CN101813862B - Liquid crystal display panel - Google Patents
Liquid crystal display panel Download PDFInfo
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- CN101813862B CN101813862B CN2010101766058A CN201010176605A CN101813862B CN 101813862 B CN101813862 B CN 101813862B CN 2010101766058 A CN2010101766058 A CN 2010101766058A CN 201010176605 A CN201010176605 A CN 201010176605A CN 101813862 B CN101813862 B CN 101813862B
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Abstract
The invention relates to a liquid crystal display panel, which comprises an active component array substrate, a counter substrate, a plurality of interstitial objects and a liquid crystal layer, wherein the active component array substrate is provided with a plurality of groups of limit structures, and each group of limit structures comprises first limit patterns and second limit patterns. The counter substrate is configured above the active component array substrate. The interstitial objects are configured on the counter substrate, are protruded to the active component array substrate and extend beside the first limit patterns and the second limit patterns; the displacement of each interstitial object is only limited by the first limit patterns or the second limit patterns; the displacement of part of interstitial objects along the first direction range is only limited by the first limit patterns, whereas the displacement of part of interstitial objects along the second direction range is only limited by the second limit patterns, and the first direction range and the second direction range are different. The liquid crystal layer is configured between the active component array substrate and the counter substrate. The liquid crystal display panel can limit the displacement of the interstitial objects, and thereby, malposition caused between the two substrates when the liquid crystal display panel is pushed or stressed is avoided.
Description
Technical field
The invention relates to a kind of display panel, and particularly about a kind of display panels.
Background technology
Display panels has that high image quality, volume are little, in light weight, low voltage drive, low consumpting power and advantages of wide application range, so it has become the main flow of display panel of new generation.Traditional display panels is to be made up of the liquid crystal layer (liquidcrystal layer) that an active assembly array substrate (active device array substrate), a colored optical filtering substrates (color filter) and are disposed between this two substrates.Wherein, also be provided with separation material (photo spacer) between colored optical filtering substrates and the active assembly array substrate, to keep the gap (cell gap) between the two substrates and to control the thickness of liquid crystal layer.
In general, influence the aperture opening ratio of display panels, can separation material be arranged on around the sweep trace of black matrix and active assembly array substrate of colored optical filtering substrates for fear of separation material.Yet, when display panels is pressed or receive stress, may produce relative displacement between colored optical filtering substrates and the active assembly array substrate, make the light that is covered by black matrix originally spill.Thus, display panels has the phenomenon generation that shows uneven (mura).Particularly; Owing to have powerful electric field around the sweep trace usually; Therefore the liquid crystal molecule that is positioned at here has chaotic toppling direction; So when producing relative displacement between colored optical filtering substrates and the active assembly array substrate, the light leak here can produce serious influence to the display effect of display panels.
Summary of the invention
The object of the present invention is to provide a kind of display panels, can avoid misplacing between the two substrates through the displacement of restriction separation material.
The present invention proposes a kind of display panels, and it comprises an active assembly array substrate, a subtend substrate, a plurality of separation material and a liquid crystal layer.Active assembly array substrate has many group position limiting structures, and each is organized position limiting structure and comprises one first spacing pattern and one second spacing pattern.The subtend substrate is disposed at the active assembly array substrate top.A plurality of separation materials are disposed on the subtend substrate; Wherein separation material is outstanding towards active assembly array substrate; And extend to by the first spacing pattern and the second spacing pattern; Wherein the displacement of each separation material only receives wherein one first spacing pattern or wherein one second spacing pattern restriction; The first spacing pattern only limits the displacement of part separation material along a first direction scope, and the second spacing pattern only limits the displacement of part separation material along a second direction scope, and the first direction scope is different with the second direction scope.Liquid crystal layer is disposed between active assembly array substrate and the subtend substrate.
Based on above-mentioned, the position limiting structure of display panels of the present invention can limit the displacement of separation material, misplaces to avoid display panels to be pressed or to cause between the two substrates when receiving stress.Thus, can avoid the light leakage phenomena of display panels, make display panels have good display quality.
Description of drawings
Figure 1A is for looking synoptic diagram on the display panels of one embodiment of the invention;
Figure 1B is the partial cutaway schematic of Figure 1A along I-I ' line;
Fig. 2 is for looking synoptic diagram on the display panels of one embodiment of the invention;
Fig. 3 is for looking synoptic diagram on the display panels of one embodiment of the invention;
Fig. 4 is for looking synoptic diagram on the display panels of one embodiment of the invention;
Fig. 5 is for looking synoptic diagram on the display panels of one embodiment of the invention;
Fig. 6 is for looking synoptic diagram on the display panels of one of the present invention embodiment;
Fig. 7 is for looking synoptic diagram on the display panels of one embodiment of the invention;
Fig. 8 is for looking synoptic diagram on the display panels of one embodiment of the invention;
Fig. 9 is for looking synoptic diagram on the display panels of one embodiment of the invention;
Figure 10 is for looking synoptic diagram on the display panels of one embodiment of the invention;
Figure 11 is for looking synoptic diagram on the display panels of one embodiment of the invention;
Figure 12 is for looking synoptic diagram on the display panels of one embodiment of the invention;
Figure 13 is for looking synoptic diagram on the display panels of one embodiment of the invention.
