CN101566670B - High-voltage switch tester - Google Patents
High-voltage switch tester Download PDFInfo
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- CN101566670B CN101566670B CN2008100254002A CN200810025400A CN101566670B CN 101566670 B CN101566670 B CN 101566670B CN 2008100254002 A CN2008100254002 A CN 2008100254002A CN 200810025400 A CN200810025400 A CN 200810025400A CN 101566670 B CN101566670 B CN 101566670B
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- power supply
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- voltage switch
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- 238000006073 displacement reaction Methods 0.000 claims abstract description 13
- 238000001514 detection method Methods 0.000 claims description 9
- 238000012360 testing method Methods 0.000 claims description 6
- 230000009471 action Effects 0.000 abstract description 10
- 230000008859 change Effects 0.000 abstract description 3
- 230000000007 visual effect Effects 0.000 abstract 1
- 230000007246 mechanism Effects 0.000 description 10
- 238000000034 method Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 208000033999 Device damage Diseases 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
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- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention relates to a high-voltage switch tester, in particular to a tester of a high-voltage electric switch. The tester comprises a power supply, a processor, a data acquisition circuit, a display circuit and a printing circuit, wherein the power supply which is a rectifier circuit connected with an external power supply is connected with a singlechip, the display circuit and the printing circuit; the data acquisition circuit comprises an acquisition device and a resistance-type displacement sensor which are connected with equipment to be tested, the acquisition device judges an action time value of a break data switch by the change of a level value, and the resistance-type displacement sensor is arranged on a high-voltage switch contact point traveling line; the action time value acquisition device and the resistance-type displacement sensor are respectively connected with the singlechip by A/D converters, and the singlechip is provided with a program storage area containing index values of action time, passing travel, time travel speed dynamic curves and a time speed travel dynamic curve. The invention can comprehensively intuitively obtain the visual indexes on the performance of a high-voltage switch.
Description
Technical field
The present invention relates to a kind of testing tool of high-voltage electrical apparatus switch, relate in particular to a kind of tester that detects industrial mechanical high-voltage electric switch performance.
Background technology
Be widely used in the mechanical high-voltage switch in the power domain at present; When operating; The mechanical property of its dynamic and static contact to switch after equipment influential; Therefore need a kind of detecting instrument that can detect mechanical type high-voltage switch gear mechanical property, obtain switch performances comprehensively, thereby prevent because the reduction of switch self performance causes device damage behind the switch.
Original high voltage switch tester has the intrinsic time detection, this detection to be switch contact reach the time value design attitude from the instruction of accepting to break off to moving contact; Comprise two course of action in this time value, the one, actuation time, claim drop-away time again; Promptly from issuing instructions to the moving contact separation time; The 2nd, close the branch time, promptly two contact separation reach the time between design attitude to moving contact, and there is significant meaning the time of decomposing these two actions.Such as, the setting of intrinsic time is 0.5 second, should be 0.1 second actuation time wherein, close the branch time should be 0.4 second; Can cause change actuation time if switch contact mechanism partly breaks down, can cause action to close the variation of branch time if switch contact operation part breaks down.If can detect in above-mentioned two times separately this moment, have great importance to analyzing the switch fault point.
Secondly; Also had the stroke index, the debugging of high-voltage switch gear contact driving mechanism was had important significance, and crossed stroke and be meant in branch, the making process; Range and stable afterwards the distance between position of switch movable contact in motion process is equivalent to the stroke value above settling position.
In addition; Also free travel speed performance graph, two indexs of time speed stroke performance graph, the former detects the moving contact average velocity of action in the scope at any time, and the latter detects the average velocity that moving contact moves in travel range arbitrarily; These two values are through the embodied of curve map; Can detect the moving situation of the driving mechanism of tested switch contact at any point-to-point transmission, such as, when unusual waveforms occurring; Can recognize the barrier point of driving mechanism motion, be convenient to the driving mechanism of switch is overhauled.
At last, current waveform profile, it is to form through detecting the current value of driving mechanism before the action of driving moving contact; The coil that specifically detects the contact-actuating operation is saturated to the situation of the current value this process of release from magnetizing.Be the operation conditions before testing agency threads off, understand driving mechanism had or not the interruption of service before the contact-actuating action a reference data.
Existing high voltage switch tester does not possess above-mentioned each detection, is not easy to analyze intuitively comprehensively, judge switch performances, can not grasp some faults that switch possibly imply in time, as is included in the actuation time in the intrinsic time.
Summary of the invention
The present invention is directed to deficiency of the prior art; The current parameters of time in a kind of motion that can obtain switch contact, travel parameters, switch contact driving mechanism is provided, and the high voltage switch tester that more can grasp switch performance all sidedly is provided according to above-mentioned parameter.
