CN101577643A - Data conversion method for test system and related data conversion device - Google Patents
Data conversion method for test system and related data conversion device Download PDFInfo
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- CN101577643A CN101577643A CNA2008100962491A CN200810096249A CN101577643A CN 101577643 A CN101577643 A CN 101577643A CN A2008100962491 A CNA2008100962491 A CN A2008100962491A CN 200810096249 A CN200810096249 A CN 200810096249A CN 101577643 A CN101577643 A CN 101577643A
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Abstract
The invention relates to a data conversion method for a test system, which comprises the following steps: receiving a test signal which comprises a test data and a sequence message which corresponds to the test data, and converting the test data according to the sequence message to generate a test pattern.
Description
Technical field
The present invention relates to a kind of data transfer device and related data conversion equipment thereof that is used for a test macro, refer to a kind of material conversion method and the related data conversion equipment thereof that can keep the test normal operation and promote testing efficiency especially.
Background technology
Along with the radio communication service of high bandwidth is more day by day popularized, the audio-visual mobile communication that is transmitted in is used and has been obtained to use widely.Along with the application of multimedia mobile terminal product is tending towards diversification, the demand of transmission bandwidth also strengthens gradually.The audio-visual coffret of tradition adopts the framework of parallel fully (Parallel) usually, sees through multi-path and transmits data.Yet, figure place increase along with video-audio data, if adopt the way of expansion parallel bus width, except meeting causes wiring quantity to increase and reduces the service efficiency of space, the increase of signal frequency also can make the electromagnetic radiation of transmission increase the weight of and cause the problem of electromagnetic interference.
Therefore, in order to improve the problems referred to above, known techniques has proposed different serial transmission interfaces, in order to the room for promotion service efficiency and reduce electromagnetic interference, one of them be mobile industry processor interface (MobileIndustry Processor Interface, MIPI).When a mobile communications device adopts serial transmission interface as with the coffret of multimedia ancillary equipment the time, the factor of the required consideration of designer is a lot, comprises power consumption, signal bandwidth, signal transmission distance, realization cost, noise sensitive degree and pin count etc.Therefore, finish the design of mobile communications device as the designer after, must see through different testing procedures, environment etc., detect mobile communications device and whether meet requiredly, and do further optimization according to this.
For instance, please refer to Fig. 1, Fig. 1 is the known schematic diagram that is used for a test macro 10 of a serial coffret 100.Test macro 10 is made up of a signal generator 102, a transmission unit 104 and a receiving element 106.Signal generator 102 is used for producing different signal pattern (Pattern), and exports transmission unit 104 to through serial or parallel mode.Transmission unit 104 is sent to receiving element 106 after being used for the signal pattern that signal generator 102 is produced is converted to the default form that meets serial transmission interface 100.When receiving element 106 is located in the mobile communications device, receive the signal pattern that transmission unit 104 is exported in order to see through serial transmission interface 100, and drive application AP_1～AP_n accordingly, then the designer can judge the usefulness of mobile communications device according to this.
Yet in above-mentioned framework, signal generator 102 uses usually with the binary code waveform record file of the time interval as unit, is used as input and verifies mobile communications device.This waveform record archives can be noted down the waveform of required input, for the waveform of dossier as for surpassing the waveform of service speed, just can't verify.In addition, for the waveform of waveform record archives, signal generator 102 can't be to the content processed, and for example content replacement, extension function etc. cause its range of application limited.
Summary of the invention
Therefore, main purpose of the present invention promptly is to provide a kind of data transfer device and related data conversion equipment and test macro that is used for a test macro.
The present invention discloses a kind of data transfer device that is used for a test macro, includes to receive a test signal, and this test signal comprises a test data and corresponding to a sequential information of this test data; And, change this test data according to this time sequence information, to produce a test pattern.
The present invention discloses a kind of DTU (Data Transfer unit) that is used for a test macro, includes a receiving terminal, is used for receiving a test signal, and this test signal comprises a test data and corresponding to a sequential information of this test data; And a converting unit, be coupled to this receiving terminal, be used for changing this test data, to produce a test pattern according to this time sequence information.