[primary clustering symbol description]
100: display panels
110: active assembly array substrate
112: substrate
114: signal wire
116: sweep trace
116a, 116b, 118a, 118b, 120a, 120b: side
118: data line
120: common line
122: sub-pixel
124: driving component
124c: channel layer
124d: drain electrode
124g: grid
124s: source electrode
126: pixel electrode
130: position limiting structure
131,133: breach
132,134,136,138: spacing pattern
140: the subtend substrate
150: separation material
160: liquid crystal layer
170: intend distribution (dummy lines)
180: graphoid case (dummy patterns)
D1, D2, D3, D4: direction scope
Embodiment
Figure 1A is for looking synoptic diagram on the display panels of one embodiment of the invention, and Figure 1B be the partial cutaway schematic of Figure 1A along I-I ' line, and for graphic clear, omission subtend substrate and liquid crystal layer illustrates in Figure 1A.Please be simultaneously with reference to Figure 1A and Figure 1B; The display panels 100 of present embodiment comprises an active assembly array substrate 110, a subtend substrate 140, a plurality of separation material 150 and a liquid crystal layer 160; Wherein active assembly array substrate 110 has many group position limiting structures 130, and each is organized position limiting structure 130 and comprises one first spacing pattern 132 and one second spacing pattern 134.Subtend substrate 140 is disposed at active assembly array substrate 110 tops.Liquid crystal layer 160 is disposed between active assembly array substrate 110 and the subtend substrate 140.A plurality of separation materials 150 are disposed on the subtend substrate 140; Wherein separation material 150 is outstanding towards active assembly array substrate 110; And extend to the first spacing pattern 132 and the second spacing pattern, 134 sides; Wherein the displacement of each separation material 150 only receives wherein one first spacing pattern 132 or wherein one second spacing pattern 134 restrictions; The first spacing pattern 132 only limits the displacement of part separation material 150 along a first direction scope D1, and the second spacing pattern 134 only limits the displacement of part separation material 150 along a second direction scope D2, and first direction scope D1 is different with second direction scope D2.What specify is; " first direction scope D1 is different with second direction scope D2 " can be read as first direction scope D1 and second direction scope D2 only has part direction scope to overlap, and also can be read as first direction scope D1 and second direction scope D2 does not overlap fully.
Please with reference to Figure 1A, in the present embodiment, active assembly array substrate 110 comprises a substrate 112, many signal line 114 and a plurality of sub-pixel 122.Signal wire 114 is disposed on the substrate 112, and signal wire 114 comprises multi-strip scanning line 116, many data lines 118 and many common lines 120.Sub-pixel 122 is disposed on the substrate 112 and with signal wire 114 and electrically connects.Careful; Sub-pixel 122 for example is to comprise driving component 124 and the pixel electrode 126 that electrically connects with driving component 124; Wherein driving component 124 comprises grid 124g, channel layer 124c, source electrode 124s and drain electrode 124d; Grid 124g and sweep trace 116 electrically connect, and source electrode 124s and data line 118 electrically connect, and drain electrode 124d and pixel electrode 126 electric connections.
In the present embodiment; The sweep trace 116 of a part for example is in order to as the first spacing pattern 132; And the sweep trace 116 of a part for example is in order to as the second spacing pattern 134, and separation material 150 extends to by the first spacing pattern 132 and the second spacing pattern 134.Careful, part separation material 150 for example is the first side 116a that extends to as the sweep trace 116 of the first spacing pattern 132, and part separation material 150 for example is the second side 116b that extends to as the sweep trace 116 of the second spacing pattern 134.Thus; The first spacing pattern 132 only limits the displacement of part separation material 150 along a first direction scope D1; And the second spacing pattern 134 only limits the displacement of part separation material 150 along a second direction scope D2; In other words, the displacement of separation material 150 only receives wherein one first spacing pattern 132 or wherein one second spacing pattern 134 restrictions.In the present embodiment, the bearing of trend of data line 118 is defined as 0 °, first direction scope D1 for example is 90 °～270 °, and second direction scope D2 for example is 270 °～450 °.In other words, the position limiting structure 130 that comprises the first spacing pattern 132 and the second spacing pattern 134 for example is to limit the displacement of separation material 150 in vertical direction, misplaces between active assembly array substrate 110 and the subtend substrate 140 avoiding.What specify is that in the present embodiment, multi-strip scanning line 116 and many common lines 120 for example are to be formed by first patterned conductive layer (Metal 1), and many data lines 118 for example are to be formed by second patterned conductive layer (Metal 2).In other words, the first spacing pattern 132 and the second spacing pattern 134 are to be formed by first patterned conductive layer (Metal 1).
Though be to be used as the first spacing pattern 132 and the second spacing pattern 134 is an example with sweep trace 116 in the embodiment shown in Figure 1A, the signal wire that can be used as spacing pattern is not limited in sweep trace.For instance; In another embodiment; As shown in Figure 2, in active assembly array substrate 110, the data line 118 of a part for example is in order to as the first spacing pattern 132; And the data line 118 of a part for example is in order to as the second spacing pattern 134, and separation material 150 extends to by the first spacing pattern 132 and the second spacing pattern 134.Careful, part separation material 150 for example is the first side 118a that extends to as the data line 118 of the first spacing pattern 132, and part separation material 150 for example is the second side 118b that extends to as the data line 118 of the second spacing pattern 134.Thus, the first spacing pattern 132 only limits the displacement of part separation material 150 along a first direction scope D1, and the second spacing pattern 134 only limits the displacement of part separation material 150 along a second direction scope D2.In the present embodiment, the bearing of trend of data line 118 is defined as 0 °, first direction scope D1 for example is that 0 °～180 ° and second direction scope D2 for example are 180 °～360 °.In other words, the position limiting structure 130 that comprises the first spacing pattern 132 and the second spacing pattern 134 for example is to limit separation material 150 displacement in the horizontal direction, misplaces between active assembly array substrate 110 and the subtend substrate 140 avoiding.What specify is that in the present embodiment, multi-strip scanning line 116 and many common lines 120 for example are to be formed by first patterned conductive layer (Metal 1), and many data lines 118 for example are to be formed by second patterned conductive layer (Metal 2).In other words, the first spacing pattern 132 and the second spacing pattern 134 are to be formed by second patterned conductive layer (Metal 2).
