side of the circuit board to be tested are arranged below the hoistable pressing plate mechanism. The invention also provides a new key board automatic test circuit which can quickly and accurately test keys in the board to be tested is good or bad. The invention has the characteristics of simple structure, less test time, high work efficiency, high degree of automation, effectively reduced production cost and enhanced competitiveness.
Description
Technical field
The present invention relates to a kind of new key board automatic test equipment and test circuit thereof, be applicable to the test of LCD, LCD TV circuit board.
Background technology
At present; The present adjustment method of keypad is manual working test, connects power supply (every plate all needs each energising once) to keypad promptly by hand earlier, treat that keypad is switched on after; Press the button on the keypad one by one, manual work sees whether manual test tool measurement voltage is normal.The said method mean test time is 12 a seconds/part, and the manual test time is long, and testing efficiency is low, and adopts manual form, and automaticity is low.Therefore, how addressing the above problem is research object of the present invention.
Summary of the invention
The object of the present invention is to provide a kind of test consuming time few, the new key board automatic test equipment that automaticity is high.
The invention is characterized in: a kind of new key board automatic test equipment; Comprise the circuit-under-test plate; It is characterized in that: said circuit-under-test plate bottom side is equipped with needle plate; Said needle plate is provided with the electrode thimble that the tested contact of circuit-under-test plate is connected with measurement circuit, and the frame of said circuit-under-test plate top is provided with the liftable press plate mechanism, said liftable press plate mechanism below be provided with respectively with circuit-under-test plate upside respectively organize the closed button that contacts of key contacts.
Another object of the present invention provides a kind of new key board automatic test circuit, and this circuit can detect the quality of button in the tested test plate (panel) fast and accurately.
The present invention adopts following two kinds of schemes; Realize above-mentioned purpose; First kind is: a kind of new key board automatic test circuit; Comprise circuit-under-test plate, single-chip microcomputer with a plurality of buttons and the A/D modular converter that links to each other with single-chip microcomputer, it is characterized in that: described single-chip microcomputer output terminal is connected with the driving circuit of liftable press plate mechanism, and said a plurality of buttons are connected with power supply through a resistance respectively; The output terminal of described A/D modular converter and be electrically connected at button and resistance between the electrode thimble, be used to detect the voltage of each resistance.
Second kind is: a kind of new key board automatic test circuit; Comprise circuit-under-test plate, single-chip microcomputer with a plurality of buttons and the A/D modular converter that links to each other with single-chip microcomputer; It is characterized in that: described single-chip microcomputer output terminal is connected with the driving circuit of liftable press plate mechanism; The output terminal of described A/D modular converter is connected in series a plurality of resistance through the electrode thimble; The output terminal of described a plurality of buttons is connected to respectively between these a plurality of resistance, so that the situation that the A/D modular converter is pressed according to different key detects different resistive voltages.
Advantage of the present invention: the present invention is simple in structure, and the test duration is few, can detect many group keypads simultaneously, high efficiency, and automaticity is high, can effectively reduce production cost, promotes competitive power.
Description of drawings
Fig. 1 is an embodiment of the invention structural representation.
Fig. 2 is that the I of Fig. 1 is to partial enlarged view.
Fig. 3 is the embodiment of the invention one test circuit figure.
Fig. 4 is the embodiment of the invention two test circuit figure.
Fig. 5 is the embodiment of the invention three test circuit figure.
Embodiment
With reference to figure 1 and Fig. 2; A kind of new key board automatic test equipment; Comprise circuit-under-test plate 1, said circuit-under-test plate 1 bottom side is equipped with needle plate 2, and said needle plate 2 is provided with the electrode thimble 3 that circuit-under-test plate 1 tested contact is connected with measurement circuit; The frame 4 of said circuit-under-test plate 1 top is provided with liftable press plate mechanism 5, said liftable press plate mechanism 5 belows be provided with respectively with circuit-under-test plate 1 upside respectively organize the closed button 6 that contacts of key contacts.
Above-mentioned needle plate 2 upsides are provided with elastic cushion block 7 and the backplate 8 with thimble perforation 8-1 that is installed in elastic cushion block 7, and said electrode thimble 3 passes backplate pin hole 8-1 and contacts with the circuit-under-test plate that is placed on backplate 8 upsides 1 each contact.
Above-mentioned liftable press plate mechanism 5 comprises button lifting support device 5-1 and buck block mechanism 5-2; Said button lifting support device 5-1 comprises up-down pressing plate 5-1-1; Said up-down pressing plate 5-1-1 bottom side connect through elastic cushion block 5-1-2 have button feeler lever 6-1 jack 5-1-3) button backplate 5-1-4; Said up-down pressing plate 5-1-1 upside is connected with the top board 5-1-5 that is connected with button feeler lever 6-1 upper end through elastic cushion block 5-1-2; Said up-down pressing plate 5-1-1 is connected with the briquetting A5-1-8 that is driven by the cylinder A5-1-7 that is fixedly arranged on the frame 4 through connecting rod 5-1-6; The briquetting B5-2-1 of said buck block mechanism 5-2 is driven by the cylinder B5-2-2 that is fixedly arranged on the briquetting A5-1-8, and the briquetting B5-2-1 of said buck block mechanism is positioned at said up-down pressing plate 5-1-1 top.
