CN101881810A - New key board automatic test equipment and test circuit thereof - Google Patents

New key board automatic test equipment and test circuit thereof Download PDF

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Publication number
CN101881810A
CN101881810A CN 201010221433 CN201010221433A CN101881810A CN 101881810 A CN101881810 A CN 101881810A CN 201010221433 CN201010221433 CN 201010221433 CN 201010221433 A CN201010221433 A CN 201010221433A CN 101881810 A CN101881810 A CN 101881810A
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China
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circuit
test
plate
new key
button
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Granted
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CN 201010221433
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Chinese (zh)
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CN101881810B (en
Inventor
沙立明
王建平
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TPV Electronics Fujian Co Ltd
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TPV Electronics Fujian Co Ltd
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Priority to CN2010102214331A priority Critical patent/CN101881810B/en
Publication of CN101881810A publication Critical patent/CN101881810A/en
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Publication of CN101881810B publication Critical patent/CN101881810B/en
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  • Input From Keyboards Or The Like (AREA)

Abstract

The invention relates to new key board automatic test equipment, comprising a circuit board to be tested of a plurality of keys. The test equipment is characterized in that the bottom side of the circuit board to be test is mounted with a needle plate; an electrode thimble which connects the touch points to be tested of the circuit board to be test and a testing circuit is arranged on the needle plate; a hoistable pressing plate mechanism is arranged on the rack above the circuit board to be tested; and keys respectively in close contact with each group of the touch points on the upper side of the circuit board to be tested are arranged below the hoistable pressing plate mechanism. The invention also provides a new key board automatic test circuit which can quickly and accurately test keys in the board to be tested is good or bad. The invention has the characteristics of simple structure, less test time, high work efficiency, high degree of automation, effectively reduced production cost and enhanced competitiveness.

