CN101566669B - Semiconductor integrated circuit device, and device and method for reliability test thereof - Google Patents
Semiconductor integrated circuit device, and device and method for reliability test thereof Download PDFInfo
- Publication number
- CN101566669B CN101566669B CN2008101048163A CN200810104816A CN101566669B CN 101566669 B CN101566669 B CN 101566669B CN 2008101048163 A CN2008101048163 A CN 2008101048163A CN 200810104816 A CN200810104816 A CN 200810104816A CN 101566669 B CN101566669 B CN 101566669B
- Authority
- CN
- China
- Prior art keywords
- integrated circuit
- clock
- test
- reliability
- sic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 102
- 239000004065 semiconductor Substances 0.000 title claims abstract description 45
- 238000000034 method Methods 0.000 title claims abstract description 23
- 239000004020 conductor Substances 0.000 claims description 27
- 238000010998 test method Methods 0.000 description 7
- 238000013461 design Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 230000006870 function Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 230000003014 reinforcing effect Effects 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Abstract
Description
Claims (18)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2008101048163A CN101566669B (en) | 2008-04-24 | 2008-04-24 | Semiconductor integrated circuit device, and device and method for reliability test thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2008101048163A CN101566669B (en) | 2008-04-24 | 2008-04-24 | Semiconductor integrated circuit device, and device and method for reliability test thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101566669A CN101566669A (en) | 2009-10-28 |
CN101566669B true CN101566669B (en) | 2011-06-01 |
Family
ID=41282925
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2008101048163A Active CN101566669B (en) | 2008-04-24 | 2008-04-24 | Semiconductor integrated circuit device, and device and method for reliability test thereof |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN101566669B (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102323539B (en) * | 2011-07-29 | 2013-06-19 | 清华大学 | Method for generating delay fault test vector set |
CN102606331A (en) * | 2012-03-20 | 2012-07-25 | 西安航天动力试验技术研究所 | Triple-redundancy voting control system and triple-redundancy voting control method |
CN102820879A (en) * | 2012-08-17 | 2012-12-12 | 中国电子科技集团公司第五十八研究所 | Radiation-proof triple-modular redundancy circuit structure |
CN108020769A (en) * | 2016-10-28 | 2018-05-11 | 深圳市中兴微电子技术有限公司 | A kind of method and apparatus of integrated circuit testing |
CN109212408B (en) * | 2017-06-29 | 2021-04-02 | 龙芯中科技术股份有限公司 | Scanning unit, and output control method and device of redundant trigger |
CN108055031B (en) * | 2017-12-14 | 2021-04-13 | 北京时代民芯科技有限公司 | Self-recovery triple modular redundancy structure for resisting single-particle soft error accumulation |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1402130A (en) * | 2001-08-24 | 2003-03-12 | 中国科学院计算技术研究所 | Self-diagnosis multimode redundant system |
CN1928831A (en) * | 2006-08-07 | 2007-03-14 | 浪潮齐鲁软件产业有限公司 | Method for improving SOC data credibility dedicated for financial tax control |
US7250786B1 (en) * | 2005-07-19 | 2007-07-31 | Xilinx, Inc. | Method and apparatus for modular redundancy with alternative mode of operation |
-
2008
- 2008-04-24 CN CN2008101048163A patent/CN101566669B/en active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1402130A (en) * | 2001-08-24 | 2003-03-12 | 中国科学院计算技术研究所 | Self-diagnosis multimode redundant system |
US7250786B1 (en) * | 2005-07-19 | 2007-07-31 | Xilinx, Inc. | Method and apparatus for modular redundancy with alternative mode of operation |
CN1928831A (en) * | 2006-08-07 | 2007-03-14 | 浪潮齐鲁软件产业有限公司 | Method for improving SOC data credibility dedicated for financial tax control |
Non-Patent Citations (1)
Title |
---|
龚锐等."FT51:一种容软错误高可靠微控制器".《计算机学报》.2007,第30卷(第10期), |
Also Published As
Publication number | Publication date |
---|---|
CN101566669A (en) | 2009-10-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN101566669B (en) | Semiconductor integrated circuit device, and device and method for reliability test thereof | |
US6964001B2 (en) | On-chip service processor | |
US6256760B1 (en) | Automatic test equipment scan test enhancement | |
US20160011260A1 (en) | On-Chip Service Processor | |
US8438439B2 (en) | Integrated circuit having a scan chain and testing method for a chip | |
US20080098268A1 (en) | Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection | |
US6788105B2 (en) | Semiconductor integrated circuit | |
US5608337A (en) | Method and apparatus of testing an integrated circuit device | |
US6289477B1 (en) | Fast-scan-flop and integrated circuit device incorporating the same | |