Above-mentioned buck block mechanism can be two or more sets, and its briquetting is gone up and down by the air cylinder driven on the briquetting that is fixedly arranged on cylinder A driving respectively.Shown in embodiment, be illustrated as two groups of buck block mechanisms, its briquetting is driven by cylinder B and cylinder C respectively.
Embodiment practical implementation process is following: drive briquetting 5-1-8 through cylinder A5-1-7 and press down; Because up-down pressing plate 5-1-1 is connected with briquetting 5-1-8 through connecting rod 5-1-6; The up-down pressing plate presses down simultaneously; Depress the circuit-under-test plate contact that makes the circuit-under-test plate and contact, supply power with probe on the needle plate;
Next cylinder B (left side) presses down earlier, makes button 6 press down the contact of circuit-under-test plate 1, through switches set and internal control circuit; Realization does not press down the test of resistance on the circuit board under the situation to the test and the cylinder C (the right) of circuit board contact under the cylinder B, tests, and cylinder B rises; Cylinder C presses down; (test philosophy is with cylinder B) tests the back and promotes cylinder A, can realize the test to two circuit board contact and resistance like this.
Please continue with reference to Fig. 3; In order to cooperate above-mentioned structure; The present invention provides a kind of new key board automatic test circuit; Comprise circuit-under-test plate, single-chip microcomputer with a plurality of buttons and the A/D modular converter that links to each other with single-chip microcomputer, it is characterized in that: described single-chip microcomputer output terminal is connected with the driving circuit of liftable press plate mechanism, and said a plurality of buttons are connected with power supply through a resistance respectively; The output terminal of described A/D modular converter and be electrically connected at button and resistance between electrode thimble 3, be used to detect the voltage of each resistance.In present embodiment, the A/D modular converter has a plurality of output points, and each output point has only two states, and is as shown in Figure 3; When button not on time, output voltage is 5V, when pressing; Corresponding output point over the ground, output voltage is 0V, discerns which button with this and is pressed.
Please with reference to Fig. 4; Fig. 4 is the embodiment of the invention two test circuit figure; In present embodiment, the new key board automatic test circuit comprises circuit-under-test plate, single-chip microcomputer with a plurality of buttons and the A/D modular converter that links to each other with single-chip microcomputer; It is characterized in that: described single-chip microcomputer output terminal is connected with the driving circuit of liftable press plate mechanism; The output terminal of described A/D modular converter is connected in series a plurality of resistance through the electrode thimble, and the output terminal of described a plurality of buttons is connected to respectively between these a plurality of resistance, so that the situation that the A/D modular converter is pressed according to different key detects different resistive voltages.In present embodiment, the output point of said A/D modular converter has a plurality of states, and is as shown in Figure 4; When button not on time, output voltage is a certain value, when certain button is pressed; Because resistance ratio changes; Output point will be exported the voltage of a correspondence, and the resistance ratio that different keys is corresponding different is discerned this voltage and just can be known that which button is pressed.
Please continue with reference to Fig. 5; Fig. 5 is the embodiment of the invention three test circuit figure; Present embodiment is that the control end of described switches set is connected with said single-chip microcomputer between the resistance in per two output terminals serial connection of a said A/D modular converter and then switches set on the basis of the foregoing description two.The concrete Fig. 5 that sees also at first controls the corresponding cylinder of keypad A and descends, and mechanism partly all presses the button of keypad A; The K1 of Closing Switch group, K2 ~ K8 switch breaks off, because the button of keypad B all is in open circuit; The output voltage of the electrode thimble 3 on the A/D module measurement keypad B measures voltage then and collection model voltage ratio is right, promptly uses the r1 resistance test of plate B; The K9 button quality of plate A, in addition, when recording the K9 switch just often; Also can be through the open and close of K9, the r1 resistance quality of test board B.Guaranteed the accuracy of whole test like this, provide high efficient.In like manner, when measuring K10 switch quality, the K2 of closed CS group; Other switches of switches set break off; Because the button of keypad B all is in open circuit, the output voltage of the electrode thimble 3 on the A/D module measurement keypad B measures voltage then and collection model voltage ratio is right; Promptly use r1, the r2 resistance test of plate B, the K10 button quality of plate A.Other several groups of test philosophies are the same, this just not tired stating.Opposite, if the button of test b plate also is to adopt above-mentioned same mode to test.
Here what deserves to be mentioned is that in order once to test a plurality of test boards, the single-chip microcomputer of the above embodiment of the present invention all can be connected with a plurality of A/D modular converters.
The above is merely preferred embodiment of the present invention, and all equalizations of doing according to claim of the present invention change and modify, and all should belong to covering scope of the present invention.
