CN101738566B - Detection module - Google Patents

Detection module Download PDF

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Publication number
CN101738566B
CN101738566B CN2008103056060A CN200810305606A CN101738566B CN 101738566 B CN101738566 B CN 101738566B CN 2008103056060 A CN2008103056060 A CN 2008103056060A CN 200810305606 A CN200810305606 A CN 200810305606A CN 101738566 B CN101738566 B CN 101738566B
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CN
China
Prior art keywords
detection module
connector
many
lead
switch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2008103056060A
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Chinese (zh)
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CN101738566A (en
Inventor
裴永斌
涂成达
林承贤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Avary Holding Shenzhen Co Ltd
Zhending Technology Co Ltd
Original Assignee
Fukui Precision Component Shenzhen Co Ltd
Zhending Technology Co Ltd
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Publication date
Application filed by Fukui Precision Component Shenzhen Co Ltd, Zhending Technology Co Ltd filed Critical Fukui Precision Component Shenzhen Co Ltd
Priority to CN2008103056060A priority Critical patent/CN101738566B/en
Publication of CN101738566A publication Critical patent/CN101738566A/en
Application granted granted Critical
Publication of CN101738566B publication Critical patent/CN101738566B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The invention relates to a detection module for detecting a plurality of contacts of a connector. The detection module comprises an emulation board and an adapter plate, wherein the emulation board corresponds to the connector and comprises a substrate, a plurality of contact pads and a plurality of first connecting wires in one-to-one correspondence with the contact pads; the substrate has an opposite first surface and a second surface, the plurality of contact pads are formed on the second surface, the plurality of first connecting wires run through the first and the second surfaces, the adapter plate corresponds to a test stand and comprises a plurality of adapter pads and a plurality of second connecting wires connected with the adapter pads one by one; the plurality of contact pads correspond to the plurality of contacts of the connector in one-to-one correspondence; the plurality of the first connecting wires are used for connecting the plurality of contact pads with the plurality of adapter pads one by one; and the plurality of second connecting wires are used for connecting the test stand so as to detect the plurality of contacts of the connector.

