CN101777913A - Method for calibration of the gain error and input offset in ADC - Google Patents

Method for calibration of the gain error and input offset in ADC Download PDF

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CN101777913A
CN101777913A CN200910201560A CN200910201560A CN101777913A CN 101777913 A CN101777913 A CN 101777913A CN 200910201560 A CN200910201560 A CN 200910201560A CN 200910201560 A CN200910201560 A CN 200910201560A CN 101777913 A CN101777913 A CN 101777913A
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dac
gain error
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CN101777913B (en
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倪文海
王睿
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CANAANTEK Corp Ltd
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Abstract

The invention provides a method for calibration of the gain error and input offset in ADC. The steps are: increasing reference voltage VDAC to calibrate the gain error, and measure the input offset Doffset using the calibrated reference voltage VREF+VDAC, then calibrate the input offset on this base. The invention reduces the gain error and the input offset to a very small number through the calibration of the ADC and thus meeting the application needs for highly precise purposes.

Description

The method of the gain error of calibrating analog-to-digital converter and input imbalance
Technical field
The present invention relates to the gain error of a kind of calibrating analog-to-digital converter in the circuit design field and the method for input imbalance.
Background technology
Ideally, the analog to digital converter ADC of M position (M-bit) should be zero the input corresponding to zero output, and the transducer of (can regard the gain=1 that gains as) is exported in full width of cloth input corresponding to the full width of cloth.But can there be input imbalance and gain error in the side circuit.The input imbalance that is to say that the zero input of ADC can't be V in input only corresponding to zero output OffsetSituation under just have zero output, this just has been equivalent to import a fixing imbalance V OffsetAnd gain error be meant the input of the full width of cloth corresponding be not full width of cloth output, full width of cloth input may cause output to be overflowed or can't reach maximum output, seem just as there being gain error (gain error), make analog signal be exaggerated gain+gain error (G+GE) and doubly just be quantized later, as shown in Figure 1.Generally speaking, not high to input imbalance and the gain error requirement of ADC, but in the high-precision applications occasion, need the imbalance of ADC and gain error very little.For example, LTC2204[1] imbalance have only ± 1mV, externally import precise reference voltage source V REFThe time, gain error is 0.2%.The high-precision applications occasion needs the gain error of ADC and imports imbalance very little, because the input imbalance of unregulated ADC and gain error are limited by the technology mismatch parameter mainly and can't reduce, at this moment just need carry out extra calibration.
Summary of the invention
The method of the gain error of a kind of calibrating analog-to-digital converter provided by the invention and input imbalance makes that circuit still can meet design requirement under the prerequisite of technology mismatch.
In order to achieve the above object, the invention provides a kind of gain error of calibrating analog-to-digital converter and the method for input imbalance, comprise following steps:
The gain error GE of step 1, estimation maximum possible MaxGain error GE with the minimum permission Allowed
Calibration times N={ log that step 2, calculating need 2(GE Max/ GE Allowed), wherein, { m} represents to be not less than the smallest positive integral of m;
Step 3, set up reference voltage V DAC, this reference voltage V DACBe the N position, full amplitude output is ± V REF* GE Max, minimum resolution (1LSB) is V REF* GE Max/ 2 N-1
Step 4, make reference voltage output bit DAC=2 N-1, time=1;
Step 5, make input value V In=+V Full/ 2, (V FullBe maximum input amplitude), obtain outputting measurement value D Out=D1 is if noise ratio more greatly can be average in the hope of what repeatedly export;
Step 6, make input value V In=-V Full/ 2, obtain outputting measurement value D Out=D2 is if noise ratio more greatly can be average in the hope of what repeatedly export;
Step 7, make step-length bit Step=2 N-1-time
Step 8, judgement D1-D2 〉=2 M-1Whether (M is the figure place of analog to digital converter) sets up, if then make bit DAC=bit DAC+ bit Step, if not, then make bit DAC=bit DAC-bit StepThis also becomes the reference voltage of analog to digital converter into V REF+ V DAC=V REF* (1+GE Max/ 2), perhaps V REF+ V DAC=V REF* (1-GE Max/ 2);
Step 9, judge whether time 〉=N-1 sets up, if, carry out step 11, if not, carry out step 10;
Step 10, make time=time+1, carry out step 5;
Step 11, make input value V In=+V Full/ 2, obtain outputting measurement value D Out=D1;
Step 12, make input value V In=-V Full/ 2, obtain outputting measurement value D Out=D2;
Step 13, judgement D1-D2 〉=2 M-1Whether set up, if, finish the gain error calibration, carry out step 14, if not, then make bit DAC=bit DAC-1, finish the gain error calibration, carry out step 14;
V after step 14, the calibration of use gain error REF+ V DACAs reference voltage, make the input value V of analog to digital converter In=0, obtain outputting measurement value D Out=D;
Step 15, make D Offset=D-2 M-1
Because output is natural binary code, so the corresponding code value of zero input of analog to digital converter is 2 M-1, with D-2 M-1As input imbalance D OffsetValue;
Step 16, make D Out=D Out-D Offset
From the output valve of analog to digital converter, cut D Offset, be the output valve after the calibration input is lacked of proper care.
The present invention can make the gain error of analog to digital converter and import imbalance very little by calibration, satisfies the application need of high accuracy occasion.
