CN101871956A - Test clamp - Google Patents
Test clamp Download PDFInfo
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- CN101871956A CN101871956A CN200910135370A CN200910135370A CN101871956A CN 101871956 A CN101871956 A CN 101871956A CN 200910135370 A CN200910135370 A CN 200910135370A CN 200910135370 A CN200910135370 A CN 200910135370A CN 101871956 A CN101871956 A CN 101871956A
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Abstract
The invention relates to a test clamp which comprises a public test board, a single test board for elements to be tested and a bearing seat, wherein the public test board comprises a plurality of groups of public test channels, and each group of public test channels comprise a plurality of public signal end points for receiving test signals; the single test board for elements to be tested is provided with a plurality of first signal end points according to the arrangement of pins of an element to be tested, is provided with a plurality of second signal end points according to the arrangement of public signal end points in a public test channel, and is provided with a plurality of leads electrically connected with corresponding first and second signal end points; and the bearing seat can be used for connecting the pins of the element to be tested to the corresponding first signal end point. The test clamp of the invention can improve the test efficiency and the test accuracy.
Description
Technical field
The present invention is relevant to a kind of test fixture, refers to the test fixture of a kind of high-level efficiency and pin-point accuracy especially.
Background technology
Along with development of science and technology, the kind of electronic product and production quantity are also more and more, and the volume production process of each part comprises different flow processs such as circuit design, wafer production/test, component package/test and product assembling in the electronic product.In order to filter out defective products ahead of time saving production cost, and guarantee that final electronic product meets the specification requirement of various applications, the element test stage is quite important.In existing testing process, can (device under test DUT) be arranged on the test board (test board), transmits test signal to element under test and measurement by tester table again with element under test.Be typically provided with many functional holes on the test board, be used for installing chip and other electron component, or be used for as the signal end.According to the kind of element under test, generally can on test board, make lead, to electrically connect each functional hole of carrying element under test and acceptance test signal according to the particular electrical circuit layout.
Please refer to Fig. 1, Fig. 1 is the vertical view of a test fixture 100 in the prior art.Test fixture 100 comprises a test board 10 and a load bearing seat 16.Load bearing seat 16 is arranged on the test board 10, comprises a plurality of spliced eyes, and the quantity of spliced eye and position are designed according to the pin of a specific element under test.Test board 10 is provided with a plurality of public test channel 15 in the peripheral region on surface, and public test channel 15 is electrically connected to the spliced eye of load bearing seat 16 by many leads 18.Therefore, as long as element under test is inserted load bearing seat 16, the test signal that tester table is exported just public test channel 15, lead 18 and the load bearing seat 16 of energy test clamp 100 is sent to element under test.The test fixture 100 of prior art is according to certain specific element under test amount body design, and can't test the element under test of other kind.Yet electronic product is of a great variety, and its circuit design, product specification or mode of operation also differ widely.Because test board involves great expense, if the element under test of each type is all measured body design test anchor clamps 100, and considering substantially of reducing production costs when not meeting volume production.
Please refer to Fig. 2 and Fig. 3, Fig. 2 is the synoptic diagram of another test fixture 200 upper surfaces in the prior art, and Fig. 3 is the synoptic diagram of test fixture 200 lower surfaces.Test fixture 200 comprises a public test board 20 and a load bearing seat 26.Load bearing seat 26 is arranged on the public test board 20, comprises a plurality of slots and pin, and the quantity of slot and pin and position are designed according to the pin of certain specific element under test.Public test board 20 comprises 4 groups of public test channel 21～24 and a plurality of connection end point 25.Public test channel 21～24 is arranged on the peripheral region on public test board 20 surfaces in the mode of symmetric circuit layout, and each is organized public test channel and comprises a plurality of global semaphore end points, but the test signal that the acceptance test board transmits.Connection end point 25 is positioned at the centerablock on public test board 200 surfaces.Before testing, at first the pin with load bearing seat 26 is welded in suitable connection end point 25, utilize artificial backguy 28 that the connection end point 25 of the pin whereabouts of load bearing seat 26 is electrically connected to global semaphore end points (as shown in Figure 3) suitable in the public test channel 21～24 again, again element under test is inserted load bearing seat 26 at last.Therefore, when testing, the test signal that tester table is exported just public test channel 21～24, artificial backguy 28 and the load bearing seat 26 of energy test clamp 200 is sent to element under test.