The present invention discloses a kind of test macro that is used for testing a communicator, includes a receiving element, is located in this communicator, is used for receiving a plurality of test patterns; One transmission unit is used for exporting these a plurality of test patterns; One serial coffret is coupled between this receiving element and this transmission unit, is used for transmitting these a plurality of test patterns; One data processing equipment is used for producing a plurality of test signals, and each test signal of these a plurality of test signals comprises a test data and a corresponding time sequence information; And a Date Conversion Unit, be coupled between this data processing equipment and this transmission unit, be used for changing this a plurality of test signals, with these a plurality of test patterns of generation according to the pairing time sequence information of this a plurality of test signals.
Description of drawings
Fig. 1 is the known schematic diagram that is used for a test macro of a serial coffret.
Fig. 2 is used for testing the schematic diagram of a test macro of a communicator for the embodiment of the invention.
Fig. 3 is the schematic diagram that is used for a data transaction flow process of Fig. 2 one Date Conversion Unit.
Fig. 4 is the functional block diagram that is used for Fig. 2 one Date Conversion Unit.
[primary clustering symbol description]
100,204 serial transmission interfaces
10,20 test macros
102 signal generators
104 transmission units
106 receiving elements
AP_1～AP_n uses
200 receiving elements
202 transmission units
206 Date Conversion Units
208 data processing equipments
30 flow processs
300,302,304,306,308 steps
400 reference frequency generators
402 high speed data conversion unit
404 low speed data converting units
406 memories
Embodiment
Please refer to Fig. 2, Fig. 2 is used for testing the schematic diagram of a test macro 20 of a communicator for the embodiment of the invention.Test macro 20 includes a receiving element 200, a transmission unit 202, a serial coffret 204, a Date Conversion Unit 206 and a data processing equipment 208.In test macro 20, data processing equipment 208 is used for producing a plurality of test signals, and Date Conversion Unit 206 then is used for test signal is converted to test pattern.Then, transmission unit 202 can see through serial transmission interface 204 test pattern is sent to receiving element 200, and the receiving element of then being located in the communicator 200 can drive application AP_1～AP_n accordingly, makes the designer can judge the usefulness of communicator according to this.Wherein, the test signal that produced of data processing equipment 208 includes a test data and a corresponding time sequence information.If a test signal is the high speed test signal, then its test data is a plurality of bit data with transmission arranged side by side; If a test signal is a low-speed test signal, then its test data is single bit data.
Further, please refer to Fig. 3, Fig. 3 is the schematic diagram that is used for a data transaction flow process 30 of Fig. 2 Date Conversion Unit 206.Data transaction flow process 30 is in order to be converted to test pattern with test signal, and it comprises following steps:
Step 300: beginning.
Step 302: receive the test signal that data processing equipment 208 is exported, this test signal includes a test data and a corresponding time sequence information.
Step 304: when this test data includes a plurality of bit data of transmission arranged side by side,, promote an operating frequency, be converted to sequence bit data, thereby produce test pattern with these a plurality of bit data that will transmit side by side according to this time sequence information.
Step 306: in this test data include one digit number according to the time, according to this time sequence information, reduce an operating frequency, so that work period of this bit data is prolonged, thereby produce test pattern.
Step 308: finish.
See through data transaction flow process 30, Date Conversion Unit 206 can be according to the time sequence information of test signal, conversion testing data.When test signal was the high speed test signal, the present invention saw through and promotes operating frequency, long numeric data arranged side by side is converted to the bit data of sequence; When test signal was low-speed test signal, the present invention saw through and reduces operating frequency, with the work period prolongation with single bit data.In addition, data transaction flow process 30 can with a default test pattern, replace this test pattern according to a control signal in addition.In other words, Date Conversion Unit 206 can change functions such as sequence, extension, content replacement side by side to the test signal that data processing unit 208 is exported.
