CN101788624B

CN101788624B - Device for testing electrical-connection topological structure

Info

Publication number: CN101788624B
Application number: CN2009102008524A
Authority: CN
Inventors: 胡刚; 刘齐山; 李建平; 邬忠勤; 姜宏; 王凤鸣
Original assignee: Shanghai Maglev Transportation Engineering Technology Research Center; Shanghai Maglev Transportation Development Co Ltd
Current assignee: Tongji University
Priority date: 2009-12-25
Filing date: 2009-12-25
Publication date: 2012-08-22
Anticipated expiration: 2029-12-25
Also published as: CN101788624A

Abstract

The invention provides a device for testing an electrical-connection topological structure, which comprises a control module, a plurality of testing modules, a wire connecting terminal and a testing socket. The plurality of testing modules are connected with the control module, the wire connecting terminal is connected with the testing modules, and the testing socket is connected with the wire connecting terminal. Each testing module comprises a plurality of testing units connected in series, the testing socket is connected with a plurality of testing points on an object to be tested, and each testing unit comprises a signal control module. As a modular structure is adopted at the inner part of the device, the testing scale control and the organization structure are flexible, and different connecting modules can be adopted for testing according to different machine cases to be tested, thereby greatly simplifying a complicated connecting circuit and being convenient for the expansion as well as maintenance of the testing device. Small-signal testing is adopted to avoid damage to the object to be tested and to realize quick measuring analysis for thousands of large-scale connecting relationships.

Description

The device that is used for testing electrical-connection topological structure

Technical field

The present invention relates to the inner device that connects of a kind of testing apparatus, be specifically related to the device that a kind of non-destructive is used for testing electrical-connection topological structure.

Background technology

At present, existing proving installation has only the equipment of testing to the mini-cable syndeton, and still needleless is to the testing apparatus of large-sized cable syndeton, especially the testing apparatus of divider and so in the cable more than 2000, the set of signals.The testing apparatus that number of test points is less at first adds measured signal on the point of test, detect the signal of the other end more successively, if there is the end points of response to be indicated as the point of connection.Its shortcoming is that this kind equipment receives the restriction of scale, can not expand arbitrarily, can't solve the test request of the many cables of number of test points, and the test point in the test result can not be mapped on the identification number of measured body end according to actual measured body.

Summary of the invention

The present invention provides a kind of device that is used for testing electrical-connection topological structure, but non-destructive ground measure the inside annexation of large-scale not charging equipment and show with grid configuration, its test point can arbitrarily be expanded simultaneously, satisfies different test requests.

For realizing above-mentioned purpose; The present invention provides a kind of device that is used for testing electrical-connection topological structure; The connection terminal that this device comprises control module, a plurality of test module that is connected with control module, is connected with the test module, and the test jack that is connected with connection terminal;

Above-mentioned test module comprises a plurality of test cells that are connected in series;

Above-mentioned test jack connects a plurality of test points on the measured body;

Above-mentioned test cell comprises the signal controlling module.

A plurality of test cells in the above-mentioned same test module, one of them test cell also comprises the interface protocol translation module that is connected with the signal controlling module, and the interface module that is connected with the interface protocol translation module;

Above-mentioned test module is connected with control module through interface module.

Each test point of measured body is connected with each pin position in the test jack.Control module is according to the numbering of test point, test cell and test module is listed the net table; And according to this each test point of net table configuration, this device provides a high level to all test points of measured body after accomplishing, in the time of a certain single-point of test; This device is just put this level point low; Receive all test points level signal at this moment on the measured body through test jack simultaneously, and be transferred to control module, control module is integrated the level signal that is received; And in the net table, export the result, just can obtain the inner circuit network situation of measured body thus.

The present invention is used for the device of testing electrical-connection topological structure and compares with conventional device; Its advantage is; The inner modular construction that adopts of the present invention, control of test scale and institutional framework are flexible, can adopt different dome modules to test according to the tested cabinet of difference; The connection circuit of complicacy is simplified greatly, be convenient to the expansion and the maintenance of proving installation;

The present invention adopts the small-signal test, avoids the destruction to measured body, realizes the quick Measurement and analysis to several thousand large-scale annexations simultaneously;

The present invention adopts high-low level test tie point, need not decompose measured body, directly obtains inner being electrically connected of measured body;

Control module of the present invention can be stored as the net sheet form with the result, makes the result simpler and clearer, highly versatile.

Description of drawings

Fig. 1 is used for the overall annexation figure of the device of testing electrical-connection topological structure for the present invention.

Embodiment

Further specify embodiments of the invention below in conjunction with accompanying drawing.

See also shown in Figure 1, the connection terminal 5 that the device that the present invention is used for testing electrical-connection topological structure comprises control module 4, a plurality of test module 1 that is connected with control module 4, is connected with test module 1, and the test jack 6 that is connected with connection terminal 5; Test module 1 comprises a plurality of test cells that are connected in series 2; A plurality of test points 3 that test jack 6 connects on the measured body.

Control module 4 is expanded 9 ports altogether; Each port connects a test module 1; Different test modules 1 is made up of 4～6 test cells that are connected in series 2 respectively; Each test cell 2 is responsible for the test of 49 test points 3, and while 4 pairs of control modules are respectively tested module 1, test cell 2 and test point 3 and numbered, and whole test system has formed topological structure thus.

