CN101769912B - Adjusting platform for in-situ test probe for whole satellite surface heat control material - Google Patents
Adjusting platform for in-situ test probe for whole satellite surface heat control material Download PDFInfo
- Publication number
- CN101769912B CN101769912B CN200810188074.7A CN200810188074A CN101769912B CN 101769912 B CN101769912 B CN 101769912B CN 200810188074 A CN200810188074 A CN 200810188074A CN 101769912 B CN101769912 B CN 101769912B
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- switch
- high precision
- adjusting
- substrate
- bracket
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Abstract
The invention relates to an adjusting platform for an in-situ test probe for a whole satellite surface heat control material. The adjusting platform can realize accurate control for the distance between a switch adjusting plate (5) and the test probe through a height adjusting mechanism consisting of an adjusting nut (7), an adjusting screw (8) and a slide block (6). The adjusting platform can finish adjusting the positions of a high-precision switch and the test probe with high precision and high efficiency so as to greatly shorten the preparation period of in-situ measurement for the optical performance of the whole satellite surface heat control material and provide strong support for finishing each measurement task on time with high efficiency and high quality.
Description
Technical field
The present invention relates to a kind of high-accuracy mechanical position control apparatus, particularly, relate to a kind of rapid adjustment platform for whole satellite surface heat control material in-situ test probe.
Background technology
For grasping satellite in process of production and the situation of change of the front surface heat control material performance of dispatching from the factory, thereby better determine and judge the performance condition of satellite, the part satellite that China produces at present has brought into use surface in situ measuring technique that thermal control performance is exercised supervision and controlled.This test mainly completes by whole satellite surface in-situ test frock, and test probe part wherein coordinates high precision switch to form by portable tester.In measurement, the accuracy of measurement mainly guarantees by the depth of parallelism and the distance of tester aperture and measured surface.In order to guarantee above-mentioned two factors, be that accomplish the position of four high precision switches by controlling test probe surrounding at present.Traditional way is, test probe is arranged on test fixture, contrast test surfaces analog board is first determined the distance peace stroke degree of test probe and measured surface, and then repeatedly adjusts four high precision switches, until all high precision switches are all in same suitable plane.Owing to directly adjusting the position of the switch at simulation near surface, wayward precision, and make four switch haptic elements extremely be difficult for accomplishing in same plane, so often cause four high precision switch regulated efficiencies and effect all not ideal enough.
Summary of the invention
The object of this invention is to provide a kind of platform of adjusting, can high precision, expeditiously complete test probe position with and the adjustment of four high precision switches, thereby greatly shorten the preparatory period of whole satellite surface heat control material optical property in site measurement, complete each measurement task strong support is provided on time efficient, high-quality.
Of the present invention can being completed by following technical scheme:
A kind of adjustment platform for whole satellite surface heat control material in-situ test probe, the substrate of adjusting platform is rectangle, on its each angle, be provided with one for adjusting the adjusting nut of height, on real estate between the adjusting nut of a pair of opposite side of substrate, groove is set, in each groove, be provided with two slide blocks, lay respectively at the two ends of groove, and be connected with contiguous adjusting nut by adjusting screw rod, four slider support switches are adjusted dull and stereotyped, another of substrate that groove is not set to opposite side on, be provided with probe bracket, the two ends of probe bracket from substrate described another to outstanding certain altitude vertically upward opposite side, then both ends horizontal is folded to substrate middle part, the opposite side of two ends and substrate is linked to be entirety, in shaped door being buckled on substrate, switch adjustment flat board is contained in the space of probe bracket and substrate formation, probe bracket does not touch switch and adjusts dull and stereotyped, test probe is positioned on the horizontal component of probe bracket.
Wherein, test probe is made up of jointly optical tester, high precision measurement switch bracket and high precision switch, the annular high precision measurement switch bracket mating with tester outer shape is installed to optical tester lower horizontal, what the lower surface of switch bracket was vertical is provided with multiple high precision switches, and switch is distributed on switch bracket.
Wherein, not contact-making switch support and multiple high precision switch of the horizontal component of probe bracket.
Wherein, high precision switch is four.
Wherein, the cubic shaped that slide block is unfilled corner, the volume of disappearance is also cube.
Beneficial effect of the present invention is:
A. pop one's head in and take off from test fixture, adjustment separately, the large danger with easily touching measured surface of difficulty while having avoided online adjustment;
B. the haptic element contact-making switch of high precision switch is adjusted flat board, can accurately determine the installation site of high precision switch;
C. four jiaos of slopes flutings of switch adjustment platform guarantee steadily to fit with slide block inclined-plane, and can limit dull and stereotyped transverse shifting, height control is used slide block and screw nut mechanism, and what less slide block inclined-plane slope and screw nut adjustment had all guaranteed adjustment plate height can be accurately controlled.
Accompanying drawing explanation
Fig. 1 is for adjusting platform schematic diagram.
Wherein, 1 is optical tester, and 2 is high precision measurement switch bracket, and 3 is high precision switch, and 4 is probe bracket, and 5 adjust flat board for switch, and 6 is slide block, and 7 is adjusting nut.
Embodiment
Below in conjunction with accompanying drawing, the present invention is elaborated.
The annular high precision measurement switch bracket 2 mating with tester 1 outer shape is installed to optical tester 1 lower horizontal, and the lower surface of switch bracket 2 is vertically provided with multiple high precision switches 3, and switch 3 is distributed on switch bracket 2.The common composition test probe of optical tester 1, high precision measurement switch bracket 2 and high precision switch 3.Conventionally getting four switches 3 tests.
