CN101666013B

CN101666013B - Broken yarn detecting circuit for yarn feeder

Info

Publication number: CN101666013B
Application number: CN2009100961120A
Authority: CN
Inventors: 高山
Original assignee: NINGBO SUN TEXTILE MACHINERY CO Ltd
Current assignee: Zhejiang Sunzhou Electric Technology Co., Ltd.
Priority date: 2009-02-11
Filing date: 2009-02-11
Publication date: 2011-06-15
Anticipated expiration: 2029-02-11
Also published as: CN101666013A

Abstract

The invention discloses a broken yarn detecting circuit for a yarn feeder, wherein the yarn feeder comprises a front broken yarn detector and a rear broken yarn detector. The rear broken yarn detector comprises a rear broken yarn detecting circuit and a non-contact inductive switch which is connected in series in the rear broken yarn detecting circuit and is used for sensing the change of the working condition of the yarn. The broken yarn detecting circuit is characterized in that the rear broken yarn detecting circuit comprises a first rectifier bridge, a sampling circuit, an isolating circuit and a signal driving circuit, wherein, the sampling circuit is for collecting a broken yarn signal and is connected with the non-contact inductive switch in series, the isolating circuit is used for isolating an interference signal and the signal driving circuit is used for feeding back the broken yarn signal to the yarn feeder host. Compared with the prior art, the non-contact inductive switch is installed on the broken yarn detector in the invention, and the defect of the poor contact of a traditional touch switch after a long-time use is avoided. In addition, the isolating circuit is increased, thereby implementing the secondary isolation to the interference signal and ensuring the working reliability of the broken yarn detector.

Description

A kind of broken yarn testing circuit of Thread-feeding device

Technical field

The present invention relates to a kind of testing circuit, particularly a kind of Thread-feeding device broken yarn testing circuit that is applied on the knitting machine.

Background technology

The yarn-feeding device of knitting machine (being also referred to as yarn feeding device) generally all is provided with Yarn break checkout gear, in case detect broken yarn main control system stall in time, weaves lining defectives such as broken hole, broken needle or hand pick are arranged to prevent to form because of broken yarn.

As shown in Figure 1 and Figure 2, be traditional yarn-feeding device and the broken yarn detection method that is adopted thereof, in Thread-feeding device, be provided with metal feeler lever (being generally stainless steel wire) and sheet metal (being generally copper sheet), feeler 3 and back feeler 7, the contact site 31 of preceding feeler 3 and the contact site 71 of back feeler 7 and the inside that sheet metal all is arranged on Thread-feeding device before the metal feeler lever has generally included.Under the yarn normal operation, as shown in Figure 1, the contact site of metal feeler lever and sheet metal disconnects, when yarn breakage, as shown in Figure 2, back feeler 7 is under the effect of self gravitation, make the contact site 71 and the sheet metal of back feeler 7 be in contact with one another, the conducting of broken yarn testing circuit, the broken yarn fault-signal is exported to console controller by this testing circuit, and main frame is quit work.There is a shortcoming in the detection method of this direct contact type: because the own wt of metal feeler lever is very light, the amplitude of fluctuation of feeler lever contact site is generally little when broken yarn, slight contact only takes place between metal feeler lever contact site and the sheet metal, thereby the resistance that causes contact point is very big and very unstable, in use for some time, under the effect of electric current, oxidation takes place in the contact site of metal feeler lever and sheet metal easily, Chemical Physics such as carbonization change, the contact resistance at this position is increased (even infinitely great) rapidly, finally cause when broken yarn takes place, making testing circuit can't normally export the broken yarn fault-signal because of loose contact.

Because there is above-mentioned defective in traditional touch switch, people begin to consider to realize that with non-contact switch the broken yarn of Thread-feeding device detects, as the patent No. is that Chinese utility model " parallel broken yarn detector ", the application number of ZL96248084.5 is that 92204539.9 Chinese utility model patent " contactless detection broken yarn automatic stopping controller " discloses a kind of touchless broken yarn signal supervisory instrument respectively, above-mentioned patent is to utilize optical component to change optical signal into the signal of telecommunication, thereby the commentaries on classics of main control system stops.But the checkout gear in the above-mentioned patent has generally included transmitter, receiver and controller three and has cooperated, and the components and parts that testing circuit relates to are more, and correspondent control circuits is comparatively complicated, thereby makes the cost that manufactures and designs and safeguard increase; And, in above-mentioned patent, there is not the design isolated circuit, do not having under the situation of broken yarn, in case there is the interfering signal input in the external world, testing circuit will send signal and give main frame, thereby causes the mistakenly stop machine, influences operate as normal.

Summary of the invention

Technical problem to be solved by this invention is to provide a kind of circuit structure simple and have a Thread-feeding device broken yarn testing circuit of isolation features preferably at above-mentioned prior art present situation.

