CN101738652A - Method for preparing ultrawide wave band high antireflection film combining three lights - Google Patents

Method for preparing ultrawide wave band high antireflection film combining three lights Download PDF

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CN101738652A
CN101738652A CN200910263403A CN200910263403A CN101738652A CN 101738652 A CN101738652 A CN 101738652A CN 200910263403 A CN200910263403 A CN 200910263403A CN 200910263403 A CN200910263403 A CN 200910263403A CN 101738652 A CN101738652 A CN 101738652A
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film
substrate
ultrawide
lights
wave band
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CN101738652B (en
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王平秋
周九林
刘琼
薛锦
贺祥清
于清
代礼密
安晓强
周欢
范卫星
方黎明
张玉东
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South West Institute of Technical Physics
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South West Institute of Technical Physics
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Abstract

The invention discloses a method for preparing an ultrawide wave band high antireflection film combining three lights. With the method, the design and the plating of a high antireflection plating film with the ultrawide range of multiple optical bands including visible light, near-infrared light and mid-infrared light can be realized. The invention can improve the humidity resistance and the resistance capability of laser induced damage of the film and prolong the service life of the film in a field harsh environment. The invention can be realized by the following technical scheme: (1) using a lithium fluoride or barium fluoride crystal material as a substrate and counting the optical thickness value of each film layer by using a film system design formula of G/4M6H2LM0.6L0.3M/A; (2) cleaning the plated substrate; (3) mildly baking the substrate; (4) bombarding the substrate by ion sources before film plating and in the process of film plating; (5) placing Al2O3, SiO and MgF2 into a rotating electron gun evaporation source crucible and finishing film plating by using an optical vacuum plating machine according to the formula sequence and the thickness value of the step (1); and (6) carrying out annealing treatment. The invention solves the technical difficulty of insecure film plating on deliquescent soft crystal materials.

Description

The preparation method of ultrawide wave band high antireflection film combining three lights
Technical field
The invention relates to the method that is coated with optical thin film, more particularly, the invention relates to the plating method of three optical bands (TV, laser and infrared) optical system broadband high antireflection film.
Background technology
Anti-reflection film is a kind of as optical thin film, is widely used in various optics and infrared components and parts, solar cell and the high-power laser system.Existing at present a lot of dissimilar anti-reflection films can satisfy the part practical application in optics and infrared technique field.And practical application widely improves constantly the requirement of anti-reflection film combination property.The high very widely anti-reflection coating of present known application generally can only be coated with the high antireflection film of mean transmissivity 〉=98%~99% narrow wavelength band (extending wave band 0.7~1.0um or single-point wavelength 1.064um such as visible light).This high antireflection film generally be in a plated film substrate, be coated with a single-point optical wavelength (as near infrared 1.064um) or optical region (as in infrared by 3.7~4.8um), maximum two optical regions are (as visible light and near infrared, 0.53um the anti-reflection film in the scope and 1.064um), in other words at present the high anti-reflection coating of preparation can only visible light, near infrared and in select one in infrared three optical regions, or maximum two optical regions are coated with.Because its high anti-reflection wavelength coverage is not wide, therefore can not directly apply to the optical design of specific (special) requirements such as laser and infrared guidance technology, can not satisfy in laser and the infrared guidance round the clock type three light (TV, laser and infrared) optical system visible light extend wave band (0.7~1.0um), near infrared (1.064um) and in infrared (3.7~4.8um) the anti-reflection requirement of super broadband scope height.
Because the high antireflection film of above-mentioned three optical regions not only requires rete to be coated with very securely and covers on the optical substrate substrate of commute deliquescence soft crystal (LiF and BaF 2) also to have the protection effect that prevents from air to continue deliquescence, and the single face mean transmissivity index request of each wave band reach 〉=98%~99%.Yet all in the prior art to relate to the available infrared coating materials kind of infrared broadband high antireflection film few, and film is that the design and processes difficulty is very big.And present existing optical coating technology can only select for use such as: quartzy, K9 glass, hard materials such as Si and Ge are done the plated film substrate, could guarantee that rete is firm.Conventional rete uses in wet environment and places, and the surface contacts with air moisture, and the transmitance of anti-reflection film and anti-outlet capacity can descend gradually, and the resisting laser damage ability of rete reduces gradually, and rugged surroundings are used for a long time in the open air.