Description

Detect module
Technical field
The present invention relates to a kind of pick-up unit, relate in particular to a kind of detection module of connector.
Background technology
Recently, the mobile phone that has a camera function receives widely and using.Along with the requirement of people, be installed on camera module in the mobile phone also to the trend development of miniaturization to the miniaturization of mobile phone.See also document Challenges of megapixel camera module assembly and test, Chowdhury, A; Darveaux, R.; Electronic Components and Technology Conference, 2005.Proceedings.55th31 May-3 June 2005Page (s): 1390-1401 Vol.2.The camera module is pegged graft with the connector that is welded on the circuit board usually, then circuit board is connected with the mainboard of mobile phone, thus the function of realization camera module.
After being packaged with connector on the circuit board, need the electrically conducting performance of testing circuit printed line road and connector.Yet the connector that encapsulates on the circuit board is not only dark but also little, brings a lot of inconvenience to detection.In the prior art, adopt the test of pegging graft of the camera module of emulation, after the grafting, the camera module of emulation is not drawn out easily, and repeatedly plug causes the camera module and connector damage of emulation, testing cost height.In the prior art, the method that adopts the probe engaged test being arranged also, is the point type contact and this method adopts, and the stability of test is not high, and the result precision of test can not get guaranteeing.
Summary of the invention
Therefore, be necessary to provide a kind of detection module, can effectively reduce the cost of connector test, and have test result exactly.
Below will a kind of detection module be described with embodiment.
A kind of detection module; Be used for a plurality of contacts of connector are detected, said detection module comprises emulation board and card extender, and said emulation board is corresponding with connector; It comprises substrate, a plurality of contact pad with contact pad one to one many first be connected lead; Said substrate has opposite first and second surface, and said a plurality of contact pads are formed at second surface, and said many first connection leads run through first surface and second surface; Said card extender is corresponding with tester table; It comprises that a plurality of switch-over soldering pads connect leads with many second that are connected one by one with switch-over soldering pad, and said a plurality of contact pads are corresponding one by one with a plurality of contacts of connector, and said many first connection leads are used for connecting one by one a plurality of contact pads and a plurality of switch-over soldering pad; Said many second connection leads are used for being connected with tester table, detect with a plurality of contacts to connector.
Adopt described detection module to make the detection module that is suitable for connector to be tested to the connector of variety classes and shape.In addition, when testing repeatedly, connector detects module and causes when damaging, and can change card extender, cushion block or emulation board according to the part of its damage, need not to change whole detection module, the cost of the test of saving.In addition, adopt the way of contact of wire dot system when avoiding to test during owing to test, improved the stability of connector test.
Description of drawings
Fig. 1 is the decomposing schematic representation of the detection module that provides of present technique scheme implementation example.
Fig. 2 is the schematic perspective view of the detection module that provides of present technique scheme implementation example.
Fig. 3 is the diagrammatic cross-section of Fig. 1 along the III-III line
Fig. 4 is the synoptic diagram of the detection module user mode that provides of present technique scheme implementation example.
Embodiment
Below in conjunction with accompanying drawing and embodiment a kind of detection module that the present technique scheme provides is described further.
Please consult Fig. 1, Fig. 2 and Fig. 3 in the lump, a kind of detection module 100 that the present technique scheme is executed example to be provided is used for connector is detected, and detects module 100 and comprises emulation board 110, card extender 120 and cushion block 130.
Emulation board 110 comprises substrate 111, a plurality of contact pad 112 and many first connection leads 113.Substrate 111 is a rectangular parallelepiped, and the shape of the xsect of substrate 111 is corresponding with the shape of the jack of connector to be detected.Substrate 111 have first surface 1111, and first surface 1111 opposing second surface 1112 and be connected in first surface 1111 and second surface 1112 between sidewall 1113.Second surface 1112 is used for contacting with connector, and a plurality of contact pads 112 are formed on the second surface 112.The quantity of contact pad 112 is all corresponding with the contact of connector with arrangement mode.In the present embodiment, the quantity of contact pad 112 is 24, and roughly becomes array to arrange.Many first connection leads 113 are formed in the substrate 111, and the quantity of the first connection lead 113 is all corresponding with the contact of connector with arrangement mode.Each first connection lead 113 all has the first relative end face 1131 and second end face, 1132, the first end faces expose from first surface 1111, and second end face 1132 exposes from second surface 1112.Second end face 1132 of each first connection lead 113 contacts with a contact pad 112 and is interconnected.Emulation board 110 is used for contacting with connector to be detected, to carry out the measurement of connector.
Card extender 120 comprise matrix 121, a plurality of switch-over soldering pad 122, with switch-over soldering pad 122 the same number of interfaces 123 and be connected in each switch-over soldering pad 122 and interface 123 that this switch-over soldering pad 122 is corresponding between second connection line 124.Card extender 120 is used for and detects board and be connected, and realizes that contact pad 112 with emulation board 110 connects through first that lead 113, second connects lead 124 and switch-over soldering pad 122 is communicated with the detection board.
