CN101798059B - Production method of silicon-based nanopore - Google Patents

Production method of silicon-based nanopore Download PDF

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CN101798059B
CN101798059B CN 201010140180 CN201010140180A CN101798059B CN 101798059 B CN101798059 B CN 101798059B CN 201010140180 CN201010140180 CN 201010140180 CN 201010140180 A CN201010140180 A CN 201010140180A CN 101798059 B CN101798059 B CN 101798059B
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silicon
etching
silicon substrate
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wet etching
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CN101798059A (en
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司卫华
刘泽文
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Tsinghua University
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Abstract

The invention provides a production method of a silicon-based nanopore, which comprises the following steps of: 1. covering a protecton material and a top protection material on a silicon substrate, and machining a pattern which needs to be etched on the silicon substrate onto the two layers of protection materials with a micro-production technology, wherein the depth of the pattern reaches the surface of the bottom of the silicon substrate; 2. etching a perpendicular columnar pore on the surface of the bottom of the silicon substrate with a deep reaction ion etching DRIE method; 3. coating photoresist on the surface of the columnar pore; and 4. continually downwards corroding from the end of the columnar pore with potassium hydroxide alkaline solution by means of wet etching, so that an included angle between a corroded inclined plane and the horizontal plane is 53.7 degrees, so as to obtain the silicon-based nanopore with controllable size. The production method provides technical support for the surface controlling technology of atomic beam and the other nanometer machining technologies, and plays a role in promoting.

Description

一种硅基纳米孔的制作方法A method for fabricating silicon-based nanopores

技术领域 technical field

本发明涉及硅表面加工技术以及深加工技术领域,特别涉及用于原子光刻的一种硅基纳米孔的制作方法。The invention relates to the field of silicon surface processing technology and deep processing technology, in particular to a method for making silicon-based nanoholes for atomic lithography.

背景技术 Background technique

在纳米制造领域中,原子光学技术的应用是一个新兴的研究领域,可提供多种制造纳米尺度材料的方法。大量基础原子光学的研究提供了许多不同的操纵自由中性原子的方法。现在研究的主要方向是在原子趋近表面时原子移动的控制,目的是在基板表面上构造任意的纳米结构。制作不同尺寸的纳米孔、纳米级条纹、点阵或者所需要的特定图案可以用来进行原子移动控制。In the field of nanofabrication, the application of atomic optics is an emerging field of research that offers a variety of methods for fabricating nanoscale materials. A great deal of research in fundamental atomic optics has provided many different ways of manipulating free neutral atoms. The main direction of research is the control of the movement of atoms as they approach the surface, with the aim of constructing arbitrary nanostructures on the substrate surface. Fabricating nanopores of different sizes, nanoscale stripes, lattices, or desired specific patterns can be used to control the movement of atoms.