Description of drawings
Fig. 1 is the schematic diagram of analog to digital converter in the background technology;
Fig. 2 is the flow chart of the gain error and the method that input is lacked of proper care of a kind of calibrating analog-to-digital converter provided by the invention;
Fig. 3 is the value of the preceding gain error of calibration in the embodiment of the invention;
Fig. 4 is the value of calibration back gain error in the embodiment of the invention;
Fig. 5 is the value that input is lacked of proper care before the calibration in the embodiment of the invention;
Fig. 6 is the value of calibration back input imbalance in the embodiment of the invention.
Embodiment
Following according to Fig. 2~Fig. 6, specify preferred embodiment of the present invention:
As shown in Figure 2, be a kind of gain error of calibrating analog-to-digital converter and the method for input imbalance, comprise following steps:
The gain error GE of step 1, estimation maximum possible MaxGain error GE with the minimum permission Allowed
Calibration times N={ log that step 2, calculating need 2(GE Max/ GE Allowed), wherein, { m} represents to be not less than the smallest positive integral of m;
Step 3, set up reference voltage V DAC, this reference voltage V DACBe the N position, full amplitude output is ± V REF* GE Max, minimum resolution (1LSB) is V REF* GE Max/ 2 N-1
Step 4, make reference voltage output bit DAC=2 N-1, time=1;
Step 5, make input value V In=+V Full/ 2, (V FullBe maximum input amplitude), obtain outputting measurement value D Out=D1 is if noise ratio more greatly can be average in the hope of what repeatedly export;
Step 6, make input value V In=-V Full/ 2, obtain outputting measurement value D Out=D2 is if noise ratio more greatly can be average in the hope of what repeatedly export;
Step 7, make step-length bit Step=2 N-1-time
Step 8, judgement D1-D2 〉=2 M-1Whether (M is the figure place of analog to digital converter) sets up, if then make bit DAC=bit DAC+ bit Step, if not, then make bit DAC=bit DAC-bit StepThis also becomes the reference voltage of analog to digital converter into V REF+ V DAC=V REF* (1+GE Max/ 2), perhaps V REF+ V DAC=V REF* (1-GE Max/ 2);
Step 9, judge whether time 〉=N-1 sets up, if, carry out step 11, if not, carry out step 10;
Step 10, make time=time+1, carry out step 5;
Step 11, make input value V In=+V Full/ 2, obtain outputting measurement value D Out=D1;
Step 12, make input value V In=-V Full/ 2, obtain outputting measurement value D Out=D2;
Step 13, judgement D1-D2 〉=2 M-1Whether set up, if, finish the gain error calibration, carry out step 14, if not, then make bit DAC=bit DAC-1, finish the gain error calibration, carry out step 14;
V after step 14, the calibration of use gain error REF+ V DACAs reference voltage, make the input value V of analog to digital converter In=0, obtain outputting measurement value D Out=D;
Step 15, make D Offset=D-2 M-1
Because output is natural binary code, so the corresponding code value of zero input of analog to digital converter is 2 M-1, with D-2 M-1As input imbalance D OffsetValue;
Step 16, make D Out=D Out-D Offset
From the output valve of analog to digital converter, cut D Offset, be the output valve after the calibration input is lacked of proper care.
In the step 16, only be to carry out subtraction at numeric field, so the analog to digital converter that analog quantitys such as amplifier imbalance are introduced input imbalance still exists, if this imbalance can cause that some circuit " overflows " in the analog to digital converter, calibration steps then of the present invention can not recover out.With the production line analog-digital converter is example, if ideally the output area of first order level circuit (Stage1) just equals the input range of second level level circuit (Stage2), the imbalance of the amplifier of Stage1 may cause the input range of its actual output area greater than Stage2 so, and some input information will " be lost ".But generally, circuit design can leave suitable surplus to non-ideal factors such as amplifier imbalances, and just the output area of Stage1 can be less than the input range of Stage2, so this method is still effective.Certainly, analog quantitys such as amplifier input imbalance can be along with variations in temperature, so, need to calibrate off and on.
Because consider various non-ideal factors in the circuit, (reference voltage is V before the gain error calibration in zero input of analog to digital converter REF+ 0) and after the gain error calibration (reference voltage is V REF+ V DAC) output code value may not be identical, so D OffsetInput imbalance in the time of should being real work under the reference voltage.
To 5000 analog to digital converters as an example, the effect of the calibrating installation that the diplomatic copy utility model provides.As shown in Figure 3, the gain error of these analog to digital converters before calibration is 2% (3 σ), and as shown in Figure 5, the input imbalance before the calibration is 10mV (3 σ).Target is that gain error is less than 0.1% after the calibration, and input imbalance is less than 1mV.The maximum possible gain error is made as ± 3%, i.e. the full width of cloth output of DAC is made as ± 3%*V REF, can calculate bit DAC=6.
After calibrating, as shown in Figure 4, the gain error of these analog to digital converters is controlled in 0.1%; As shown in Figure 6, the input imbalance can reach theoretic null value.
Although content of the present invention has been done detailed introduction by above preferred embodiment, will be appreciated that above-mentioned description should not be considered to limitation of the present invention.After those skilled in the art have read foregoing, for multiple modification of the present invention with to substitute all will be conspicuous.Therefore, protection scope of the present invention should be limited to the appended claims.

