CN101696950A - Spherical Langmuir probe device for measuring low-density cold plasmas - Google Patents
Spherical Langmuir probe device for measuring low-density cold plasmas Download PDFInfo
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- CN101696950A CN101696950A CN200910235758A CN200910235758A CN101696950A CN 101696950 A CN101696950 A CN 101696950A CN 200910235758 A CN200910235758 A CN 200910235758A CN 200910235758 A CN200910235758 A CN 200910235758A CN 101696950 A CN101696950 A CN 101696950A
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Abstract
The invention discloses a spherical Langmuir probe device for measuring low-density cold plasmas, which is used for measuring low-density cold plasmas with the density of between 105 and 108cm-3 and electron energy of between 0.5 and 5eV. The device comprises a hollow gold-plated titanium metal spherical Langmuir probe, a hollow cylindrical titanium metal support, an electrical connection point of the Langmuir probe and a ceramic insulating base of the Langmuir probe. The extraspherical diameter of the hollow gold-plated titanium metal spherical Langmuir probe is not less than 56mm, and the thickness of a shell is between 0.5 and 2mm; and the outer surface of the probe is subjected to gold-plating treatment, and the gold-plating thickness is between 10 and 50nm. The device effectively improves the charge collection of the plasmas and reduces the mass, and the surface gold-plating can play a role in antioxidation. The device is suitable for parameter measurement of spatial on-orbit low-density cold plasmas, and improves the reliability and the stability of the measurement.
Description
Technical field
The invention belongs to space plasma parameter measurement field, relate to a kind of spherical Langmuir probe device that is used for the space plasma parameter measurement, be used in particular for density 10
5Cm
-3-10
8Cm
-3The measurement of space plasma parameter.
Background technology
Space low-density (10
5Cm
-3-10
8Cm
-3) cold plasma and spacecraft surface interaction can cause spacecraft or the sputter of instrument sensing surface to pollute, if the solar array of the direct inswept spacecraft of high-energy plume ion, will produce more serious sputtering etching, cause the performance of solar array to descend or inefficacy.In addition, the space low-density 10
5Cm
-3-10
8Cm
-3Cold plasma also can influence the spacecraft charging balance, brings out electrostatic discharge event, and spacecraft is caused potential danger.Therefore, need monitor, make it to be controlled in the safe range the plasma parameter of spacecraft surface environment.
At present, the Langmuir probe weak point that existing plasma ground survey is used is: the low-density cold plasmas measuring error is big, and probe mass is big, and the anti-atomic oxygen ability is not suitable in the spacecraft in orbit.
Summary of the invention
The objective of the invention is for overcoming the deficiencies in the prior art, it is 10 that a kind of density measurement that is used for is provided
5Cm
-3-10
8Cm
-3, electron energy is at the spherical youth Miu Er probe unit of the low-density cold plasmas of 0.5eV--5eV.
Apparatus of the present invention comprise the spherical youth Miu Er of hollow gold-plated titanium probe, open column shape titanium support, langmuir type probe electric connection point and youth Miu Er probe ceramic insulation base.
The spherical youth Miu Er of described hollow gold-plated titanium probe ball overall diameter is not less than 56mm, and shell thickness is 0.5mm--2mm; The probe outside surface adopts gold-plated processing, and gold plating thickness is 10nm--50nm.Spherical youth Miu Er probe has only the above-mentioned requirements of satisfying, and can accurately measure density is 10
5Cm
-3-10
8Cm
-3, electron energy is at the plasma of 0.5eV--5eV.
Preferably, the height of open column shape titanium support is at 50mm--150mm, and the cylinder external diameter is 6mm--8mm, and internal diameter is 3mm--5mm.
Youth Miu Er probe ceramic insulation base is to contain the epoxy aluminium oxide to be not less than 99.8% ceramic round platform.This is because the epoxy aluminium oxide has high thermal resistance, high resistance, youth Miu Er probe can be suspended over the ground, and characteristic such as the thermal expansivity of thermal expansivity and titanium is approaching, is convenient to weld encapsulation with open column shape titanium support.It is enough high that the height of youth Miu Er probe ceramic insulation base is wanted, and will reach 3/5 of open column shape titanium support height at least, to guarantee open column shape titanium support enough shock resistances arranged.
The annexation of above-mentioned ingredient is:
The top of spherical youth's Miu Er probe of hollow gold-plated titanium and open column shape titanium support is weldingly connected;
The bottom of open column shape titanium support is wrapped in the youth Miu Er probe ceramic insulation base, and its metal support must not be less than 3/5 of stent length by ceramic insulation base wrapping portion.