In another embodiment, as shown in Figure 3, in active assembly array substrate 110, the common line 120 of a part also can be in order to as the first spacing pattern 132, and the common line 120 of a part also can be in order to as the second spacing pattern 134.Careful, part separation material 150 for example is the first side 120a that extends to as the common line 120 of the first spacing pattern 132, and part separation material 150 for example is the second side 120b that extends to as the common line 120 of the second spacing pattern 134.Thus, the first spacing pattern 132 only limits the displacement of part separation material 150 along a first direction scope D1, and the second spacing pattern 134 only limits the displacement of part separation material 150 along a second direction scope D2.In the present embodiment, the bearing of trend of data line 118 is defined as 0 °, first direction scope D1 for example is 90 °～270 °, and second direction scope D2 for example is 270 °～450 °.In other words; The position limiting structure 130 that comprises the first spacing pattern 132 and the second spacing pattern 134 in the present embodiment for example is to limit the displacement of separation material 150 along vertical direction, misplaces between active assembly array substrate 110 and the subtend substrate 140 avoiding.What specify is that in the present embodiment, multi-strip scanning line 116 and many common lines 120 for example are to be formed by first patterned conductive layer (Metal 1), and many data lines 118 for example are to be formed by second patterned conductive layer (Metal 2).In other words, be to form in order to common line 120 by first patterned conductive layer (Metal 1) as the first spacing pattern 132 and the second spacing pattern 134.
In an embodiment again; As shown in Figure 4; In active assembly array substrate 110; Because sweep trace 116 is parallel setting with common line 120, therefore also can be to reach with a common line 120 as the second spacing pattern 134, with of the displacement of restriction separation material 150 as the first spacing pattern 132 along vertical direction with one scan line 116.In addition, position limiting structure 130 also can also comprise the data line 118 as the 3rd spacing pattern 136 and the 4th spacing pattern 138, with the displacement of restriction separation material 150 along horizontal direction.In other words, the first spacing pattern 132 only limits part separation material 150 and only limits part separation material 150 along displacement, the second spacing pattern 134 of a first direction scope D1 and only limit part separation material 150 along displacement, the 3rd spacing pattern 136 of a second direction scope D2 and only limit part separation material 150 displacement to scope D4 along a four directions along displacement and the 4th spacing pattern 138 of a third direction scope D3.In the present embodiment; The bearing of trend of data line 118 is defined as 0 °, and first direction scope D1 for example is that 270 °～450 °, second direction scope D2 for example are that 90 °～270 °, third direction scope D3 for example are that 0 °～180 ° and four directions for example are 180 °～360 ° to scope D4.In other words, comprise in the present embodiment that the position limiting structure 130 of spacing pattern 132,134,136,138 can limit the displacement of separation material 150 along vertical direction or horizontal direction, misplace between active assembly array substrate 110 and the subtend substrate 140 avoiding.What specify is that in the present embodiment, multi-strip scanning line 116 and many common lines 120 for example are to be formed by first patterned conductive layer (Metal 1), and many data lines 118 for example are to be formed by second patterned conductive layer (Metal 2).In other words, be to form in order to sweep trace 116 and common line 120 by first patterned conductive layer (Metal 1) as the first spacing pattern 132 and the second spacing pattern 134.In order to the data line 118 as the 3rd spacing pattern 136 and the 4th spacing pattern 138 is to be formed by second patterned conductive layer (Metal 2).
In the above embodiments; As the signal wire 114 of spacing pattern 132,134,136,138 can be in sweep trace 116, data line 118 and the common line 120 at least one; Wherein in sweep trace 116 and the common line 118 any both can be used as each other the spacing pattern 132,134 of collocation; With of the displacement of restriction separation material 150 along vertical direction; And any two data lines 118 can be used as the spacing pattern 136,138 of collocation each other, with the displacement of restriction separation material 150 along horizontal direction.Thus, when display panels 100 is pressed or receives stress, because therefore 132,134,136,138 restrictions of mobile limited pattern of separation material 150 can be avoided misplacing between active assembly array substrate 110 and the subtend substrate 140.Particularly; Because spacing pattern 132,134,136,138 can be avoided misplacing between active assembly array substrate 110 and the subtend substrate 140; Therefore can avoid spilling the liquid crystal molecule that is arranged in around the sweep trace 116, so can solve the demonstration inequality problem of display panel in the prior art.In other words, spacing pattern the light leakage phenomena that can further avoid display panels is set, make display panels have good display quality.
