CN101666853A - Test scheduling system and test scheduling method - Google Patents

Test scheduling system and test scheduling method Download PDF

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CN101666853A
CN101666853A CN 200810135557 CN200810135557A CN101666853A CN 101666853 A CN101666853 A CN 101666853A CN 200810135557 CN200810135557 CN 200810135557 CN 200810135557 A CN200810135557 A CN 200810135557A CN 101666853 A CN101666853 A CN 101666853A
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test
test parameter
storage device
parameter
download
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CN101666853B (en
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梁文山
陈福泰
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King Yuan Electronics Co Ltd
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King Yuan Electronics Co Ltd
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Abstract

The invention relates to a test scheduling system and a test scheduling method, in particular to a test scheduling system and a test scheduling method for automatically optimized testing a parameter download process in a testing process. The test scheduling system and the test scheduling method calculate a weight value of each testing parameter through a weight unit, and establish an optimized testing parameter download process by a mode that the priority for downloading the testing parameters is given to larger weight value, so that the required testing parameters can be downloaded in the minimum downloading frequencies and time of the testing parameters to improve the testing efficiency.

Description

Test program system and method
Technical field
The present invention relates to a kind of test program system and method, particularly relate to a kind of test program system and method for downloading flow process in order to self-optimization test parameter in testing process.
Background technology
Electronic component is after completing, usually need through wafer sort (circuit probe test), in order to distinguishing the good and the bad of crystal grain before encapsulation, the quality of confirming crystal grain to be to encapsulate, and avoids encapsulating and causing unnecessary waste for the bad crystal grain of quality; And after encapsulation, need to carry out finished product test (final test), be without damage with wafer in definite encapsulation process, and wafer is still up to specification after encapsulation.
Yet, no matter be to close to state that a kind of test, all need to set up a test pattern (pattern), and whom test pattern decision signal passes to, when transmit and lasting dependence test states such as time according to this, that is in testing process, decision offers each signal contact Low or the signal of High (i.e. 0 or 1 signal) on the crystal grain according to this test pattern, and this signal is kept or time of taking place (is time generation speed (time generation rate; Be called for short TG rate)) etc. test parameter, and test.
Complicated, multifunction and productive setization along with electronic component now, therefore the function and the step of the required test of crystal grain are also increasingly sophisticated, therefore, it also significantly increases the test parameter of the test mode that test pattern determines that is used for reaching thereupon, cause the storer finite capacity usually in the tester table, test parameter that can't be once that this is whole is downloaded, and can't test.In addition, limited because of the memory span in the tester table, all test pattern parameters needed can't be connect down and be stated from wherein, therefore, in case change test pattern or testing process often need to download test parameter again, and cause the reduction of tested performance.
Adopt the method for this problem of solution to have two kinds at present, wherein a kind of is to adopt the method for once downloading, that is changes or buy the enough big tester table of memory span, so that test in the storer that can once all test parameters be downloaded.Yet the shortcoming of this method is the big more tester table of memory span, and its price often becomes multiple to grow up, and buys the tester table that a memory span is large enough to hold all test parameters of all test patterns needs, will cause the significantly lifting of testing cost.In addition, though the electronic component that needs the tester table of the so big storer of capacity to test has the trend of increase, but it is still on the low side on the ratio of the present electronic component of producing, therefore, the tester table of buying this large memories capacity comes in response to needing the substantive test parameter but the not high electronic component of probability will increase meaningless cost.
Another kind of mode is then downloaded method for gradation, promptly when required test parameter can't be downloaded once, its gradation is downloaded, the test parameter that the current meeting of preferential download uses, after treating that these test parameters all use, downloading other required test parameters again tests, but the shortcoming of this mode is test parameter each time and downloads, download again after all previous test parameter being removed or directly cover, if make reusable test parameter is arranged, also need to download again, therefore cause the increase of whole download time and time, and then cause the attenuating of tested performance.In addition, facing dynamic testing process, hierarchical test (grade) for example, or test branch, for example by the test of returning complexity such as surveying of (fail), its needed test pattern and corresponding test parameter are not various, often can't adopt because of the restriction of memory span and once download method in test, can expend again and need many times download parameters but adopt gradation to download rule, cause the significantly attenuating of tested performance.