The langmuir type probe electric connection point is welded in the bottom of open column shape titanium support welding, and the langmuir type probe electric connection point is connected by the power supply of lead with the outside.
The course of work of apparatus of the present invention is as follows:
After this device entered space environment with spacecraft, it was in the space plasma environment.At this moment, the langmuir type probe electric connection point is powered up, spherical youth's Miu Er probe of hollow gold-plated titanium and open column shape titanium support are all switched on.Voltage range is controlled at-50V-150V between, the scanning step is 100mV--250mV, each step scan period is 1Hz (that is, per second writes down 1 primary current-magnitude of voltage).
By the spherical youth Miu Er of hollow gold-plated titanium probe is scanned, can obtain I-V (current-voltage) probe data record.Draw I-V (current-voltage) probe data recording curve according to this data recording result.At last, according to the characteristic number strong point of this curve, can calculate the density and the temperature parameter of plasma.
Beneficial effect
Probe of the present invention can be installed in the spacecraft, can be in orbit.Be not less than the 5.6cm diameter by employing, can effectively collect 10
5Cm
-3About the low-density space plasma; By adopting craft of gilding, can effectively suppress the space action of atomic oxygen; By adopting 99.8% epoxy aluminium oxide ceramics, can play high temperature resistantly, the effect of insulation has improved the reliability and the stability of space plasma parameter measurement.
Description of drawings
Fig. 1 is that the structure of apparatus of the present invention is formed synoptic diagram.
Wherein, the hollow titanium Langmuir probe of 1-, 2-open column shape titanium support, 3-langmuir type probe electric connection point, 4-youth Miu Er probe ceramic insulation base.
Embodiment
Below in conjunction with accompanying drawing and preferred implementation of the present invention is further described.
Apparatus of the present invention comprise the spherical youth Miu Er of hollow gold-plated titanium probe 1, open column shape titanium support 2, langmuir type probe electric connection point 3, youth Miu Er probe ceramic insulation base 4.
Wherein, the ball overall diameter of the spherical youth Miu Er of hollow gold-plated titanium probe 1 is not less than 56mm, and shell thickness is 0.5mm--2mm; The outside surface of the spherical youth Miu Er of hollow gold-plated titanium probe 1 adopts gold-plated, and its thickness is 10nm--50nm.
The height of open column shape titanium support 2 is at 50mm--150mm, and the cylinder external diameter is 6mm--8mm, and internal diameter is 3mm--5mm.
Youth Miu Er probe ceramic insulation base 4 is not less than 99.8% ceramic round platform for containing the epoxy aluminium oxide.This is because the epoxy aluminium oxide has high thermal resistance, high resistance, youth Miu Er probe can be suspended over the ground, and characteristic such as the thermal expansivity of thermal expansivity and titanium is approaching, is convenient to weld encapsulation with open column shape titanium support 3.It is enough high that the height of youth Miu Er probe ceramic insulation base 4 is wanted, and will reach 3/5 of open column shape titanium support 3 height at least, to guarantee open column shape titanium support 3 enough shock resistances arranged.
Its annexation is:
The spherical youth Miu Er of hollow gold-plated titanium probe 1 is weldingly connected with the top of open column shape titanium support 2;
The lower end of open column shape titanium support 2 is wrapped on the youth Miu Er probe ceramic insulation base 4, and its metal support must not be less than 2/3 of stent length by ceramic insulation base wrapping portion.
Langmuir type probe electric connection point 3 is welded in the bottom of open column shape titanium support welding 2, and langmuir type probe electric connection point 3 is connected by the power supply of lead with the outside.
The course of work of apparatus of the present invention is as follows:
After this device entered space environment with spacecraft, it was in the space plasma environment.At this moment, langmuir type probe electric connection point 3 is powered up, make the spherical youth Miu Er of hollow gold-plated titanium probe 1 all switch on open column shape titanium support 2.Voltage range is controlled at-20V-80V between, the scanning step is 250mV, each step scan period is 1Hz (that is, per second writes down 1 primary current-magnitude of voltage).
By the spherical youth Miu Er of hollow gold-plated titanium probe 1 is scanned, just can obtain I-V (current-voltage) probe data record.Draw I-V (current-voltage) probe data recording curve according to this data recording result.At last, according to the characteristic number strong point of this curve, can calculate the density and the temperature parameter of plasma.
