CN101576414B - Autocorrelation measuring apparatus for measuring glow ultrashort pulse full width at half maximum - Google Patents
Autocorrelation measuring apparatus for measuring glow ultrashort pulse full width at half maximum Download PDFInfo
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- CN101576414B CN101576414B CN2008101062777A CN200810106277A CN101576414B CN 101576414 B CN101576414 B CN 101576414B CN 2008101062777 A CN2008101062777 A CN 2008101062777A CN 200810106277 A CN200810106277 A CN 200810106277A CN 101576414 B CN101576414 B CN 101576414B
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- 239000004065 semiconductor Substances 0.000 claims abstract description 34
- 230000009022 nonlinear effect Effects 0.000 claims abstract description 13
- 238000005259 measurement Methods 0.000 claims abstract description 11
- 238000001514 detection method Methods 0.000 claims abstract description 7
- 239000013078 crystal Substances 0.000 claims description 15
- 230000003287 optical effect Effects 0.000 claims description 15
- 230000003595 spectral effect Effects 0.000 claims description 13
- 230000005284 excitation Effects 0.000 claims description 10
- 238000012360 testing method Methods 0.000 claims description 9
- 239000010408 film Substances 0.000 claims description 6
- 238000007747 plating Methods 0.000 claims description 6
- 238000009738 saturating Methods 0.000 claims description 6
- 230000015572 biosynthetic process Effects 0.000 claims description 3
- 230000003071 parasitic effect Effects 0.000 claims description 3
- 239000000523 sample Substances 0.000 claims description 3
- 239000010409 thin film Substances 0.000 claims description 3
- 230000035945 sensitivity Effects 0.000 abstract description 5
- 238000000034 method Methods 0.000 description 5
- 238000005311 autocorrelation function Methods 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 3
- 238000011160 research Methods 0.000 description 3
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- 238000013461 design Methods 0.000 description 1
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Abstract
The invention discloses an autocorrelation measuring apparatus for measuring glow ultrashort pulse full width at half maximum, which comprises a temperature controller, a light source, a collimation and convergence unit, a light splitting and delaying unit, a nonlinear effect unit and a signal detection unit, wherein the temperature controller is used for controlling the temperature of a laser as the light source and solving the problem that the lasing wavelength of the laser is easy to drift, and can be adjusted integrally to achieve light path adjustment; and the laser serves as the light source and the emergent light thereof passes through a self-focusing lens in the collimation and convergence unit, the light splitting and delaying unit, a plano-convex lens in the collimation and convergence unit, and the nonlinear effect unit, and then gets into the signal detection unit to achieve the measurement on the emergent light of the laser. The temperature of the laser is stabilized within 0.2 DEG C, and the temperature is changed so as to adjust the output wavelength of a semiconductor laser, enlarge the measurable wavelength range and improve the measuring sensitivity, thus the requirement on generating ultrashort pulse to measure a glow semiconductor laser is satisfied.
Description
Technical field
The present invention especially is fit to measure the ruddiness ultrashort pulse relevant for a kind of autocorrelation function analyzer that is used to measure the big full duration of semiconductor ultrashort light pulse half-shadow, can adjust the wavelength of semiconductor laser by temperature control system, the wavelength coverage that expansion can be tested.
Background technology
The ultrashort pulse semiconductor laser has important use in fields such as optical communication, information stores, medical treatment, thermometricallies, also is the focus of research always.Along with semiconductor laser develops to the shortwave direction, red light semiconductor laser is also full-fledged, and the red light semiconductor laser of ultrashort pulse has outstanding effect in fields such as LAN (Local Area Network) communication, electro optic samplings, thereby has also obtained certain research.
Along with the application of ultrashort pulse red light semiconductor laser and research more and more widely, also more and more to the demand of ruddiness ultrashort pulse test.It is a kind of simple, cost is low, precision is high method that the intensity correlation method is measured ultrashort pulse, has obtained ripe application at near-infrared band.It is that emergent light pulse with laser instrument is divided into two bundles, after wherein a branch of elapsed time postpones again with another Shu Huihe, through producing the intensity autocorrelation signal behind the nonlinear crystal, according to this signal can push away the big full duration of half-shadow of ultrashort pulse.The principle of intensity auto-correlation systematic survey ultrashort light pulse is will the measurement of time be converted to measurement of length.The pass of distance, delta L that moveable arm moves in the lag line and time delay τ is:
As long as so record the distance that moveable arm moves, just can extrapolate delay time T, moveable arm moves 0.15mm and is equivalent to τ variation 1ps, thereby this method can have very high measuring accuracy.
