CN101799521B - Power supply power-fail method of auto sound singlechip and peripheral circuit equipment - Google Patents
Power supply power-fail method of auto sound singlechip and peripheral circuit equipment Download PDFInfo
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- CN101799521B CN101799521B CN 201010139000 CN201010139000A CN101799521B CN 101799521 B CN101799521 B CN 101799521B CN 201010139000 CN201010139000 CN 201010139000 CN 201010139000 A CN201010139000 A CN 201010139000A CN 101799521 B CN101799521 B CN 101799521B
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Abstract
The invention relates to the technical field of auto sound, in particular to a power supply power-fail method of auto sound singlechip and peripheral circuit equipment, comprising a high-frequency power-fail stage which controls the power failure of singlechip high-frequency crystal oscillator and a low-frequency power-fail stage which controls the power failure of singlechip low-frequency crystal oscillator, wherein the high-frequency power-fail time is less than the low-frequency power-fail time. The invention builds a power-fail curve model, uses a time slot to specifically divide the model and gives the qualitative relationship of each stage in the power-fail curve model under the control of hardware. A mathematical model can be applied in all auto sound development and can shorten power supply pulse experiment times of the auto sound.
Description
Technical field
The present invention relates to the automobile audio technical field, the power supply power-fail method of particularly a kind of chip of automobile audio and peripheral circuit equipment.
Background technology
The deviser of automobile audio has often spent a large amount of time and efforts how by power pulse experimentally, thereby how fast and effeciently saving cost by the power pulse experiment is a challenge to the automobile audio deviser, and at present not a model can not disclose power down curve and relation soft, hardware.
Summary of the invention
The invention provides the power supply power-fail method of a kind of chip of automobile audio and peripheral circuit equipment,, lack technical matters the guidance of testing by power pulse to solve in the prior art.
The technical solution used in the present invention is as follows:
The power supply power-fail method of a kind of chip of automobile audio and peripheral circuit equipment, be used for testing by power pulse, the high frequency power down stage that comprises the high frequency crystal oscillator power down of control single chip computer, in the low frequency power down stage of control single chip computer low frequency crystal oscillator, the time in high frequency power down stage is less than the time in low frequency power down stage.
As a kind of preferred version, the time in the time in described high frequency power down stage and low frequency power down stage has following relation:
ΔV＝V0-VR-K(T2-T1)，
Voltage difference between voltage when voltage when wherein Δ V is the automobile audio shutdown and automobile audio operate as normal, VR is the minimum voltage of single-chip microcomputer energy operate as normal when low frequency, voltage when V0 is system's operate as normal, K is the power down rate, it is the voltage drop in the unit interval, T1 is the time in high frequency power down stage, and T2 is the time in low frequency power down stage.
As further preferred version, the time in the time in described high frequency power down stage and low frequency power down stage has following relation:
K＝(2.3-ΔV)/(T2-T1)。
As a kind of preferred version, in the described high frequency power down stage, the time that is used to close single-chip microcomputer peripheral circuit equipment is less than or equal to 150ms.
As a kind of preferred version, the described high frequency power down stage, close peripheral circuit equipment successively according to the size of peripheral circuit electricity consumption of equipment amount, close the big peripheral circuit equipment of power consumption earlier, close the little peripheral circuit equipment of power consumption again.
As a kind of preferred version, the time in described low frequency power down stage is greater than the pulse width of power pulse test.
The present invention has set up the power down curve model, and it is carried out clear and definite division with the time period, provided the qualitative relationships that each stage is controlled by software and hardware in the power down curve model, this mathematical model can be applied in all automobile audio exploitations, can shorten automobile audio and test desired times by power pulse.
Description of drawings
Fig. 1 is a power down curve measured drawing of the present invention;
Fig. 2 is a power down curve model of the present invention;
Embodiment
Below in conjunction with the drawings and specific embodiments the present invention is described in more detail.
As shown in Figure 1, power supply power-fail method of the present invention, automobile audio is carried out three phases divide on the power down time: high frequency power down stage (T1), low frequency power down stage (T2), the power down stage (after the T2) resets.
1. high frequency power down stage (T1): also be in the high-frequency work state at this stage single-chip microcomputer, peripheral equipment power consumption is bigger.
2. low frequency power down stage (T2): shut down at this stage sound equipment, single-chip microcomputer is in the low frequency operation state, and peripheral equipment quits work, and power consumption is less.
3. the power down stage (after the T2) resets: be in abnormal operating state at this stage single-chip microcomputer.
Wherein, the time T 1 in high frequency power down stage is less than the time T 2 in low frequency power down stage.
As shown in Figure 2, be the power down curve model of this law.
Horizontal ordinate express time wherein, ordinate is represented voltage.0～T1 represents the high frequency power down stage, and T1～T2 represents the low frequency power down stage, and T2 represents to reset the power down stage later on.Voltage when V1 is the sound equipment shutdown, VR are the minimum voltages of single-chip microcomputer energy operate as normal when low frequency.V0 is a constant, the voltage when being system's operate as normal.
We can draw following formula:
ΔV＝V0-V1＝V0-VR-(V1-VR)＝V0-VR-K(T2-T1)，
Wherein K is the power down rate, and V0=5v determines for a certain specific single-chip microcomputer VR, is example with ToshibaTMP87PP21F series, VR=2.7v, and then above formula can be simplified as follows:
ΔV＝2.3-K(T2-T1)，
We just can release following two conclusions from this formula:
1. for a specific hardware, K and T2 are a constant, if T1 is more little, then Δ V is more little, and the power down curve is slow more, test by power pulse easily more.