Fig. 5 for graphic clear, omits illustrating of subtend substrate and liquid crystal layer for looking synoptic diagram on the display panels of one embodiment of the invention among Fig. 5.Please with reference to Fig. 5, in the present embodiment, active assembly array substrate 110 comprises that a substrate 112, many signal line 114, many intend distribution 170 and a plurality of sub-pixel 122.Signal wire 114 is disposed on the substrate 112, and signal wire 114 comprises multi-strip scanning line 116, many data lines 118 and many common lines 120.Sub-pixel 122 electrically connects with signal wire 114.Intend distribution 170 and be disposed on the substrate 112, and the bearing of trend of plan distribution 170 for example is the bearing of trend that is parallel to sweep trace 116.In the present embodiment; Active assembly array substrate 110 has many group position limiting structures 130; Each is organized position limiting structure 130 and comprises one first spacing pattern 132 and one second spacing pattern 134; Wherein sweep trace 116 for example is in order to as the first spacing pattern 132, intends distribution 170 and for example is in order to as the second spacing pattern 134.Separation material 150 extends to the first spacing pattern 132 and the second spacing pattern, 134 sides; Thus; The first spacing pattern 132 only limits the displacement of part separation material 150 along a first direction scope D1, and the second spacing pattern 134 only limits the displacement of part separation material 150 along a second direction scope D2.In the present embodiment, the bearing of trend of data line 118 is defined as 0 °, first direction scope D1 for example is 90 °～270 °, and second direction scope D2 for example is 270 °～450 °.In other words, comprise that the position limiting structure 130 of the first spacing pattern 132 and the second spacing pattern 134 can limit the displacement of separation material 150 in vertical direction, misplace between active assembly array substrate 110 and the subtend substrate 140 avoiding.What specify is; In the present embodiment; Multi-strip scanning line 116, many common lines 120 and to intend distribution 170 for example be to be formed by first patterned conductive layer (Metal 1), and many data lines 118 for example are to be formed by second patterned conductive layer (Metal2).In other words, in order to as the sweep trace of the first spacing pattern 132 116 and in order to as the second spacing pattern 134 and to intend distribution 170 be to be formed by first patterned conductive layer (Metal 1).
Fig. 6 for graphic clear, omits illustrating of subtend substrate and liquid crystal layer for looking synoptic diagram on the display panels of one embodiment of the invention among Fig. 6.Active assembly array substrate 110 shown in Figure 6 is similar with active assembly array substrate 110 shown in Figure 5; Its main difference is in active assembly array substrate 110 and also comprises plan distribution 172, and the bearing of trend of intending distribution 172 for example is the bearing of trend that is parallel to data line 118.In the present embodiment, active assembly array substrate 110 has many group position limiting structures 130, and each is organized position limiting structure 130 and comprises one first spacing pattern 132, one second spacing pattern 134, one the 3rd spacing pattern 136 and one the 4th spacing pattern 138.Wherein, Sweep trace 116 for example is in order to as the first spacing pattern 132; Intend distribution 170 and for example be in order to as the second spacing pattern 134, data line 118 for example is in order to as the 3rd spacing pattern 136 and to intend distribution 172 for example be in order to as the 4th spacing pattern 138.Separation material 150 extends to first spacing pattern 132, second spacing pattern the 134, the 3rd spacing pattern 136 and the 4th spacing pattern 138 sides.Thus, the first spacing pattern 132 only limits part separation material 150 and only limits part separation material 150 along displacement, the second spacing pattern 134 of a first direction scope D1 and only limit part separation material 150 along displacement, the 3rd spacing pattern 136 of a second direction scope D2 and only limit part separation material 150 displacement to scope D4 along a four directions along displacement and the 4th spacing pattern 138 of a third direction scope D3.In the present embodiment; The bearing of trend of data line 118 is defined as 0 °, and first direction scope D1 for example is that 90 °～270 °, second direction scope D2 for example are that 270 °～450 °, third direction scope D3 for example are that 0 °～180 ° and four directions for example are 180 °～360 ° to scope D4.In other words, comprise in the present embodiment that the position limiting structure 130 of spacing pattern 132,134,136,138 can limit the displacement of separation material 150 along vertical direction or horizontal direction, misplace between active assembly array substrate 110 and the subtend substrate 140 avoiding.What specify is; In the present embodiment; Multi-strip scanning line 116, many common lines 120 and to intend distribution 170 for example be to be formed by first patterned conductive layer (Metal 1), and many data lines 118 and plan distribution 172 for example are to be formed by second patterned conductive layer (Metal 2).In other words, be to form in order to sweep trace 116 and plan distribution 170 by first patterned conductive layer (Metal 1) as the first spacing pattern 132 and the second spacing pattern 134.Data line 118 and plan distribution 172 in order to as the 3rd spacing pattern 136 and the 4th spacing pattern 138 are to be formed by second patterned conductive layer (Metal 2).