The test fixture 200 of prior art comprises a plurality of connection end points 25, applicable to the load bearing seat 26 that designs at different types of element under test.Yet, all backguys again when at every turn testing different product, time and effort consuming not only, the accuracy when artificial welding quality also can have influence on test.On the other hand, the distribution tool symmetry of global semaphore end points, that is in test during specific element under test in fact only need be used in the public test channel 21～24 wherein one group.Yet because manually backguy 28 needs than large space, so test fixture 200 can't hold a plurality of load bearing seats 26, testable element under test limited amount, the complexity effect of tested person circuit easily.If will carry out a plurality of determinand tests, needed artificial span wire system is quite complicated, and entire making process is very consuming time, and also needs time and effort consuming ground to carry out debug (debug) after completing.The test fixture 200 of prior art needs higher solder technology and expends more manpower, and testing efficiency is not good.
Summary of the invention
The invention provides the test fixture of a kind of high-level efficiency and pin-point accuracy, it comprises a public test board (test board), one first test board and one first load bearing seat.This public test board comprises the public test channel of many groups, and each is organized public test channel and comprises a plurality of global semaphore end points, is used for the acceptance test signal; This first test board is used for testing one first element under test.This first test board comprises a plurality of first signal ends, and its pin layout according to this first element under test is arranged on this first test board, is used for transmitting test signal corresponding pin to this first element under test respectively; A plurality of secondary signal end points, corresponding to one first group of public test channel in the public test channel of these many groups, and the layout according to global semaphore end points in this first group of public test channel is arranged on this first test board, is used for receiving this first group of test signal that public test channel transmits respectively; Many first leads are used for electrically connecting corresponding first signal end and secondary signal end points respectively.This first load bearing seat comprises a plurality of slots, is used for carrying the pin of this first element under test; And a plurality of pins, be connected to corresponding first signal end in this first test board respectively.
Test fixture of the present invention, the public test channel of these many groups is arranged on this public test board with the symmetrical expression layout type.
Test fixture of the present invention, the no more than numbers that should organize all global semaphore end points in the public test channel of the number of these a plurality of secondary signal end points more; The number of global semaphore end points in no more than this first group of public test channel of the number of these a plurality of secondary signal end points.
Test fixture of the present invention, the number of these a plurality of secondary signal end points is no less than the number of these a plurality of first signal ends.
Test fixture of the present invention, the number of these a plurality of first signal ends are no less than the pin number of this first element under test.
Test fixture of the present invention, this test fixture also comprises: one second test board, be used for testing one second element under test, this second test board comprises: a plurality of the 3rd signal ends, pin layout according to this second element under test is arranged on this second test board, is used for transmitting test signal corresponding pin to this second element under test respectively; A plurality of the 4th signal ends, corresponding to one second group of public test channel in the public test channel of these many groups, and the layout according to global semaphore end points in this second group of public test channel is arranged on this second test board, is used for receiving this second group of test signal that public test channel transmits respectively; Many second leads are used for electrically connecting corresponding the 3rd signal end and the 4th signal end respectively; And one second load bearing seat, this second load bearing seat comprises; A plurality of slots are used for carrying the pin of this second element under test; And a plurality of pins, be connected to corresponding the 3rd signal end in this second test board respectively.
Test fixture of the present invention, the no more than numbers that should organize all global semaphore end points in the public test channel of the number of these a plurality of the 4th signal ends more; The number of global semaphore end points in no more than this second group of public test channel of the number of these a plurality of the 4th signal ends; The number of these a plurality of the 4th signal ends is no less than the number of these a plurality of the 3rd signal ends.
Test fixture of the present invention, the number of these a plurality of the 3rd signal ends are no less than the pin number of this second element under test.
Test fixture of the present invention, the area of the area of this first test board and this second test board is not more than the area of this public test board; And this first test board and this second test board tool equal area.
Test fixture of the present invention, this first test board, this second test board and this public test board be printed circuit board (PCB) (printed circuit board, PCB).
Test clip prodigiosin of the present invention improves testing efficiency and accuracy.
Description of drawings
Fig. 1 is the vertical view of a test fixture in the prior art.
Fig. 2 is the synoptic diagram of another test fixture upper surface in the prior art.
Fig. 3 is the synoptic diagram of the test fixture lower surface of Fig. 2.
Fig. 4 is the vertical view of a test fixture in the first embodiment of the invention.
Fig. 5 is the enlarged diagram of the single element under test test board of the present invention.
Fig. 6 is the vertical view of a test fixture in the second embodiment of the invention.
Fig. 7 is the vertical view of a test fixture in the third embodiment of the invention.