Technical scheme of the present invention is: comprise power supply, processor, data acquisition circuit, display circuit and print circuit; Power supply is the rectification circuit that is connected with external power source; It connects single-chip microcomputer, display circuit, print circuit; Data acquisition circuit comprises that the level that passes through that connects on the equipment under test just changes the harvester of judging fracture data switch value actuation time and the resistance-type displacement transducer that is arranged on collection contact travel on the running route of high-voltage switch gear contact, and actuation time, harvester, the resistance-type displacement transducer of value connected single-chip microcomputer through analog to digital converter respectively; Be provided with the memory block that generates the program of the desired value that comprises actuation time, crosses stroke, time travel speed performance graph, time speed stroke performance graph according to the data that received in the single-chip microcomputer.
It also comprises the current waveform profile detection line, and the current waveform profile detection line comprises the Switching Power Supply that is connected between external power source and the coil power, and is connected the current transformer between Switching Power Supply and the coil power; Current transformer, Switching Power Supply connect single-chip microcomputer; Also include according to the current transformer data in the single-chip microcomputer memory block and combine the harvester of said actuation time of value, the program that resistance-type displacement transducer data generate current waveform profile, and the program adjusted of command switch power supply.
In the data acquisition circuit of the present invention actuation time value harvester be the connecting line that connects equipment under test and this machine; And being stored in the program of passing through level variation judgement time origination point in the single-chip microcomputer, the time interval between two level change can reflect the time value of action; Resistance-type displacement transducer in the data acquisition mainly is a numerical value of gathering contact travel; More than two numerical value inputs single-chip microcomputer; Program in single-chip microcomputer converses actuation time, mistake stroke and formation time travel speed performance graph, time speed stroke performance graph respectively; Increase the function of detector, obtained the index directly perceived of high-voltage switch gear performance condition more comprehensively, intuitively.In addition, also on drive coil, be provided with the collection current transformer and the Switching Power Supply of gathering the coil power current value, have accessiblely before starting with the driving mechanism that obtains switch contact, grasp the performance of high-voltage switch gear more all sidedly.Of the present inventionly filled up that existing high-voltage switch gear detector can not detect actuation time, crosses stroke and formation time travel speed performance graph, time speed stroke performance graph; And the driving mechanism that can not detect switch contact has the blank of accessible fault before startup, realized intuitively obtaining of above each data.
Description of drawings
Accompanying drawing is a theory diagram of the present invention
The solid line hollow arrow is a signal transmission line among the figure, and the dotted line hollow arrow is the electric energy transmitting circuit.
Embodiment
As shown in the figure, the present invention includes power supply, processor, data acquisition circuit, display circuit and print circuit; Power supply is the rectification circuit that is connected with external power source; It connects single-chip microcomputer, display circuit, print circuit; Data acquisition circuit comprises that the level that passes through that connects on the equipment under test just changes the harvester of judging fracture data switch value actuation time and the resistance-type displacement transducer that is arranged on collection contact travel on the running route of high-voltage switch gear contact, and actuation time, harvester, the resistance-type displacement transducer of value connected single-chip microcomputer through analog to digital converter respectively; The collection that be worth actuation time is to be electrically connected each port A, B, C through p-wire, concludes beginning, the end of actuation time through the variation of each port level height; Stroke is gathered, and through being arranged on the resistance-type stroke sensor on the contact position, gathers the stroke distances data.Be provided with the memory block that generates the program of the desired value that comprises actuation time, crosses stroke, time travel speed performance graph, time speed stroke performance graph according to the data that received in the single-chip microcomputer.
It also comprises the current waveform profile detection line, and the current waveform profile detection line comprises the Switching Power Supply that is connected between external power source and the coil power, and is connected the current transformer between Switching Power Supply and the coil power; Current transformer, Switching Power Supply connect single-chip microcomputer; Also include according to the current transformer data in the single-chip microcomputer memory block and combine the harvester of said actuation time of value, the program that resistance-type displacement transducer data generate current waveform profile, and the program adjusted of command switch power supply.
Claims (2)
1. a high voltage switch tester comprises power supply, processor, data acquisition circuit, display circuit and print circuit; Power supply is the rectification circuit that is connected with external power source; It connects single-chip microcomputer, display circuit, print circuit; It is characterized in that; Data acquisition circuit comprises that the level that passes through that connects on the equipment under test just changes the harvester of judging fracture data switch value actuation time and the resistance-type displacement transducer that is arranged on collection contact travel on the running route of high-voltage switch gear contact, and actuation time, harvester, the resistance-type displacement transducer of value connected single-chip microcomputer through analog to digital converter respectively; Be provided with the memory block that generates the program of the desired value that comprises actuation time, crosses stroke, time travel speed performance graph, time speed stroke performance graph according to the data that received in the single-chip microcomputer.