Claims (1)

1. the method for the gain error of a calibrating analog-to-digital converter and input imbalance is characterized in that the method includes the steps of:
The gain error GE of step estimation maximum possible MaxGain error GE with the minimum permission Allowed
Calibration times N={ log that step 2, calculating need 2(GE Max/ GE Allowed), wherein, { m} represents to be not less than the smallest positive integral of m;
Step 3, set up reference voltage V DAC, this reference voltage V DACBe the N position, full amplitude output is ± V REF* GE Max, minimum resolution (1LSB) is V REF* GE Max/ 2 N-1
Step 4, make reference voltage output bit DAC=2 N-1, time=1;
Step 5, make input value V In=+V Full/ 2, (V FullBe maximum input amplitude), obtain outputting measurement value D Out=D1 is if noise ratio more greatly can be average in the hope of what repeatedly export;
Step 6, make input value V In=-V Full/ 2, obtain outputting measurement value D Out=D2 is if noise ratio more greatly can be average in the hope of what repeatedly export;
Step 7, make step-length bit Step=2 N-1-time
Step 8, judgement D1-D2 〉=2 M-1Whether (M is the figure place of analog to digital converter) sets up, if then make bit DAC=bit DAC+ bit Step, if not, then make bit DAC=bit DAC-bit StepThis also becomes the reference voltage of analog to digital converter into V REF+ V DAC=V REF* (1+GE Max/ 2), perhaps V REF+ V DAC=V REF* (1-GE Max/ 2);
Step 9, judge whether time 〉=N-1 sets up, if, carry out step 11, if not, carry out step 10;
Step 10, make time=time+1, carry out step 5;
Step 1 makes input value V In=+V Full/ 2, obtain outputting measurement value D Out=D1;
Step 12, make input value V In=-V Full/ 2, obtain outputting measurement value D Out=D2;
Step 13, judgement D1-D2 〉=2 M-1Whether set up, if, finish the gain error calibration, carry out step 14, if not, then make bit DAC=bit DAC-1, finish the gain error calibration, carry out step 14;
V after step 14, the calibration of use gain error REF+ V DACAs reference voltage, make the input value V of analog to digital converter In=0, obtain outputting measurement value D Out=D;
Step 15, make D Offset=D-2 M-1
Because output is natural binary code, so the corresponding code value of zero input of analog to digital converter is 2 M-1, with D-2 M-1As input imbalance D OffsetValue;
Step 16, make D Out=D Out-D Offset
From the output valve of analog to digital converter, cut D Offset, be the output valve after the calibration input is lacked of proper care.
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Cited By (7)