Therefore, for solving aforementioned problem such as known, need a kind of test program system and method badly, can be in testing process, the self-optimization test parameter is downloaded flow process, and under the limited memory span of tester table, with minimum download time and download time all required test parameters, and then increase tested performance and reduce testing cost.
Because the defective that above-mentioned existing tester table or download method exist, the inventor is based on being engaged in this type of product design manufacturing abundant for many years practical experience and professional knowledge, and the utilization of cooperation scientific principle, actively studied innovation, in the hope of founding a kind of new test program system and method, can improve general existing tester table or download method, make it have more practicality.Through constantly research, design, and after studying repeatedly and improving, create the present invention who has practical value finally.
Summary of the invention
The objective of the invention is to, overcome the defective that existing test program system and method exist, and provide a kind of new test program system and method, technical matters to be solved is to make it solve known tester table can't be downloaded to problem in the storer because of test parameter that insufficient memory capacity caused, or the identical test parameter of repeated downloads and the problem that can't cause tested performance to reduce, thereby be suitable for practicality more with the download that minimum download time and download time are carried out test parameter.
The object of the invention to solve the technical problems realizes by the following technical solutions.A kind of test program system according to the present invention proposes comprises: a test pattern (pattern) sends and tests required test parameter in order to the decision test signal; One storage device is in order to download the test parameter required with storing test; One switches switch, connects this test pattern (pattern) and this storage device respectively; And a scheduling device, connect this change-over switch and this storage device respectively, in order to the download flow process of the required test parameter of this test pattern of optimization (pattern).
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
Aforesaid test program system, when wherein said storage device does not exceed the storage device capacity at the required test parameter of this test pattern (pattern), once the required test parameter of all these test patterns (pattern) is downloaded to this storage device, if exceed the storage device capacity, then download the required test parameter of this test pattern of part (pattern) earlier in this storage device.
Aforesaid test program system, wherein said scheduling device comprises: a test parameter unit, be connected with this storage device, in order to collect this test pattern (pattern) the test parameter that might need, and download test parameter to this storage device; One weight unit is connected with this test parameter unit, in order to analyzing the use amount of the required test parameter of each this test pattern (pattern), and calculates the weighted value of its each this test parameter according to this; One optimization scheduling unit connects this weight unit and this test parameter unit respectively, in order to set up an optimized test parameter download table according to the weighted value of each this test parameter; And a scheduling converting unit, be connected with this optimization scheduling unit, should the connection table in order to set up one, and the storage location of each required test parameter of test pattern in this storage device learnt in contrast.
Aforesaid test program system, wherein said each this test parameter is according at least three kinds of its weighted values of numerical evaluation, wherein this numerical value comprises a α value, it represents each this test parameter number of times of normal use or degree, a β value, it represents each this test parameter most recently used number of times or a degree and a γ value, and it represents each this untapped number of times of test parameter a period of time or degree.
Aforesaid test program system, wherein said scheduling device is retrieved this storage device and whether has been downloaded the required test parameter of each this test pattern (pattern), be checked through the test parameter of having downloaded and then recomputate and adjust its weighted value again, if retrieve the test parameter of not downloading, then comply with the old test parameter that its weighted value decision will be replaced, and download this test parameter, after the download, recomputate and adjust its weighted value.
Aforesaid test program system, the optimized test parameter download table that wherein said optimization scheduling unit is set up, in order to determine those test parameters need be downloaded to this storage device, this test parameter unit is then downloaded the table test parameter that this test pattern (pattern) is required according to optimized test parameter and is downloaded in this storage device with optimization download flow process.
Aforesaid test program system, wherein said connection table is to comprise to download flow process with optimization and be downloaded to the storage location of each this test parameter in storage device in this storage device, and original this test pattern sets the side-play amount (offset) between the storage location of each this test parameter in this storage device, and this change-over switch finds the required storage location of test parameter reality in this storage device of each this test pattern (pattern) according to this side-play amount (offset), tests and extract required test parameter.
The object of the invention to solve the technical problems also realizes by the following technical solutions.A kind of test scheduling method according to the present invention proposes comprises: collect test parameter that all testing processs may use in the test parameter unit; By a weight unit analysis and calculate the weighted value of each this test parameter; Weighted value according to each this test parameter determines whether this test parameter is stated from the tester table down; Download required test parameter; And begin to test.
The object of the invention to solve the technical problems also can be applied to the following technical measures to achieve further.
