CN101629987B - Method for detecting circuital suspended joints - Google Patents
Method for detecting circuital suspended joints Download PDFInfo
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- CN101629987B CN101629987B CN2008101377300A CN200810137730A CN101629987B CN 101629987 B CN101629987 B CN 101629987B CN 2008101377300 A CN2008101377300 A CN 2008101377300A CN 200810137730 A CN200810137730 A CN 200810137730A CN 101629987 B CN101629987 B CN 101629987B
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Abstract
The invention provides a method for detecting circuital suspended joints, which can perform detection at the early design stage at a quick detection speed without detection errors. The method for detecting the circuital suspended joints comprises the following steps: providing a network online list which is used for describing the circuit structure of an application circuit, wherein the application circuit comprises a plurality of transistors; coupling each one of a power supply port and a signal input port of the application port to a voltage supply; generating test voltage into the application circuit through each voltage supply so that the test voltage is transmitted to the transistors, wherein the test voltage is larger than the reference voltage; and detecting whether the voltage of the points of junction of the transistors in the transistors is larger than the reference voltage so as to determine whether the points of junction are the suspended joints.
Description
Technical field
The invention relates to a kind of design review (check) (DR) method, be meant a kind of inspection method of circuit suspension joint especially.
Background technology
In the design process of integrated circuit, network on-line table (netlist) is a kind of file of the circuit structure with the text description application circuit.In order to confirm that the described application circuit of network on-line table can normal operation, the inspection of circuit suspension joint must.
In general, the inspection method of circuit suspension joint is by electric design automation (ElectronicDesign Automation, EDA) the built-in program of instrument is checked the network on-line table of application circuit, to judge each metal-oxide semiconductor (MOS) (the Metal-Oxide Semiconductor in this application circuit, whether grid MOS) is connected to any element, if be not connected to any element, then the grid suspension joint of this metal-oxide semiconductor (MOS) of direct representation.The method can just check in that layout (layout) is preceding, can wrongheaded shortcoming but have.For example: when the grid of metal-oxide semiconductor (MOS) only was connected to an end of electric capacity, the grid of this metal-oxide semiconductor (MOS) was actually the state of suspension joint, did not have suspension joint but can be judged as by the method.Again for example: when the grid of metal-oxide semiconductor (MOS) only was connected to an end of resistance, whether the grid of this metal-oxide semiconductor (MOS) the suspension joint other end suspension joint whether that depends on this resistance, but the known practice can be judged as and do not have suspension joint.
Summary of the invention
Therefore, purpose of the present invention is promptly in the inspection method that a kind of circuit suspension joint is provided, and the design phase is checked in early days, inspection speed can check mistake soon and not.
The present invention is the inspection method that discloses a kind of circuit suspension joint, and the one embodiment comprises following steps: the network on-line table is provided, and this network on-line table is used for describing the circuit structure of application circuit, and wherein, this application circuit comprises a plurality of transistors; The power port of this application circuit and in the signal input port each are coupled to a voltage source; Produce test voltage to this application circuit by each voltage source, make these test voltages be transmitted to those transistors, wherein, these test voltages are greater than reference voltage; And check in those transistors that whether the voltage of transistorized tie point is greater than this reference voltage, to determine whether suspension joint of this tie point.
In addition, another embodiment of the inspection method of circuit suspension joint of the present invention comprises following steps: the network on-line table is provided, and this network on-line table is used for describing the circuit structure of application circuit, and wherein, this application circuit comprises a plurality of transistors; The power port of this application circuit and in the signal input port each are coupled to a voltage source; Produce test voltage to this circuit by each voltage source, make these test voltages be transmitted to those transistors; And check in those transistors whether the voltage of transistorized tie point equals in these test voltages in fact, to determine whether suspension joint of this tie point.
Description of drawings
Fig. 1 is a process flow diagram, and first embodiment of the inspection method of circuit suspension joint of the present invention is described; And
Fig. 2 is a process flow diagram, and second embodiment of the inspection method of circuit suspension joint of the present invention is described;
Fig. 3 is a circuit diagram, illustrates that how the foregoing description has the existence of suspension joint situation in the check circuit.
[main element label declaration]
11～15 steps 314,315... transistor
21～25 step 316 resistance
31 application circuits, 317 electric capacity
311,312... power port 318,319... transistor
313 signal input ports, 32～34 supply-voltage sources
Embodiment
About aforementioned and other technology contents, characteristics and effect of the present invention, in the following detailed description that cooperates with reference to graphic and two embodiment, can clearly present.
See also Fig. 1, it illustrates first embodiment of the inspection method of circuit suspension joint of the present invention, and first embodiment comprises following steps:
Step 11: the network on-line table is provided, and this network on-line table is used for describing the circuit structure of application circuit, and wherein, this application circuit has comprised a plurality of transistors.
Step 12: the power port of this application circuit and in the signal input port each are coupled to a voltage source.
Step 13: produce test voltage to this application circuit by each voltage source, make these test voltages be transmitted to those transistors, wherein, these test voltages are greater than reference voltage.