But also there are some problems in this measuring method: because nonlinear effect having relatively high expectations to lambda1-wavelength, be slightly offset nonlinear properties are reduced greatly, semiconductor laser has the easily characteristics of drift of excitation wavelength again simultaneously, the wavelength coverage that this has limited instrument measurable has greatly reduced the sensitivity of measuring.
The present invention has designed the autocorrelation function analyzer of a kind of suitable measurement ruddiness ultrashort pulse, and at the easy characteristics of drifting about of semiconductor laser excitation wavelength, designed volume little, can be installed in the temperature controller on the adjusting bracket, regulate the excitation wavelength of semiconductor laser by the control temperature, enlarge the wavelength coverage that to test, improved measurement sensitivity.
Summary of the invention
(1) technical matters that will solve
In view of this, fundamental purpose of the present invention is to provide a kind of autocorrelation measurer that is used to measure the big full duration of ruddiness ultrashort pulse half-shadow, to satisfy testing requirement to the ruddiness ultrashort pulse, solve the easily problem of drift of semiconductor laser excitation wavelength, the wavelength coverage that expansion can be tested improves measurement sensitivity.
(2) technical scheme
For achieving the above object, the invention provides a kind of autocorrelation measurer that is used to measure the big full duration of ruddiness ultrashort pulse half-shadow, this autocorrelation measurer comprises temperature controller, light source, collimation and convergence unit, beam split and delay cell, nonlinear effect unit and acquisition of signal unit;
Wherein, temperature controller is used to control the temperature as the laser instrument of light source, solves the problem of the easy drift of laser instrument excitation wavelength, and can wholely adjust, and realizes the light path adjusting;
Light source type is a semiconductor laser, this semiconductor laser emergent light is successively through the plano-convex lens in GRIN Lens, beam split and delay cell, collimation and the convergence unit in collimation and the convergence unit, and nonlinear effect unit, the entering signal probe unit is realized the measurement to laser emitting light.
In addition, according to one embodiment of present invention, described temperature controller comprises heat radiator 12, intermediate plate 13 and semiconductor chilling plate 14, wherein, in heat radiator 12 bottoms two intermediate plates 13 are arranged, whole temperature controller is fixed on the adjusting bracket by the screw on this intermediate plate 13.
In addition, according to one embodiment of present invention, described light source comprises L type shell 15 and semiconductor laser 16, and wherein L type shell 15 is fixed on the temperature controller by screw, heat conduction and optic alignment had both been guaranteed, again by the fixing joint that injects electric signal of the circular hole on the galianconism.
In addition, according to one embodiment of present invention, described collimation is drawn together GRIN Lens 3 and plano-convex lens 7 with the convergence unit pack; The emergent light of light source is generally divergent beams, becomes parallel beam by GRIN Lens 3 collimations, assembles slightly by plano-convex lens 7 again, with the optical density of raising by nonlinear crystal, thereby improves shg efficiency.
In addition, according to one embodiment of present invention, the specification of described GRIN Lens 3 is suitable for collimating the light of red spectral band, its incident wavelength scope 650nm to 670nm; The focal range of described plano-convex lens 7 is 10cm to 20cm.
In addition, according to one embodiment of present invention, described GRIN Lens 3 and plano-convex lens 7 all plate and carry out anti-reflection with optical thin film to red spectral band.
In addition, according to one embodiment of present invention, described beam split and delay cell comprise moving reflector 4, stationary mirror 5 and spectroscope 6; By the parallel beam of GRIN Lens outgoing, with 45 incident spectroscope 6, be divided into two bundles, wherein a branch of the reflection through stationary mirror 5 returned, and its light path immobilizes; Another bundle through moving reflector 4 reflection return, by the moving to make and produce optical path difference between the two-beam of moving reflector 4, thereby formation time postpones; Overlap on spatial domain after the two-beam outgoing, postpone on time domain, continuous mobile moving reflector 4 can form the scanning of a branch of light to another Shu Guang.