The present invention solves the problems of the technologies described above the technical scheme that is adopted: the broken yarn testing circuit of this Thread-feeding device, broken yarn detector and back broken yarn detector before described Thread-feeding device includes, wherein, described back broken yarn detector includes a back broken yarn testing circuit, this back broken yarn detector also includes a non-contact inductive switch that is serially connected among the broken yarn testing circuit of described back, this inductive switch is used to respond to the variation of yarn duty, it is characterized in that: described back broken yarn testing circuit includes

One first rectifier bridge (T1), this first rectifier bridge (T1) has first ac input end (AC1), second ac input end (AC2), first dc output end (V+) and second dc output end (V-), wherein, first ac input end (AC1) of described first rectifier bridge (T1) connects the input (U) of AC power, second ac input end (AC2) of this first rectifier bridge (T1) connects interchange ground (END), and second dc output end (V-) of this first rectifier bridge (T1) connects direct current ground (GND);

One sample circuit (A), be used to gather the broken yarn signal, described non-contact inductive switch series is connected in this sample circuit, the input (ai) of this sample circuit (A) connects the dc power anode (VCC) that AC power obtains after described first rectifier bridge (T1) rectification, the output of this sample circuit (A) includes first output (ao1) and second output (ao2), and first output (ao1) of described sample circuit (A) links to each other with second ac input end (AC2) of described first rectifier bridge (T1);

One buffer circuit (B), interfering signal through described sample circuit (A) is realized isolating, this buffer circuit (B) includes input (bi) and output (bo), and wherein, the input (bi) of this buffer circuit (B) links to each other with second output (ao2) of described sample circuit (A); And

One signal drive circuit (C), include input (ci), output (co) and feedback end (ck), this signal drive circuit (C) is given the Thread-feeding device main frame with described broken yarn signal feedback, wherein, the input (ci) of described signal drive circuit (C) connects the output (bo) of described buffer circuit (B), the output (co) of this signal drive circuit (C) connects second dc output end (V-) of described first rectifier bridge (T1), and the feedback end (ck) of this signal drive circuit (C) links to each other with first dc output end (V+) of described first rectifier bridge (T1).

Described back broken yarn testing circuit can for: described non-contact inductive switch is first optocoupler (IC1); Described sample circuit (A) is a core with this first optocoupler (IC1), also includes first resistance (R1), second resistance (R2); Described buffer circuit (B) is one second optocoupler (IC2), described signal drive circuit (C) includes the 3rd resistance (R3), the 4th resistance (R4), the 5th resistance (R5), first triode (Q1), first electric capacity (C1) and first light emitting diode (D1), wherein, the light-emitting diodes tube anode of described first optocoupler (IC1) connects dc power anode (VCC) through described first resistance (R1), the light-emitting diodes tube cathode of this first optocoupler (IC1) links to each other as first output (ao1) of sample circuit (A) and second ac input end (AC2) of described first rectifier bridge (T1), and the transistor emitter of first optocoupler (IC1) connects second ac input end (AC2) of described first rectifier bridge (T1); The light-emitting diodes tube anode of described second optocoupler (IC2) links to each other with described dc power anode (VCC) through described second resistance (R2), the light-emitting diodes tube cathode of this second optocoupler (IC2) links to each other with the transistor collector of described first optocoupler (IC1), second dc output end (V-) of the transistor emitter of second optocoupler (IC2) and described first rectifier bridge (T1) links to each other, the transistor collector one tunnel of second optocoupler (IC2) links to each other through the base stage of described the 3rd resistance (R3) with described positive-negative-positive first triode (Q1), another road first electric capacity (C1) connects direct current ground (GND), first dc output end (V+) of the emitter stage of described first triode (Q1) and described first rectifier bridge (T1) links to each other, the colelctor electrode one tunnel of first triode (Q1) links to each other with the anode of described first light emitting diode (D1), another Lu Jingdi five resistance (R5) connect direct current ground (GND), and the negative electrode of described first light emitting diode (D1) connects direct current ground (GND) through the 4th resistance (R4).

Described back broken yarn testing circuit also can for: described non-contact inductive switch is first optocoupler (IC1); Described sample circuit (A) is a core with this first optocoupler (IC1), also includes first resistance (R1), second resistance (R2); Described buffer circuit (B) is one second optocoupler (IC2), described signal drive circuit (C) includes the 3rd resistance (R3), the 4th resistance (R4), the 5th resistance (R5), first triode (Q1), first electric capacity (C1) and first light emitting diode (D1), wherein, the light-emitting diodes tube anode of described first optocoupler (IC1) connects dc power anode (VCC) through described first resistance (R1), the light-emitting diodes tube cathode of this first optocoupler (IC1) links to each other as first output (ao1) of sample circuit (A) and second ac input end (AC2) of described first rectifier bridge (T1), and the transistor emitter of first optocoupler (IC1) connects second ac input end (AC2) of described first rectifier bridge (T1); The light-emitting diodes tube anode one tunnel of described second optocoupler (IC2) links to each other with described dc power anode (VCC) through described second resistance (R2), another road directly links to each other with the transistor collector of described first optocoupler (IC1), the light-emitting diodes tube cathode of this second optocoupler (IC2) links to each other with the transistor emitter of described first optocoupler (IC1), second dc output end (V-) of the transistor emitter of second optocoupler (IC2) and described first rectifier bridge (T1) links to each other, the transistor collector one tunnel of second optocoupler (IC2) links to each other through the base stage of described the 3rd resistance (R3) with described positive-negative-positive first triode (Q1), another road first electric capacity (C1) connects direct current ground (GND), first dc output end (V+) of the emitter stage of described first triode (Q1) and described first rectifier bridge (T1) links to each other, the colelctor electrode one tunnel of first triode (Q1) links to each other with the anode of described first light emitting diode (D1), another Lu Jingdi five resistance (R5) connect direct current ground (GND), and the negative electrode of described first light emitting diode (D1) connects direct current ground (GND) through the 4th resistance (R4).