Aforesaid test scheduling method wherein more comprises prior download and partly tests the step of required test parameter in the storage device of a tester table.
Aforesaid test scheduling method wherein also comprises the step of setting up a test pattern (pattern).
Aforesaid test scheduling method, wherein also comprise the step of setting up an optimized test parameter download table according to the weighted value of each this test parameter, in order to determining some test parameters need download in this storage device, or those stored test parameters need be replaced in this storage device.
Aforesaid test scheduling method wherein also comprises according to this optimized test parameter download table test parameter that this test pattern (pattern) is required and is downloaded to step in this storage device with optimization download flow process.
Aforesaid test scheduling method, wherein also comprise the step of setting up a connection table, download flow process in order to contrast with optimization and be downloaded to the storage location of each this test parameter in storage device in this storage device, and original this test pattern sets the side-play amount (offset) between the storage location of each this test parameter in this storage device.
Aforesaid test scheduling method wherein also comprises a retrieval one test parameter and whether has been present in step in this storage device.
Aforesaid test scheduling method, wherein if in this storage device, retrieve this test parameter, then recomputate and adjust its weighted value again, if in this storage device, do not retrieve this test parameter, then comply with the old test parameter that its weighted value decision will be replaced, and download this test parameter, after the download, recomputate and adjust its weighted value.
Aforesaid test scheduling method wherein also comprises one and seeks step, in order to seek in this storage device with to each test parameter that should test pattern (pattern), and test.
Aforesaid test scheduling method, wherein this searching step utilizes one to switch switch according to this side-play amount (offset), and finds each required test parameter reality storage location in this storage device, tests and extract required test parameter.
Aforesaid test scheduling method, wherein this analysis and calculate the step of the weighted value of each this test parameter is to utilize the use amount of each this test parameter to analyze and calculate.
Aforesaid test scheduling method, the weighted value of each this test parameter wherein, according at least three kinds of its weighted values of numerical evaluation, wherein this numerical value comprises a α value, it represents each this test parameter number of times of normal use or degree, a β value, it represents each this test parameter most recently used number of times or a degree and a γ value, and it represents each this untapped number of times of test parameter a period of time or degree.
Aforesaid test scheduling method, the step of wherein downloading required test parameter are to be preferential mode with the big more test parameter of weighted value, download required test parameter in tester table.
The present invention compared with prior art has tangible advantage and beneficial effect.As known from the above, in order to achieve the above object, the invention provides a kind of technological means that addresses the above problem, it provides a kind of test program system, it can download flow process with optimized test parameter, downloads the required test parameter of each test pattern (pattern) in the testing process.This test program system comprises a test pattern (pattern) that sends kind and time and test required test parameter in order to test signal in the decision testing process, one in order to download and the storage device that stores required test parameter, one in order to seek the required test parameter of corresponding test pattern (pattern) in storage device storage location and the change-over switch of testing, and in order to the scheduling device of the download flow process of the required test parameter of optimization test pattern (pattern).This test program system by the scheduling device to test each required test parameter of test pattern (pattern), carry out the calculating of weighted value according to its use amount, and the many more test parameter weighted value of normal more use and recent access times is big more, and whether the weighted value of each test parameter decides it to be substituted when downloading test parameter next time, or when after changing test pattern, downloading test parameter again, whether covered by other test parameters, download flow process and reach an optimized test parameter, therefore, can the repeated downloads not normal test parameter that uses, so reduce the number of times and the time of downloading test parameter, and then improve tested performance.
In addition, the invention provides the technological means that another kind addresses the above problem, it provides a kind of test scheduling method, but the test parameter of self-optimization is downloaded flow process, and improves tested performance.This test scheduling method, the test parameter that earlier all testing processs may be used is collected and is stored in the test parameter unit, utilize a weight unit analysis again and calculate the weighted value of each test parameter, and determine according to weighted value whether each test parameter is stated from the tester table down, then, with the big more test parameter of weighted value is that preferential mode is downloaded required test parameter, just can begin then to test.This test scheduling method is before downloading test parameter, according to the use amount of each test parameter and recent access times, calculate the weighted value of each test parameter in advance, download flow process according to its weighted value optimized test parameter that is ranked again, with the download time and the time of minimum test parameter, download required test parameter and then improve tested performance.