Description

New key board automatic test equipment and test circuit thereof
Technical field
The present invention relates to a kind of new key board automatic test equipment and test circuit thereof, be applicable to the test of LCD, LCD TV circuit board.
Background technology
At present, the present adjustment method of keypad is manual working test, connects power supply (every plate all needs each energising once) to keypad promptly by hand earlier, treat that keypad is switched on after, press the button on the keypad one by one, see manually whether manual test tool measurement voltage is normal.The said method mean test time is 12 a seconds/part, and the manual test time is long, and testing efficiency is low, and adopts manual form, and automaticity is low.Therefore, how addressing the above problem is research object of the present invention.
Summary of the invention
The object of the present invention is to provide a kind of test consuming time few, the new key board automatic test equipment that automaticity is high.
The invention is characterized in: a kind of new key board automatic test equipment, comprise the circuit-under-test plate, it is characterized in that: described circuit-under-test plate bottom side is equipped with needle plate, described needle plate is provided with the electrode thimble that the tested contact of circuit-under-test plate is connected with measurement circuit, the frame of described circuit-under-test plate top is provided with the liftable press plate mechanism, described liftable press plate mechanism below be provided with respectively with circuit-under-test plate upside respectively organize the closed button that contacts of key contacts.
Another object of the present invention provides a kind of new key board automatic test circuit, and this circuit can detect the quality of button in the tested test plate (panel) fast and accurately.
The present invention adopts following two kinds of schemes, realize above-mentioned purpose, first kind is: a kind of new key board automatic test circuit, comprise circuit-under-test plate, single-chip microcomputer with a plurality of buttons and the A/D modular converter that links to each other with single-chip microcomputer, it is characterized in that: described single-chip microcomputer output terminal is connected with the driving circuit of liftable press plate mechanism, described a plurality of button is connected with power supply through a resistance respectively, the output terminal of described A/D modular converter and be electrically connected at button and resistance between the electrode thimble, be used to detect the voltage of each resistance.
Second kind is: a kind of new key board automatic test circuit, comprise circuit-under-test plate, single-chip microcomputer with a plurality of buttons and the A/D modular converter that links to each other with single-chip microcomputer, it is characterized in that: described single-chip microcomputer output terminal is connected with the driving circuit of liftable press plate mechanism, the output terminal of described A/D modular converter is connected in series a plurality of resistance through the electrode thimble, the output terminal of described a plurality of buttons is connected to respectively between these a plurality of resistance, so that the situation that the A/D modular converter is pressed according to different key detects different resistive voltages.
Advantage of the present invention: the present invention is simple in structure, and the test duration is few, can detect many group keypads simultaneously, and high efficiency, and automaticity height can effectively reduce production cost, promote competitive power.
Description of drawings
Fig. 1 is an embodiment of the invention structural representation.
Fig. 2 is that the I of Fig. 1 is to partial enlarged view.
Fig. 3 is the embodiment of the invention one test circuit figure.
Fig. 4 is the embodiment of the invention two test circuit figure.
Fig. 5 is the embodiment of the invention three test circuit figure.
Embodiment
With reference to figure 1 and Fig. 2, a kind of new key board automatic test equipment, comprise circuit-under-test plate 1, described circuit-under-test plate 1 bottom side is equipped with needle plate 2, described needle plate 2 is provided with the electrode thimble 3 that circuit-under-test plate 1 tested contact is connected with measurement circuit, the frame 4 of described circuit-under-test plate 1 top is provided with liftable press plate mechanism 5, described liftable press plate mechanism 5 belows be provided with respectively with circuit-under-test plate 1 upside respectively organize the closed button 6 that contacts of key contacts.
Above-mentioned needle plate 2 upsides are provided with elastic cushion block 7 and are installed in the backplate 8 with thimble perforation 8-1 of elastic cushion block 7, and described electrode thimble 3 passes backplate pin hole 8-1 and contacts with circuit-under-test plate 1 each contact that is placed on backplate 8 upsides.
Above-mentioned liftable press plate mechanism 5 comprises button lifting support device 5-1 and buck block mechanism 5-2, described button lifting support device 5-1 comprises lifting pressing plate 5-1-1, described lifting pressing plate 5-1-1 bottom side connect through elastic cushion block 5-1-2 have button feeler lever 6-1 jack 5-1-3) button backplate 5-1-4, described lifting pressing plate 5-1-1 upside is connected with the top board 5-1-5 that is connected with button feeler lever 6-1 upper end through elastic cushion block 5-1-2, described lifting pressing plate 5-1-1 is connected with the briquetting A5-1-8 that is driven by the cylinder A5-1-7 that is fixedly arranged on the frame 4 through connecting rod 5-1-6, the briquetting B5-2-1 of described buck block mechanism 5-2 drives lifting by the cylinder B5-2-2 that is fixedly arranged on the briquetting A5-1-8, and the briquetting B5-2-1 of described buck block mechanism is positioned at described lifting pressing plate 5-1-1 top.
Above-mentioned buck block mechanism can be two or more sets, and its briquetting is respectively by the air cylinder driven lifting on the briquetting that is fixedly arranged on cylinder A driving.As shown in the Examples, be illustrated as two groups of buck block mechanisms, its briquetting drives lifting by cylinder B and cylinder C respectively.
The embodiment specific implementation process is as follows: drive briquetting 5-1-8 by cylinder A5-1-7 and press down, because lifting pressing plate 5-1-1 is connected with briquetting 5-1-8 through connecting rod 5-1-6, the lifting pressing plate presses down simultaneously, the circuit-under-test plate depressed the contact that makes the circuit-under-test plate and contact, power with probe on the needle plate;
Next cylinder B (left side) presses down earlier, make button 6 press down the contact of circuit-under-test plate 1, by switches set and internal control circuit, realization is to the test of circuit board contact under the cylinder B and cylinder C(the right) do not press down the test of resistance on the circuit board under the situation, test, cylinder B rises, cylinder C presses down, (test philosophy is with cylinder B) tests the back and promotes cylinder A, can realize the test to two circuit board contact and resistance like this.
Please continue with reference to Fig. 3, in order to cooperate above-mentioned structure, the invention provides a kind of new key board automatic test circuit, comprise circuit-under-test plate, single-chip microcomputer with a plurality of buttons and the A/D modular converter that links to each other with single-chip microcomputer, it is characterized in that: described single-chip microcomputer output terminal is connected with the driving circuit of liftable press plate mechanism, described a plurality of button is connected with power supply through a resistance respectively, the output terminal of described A/D modular converter and be electrically connected at button and resistance between electrode thimble 3, be used to detect the voltage of each resistance.In present embodiment, the A/D modular converter has a plurality of output points, and each output point has only two states, as shown in Figure 3, when button not on time, output voltage is 5V, when pressing, corresponding output point over the ground, output voltage is 0V, discerns which button with this and is pressed.
Please refer to Fig. 4, Fig. 4 is the embodiment of the invention two test circuit figure, in present embodiment, the new key board automatic test circuit, comprise circuit-under-test plate with a plurality of buttons, single-chip microcomputer and the A/D modular converter that links to each other with single-chip microcomputer, it is characterized in that: described single-chip microcomputer output terminal is connected with the driving circuit of liftable press plate mechanism, the output terminal of described A/D modular converter is connected in series a plurality of resistance through the electrode thimble, the output terminal of described a plurality of buttons is connected to respectively between these a plurality of resistance, so that the situation that the A/D modular converter is pressed according to different key detects different resistive voltages.In present embodiment, the output point of described A/D modular converter has a plurality of states, as shown in Figure 4, when button not on time, output voltage is a certain value, when certain button is pressed, because resistance ratio changes, output point will be exported the voltage of a correspondence, and the resistance ratio that different buttons is corresponding different is discerned this voltage and just can be known which button is pressed.
Please continue with reference to Fig. 5, Fig. 5 is the embodiment of the invention three test circuit figure, present embodiment is that the control end of described switches set is connected with described single-chip microcomputer between the resistance in per two output terminals serial connection of a described A/D modular converter and then switches set on the basis of the foregoing description two.The concrete Fig. 5 that sees also, at first controlling the corresponding cylinder of keypad A descends, mechanism partly all presses the button of keypad A, the K1 of Closing Switch group, K2 ~ K8 switch disconnects, because the button of keypad B all is in open circuit, the A/D module measures the output voltage of the electrode thimble 3 on the keypad B, it is right with collection model voltage ratio to measure voltage then, promptly uses the r1 resistance test of plate B, the K9 button quality of plate A, in addition, when recording the K9 switch just often, also can be by the open and close of K9, the r1 resistance quality of test board B.Guaranteed the accuracy of whole test like this, provide high efficient.In like manner, when measuring K10 switch quality, the K2 of closed gauge tap group, other switches of switches set disconnect, because the button of keypad B all is in open circuit, the output voltage of the electrode thimble 3 on the A/D module measurement keypad B measures voltage then and collection model voltage ratio is right, promptly use r1, the r2 resistance test of plate B, the K10 button quality of plate A.Other several groups of test philosophies are the same, this just not tired stating.Opposite, if the button of test b plate also is to adopt above-mentioned same mode to test.
Here what deserves to be mentioned is that in order once to test a plurality of test boards, the single-chip microcomputer of the above embodiment of the present invention all can be connected with a plurality of A/D modular converters.
The above only is preferred embodiment of the present invention, and all equalizations of being done according to the present patent application claim change and modify, and all should belong to covering scope of the present invention.