Described back broken yarn testing circuit can also for: described non-contact inductive switch is first optocoupler (IC1); Described sample circuit (A) is a core with this first optocoupler (IC1), also includes the 6th resistance (R6), the 7th resistance (R7), the 8th resistance (R8) and NPN type second triode (Q2); Described buffer circuit (B) is one second optocoupler (IC2), described signal drive circuit (C) includes the 9th resistance (R9), the tenth resistance (R10), the 11 resistance (R11), the 12 resistance (R12), first light emitting diode (D1), NPN type the 3rd triode (Q3) and second electric capacity (C2), wherein, the light-emitting diodes tube anode of described first optocoupler (IC1) links to each other with dc power anode (VCC) through described the 6th resistance (R6), the light-emitting diodes tube cathode of this first optocoupler (IC1) links to each other as first output (ao1) of sample circuit (A) and second ac input end (AC2) of described first rectifier bridge (T1), the transistor collector one tunnel of described first optocoupler (IC1) links to each other with dc power anode (VCC) through the 7th resistance (R7), another road connects the base stage of described second triode (Q2), and second ac input end (AC2) that the transistor emitter of the emitter stage of described second triode (Q2) and this first optocoupler (IC1) connects altogether to one point union and described first rectifier bridge (T1) links to each other; The light-emitting diodes tube anode of described second optocoupler (IC2) links to each other with dc power anode (VCC) through described the 8th resistance (R8), the light-emitting diodes tube cathode of this second optocoupler (IC2) links to each other with the colelctor electrode of described second triode (Q2), the transistor collector of this second optocoupler (IC2) links to each other through first dc output end (V+) of described the 9th resistance (R9) and described first rectifier bridge (T1), the transistor emitter one tunnel of this second optocoupler (IC2) links to each other through second dc output end (V-) of the tenth resistance (R10) and described first rectifier bridge (T1), another road links to each other with the base stage of described the 3rd triode (Q3), the emitter stage of the 3rd triode (Q3) links to each other with direct current ground (GND), also be parallel with described second electric capacity (C2) between the base stage of the 3rd triode (Q3) and the emitter stage, the colelctor electrode one tunnel of described the 3rd triode (Q3) links to each other through first dc output end (V+) of described the 11 resistance (R11) and first rectifier bridge (T1), another road links to each other with the negative electrode of described first light emitting diode (D1), and the anode of this first light emitting diode (D1) links to each other through first dc output end (V+) of described the 12 resistance (R12) and described first rectifier bridge (T1).

Broken yarn testing circuit before broken yarn detector includes one before described, the input (ei) of broken yarn testing circuit (E) and the input (U) of described AC power link to each other before being somebody's turn to do, and the output (eo) of this preceding broken yarn testing circuit (E) links to each other with second ac input end (AC2) of described first rectifier bridge (T1).

The broken yarn testing circuit includes second rectifier bridge (T2) before described, preceding broken yarn switch (K), the 13 resistance (R13) and second light emitting diode (D2), wherein, described second rectifier bridge (T2) has first ac input end (AC1 '), second ac input end (AC2 '), first dc output end (V+ ') and second dc output end (V-'), first ac input end (AC1 ') of this second rectifier bridge (T2) and the input (U) of described AC power link to each other, second ac input end (AC2 ') of this second rectifier bridge (T2) broken yarn switch (K) before described connects interchange ground (END), first dc output end (V+ ') of this second rectifier bridge (T2) links to each other through the anode of described the 13 resistance (R13) with described second light emitting diode (D2), and second dc output end (V-') of this second light emitting diode (D2) negative electrode and described second rectifier bridge (T2) links to each other.

Compared with prior art, the invention has the advantages that: with the broken yarn signal by the sample circuit collection, and be converted to the signal of telecommunication and then notify the stall of Thread-feeding device main frame, because the non-contact inductive switch has been installed on broken yarn detector, can avoid traditional touch switch to use the defective of back loose contact for a long time, guarantee the accuracy of broken yarn detection and the long-term effectiveness of broken yarn detector work; In addition; because behind sample circuit, increased buffer circuit again, guarantee under the yarn normal operating conditions, can realize secondary isolation to interfering signal; prevent because the Thread-feeding device mistakenly stop machine that causes of interfering signal, further guaranteed the functional reliability of broken yarn detector.