In addition, according to one embodiment of present invention, described nonlinear effect unit comprises long-pass filter plate 8, nonlinear crystal 9 and short-pass filter plate 10; Light beam by the plano-convex lens outgoing filters fundamental frequency wave band light wave in addition through long-pass filter plate 8, to reduce the generation of spurious signal; Fundamental frequency light produces frequency-doubled signal through nonlinear crystal 9 backs, filters by fundamental frequency light and the parasitic light that short-pass filter plate 10 will see through, to improve detection efficiency again.
In addition, according to one embodiment of present invention, described long-pass filter plate 8 can be saturating for red spectral band, and the bandwidth of ruddiness is 645nm to 675nm thoroughly; Described short-pass filter plate 10 can be saturating for ultraviolet light, and the bandwidth of ultraviolet light is 315nm to 345nm thoroughly; Described nonlinear crystal 9 is BBO, fundamental frequency wavelength coverage 650nm to 670nm, and the end plating close with long-pass filter plate 8 be with the fundamental wave anti-reflection film, and the end plating close with short-pass filter plate 10 is with frequency multiplication ripple anti-reflection film, to satisfy the needs of ruddiness test.
In addition, according to one embodiment of present invention, described acquisition of signal unit is the photo-detector 11 of detectable ultraviolet light, frequency-doubled signal by 10 outgoing of short-pass filter plate is relevant with time delay, mobile moving reflector 4 continuously changes time delay, can on photo-detector 11, obtain the auto-correlation waveform, this waveform be write down and handles, obtain the pulse width information of incident light pulse by computing machine.
In addition, according to one embodiment of present invention, described photo-detector 11 is a photomultiplier, and the detection wavelength coverage is 260nm to 900nm.
(3) beneficial effect
From technique scheme as can be seen, the present invention has following beneficial effect:
1, the invention provides a kind of autocorrelation measurer that is used to measure the big full duration of ruddiness ultrashort pulse half-shadow, and designed volume little, can be installed in the temperature controller of regulating on the adjusting bracket, can be in 0.2 ° with the semiconductor laser temperature stabilization, solved the problem of semiconductor laser excitation wavelength drift, enlarge the scope that to survey wavelength, improved the sensitivity of measuring.
2, this autocorrelation measurer that is used to measure the big full duration of ruddiness ultrashort pulse half-shadow provided by the invention, design at red spectral band, all elements all are operated in red spectral band, be suitable for measuring the semiconductor laser ultrashort pulse of red spectral band, well satisfied needs the ruddiness pulse test.
Description of drawings
For further specifying content of the present invention and characteristics, do a detailed description below in conjunction with accompanying drawing:
Fig. 1 is the structural representation of ruddiness ultrashort pulse intensity autocorrelation function analyzer provided by the invention;
Wherein: 1, temperature controller; 2, light source; 3, GRIN Lens; 4, moving reflector; 5, stationary mirror; 6, spectroscope; 7, plano-convex lens; 8, long-pass filter plate; 9, nonlinear crystal; 10, short-pass filter plate; 11, photo-detector.
Fig. 2 is the side view of temperature controller;
Wherein: 12, heat radiator; 13, intermediate plate; 14, semiconductor chilling plate; 15, L type shell; 16, semiconductor laser.
Fig. 3 is the front elevation of temperature controller.
Embodiment
For making the purpose, technical solutions and advantages of the present invention clearer, below in conjunction with specific embodiment, and with reference to accompanying drawing, the present invention is described in more detail.
This autocorrelation measurer that is used to measure the big full duration of ruddiness ultrashort pulse half-shadow provided by the invention, development on intensity autocorrelation measurement principle.Semiconductor laser installing is on temperature controller, temperature controller is installed on the five times regualting frame, emergent light is divided into two bundles through behind the colimated light system, after wherein a branch of elapsed time postpones again with another Shu Chonghe, enter nonlinear crystal and produce the intensity autocorrelation signal, signal is gathered by acquisition system behind the wave plate after filtration.