Claims (9)

1. new key board automatic test equipment, comprise circuit-under-test plate with a plurality of buttons, it is characterized in that: described circuit-under-test plate bottom side is equipped with needle plate, described needle plate is provided with the electrode thimble that the tested contact of circuit-under-test plate is connected with measurement circuit, the frame of described circuit-under-test plate top is provided with the liftable press plate mechanism, described liftable press plate mechanism below be provided with respectively with circuit-under-test plate upside respectively organize the closed button that contacts of key contacts.
2. new key board automatic test equipment according to claim 1, it is characterized in that: described needle plate upside is provided with elastic cushion block and is installed in the backplate with thimble perforation of elastic cushion block, and described electrode thimble passes the backplate pin hole and contacts with each contact of circuit-under-test plate that is placed on the backplate upside.
3. new key board automatic test equipment according to claim 1, it is characterized in that: described liftable press plate mechanism comprises button lifting support device and buck block mechanism, described button lifting support device comprises the lifting pressing plate, described lifting pressing plate bottom side connects the button backplate with button feeler lever jack through elastic cushion block, described lifting pressing plate upside is connected with the top board that is connected with button feeler lever upper end through elastic cushion block, described lifting pressing plate is connected with the briquetting A that is driven by the cylinder A that is fixedly arranged on the frame through connecting rod, the briquetting B of described buck block mechanism drives lifting by the cylinder B that is fixedly arranged on the briquetting A, and the briquetting B of described buck block mechanism is positioned at described lifting pressing plate top.
4. new key board automatic test equipment according to claim 3 is characterized in that: described buck block mechanism can be two or more sets, and its briquetting is respectively by the air cylinder driven lifting on the briquetting that is fixedly arranged on cylinder A driving.
5. new key board automatic test circuit, comprise circuit-under-test plate, single-chip microcomputer with a plurality of buttons and the A/D modular converter that links to each other with single-chip microcomputer, it is characterized in that: described single-chip microcomputer output terminal is connected with the driving circuit of liftable press plate mechanism, described a plurality of button is connected with power supply through a resistance respectively, the output terminal of described A/D modular converter and be electrically connected at button and resistance between the electrode thimble, be used to detect the voltage of each resistance.
6. according to the described new key board automatic test circuit of right claim 5, it is characterized in that: described single-chip microcomputer is connected with a plurality of A/D modular converters.
7. new key board automatic test circuit, comprise circuit-under-test plate, single-chip microcomputer with a plurality of buttons and the A/D modular converter that links to each other with single-chip microcomputer, it is characterized in that: described single-chip microcomputer output terminal is connected with the driving circuit of liftable press plate mechanism, the output terminal of described A/D modular converter is connected in series a plurality of resistance through the electrode thimble, the output terminal of described a plurality of buttons is connected to respectively between these a plurality of resistance, so that the situation that the A/D modular converter is pressed according to different key detects different resistive voltages.
8. according to the described new key board automatic test circuit of right claim 7, it is characterized in that: described single-chip microcomputer is connected with a plurality of A/D modular converters.
9. according to claim 7 or 8 described new key board automatic test circuit, it is characterized in that: described A/D modular converter has at least two above output terminals, an also and then switches set between per two resistance that output terminal was connected in series, the control end of described switches set is connected with described single-chip microcomputer.
CN2010102214331A 2010-07-08 2010-07-08 New key board automatic test equipment and test circuit thereof Expired - Fee Related CN101881810B (en)