Fig. 7 for graphic clear, omits illustrating of subtend substrate and liquid crystal layer for looking synoptic diagram on the display panels of one embodiment of the invention among Fig. 7.Please with reference to Fig. 7, in the present embodiment, active assembly array substrate 110 comprises a substrate 112, many signal line 114, a plurality of graphoid case 180 and a plurality of sub-pixel 122.Signal wire 114 is disposed on the substrate 112, and signal wire 114 comprises multi-strip scanning line 116, many data lines 118 and many common lines 120.Graphoid case 180 is disposed on the substrate 112, and wherein graphoid case 180 for example is in order to as the first spacing pattern 132 and the second spacing pattern 134.In the present embodiment, the first spacing pattern 132 and the second spacing pattern 134 for example are L shaped spacing patterns.Separation material 150 extends to the first spacing pattern 132 and the second spacing pattern, 134 sides; Thus; The first spacing pattern 132 only limits the displacement of part separation material 150 along a first direction scope D1, and the second spacing pattern 134 only limits the displacement of part separation material 150 along a second direction scope D2.In the present embodiment, the bearing of trend of data line 118 is defined as 0 °, first direction scope D1 for example is 0 °～90 °, and second direction scope D2 for example is 180 °～270 °.In other words; The position limiting structure 130 that comprises the first spacing pattern 132 and the second spacing pattern 134 can limit separation material 150 and can limit the displacement of separation material 150 along vertical direction or horizontal direction, misplaces between active assembly array substrate 110 and the subtend substrate 140 avoiding.What specify is; In the present embodiment; Multi-strip scanning line 116, many common line 120, first spacing patterns 132 and the second spacing pattern 134 for example are to be formed by first patterned conductive layer (Metal 1), and many data lines 118 for example are to be formed by second patterned conductive layer (Metal 2).But in another embodiment; Multi-strip scanning line 116 for example is to be formed by first patterned conductive layer (Metal 1) with many common lines 120, and many data line 118, the first spacing patterns 132 and the second spacing pattern 134 for example are to be formed by second patterned conductive layer (Metal 2).In addition, the first spacing pattern 132 and the second spacing pattern 134 also can be to be formed by patterned semiconductor layer, and in other words, the present invention does not limit the material of the first spacing pattern 132 and the second spacing pattern 134.
Fig. 8 for graphic clear, omits illustrating of subtend substrate and liquid crystal layer for looking synoptic diagram on the display panels of one embodiment of the invention among Fig. 8.Active assembly array substrate 110 shown in Figure 8 is similar with active assembly array substrate 110 shown in Figure 7; Its main difference is in the position limiting structure 130 of respectively organizing of active assembly array substrate 110 and also comprises the graphoid case 182 that is used as one the 3rd spacing pattern 136 and one the 4th spacing pattern 138; Wherein the 3rd spacing pattern 136 only limits the displacement of part separation material 150 along a third direction scope D3; And the 4th spacing pattern 138 only limits part separation material 150 displacement to scope D4 along a four directions, and third direction scope D3 is different to scope D4 with the four directions.In the present embodiment, the 3rd spacing pattern 136 and the 4th spacing pattern 138 for example are L shaped spacing patterns.The bearing of trend of data line 118 is defined as 0 °, and third direction scope D3 for example is that 90 °～180 ° and four directions for example are 270 °～360 ° to scope D4.In other words, comprise in the present embodiment that the position limiting structure 130 of spacing pattern 132,134,136,138 can limit the displacement of separation material 150 along vertical direction or horizontal direction, misplace between active assembly array substrate 110 and the subtend substrate 140 avoiding.Similarly, in the present embodiment, the 3rd spacing pattern 136 and the 4th spacing pattern 138 can be formed by first patterned conductive layer (Metal 1), second patterned conductive layer (Metal 2), patterned semiconductor layer or other material layer.
Fig. 9 for graphic clear, omits illustrating of subtend substrate and liquid crystal layer for looking synoptic diagram on the display panels of one embodiment of the invention among Fig. 9.Active assembly array substrate 110 shown in Figure 9 is similar with active assembly array substrate 110 shown in Figure 7; Its main difference is in the shape of the first spacing pattern 132 and the second spacing pattern 134; In the present embodiment, the first spacing pattern 132 and the second spacing pattern 134 for example are the spacing patterns of strip.The first spacing pattern 132 only limits the displacement of part separation material 150 along a first direction scope D1, and the second spacing pattern 134 only limits the displacement of part separation material 150 along a second direction scope D2.In the present embodiment, the bearing of trend of data line 118 is defined as 0 °, first direction scope D1 for example is 90 °～270 °, and second direction scope D2 for example is 270 °～450 °.In other words, comprise that the position limiting structure 130 of the first spacing pattern 132 and the second spacing pattern 134 can limit the displacement of separation material 150 along vertical direction, misplace between active assembly array substrate 110 and the subtend substrate 140 avoiding.
Figure 10 for graphic clear, omits illustrating of subtend substrate and liquid crystal layer for looking synoptic diagram on the display panels of one embodiment of the invention among Figure 10.Active assembly array substrate 110 shown in Figure 10 is similar with active assembly array substrate 110 shown in Figure 9; Its main difference is in the position limiting structure 130 of respectively organizing of active assembly array substrate 110 and also comprises one the 3rd spacing pattern 136 and one the 4th spacing pattern 138; Wherein the 3rd spacing pattern 136 only limits the displacement of part separation material 150 along a third direction scope D3; And the 4th spacing pattern 138 only limits part separation material 150 displacement to scope D4 along a four directions, and third direction scope D3 is different to scope D4 with the four directions.In the present embodiment, the 3rd spacing pattern 136 and the 4th spacing pattern 138 for example are the spacing patterns of strip.The bearing of trend of data line 118 is defined as 0 °, and third direction scope D3 for example is that 0 °～180 ° and four directions for example are 180 °～360 ° to scope D4.In other words, comprise in the present embodiment that the position limiting structure 130 of spacing pattern 132,134,136,138 can limit the displacement of separation material 150 along vertical direction or horizontal direction, misplace between active assembly array substrate 110 and the subtend substrate 140 avoiding.