目前关于硅基纳米孔的制作并没有一个非常好的方法,这主要是由硅基纳米孔本身的特点决定的。在半导体行业用的普通硅片的厚度在几百微米左右,要想在硅片上形成纳米量级的孔或者条纹,在技术上要有非常精确的控制。现有的纳米孔或者纳米筛的制作主要采用合成法。Mintova等人利用原位水热晶化法首次得到了粒径分布均匀的Silicalite-1纳米分子筛晶粒[文献1:Mintova S,Mo S,Bein T.[J].Nanosized AlPO4-5 molecular sieves and ultrathin filmsprepared by microwave synthesis.Chem.Mater,1998,10(12):4030~4036],该方法操作过程简单,不需要特殊的装置,但是该方法制备的分子筛晶体尺寸和取向控制的重现性差,要获得致密无针孔的膜,至少需要几微米的厚度,因而导致了温变时极易产生龟裂,甚至脱落。Xu等人应用微波加热技术成功地合成了NaA型分子筛膜[文献2:Xu X C,Yang W S,Liu J,et al.[J].Synthesis of ahigh-permeance NaA zeolite membrane by microwave heating Adv.Mater,2000,12(3):195~197],该方法能够提高晶化速率,并且一定程度上缩小了晶体尺寸,但是容易发生局部分子筛堆积,很难控制在支撑基材表面形成大面积均匀而致密的分子筛膜。At present, there is no very good method for making silicon-based nanopores, which is mainly determined by the characteristics of silicon-based nanopores themselves. The thickness of ordinary silicon wafers used in the semiconductor industry is about a few hundred microns. To form nanometer-scale holes or stripes on silicon wafers, very precise technical control is required. The existing nanopores or nanosieves are mainly produced by synthetic methods. Mintova et al. used the in-situ hydrothermal crystallization method to obtain Silicalite-1 nano-molecular sieve grains with uniform particle size distribution for the first time [Document 1: Mintova S, Mo S, Bein T.[J].Nanosized AlPO4-5 molecular sieves and Ultrathin films prepared by microwave synthesis.Chem.Mater, 1998,10(12):4030~4036], the method is simple in operation and does not require special equipment, but the molecular sieve crystal size and orientation control of the prepared method have poor reproducibility, To obtain a dense and pinhole-free film, a thickness of at least several microns is required, which leads to cracking and even falling off when the temperature changes. Xu et al. successfully synthesized NaA-type molecular sieve membranes using microwave heating technology [Document 2: Xu X C, Yang W S, Liu J, et al.[J].Synthesis of high-permeance NaA zeolite membrane by microwave heating Adv. Mater, 2000, 12(3): 195~197], this method can increase the crystallization rate and reduce the crystal size to a certain extent, but it is prone to local accumulation of molecular sieves, and it is difficult to control the formation of large-area uniform molecular sieves on the surface of the support substrate. And dense molecular sieve membrane.

发明内容 Contents of the invention

为了克服上述现有技术的缺陷,本发明的目的在于提供一种硅基纳米孔的制作方法,能够在原子趋近表面时控制原子的移动。In order to overcome the above-mentioned defects in the prior art, the object of the present invention is to provide a method for fabricating silicon-based nanopores, which can control the movement of atoms when they approach the surface.

为了达到上述目的,本发明的技术方案是这样实现的:In order to achieve the above object, the technical solution of the present invention is achieved in that:

一种硅基纳米孔的制作方法,包括以下步骤:A method for making silicon-based nanopores, comprising the following steps:

一、在硅衬底1上覆盖保护材料2和顶层保护材料3,保护材料2采用溅射的铬层,厚度为300nm,顶层保护材料3采用溅射的铝层,厚度为300nm,用微细加工技术将需要在硅衬底1上刻蚀出的图形加工到两层保护材料上,图形的深度到达硅衬底1的表面;1. Cover the protective material 2 and the top protective material 3 on the silicon substrate 1. The protective material 2 adopts a sputtered chromium layer with a thickness of 300nm, and the top protective material 3 adopts a sputtered aluminum layer with a thickness of 300nm. The technology processes the pattern that needs to be etched on the silicon substrate 1 onto two layers of protective materials, and the depth of the pattern reaches the surface of the silicon substrate 1;

二、在硅衬底1的表面运用深反应离子刻蚀DRIE的方法刻蚀出垂直的柱状孔,刻蚀的深度取决于所用硅片的厚度和所要制作的硅纳米孔之间的距离,根据硅各向异性湿法腐蚀的特性和所要制作的硅纳米孔之间的距离,可以得到湿法腐蚀的深度,深反应离子刻蚀DRIE刻蚀的深度为硅片的厚度减去湿法腐蚀的深度;Two, use deep reactive ion etching DRIE method to etch vertical columnar holes on the surface of silicon substrate 1, the depth of etching depends on the thickness of the silicon wafer used and the distance between the silicon nanoholes to be made, according to The characteristics of silicon anisotropic wet etching and the distance between the silicon nanopores to be fabricated can obtain the depth of wet etching, and the depth of deep reactive ion etching DRIE etching is the thickness of the silicon wafer minus the wet etching depth;

三、在柱状孔的表面6涂上光刻胶5;3. Coating photoresist 5 on the surface 6 of the columnar hole;

四、采用湿法腐蚀,利用浓度为30%的氢氧化钾碱性溶液,从柱状孔末端往下继续腐蚀,使得腐蚀出的斜面4与水平面的夹角为53.7°,最后得到尺寸可控的硅纳米孔7。4. Wet etching is adopted, using a potassium hydroxide alkaline solution with a concentration of 30%, to continue etching from the end of the columnar hole downwards, so that the angle between the etched inclined plane 4 and the horizontal plane is 53.7°, and finally a controllable size is obtained. Silicon nanopores7.