Step 14: check in those transistors that whether the voltage of transistorized tie point is greater than this reference voltage, to determine whether suspension joint of this tie point.
Step 15: when this tie point is suspension joint, revise this network on-line table, to produce new network on-line table.
Can be well understood to by above-mentioned step, the first embodiment of the present invention provides the network on-line table earlier, and this network on-line table has been described the circuit structure of application circuit, for example: network communication controller, display controller, analog-to-digital converter, digital to analog converter, phase-locked loop ... wait application circuit.No matter be simulation or digital circuit, present embodiment can check all whether its circuit has the suspension joint situation to take place.
Then, the power port of this application circuit and in the signal input port each are coupled to a voltage source, produce test voltage to this application circuit by each voltage source again.The person of noting, these test voltages can be identical (for example: all power ports and signal input port all meet 5V and test), perhaps these test voltages can be that identical (for example: the part power port meets 5V to part, another part power port meets 3.3V, the part signal input port meets 5V, and another part signal input port meets 3.3V).In addition, these test voltages are greater than reference voltage, and this reference voltage can be decided in its sole discretion by circuit designers, for example: 0V, 3.3V or 5V.Certainly, the test voltage of present embodiment and reference voltage do not exceed with 5V, 3.3V and 0V, also can be other magnitude of voltage.
After these test voltages are transmitted to those transistors, check then in those transistors that whether the voltage of transistorized tie point is greater than this reference voltage, to determine whether suspension joint of this tie point.And above-mentioned tie point for example is transistorized grid, drain electrode or source electrode.At last, if the voltage of checking certain tie point is during greater than this reference voltage, then this tie point is considered as there is not suspension joint.On the contrary, if check when the voltage of certain tie point is less than or equal to this reference voltage, then this tie point is considered as the situation generation of suspension joint, at this moment, need to revise this network on-line table, and produce new network on-line table and check again again, and repeat to revise and checking process, take place until the situation that does not have suspension joint.
Then, see also Fig. 2, it illustrates second embodiment of circuit suspension joint inspection method of the present invention, and second embodiment comprises following steps:
Step 21: the network on-line table is provided, and this network on-line table is used for describing the circuit structure of application circuit, and wherein, this application circuit has comprised a plurality of transistors.
Step 22: the power port of this application circuit and in the signal input port each are coupled to a voltage source.
Step 23: produce test voltage to this application circuit by each voltage source, make these test voltages be transmitted to those transistors.
Step 24: check in those transistors whether the voltage of transistorized tie point equals in these test voltages in fact, to determine whether suspension joint of this tie point.
Step 25: when this tie point is suspension joint, revise this network on-line table, to produce new network on-line table.
By above-mentioned step as can be known, second embodiment and the first embodiment difference are that second embodiment is as the standard that judges whether that the suspension joint situation takes place with these test voltages.In other words, when these test voltages are transmitted to those tested transistors, present embodiment is whether the voltage (voltage of for example transistorized grid, drain electrode or source electrode) of judging those each tie points of transistor equals in these test voltages in fact, with as the generation that judges whether the suspension joint situation.If when the voltage of checked tie point was not equal in these test voltages one in fact, the situation that then is judged as suspension joint took place.Otherwise,, then be judged as the situation that does not have suspension joint and take place if when the voltage of checked tie point equals in these test voltages one in fact.The step that all the other are identical with first embodiment can for the sake of clarity, not repeat to give unnecessary details at this in addition directly with reference to the explanation of first embodiment.
See also Fig. 3, this figure is that the foregoing description checks whether the described application circuit 31 of network on-line table has the explanation of suspension joint situation.Suppose that application circuit 31 has comprised four transistors 314,315,318,319, two power ports 311,312, signal input port 313, resistance 316 and electric capacity 317, and couple relation as shown in Figure 3.
In order to check whether application circuit 31 has the existence of suspension joint point, and the voltage source 32～34 that the test voltage that is provided is 5V is provided for power port 311,312 and signal input port 313.Then, the test voltage (5V) that voltage source 32～34 is provided is propagated in application circuit 31 via transistor 314,315 and resistance 316, but can't in application circuit 21, propagate via electric capacity 217, make that the voltage of grid of transistor 318 is 5V, and the voltage of the grid of transistor 319 be 0V.At last, whether the voltage of checking each tie point equals test voltage (5V) in fact or greater than the default reference voltage of circuit designers (for example 3.3V).Example with Fig. 3, because the voltage of the grid of transistor 318 is 5V, both equaled test voltage (5V) in fact, also greater than default reference voltage (3.3V), and the voltage of the grid of transistor 319 is 0V, both has been not equal to test voltage (5V), also is not more than default reference voltage (3.3V), the grid that can check out transistor 318 does not have the situation of suspension joint to take place, and the grid of transistor 319 has the situation of suspension joint to take place.
It should be noted that in the present embodiment the test voltage that voltage source 32～34 is provided is not necessarily all identical, for example: voltage source 32,33 test voltages that provided are 5V, and the test voltage that voltage source 34 is provided is that 6V also can implement.In addition, the application circuit 31 among Fig. 3 only is an example, can be suitable in the actual application extensively, for example mimic channel or digital circuit all can, and not only be confined to the circuit structure of application circuit 31 among Fig. 3.