Figure 11 for graphic clear, omits illustrating of subtend substrate and liquid crystal layer for looking synoptic diagram on the display panels of one embodiment of the invention among Figure 11.In the present embodiment, active assembly array substrate 110 comprises substrate 112, many signal line 114 and a plurality of sub-pixel 122.Signal wire 114 is disposed on the substrate 112, and signal wire 114 comprises multi-strip scanning line 116, many data lines 118 and many common lines 120.A plurality of sub-pixels 122 are disposed on the substrate 112, and electrically connect with signal wire 114.In the present embodiment; Sweep trace 116 for example is to have the first spacing pattern 132 and the second spacing pattern 134; Each first spacing pattern 132 and each second spacing pattern 134 are respectively at defining a breach 131 on the signal wire 114, and each breach 131 corresponds respectively to a wherein separation material 150.Wherein, The first spacing pattern 132 and the second spacing pattern 134 for example are to comprise the part that protrudes in sweep trace 116; Therefore the first spacing pattern 132 and the second spacing pattern 134 for example are L shaped spacing patterns; The first spacing pattern 132 only limits the displacement of part separation material 150 along a first direction scope D1, and the second spacing pattern 134 only limits the displacement of part separation material 150 along a second direction scope D2, and first direction scope D1 is different with second direction scope D2.In the present embodiment, the bearing of trend of data line 118 is defined as 0 °, first direction scope D1 for example is 0 °～90 °, and second direction scope D2 for example is 180 °～270 °.In other words, comprise that the position limiting structure 130 of the first spacing pattern 132 and the second spacing pattern 134 can limit the displacement of separation material 150 along vertical direction and horizontal direction, misplace between active assembly array substrate 110 and the subtend substrate 140 avoiding.
Figure 12 for graphic clear, omits illustrating of subtend substrate and liquid crystal layer for looking synoptic diagram on the display panels of one embodiment of the invention among Figure 12.Active assembly array substrate 110 shown in Figure 12 is similar with active assembly array substrate 110 shown in Figure 11, and its main difference is in the position limiting structure 130 of respectively organizing of active assembly array substrate 110 and also comprises one the 3rd spacing pattern 136 and one the 4th spacing pattern 138.In the present embodiment; Sweep trace 116 for example is also to have the 3rd spacing pattern 136 and the 4th spacing pattern 138; Each the 3rd spacing pattern 136 and each the 4th spacing pattern 138 are respectively at defining a breach 133 on the sweep trace 116, and each breach 133 corresponds respectively to a wherein separation material 150.Wherein, The 3rd spacing pattern 136 and the 4th spacing pattern 138 for example are L shaped spacing patterns; The 3rd spacing pattern 136 only limits the displacement of part separation material 150 along a third direction scope D3; And the 4th spacing pattern 138 only limits part separation material 150 displacement to scope D4 along a four directions, and third direction scope D3 is different to scope D4 with the four directions.In the present embodiment, the bearing of trend of data line 118 is defined as 0 °, third direction scope D3 for example is 90 °～180 °, and the four directions for example is 270 °～360 ° to scope D4.In other words, comprise in the present embodiment that the position limiting structure 130 of spacing pattern 132,134,136,138 can limit the displacement of separation material 150 along vertical direction or horizontal direction, misplace between active assembly array substrate 110 and the subtend substrate 140 avoiding.It should be noted that; Though be that to have the spacing pattern 132,134,136,138 that defines breach 131,133 with sweep trace 116 be example in Figure 11 and embodiment shown in Figure 12; But in other embodiments; Data line 118 and common line 120 also can have the spacing pattern that defines breach, with the displacement of restriction separation material 150 along vertical direction or horizontal direction.
Figure 13 for graphic clear, omits illustrating of subtend substrate and liquid crystal layer for looking synoptic diagram on the display panels of one embodiment of the invention among Figure 13.Active assembly array substrate 110 shown in Figure 13 is similar with active assembly array substrate 110 shown in Figure 11, and its main difference is in the first spacing pattern 132 of active assembly array substrate 110 and the pattern of the second spacing pattern 134.In the present embodiment; Sweep trace 116 for example is to have the first spacing pattern 132 and the second spacing pattern 134; Each first spacing pattern 132 and each second spacing pattern 134 are respectively at defining a breach 131 on the signal wire 114, and each breach 131 corresponds respectively to a wherein separation material 150.Wherein, The first spacing pattern 132 and the second spacing pattern 134 for example are the spacing patterns of ㄇ shape; The first spacing pattern 132 only limits the displacement of part separation material 150 along a first direction scope D1; And the second spacing pattern 134 only limits the displacement of part separation material 150 along a second direction scope D2, and first direction scope D1 is different with second direction scope D2.In the present embodiment, the bearing of trend of data line 118 is defined as 0 °, first direction scope D1 for example is 270 °～450 °, and second direction scope D2 for example is 90 °～270 °.In other words, comprise that the position limiting structure 130 of the first spacing pattern 132 and the second spacing pattern 134 can limit the displacement of separation material 150, misplace between active assembly array substrate 110 and the subtend substrate 140 avoiding.