本发明的制作方法避免了传统的合成方法,采用深反应离子刻蚀DRIE干法刻蚀和湿法刻蚀相结合的特点,在普通硅片上制作硅纳米孔。本发明制作方法中顶层保护材料3可以避免在干法刻蚀中对保护材料2的刻蚀,保护材料2可以避免在湿法刻蚀中溶液对保护层下的硅衬底1的腐蚀,在柱状孔的表面6上有保护层5,避免在湿法腐蚀过程中侧面的硅材料被腐蚀。The manufacturing method of the present invention avoids the traditional synthesis method, adopts the characteristics of combining deep reactive ion etching (DRIE) dry etching and wet etching, and manufactures silicon nanopores on ordinary silicon wafers. In the manufacturing method of the present invention, the top protective material 3 can avoid etching the protective material 2 in the dry etching, and the protective material 2 can avoid the corrosion of the silicon substrate 1 under the protective layer by the solution in the wet etching. There is a protection layer 5 on the surface 6 of the columnar hole to prevent the silicon material on the side from being corroded during the wet etching process.

附图说明 Description of drawings

图1为本发明制作过程的剖面图。Fig. 1 is a sectional view of the manufacturing process of the present invention.

图2为本发明制作过程的正面图。Fig. 2 is a front view of the manufacturing process of the present invention.

图3为本发明制作过程的俯视图。Fig. 3 is a top view of the manufacturing process of the present invention.

图4为本发明制作出的硅基纳米孔的结构示意图。Fig. 4 is a schematic diagram of the structure of the silicon-based nanopore produced by the present invention.

具体实施方式 Detailed ways

下面结合附图对本发明的原理进行详细说明。The principle of the present invention will be described in detail below in conjunction with the accompanying drawings.

一种硅基纳米孔的制作方法,包括以下步骤:A method for making silicon-based nanopores, comprising the following steps:

一、参见图1,在硅衬底1上覆盖保护材料2和顶层保护材料3,目的是形成带有保护层的硅腐蚀窗口,在干法刻蚀和湿法刻蚀过程中,使被保护的部分不被腐蚀,保护材料2采用溅射的铬层,厚度为300nm,顶层保护材料3采用溅射的铝层,厚度为300nm,用微细加工技术将需要在硅衬底1上刻蚀出的图形加工到两层保护材料上,图形的深度到达硅衬底1的表面;1. Referring to FIG. 1, the protective material 2 and the top layer protective material 3 are covered on the silicon substrate 1, the purpose is to form a silicon etching window with a protective layer, so that the protected The part is not corroded, the protective material 2 adopts a sputtered chromium layer with a thickness of 300nm, and the top protective material 3 adopts a sputtered aluminum layer with a thickness of 300nm. The graphics are processed on two layers of protective materials, and the depth of the graphics reaches the surface of the silicon substrate 1;

二、参见图2,在硅衬底1的表面运用深反应离子刻蚀DRIE的方法刻蚀出垂直的柱状孔,刻蚀的深度取决于所用硅片的厚度和所要制作的硅纳米孔之间的距离,根据硅各向异性湿法腐蚀的特性和所要制作的硅纳米孔之间的距离,可以得到湿法腐蚀的深度,硅片的厚度减去湿法腐蚀的深度可以得到深反应离子刻蚀DRIE刻蚀的深度;2. Referring to FIG. 2, vertical columnar holes are etched on the surface of the silicon substrate 1 by deep reactive ion etching (DRIE). The depth of etching depends on the thickness of the silicon wafer used and the gap between the silicon nanopores According to the characteristics of silicon anisotropic wet etching and the distance between the silicon nanopores to be fabricated, the depth of wet etching can be obtained, and the depth of wet etching can be obtained by subtracting the thickness of silicon wafer from the depth of wet etching. Etching depth of DRIE etching;