Matrix 121 is a tabular, and in the present embodiment, matrix 121 is a rectangular flat.Matrix 121 has relative the 1211 and the 4th surface 1212, the 3rd surface.For ease card extender 120 is installed on the work board, on matrix 121, has offered fixed orifice 1213.In the present embodiment, offer 3 fixed orifices 1213 to the 4th surface 1212 from the 3rd surface 1211 of matrix 121.
A plurality of switch-over soldering pads 122 are formed on the 3rd surface 1211 of matrix 121.It is identical with spread pattern that the number of weld pad 122 and spread pattern and first of emulation board 110 are connected lead 113 numbers.In the present embodiment, card extender 120 is provided with 24 switch-over soldering pads 122 altogether.
In the present embodiment, card extender 120 is provided with 24 interfaces 123 altogether.A plurality of interfaces 123 rule on card extender 120 is arranged.In order to make card extender 120 easy to use, 24 interfaces 123 are all arranged along one side of rectangle matrix 121.Leave the space between two adjacent interfaces 123.A plurality of interfaces 123 are used for card extender 120 is communicated with tester table.
Second connects the first surface 1211 that lead 124 is formed at matrix 121, and to connect lead 124 not fragile in order to make in card extender 120 uses second, can connect lead 124 with second and be fixed in first surface 1212 or be embedded in the matrix 121.Each second connects lead 124 and is connected between a switch-over soldering pad 122 and the interface 123, make each switch-over soldering pad 122 all with corresponding interface 123 mutual conduction.And any two second connect lead 124 all not conductings.
In the present embodiment, between emulation board 110 and card extender 120, also be provided with cushion block 130.The shape of cross section of cushion block 130 is consistent with size with the shape of the xsect of connector plug jack to be detected, is used in emulation board 110 is contained in the jack of connector.Thereby when guaranteeing to test, emulation board 110 contacts with a plurality of contacts of connector.In the present embodiment, cushion block 130 is a rectangular parallelepiped, has the 5th surface 131, with 131 relative the 6th surfaces 132, the 5th surface and be connected in the side 133 between the 5th surface the 131 and the 6th surperficial 132.In cushion block 130, be embedded with 133,24 the 3rd connections of 24 the 3rd connection leads lead 134 and be parallel to each other.Each the 3rd connection lead 134 all has the first relative end face 1341 and second end face 1342.Each the 3rd connection lead 134 extends along the direction on vertical the 5th surface 131; And run through cushion block 130; That is, first end face 1341 of each the 3rd connection lead 134 exposes from the 5th surface 131, and second end face 1342 of each the 3rd connection lead 134 exposes from the 6th surface 132.
Cushion block 130 is arranged between emulation board 110 and the card extender 120; And make each the 3rd connect lead 134 first end face 1341 all contact and be interconnected with a switch-over soldering pad 122, second end face 1342 of each the 3rd connection lead 134 all with the 113 corresponding connections of one first connection lead.
In the present embodiment; Emulation board 110 amplexiforms the second surface 132 in cushion block 130; The sidewall 1113 of substrate 111 flushes with the side 133 of cushion block 130 each other, and make each the 3rd connect lead 134 second end face 1,342 first end face 1131 that is connected lead 113 with one first contact and be connected.Like this; Each contact pad 112 with corresponding one first connect lead 113, one piece the 3rd connect lead 134, switch-over soldering pad 122, one second connect lead 124 and an interface 123 is communicated with; Thereby can so that each contact of the connector that detects all with interface 123 electrically conductings, can detect the detection of realization through docking port 123 thereby so detect board to the connector contact.
The height sum of cushion block 130 and emulation board 110 should be greater than the degree of depth of the jack of connector to be detected.Cushion block 130 the thickness low LCL that can change emulation board 110 is set the time, the problem that contact pad 112 can't contact with the contact of the connector that detects.When the degree of depth of the jack of connector to be detected during, also cushion block 130 can be set, and carry out detection after directly emulation board 110 being mounted on card extender 120 connector less than emulation board 110 thickness.
See also Fig. 4, when detection module 100 is used to detect connector 200, comprise the steps:
At first, will detect module 100 and be installed on tester table 300.Tester table 300 has installing plate 310 and test chip (figure does not show).Installing plate 310 has installed surface 311, on installed surface 311, offers mounting hole 312, and each mounting hole 312 is all corresponding with a fixed orifice 1213.Pass fixed orifice 1213 and screw in mounting hole 312 through fixture 314 and be fixed in installing plate 310, and make the second surface 1212 of matrix 121 closely contact, each interface 123 is connected with the corresponding port of test chip with installed surface 311 will detect module 100.
Secondly, emulation board 110 and cushion block 120 are stretched in the jack 210 of connector 200, make the contact pad 112 of emulation board 110 contact, thereby test chip both can detect the contacts 211 in the connector 200 with jack 210 interior contacts 211.
Adopt described detection module 100 can be directed against the connector of variety classes and shape, making is suitable for connector to be tested and detects module.In addition, when testing repeatedly, connector detects module and causes when damaging, and can change card extender, cushion block or emulation board according to the part of its damage, need not to change whole detection module, the cost of the test of saving.In addition, adopt the way of contact of wire dot system when avoiding to test during owing to test, improved the stability of connector test.
It is understandable that, for the person of ordinary skill of the art, can make other various corresponding changes and distortion by technical conceive according to the present invention, and all these change the protection domain that all should belong to claim of the present invention with distortion.