Claims (2)
1. one kind is used for the isoionic spherical Langmuir probe device of measurement space low-density cold, comprises spherical youth Miu Er probe, open column shape titanium support, langmuir type probe electric connection point and youth Miu Er probe ceramic insulation base, it is characterized in that:
Described spherical youth Miu Er probe is hollow gold-plated titanium spherical structure, and its ball overall diameter is not less than 56mm, and shell thickness is 0.5mm--2mm; The probe outside surface adopts gold-plated processing, and gold plating thickness is 10nm--50nm;
Described youth Miu Er probe ceramic insulation base is to contain the epoxy aluminium oxide to be not less than 99.8% ceramic round platform; The height of youth Miu Er probe ceramic insulation base will reach 3/5 of open column shape titanium support height at least;
Its annexation is:
The top of spherical youth's Miu Er probe of hollow gold-plated titanium and open column shape titanium support is weldingly connected; The bottom of open column shape titanium support is wrapped in the youth Miu Er probe ceramic insulation base, and its metal support must not be less than 3/5 of stent length by ceramic insulation base wrapping portion; The langmuir type probe electric connection point is welded in the bottom of open column shape titanium support welding, and the langmuir type probe electric connection point is connected by the power supply of lead with the outside.
2. a kind of isoionic spherical Langmuir probe device of measurement space low-density cold that is used for as claimed in claim 1 is characterized in that the height of described open column shape titanium support is at 50mm--150mm, and the cylinder external diameter is 6mm--8mm, and internal diameter is 3mm--5mm.
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CN200910235758A CN101696950A (en) | 2009-10-13 | 2009-10-13 | Spherical Langmuir probe device for measuring low-density cold plasmas |
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CN200910235758A CN101696950A (en) | 2009-10-13 | 2009-10-13 | Spherical Langmuir probe device for measuring low-density cold plasmas |
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Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102508002A (en) * | 2011-10-31 | 2012-06-20 | 北京遥测技术研究所 | Plasma density measuring equipment of high temperature resistant embedded double-probe type |
CN102543788A (en) * | 2011-11-29 | 2012-07-04 | 上海华力微电子有限公司 | Device for plasma detection |
CN102941930A (en) * | 2012-11-25 | 2013-02-27 | 中国航天科技集团公司第五研究院第五一〇研究所 | Surface electrification simulation test system and method for satellite tail regions |
CN104340381A (en) * | 2014-10-24 | 2015-02-11 | 兰州空间技术物理研究所 | Experiment system for space lower earth orbit plasma environment simulation |
CN104677945A (en) * | 2013-12-02 | 2015-06-03 | 中国科学院空间科学与应用研究中心 | Langmuir probe sensor used on sounding rocket |
CN109104805A (en) * | 2018-07-25 | 2018-12-28 | 北京航空航天大学 | Langmuir probe, Langmuir probe diagnostic system and its diagnostic method |
CN111257001A (en) * | 2020-02-25 | 2020-06-09 | 北京航空航天大学 | Ring probe and combined probe |
-
2009
- 2009-10-13 CN CN200910235758A patent/CN101696950A/en active Pending
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102508002A (en) * | 2011-10-31 | 2012-06-20 | 北京遥测技术研究所 | Plasma density measuring equipment of high temperature resistant embedded double-probe type |
CN102508002B (en) * | 2011-10-31 | 2014-02-19 | 北京遥测技术研究所 | Plasma density measuring equipment of high temperature resistant embedded double-probe type |
CN102543788A (en) * | 2011-11-29 | 2012-07-04 | 上海华力微电子有限公司 | Device for plasma detection |
CN102941930A (en) * | 2012-11-25 | 2013-02-27 | 中国航天科技集团公司第五研究院第五一〇研究所 | Surface electrification simulation test system and method for satellite tail regions |
CN104677945A (en) * | 2013-12-02 | 2015-06-03 | 中国科学院空间科学与应用研究中心 | Langmuir probe sensor used on sounding rocket |
CN104340381A (en) * | 2014-10-24 | 2015-02-11 | 兰州空间技术物理研究所 | Experiment system for space lower earth orbit plasma environment simulation |
CN104340381B (en) * | 2014-10-24 | 2016-04-06 | 兰州空间技术物理研究所 | A kind of space Low Earth Orbit plasma environment experimental system for simulating |
CN109104805A (en) * | 2018-07-25 | 2018-12-28 | 北京航空航天大学 | Langmuir probe, Langmuir probe diagnostic system and its diagnostic method |
CN111257001A (en) * | 2020-02-25 | 2020-06-09 | 北京航空航天大学 | Ring probe and combined probe |
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Application publication date: 20100421 |