Description of drawings

Fig. 1 is a Thread-feeding device structural representation of the prior art;

Fig. 2 is the partial sectional view of Thread-feeding device shown in Figure 1 when broken yarn;

Fig. 3 is the Thread-feeding device partial sectional view of the embodiment of the invention;

Fig. 4 is the circuit theory diagrams of the embodiment of the invention;

Fig. 5 is the circuit structure diagram of the embodiment of the invention one;

Fig. 6 is the circuit structure diagram of the embodiment of the invention two;

Fig. 7 is the circuit structure diagram of the embodiment of the invention three.

Fig. 8 is a back of the present invention broken yarn testing circuit schematic diagram.

The specific embodiment

Embodiment describes in further detail the present invention below in conjunction with accompanying drawing.

Be the Thread-feeding device structural representation of prior art as shown in Figure 1 and Figure 2, wherein, yarn 1 is wrapped on the yarn storage wheel 2, one of yarn 1 passes clearing sheet 4, the yarn clip board 5 that is positioned at preceding feeler 3 positions successively, pass from the top of advancing yarn porcelain girth sheets 6 then, the other end of yarn 1 passes from the bottom of the yarn parts 8 that are positioned at feeler 7 positions, back, and the end of preceding feeler 3 and back feeler 7 is tangent and support with yarn 1 respectively; Fig. 1 is the state diagram of Thread-feeding device when the yarn operate as normal, and at this moment, yarn 1 is tightened, and the end of preceding feeler 3 and back feeler 7 is dropped on the yarn 1; Fig. 2 then is the state diagram of Thread-feeding device when broken yarn, at this moment, preceding feeler 3 and back feeler 7 are because no support force effect after the yarn disconnection, feeler is sagging under the deadweight effect, the contact site 71 of the contact site 31 of preceding feeler 3 and back feeler 7 contacts with preceding spy copper sheet 91 that is arranged on Thread-feeding device inside and back spy copper sheet 92 respectively, thereby start the broken yarn testing circuit, and main control system stall.

Fig. 3 is described, for the present invention's employing is contactless induction switch structure, the concrete photoinduction switch that is cooperated by optocoupler 93 and light barrier 72 that adopts replaces metal feeler lever of the prior art and this touch switch of copper sheet, wherein, light barrier 72 links to each other with back feeler 7, can drive light barrier 72 actions by back feeler 7.

When light barrier 72 blocked optocoupler 93 centre positions, the receiving terminal of optocoupler 93 can't receive the light that transmitting terminal sends, and optocoupler 93 ends, the output no signal of optocoupler 93; When in the middle of the optocoupler 93 during no light barrier 72, the receiving terminal of optocoupler 93 can receive the light that transmitting terminal sends, optocoupler 93 conductings, and the output of optocoupler 93 has signal to export.

Here; light barrier 72 blocks in the middle of the optocoupler 93 or all can not produce a non-contact switch signal at optocoupler 93; position relation between optocoupler under the yarn normal operating conditions 93 and light barrier 72 (being light barrier 72 to be arranged or do not have light barrier 72 in the middle of the optocoupler 93) will be by concrete testing circuit decision; guarantee when the broken yarn state; by the change in location of the back light barrier 72 that causes of feeler 7, can make broken yarn testing circuit operate as normal and export a fault-signal and main control system is shut down with respect to optocoupler 93.

Fig. 4 is the schematic block circuit diagram of broken yarn testing circuit behind the present invention, this back broken yarn detector includes a non-contact inductive switch that is serially connected among the broken yarn testing circuit of back, this inductive switch is a conducting state when the yarn operate as normal, be off-state when broken yarn, described back broken yarn testing circuit includes

The first rectifier bridge T1, this first rectifier bridge T1 is a full bridge rectifier, have the first ac input end AC1, the second ac input end AC2, the first dc output end V+ and the second dc output end V-, wherein, the first ac input end AC1 of the first rectifier bridge T1 connects the input U of AC power, the second ac input end AC2 of this first rectifier bridge T1 connects interchange ground END, and the second dc output end V-of this first rectifier bridge T1 meets direct current ground GND;

Sample circuit A, be used to gather the broken yarn signal, the non-contact inductive switch series is connected in this sample circuit, the input ai of this sample circuit A connects the dc power anode VCC that AC power obtains after the first rectifier bridge T1 rectification, the output of this sample circuit A includes the first output ao1 and the second output ao2, and the first output ao1 of sample circuit A links to each other with the second ac input end AC2 of the first rectifier bridge T1;

Buffer circuit B realizes secondary isolation to the interfering signal through over-sampling circuit A, and this buffer circuit B includes input bi and output bo, and wherein, the second output ao2 of the input bi of this buffer circuit B and sample circuit A links to each other;

Signal drive circuit C, include input ci, output co and feedback end ck, this signal drive circuit C gives the Thread-feeding device main frame with the broken yarn signal feedback, wherein, the input ci of signal drive circuit C connects the output bo of buffer circuit B, the output co of this signal drive circuit C connects the second dc output end V-of the first rectifier bridge T1, and the first dc output end V+ of the feedback end ck of this signal drive circuit C and the first rectifier bridge T1 links to each other; And

Preceding broken yarn testing circuit E, the input ei of this preceding broken yarn testing circuit E and the input U of AC power link to each other, and the second ac input end AC2 of the output eo of preceding broken yarn testing circuit E and the first rectifier bridge T1 links to each other.