Claims (9)

1. one kind is detected module; Be used for a plurality of contacts of connector are detected, said detection module comprises emulation board and card extender, and said emulation board is corresponding with connector; It comprises substrate, a plurality of contact pad with contact pad one to one many first be connected lead; Said substrate has opposite first and second surface, and said a plurality of contact pads are formed at second surface, and said many first connection leads run through first surface and second surface; Said card extender is corresponding with tester table; It comprises that a plurality of switch-over soldering pads connect leads with many second that are connected one by one with switch-over soldering pad, and said a plurality of contact pads are corresponding one by one with a plurality of contacts of connector, and said many first connection leads are used for connecting one by one a plurality of contact pads and a plurality of switch-over soldering pad; Said many second connection leads are used for being connected with tester table, detect with a plurality of contacts to connector.
2. detection module as claimed in claim 1; It is characterized in that; Said detection module further comprises cushion block, is provided with many 3rd in the said cushion block and connects leads, and said many 3rd connect leads a plurality of switch-over soldering pads that connect one to one and are connected lead with Duo Gen first.
3. detection module as claimed in claim 2 is characterized in that, the height sum of said cushion block and emulation board is more than or equal to the degree of depth of the jack of connector to be detected.
4. detection module as claimed in claim 2 is characterized in that the shape of said cushion block is corresponding with the shape of emulation board.
5. detection module as claimed in claim 1 is characterized in that, said card extender is provided with many second and is connected a plurality of interfaces that lead connects one to one, and many second connect lead and are connected with tester table through a plurality of interfaces.
6. detection module as claimed in claim 5 is characterized in that, said a plurality of interfaces array arrangement on card extender.
7. detection module as claimed in claim 1; It is characterized in that; Said card extender also comprises matrix, and said matrix has relative the 3rd surface and the 4th surface, and the said second connection lead fixed is on the 3rd surface or be embedded in the matrix; Said a plurality of switch-over soldering pad is arranged at the 3rd surface, and said the 4th surface is used for contacting with tester table.
8. detection module as claimed in claim 7 is characterized in that, offers a plurality of fixed orifices in the said matrix, and said fixed orifice is used for fixing with tester table.
9. detection module as claimed in claim 1 is characterized in that, said a plurality of contact pad rules are arranged.
CN2008103056060A 2008-11-18 2008-11-18 Detection module Expired - Fee Related CN101738566B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2008103056060A CN101738566B (en) 2008-11-18 2008-11-18 Detection module

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2008103056060A CN101738566B (en) 2008-11-18 2008-11-18 Detection module

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CN101738566A CN101738566A (en) 2010-06-16
CN101738566B true CN101738566B (en) 2012-03-21

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Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5770320B2 (en) * 2014-01-28 2015-08-26 ファナック株式会社 Contact state monitoring device for connector contacts

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1195109A (en) * 1997-03-31 1998-10-07 住友电装株式会社 Testing unit for connector testing
GB2355871A (en) * 1999-08-10 2001-05-02 Hewlett Packard Co Connector continuity detection system
CN101231322A (en) * 2007-02-09 2008-07-30 段超毅 Test connection method and apparatus for integrated circuit open circuit/ short-circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1195109A (en) * 1997-03-31 1998-10-07 住友电装株式会社 Testing unit for connector testing
GB2355871A (en) * 1999-08-10 2001-05-02 Hewlett Packard Co Connector continuity detection system
CN101231322A (en) * 2007-02-09 2008-07-30 段超毅 Test connection method and apparatus for integrated circuit open circuit/ short-circuit

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C06 Publication
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C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C53 Correction of patent for invention or patent application
CB02 Change of applicant information

Address after: 518103 Shenzhen Province, Baoan District Town, Fuyong Tong tail Industrial Zone, factory building, building 5, floor, 1

Applicant after: Fuku Precision Components (Shenzhen) Co., Ltd.

Co-applicant after: Zhending Technology Co., Ltd.

Address before: 518103 Shenzhen Province, Baoan District Town, Fuyong Tong tail Industrial Zone, factory building, building 5, floor, 1

Applicant before: Fuku Precision Components (Shenzhen) Co., Ltd.

Co-applicant before: Honsentech Co., Ltd.

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CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20120321

Termination date: 20151118

EXPY Termination of patent right or utility model