CN101876685B - Circuit parameter multi-point tester - Google Patents
Circuit parameter multi-point tester Download PDFInfo
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- CN101876685B CN101876685B CN2009100222307A CN200910022230A CN101876685B CN 101876685 B CN101876685 B CN 101876685B CN 2009100222307 A CN2009100222307 A CN 2009100222307A CN 200910022230 A CN200910022230 A CN 200910022230A CN 101876685 B CN101876685 B CN 101876685B
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- 238000012360 testing method Methods 0.000 claims abstract description 73
- 239000011159 matrix material Substances 0.000 abstract description 9
- 239000002699 waste material Substances 0.000 abstract description 3
- 230000007547 defect Effects 0.000 abstract 1
- 238000000034 method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000004807 localization Effects 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
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Abstract
The invention relates to a circuit parameter multi-point tester which comprises at least one circuit parameter multi-point testing apparatus, an analogue bus, a multi-way switch group and a commutator, wherein the multi-way switch group comprises a plurality of multi-way switches; and the commutator is used for connecting the multi-way switches and circuits to be tested. The circuit parameter multi-point tester also comprises an apparatus end matrix switch which is used for gating between an apparatus test wire and the analogue bus; and each multi-way switch comprises an analogue bus connecting switch and a circuit connecting switch, and the analogue bus connecting switch of the multi-way switch group and the analogue bus form a circuit end matrix switch which is used for realizing the switching of a test loop among different circuits to be tested. The invention solves the defects of poor expansibility of the testing apparatus in the circuit parameter test, incapability of simultaneously working of a plurality of testing apparatuses, waste and inflexible test, and has the advantages of strong expansibility and flexible topological structure.
Description
Technical field
The present invention relates to the virtual instrument technique field, is a kind of circuit parameter multi-point tester device.
Background technology
Existing parametric test circuit instrument, some adopts matrix switch, but the waste that has brought number of switches, some adopts multi-way switch, but has brought the inflexible shortcoming of test.In addition, the extendability of parametric test circuit instrument is poor, and many testing tools can not be worked simultaneously.
Summary of the invention
It is poor that the object of the invention is to overcome in the parametric test circuit testing tool extendability; Many testing tools can not be worked simultaneously; Inflexible shortcoming of the waste of the number of switches of only bringing with matrix switch and the test that only brings with multi-way switch provides that a kind of extendability is strong, the open flexibly circuit parameter multi-point tester of topological structure.
Technical solution of the present invention is:
A kind of circuit parameter multi-point tester; Comprise at least one parametric test circuit instrument 1, emulation bus 2, multi-way switch group, breakout box 6; Said multi-way switch group comprises a plurality of multi-way switchs 5; Said breakout box 6 is used to connect multi-way switch 5 and circuit-under-test 9; Its special character is: said circuit parameter multi-point tester also comprises instrument end moment battle array switch 4, and the gating that said instrument end moment battle array switch 4 is used between instrument test line 8 and the emulation bus 2, said each multi-way switch 5 comprise that emulation bus connects switch 51 and is connected switch 52 with circuit; The emulation bus of said multi-way switch group connects switch 51, emulation bus 2 built-up circuit end moment battle array switches 7, and said circuit connects switch 52 and is used to realize the switching of test loop between different circuit-under-tests 9.
Foregoing circuit parameter testing instrument 1 comprises a kind of or any several kinds combination in multimeter, insulativity tester, the Hi-pot Tester.
Foregoing circuit parameter testing instrument 1 comprises a kind of or any several kinds combination in multimeter, signal source, oscillograph, insulativity tester, the Hi-pot Tester.
Above-mentioned emulation bus 2 also comprises expansion emulation bus 3.
The present invention has the following advantages:
1, the present invention can realize any expansion of multiple test function through the combination of testing tool, instrument end moment battle array switch; Can realize any expansion of the number of test points of multi-channel test through the quantity that increases multi-way switch;
2, the present invention can realize that many testing tools test simultaneously.
3, the present invention is particularly suitable for the maintenance and the localization of fault of various circuit in main equipment and the system, can be applicable in the fields such as boats and ships, space flight, aviation, large test system and automatic factory.
Description of drawings
Fig. 1 is the structural representation block diagram of the utility model multi-core cable tester;
Fig. 2 is the topology diagram of the utility model multi-core cable tester;
Wherein: 1-parametric test circuit instrument, the 2-emulation bus, 3-expands emulation bus, 4-instrument end moment battle array switch; The 5-multi-way switch, the 51-emulation bus connects switch, and the 52-circuit connects switch, 6-breakout box; 7-circuit end matrix switch, 8-instrument test line, 9-circuit-under-test.
Embodiment
The composition of circuit parameter multi-point tester of the present invention is as depicted in figs. 1 and 2, is made up of many parametric test circuit instruments 1, instrument end moment battle array switch 4, circuit end matrix switch 7, circuit connection switch 52, breakout box 6.Testing tool is used for realizing the test of each performance parameter of circuit-under-test, comprises multimeter, signal source, oscillograph, insulativity tester, Hi-pot Tester etc., also can be according to other parameter tester of increase in demand.Instrument end moment battle array switch is used for realizing that with the circuit end matrix switch being strobed into different circuits to the test lead of testing tool is connected switch 52.Left-hand component is instrument end moment battle array switch, is formed by connecting through switch on the instrument test line of emulation bus and testing tool; Right-hand component is the circuit end matrix switch, is connected switch 51 with emulation bus emulation bus and is formed by connecting.The quantity of emulation bus is by maximum p-wire number decisions of the testing tool of working simultaneously, the method that the test of Other Instruments then adopts emulation bus to share.Circuit connects switch 52 and is used for realizing the switching of test loop between the different test point of circuit-under-test.In the test of 2 lines, be connected respectively to two circuit to the two ends of circuit-under-test and connect on the switch; In the test of 4 lines,, be connected respectively to four circuit to each end of circuit-under-test and connect on the switch according to the method for 4 lines test; Also can be connected respectively to a plurality of circuit to a plurality of circuit and connect on the switch, a plurality of circuit-under-tests are tested simultaneously; Can connect switch to a plurality of circuit and merge, form the more circuit of passage and connect switch.Breakout box is used for realizing that circuit connects the connection between switch and the circuit-under-test.