2. a kind of high voltage switch tester according to claim 1; It is characterized in that; It also comprises the current waveform profile detection line; The current waveform profile detection line comprises the Switching Power Supply that is connected between external power source and the coil power, and is connected the current transformer between Switching Power Supply and the coil power; Current transformer, Switching Power Supply connect single-chip microcomputer; Also include according to the current transformer data in the single-chip microcomputer memory block and combine the harvester of said actuation time of value, the program that resistance-type displacement transducer data generate current waveform profile, and the program adjusted of command switch power supply.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2008100254002A CN101566670B (en) | 2008-04-25 | 2008-04-25 | High-voltage switch tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2008100254002A CN101566670B (en) | 2008-04-25 | 2008-04-25 | High-voltage switch tester |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101566670A CN101566670A (en) | 2009-10-28 |
| CN101566670B true CN101566670B (en) | 2012-07-04 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2008100254002A Expired - Fee Related CN101566670B (en) | 2008-04-25 | 2008-04-25 | High-voltage switch tester |
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| Country | Link |
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| CN (1) | CN101566670B (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101923128A (en) * | 2010-06-30 | 2010-12-22 | 南京工业职业技术学院 | Intelligent three-phase equipment safety detector |
| CN102435942B (en) * | 2011-09-06 | 2014-06-25 | 武汉义天科技有限公司 | Electromagnetic induction system of high-tension switch fracture and test method thereof |
| CN103017608B (en) * | 2012-12-20 | 2015-05-06 | 北京电子工程总体研究所 | Activation circuit tester |
| CN103197237B (en) * | 2013-03-08 | 2015-04-15 | 黑龙江省电力科学研究院 | Valve action time testing system |
| AU2018204677B2 (en) * | 2017-07-24 | 2021-12-09 | Cristaudo, Anthony | Mining electrical outlet protection devices test unit |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA2113193A1 (en) * | 1992-05-12 | 1993-11-25 | David L. Swindler | System for monitoring circuit breaker operations and alerting need of preventative maintenance |
| CN2456176Y (en) * | 2000-12-04 | 2001-10-24 | 王农 | Circuit breaker online monitor |
| US7259565B2 (en) * | 2003-09-15 | 2007-08-21 | General Electric Company | Testing an electrical switchgear system |
| CN100375902C (en) * | 2004-10-22 | 2008-03-19 | 哈尔滨工业大学 | Testing method for dynamic characterist ics of electromagnetic relay |
| CN201060252Y (en) * | 2007-05-18 | 2008-05-14 | 天津市百利电气有限公司 | Three phase electronic type over loading relay tester |
| CN201225961Y (en) * | 2008-04-25 | 2009-04-22 | 毕青春 | High voltage switch tester |
-
2008
- 2008-04-25 CN CN2008100254002A patent/CN101566670B/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA2113193A1 (en) * | 1992-05-12 | 1993-11-25 | David L. Swindler | System for monitoring circuit breaker operations and alerting need of preventative maintenance |
| CN2456176Y (en) * | 2000-12-04 | 2001-10-24 | 王农 | Circuit breaker online monitor |
| US7259565B2 (en) * | 2003-09-15 | 2007-08-21 | General Electric Company | Testing an electrical switchgear system |
| CN100375902C (en) * | 2004-10-22 | 2008-03-19 | 哈尔滨工业大学 | Testing method for dynamic characterist ics of electromagnetic relay |
| CN201060252Y (en) * | 2007-05-18 | 2008-05-14 | 天津市百利电气有限公司 | Three phase electronic type over loading relay tester |
| CN201225961Y (en) * | 2008-04-25 | 2009-04-22 | 毕青春 | High voltage switch tester |
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| CN101566670A (en) | 2009-10-28 |
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Assignee: Yangzhou HuanDian Electric Co., Ltd. Assignor: Bi Qingchun Contract record no.: 2012320000883 Denomination of invention: High-voltage switch tester Granted publication date: 20120704 License type: Exclusive License Open date: 20091028 Record date: 20120711 |
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Effective date of registration: 20161216 Address after: Baoying County, Jiangsu city of Yangzhou Province Liu Bao Zhen 225828 Ren Li Dang Patentee after: YANGZHOU YANYANGTIAN NEW ENERGY CO., LTD. Address before: The people of East 225828 Baoying County of Jiangsu province Liubao town No. 102 Patentee before: Bi Qingchun |
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Effective date of registration: 20171101 Address after: 225821 Jiangsu city of Yangzhou province Baoying County Town People's road pile Patentee after: Yangzhou HuanDian Electric Co., Ltd. Address before: Baoying County, Jiangsu city of Yangzhou Province Liu Bao Zhen 225828 Ren Li Dang Patentee before: YANGZHOU YANYANGTIAN NEW ENERGY CO., LTD. |
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| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120704 Termination date: 20190425 |