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CN101655687B (en) * 2008-08-20 2011-11-09 鸿富锦精密工业(深圳)有限公司 Calibration system of voltage error
CN104254975A (en) * 2012-02-14 2014-12-31 赫梯特微波公司 Methods for calibrating pipeline analog-to-digital converters having multiple channels
CN105245227A (en) * 2015-11-09 2016-01-13 天津大学 Digital calibration method for image sensor column-level cycle ADC (Analog to Digital Converter)
CN108508385A (en) * 2018-03-06 2018-09-07 东南大学 A kind of low-cost and high-precision auto-correction method
CN110531296A (en) * 2019-08-09 2019-12-03 格威半导体(厦门)有限公司 The gain calibration methods thereof of battery management system
CN112600557A (en) * 2020-12-16 2021-04-02 东南大学 Pipeline ADC digital domain gain calibration method
CN113437974A (en) * 2021-07-14 2021-09-24 杭州海康微影传感科技有限公司 Single-slope analog-to-digital converter calibration method and system

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CN100452655C (en) * 2005-10-10 2009-01-14 东南大学 Self correcting multipath A/D converter
US7710303B2 (en) * 2007-04-17 2010-05-04 Microchip Technology Incorporated Analog-to-digital converter offset and gain calibration using internal voltage references
CN101222230B (en) * 2008-01-24 2010-04-21 上海萌芯电子科技有限公司 Assembly line type D/A convertor capable of calibrating capacitance mismatch and finite gain error

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CN101655687B (en) * 2008-08-20 2011-11-09 鸿富锦精密工业(深圳)有限公司 Calibration system of voltage error
CN104254975A (en) * 2012-02-14 2014-12-31 赫梯特微波公司 Methods for calibrating pipeline analog-to-digital converters having multiple channels
CN104254975B (en) * 2012-02-14 2017-11-03 赫梯特微波有限责任公司 Method and apparatus for calibrating the production line analog-digital converter with multiple passages
CN105245227A (en) * 2015-11-09 2016-01-13 天津大学 Digital calibration method for image sensor column-level cycle ADC (Analog to Digital Converter)
CN105245227B (en) * 2015-11-09 2018-08-31 天津大学 Digital calibrating method for imaging sensor row grade circulation A DC
CN108508385A (en) * 2018-03-06 2018-09-07 东南大学 A kind of low-cost and high-precision auto-correction method
CN110531296A (en) * 2019-08-09 2019-12-03 格威半导体(厦门)有限公司 The gain calibration methods thereof of battery management system
CN110531296B (en) * 2019-08-09 2022-05-10 格威半导体(厦门)有限公司 Gain calibration method of battery management system
CN112600557A (en) * 2020-12-16 2021-04-02 东南大学 Pipeline ADC digital domain gain calibration method
CN112600557B (en) * 2020-12-16 2023-08-01 东南大学 Pipelined ADC digital domain gain calibration method
CN113437974A (en) * 2021-07-14 2021-09-24 杭州海康微影传感科技有限公司 Single-slope analog-to-digital converter calibration method and system

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