The present invention utilizes circuit test instrument, matrix switch and multi-way switch to realize the function of circuit parameter multi-point sampler; Main effect is that electric parameter, conduction, insulativity and the index such as withstand voltage to various circuit detects, and can be the localization of fault of circuit on concrete test point.Testing tool of the present invention can be expanded arbitrarily, can be strobed into the test lead of testing tool between the different test points, so can realize the switching of test loop between different test points.
If the quantity of emulation bus of the present invention is selected 4 for use, then can carry out the test of 2 lines and the test of 4 lines of circuit parameter; Multi-way switch selects for use 81 to select 24 multi-way switchs, can realize that 2 lines test the test of maximum 80 dot circuits and the test that 4 lines are tested maximum 40 dot circuits, and can realize that two 2 line testing tools carry out work simultaneously.The quantity of emulation bus shown in Figure 2 is 5, and the quantity of expansion emulation bus is 2.But the present invention's measuring point number equals the port number of multi-way switch deducts the emulation bus number.
The present invention can be used for the parameter and the performance test of polycore cable.
Claims (4)
1. circuit parameter multi-point tester; Comprise at least one parametric test circuit instrument (1), emulation bus (2), multi-way switch group, breakout box (6); Said multi-way switch group comprises a plurality of multi-way switchs (5); Said breakout box (6) is used to connect multi-way switch (5) and circuit-under-test (9); It is characterized in that: said circuit parameter multi-point tester also comprises instrument end moment battle array switch (4), and said instrument end moment battle array switch (4) is used for the gating between instrument test line (8) and the emulation bus (2), and said each multi-way switch (5) comprises that emulation bus connects switch (51) and is connected switch (52) with circuit; The emulation bus of said multi-way switch group connects switch (51), emulation bus (2) built-up circuit end moment battle array switch (7), and said circuit connects switch (52) and is used to realize the switching of test loop between different circuit-under-tests (9).
2. circuit parameter multi-point tester according to claim 1 is characterized in that: said parametric test circuit instrument (1) comprises a kind of or any several kinds combination in multimeter, insulativity tester, the Hi-pot Tester.
3. circuit parameter multi-point tester according to claim 1 is characterized in that: said parametric test circuit instrument (1) comprises a kind of or any several kinds combination in multimeter, signal source, oscillograph, insulativity tester, the Hi-pot Tester.
4. according to claim 1 or 2 or 3 described circuit parameter multi-point testers, it is characterized in that: said emulation bus (2) also comprises expansion emulation bus (3).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009100222307A CN101876685B (en) | 2009-04-28 | 2009-04-28 | Circuit parameter multi-point tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009100222307A CN101876685B (en) | 2009-04-28 | 2009-04-28 | Circuit parameter multi-point tester |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101876685A CN101876685A (en) | 2010-11-03 |
| CN101876685B true CN101876685B (en) | 2012-07-04 |
Family
ID=43019294
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009100222307A Expired - Fee Related CN101876685B (en) | 2009-04-28 | 2009-04-28 | Circuit parameter multi-point tester |
Country Status (1)
| Country | Link |
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| CN (1) | CN101876685B (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102096036B (en) * | 2010-12-03 | 2013-12-11 | 华东光电集成器件研究所 | Device for testing integrated triode array circuit |
| CN102445614B (en) * | 2011-09-30 | 2015-01-21 | 苏州工业园区世纪福科技有限公司 | Universal signal routing system for electronic product function test |
| CN104965133A (en) * | 2015-06-03 | 2015-10-07 | 北京浩正泰吉科技有限公司 | 1553B data bus network test system |
| CN105510736B (en) * | 2015-11-26 | 2019-03-12 | 北京东方计量测试研究所 | A kind of test macro and method of satellite borne equipment |
| CN105487033B (en) * | 2016-01-11 | 2018-09-21 | 无锡市计量测试院 | The calibrating installation of wire test instrument |
| CN109725240B (en) * | 2018-11-16 | 2021-10-12 | 中国兵器工业集团江山重工研究院有限公司 | General electric strength detection device |
| CN111025046B (en) * | 2019-11-25 | 2023-07-14 | 上海科梁信息科技股份有限公司 | Test system, method for controlling matrix switch and storage medium |
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2009
- 2009-04-28 CN CN2009100222307A patent/CN101876685B/en not_active Expired - Fee Related
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| Publication number | Publication date |
|---|---|
| CN101876685A (en) | 2010-11-03 |
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| PB01 | Publication | ||
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| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
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| PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: Circuit parameter multi-point tester Effective date of registration: 20171108 Granted publication date: 20120704 Pledgee: Bank of Xi'an Limited by Share Ltd. West Branch Pledgor: SHAANXI HITECH ELECTRONIC Co.,Ltd. Registration number: 2017610000140 |
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| PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120704 |
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| CF01 | Termination of patent right due to non-payment of annual fee |