US20130275824A1 (en) | Scan-based capture and shift of interface functional signal values in conjunction with built-in self-test | |
CN109358993A (en) | The processing method and processing device of deep neural network accelerator failure | |
KR100790428B1 (en) | Asynchronous reset circuit testing | |
US7152194B2 (en) | Method and circuit for scan testing latch based random access memory | |
US20020078412A1 (en) | Built-in self test for a programmable logic device using linear feedback shift registers and hierarchical signature generation | |
US6694463B2 (en) | Input/output continuity test mode circuit | |
US7240263B2 (en) | Apparatus for performing stuck fault testings within an integrated circuit | |
US6806731B2 (en) | Semiconductor integrated circuit device and fault-detecting method of a semiconductor integrated circuit device | |
US7913132B2 (en) | System and method for scanning sequential logic elements | |
US7788565B2 (en) | Semiconductor integrated circuit | |
US20030172334A1 (en) | Technique for debugging an integrated circuit having a parallel scan-chain architecture | |
Huang et al. | Efficient diagnosis for multiple intermittent scan chain hold-time faults | |
US7900103B2 (en) | Scan chain architecture for increased diagnostic capability in digital electronic devices | |
Huang et al. | Using fault model relaxation to diagnose real scan chain defects | |
CN111983421B (en) | Circuit detection system and circuit detection method | |
TW202236293A (en) | Test circuit |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
EE01 | Entry into force of recordation of patent licensing contract |
Assignee: Beijing Loongson Zhongke Technology Service Center Co., Ltd. Assignor: Institute of Computing Technology, Chinese Academy of Sciences Contract fulfillment period: 2009.12.16 to 2028.12.31 Contract record no.: 2010990000062 Denomination of invention: Semiconductor integrated circuit device and device and method for reliability test thereof License type: exclusive license Record date: 20100128 |
|
LIC | Patent licence contract for exploitation submitted for record |
Free format text: EXCLUSIVE LICENSE; TIME LIMIT OF IMPLEMENTING CONTACT: 2009.12.16 TO 2028.12.31; CHANGE OF CONTRACT Name of requester: BEIJING LOONGSON TECHNOLOGY SERVICE CENTER CO., LT Effective date: 20100128 |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
EC01 | Cancellation of recordation of patent licensing contract |
Assignee: Longxin Zhongke Technology Co., Ltd. Assignor: Institute of Computing Technology, Chinese Academy of Sciences Contract record no.: 2010990000062 Date of cancellation: 20141231 |
|
EM01 | Change of recordation of patent licensing contract |
Change date: 20141231 Contract record no.: 2010990000062 Assignee after: Longxin Zhongke Technology Co., Ltd. Assignee before: Beijing Loongson Zhongke Technology Service Center Co., Ltd. |
|
LICC | Enforcement, change and cancellation of record of contracts on the licence for exploitation of a patent or utility model | ||
EE01 | Entry into force of recordation of patent licensing contract |
Application publication date: 20091028 Assignee: Longxin Zhongke Technology Co., Ltd. Assignor: Institute of Computing Technology, Chinese Academy of Sciences Contract record no.: 2015990000066 Denomination of invention: Semiconductor integrated circuit device and device and method for reliability test thereof Granted publication date: 20110601 License type: Common License Record date: 20150211 |
|
TR01 | Transfer of patent right |
Effective date of registration: 20200819 Address after: 100095, Beijing, Zhongguancun Haidian District environmental science and technology demonstration park, Liuzhou Industrial Park, No. 2 building Patentee after: LOONGSON TECHNOLOGY Corp.,Ltd. Address before: 100080 Haidian District, Zhongguancun Academy of Sciences, South Road, No. 6, No. Patentee before: Institute of Computing Technology, Chinese Academy of Sciences |
|
TR01 | Transfer of patent right | ||
EC01 | Cancellation of recordation of patent licensing contract |
Assignee: LOONGSON TECHNOLOGY Corp.,Ltd. Assignor: Institute of Computing Technology, Chinese Academy of Sciences Contract record no.: 2015990000066 Date of cancellation: 20200928 |
|
EC01 | Cancellation of recordation of patent licensing contract | ||
CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: 100095 Building 2, Longxin Industrial Park, Zhongguancun environmental protection technology demonstration park, Haidian District, Beijing Patentee after: Loongson Zhongke Technology Co.,Ltd. Address before: 100095 Building 2, Longxin Industrial Park, Zhongguancun environmental protection technology demonstration park, Haidian District, Beijing Patentee before: LOONGSON TECHNOLOGY Corp.,Ltd. |