Test point 3 on the different measured bodies is connected to through different test adaptor heads in the test jack 6 of standard of this device, and the test jack 6 of standard is connected to connection terminal 5, and test module 1 connects the p-wire that comes out and also is connected to connection terminal 5.Because will be provided with each test point 3 of identification number and each pin position of test jack 6 connects one to one; And through connection terminal 5, each pin position of test jack 6 and tie point under each test cell 2 are connected one to one, therefore, make the corresponding of tie point and each test point 3 under the test cell 2.

Control module 4 is through this corresponding relation; The numbering of each test module 1, test cell 2 and test point 3 is connected; Make under the total system each test point 3 all possess specific numbering, and according to this numbering configuration testing point 3, and control corresponding test point 3 and test.After test operation is accomplished, return the test result of each test point 3 to control module 4 through numbered address, and according to the signal condition of mould group number, unit number and each fc-specific test FC point 3 of test period output of correspondence.Such logical organization makes maintenance and extend testing point 3 be very easy to; Need to increase test point 3; Then only need in suitable test module 1, increase test cell 2 or newly-increased test module 1, and the newly-increased port that this test module 1 is connected on the control module 4 gets final product.Simultaneously because be that each test cell 2 is accomplished test alone; Test point 3 numbers that the test duration of each test cell 2 only is connected with this test cell 2 are relevant; And do not have direct relation with the sum of the test point 3 of total system; Therefore increase the number of the test point 3 of total system, can not have influence on the test duration of each test point 3, guaranteed the speed of test.

Test cell 2 comprises signal controlling module 21.Signal controlling module 21 adopts complex logic chip EPM1270TC-144 able to programme, and this chip is responsible for the instruction that signal receives control module 4, carries out corresponding input-output operation according to instruction.

In each test module 1; Each test cell 2 adopts being connected in series of four line serials, Transistor-Transistor Logic level; The signal controlling module 21 of back one test cell 2 is connected to signal controlling module 21 chips of a unit, wherein is connected first test cell 2, is equipped with interface protocol translation module 22 and interface module 23; In order to receive the output signal of complex logic chip able to programme, all the other test cells 2 only are provided with complex logic chip able to programme.The test signal that each test cell 2 is received; The series connection switching of signal controlling module 21 chips through each test cell 2; Be transmitted to the interface protocol translation module 22 escape chips of the test cell 2 that is connected first at last by signal controlling module 21 chips, transfer to control module 4 via interface module 23 connections again.Wherein interface protocol translation module 22 adopts the interface protocol escape chip ATmega8-16AC of module groups; Being responsible for to be the bit manipulation instruction of EPM1270TC-144 chip based on the control module 4 instruction escapes of ASCII character, and be that control module 4 is returned in the instruction of ASCII with the bit manipulation instruction escape that the EPM1270TC-144 chip returns.Interface module 23 is interface chip MAX3232, realizes the conversion of Transistor-Transistor Logic level to the RS-232 level, thereby realizes being connected with the Physical layer of control module 5.

Workflow of the present invention is following:

Start proving installation of the present invention and control module 4; The measured point is connected to this device; Adopt the method that the test point 3 of measured body is realized grouped organizing among the present invention; Per 49 tested pilots 3 constitute a test cell 2, and the test cell 2 of some constitutes a test module 1, and each test module 1 takies a port of control module 4; And each test point 3, test cell 2 and test module 1 numbered, just can list the relation list of corresponding test module 1, test cell 2 and test point 3 thus.According to this relation table in control module 4; Through test mould group number, test cell number, test period configuration testing point 3, successively according to configuration arrangement test point 3 relation lists, promptly begin synchronous 2 pairs of test points 3 of each test cell after configuration finishes and test then; This device provides a high level respectively to the test point 3 of all measured bodies of connecting; This level signal is a small-signal, avoids destroying measured body, in the time of a certain single-point of test; This device is put this level point low; Then all points that are connected with this test point 3 all can be drawn and are low level, and testing of equipment is fetched the level of all test points 3, and then the set of all low level points is the network with this test point 3.Control module 4 has been gathered after the data of all test modules 1; Organize into groups analysis; And shine upon according to given relation list, according to given mould group number, unit number and test period the result is put in order and exports, obtain promptly reflecting that all measured points connect the net list of situation.In test process, the test cell 2 between each test module 1 is accomplished surveying work synchronously, simultaneously.Centralized control through control module 4; Guarantee to realize test synchronously between each test module 1; And test result returned to control module 4, and respectively test the number that module 1 comprises test cell 2 quantity and test module 1 through expansion, realizations needs the several measurement of test point 3.

Although content of the present invention has been done detailed introduction through above-mentioned preferred embodiment, will be appreciated that above-mentioned description should not be considered to limitation of the present invention.After those skilled in the art have read foregoing, for multiple modification of the present invention with to substitute all will be conspicuous.Therefore, protection scope of the present invention should be limited appended claim.

Claims

1. device that is used for testing electrical-connection topological structure; It is characterized in that; The connection terminal (5) that this device comprises control module (4), a plurality of test module (1) that is connected with control module (4), is connected with test module (1), and the test jack (6) that is connected with connection terminal (5); Described test module (1) comprises a plurality of test cells that are connected in series (2); Described test jack (6) connects a plurality of test points (3) on the measured body;

Described test cell (2) comprises signal controlling module (21).

2. the device that is used for testing electrical-connection topological structure as claimed in claim 1; It is characterized in that; A plurality of test cells (2) in the same described test module (1); One of them test cell (2) also comprises the interface protocol translation module (22) that is connected with signal controlling module (21), and the interface module (23) that is connected with interface protocol translation module (22); Described test module (1) is connected with control module (4) through interface module (23).