The present invention mainly comprises two aspects, the one, in order to satisfy the needs of shortwave test, designed the autocorrelation function analyzer of suitable measurement ruddiness ultrashort pulse.Second aspect is because the excitation wavelength of semiconductor laser often drifts about, and designed the temperature controller that can be installed on the adjusting bracket, is made up of semiconductor chilling plate, heat radiator.Semiconductor laser is fixed on the temperature controller by shell, has two intermediate plates that temperature controller is fixed on the adjusting bracket.
Shown in Fig. 1,2 and 3, this autocorrelation measurer that is used to measure the big full duration of ruddiness ultrashort pulse half-shadow provided by the invention comprises several sections such as temperature controller, light source, collimation and convergence unit, beam split and delay cell, nonlinear effect unit and acquisition of signal unit.Wherein, temperature controller is used to control the temperature as the laser instrument of light source, solves the problem of the easy drift of laser instrument excitation wavelength, and can wholely adjust, and realizes the light path adjusting; Laser instrument is as light source, its emergent light is successively through the plano-convex lens in GRIN Lens, beam split and delay cell, collimation and the convergence unit in collimation and the convergence unit, and the nonlinear effect unit, the entering signal probe unit is realized the measurement to laser emitting light.
Temperature controller comprises heat radiator 12, intermediate plate 13 and semiconductor chilling plate 14, wherein, in heat radiator 12 bottoms two intermediate plates 13 is arranged, and by the screw on this intermediate plate 13 whole temperature controller is fixed on the adjusting bracket.
Light source comprises L type shell 15 and semiconductor laser 16, and wherein L type shell 15 is fixed on the temperature controller by screw, has both guaranteed heat conduction and optic alignment, again by the fixing joint that injects electric signal of the circular hole on the galianconism.
Collimation is drawn together GRIN Lens 3 and plano-convex lens 7 with the convergence unit pack; The emergent light of light source is generally divergent beams, becomes parallel beam by GRIN Lens 3 collimations, assembles slightly by plano-convex lens 7 again, with the optical density of raising by nonlinear crystal, thereby improves shg efficiency.Wherein, the specification of GRIN Lens 3 is suitable for collimating the light of red spectral band, its incident wavelength scope 650nm to 670nm; The focal range of described plano-convex lens 7 is 10cm to 20cm.GRIN Lens 3 and plano-convex lens 7 all plate and carry out anti-reflection with optical thin film to red spectral band.
Beam split and delay cell comprise moving reflector 4, stationary mirror 5 and spectroscope 6; By the parallel beam of GRIN Lens outgoing, with 45 incident spectroscope 6, be divided into two bundles, wherein a branch of the reflection through stationary mirror 5 returned, and its light path immobilizes; Another bundle through moving reflector 4 reflection return, by the moving to make and produce optical path difference between the two-beam of moving reflector 4, thereby formation time postpones; Overlap on spatial domain after the two-beam outgoing, postpone on time domain, continuous mobile moving reflector 4 can form the scanning of a branch of light to another Shu Guang.
The nonlinear effect unit comprises long-pass filter plate 8, nonlinear crystal 9 and short-pass filter plate 10; Light beam by the plano-convex lens outgoing filters fundamental frequency wave band light wave in addition through long-pass filter plate 8, to reduce the generation of spurious signal; Fundamental frequency light produces frequency-doubled signal through nonlinear crystal 9 backs, filters by fundamental frequency light and the parasitic light that short-pass filter plate 10 will see through, to improve detection efficiency again.Wherein, long-pass filter plate 8 can be saturating for red spectral band, and the bandwidth of ruddiness is 645nm to 675nm thoroughly; Described short-pass filter plate 10 can be saturating for ultraviolet light, and the bandwidth of ultraviolet light is 315nm to 345nm thoroughly; Described nonlinear crystal 9 is BBO, fundamental frequency wavelength coverage 650nm to 670nm, and the end plating close with long-pass filter plate 8 be with the fundamental wave anti-reflection film, and the end plating close with short-pass filter plate 10 is with frequency multiplication ripple anti-reflection film, to satisfy the needs of ruddiness test.