Therefore, in test macro 20, for the high speed test data, data processing equipment 208 can see through load mode arranged side by side and transmit long numeric data in a special time segmentation; Date Conversion Unit 206 then can promote operating frequency, so that bit data arranged side by side is converted to the sequence bit data according to data transaction flow process 30.In other words, because Date Conversion Unit 206 can be converted to a plurality of bit data arranged side by side the bit data of sequence, therefore, data processing equipment 208 can see through the time compression mode, and the high speed test data are sent to Date Conversion Unit 206.Thus, when test data surpassed service speed, the present invention still can see through the time compression mode, keeps the test normal operation.On the contrary, for the low speed test data, data processing equipment 208 can transmit single bit data in a special time segmentation; Date Conversion Unit 206 then can reduce operating frequency according to data transaction flow process 30, and the work period prolongation with single bit data is reduced to original sequential.In other words, because Date Conversion Unit 206 can prolong work period of single bit data, therefore, data processing equipment 208 can be with the low speed test data replacing than lower-order digit, and be sent to Date Conversion Unit 206.Thus, the data volume of required transmission is reduced, to promote testing efficiency.
Further, the implementation about Date Conversion Unit 206 please refer to Fig. 4.As shown in Figure 4, Date Conversion Unit 206 includes a reference frequency generator 400, a high speed data conversion unit 402, a low speed data converting unit 404 and a memory 406.Reference frequency generator 400 is used for producing an operating frequency Fref.High speed data conversion unit 402 and low speed data converting unit 404 all are coupled between reference frequency generator 400 and the data processing equipment 208, are used for respectively handling at a high speed and the test signal of low speed.At the high speed test signal, high speed data conversion unit 402 can see through a frequency multiplier (not being plotted among Fig. 4) or other frequency adjustment unit according to the time sequence information of correspondence, promotes operating frequency Fref, is converted to the sequence bit data with the bit data that will transmit side by side.At low-speed test signal, low speed data converting unit 404 can see through a frequency eliminator (not being plotted among Fig. 4) or other frequency adjustment unit according to the time sequence information of correspondence, reduces operating frequency Fref, with the work period prolongation with single bit data.In addition, in Fig. 4, memory 406 is used for storing predetermined pattern, when high speed data conversion unit 402 or low speed data converting unit 404 receive specific control signal, high speed data conversion unit 402 or low speed data converting unit 404 can be by choosing the corresponding preset pattern in the memory 406, and export transmission unit 202 to.Therefore, Date Conversion Unit 206 can change functions such as sequence, extension, content replacement side by side to the test signal that data processing unit 208 is exported.
In sum, see through test macro 20, Date Conversion Unit 206 can change functions such as sequence, extension, content replacement side by side to the test signal that data processing unit 208 is exported, make data processing equipment 208 to carry out time compression or to prolong running to high speed test data or low speed test data, keeping the test normal operation, and promote testing efficiency.
The above only is preferred embodiment of the present invention, and all equalizations of being made according to the present patent application claim change and revise, and all should belong to covering scope of the present invention.
Claims (16)
1. data transfer device that is used for a test macro includes:
Receive a test signal, this test signal comprises a test data and corresponding to a sequential information of this test data; And
According to this time sequence information, change this test data, to produce a test pattern.
2. data transfer device as claimed in claim 1, wherein this test data includes a plurality of bit data of transmission arranged side by side.
3. data transfer device as claimed in claim 2, wherein changing this test data to produce this test pattern according to this time sequence information, is according to this time sequence information, promotes an operating frequency, be converted to sequence bit data with these a plurality of bit data that will transmit side by side, thereby produce this test pattern.
4. data transfer device as claimed in claim 1, wherein this test data includes bit data.
5. data transfer device as claimed in claim 4, wherein changing this test data to produce this test pattern according to this time sequence information, is according to this time sequence information, reduces an operating frequency, with work period prolongation, thereby produce this test pattern with this bit data.
6. data transfer device as claimed in claim 1, it comprises in addition according to a control signal, with a default test pattern, replaces this test pattern.
7. DTU (Data Transfer unit) that is used for a test macro includes:
One receiving terminal is used for receiving a test signal, and this test signal comprises a test data and corresponding to a sequential information of this test data; And
One converting unit is coupled to this receiving terminal, is used for changing this test data according to this time sequence information, to produce a test pattern.
8. DTU (Data Transfer unit) as claimed in claim 7, wherein this test data includes a plurality of bit data of transmission arranged side by side.
9. DTU (Data Transfer unit) as claimed in claim 8, wherein this converting unit promotes an operating frequency according to this time sequence information, is converted to sequence bit data with these a plurality of bit data that will transmit side by side, thereby produces this test pattern.