Fig. 5～Fig. 7 is three specific embodiments of the schematic block circuit diagram of corresponding diagram 4 of the present invention, and, three embodiment adopt the 12V ac power supply respectively, this alternating current obtains 12V dc source VCC after through the first rectifier bridge T1 rectification and drives subsequent conditioning circuit work, the 12V AC power is a power input, is again the fault signal output part, simultaneously, realize the secondary isolation by buffer circuit in the circuit, strengthened antijamming capability.

Embodiment one, as shown in Figure 5:

Model is that the grooved first optocoupler IC1 of ITR8105 is connected among the employing circuit A as non-contact inductive switch series of the present invention, and this sample circuit A is a core with the first optocoupler IC1, also comprises first resistance R 1, second resistance R 2;

Buffer circuit B comprises that model is the grooved second optocoupler IC2 of P521;

Signal drive circuit C comprises the 3rd resistance R 3, the 4th resistance R 4, the 5th resistance R 5, the first triode Q1, first capacitor C 1 (time-lag action) and the first light emitting diode D1;

Preceding broken yarn testing circuit comprises that model is similarly the second rectifier bridge T2 of MB6F1A, preceding broken yarn K switch, the 13 resistance R 13 and the second light emitting diode D2.

Wherein, the light-emitting diodes tube anode of the first optocoupler IC1 connects 12V dc power anode VCC through first resistance R 1, the light-emitting diodes tube cathode of this first optocoupler IC1 links to each other as the first output ao1 of sample circuit A and the second ac input end AC2 of the first rectifier bridge T1, and the transistor emitter of the first optocoupler IC1 connects the second ac input end AC2 of the first rectifier bridge T1;

The light-emitting diodes tube anode of the second optocoupler IC2 links to each other with 12V dc power anode VCC through second resistance R 2, the light-emitting diodes tube cathode of this second optocoupler IC2 and the transistor collector of the first optocoupler IC1 link to each other, the second dc output end V-of the transistor emitter of the second optocoupler IC2 and the first rectifier bridge T1 links to each other, the transistor collector one tunnel of the second optocoupler IC2 links to each other through the base stage of the 3rd resistance R 3 with the positive-negative-positive first triode Q1, another road first capacitor C 1 connects direct current ground GND, the first dc output end V+ of the emitter stage of the first triode Q1 and the first rectifier bridge T1 links to each other, the colelctor electrode one tunnel of the first triode Q1 links to each other with the anode of the first light emitting diode D1, another Lu Jingdi five resistance R 5 connect direct current ground GND, and the negative electrode of the first light emitting diode D1 meets direct current ground GND through the 4th resistance R 4;

The second rectifier bridge T2 has the first ac input end AC1 ', the second ac input end AC2 ', the first dc output end V+ ' and the second dc output end V-', the first ac input end AC1 ' of this second rectifier bridge T2 and the input U of 12V AC power link to each other, the second ac input end AC2 ' of this second rectifier bridge T2 connects interchange ground END through preceding broken yarn K switch, the first dc output end V+ ' of this second rectifier bridge T2 links to each other through the anode of the 13 resistance R 13 and the second light emitting diode D2, and the second dc output end V-' of this second light emitting diode D2 negative electrode and the second rectifier bridge T2 links to each other.

The operation principle of embodiment one is:

Preceding broken yarn testing circuit: under normal circumstances, preceding broken yarn K switch disconnects, at this moment, the first dc output end V+ ' of the second rectifier bridge T2 and the second dc output end V-' do not have voltage output, the second light emitting diode D2 do not work (no signal indication), on the direct current output loop of the second rectifier bridge T2, there is not voltage change, the output of fault-free signal, Thread-feeding device main frame operate as normal;

When taking place under the broken yarn situation, at this moment, preceding broken yarn K switch auto-closing, voltage of output on the dc output end of the second rectifier bridge T2 after the closure, this voltage drives the second light emitting diode D2 luminous (signal indication) by the 13 resistance R 13, when the second light emitting diode D2 is luminous, can on the 12V current loop, produce pressure drop, and give main frame by second rectifier bridge T2 output fault-signal, and then the main control system stall.

Back broken yarn testing circuit: under normal circumstances, the centre of the first optocoupler IC1 is blocked by light barrier, the light that the light emitting diode of the first optocoupler IC1 transmitting terminal sends can not be received termination and receive, the output triode of the first optocoupler IC1 ends, so, no-voltage on the input light emitting diode of the second optocoupler IC2, the output triode of this second optocoupler IC2 also ends, and, the current collection of the output triode of the second optocoupler IC2 is high level very, correspondingly, the base stage of the first triode Q1 also is a high level, and the first triode Q1 reverse bias ends, the loop of testing circuit disconnects, the first light emitting diode D1 does not work (no signal indication), does not produce voltage change on the loop, the output of fault-free signal;

When taking place under the broken yarn situation, the centre of the first optocoupler IC1 does not have light barrier, at this moment, the light that the light emitting diode of the first optocoupler IC1 transmitting terminal sends is received termination and receives, make the triode of output be in conducting state, low level signal of first optocoupler IC1 output is given the base stage of the first triode Q1, make the triode Q1 forward bias conducting of winning, so, the first triode Q1, the first light emitting diode D1, the 4th resistance R 4 and the 5th resistance R 5 constitute a DC loop, the first light emitting diode D1 luminous (signal indication), when the first light emitting diode D1 is luminous, can makes the voltage of 12V DC loop produce certain fluctuation (pressure drop), and this direct current fluctuation voltage is converted to the AC ripple signal by the first rectifier bridge T1, and export to main frame as a fault-signal, and then the control Thread-feeding device quits work.