Summary of the invention
In order to overcome the high anti-reflection coating technology of present routine only limits to be coated with the narrow high antireflection film of single-point or wavelength coverage in the hard material substrate defective, the invention provides a kind of can satisfy visible light, near infrared in the super broadband area requirement of infrared three photosystems, rete is hard firmly, humidity resistance is good, the resisting laser damage ability is strong, and field extreme environment uses the preparation method of permanent ultrawide wave band high antireflection film combining three lights.
Above-mentioned purpose of the present invention can reach by following measure: the preparation method of a kind of ultrawide wave band high antireflection film combining three lights provided by the invention is characterized in that this method comprises by following process for plating step and forming that step is as follows:
(1) with lithium fluoride (LiF) or barium fluoride (BaF 2) crystalline material is substrate, is design formula with film: G/4M6H2LM0.6L0.3M/A,
Calculate the optical thickness value of every tunic and the lattice of tabulating in order, wherein, G is LiF or BaF 2The crystalline material substrate, M is Al 2O 3Coating materials, H are the SiO coating materials, and L is MgF 2Coating materials, A are refractive index N A=1 air dielectric, film are reference wavelength λ c=860nm; The electron gun evaporation source crucible of above-mentioned M, H, L coating materials being put into successively the coating machine vacuum chamber is standby;
(2) in plated film substrate ultrasonic cleaning process,, dried up by the plating substrate with the cleaning fluid cleaning, put into vacuum chamber and vacuumize to be plated;
(3) the baking substrate of heating, under vacuum environment, baking gradually heats up in 30 ℃~150 ℃ scopes;
(4) in bonding bottoming technology of optical film and stress matching technique, be the optical thickness value and the form order of each tunic of calculating of design formula according to aforementioned films, with Al 2O 3, SiO and MgF 2It is 100~120 rev/mins rotating electron rifle evaporation source crucible that three kinds of coating materials are put into speed of rotation successively, finishes plated film with the optics vacuum coating equipment by the formula tab sequential and the one-tenth-value thickness 1/10 of described step (1) then;
(5) in the auxiliary evaporation process of ion gun, before plated film He in the coating process, bombard substrate with ion gun; Allow the ion beam bombardment substrate of its generation finish to plated film always;
(6) in high low temperature annealing process, the LiF and the BaF of film will have been plated 2Crystal carries out annealing in process after vacuum chamber naturally cools to room temperature.
The present invention has following beneficial effect than prior art
(1) high antireflection film with the inventive method preparation has very wide multiband scope.The present invention is with LiF and BaF 2For substrate finish from visible light, near infrared to the optimization film system design of infrared three photosystem broadband high antireflection films and the high antireflection film of three different optical wave bands of covering (length) of being coated with, not only rete is firm, and reaching rete single face mean transmissivity 〉=98%~99% simultaneously at these three optical regions (length), the transparent nothing of whole broadband scope absorbs.Having solved prior art can only be at an optical region (too many by two optical region), and narrow wavelength band is coated with the deficiency of high antireflection film.
(2) because film of the present invention system is designed to the design of optimized broadband film system, and the thick control of each tunic has 5% with interior error range in the permission coating process, this can make the yield rate of product bring up near 100%.
(3) A of the present invention's employing: plated film substrate ultrasonic cleaning process, B: ion gun is assisted evaporation process, C: the bonding bottoming technology of optical film, D: optical film stress matching technique, E: the technology that high low temperature annealing process etc. are special.Deliquescence soft crystal infra-red material LiF and BaF have been solved 2On be coated with the rete firmness technology difficult problem of multilayer broadband high antireflection film.Product proves that by+70~-55 ℃ of high/low-temperature impact experiments and long-term field trial rete is hard firmly, and resisting laser damage is functional.
(4) the plated film substrate has good protection against the tide and protection effect.Because the moistureproof rete of hard has completely cut off LiF and BaF 2The surface contacts with air moisture, makes high antireflection film have commute deliquescence soft crystal LiF and BaF simultaneously 2In air, prevent the defencive function of its further deliquescence, for optical system components in the open air rugged surroundings use for a long time, implement round-the-clock round-the-clock recognition objective assurance be provided.
The present invention can be used for the equipment and instrument of TV, laser and infrared three light path optical systems, and to improving its optical property, the weight and volume that reduces instrument is significant.The present invention has realized laser and infrared guidance technology from the past can only be by day, or can only realize the function transition of round-the-clock round-the-clock automatic recognition objective in the deficiency of recognition objective at night.