Therefore in sum, the present invention utilizes the network on-line table to check, the design phase can be checked in early days, and is to check by propagating voltage, so inspection speed can check mistake soon and not, so can reach purpose of the present invention really.
The above person of thought, only be embodiments of the invention, when not limiting scope of the invention process with this, promptly the simple equivalent of being done according to claim scope of the present invention and invention description content generally changes and modifies, and all still belongs in the scope that claim of the present invention contains.
Claims (14)
1. the inspection method of a circuit suspension joint comprises:
The network on-line table is provided, and this network on-line table is used for describing the circuit structure of application circuit; Wherein, this application circuit comprises a plurality of transistors;
The power port of this application circuit and in the signal input port each are coupled to a voltage source;
Produce test voltage to this application circuit by each voltage source, make a plurality of test voltages be transmitted to those transistors; Wherein, described a plurality of test voltage is greater than reference voltage; And
Check in those transistors that whether the voltage of transistorized tie point is greater than this reference voltage, to determine whether suspension joint of this tie point.
2. the inspection method of circuit suspension joint according to claim 1, also comprising step is when this tie point is suspension joint, revises this network on-line table, to produce new network on-line table.
3. the inspection method of circuit suspension joint according to claim 1, wherein this tie point is transistorized grid.
4. the inspection method of circuit suspension joint according to claim 1, wherein said a plurality of test voltage parts are identical.
5. the inspection method of circuit suspension joint according to claim 1, wherein said a plurality of test voltages are identical.
6. the inspection method of circuit suspension joint according to claim 1, wherein this application circuit is a digital circuit.
7. the inspection method of circuit suspension joint according to claim 1, wherein this application circuit is a mimic channel.
8. the inspection method of a circuit suspension joint comprises:
The network on-line table is provided, and this network on-line table is used for describing the circuit structure of application circuit; Wherein, this application circuit comprises a plurality of transistors;
The power port of this application circuit and in the signal input port each are coupled to a voltage source;
Produce test voltage to this circuit by each voltage source, make a plurality of test voltages be transmitted to those transistors; And
Check in those transistors whether transistorized tie point voltage equals in described a plurality of test voltage in fact, to determine whether suspension joint of this tie point.
9. the inspection method of circuit suspension joint according to claim 8, also comprising step is when this tie point is suspension joint, revises this network on-line table, to produce new network on-line table.
10. the inspection method of circuit suspension joint according to claim 8, wherein this tie point is transistorized grid.
11. the inspection method of circuit suspension joint according to claim 8, wherein said a plurality of test voltage parts are identical.
12. the inspection method of circuit suspension joint according to claim 8, wherein said a plurality of test voltages are identical.
13. the inspection method of circuit suspension joint according to claim 8, wherein this application circuit is a digital circuit.
14. the inspection method of circuit suspension joint according to claim 8, wherein this application circuit is a mimic channel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2008101377300A CN101629987B (en) | 2008-07-18 | 2008-07-18 | Method for detecting circuital suspended joints |
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| Application Number | Priority Date | Filing Date | Title |
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| CN2008101377300A CN101629987B (en) | 2008-07-18 | 2008-07-18 | Method for detecting circuital suspended joints |
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| CN101629987A CN101629987A (en) | 2010-01-20 |
| CN101629987B true CN101629987B (en) | 2011-11-09 |
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| CN2008101377300A Active CN101629987B (en) | 2008-07-18 | 2008-07-18 | Method for detecting circuital suspended joints |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN112285446B (en) * | 2019-07-12 | 2024-05-31 | 瑞昱半导体股份有限公司 | Test system, transmitting device and receiving device for executing various tests |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW403839B (en) * | 1997-09-17 | 2000-09-01 | Nanya Plastics Corp | A quick-check measurement for floating unit confirmation using bit-line coupling pattern |
| CN1584846A (en) * | 2004-06-08 | 2005-02-23 | 威盛电子股份有限公司 | Determination for wrong working voltage of floating point arithmetic by processor |
| US7279922B1 (en) * | 2006-06-28 | 2007-10-09 | Sun Microsystems, Inc. | Sub-sampling of weakly-driven nodes |
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2008
- 2008-07-18 CN CN2008101377300A patent/CN101629987B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW403839B (en) * | 1997-09-17 | 2000-09-01 | Nanya Plastics Corp | A quick-check measurement for floating unit confirmation using bit-line coupling pattern |
| CN1584846A (en) * | 2004-06-08 | 2005-02-23 | 威盛电子股份有限公司 | Determination for wrong working voltage of floating point arithmetic by processor |
| US7279922B1 (en) * | 2006-06-28 | 2007-10-09 | Sun Microsystems, Inc. | Sub-sampling of weakly-driven nodes |
Non-Patent Citations (3)
| Title |
|---|
| JP平1-140080A 1989.06.01 |
| JP特开2007-102933A 2007.04.19 |
| JP特开平5-80115A 1993.04.02 |
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