Embodiment
Please refer to Fig. 4, Fig. 4 is the vertical view of a test fixture 300 in the first embodiment of the invention.Test fixture 300 comprises public test board 30, one a single element under test test board 40 and a load bearing seat 36.Load bearing seat 36 is arranged on the single element under test test board 40, comprises a plurality of slots and pin, and the quantity of slot and pin and position are designed according to the pin of a specific element under test.Public test board 30 comprises 4 groups of public test channel 31～34 and a plurality of connection end point 35.Public test channel 31～34 is arranged at the peripheral region on public test board 30 surfaces in the mode of symmetric circuit layout, and each is organized public test channel and comprises a plurality of global semaphore end points, but the test signal that the acceptance test board transmits.Connection end point 35 is arranged at the centerablock on public test board 300 surfaces.Load bearing seat 36 comprises a plurality of slots and pin, and the quantity of slot and pin and position are designed according to the pin of certain specific element under test, therefore as long as specific element under test is inserted in the slot of load bearing seat 36, can transmit signal by the pin of load bearing seat 36.
Please refer to Fig. 5, Fig. 5 is the enlarged diagram of the single element under test test board 40 of the present invention.Single element under test test board 40 comprises a plurality of first signal ends 41, a plurality of secondary signal end points 42 and many leads 48.The number of first signal end 41 and position are designed according to the pin of load bearing seat 36, therefore the pin of load bearing seat 36 can be welded in corresponding first signal end 41.The distribution tool symmetry of global semaphore end points, that is when the specific element under test of test, in fact only need use in the public test channel 31～34 wherein one group, therefore the number and the position of secondary signal end points 42 can be designed according to the layout of interior the global semaphore end points of a public test channel (for example public test channel 31), therefore can be welded in corresponding global semaphore end points on the public test board 30 in required signal end when testing element under test in the secondary signal end points 42.On the other hand, lead 48 can be electrically connected to corresponding first signal end 41 in required signal end during element under test with test in the secondary signal end points 42.In other words, the test signal of tester table is sent to element under test by the pin of global semaphore end points, secondary signal end points 42, lead 48, first signal end 41 and the load bearing seat 36 of public test board 30.
Please refer to Fig. 6, Fig. 6 is the vertical view of a test fixture 400 in the second embodiment of the invention.Test fixture 400 comprises public test board 30, two single element under test test boards 40 and two load bearing seats 36.The second embodiment of the invention and first example structure are similar, difference is that the test fixture 400 of second embodiment comprises two groups of identical single element under test test board and load bearing seats, can test the element under test of two same-types when therefore testing simultaneously at every turn.According to the configuration of test fixture among Fig. 6 400, multipotency is tested the element under test of four same-types simultaneously when testing at every turn.Yet the present invention also can adopt other configuration, to test the element under test of other quantity same-type simultaneously.
Please refer to Fig. 7, Fig. 7 is the vertical view of a test fixture 500 in the third embodiment of the invention.Test fixture 500 comprises a public test board 30, single element under test test board 40 and 50, and two load bearing seats 36 and 46.Single element under test test board 40,50 and similar Fig. 4 of load bearing seat 36,46 and embodiment shown in Figure 5, wherein single element under test test board 40 and load bearing seat 36 design according to one first element under test, and single element under test test board 50 and load bearing seat 46 designs according to one second element under test, so the number of signal end and position or the layout of single element under test test board upper conductor may be different on the number of load bearing seat slot/pin and position, the single element under test test board.The third embodiment of the invention and first example structure are similar, difference is that the test fixture 500 of the 3rd embodiment comprises two groups of different single element under test test board and load bearing seats, can test two dissimilar element under tests simultaneously when therefore testing at every turn.According to the configuration of test fixture among Fig. 7 500, multipotency is tested four dissimilar element under tests simultaneously when testing at every turn.Yet the present invention also can adopt other configuration, to test the dissimilar element under test of other quantity simultaneously.
In test fixture of the present invention, the quantity of each signal end and distribute can be according to tester table or element under test kind and different.In preferred embodiment of the present invention, on the public test board sum of global semaphore end points more than or equal the sum of secondary signal end points on the single element under test test board, the number of global semaphore end points in one group of public test channel wherein on the total no more than public test board of secondary signal end points on the single element under test test board, the sum of secondary signal end points is no less than the sum of first signal end on the single element under test test board, and the sum of first signal end is no less than the pin number of load bearing seat on the single element under test test board.Yet Fig. 4 does not limit category of the present invention to the structure that embodiment shown in Figure 7 only illustrates test fixture of the present invention.In addition, the single element under test test board of the present invention and this public test board can be printed circuit board (PCB) (printed circuit board, PCB), the area of single element under test test board is not more than the area of public test board, and its external form can be as Fig. 4 to fan type shown in Figure 7, or other shape.
The present invention is directed to specific element under test and come amount body design load bearing seat and single element under test test board, promptly be arranged on the public test board by simple welding, allow different types of element under test all can use same public test board, therefore the invention provides a kind of test fixture that can improve testing efficiency and accuracy.