The acquisition of signal unit is the photo-detector 11 of detectable ultraviolet light, frequency-doubled signal by 10 outgoing of short-pass filter plate is relevant with time delay, mobile moving reflector 4 continuously changes time delay, can on photo-detector 11, obtain the auto-correlation waveform, by computing machine this waveform is write down and handles, obtain the pulse width information of incident light pulse.Photo-detector 11 is generally photomultiplier, and it surveys wavelength coverage is 260nm to 900nm.
The above each optical element all is fixed on the base platform successively by support, and adjusts the optical axis coincidence that makes them.This structure can be adjusted the excitation wavelength of laser instrument by the control temperature, and volume is small and exquisite, and it is convenient to adjust light path, and each element all is operated in red spectral band, has well satisfied the testing requirement of ruddiness ultrashort pulse.
Refer again to Fig. 1,2,3, concrete enforcement of the present invention mainly comprises the steps:
(1) temperature controller is installed.With semiconductor laser and heat sink being fixed on the L type shell, on the short arm of shell, there is a circular hole to be used for fixing the joint that injects electric signal.Shell is fixed on the semiconductor chilling plate, heat radiator two intermediate plates are arranged bottom, be used for whole temperature controller is fixed on the adjusting bracket, so that regulate.
(2) regulate light path.Regulate GRIN Lens, laser emitting light is collimated, regulate each optical element of back then successively, the optical axis that makes them is all on a horizontal line.
(3) regulate hot spot.Among Fig. 1,4,5,6 form the optical delay systems, and the outgoing beam of laser instrument is divided into two bundles, by moving reflector wherein a branch of generation time are postponed.When two-beam overlaps once more, can produce interference fringe, be equivalent to two air-gaps between the catoptron and caused interference.If two catoptrons are not parallel, then form equal inclination interference, interference fringe is a parallel strip; If two catoptrons are parallel, then form equal thickness interference, interference fringe is circular.Distance between two parallel mirrors more hour, annulus can be sparse more, when two catoptrons overlapped fully, interference fringe became a hot spot or shadow.Make their parallel and overlap fully by the angle of regulating two catoptrons.
(4) scan.The scanning moving reflector is used detector receiving intensity autocorrelation signal, and acquired signal is handled.
Above-described specific embodiment; purpose of the present invention, technical scheme and beneficial effect are further described; institute is understood that; the above only is specific embodiments of the invention; be not limited to the present invention; within the spirit and principles in the present invention all, any modification of being made, be equal to replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (11)
1. autocorrelation measurer that is used to measure the big full duration of ruddiness ultrashort pulse half-shadow, it is characterized in that this autocorrelation measurer comprises temperature controller, light source, collimation and convergence unit, beam split and delay cell, nonlinear effect unit and acquisition of signal unit;
Wherein, temperature controller is used to control the temperature as the laser instrument of light source, solves the problem of the easy drift of laser instrument excitation wavelength, and can wholely adjust, and realizes the light path adjusting;
Light source type is a semiconductor laser, this semiconductor laser emergent light is successively through the plano-convex lens in GRIN Lens, beam split and delay cell, collimation and the convergence unit in collimation and the convergence unit, and nonlinear effect unit, the entering signal probe unit is realized the measurement to laser emitting light.
2. the autocorrelation measurer that is used to measure the big full duration of ruddiness ultrashort pulse half-shadow according to claim 1, it is characterized in that, described temperature controller comprises heat radiator (12), intermediate plate (13) and semiconductor chilling plate (14), wherein, in heat radiator (12) bottom two intermediate plates (13) are arranged, whole temperature controller is fixed on the adjusting bracket by the screw on this intermediate plate (13).
3. the autocorrelation measurer that is used to measure the big full duration of ruddiness ultrashort pulse half-shadow according to claim 1, it is characterized in that, described light source comprises L type shell (15) and semiconductor laser (16), wherein L type shell (15) is fixed on the temperature controller by screw, heat conduction and optic alignment had both been guaranteed, again by the fixing joint that injects electric signal of the circular hole on the galianconism.