三、参见图1、图2,在柱状孔的表面6涂上光刻胶5,避免在湿法腐蚀过程中侧面的硅材料被腐蚀;3. Referring to Fig. 1 and Fig. 2, a photoresist 5 is coated on the surface 6 of the columnar hole to prevent the silicon material on the side from being corroded during the wet etching process;

四、参见图4,采用湿法腐蚀,利用浓度为30%的氢氧化钾碱性溶液,从柱状孔末端往下继续腐蚀,,使得腐蚀出的斜面4与水平面的夹角为53.7°,最后得到尺寸可控的硅纳米孔7。4. Referring to Fig. 4, wet etching is adopted, using a potassium hydroxide alkaline solution with a concentration of 30%, to continue etching downward from the end of the columnar hole, so that the angle between the etched inclined plane 4 and the horizontal plane is 53.7°, and finally A size-controllable silicon nanopore 7 is obtained.

Claims (1)

1.一种硅基纳米孔的制作方法,其特征在于,包括以下步骤:1. A method for preparing silicon-based nanopores, comprising the following steps: 一、在硅衬底(1)上覆盖保护材料(2)和顶层保护材料(3),保护材料(2)采用溅射的铬层,厚度为300nm,顶层保护材料(3)采用溅射的铝层,厚度为300nm,用微细加工技术将需要在硅衬底(1)上刻蚀出的图形加工到两层保护材料上,图形的深度到达硅衬底(1)的表面;1. Cover the protective material (2) and the top protective material (3) on the silicon substrate (1). The protective material (2) is a sputtered chromium layer with a thickness of 300nm. The top protective material (3) is sputtered Aluminum layer with a thickness of 300nm, using microfabrication technology to process the pattern to be etched on the silicon substrate (1) onto two layers of protective materials, and the depth of the pattern reaches the surface of the silicon substrate (1); 二、在硅衬底(1)的表面运用深反应离子刻蚀的方法刻蚀出垂直的柱状孔,刻蚀的深度取决于所用硅片的厚度和所要制作的硅纳米孔之间的距离,根据硅各向异性湿法腐蚀的特性和所要制作的硅纳米孔之间的距离,可以得到湿法腐蚀的深度,深反应离子刻蚀的深度为硅片的厚度减去湿法腐蚀的深度;2. Use deep reactive ion etching to etch vertical columnar holes on the surface of the silicon substrate (1). The etching depth depends on the thickness of the silicon wafer used and the distance between the silicon nanoholes to be fabricated. According to the characteristics of silicon anisotropic wet etching and the distance between the silicon nanopores to be fabricated, the depth of wet etching can be obtained, and the depth of deep reactive ion etching is the thickness of silicon wafer minus the depth of wet etching; 三、在柱状孔的表面(6)涂上光刻胶(5);3. Apply photoresist (5) on the surface (6) of the columnar hole; 四、采用湿法腐蚀,利用浓度为30%的氢氧化钾碱性溶液,从柱状孔末端往下继续腐蚀,使得腐蚀出的斜面(4)与水平面的夹角为53.7°,最后得到尺寸可控的硅纳米孔(7)。4. Wet etching is adopted, and the potassium hydroxide alkaline solution with a concentration of 30% is used to continue etching downward from the end of the columnar hole, so that the angle between the etched inclined surface (4) and the horizontal plane is 53.7°, and the final size can be obtained. controlled silicon nanopores (7).
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US6706203B2 (en) * 2001-10-30 2004-03-16 Agilent Technologies, Inc. Adjustable nanopore, nanotome, and nanotweezer
KR20090121544A (en) * 2008-05-22 2009-11-26 한양대학교 산학협력단 Nanopore Formation Method

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US6706203B2 (en) * 2001-10-30 2004-03-16 Agilent Technologies, Inc. Adjustable nanopore, nanotome, and nanotweezer
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