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CN2010102214331A CN101881810B (en) 2010-07-08 2010-07-08 New key board automatic test equipment and test circuit thereof

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Application Number Priority Date Filing Date Title
CN2010102214331A CN101881810B (en) 2010-07-08 2010-07-08 New key board automatic test equipment and test circuit thereof

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CN101881810B CN101881810B (en) 2012-07-04

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Cited By (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102435905A (en) * 2011-12-31 2012-05-02 昆山圣泰机电制造有限公司 Aging tester for elevator button circuit board
CN103048609A (en) * 2012-12-19 2013-04-17 昆山迈致治具科技有限公司 PCB (Printed Circuit Board) test jig with air blowing function
CN103091624A (en) * 2013-01-18 2013-05-08 宁波三星电气股份有限公司 Test method based on final circular test (FCT) multi-station test device
CN103091623A (en) * 2013-01-18 2013-05-08 宁波三星电气股份有限公司 Final circular test (FCT) multi-station test machine
CN103454574A (en) * 2013-08-16 2013-12-18 安徽鑫龙电器股份有限公司 Static testing device for circuit board
CN103618897A (en) * 2013-10-31 2014-03-05 四川长虹电器股份有限公司 A testing device of a machine core main board of a TV integrated machine
CN103823173A (en) * 2014-03-17 2014-05-28 青岛海信电器股份有限公司 Remote control board yoke plate test equipment
CN103856964A (en) * 2014-03-13 2014-06-11 博威科技(深圳)有限公司 Device for testing and calibrating Femto
CN104459530A (en) * 2014-12-22 2015-03-25 广州创维平面显示科技有限公司 Keying board tester and keying board test device
CN104614618A (en) * 2015-02-07 2015-05-13 刘刚 Semi-automatic interchange equipment for testing electrical performance and testing method thereof
CN105093044A (en) * 2015-09-14 2015-11-25 苏州博众精工科技有限公司 Needle loading board module test mechanism
CN106597248A (en) * 2015-10-16 2017-04-26 惠州Tcl移动通信有限公司 Spliced plate detection device
CN106885968A (en) * 2017-03-17 2017-06-23 广东长盈精密技术有限公司 Continuity test fixture
CN107271781A (en) * 2017-07-25 2017-10-20 江苏凯尔生物识别科技有限公司 A kind of fingerprint module automatic impedance-testing device
CN107850637A (en) * 2016-03-18 2018-03-27 深圳市艾励美特科技有限公司 A kind of electronic product testing jig
CN108693470A (en) * 2018-06-20 2018-10-23 广东美的厨房电器制造有限公司 The detection device of thin film switch
CN110455174A (en) * 2019-08-01 2019-11-15 福州国化智能技术有限公司 An automatic measuring device for rod flexibility
CN110596573A (en) * 2019-10-12 2019-12-20 苏州恒河激光科技有限公司 A detection device for FPC
CN111077431A (en) * 2019-12-30 2020-04-28 浙江力创自动化科技有限公司 Electrical property detection equipment of control circuit board
CN111812444A (en) * 2020-08-07 2020-10-23 常州敏杰电器有限公司 An inspection box testing device
CN112285539A (en) * 2020-12-30 2021-01-29 南京亚尔软件测试有限公司 IED flexible testing front-end adapter suitable for automatic taking and placing
CN117330801A (en) * 2023-10-19 2024-01-02 深圳市兆兴博拓科技股份有限公司 Circuit board testing device, debugging method and debugging system

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CN201732148U (en) * 2010-07-08 2011-02-02 福建捷联电子有限公司 Novel automatic keyboard plate testing device