Embodiment two, as shown in Figure 6:

The element composition of present embodiment circuit and embodiment's one is identical, and unique difference is that the output of the first optocoupler IC1 is different with the connected mode of the input of the second optocoupler IC2.

In the present embodiment, the light-emitting diodes tube anode of the first optocoupler IC1 connects 12V dc power anode VCC through first resistance R 1, the light-emitting diodes tube cathode of this first optocoupler IC1 links to each other as the first output ao1 of sample circuit A and the second ac input end AC2 of the first rectifier bridge T1, and the transistor emitter of the first optocoupler IC1 connects the second ac input end AC2 of the first rectifier bridge T1;

The light-emitting diodes tube anode one tunnel of the second optocoupler IC2 links to each other with dc power anode VCC through second resistance R 2, another road directly links to each other with the transistor collector of the first optocoupler IC1, and the light-emitting diodes tube cathode of this second optocoupler IC2 and the transistor emitter of the first optocoupler IC1 link to each other.Connected mode between all the other elements is with embodiment one, do not do at this and gives unnecessary details.

The operation principle of embodiment two:

The operation principle of preceding broken yarn testing circuit is not described further at this with embodiment one.

Back broken yarn testing circuit: under the yarn normal operation, the centre of the first optocoupler IC1 does not have light barrier, the light that the light emitting diode of the first optocoupler IC1 transmitting terminal sends is received termination and receives, the output triode conducting of the first optocoupler IC1, make that the input light emitting diode anode potential of the second optocoupler IC2 is a low level, the second optocoupler IC2 cisco unity malfunction, at this moment, the base stage of the first triode Q1 is a high level, the first triode Q1 ends, the first light emitting diode D2 does not work, the output of fault-free signal;

Under yarn broken yarn situation, blocked by light barrier in the middle of the first optocoupler IC1, at this moment, the first optocoupler IC1 cisco unity malfunction, the output triode of the first optocoupler IC1 ends, thereby a 12V forward voltage is provided for the input of the second optocoupler IC2, make the second optocoupler IC2 operate as normal, the output triode conducting of the second optocoupler IC2, the base potential of the first triode Q1 is dragged down, the first triode Q1 conducting, so, the first triode Q1, the first light emitting diode D1, the 4th resistance R 4 and the 5th resistance R 5 constitute a DC loop, and the first light emitting diode D1 luminous (signal indication) is when the first light emitting diode D1 is luminous, can make the voltage of 12V DC loop produce certain fluctuation (pressure drop), and by the first rectifier bridge T1 this direct current fluctuation voltage is converted to the AC ripple signal, and exports to main frame, and then the control Thread-feeding device quits work as a fault-signal.

Embodiment three, as shown in Figure 7:

Model is that the grooved first optocoupler IC1 of ITR8105 is connected among the employing circuit A as non-contact inductive switch series of the present invention, this sample circuit A is a core with this first optocoupler IC1, also includes the 6th resistance R 6, the 7th resistance R 7, the 8th resistance R 8 and the NPN type second triode Q2;

Signal drive circuit C includes the 9th resistance R 9, the tenth resistance R the 10, the 11 resistance R the 11, the 12 resistance R 12, the first light emitting diode D1, NPN type the 3rd triode Q3 and second capacitor C 2 (time-lag action);

Wherein, the light-emitting diodes tube anode of the first optocoupler IC1 links to each other with dc power anode VCC through the 6th resistance R 6, the light-emitting diodes tube cathode of this first optocoupler IC1 links to each other as the first output ao1 of sample circuit A and the second ac input end AC2 of the first rectifier bridge T1, the transistor collector one tunnel of the first optocoupler IC1 links to each other with dc power anode VCC through the 7th resistance R 7, another road connects the base stage of the second triode Q2, and the second ac input end AC2 that the transistor emitter of the emitter stage of the second triode Q2 and this first optocoupler IC1 connects altogether to the one point union and the first rectifier bridge T1 links to each other;

The light-emitting diodes tube anode of the second optocoupler IC2 links to each other with dc power anode VCC through the 8th resistance R 8, the light-emitting diodes tube cathode of this second optocoupler IC2 and the colelctor electrode of the second triode Q2 link to each other, the transistor collector of this second optocoupler IC2 links to each other through the first dc output end V+ of the 9th resistance R 9 and the first rectifier bridge T1, the transistor emitter one tunnel of this second optocoupler IC2 links to each other through the second dc output end V-of the tenth resistance R 10 and the first rectifier bridge T1, another road links to each other with the base stage of the 3rd triode Q3, the emitter stage of the 3rd triode Q3 links to each other with direct current ground GND, also be parallel with second capacitor C 2 between the base stage of the 3rd triode Q3 and the emitter stage, the colelctor electrode one tunnel of the 3rd triode Q3 links to each other through the first dc output end V+ of the 11 resistance R 11 and the first rectifier bridge T1, another road links to each other with the negative electrode of the first light emitting diode D1, and the anode of this first light emitting diode D1 links to each other through the first dc output end V+ of the 12 resistance R 12 and the first rectifier bridge T1.