4. the autocorrelation measurer that is used to measure the big full duration of ruddiness ultrashort pulse half-shadow according to claim 1 is characterized in that, described collimation is drawn together GRIN Lens (3) and plano-convex lens (7) with the convergence unit pack; The emergent light of light source is generally divergent beams, becomes parallel beam by GRIN Lens (3) collimation, assembles slightly by plano-convex lens (7) again, with the optical density of raising by nonlinear crystal, thereby improves shg efficiency.
5. the autocorrelation measurer that is used to measure the big full duration of ruddiness ultrashort pulse half-shadow according to claim 4 is characterized in that, the specification of described GRIN Lens (3) is suitable for collimating the light of red spectral band, its incident wavelength scope 650nm to 670nm; The focal range of described plano-convex lens (7) is 10cm to 20cm.
6. the autocorrelation measurer that is used to measure the big full duration of ruddiness ultrashort pulse half-shadow according to claim 4 is characterized in that, described GRIN Lens (3) and plano-convex lens (7) all plate and carry out anti-reflection with optical thin film to red spectral band.
7. the autocorrelation measurer that is used to measure the big full duration of ruddiness ultrashort pulse half-shadow according to claim 1 is characterized in that, described beam split and delay cell comprise moving reflector (4), stationary mirror (5) and spectroscope (6); By the parallel beam of GRIN Lens outgoing, with 45 incident spectroscope (6), be divided into two bundles, wherein a branch of the reflection through stationary mirror (5) returned, and its light path immobilizes; Another bundle through moving reflector (4) reflection return, can make by moving of moving reflector (4) to produce optical path difference between the two-beam, thereby formation time postpones; Overlap on spatial domain after the two-beam outgoing, postpone on time domain, continuous mobile moving reflector (4) can form the scanning of a branch of light to another Shu Guang.
8. the autocorrelation measurer that is used to measure the big full duration of ruddiness ultrashort pulse half-shadow according to claim 1 is characterized in that, described nonlinear effect unit comprises long-pass filter plate (8), nonlinear crystal (9) and short-pass filter plate (10); Light beam by the plano-convex lens outgoing filters fundamental frequency wave band light wave in addition through long-pass filter plate (8), to reduce the generation of spurious signal; Fundamental frequency light produces frequency-doubled signal through nonlinear crystal (9) back, and the fundamental frequency light and the parasitic light that will see through by short-pass filter plate (10) filters again, to improve detection efficiency.
9. the autocorrelation measurer that is used to measure the big full duration of ruddiness ultrashort pulse half-shadow according to claim 8 is characterized in that, described long-pass filter plate (8) can be saturating for red spectral band, and the bandwidth of ruddiness is 645nm to 675nm thoroughly; Described short-pass filter plate (10) can be saturating for ultraviolet light, and the bandwidth of ultraviolet light is 315nm to 345nm thoroughly; Described nonlinear crystal (9) is BBO, fundamental frequency wavelength coverage 650nm to 670nm, the end plating close with long-pass filter plate (8) is with the fundamental wave anti-reflection film, and the end plating close with short-pass filter plate (10) is with frequency multiplication ripple anti-reflection film, to satisfy the needs of ruddiness test.
10. the autocorrelation measurer that is used to measure the big full duration of ruddiness ultrashort pulse half-shadow according to claim 1, it is characterized in that, described acquisition of signal unit is the photo-detector (11) of detectable ultraviolet light, frequency-doubled signal by short-pass filter plate (10) outgoing is relevant with time delay, mobile moving reflector (4) continuously changes time delay, can on photo-detector (11), obtain the auto-correlation waveform, by computing machine this waveform is write down and handles, obtain the pulse width information of incident light pulse.
11. the autocorrelation measurer that is used to measure the big full duration of ruddiness ultrashort pulse half-shadow according to claim 10 is characterized in that, described photo-detector (11) is a photomultiplier, and the detection wavelength coverage is 260nm to 900nm.
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| CN109490333A (en) * | 2018-10-26 | 2019-03-19 | 北京协同创新研究院 | A kind of industrial nondestructive testing X ray image plate laser scanner |
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