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CN201066379Y (en) * 2007-06-18 2008-05-28 比亚迪股份有限公司 Keyboard tester
CN101661418A (en) * 2008-08-26 2010-03-03 比亚迪股份有限公司 Keyboard testing system
CN201732148U (en) * 2010-07-08 2011-02-02 福建捷联电子有限公司 Novel automatic keyboard plate testing device

Cited By (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102435905A (en) * 2011-12-31 2012-05-02 昆山圣泰机电制造有限公司 Aging tester for elevator button circuit board
CN103048609A (en) * 2012-12-19 2013-04-17 昆山迈致治具科技有限公司 PCB (Printed Circuit Board) test jig with air blowing function
CN103091623B (en) * 2013-01-18 2015-09-30 宁波三星智能电气有限公司 FCT multistation test machine
CN103091624A (en) * 2013-01-18 2013-05-08 宁波三星电气股份有限公司 Test method based on final circular test (FCT) multi-station test device
CN103091623A (en) * 2013-01-18 2013-05-08 宁波三星电气股份有限公司 Final circular test (FCT) multi-station test machine
CN103091624B (en) * 2013-01-18 2015-09-30 宁波三星智能电气有限公司 Based on the method for testing of FCT multistation proving installation
CN103454574A (en) * 2013-08-16 2013-12-18 安徽鑫龙电器股份有限公司 Static testing device for circuit board
CN103618897B (en) * 2013-10-31 2015-07-15 四川长虹电器股份有限公司 A testing device of a machine core main board of a TV integrated machine
CN103618897A (en) * 2013-10-31 2014-03-05 四川长虹电器股份有限公司 A testing device of a machine core main board of a TV integrated machine
CN103856964A (en) * 2014-03-13 2014-06-11 博威科技(深圳)有限公司 Device for testing and calibrating Femto
CN103823173A (en) * 2014-03-17 2014-05-28 青岛海信电器股份有限公司 Remote control board yoke plate test equipment
CN104459530A (en) * 2014-12-22 2015-03-25 广州创维平面显示科技有限公司 Keying board tester and keying board test device
CN104459530B (en) * 2014-12-22 2018-02-16 广州创维平面显示科技有限公司 Keying panel tester and key-controlled board measuring device
CN104614618A (en) * 2015-02-07 2015-05-13 刘刚 Semi-automatic interchange equipment for testing electrical performance and testing method thereof
CN104614618B (en) * 2015-02-07 2018-01-30 深圳市强瑞电子有限公司 The semi-automatic switchgear and its method of testing of electrical testing
CN105093044A (en) * 2015-09-14 2015-11-25 苏州博众精工科技有限公司 Needle loading board module test mechanism
CN105093044B (en) * 2015-09-14 2018-06-05 博众精工科技股份有限公司 A kind of pin support plate module mechanism for testing
CN106597248A (en) * 2015-10-16 2017-04-26 惠州Tcl移动通信有限公司 Spliced plate detection device
CN106597248B (en) * 2015-10-16 2019-11-29 惠州Tcl移动通信有限公司 A kind of jigsaw detection device
CN107850637A (en) * 2016-03-18 2018-03-27 深圳市艾励美特科技有限公司 A kind of electronic product testing jig
CN106885968A (en) * 2017-03-17 2017-06-23 广东长盈精密技术有限公司 Continuity test fixture
CN107271781A (en) * 2017-07-25 2017-10-20 江苏凯尔生物识别科技有限公司 A kind of fingerprint module automatic impedance-testing device
CN108693470A (en) * 2018-06-20 2018-10-23 广东美的厨房电器制造有限公司 The detection device of thin film switch
CN110455174A (en) * 2019-08-01 2019-11-15 福州国化智能技术有限公司 An automatic measuring device for rod flexibility
CN110596573A (en) * 2019-10-12 2019-12-20 苏州恒河激光科技有限公司 A detection device for FPC
CN111077431A (en) * 2019-12-30 2020-04-28 浙江力创自动化科技有限公司 Electrical property detection equipment of control circuit board
CN111812444A (en) * 2020-08-07 2020-10-23 常州敏杰电器有限公司 An inspection box testing device
CN112285539A (en) * 2020-12-30 2021-01-29 南京亚尔软件测试有限公司 IED flexible testing front-end adapter suitable for automatic taking and placing
CN117330801A (en) * 2023-10-19 2024-01-02 深圳市兆兴博拓科技股份有限公司 Circuit board testing device, debugging method and debugging system
CN117330801B (en) * 2023-10-19 2024-02-20 深圳市兆兴博拓科技股份有限公司 Circuit board testing device, debugging method and debugging system

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