The operation principle of embodiment three:

Back broken yarn testing circuit: under the yarn normal operation, there is not light barrier in the middle of the first optocoupler IC1, the light that the light emitting diode of the first optocoupler IC1 transmitting terminal sends is received termination and receives, the output triode of the first optocoupler IC1 is in conducting state, and export the base stage that a low level signal is given the second triode Q2, so, the second triode Q2 instead ends partially, the current collection of the second triode Q2 is high level very, the second optocoupler IC2 can't operate as normal, and the output triode of the second optocoupler IC2 ends, therefore, the base stage of the 3rd triode Q3 is similarly low level, the 3rd triode Q3 is in cut-off state, and the 12V DC loop is in off-state, and the first light emitting diode D1 does not work, the supply voltage no change, the output of fault-free signal;

Under yarn broken yarn situation, the centre of the first optocoupler IC1 is blocked by light barrier, the output triode of the first optocoupler IC1 ends, the base stage of the second triode Q2 obtains high level and conducting, at this moment, the second optocoupler IC2 operate as normal, the light that the input light emitting diode of the second optocoupler IC2 sends is received termination and receives, the output triode of the second optocoupler IC2 is in conducting state, so, the base stage of the 3rd triode Q3 is high level and conducting, the 11 resistance R 11, the first light emitting diode D1 and the 12 resistance R 12 are formed a DC loop, the first light emitting diode D1 luminous (signal indication), when the first light emitting diode D1 is luminous, can make the voltage on the 12V DC loop produce certain fluctuation (pressure drop), this direct current fluctuation voltage is fed back to an AC ripple signal and exports to main frame as a fault-signal by the first rectifier bridge T1, and then the control Thread-feeding device quits work.

Claims

1. the broken yarn testing circuit of a Thread-feeding device, broken yarn detector and back broken yarn detector before described Thread-feeding device includes, wherein, described back broken yarn detector includes a back broken yarn testing circuit, this back broken yarn detector also includes a non-contact inductive switch that is serially connected among the broken yarn testing circuit of described back, this inductive switch is used to respond to the variation of yarn duty, it is characterized in that: described back broken yarn testing circuit includes

2. the broken yarn testing circuit of Thread-feeding device according to claim 1, it is characterized in that: described non-contact inductive switch is first optocoupler (IC1); Described sample circuit (A) is a core with this first optocoupler (IC1), also includes first resistance (R1), second resistance (R2); Described buffer circuit (B) is one second optocoupler (IC2), described signal drive circuit (C) includes the 3rd resistance (R3), the 4th resistance (R4), the 5th resistance (R5), first triode (Q1), first electric capacity (C1) and first light emitting diode (D1)

Wherein, the light-emitting diodes tube anode of described first optocoupler (IC1) connects dc power anode (VCC) through described first resistance (R1), the light-emitting diodes tube cathode of this first optocoupler (IC1) links to each other as first output (ao1) of sample circuit (A) and second ac input end (AC2) of described first rectifier bridge (T1), and the transistor emitter of first optocoupler (IC1) connects second ac input end (AC2) of described first rectifier bridge (T1);

The light-emitting diodes tube anode of described second optocoupler (IC2) links to each other with described dc power anode (VCC) through described second resistance (R2), the light-emitting diodes tube cathode of this second optocoupler (IC2) links to each other with the transistor collector of described first optocoupler (IC1), second dc output end (V-) of the transistor emitter of second optocoupler (IC2) and described first rectifier bridge (T1) links to each other, the transistor collector one tunnel of second optocoupler (IC2) links to each other through the base stage of described the 3rd resistance (R3) with described first triode (Q1), another road first electric capacity (C1) connects direct current ground (GND), first dc output end (V+) of the emitter stage of described first triode (Q1) and described first rectifier bridge (T1) links to each other, the colelctor electrode one tunnel of first triode (Q1) links to each other with the anode of described first light emitting diode (D1), another Lu Jingdi five resistance (R5) connect direct current ground (GND), and the negative electrode of described first light emitting diode (D1) connects direct current ground (GND) through the 4th resistance (R4).