Claims (2)
1. key board automatic test equipment; Comprise circuit-under-test plate with a plurality of key contacts; It is characterized in that: said circuit-under-test plate bottom side is equipped with needle plate; Said needle plate is provided with the electrode thimble that the tested contact of circuit-under-test plate is connected with measurement circuit, and the frame of said circuit-under-test plate top is provided with the liftable press plate mechanism, said liftable press plate mechanism below be provided with respectively with circuit-under-test plate upside respectively organize the closed button that contacts of key contacts; Said needle plate upside is provided with elastic cushion block and the backplate with thimble perforation that is installed on the elastic cushion block, and said electrode thimble passes said thimble perforation and contacts with each contact of circuit-under-test plate that is placed on the backplate upside; Said liftable press plate mechanism comprises button lifting support device and buck block mechanism; Said button lifting support device comprises the up-down pressing plate; Said up-down pressing plate bottom side connects the button backplate with button feeler lever jack through elastic cushion block; Said up-down pressing plate upside is connected with the top board that is connected with button feeler lever upper end through elastic cushion block; Said up-down pressing plate is connected with the briquetting A that is driven by the cylinder A that is fixedly arranged on the frame through connecting rod, and the briquetting B of said buck block mechanism is driven by the cylinder B that is fixedly arranged on the briquetting A, and the briquetting B of said buck block mechanism is positioned at said up-down pressing plate top.
2. key board automatic test equipment according to claim 1 is characterized in that: said buck block mechanism is two or more sets, and its briquetting B is driven by the cylinder B on the briquetting A that is fixedly arranged on cylinder A driving respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010102214331A CN101881810B (en) | 2010-07-08 | 2010-07-08 | New key board automatic test equipment and test circuit thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010102214331A CN101881810B (en) | 2010-07-08 | 2010-07-08 | New key board automatic test equipment and test circuit thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101881810A CN101881810A (en) | 2010-11-10 |
| CN101881810B true CN101881810B (en) | 2012-07-04 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010102214331A Expired - Fee Related CN101881810B (en) | 2010-07-08 | 2010-07-08 | New key board automatic test equipment and test circuit thereof |
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| CN (1) | CN101881810B (en) |
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| CN102435905A (en) * | 2011-12-31 | 2012-05-02 | 昆山圣泰机电制造有限公司 | Aging testing machine for button circuit board of elevator |
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| CN103618897B (en) * | 2013-10-31 | 2015-07-15 | 四川长虹电器股份有限公司 | A testing device of a machine core main board of a TV integrated machine |
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| CN105093044B (en) * | 2015-09-14 | 2018-06-05 | 博众精工科技股份有限公司 | A kind of pin support plate module mechanism for testing |
| CN106597248B (en) * | 2015-10-16 | 2019-11-29 | 惠州Tcl移动通信有限公司 | A kind of jigsaw detection device |
| WO2017156778A1 (en) * | 2016-03-18 | 2017-09-21 | 深圳市艾励美特科技有限公司 | Test fixture for electronic product |
| CN106885968A (en) * | 2017-03-17 | 2017-06-23 | 广东长盈精密技术有限公司 | Continuity test tool |
| CN107271781A (en) * | 2017-07-25 | 2017-10-20 | 江苏凯尔生物识别科技有限公司 | A kind of fingerprint module automatic impedance-testing device |
| CN108693470A (en) * | 2018-06-20 | 2018-10-23 | 广东美的厨房电器制造有限公司 | The detection device of thin film switch |
| CN112285539B (en) * | 2020-12-30 | 2021-04-13 | 南京亚尔软件测试有限公司 | IED flexible testing front-end adapter suitable for automatic taking and placing |
| CN117330801B (en) * | 2023-10-19 | 2024-02-20 | 深圳市兆兴博拓科技股份有限公司 | Circuit board testing device, debugging method and debugging system |
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| US6211690B1 (en) * | 1997-10-15 | 2001-04-03 | Tessera, Inc. | Apparatus for electrically testing bare printed circuits |
| CN201066379Y (en) * | 2007-06-18 | 2008-05-28 | 比亚迪股份有限公司 | Keyboard tester |
| CN101661418A (en) * | 2008-08-26 | 2010-03-03 | 比亚迪股份有限公司 | Keyboard testing system |
| CN201732148U (en) * | 2010-07-08 | 2011-02-02 | 福建捷联电子有限公司 | Novel automatic keyboard plate testing device |
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Patent Citations (4)
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|---|---|---|---|---|
| US6211690B1 (en) * | 1997-10-15 | 2001-04-03 | Tessera, Inc. | Apparatus for electrically testing bare printed circuits |
| CN201066379Y (en) * | 2007-06-18 | 2008-05-28 | 比亚迪股份有限公司 | Keyboard tester |
| CN101661418A (en) * | 2008-08-26 | 2010-03-03 | 比亚迪股份有限公司 | Keyboard testing system |
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| CN101881810A (en) | 2010-11-10 |
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