What specify is, in the above embodiments, is used as spacing pattern, the use but these spacing patterns can be arranged in pairs or groups in fact each other with signal wire, the signal wire intending distribution, graphoid case and have a breach respectively.In addition, the present invention does not limit the shape of breach and the shape of spacing pattern, and the shape of spacing pattern can be Figure 11 and ㄇ font L shaped, shown in Figure 13 or other shape shown in Figure 12.
In sum, the position limiting structure of display panels of the present invention can limit the displacement of separation material, misplaces to avoid display panels to be pressed or to cause between the two substrates when receiving stress.Thus, can avoid the light leakage phenomena of display panels, make display panels have good display quality.Particularly, in certain embodiments, be to utilize the inherent structure of display panels to be used as spacing pattern, and do not need the spacing pattern of extra making, so can not increase the cost of manufacture or the processing procedure time of display panels.
Though the present invention discloses as above with embodiment; But be not in order to limit the present invention; Has common knowledge the knowledgeable in the technical field under any; Do not breaking away from the spirit and scope of the present invention, when doing a little must the change and retouching, so protection scope of the present invention is when being as the criterion with what claims defined.
Claims (28)
1. a display panels is characterized in that, comprising:
One active assembly array substrate has many group position limiting structures, and each is organized position limiting structure and comprises one first spacing pattern and one second spacing pattern;
One subtend substrate is disposed at said active assembly array substrate top;
A plurality of separation materials; Be disposed on the said subtend substrate; Wherein said separation material is outstanding towards said active assembly array substrate; And extend to by the said first spacing pattern and the said second spacing pattern, wherein the displacement of each said separation material only receives wherein one first spacing pattern or wherein one second spacing pattern restriction, and the said first spacing pattern only limits the displacement of part separation material along a first direction scope; And the said second spacing pattern only limits the displacement of part separation material along a second direction scope, and said first direction scope is different with said second direction scope; And
One liquid crystal layer is disposed between said active assembly array substrate and the said subtend substrate.
2. display panels as claimed in claim 1 is characterized in that, said active assembly array substrate comprises:
One substrate;
Many signal line are disposed on the said substrate, wherein at least the said signal wire of part in order to as the said first spacing pattern and the said second spacing pattern; And
A plurality of sub-pixels are disposed on the said substrate, and electrically connect with said signal wire.
3. display panels as claimed in claim 2 is characterized in that, said signal wire comprises multi-strip scanning line, many data lines and many common lines.
4. display panels as claimed in claim 2 is characterized in that, said signal wire comprises multi-strip scanning line, many data lines or many common lines.
5. display panels as claimed in claim 1 is characterized in that, said active assembly array substrate comprises:
One substrate;
Many signal line are disposed on the said substrate, wherein at least the said signal wire of part in order to as the said first spacing pattern;
Intend distributions for many, be disposed on the said substrate, wherein said plan distribution is in order to as the said second spacing pattern; And
A plurality of sub-pixels are disposed on the said substrate, and electrically connect with said signal wire.
6. display panels as claimed in claim 5 is characterized in that, said signal wire comprises multi-strip scanning line, many data lines and many common lines.
7. display panels as claimed in claim 5 is characterized in that, said signal wire comprises multi-strip scanning line, many data lines or many common lines.
8. display panels as claimed in claim 5 is characterized in that, the bearing of trend of said plan distribution is parallel to the bearing of trend of said signal wire.
9. display panels as claimed in claim 1 is characterized in that, said active assembly array substrate comprises:
One substrate;
Many signal line are disposed on the said substrate;
A plurality of graphoid cases are disposed on the said substrate, and wherein said graphoid case is in order to as the said first spacing pattern and the said second spacing pattern; And
A plurality of sub-pixels are disposed on the said substrate, and electrically connect with said signal wire.
10. display panels as claimed in claim 9 is characterized in that, said signal wire comprises multi-strip scanning line, many data lines and many common lines.
11. display panels as claimed in claim 9 is characterized in that, said signal wire comprises multi-strip scanning line, many data lines or many common lines.
12. display panels as claimed in claim 9; It is characterized in that; Each said first spacing pattern and each said second spacing pattern are L shaped spacing pattern, and said first direction scope is 0 °～90 °, and said second direction scope is 180 °～270 °.
13. display panels as claimed in claim 12; It is characterized in that; Each is organized position limiting structure and also comprises one the 3rd spacing pattern and one the 4th spacing pattern; The said the 3rd spacing pattern only limits the displacement of part separation material along a third direction scope, and the said the 4th spacing pattern only limits the displacement to scope along a four directions of part separation material, and said third direction scope is different to scope with said four directions.
14. display panels as claimed in claim 13; It is characterized in that; Each the said the 3rd spacing pattern and each the said the 4th spacing pattern are L shaped spacing pattern, and said third direction scope is 90 °～180 °, and said four directions is 270 °～360 ° to scope.
15. display panels as claimed in claim 9 is characterized in that, each said first spacing pattern and each said second spacing pattern are the spacing pattern of strip.
16. display panels as claimed in claim 15 is characterized in that, each is organized position limiting structure and also comprises one the 3rd spacing pattern and one the 4th spacing pattern, and each the said the 3rd spacing pattern and each the said the 4th spacing pattern are the spacing pattern of strip.
17. display panels as claimed in claim 16; It is characterized in that; Each said first spacing pattern and the bearing of trend of each said second spacing pattern are vertical with data line in the said signal wire, and each the said the 3rd spacing pattern is parallel with the data line in the said signal wire with the bearing of trend of each said the 4th spacing pattern.