3. the broken yarn testing circuit of Thread-feeding device according to claim 1, it is characterized in that: described non-contact inductive switch is first optocoupler (IC1); Described sample circuit (A) is a core with this first optocoupler (IC1), also includes first resistance (R1), second resistance (R2); Described buffer circuit (B) is one second optocoupler (IC2), described signal drive circuit (C) includes the 3rd resistance (R3), the 4th resistance (R4), the 5th resistance (R5), first triode (Q1), first electric capacity (C1) and first light emitting diode (D1)

The light-emitting diodes tube anode one tunnel of described second optocoupler (IC2) links to each other with described dc power anode (VCC) through described second resistance (R2), another road directly links to each other with the transistor collector of described first optocoupler (IC1), the light-emitting diodes tube cathode of this second optocoupler (IC2) links to each other with the transistor emitter of described first optocoupler (IC1), second dc output end (V-) of the transistor emitter of second optocoupler (IC2) and described first rectifier bridge (T1) links to each other, the transistor collector one tunnel of second optocoupler (IC2) links to each other through the base stage of described the 3rd resistance (R3) with described first triode (Q1), another road first electric capacity (C1) connects direct current ground (GND), first dc output end (V+) of the emitter stage of described first triode (Q1) and described first rectifier bridge (T1) links to each other, the colelctor electrode one tunnel of first triode (Q1) links to each other with the anode of described first light emitting diode (D1), another Lu Jingdi five resistance (R5) connect direct current ground (GND), and the negative electrode of described first light emitting diode (D1) connects direct current ground (GND) through the 4th resistance (R4).

4. the broken yarn testing circuit of Thread-feeding device according to claim 1, it is characterized in that: described non-contact inductive switch is first optocoupler (IC1); Described sample circuit (A) is a core with this first optocoupler (IC1), also includes the 6th resistance (R6), the 7th resistance (R7), the 8th resistance (R8) and NPN type second triode (Q2); Described buffer circuit (B) is one second optocoupler (IC2), described signal drive circuit (C) includes the 9th resistance (R9), the tenth resistance (R10), the 11 resistance (R11), the 12 resistance (R12), first light emitting diode (D1), NPN type the 3rd triode (Q3) and second electric capacity (C2)

Wherein, the light-emitting diodes tube anode of described first optocoupler (IC1) links to each other with dc power anode (VCC) through described the 6th resistance (R6), the light-emitting diodes tube cathode of this first optocoupler (IC1) links to each other as first output (ao1) of sample circuit (A) and second ac input end (AC2) of described first rectifier bridge (T1), the transistor collector one tunnel of described first optocoupler (IC1) links to each other with dc power anode (VCC) through the 7th resistance (R7), another road connects the base stage of described second triode (Q2), and second ac input end (AC2) that the transistor emitter of the emitter stage of described second triode (Q2) and this first optocoupler (IC1) connects altogether to one point union and described first rectifier bridge (T1) links to each other;

The light-emitting diodes tube anode of described second optocoupler (IC2) links to each other with dc power anode (VCC) through described the 8th resistance (R8), the light-emitting diodes tube cathode of this second optocoupler (IC2) links to each other with the colelctor electrode of described second triode (Q2), the transistor collector of this second optocoupler (IC2) links to each other through first dc output end (V+) of described the 9th resistance (R9) and described first rectifier bridge (T1), the transistor emitter one tunnel of this second optocoupler (IC2) links to each other through second dc output end (V-) of the tenth resistance (R10) and described first rectifier bridge (T1), another road links to each other with the base stage of described the 3rd triode (Q3), the emitter stage of the 3rd triode (Q3) links to each other with direct current ground (GND), also be parallel with described second electric capacity (C2) between the base stage of the 3rd triode (Q3) and the emitter stage, the colelctor electrode one tunnel of described the 3rd triode (Q3) links to each other through first dc output end (V+) of described the 11 resistance (R11) and first rectifier bridge (T1), another road links to each other with the negative electrode of described first light emitting diode (D1), and the anode of this first light emitting diode (D1) links to each other through first dc output end (V+) of described the 12 resistance (R12) and described first rectifier bridge (T1).

5. the broken yarn testing circuit of Thread-feeding device according to claim 1, it is characterized in that: broken yarn testing circuit before broken yarn detector includes before described, the input (ei) of broken yarn testing circuit (E) and the input (U) of described AC power link to each other before being somebody's turn to do, and the output (eo) of this preceding broken yarn testing circuit (E) links to each other with second ac input end (AC2) of described first rectifier bridge (T1).

6. the broken yarn testing circuit of Thread-feeding device according to claim 5, it is characterized in that: the broken yarn testing circuit includes second rectifier bridge (T2) before described, preceding broken yarn switch (K), the 13 resistance (R13) and second light emitting diode (D2), wherein, described second rectifier bridge (T2) has first ac input end (AC1 '), second ac input end (AC2 '), first dc output end (V+ ') and second dc output end (V-'), first ac input end (AC1 ') of this second rectifier bridge (T2) and the input (U) of described AC power link to each other, second ac input end (AC2 ') of this second rectifier bridge (T2) broken yarn switch (K) before described connects interchange ground (END), first dc output end (V+ ') of this second rectifier bridge (T2) links to each other through the anode of described the 13 resistance (R13) with described second light emitting diode (D2), and second dc output end (V-') of this second light emitting diode (D2) negative electrode and described second rectifier bridge (T2) links to each other.