By technique scheme, the present invention tests program system and method has following advantage and remarkable result at least:
Therefore, the effect that the present invention contrasts prior art is to provide a kind of test program system and method, its can be in testing process the download flow process of self-optimization test parameter, and with the download time and time of minimum test parameter, download required test parameter, reduce the repeated downloads of same test parameter, and then improve tested performance, in addition, this test program system and method have more and have advantage and the effect that following prior art does not have:
1) can effectively reduce repetition data transmission capacity between tester table and the measuring head;
2) system can calculate automatically, need not manually get involved adjustment;
When 3) running into the test branch flow process, can adapt to dynamic adjustment automatically;
4) can utilize the storer of tester table fully, performance hardware characteristic;
5) both made the storer deficiency also can carry out test;
6) can on tested performance, obtain optimal balance point automatically to tackling a large amount of test parameter data;
7) its calculation framework (utilizing weighted value to calculate and analysis) can apply to the optimization of other testing processs, for example PELEVEL easily.
Above-mentioned explanation only is the general introduction of technical solution of the present invention, for can clearer understanding technological means of the present invention, and can be implemented according to the content of instructions, and for above-mentioned and other purposes, feature and advantage of the present invention can be become apparent, below especially exemplified by preferred embodiment, and conjunction with figs., be described in detail as follows.
Description of drawings
Fig. 1 is the structural representation of the test program system of one embodiment of the invention.
The process flow diagram of the test scheduling method of known one embodiment of the invention shown in Figure 2.
1: the test program system
10: test pattern (pattern)
20: storage device
30: change-over switch
40: the scheduling device
42: the test parameter unit
44: weight unit
46: optimization scheduling unit
48: the scheduling converting unit
202: collect the test parameter step that might use
204: the weighted value step of analyzing and calculate each test parameter
206: set up a connection table step
208: retrieve a test parameter and whether be present in the storage device step
210: the old test number step that will be replaced according to weighted value decision.
212: download this test parameter step
214: the weighted value step of adjusting test parameter
216: carry out testing procedure
α: use amount
β: recent access times
γ: untapped number of times
ω: weighted value
Embodiment
Reach technological means and the effect that predetermined goal of the invention is taked for further setting forth the present invention, below in conjunction with accompanying drawing and preferred embodiment, to test program system and its embodiment of method, method, step, feature and the effect thereof that foundation the present invention proposes, describe in detail as after.
Some embodiments of the present invention are described in detail as follows.Yet except this was described in detail, the present invention can also be widely implements at other embodiment.That is scope of the present invention is not subjected to the restriction of the embodiment that proposed, and the claims that propose with the present invention are as the criterion.Secondly, when each element in embodiments of the invention illustrate or structure illustrate with single element or structrual description, should be with this as the cognition that qualification is arranged, promptly following explanation not during the restriction on the lay special stress on number spirit of the present invention and range of application can spread on most elements or structure and structure of depositing and the method.Moreover in this manual, the different piece of each element is not drawn according to size fully, and some yardstick is compared with other scale dependents or had and exaggerated or simplify, to provide clearer description to promote the understanding of the present invention.And the existing skill that the present invention continued to use is only done quoting of emphasis formula at this, to help elaboration of the present invention.
Please refer to shown in Figure 1ly, it is the structural representation of the test program system of one embodiment of the invention.This test program system 1 includes a test pattern (pattern) 10, a storage device 20, switches a switch 30 and a scheduling device 40.Wherein, test pattern 10 is transmission and the frequencies in order to decision signal in testing process, for example offer each signal contact Low or the signal of High (i.e. 0 or 1 signal) on the crystal grain, and required test parameter is tested in decision, for example signal is kept or time of taking place test parameters such as (for example the time produce speed (time TG rate)), and this test pattern 10 can testing process difference and change to some extent, and be not to be a fixed mode.20 of storage devices are in order to download and to store test pattern 10 required test parameters, change-over switch 30 then in order to seek corresponding test pattern 10 each required test parameter in storage device storage location and extract in the storage device test parameter and test, wherein, change-over switch 30 connects test pattern 10 and storage device 20 respectively, and test pattern 10 then is connected to each other by change-over switch 30 with storage device 20.