10. DTU (Data Transfer unit) as claimed in claim 7, wherein this test data includes bit data.
11. DTU (Data Transfer unit) as claimed in claim 10, wherein this converting unit reduces an operating frequency according to this time sequence information, with the work period prolongation with this bit data, thereby produces this test pattern.
12. DTU (Data Transfer unit) as claimed in claim 7, wherein this converting unit is used in addition according to a control signal, with a default test pattern, replaces this test pattern.
13. a test macro that is used for testing a communicator includes:
One receiving element is located in this communicator, is used for receiving a plurality of test patterns;
One transmission unit is used for exporting these a plurality of test patterns;
One serial coffret is coupled between this receiving element and this transmission unit, is used for transmitting these a plurality of test patterns;
One data processing equipment is used for producing a plurality of test signals, and each test signal of these a plurality of test signals comprises a test data and a corresponding time sequence information; And
One Date Conversion Unit is coupled between this data processing equipment and this transmission unit, is used for changing this a plurality of test signals according to the pairing time sequence information of these a plurality of test signals, to produce these a plurality of test patterns.
14. test macro as claimed in claim 13, wherein this Date Conversion Unit includes:
One reference frequency generator is used for producing an operating frequency;
One high speed data conversion unit, be coupled between this reference frequency generator and this data processing equipment, when a test data that is used for a test signal includes a plurality of bit data of transmission arranged side by side, according to pairing time sequence information, promote this operating frequency, be converted to sequence bit data with these a plurality of bit data that will transmit side by side; And
One low speed data converting unit, be coupled between this reference frequency generator and this data processing equipment, a test data that is used for a test signal include one digit number according to the time, according to this time sequence information, reduce an operating frequency, with work period prolongation with this bit data.
15. test macro as claimed in claim 13, it includes a memory in addition, is used for storing a plurality of default test patterns.
16. test macro as claimed in claim 15, wherein this converting unit is used in addition according to a control signal, selects a default test pattern by these a plurality of default test patterns, to produce a test pattern of these a plurality of test patterns.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2008100962491A CN101577643B (en) | 2008-05-06 | 2008-05-06 | Data conversion method for test system and related data conversion device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2008100962491A CN101577643B (en) | 2008-05-06 | 2008-05-06 | Data conversion method for test system and related data conversion device |
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| Publication Number | Publication Date |
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| CN101577643A true CN101577643A (en) | 2009-11-11 |
| CN101577643B CN101577643B (en) | 2012-03-21 |
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| CN2008100962491A Expired - Fee Related CN101577643B (en) | 2008-05-06 | 2008-05-06 | Data conversion method for test system and related data conversion device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2772861A1 (en) * | 2013-02-27 | 2014-09-03 | Samsung Electro-Mechanics Co., Ltd | Semiconductor test device and semiconductor test method |
| CN111856230A (en) * | 2019-04-16 | 2020-10-30 | 京元电子股份有限公司 | Image testing system and image extracting card thereof |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105469835B (en) * | 2014-09-12 | 2018-11-13 | 华邦电子股份有限公司 | Storage device and its test method |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4293840B2 (en) * | 2003-06-06 | 2009-07-08 | 株式会社アドバンテスト | Test equipment |
| US7363563B1 (en) * | 2003-12-05 | 2008-04-22 | Pmc-Sierra, Inc. | Systems and methods for a built in test circuit for asynchronous testing of high-speed transceivers |
| US7225379B2 (en) * | 2004-04-23 | 2007-05-29 | Oki Electric Industry Co., Ltd. | Circuit and method for testing semiconductor device |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2772861A1 (en) * | 2013-02-27 | 2014-09-03 | Samsung Electro-Mechanics Co., Ltd | Semiconductor test device and semiconductor test method |
| CN111856230A (en) * | 2019-04-16 | 2020-10-30 | 京元电子股份有限公司 | Image testing system and image extracting card thereof |
| CN111856230B (en) * | 2019-04-16 | 2023-03-17 | 京元电子股份有限公司 | Image testing system and image extracting card thereof |
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| Publication number | Publication date |
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| CN101577643B (en) | 2012-03-21 |
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