2. for a software specifically, T1 and Δ V are a constant, above formula can further develop and be: K=(2.3-Δ V)/(T2-T1),
Then K and T2 are inversely proportional to, and K is more little, and T2 is just big more.
Be how in the project of reality, to use these two conclusions to come more rational design software and hardware below:
1.T1 be by the decision of unused time of software,, when power down, to shorten the communication time of single-chip microcomputer and peripheral equipment as early as possible in order to reduce T1.Discover that by us it is more rational that T1 is controlled between 100ms～150ms.
2. Optimization Software shutdown process, such as, when power down process, software can be paid the utmost attention to and close the bigger peripheral equipment of power consumption earlier, closes miscellaneous equipment again, to reduce Δ V, makes the power down curve slower.
3. hardware will verify carefully whether the selection of design parameter on the feed circuit is reasonable, and this parameter can directly influence the size of power down rate k.Big more such as electric capacity, then the electric weight of Chu Cuning is many more, and the voltage drop K of unit interval is just more little, thereby T2 is just big more.Why will increase T2 is because T2 and certain concrete pulse test have contact nearly, we are example with pulse 5, in pulse 5, td=150ms, the width of pulse maximum just is 150ms, in order to guarantee that single-chip microcomputer is in impulse duration energy operate as normal, we must satisfy t2＞=td, electric capacity is the bigger the better theoretically, but the big more cost of electric capacity is also high more, so should carefully select.
Claims (5)
1. the power supply power-fail method of chip of automobile audio and peripheral circuit equipment, be used for testing by power pulse, the high frequency power down stage that comprises the high frequency crystal oscillator power down of control single chip computer, the low frequency power down stage of control single chip computer low frequency crystal oscillator, it is characterized in that, the time in high frequency power down stage, the time in the time in described high frequency power down stage and low frequency power down stage had following relation less than the time in low frequency power down stage:
ΔV＝V0-VR-K(T2-T1)，
Voltage difference between voltage when voltage when wherein Δ V is the automobile audio shutdown and automobile audio operate as normal, VR is the minimum voltage of single-chip microcomputer energy operate as normal when low frequency, voltage when V0 is system's operate as normal, K is the power down rate, it is the voltage drop in the unit interval, T1 is the time in high frequency power down stage, and T2 is the time in low frequency power down stage.
2. power supply power-fail method according to claim 1 is characterized in that, the time in the time in described high frequency power down stage and low frequency power down stage has following relation:
K＝(2.3-ΔV)/(T2-T1)。
3. power supply power-fail method according to claim 1 is characterized in that, in the described high frequency power down stage, the time that is used to close single-chip microcomputer peripheral circuit equipment is less than or equal to 150ms.
4. power supply power-fail method according to claim 1, it is characterized in that the described high frequency power down stage is closed peripheral circuit equipment successively according to the size of peripheral circuit electricity consumption of equipment amount, close the big peripheral circuit equipment of power consumption earlier, close the little peripheral circuit equipment of power consumption again.
5. power supply power-fail method according to claim 1 is characterized in that, the time in described low frequency power down stage is greater than the pulse width of power pulse test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201010139000 CN101799521B (en) | 2010-03-31 | 2010-03-31 | Power supply power-fail method of auto sound singlechip and peripheral circuit equipment |
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| Application Number | Priority Date | Filing Date | Title |
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| CN 201010139000 CN101799521B (en) | 2010-03-31 | 2010-03-31 | Power supply power-fail method of auto sound singlechip and peripheral circuit equipment |
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| Publication Number | Publication Date |
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| CN101799521A CN101799521A (en) | 2010-08-11 |
| CN101799521B true CN101799521B (en) | 2011-12-28 |
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| CN 201010139000 Expired - Fee Related CN101799521B (en) | 2010-03-31 | 2010-03-31 | Power supply power-fail method of auto sound singlechip and peripheral circuit equipment |
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Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US5304987A (en) * | 1992-04-16 | 1994-04-19 | At&T Bell Laboratories | Board removal detection circuit |
| CN2733374Y (en) * | 2004-08-18 | 2005-10-12 | 北京格林威尔科技发展有限公司 | Remote power down monitoring module |
| CN200962514Y (en) * | 2006-10-25 | 2007-10-17 | 深圳桑达国际电子器件有限公司 | Electricity drop detection device |
| US8803356B2 (en) * | 2007-08-22 | 2014-08-12 | Mitsubishi Electric Corporation | Controller for AC electric train |
| CN101509946A (en) * | 2009-01-09 | 2009-08-19 | 上海新时达电气股份有限公司 | Phase-lacking and power down detecting method for three phase AC input power supply |
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Address after: 516006 Guangdong province Huizhou Zhongkai hi tech Industrial Development Zone Pearl River Road No. 1 Patentee after: HUIZHOU DESAY SV AUTOMOTIVE CO., LTD. Address before: 516006 Guangdong province Huizhou Zhongkai hi tech Industrial Development Zone Pearl River Road No. 1 Patentee before: Huizhou Desay SV Auto. Electronics Co., Ltd. |
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Granted publication date: 20111228 Termination date: 20200331 |