40 in scheduling device is in order to the download flow process of the required test parameter of this test pattern of self-optimization 10, and it comprises, and a test parameter unit 42 is connected with storage device 20, a weight unit 44 is connected with test parameter unit 42, connection weight unit 44 and test parameter unit 42 and a scheduling converting unit 48 are connected with optimization scheduling unit 46 respectively in an optimization scheduling unit 46.Wherein, test parameter unit 42 be in order to collect various test patterns the test parameter that may need, and download and need test parameter in the employed test pattern to storage device 20, weight unit 44 is then in order to analyzing the use amount of the required test parameter of each test pattern, and calculates the weighted value of each test parameter according to the use amount of each test parameter.
Optimization scheduling unit 46 is in order to the weighted value according to each test parameter, and set up an optimized test parameter download table in the preferential mode of downloading of the big more test parameter of weighted value, and make test parameter unit 42 according to the order that is ranked in this optimized test parameter download table, download required test parameter in regular turn to storage device 20, scheduling converting unit 48 then in order to set up a connection table, is learnt the storage location of each required test parameter in storage device 20 in the test pattern 10 and contrast.
This test program system 1, with various test patterns the test parameter that may need with the access times of each test parameter, after collecting and being stored in the test parameter unit 42,44 of weight unit can analytical test parameter unit use amount (promptly the number of times or the degree of normal use) the α of 42 collected each test parameter, recent access times or degree β, and at least three kinds of data such as untapped number of times or degree γ, and calculate the weighted value ω of each required test parameter of test module 10, for example with the α value in weighted value ω shared proportion greater than the β value, (for example the α value is with 2 times of weightings and calculate greater than the mode of γ value with β value shared proportion in weighted value ω, one times of β value weighting, and the mode of 0.5 times of γ value weighting is with the α value, β value and the addition of γ value and weighted value ω), but not as limit.According to the design of test and demand also can adopt separately the α value in weighted value ω shared proportion greater than the mode of β value, or β value shared proportion in weighted value ω calculates greater than the mode of γ value, even adopt α value shared proportion in weighted value ω to be equal to or less than the mode of β value, even add the calculating that other parameters are carried out weighted value ω.
After the weighted value ω of each test parameter that test pattern 10 is required calculates, 46 of optimization scheduling unit can be according to the weighted value ω of each required test parameter, and set up an optimized test parameter download table, wherein, set up an optimized download flow process with the preferential arrangement mode of downloading of the big more test parameter of weighted value, and download the more fixed test parameters of voting according to this optimized test parameter and need download in the system storage device 20.Yet, optimized download flow process is not changeless in testing process, but along with each test parameter over and over again is used or is not used at testing process, make test parameter unit 42 then according to the α value, β value and γ value change, make weight unit 44 over and over again reanalyse and calculate the current weighted value ω of each test parameter and adjust, therefore, optimized test parameter download table can over and over again automatically be adjusted according to the current weighted value ω of each required test parameter in 46 of optimization scheduling unit, and reach at any time all download flow processs of self-optimization test parameter, and all carry out the download of test parameter at any time, and then retrofit testing usefulness with minimum download time and time.
42 of test parameter unit are according to the order that is ranked in this optimized test parameter download table, download required test parameter in regular turn to storage device 20, but before downloading each parameter, whether test parameter unit 42 can be loaded with this test parameter down by retrieval storage device 20, if have at storage device 20 and retrieve the then download no longer again of this test parameter, and because of its access times that in new testing process, increase or access times increase in the recent period, and recomputate and adjust its weighted value ω, but if retrieve less than this test parameter at storage device 20, then the optimization of being set up at optimized test parameter download table according to its weighted value ω is downloaded the order that flow process is arranged, decision will be replaced old test parameter, and download this parameter value in storage device 20, because of its access times that in new testing process, increase or access times increase in the recent period, and recomputate and adjust its weighted value ω.
In addition, after required test parameter downloads in the storage device 20, the storage location of each required test parameter in storage device 20 often, setting the storage location of each desired parameters in storage device 20 with original test pattern 10 can be different, scheduling converting unit 48 then can be according to the storage location of each required test parameter in storage device 20, and the side-play amount that original test pattern 10 sets between the storage location of each desired parameters in storage device 20 is set up a connection table, learns the storage location of each required test parameter in storage device 20 in the test pattern 10 in order to contrast.This connection table then can be used in testing process or not be used because of each test parameter, and the change that causes use amount (α value), recent access times (β value) and be not used number of times (γ value), and then cause the change of its weighted value ω, and optimized test parameter is downloaded the adjustment of table.Therefore, to make the storage location of this test parameter in storage device 20 to change to some extent, or make storage location and original test pattern 10 side-play amount that set each desired parameters storage location in storage device 20 between of this test parameter in storage device 20 change, and then make scheduling converting unit 48 newly set up a connection table that meets current side-play amount.