Embodiment
Further specify the present invention below by embodiment.In following examples,
Embodiment 1
At first use optical thin film design software (TFC) design of United States advanced to meet the optimization film system of the technology of the present invention index request.With lithium fluoride (LiF) or barium fluoride (BaF through optics processing 2) crystalline material be substrate (lens or plain film) at its surface coating, be design formula with film:
G/4M6H2LM0.6L0.3M/A,
Calculate the optical thickness value and the row lattice in order of every tunic.G is that refractive index is N in the formula G=1.38 or 1.45, represent lithium fluoride (LiF) or barium fluoride (BaF 2) substrate of crystalline material, M is refractive index N M=1.60 Al 2O 3Coating materials, H are refractive index N H=1.80 SiO coating materials, L are refractive index N L=1.38 MgF 2Coating materials, A are refractive index N A=1 air dielectric, film are reference wavelength λ c=860nm.(above M, H, L are purity 99.9% granular film material)
This film system can be made up of 6 tunics from the inside to surface, sees Table 1 by the optical thickness value of 6 each layers of tunic of above-mentioned formula calculation Design:
Table 1 (is LiF and the BaF that formula calculates according to film among the embodiment 1 2The tabulation of crystal 6 tunic optical thickness theoretical mean)
Sequence number Ground floor 4M Second layer 6H The 3rd layer of 2L The 4th layer of M Layer 5 0.6L Layer 6 0.3M
The optical thickness of rete (nm) ??860 ??1290 ??430 ?215 ??129 ??64.5
Film is the design formula explanation:
(1) table 1 is to get LiF and BaF 2The mean value of substrate refractive index and be the 6 tunic optical thickness theoretical values tabulation that design formula is calculated according to film.Because LiF and BaF 2Refractive index is approaching, and this film system can adopt same design to these two kinds of materials, and technical indicator all reaches requirement.
(2) in order to guarantee the rete firmness, this film is the distributing order of three kinds of coating materials M, H and L in the design formula, should meet the technical requirement of " the bonding bottoming technology of optical film " and technologies such as " optical film stress matching techniques ".The bonding bottoming technology of optical film be with LiF and BaF 2The 4M tunic material (Al that substrate is bonding 2O 3) being coated on ground floor, can play a key effect to whole rete firmness.Optical film stress matching technique is: at film is on design and coating materials are arranged, with above-mentioned H, M, three kinds of coating materials of L according to its stress characteristics, make compressive stress coating materials and tension stress coating materials alternately arrange (stress coupling) can play an important role to whole rete firmness.
Finish the technology of table 1, available common homemade vacuum coating equipment is finished, (such as: the ZZ800 molding box formula vacuum coating equipment that the modern Nan Guang in Chengdu factory produces), its main technique condition comprises:
Optically coated specialized equipment: vacuum coating equipment during use, can be evacuated to 10 with coating chamber with vacuum pump -2~10 -3The Pa magnitude, the various coating materials of putting into vacuum chamber in advance form vapour molecule under electron gun (producing the crucible of high pressure, high temperature) effect, adhere to (growth) successively at the optical element substrate surface by designing requirement.
Light-operated, i.e. blooming control system, as the crucial accessory of vacuum coating equipment, " light-operated " instrument is according to the interference of light principle, converts the light signal of plated film to electric signal, accurately the optically coated one-tenth-value thickness 1/10 of identification record.
Brilliant control, i.e. crystal oscillator film thickness monitoring system." brilliant control " instrument adheres to the principle that thickness (weight) is directly proportional according to the oscillation frequency of quartz crystal and different coating materials and converts the optical thickness value to, also is used for the optically coated geometric thickness value of detection in the vacuum chamber.
Ion gun can be selected Kaufman type ion gun assistant depositing device for use.In the coating process, this device can produce the high energy ion bundle in vacuum chamber, auxiliary coating materials molecule fast and high-energy be deposited on substrate surface.It is the important means that improves the rete firmness.
Electron gun is an e type electron beam evaporation source.Be the copper crucible of the most frequently used a kind of circular porous evaporation coating materials, high pressure filament ejected electron bundle is got on the coating materials with 270 ° of angles, makes the coating materials evaporation.
Baking can realize with the heated baking device.Can select common resistance wire formula quartz ampoule electric heating device for use, the temperature that is used for vacuum chamber (comprising the plated film substrate) heats up.