The substrate of adjusting platform is rectangle, on its each angle, be provided with one for adjusting the adjusting nut 7 of height, on real estate between the adjusting nut 7 of a pair of opposite side of substrate, groove is set, in each groove, be provided with two slide blocks 6, lay respectively at the two ends of groove, and be connected with contiguous adjusting nut 7 by adjusting screw rod 8.Four slide block 6 supporting switch adjust dull and stereotyped 5.The cubic shaped that slide block 6 is unfilled corner, the volume of disappearance is also cube, this shape energy limit switch is adjusted dull and stereotyped 5 transverse shifting.Rotate the adjusting nut 7 on four angles, can make four corresponding slide blocks 6 slide in groove, thereby switch adjustment flat board 5 is moved up and down thereupon.Another of substrate that groove is not set to opposite side on, be provided with probe bracket 4, the two ends of probe bracket 4 from substrate described another to outstanding certain altitude vertically upward opposite side, then level is folded to substrate middle part, the opposite side of two ends and substrate is linked to be entirety, in shaped door being buckled on substrate, is contained in switch adjustment flat board 5 in the space of probe bracket 4 and substrate formation, adjusts dull and stereotyped 5 but do not touch switch.
Test probe is positioned on probe bracket 4, makes the detection aperture of tester down, now switch 3 and switch bracket 2 are in relaxation state.Then rotate four adjusting nuts 7 on angle, moving up and down in process, detect aperture and the switch of tester and adjust the relative position between dull and stereotyped 5, just stop adjusting until switch adjustment flat board 5 reaches correct position.Then, then the haptic element that makes each high precision switch 3 all adjusts dull and stereotyped 5 position in the switch of just fitting, floatless switch 3 immediately, thus complete the adjustment of test probe.Finally take off test probe, be installed on satellite test frock.
Although above the specific embodiment of the present invention has been given to describe in detail and explanation; but what should indicate is; we can carry out various equivalences to above-mentioned embodiment according to conception of the present invention and change and revise; when its function producing does not exceed spiritual that instructions and accompanying drawing contain yet, all should be within protection scope of the present invention.
Claims (4)
1. the adjustment platform for whole satellite surface heat control material in-situ test probe, it is characterized in that, the substrate of adjusting platform is rectangle, on its each angle, be provided with one for adjusting the adjusting nut (7) of height, on real estate between the adjusting nut (7) of one opposite side of substrate, two grooves are set, in each groove, be provided with two slide blocks (6), two slide blocks (6) lay respectively at the two ends of groove, and be connected with contiguous adjusting nut (7) by adjusting screw rod (8), four slide blocks (6) supporting switch is adjusted dull and stereotyped (5), another of substrate that groove is not set to opposite side on, be provided with probe bracket (4), the two ends of probe bracket (4) from substrate described another to outstanding certain altitude vertically upward opposite side, then level is folded to substrate middle part, be linked to be entirety with the opposite side of substrate, in shaped door being buckled on substrate, switch adjustment dull and stereotyped (5) is contained in the space of probe bracket (4) and substrate formation, probe bracket (4) does not touch switch and adjusts dull and stereotyped (5), test probe is positioned on the horizontal component of probe bracket (4), wherein, slide block is unfilled corner cubic shaped.
2. adjustment platform as claimed in claim 1, it is characterized in that, test probe is made up of jointly optical tester (1), high precision measurement switch bracket (2) and high precision switch (3), the annular high precision measurement switch bracket (2) mating with optical tester (1) outer shape is installed to optical tester (1) lower horizontal, what the lower surface of high precision measurement switch bracket (2) was vertical is provided with multiple high precision switches (3), and high precision switch (3) is distributed on high precision measurement switch bracket (2).
3. adjustment platform as claimed in claim 2, is characterized in that, the horizontal component of probe bracket (4) is contact-making switch support (2) and multiple high precision switch (3) not.
4. adjust as claimed in claim 2 or claim 3 platform, it is characterized in that, high precision switch (3) is four.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200810188074.7A CN101769912B (en) | 2008-12-29 | 2008-12-29 | Adjusting platform for in-situ test probe for whole satellite surface heat control material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200810188074.7A CN101769912B (en) | 2008-12-29 | 2008-12-29 | Adjusting platform for in-situ test probe for whole satellite surface heat control material |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101769912A CN101769912A (en) | 2010-07-07 |
| CN101769912B true CN101769912B (en) | 2014-05-28 |
Family
ID=42502901
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200810188074.7A Expired - Fee Related CN101769912B (en) | 2008-12-29 | 2008-12-29 | Adjusting platform for in-situ test probe for whole satellite surface heat control material |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101769912B (en) |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2101657U (en) * | 1991-07-15 | 1992-04-15 | 秦皇岛市海港耀华玻璃机械厂 | Horizontal conveying righting device for thin sheet material |
| JP4684507B2 (en) * | 1999-07-05 | 2011-05-18 | ノバルティス アーゲー | How to use the sensor platform |
| CN2683547Y (en) * | 2004-01-20 | 2005-03-09 | 碧悠国际光电股份有限公司 | Glass substrate dressing apparatus |
-
2008
- 2008-12-29 CN CN200810188074.7A patent/CN101769912B/en not_active Expired - Fee Related
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| Publication number | Publication date |
|---|---|
| CN101769912A (en) | 2010-07-07 |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140528 Termination date: 20201229 |