The storage location of each test parameter reality in storage device 20 in the connection table that 30 of change-over switches are set up according to each scheduling converting unit 48, and original test pattern 10 sets the side-play amount between the storage location of each desired parameters in storage device 20, contrast and find out each required test parameter of test pattern 10, and extract required test parameter and test.
Storage device 20 in test program system 1 of the present invention can be a storer or data bank, and described in the present invention test parameter can be arbitrary test parameter that needs of distinguishing when carrying out electronic components test, and for example signal frequency, time produce speed test parameters such as (TG rate).In the present invention, scheduling device 40 can be a computer, test parameter unit 42, weight unit 44, optimization scheduling unit 46 and scheduling converting unit 48 be difference each software program in the computer for this reason then, or scheduling device 40 can be a processor, and test parameter unit 42, weight unit 44, optimization scheduling unit 46 and scheduling converting unit 48 then are respectively each processing or the computing unit in this processor.In addition, test program system 1 of the present invention can be in the required test parameter amount of test pattern 1 during less than the capacity of storage device 20, according to above-mentioned mechanism, and eliminating repeated downloads storage device 20 already present test parameters, and all are not present in the storage device 20 but the test parameter that need be downloaded with the disposable download of an optimized current-carrying journey, and in the required test parameter amount of test pattern 1 during greater than the capacity of storage device 20, according to above-mentioned mechanism, required test parameter is downloaded in gradation, and at any time in response to the use amount of each test parameter, and adjust the weighted value of each test parameter, and then carry in the testing process at any time all download flow processs of self-optimization test parameter.
Please refer to shown in Figure 2ly, it is the process flow diagram of the test scheduling method of one embodiment of the invention.This method of testing, set up or select a test pattern (pattern) earlier, and be stated from the storage device of tester table under in advance that this test pattern is the required part test parameter, but can not download in advance yet, decide fully according to the demand of test and design, then, with various test patterns the test parameter that may need with the access times of each test parameter, collect and be stored in the test parameter unit (step 202).Then, by a weight unit analysis and calculate the weighted value (step 204) of each test parameter.This analysis and the weighted value step (step 204) of calculating each required test parameter, collect and at least three kinds of data such as the use amount α of analytical test parameter, recent access times β and untapped number of times γ and calculate the weighted value ω of each required test parameter of test module, therefore relation between its account form and α value, β value and the γ value does not repeat them here as mentioned before.
Then, set up an optimized test parameter download table, need download in the storage device in order to determine which test parameter, or which stored test parameter need be replaced in this storage device according to the weighted value ω of each required test parameter.Be the downloading order that preferential mode is arranged required test parameter then in this optimized test parameter download table, and provide the optimization of a test parameter to download flow process with the big more test parameter of weighted value.Then, download institute's test parameter optimization of arranging download flow process in the table, download required test parameter in regular turn to storage device according to optimized test parameter.
Then, set up a connection table (step 206), in order to show as downloading according to optimized test parameter, and the following storage location that is stated from each the required test parameter in the storage device, and original test pattern sets the contrast between the storage location of each desired parameters in storage device, and calculates the physical holding of the stock position in storage device of each required test parameter and originally be set in side-play amount between the storage location in the storage device.
Then, carry out a searching step (step 208), retrieve at each test parameter in the optimized test parameter download table, whether the retrieval storage device is loaded with this test parameter down, download if having no longer again, and because of its access times that in new testing process, increase or access times increase in the recent period, and recomputate and adjust its weighted value ω (step 214), but do not have the optimization of then being set up at optimized test parameter download table and download the order that flow process is arranged according to its weighted value ω, decision will be replaced old test parameter (step 210), downloading this parameter value (step 212) in storage device then, is that preferential mode is downloaded required test parameter with the big more test parameter of weighted value.Wherein, each required test parameter then because of its access times that in new testing process, increase or in the recent period access times increase, and recomputate and adjust its weighted value ω (step 214).Therefore, along with each test parameter over and over again is used or is not used at testing process, and make the α value of each test parameter, β value and γ value change, make its weights omega change and need recomputate and adjust, and then make optimized test parameter download table and the connection table set up according to weights omega rebulid or adjust, and the self-optimization test parameter is downloaded flow process at any time, and keep with the big more test parameter of weighted value is preferential optimization test parameter download flow process, and reach at any time all download flow processs of self-optimization test parameter, and all carry out the download of test parameter at any time, and then retrofit testing usefulness with minimum download time and time.