The process for plating step is as follows:
(1) clean vacuum chamber and load coating materials.After in the coating machine vacuum chamber, finishing big cleaning, be that three kinds of coating materials: M are Al in the design formula with above-mentioned film 2O 3, H is SiO, L is MgF 2, be purity 99.9% graininess crystal coating materials is put into rotatable electron gun evaporation source crucible successively, uses when waiting for the back coating evaporation.
(2) cleaning is by the plating substrate, with LiF and BaF 2Crystal is put into and is filled the supersonic wave cleaning machine that ethanol (analysis of purity 〉=99.5% is pure) is made cleaning fluid, and gear cleaned 10 minutes in using; Use acetone (analysis of purity 〉=99.5% is pure) cleaning fluid again instead and cleaned 10 minutes, dry up with high pure nitrogen, put into clean vacuum chamber load plate frame and close the door vacuumize to be plated.
(3) the baking substrate of heating is when being evacuated down to 10 -3During the Pa magnitude, open the heated baking device.Add baking since 30 ℃, per 10 ℃ of constant temperature 10 minutes slowly heat up, and can guarantee that soft crystal does not burst, and are raised to 150 ℃ of insulations 90~120 minutes always, in the whole temperature-rise period, and device LiF and BaF 2The load plate of diaphragm substrate is by 20 rev/mins of speed Rotating with Uniform.
(4) bombardment substrate before the ion gun plating: before the formal plated film, the source parameters of Kaufman type ion gun assistant depositing device is transferred to: plate voltage 600~700V, line 90~100mA fills the high-purity argon gas Ar or the oxygen O of four 9 of purity 2, with the inflation and vacuum-control(led) system with vacuum degree control 8 * 10 -3Pa~9 * 10 - 3Between the Pa, the ion beam bombardment LiF or the BaF that allow ion gun produce 2Substrate 20 minutes.
(5) finish the coating materials evaporation in order: according to aforementioned films is the order of the since the 1st to the 6th layer of design formula and the optical thickness value plated film of each tunic that form calculates.The judgement of optical thickness value is as the criterion with each layer optical thickness value that " light-operated " shows, each tunic geometric thickness value that " brilliant control " shows is the reference of calculating optical one-tenth-value thickness 1/10, and the coefficient before each tunic of formula is the multiple value that " light-operated " walks the quarter-wave extreme value.During this time, Kaufman type ion gun assistant depositing device is in running order always, and parameter and above-mentioned steps (4) are just the same.In whole coating materials evaporation process, vacuum tightness is 8 * 10 in the vacuum chamber of coating machine -3Pa~9 * 10 -3Pa, " electron gun " evaporation rate is: Al 2O 31~1.2nm/s, SiO 2~2.5nm/s, MgF 20.6~0.8nm/s; Substrate diaphragm load plate Workpiece Rotating speed is 100~120 rev/mins.In the whole coating process that is right after, keep above-mentioned source parameters constant, allow the ion beam bombardment substrate of its generation finish to plated film always.
(6) annealing in process: the LiF and the BaF that have plated film 2Crystal fills high pure nitrogen and enters vacuum chamber after vacuum chamber naturally cools to room temperature, opens behind the door to take out and transfers to common drying box and begin annealing in process.Begin to heat up from 40C, 10 ℃ of every intensifications are constant temperature 10 minutes again, is raised to 130 ℃ always, and constant temperature begins cooling after 8~10 hours, and constant temperature is 10 minutes after 10 ℃ of every coolings, drop to always 40 ℃ of normal temperature can take out detect stand-by.
Embodiment 2
By the method for the optical thickness value repeated experiments embodiment 1 of 6 each layers of tunic of calculation Design in the above-mentioned table 1, each layer optical thickness that to adopt optimization film of the present invention be formula and table 1, in the coating process step:
(1) repeat processing step (1) among the embodiment 1,
(2) repeat processing step (2) among the embodiment 1, just will be fixed as and place LiF by the plating substrate.
(3) repeat processing step (3) among the embodiment 1, the fixing at last insulation of the temperature of the baking substrate of just will heating 90 minutes.
(4) repeat processing step (4) among the embodiment 1: before the formal plated film in parameter aspect source parameters is transferred to plate voltage and is fixed as 650V, line is fixed as 90mA, fills the high-purity argon gas Ar of four 9 of purity, and vacuum degree control is fixed on 8 * 10 -3Pa, the ion beam bombardment LiF substrate of generation 20 minutes.
(5) repeat processing step (5) among the embodiment 1, the parameter aspect: vacuum tightness is for fixing 8 * 10 during evaporation -3Pa, evaporation rate is fixed as: Al 2O 31nm/s, SiO 2nm/s, MgF 20.6nm/s; Workpiece Rotating speed is fixed as 100 rev/mins.