The above only is preferred embodiment of the present invention; so it is not in order to limit scope of the present invention; any personnel that are familiar with this technology; without departing from the spirit and scope of the present invention; can do further improvement and variation on this basis, so the scope that claims were defined that protection scope of the present invention is worked as with the application is as the criterion.
Being simply described as follows of symbol in the accompanying drawing:
10: test board
20,30: public test board
28: backguy
18,48: lead
25,35: connection end point
41: the first signal end points
42: the secondary signal end points
40,50: single element under test test board
16,26,36,46: load bearing seat
100,200,300,400,500: test fixture
15,21～24,31～34: public test channel.
Claims (10)
1. a test fixture is characterized in that, this test fixture comprises:
One public test board, this public test board comprises:
The public test channel of many groups, each is organized public test channel and comprises a plurality of global semaphore end points, and described a plurality of global semaphore end points are used for the acceptance test signal;
One first test board is used for testing one first element under test, and this first test board comprises:
A plurality of first signal ends are arranged on this first test board according to the pin layout of this first element under test, are used for transmitting test signal corresponding pin to this first element under test respectively;
A plurality of secondary signal end points, corresponding to one first group of public test channel in the public test channel of these many groups, and the layout according to global semaphore end points in this first group of public test channel is arranged on this first test board, is used for receiving this first group of test signal that public test channel transmits respectively;
Many first leads are used for electrically connecting corresponding first signal end and secondary signal end points respectively; And
One first load bearing seat, this first load bearing seat comprises:
A plurality of slots are used for carrying the pin of this first element under test; And
A plurality of pins are connected to corresponding first signal end in this first test board respectively.
2. test fixture according to claim 1 is characterized in that, the public test channel of these many groups is arranged on this public test board with the symmetrical expression layout type.
3. test fixture according to claim 1 is characterized in that, the no more than numbers that should organize all global semaphore end points in the public test channel of the number of these a plurality of secondary signal end points more; The number of global semaphore end points in no more than this first group of public test channel of the number of these a plurality of secondary signal end points.
4. test fixture according to claim 1 is characterized in that the number of these a plurality of secondary signal end points is no less than the number of these a plurality of first signal ends.
5. test fixture according to claim 1 is characterized in that, the number of these a plurality of first signal ends is no less than the pin number of this first element under test.
6. test fixture according to claim 1 is characterized in that, this test fixture also comprises:
One second test board is used for testing one second element under test, and this second test board comprises:
A plurality of the 3rd signal ends are arranged on this second test board according to the pin layout of this second element under test, are used for transmitting test signal corresponding pin to this second element under test respectively;
A plurality of the 4th signal ends, corresponding to one second group of public test channel in the public test channel of these many groups, and the layout according to global semaphore end points in this second group of public test channel is arranged on this second test board, is used for receiving this second group of test signal that public test channel transmits respectively;
Many second leads are used for electrically connecting corresponding the 3rd signal end and the 4th signal end respectively; And
One second load bearing seat, this second load bearing seat comprises;
A plurality of slots are used for carrying the pin of this second element under test; And
A plurality of pins are connected to corresponding the 3rd signal end in this second test board respectively.
7. test fixture according to claim 6 is characterized in that, the no more than numbers that should organize all global semaphore end points in the public test channel of the number of these a plurality of the 4th signal ends more; The number of global semaphore end points in no more than this second group of public test channel of the number of these a plurality of the 4th signal ends; The number of these a plurality of the 4th signal ends is no less than the number of these a plurality of the 3rd signal ends.
8. test fixture according to claim 6 is characterized in that, the number of these a plurality of the 3rd signal ends is no less than the pin number of this second element under test.
9. test fixture according to claim 6 is characterized in that, the area of the area of this first test board and this second test board is not more than the area of this public test board; And this first test board and this second test board tool equal area.
10. test fixture according to claim 6 is characterized in that, this first test board, this second test board and this public test board are printed circuit board (PCB).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200910135370A CN101871956A (en) | 2009-04-24 | 2009-04-24 | Test clamp |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200910135370A CN101871956A (en) | 2009-04-24 | 2009-04-24 | Test clamp |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101871956A true CN101871956A (en) | 2010-10-27 |
Family
ID=42996942
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200910135370A Pending CN101871956A (en) | 2009-04-24 | 2009-04-24 | Test clamp |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101871956A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103869105A (en) * | 2012-12-11 | 2014-06-18 | 中芯国际集成电路制造(上海)有限公司 | General type test board |
-
2009
- 2009-04-24 CN CN200910135370A patent/CN101871956A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103869105A (en) * | 2012-12-11 | 2014-06-18 | 中芯国际集成电路制造(上海)有限公司 | General type test board |
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Application publication date: 20101027 |