18. display panels as claimed in claim 1 is characterized in that, said active assembly array substrate comprises:
One substrate;
Many signal line; Be disposed on the said substrate; Wherein said signal wire has the said first spacing pattern and the said second spacing pattern; Each said first spacing pattern and each said second spacing pattern are respectively at defining a breach on the said signal wire, and each said breach corresponds respectively to a wherein separation material; And
A plurality of sub-pixels are disposed on the said substrate, and electrically connect with said signal wire.
19. display panels as claimed in claim 18 is characterized in that, said signal wire comprises multi-strip scanning line, many data lines and many common lines.
20. display panels as claimed in claim 18 is characterized in that, said signal wire comprises multi-strip scanning line, many data lines or many common lines.
21. display panels as claimed in claim 18; It is characterized in that; Each said first spacing pattern and each said second spacing pattern are L shaped spacing pattern, and said first direction scope is 0 °～90 °, and said second direction scope is 180 °～270 °.
22. display panels as claimed in claim 21; It is characterized in that; Each is organized position limiting structure and also comprises one the 3rd spacing pattern and one the 4th spacing pattern; The said the 3rd spacing pattern only limits the displacement of part separation material along a third direction scope, and the said the 4th spacing pattern only limits the displacement to scope along a four directions of part separation material, and said third direction scope is different to scope with said four directions.
23. display panels as claimed in claim 22; It is characterized in that; Each the said the 3rd spacing pattern and each the said the 4th spacing pattern are L shaped spacing pattern, and said third direction scope is 90 °～180 °, and said four directions is 270 °～360 ° to scope.
24. display panels as claimed in claim 1 is characterized in that, said active assembly array substrate comprises:
One substrate;
One first patterned conductive layer is disposed on the said substrate, and wherein said first patterned conductive layer comprises multi-strip scanning line, many common lines, the said first spacing pattern and the said second spacing patterns;
One second patterned conductive layer is disposed on the said substrate, and wherein said second patterned conductive layer comprises many data lines that interlock with said sweep trace; And
A plurality of sub-pixels are disposed on the said substrate, and electrically connect with said sweep trace and said data line.
25. display panels as claimed in claim 1 is characterized in that, said active assembly array substrate comprises:
One substrate;
One first patterned conductive layer is disposed on the said substrate, and wherein said first patterned conductive layer comprises multi-strip scanning line and many common lines, and said sweep trace and said common line are in order to as the said first spacing pattern and the said second spacing pattern;
One second patterned conductive layer is disposed on the said substrate, and wherein said second patterned conductive layer comprises many data lines that interlock with said sweep trace; And
A plurality of sub-pixels are disposed on the said substrate, and electrically connect with said sweep trace and said data line.
26. display panels as claimed in claim 1 is characterized in that, said active assembly array substrate comprises:
One substrate;
One first patterned conductive layer is disposed on the said substrate, and wherein said first patterned conductive layer comprises multi-strip scanning line and many common lines, and said sweep trace or said common line are in order to as the said first spacing pattern and the said second spacing pattern;
One second patterned conductive layer is disposed on the said substrate, and wherein said second patterned conductive layer comprises many data lines that interlock with said sweep trace; And
A plurality of sub-pixels are disposed on the said substrate, and electrically connect with said sweep trace and said data line.
27. display panels as claimed in claim 1 is characterized in that, said active assembly array substrate comprises:
One substrate;
One first patterned conductive layer is disposed on the said substrate, and wherein said first patterned conductive layer comprises multi-strip scanning line and many common lines;
One second patterned conductive layer is disposed on the said substrate, wherein said second patterned conductive layer comprise many with said sweep trace and staggered data line, the said first spacing pattern and the said second spacing patterns of many common lines; And
A plurality of sub-pixels are disposed on the said substrate, and electrically connect with said sweep trace and said data line.
28. display panels as claimed in claim 1 is characterized in that, said active assembly array substrate comprises:
One substrate;
One first patterned conductive layer is disposed on the said substrate, and wherein said first patterned conductive layer comprises multi-strip scanning line and many common lines;
One second patterned conductive layer; Be disposed on the said substrate; Wherein said second patterned conductive layer comprise many with said sweep trace and the staggered data lines of many common lines, and said data line is in order to as the said first spacing pattern and the said second spacing pattern; And
A plurality of sub-pixels are disposed on the said substrate, and electrically connect with said sweep trace and said data line.
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| CN2010101766058A CN101813862B (en) | 2010-05-10 | 2010-05-10 | Liquid crystal display panel |
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| CN2010101766058A CN101813862B (en) | 2010-05-10 | 2010-05-10 | Liquid crystal display panel |
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| CN101813862A CN101813862A (en) | 2010-08-25 |
| CN101813862B true CN101813862B (en) | 2012-01-04 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US6717629B2 (en) * | 1999-12-10 | 2004-04-06 | Kabushiki Kaisha Advanced Display | Liquid crystal display device with conductive chamfering amount marks and method of manufacturing the same |
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| CN101435936B (en) * | 2007-11-12 | 2013-06-12 | 群创光电股份有限公司 | Backlight module and display apparatus |
| CN101650502B (en) * | 2008-08-15 | 2012-05-30 | 胜华科技股份有限公司 | Liquid crystal display panel |
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