Then, seek step, switch in the connection table that switch sets up according to step 206 by one, contrast the storage location of each test parameter reality in storage device, and original test pattern sets the side-play amount between the storage location of each desired parameters in storage device, and find the required storage location of each test parameter in storage device of test pattern, then extract test parameter and test.
The invention provides a kind of test program system and method, its can be in testing process the download flow process of self-optimization test parameter, it is in the mode of the use amount of analyzing each required test parameter, calculate the weighted value of each test parameter, and in the preferential mode of downloading of the big more test parameter of weighted value, set up an optimized test parameter and download flow process, and adjust weighted value at any time according to the change of each test parameter access times, and the download flow process of self-optimization test parameter at any time, guarantee download time and time with minimum test parameter, download required test parameter, reduce the repeated downloads of same test parameter, and then improve tested performance.Therefore, test program system of this case and method more can possess advantage and the effect that has following prior art not have:
(1) can effectively reduce repetition data transmission capacity between tester table and the measuring head;
(2) system can calculate automatically, need not manually get involved adjustment;
When (3) running into the test branch flow process, can adapt to dynamic adjustment automatically;
(4) can utilize the storer of tester table fully, the performance ardware feature;
(5) both made the storer deficiency also can carry out test;
(6) can on tested performance, obtain optimal balance point automatically to tackling a large amount of test parameter data;
(7) its calculation framework (utilizing weighted value to calculate and analysis) can apply to the optimization of other testing processs, for example PELEVEL easily.
The above, it only is preferred embodiment of the present invention, be not that the present invention is done any pro forma restriction, though the present invention discloses as above with preferred embodiment, yet be not in order to limit the present invention, any those skilled in the art, in not breaking away from the technical solution of the present invention scope, when the technology contents that can utilize above-mentioned announcement is made a little change or is modified to the equivalent embodiment of equivalent variations, in every case be not break away from the technical solution of the present invention content, according to technical spirit of the present invention to any simple modification that above embodiment did, equivalent variations and modification all still belong in the scope of technical solution of the present invention.

Claims (20)

1, a kind of test program system is characterized in that it comprises:
One test pattern sends and tests required test parameter in order to the decision test signal;
One storage device is in order to download the test parameter required with storing test;
One switches switch, connects this test pattern and this storage device respectively; And
One scheduling device connects this change-over switch and this storage device respectively, in order to the download flow process of the required test parameter of this test pattern of optimization.
2, test program system according to claim 1, it is characterized in that wherein this storage device is not when the required test parameter of this test pattern exceeds the storage device capacity, once that all these test patterns are required test parameter is downloaded to this storage device, if exceed the storage device capacity, then download the required test parameter of this test pattern of part earlier in this storage device.
3, test program system according to claim 1 is characterized in that wherein the scheduling device comprises:
One test parameter unit is connected with this storage device, in order to collect this test pattern the test parameter that might need, and download test parameter to this storage device;
One weight unit is connected with this test parameter unit, in order to analyzing the use amount of the required test parameter of each this test pattern, and calculates the weighted value of its each this test parameter according to this;
One optimization scheduling unit connects this weight unit and this test parameter unit respectively, in order to set up an optimized test parameter download table according to the weighted value of each this test parameter; And
One scheduling converting unit is connected with this optimization scheduling unit, should the connection table in order to set up one, and the storage location of each required test parameter of test pattern in this storage device learnt in contrast.
4, test program system according to claim 3, it is characterized in that wherein each this test parameter is according at least three kinds of its weighted values of numerical evaluation, wherein this numerical value comprises a α value, it represents each this test parameter number of times of normal use or degree, a β value, it represents each this test parameter most recently used number of times or a degree and a γ value, and it represents each this untapped number of times of test parameter a period of time or degree.
