CN101615104B - 硬盘切换系统及其切换方法 - Google Patents
硬盘切换系统及其切换方法 Download PDFInfo
- Publication number
- CN101615104B CN101615104B CN2008103023118A CN200810302311A CN101615104B CN 101615104 B CN101615104 B CN 101615104B CN 2008103023118 A CN2008103023118 A CN 2008103023118A CN 200810302311 A CN200810302311 A CN 200810302311A CN 101615104 B CN101615104 B CN 101615104B
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- CN
- China
- Prior art keywords
- hard disk
- electric switch
- power supply
- switching
- computing machine
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- 238000000034 method Methods 0.000 title claims description 19
- 230000011664 signaling Effects 0.000 claims description 3
- 230000005540 biological transmission Effects 0.000 claims description 2
- 238000012360 testing method Methods 0.000 description 14
- 238000010586 diagram Methods 0.000 description 3
- 238000010998 test method Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
- G01R31/318508—Board Level Test, e.g. P1500 Standard
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
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Abstract
Description
Claims (10)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2008103023118A CN101615104B (zh) | 2008-06-25 | 2008-06-25 | 硬盘切换系统及其切换方法 |
US12/211,058 US20090322346A1 (en) | 2008-06-25 | 2008-09-15 | Motherboard test system and test method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2008103023118A CN101615104B (zh) | 2008-06-25 | 2008-06-25 | 硬盘切换系统及其切换方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101615104A CN101615104A (zh) | 2009-12-30 |
CN101615104B true CN101615104B (zh) | 2012-05-30 |
Family
ID=41446606
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2008103023118A Expired - Fee Related CN101615104B (zh) | 2008-06-25 | 2008-06-25 | 硬盘切换系统及其切换方法 |
Country Status (2)
Country | Link |
---|---|
US (1) | US20090322346A1 (zh) |
CN (1) | CN101615104B (zh) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8170828B2 (en) * | 2009-06-05 | 2012-05-01 | Apple Inc. | Test method using memory programmed with tests and protocol to communicate between device under test and tester |
CN101958140A (zh) * | 2009-07-20 | 2011-01-26 | 鸿富锦精密工业(深圳)有限公司 | 硬盘电源控制电路 |
CN102053661B (zh) * | 2009-10-27 | 2013-12-11 | 鸿富锦精密工业(深圳)有限公司 | 一种主板及其上的继电器装置 |
CN102478623B (zh) * | 2010-11-22 | 2013-10-16 | 英业达股份有限公司 | 待测单元的测试方法 |
CN102331941B (zh) * | 2011-07-07 | 2014-07-02 | 曙光信息产业股份有限公司 | 一种龙芯主板硬盘切换管理的方法 |
CN102929731A (zh) * | 2011-08-09 | 2013-02-13 | 鸿富锦精密工业(深圳)有限公司 | 多系统电子装置 |
TW201314233A (zh) * | 2011-09-21 | 2013-04-01 | Hon Hai Prec Ind Co Ltd | 測試卡 |
CN103296504A (zh) * | 2012-02-23 | 2013-09-11 | 微盟电子(昆山)有限公司 | 具序列进阶技术附加装置接口的连接器及其相关电子装置 |
CN103472405A (zh) * | 2012-06-08 | 2013-12-25 | 鸿富锦精密工业(深圳)有限公司 | 电源供应器测试电路 |
EP3620149B1 (en) | 2013-03-15 | 2021-10-06 | Hayward Industries, Inc. | Modular pool/spa control system |
US9183071B1 (en) | 2013-12-02 | 2015-11-10 | Leidos, Inc. | System and method for automated hardware compatibility testing |
JP2015207166A (ja) * | 2014-04-21 | 2015-11-19 | 株式会社バッファロー | ディスクドライブ装置、及びプログラム |
US9557363B2 (en) * | 2015-03-24 | 2017-01-31 | The Boeing Company | Large scale automated test system reconfiguration |
CN104881341B (zh) * | 2015-06-16 | 2019-03-05 | 深圳市金泰克半导体有限公司 | 一种服务器、计算机硬盘的测试方法及其测试系统 |
CN105487959A (zh) * | 2015-12-09 | 2016-04-13 | 浪潮电子信息产业股份有限公司 | 一种intel NVMe硬盘的管理方法 |
US11720085B2 (en) | 2016-01-22 | 2023-08-08 | Hayward Industries, Inc. | Systems and methods for providing network connectivity and remote monitoring, optimization, and control of pool/spa equipment |
US11129256B2 (en) | 2016-01-22 | 2021-09-21 | Hayward Industries, Inc. | Systems and methods for providing network connectivity and remote monitoring, optimization, and control of pool/spa equipment |
CN109407988A (zh) * | 2018-10-18 | 2019-03-01 | 张德辉 | 冷数据存储系统及其存储方法 |
CN111722970B (zh) * | 2020-07-23 | 2021-04-30 | 深圳市微特精密科技股份有限公司 | 一种主板测试装置 |
CN112951315A (zh) * | 2021-02-26 | 2021-06-11 | 山东英信计算机技术有限公司 | 一种兼容nvme\ahci双协议硬盘测试装置及方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5257368A (en) * | 1991-03-28 | 1993-10-26 | International Business Machines Corp. | System for dynamically changing a system I/O configuration by determining differences between current and future configurations and describing differences to software and hardware control blocks |
US20030060996A1 (en) * | 2000-06-07 | 2003-03-27 | John Yi | Semi-automated multi-site system tester |
US20030084307A1 (en) * | 2001-10-30 | 2003-05-01 | Schwartz Jeffrey D. | Secure boot device selection method and system |
TW594021B (en) * | 2002-04-30 | 2004-06-21 | Via Tech Inc | Main computer board on/off testing device, method and system |
EP1707039A4 (en) * | 2003-12-29 | 2009-07-15 | Sherwood Information Partners | SYSTEM AND METHOD FOR STORING MASS BY MEANS OF AN ENCLOSURE WITH SEVERAL HARD DISK DRIVERS |
-
2008
- 2008-06-25 CN CN2008103023118A patent/CN101615104B/zh not_active Expired - Fee Related
- 2008-09-15 US US12/211,058 patent/US20090322346A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
CN101615104A (zh) | 2009-12-30 |
US20090322346A1 (en) | 2009-12-31 |
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C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: NANTONG BAISHENG PRECISION MACHINERY CO., LTD. Free format text: FORMER OWNER: HONGFUJIN PRECISE INDUSTRY (SHENZHEN) CO., LTD. Effective date: 20141027 Free format text: FORMER OWNER: HONGFUJIN PRECISE INDUSTRY CO., LTD. Effective date: 20141027 |
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Free format text: CORRECT: ADDRESS; FROM: 518109 SHENZHEN, GUANGDONG PROVINCE TO: 226000 NANTONG, JIANGSU PROVINCE |
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Effective date of registration: 20141027 Address after: 226000 Jiangsu city of Nantong province's Tongzhou District Stone Town Village fourteen groups Patentee after: Nantong Baisheng Precision Machinery Co., Ltd. Address before: 518109 Guangdong city of Shenzhen province Baoan District Longhua Town Industrial Zone tabulaeformis tenth East Ring Road No. 2 two Patentee before: Hongfujin Precise Industry (Shenzhen) Co., Ltd. Patentee before: Hon Hai Precision Industry Co., Ltd. |
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CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120530 Termination date: 20170625 |
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CF01 | Termination of patent right due to non-payment of annual fee |