The actual optical thickness of each tunic of record saw Table 2 after plated film was finished:
Table 2 (the optical thickness value tables of the embodiment 2 actual LiF crystal 6 tunics that are coated with)
Sequence number Ground floor 4M Second layer 6H The 3rd layer of 2L The 4th layer of M Layer 5 0.6L Layer 6 0.3M
The optical thickness of rete (nm) ??867 ??1305 ??425 ?216 ??134 ??66
Annotate: do not get a position radix point value afterwards, because of precision enough reaches design proposal.
(6) annealing in process: repeat processing step (6) among the embodiment 1, after just annealing was warmed up to 130 ℃, fixedly constant temperature began cooling after 8 hours.
Embodiment 3
By the method for the optical thickness value repeated experiments embodiment 1 of 6 each layers of tunic of calculation Design in the above-mentioned table 1, each layer optical thickness that to adopt optimization film of the present invention be formula and table one, in the coating process step:
(1) repeats processing step (1) among the embodiment 1.
(2) repeat processing step (2) among the embodiment 1, just will be fixed as and place BaF by the plating substrate 2
(3) repeat processing step (3) among the embodiment 1, the fixing at last insulation of the temperature of the baking substrate of just will heating 150 minutes.
(4) repeat processing step (4) among the embodiment 1: the parameter aspect, before the formal plated film, source parameters to be transferred to plate voltage to be fixed as 700V, line is fixed as 100mA, fills the high purity oxygen gas O of four 9 of purity 2, vacuum degree control is being fixed 9 * 10 -3Pa, the ion beam bombardment BaF of generation 2Substrate 20 minutes.
(5) repeat processing step (5) among the embodiment 1, the parameter aspect: evaporation rate is fixed as: Al 2O 31.2nm/s, SiO 2.5nm/s, MgF 20.8nm/s; Workpiece Rotating speed is fixed as 120 rev/mins
The actual optical thickness of each tunic of record saw Table 3 after plated film was finished:
Table 3 (the embodiment 3 actual BaF that are coated with 2The optical thickness value table of crystal 6 tunic)
Sequence number Ground floor 4M Second layer 6H The 3rd layer of 2L The 4th layer of M Layer 5 0.6L Layer 6 0.3M
The optical thickness of rete (nm) ??854 ??1279 ??418 ?210 ??125 ??62
Remarks: do not get a position radix point value afterwards, because of precision enough reaches design proposal.
(6) repeat processing step (6) among the embodiment 1, after just annealing was warmed up to 130 ℃, fixedly constant temperature began cooling after 10 hours.
Every characteristic index test result that the foregoing description is coated with rete is as follows:
(1) the single face mean transmissivity at three optical regions (length) is:
Visible light extends wave band: 0.7~1.0um, T 〉=97%
Near-infrared wavelength: 1.064um T 〉=99%
Middle-infrared band: 3.7~4.8um T 〉=99%
More than the average single face transmitance T of three optical regions (length) 〉=98%~99%,
(2) rete fastness and resisting laser damage test: all satisfy the requirement of optical thin film national Specification, and by air standard+70~-55 ℃ high/low-temperature impact experiment.
(3) rete humidity resistance: satisfy the requirement of optical thin film national Specification, by the field use and water in multinomial ultrawide wave band high antireflection film combining three lights commute deliquescence soft crystal material LiF and the BaF that experiment showed, that the foregoing description prepares such as soak 2Extraordinary moisture protection effect is arranged.