5, test program system according to claim 4, whether it is characterized in that wherein this scheduling device is retrieved this storage device has downloaded the required test parameter of each this test pattern, be checked through the test parameter of having downloaded and then recomputate and adjust its weighted value again, if retrieve the test parameter of not downloading, then comply with the old test parameter that its weighted value decision will be replaced, and download this test parameter, after the download, recomputate and adjust its weighted value.
6, test program system according to claim 3, it is characterized in that the optimized test parameter download table that optimization scheduling unit is wherein set up, in order to determine those test parameters need be downloaded to this storage device, this test parameter unit is then downloaded flow process according to the optimized test parameter download table test parameter that this test pattern is required with an optimization and is downloaded in this storage device.
7, test program system according to claim 6, it is characterized in that wherein correlating table and be comprising and download flow process with optimization and be downloaded to the storage location of each this test parameter in storage device in this storage device, and original this test pattern sets the side-play amount between the storage location of each this test parameter in this storage device, and this change-over switch finds the required storage location of test parameter reality in this storage device of each this test pattern according to this side-play amount, tests and extract required test parameter.
8, a kind of test scheduling method is characterized in that it comprises:
Collect test parameter that all testing processs may use in the test parameter unit;
By a weight unit analysis and calculate the weighted value of each this test parameter;
Weighted value according to each this test parameter determines whether this test parameter is stated from the tester table down;
Download required test parameter; And
Begin to test.
9, test scheduling method according to claim 8 is characterized in that wherein also comprising prior download and partly tests the step of required test parameter in the storage device of a tester table.
10, test scheduling method according to claim 8 is characterized in that wherein also comprising the step of setting up a test pattern.
11, test scheduling method according to claim 10, it is characterized in that wherein also comprising the step of setting up an optimized test parameter download table according to the weighted value of each this test parameter, in order to determining some test parameters need download in this storage device, or those stored test parameters need be replaced in this storage device.
12, test scheduling method according to claim 11 is characterized in that wherein also comprising according to this optimized test parameter download table test parameter that this test pattern is required and is downloaded to step in this storage device with optimization download flow process.
13, test scheduling method according to claim 12, it is characterized in that wherein also comprising the step of setting up a connection table, download flow process in order to contrast with optimization and be downloaded to the storage location of each this test parameter in storage device in this storage device, and original this test pattern sets the side-play amount between the storage location of each this test parameter in this storage device.
14, test scheduling method according to claim 8 is characterized in that wherein also comprising a retrieval one test parameter and whether has been present in step in this storage device.
15, test scheduling method according to claim 14, it is characterized in that wherein if in this storage device, retrieve this test parameter, then recomputate and adjust its weighted value again, if in this storage device, do not retrieve this test parameter, then comply with the old test parameter that its weighted value decision will be replaced, and download this test parameter, after the download, recomputate and adjust its weighted value.
16, test scheduling method according to claim 13 is characterized in that it also comprises one and seeks step, in order to seek in this storage device with to each test parameter that should test pattern, and test.
17, test scheduling method according to claim 16, it is characterized in that wherein this searching step utilizes one to switch switch according to this side-play amount, and find each required test parameter reality storage location in this storage device, test and extract required test parameter.
18, test scheduling method according to claim 8 is characterized in that wherein this analysis and calculates the step of the weighted value of each this test parameter, is to utilize the use amount of each this test parameter to analyze and calculate.
19, test scheduling method according to claim 18, it is characterized in that the wherein weighted value of each this test parameter, according at least three kinds of its weighted values of numerical evaluation, wherein this numerical value comprises a α value, it represents each this test parameter number of times of normal use or degree, a β value, it represents each this test parameter most recently used number of times or a degree and a γ value, and it represents each this untapped number of times of test parameter a period of time or degree.
20, test scheduling method according to claim 8, the step that it is characterized in that wherein downloading required test parameter are to be preferential mode with the big more test parameter of weighted value, download required test parameter in tester table.
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CN103365765A (en) * 2012-03-28 2013-10-23 腾讯科技(深圳)有限公司 Test case screening method and test case screening system for testing
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CN102819310B (en) * 2011-06-09 2016-01-13 宏正自动科技股份有限公司 Output end power supply management method and device
CN103365765A (en) * 2012-03-28 2013-10-23 腾讯科技(深圳)有限公司 Test case screening method and test case screening system for testing
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CN109725249A (en) * 2019-01-31 2019-05-07 安庆师范大学 A kind of testing process dynamic adjusting method and adjustment system

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