Claims (9)

1. the preparation method of a ultrawide wave band high antireflection film combining three lights is characterized in that, this method comprises by following process for plating step and forming that step is as follows:
(1) with lithium fluoride (LiF) or barium fluoride (BaF 2) crystalline material is substrate, is design formula with film: G/4M6H2LM0.6L0.3M/A,
Calculate the optical thickness value of every tunic and the lattice of tabulating in order, wherein, G is LiF or BaF 2The crystalline material substrate, M is Al 2O 3Coating materials, H are the SiO coating materials, and L is MgF 2Coating materials, A are refractive index N A=1 air dielectric, film are reference wavelength λ c=860nm; The electron gun evaporation source crucible of above-mentioned M, H, L coating materials being put into successively the coating machine vacuum chamber is standby;
(2) in plated film substrate ultrasonic cleaning process,, dried up by the plating substrate with the cleaning fluid cleaning, put into vacuum chamber and vacuumize to be plated;
(3) the baking substrate of heating, under vacuum environment, baking gradually heats up in 30 ℃~150 ℃ scopes;
(4) in bonding bottoming technology of optical film and stress matching technique, be the optical thickness value and the form order of each tunic of calculating of design formula according to aforementioned films, with Al 2O 3, SiO and MgF 2It is 100~120 rev/mins rotating electron rifle evaporation source crucible that three kinds of coating materials are put into speed of rotation successively, finishes plated film with the optics vacuum coating equipment by the formula tab sequential and the one-tenth-value thickness 1/10 of described step (1) then;
(5) in the auxiliary evaporation process of ion gun, before plated film He in the coating process, bombard substrate with ion gun; Allow the ion beam bombardment substrate of its generation finish to plated film always;
(6) in high low temperature annealing process, the LiF and the BaF of film will have been plated 2Crystal carries out annealing in process after vacuum chamber naturally cools to room temperature.
2. the preparation method of ultrawide wave band high antireflection film combining three lights as claimed in claim 1 is characterized in that, described plated film substrate ultrasonic cleaning process is with LiF and BaF 2Crystal is put into and is filled the supersonic wave cleaning machine that ethanol is made cleaning fluid, and gear cleaned 10 minutes in selecting for use, uses the acetone cleaning fluid again instead and cleans 10 minutes, dries up with high pure nitrogen, put into clean vacuum chamber load plate frame and close the door vacuumize to be plated.
3. the preparation method of ultrawide wave band high antireflection film combining three lights as claimed in claim 1 is characterized in that, the bonding bottoming technology of described optical film, be with LiF and BaF 2The 4M tunic material (Al that substrate is bonding 2O 3) be coated on ground floor.
4. the preparation method of ultrawide wave band high antireflection film combining three lights as claimed in claim 1, it is characterized in that, described optical film stress matching technique, be with above-mentioned H, M, three kinds of coating materials of L according to its detected stress characteristics, compressive stress coating materials and tension stress coating materials are alternately arranged.
5. the preparation method of ultrawide wave band high antireflection film combining three lights as claimed in claim 1 is characterized in that, when heating the baking substrate, when being evacuated down to 10 -3During the Pa magnitude, add baking since 30 ℃, per 10 ℃ of constant temperature 10 minutes, slowly intensification is raised to 150 ℃ of insulations 120 minutes, 20 rev/mins of Workpiece Rotating always.
6. the preparation method of ultrawide wave band high antireflection film combining three lights as claimed in claim 1, it is characterized in that, described ion gun is assisted evaporation process, be before plated film, source parameters to be transferred to: plate voltage 600~700V, line 90~100mA fills the high-purity argon gas Ar or the oxygen O of four 9 of purity 2, with vacuum degree control 8 * 10 -3Pa~9 * 10 -3Between the Pa, with the ion beam bombardment LiF or the BaF that produce 2Substrate 20 minutes.
7. the preparation method of ultrawide wave band high antireflection film combining three lights as claimed in claim 1 is characterized in that, high low temperature annealing process is to have plated the LiF and the BaF of film 2After diaphragm naturally cools to room temperature, transfer to drying box from vacuum chamber again and carry out annealing in process: since 40 ℃ of intensifications, 10 ℃ of every intensifications are constant temperature 10 minutes again, be raised to 130 ℃, constant temperature was lowered the temperature after 8~10 hours always, 10 ℃ of constant temperature of every cooling 10 minutes, drop to 40 ℃ of normal temperature, taking-up detects stand-by.
8. the preparation method of ultrawide wave band high antireflection film combining three lights as claimed in claim 1 is characterized in that, described film is is to be made up of 6 tunics from the inside to surface, by the optical thickness value of each tunic of above-mentioned steps (1) formula calculation Design.
9. the preparation method of ultrawide wave band high antireflection film combining three lights as claimed in claim 8 is characterized in that, the optical thickness value of described each tunic is as shown in the table:
Sequence number Ground floor 4M Second layer 6H The 3rd layer of 2L The 4th layer of M Layer 5 0.6L Layer 6 0.3M The optical thickness of rete (nm) ??860 ??1290 ??430 ??215 ??129 ??64.5
CN2009102634034A 2009-12-15 2009-12-15 Method for preparing ultrawide wave band high antireflection film combining three lights Expired - Fee Related CN101738652B (en)

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