CN101545935B - Method for realizing analysis of electrical performance indexes in embedded type system - Google Patents

Method for realizing analysis of electrical performance indexes in embedded type system Download PDF

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Publication number
CN101545935B
CN101545935B CN200810088018A CN200810088018A CN101545935B CN 101545935 B CN101545935 B CN 101545935B CN 200810088018 A CN200810088018 A CN 200810088018A CN 200810088018 A CN200810088018 A CN 200810088018A CN 101545935 B CN101545935 B CN 101545935B
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embedded system
working current
current
embedded type
time
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CN101545935A (en
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王武
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ZTE Corp
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ZTE Corp
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Abstract

The invention discloses a method for realizing the analysis of electrical performance indexes in an embedded type system, which comprises the following steps: (1) detecting the working current flowing through the embedded type system; and (2) according to the set sampling frequency, obtaining the average working current of the embedded type system in appointed time, displaying the changing curve of the current along the time through a screen of the embedded type system aiming at the embedded type equipment with the screen and a file system and storing the data of the working current for subsequent analysis. Compared with the prior art, the method can realize that the working current of the embedded type system can be obtained without using an instrument, can obtain the situation of power consumption of the embedded type system in the practical working environment. As the operating environment of the embedded type system and the practical operating environment have great difference, the situation of the power consumption of the embedded type system also has large difference; the method gets rid of the situation that the electrical performance indexes of the embedded type system can be only obtained by using the instrument in a laboratory; and the obtained electrical performance indexes are more objective and true.

Description

A kind of method that on embedded system, realizes analysis of electrical performance indexes
Technical field
The present invention relates to the embedded system technology field, specifically, relate in particular to a kind of method that on embedded system, realizes analysis of electrical performance indexes.
Background technology
Electrical performance indexes is an important indicator of weighing embedded system performance.The good electrical properties index can reduce working current, improves the life-span of components and parts.Be that the embedded system of energy source seems particularly important for adopting battery particularly, the good electrical properties design can obviously prolong work/stand-by time, improves user's satisfaction.
Embedded system is carried out the basis that rational electrical performance indexes analysis is further optimization, the design of check embedded system electrical property.The running environment of embedded system varies, but way commonly used at present is to use instrument to obtain Embedded electrical performance indexes in the laboratory, yet test figure can not reflect the situation of embedded system in real work.This becomes, and the embedded system electrical performance indexes is further optimized and a big obstacle of check Optimization result.
Summary of the invention
The technical matters that the present invention solved is to provide a kind of method that on embedded system, realizes analysis of electrical performance indexes, to solve electrical performance indexes in the embedded system because of the varying of running environment, causes it to analyze this technical matters of difficulty.
In order to address the above problem, the invention provides a kind of method that on embedded system, realizes analysis of electrical performance indexes, it is characterized in that, may further comprise the steps:
(1) detects the working current that flows through said embedded system;
(2) according to the average working current in the fixed time of the SF acquisition embedded system that is provided with; Embedded device to screen, file system are arranged can pass through embedded device screen display electric current curve over time, and the store operational current data is in order to subsequent analysis.
Method of the present invention, wherein, said step (1) comprising:
(11) serial connection one high precision, little resistance resistance on the power output circuit of said embedded system;
(12) the analog electrical pressure reduction to these resistance two ends carries out mould/number conversion, obtains the numerical value of this voltage difference;
(13) numerical evaluation according to said resistance value and voltage difference obtains working current.
Method of the present invention, wherein, said step (2) comprising:
(21) according to maximum, minimum, average working current in the fixed time of the SF acquisition embedded system that is provided with;
(22) on the screen of embedded device, show working current change curve in time, the power consumption situation of reflection embedded system;
(23) the working current data of obtaining are stored in the embedded system in chronological order, and use these data to carry out subsequent analysis and handle.
Further, wherein, said high precision, little resistance resistance are 0.1 ohm high precision, little resistance resistance.
Further, wherein, said step (21) comprising:
(211) confirm suitable SF according to embedded system;
(212) working current in a period of time is carried out integral and calculating to obtain integration current;
(213) be divided by according to said integration current and corresponding time and obtain the average working current in this time;
(214) write down interior minimum and maximum working current of this time simultaneously.
Further, wherein, SF is 10Hz in the said step (211).
Further, wherein, calculate integration current in the said step (212) and adopt following mode: when SF is enough little, the mode that working current in a period of time uses sampling period and sample value product to sue for peace is again calculated integration current.
Compared with prior art, the present invention can realize not using instrument just can obtain the working current of embedded system, can obtain the power consumption situation of embedded system in actual working environment.Because breadboard operation for embedded system environment and actual motion environment difference are very big; Also there is very big difference in the power consumption situation of embedded system; This invention has been broken away from the embedded system electrical performance indexes and can only used instrument to obtain situation in the laboratory, and the electrical performance indexes that obtains is objective reality more.Be the basis of improving the design of embedded system electrical property, thereby be that the satisfaction that increases the embedded system user provides guarantee.
Description of drawings
Fig. 1 is a kind of method basic flow sheet of on embedded system, realizing analysis of electrical performance indexes according to the invention;
Fig. 2 is a particular flow sheet of step 101 in the said method of Fig. 1;
Fig. 3 is a particular flow sheet of step 102 in the said method of Fig. 1.
Embodiment
The present invention provides a kind of method that on embedded system, realizes analysis of electrical performance indexes here, to solve electrical performance indexes in the embedded system because of the varying of running environment, causes it to analyze existing problems.Below embodiment is described in detail, but not as to qualification of the present invention.
The present invention is applicable in the obtaining and analyzing of embedded system electrical performance indexes, to realize that on mobile phone the electrical performance indexes analysis is that example is set forth.
How to improve the mobile phone electrical performance indexes, prolongs standby time is the difficult problem of a pendulum in face of mobile phone research and development, manufacturing industry.Obtaining the working current of mobile phone in actual working environment is the basis of improving electrical performance indexes; People can only use instrument to obtain the electrical performance indexes of mobile phone in the laboratory at present; Yet actual environment for use is than complicated many in laboratory, and the result who draws can not reflect the electrical performance indexes of mobile phone in actual environment for use.
Adopt method basic flow sheet shown in Figure 1, concrete steps comprise:
Step 101, the voltage R through the resistance R two ends that are connected in series in the testing circuit Sense, just can use Δ V/R SenseObtain the electric current that flows through this resistance, this electric current is exactly the electric current of embedded system work.Detect the working current that flows through embedded system like this;
Step 102, obtain the embedded working current in the fixed time with certain frequency, it is accurate more that the high more average working current of frequency calculates, but high and consume more multipotency to hardware requirement, a reference frequency is 10Hz.Adopt integral way to calculate average working current, this average working current can be used for assessing this Embedded average power consumption situation.(this value is an empirical value according to 10Hz; The high more integral and calculating of SF is accurate more; But high sampling rate is high and consume more multipotency to hardware requirement) about SF obtain the different operating electric current in fixed time of embedded system; And the screen display through embedded system, store said working current data then and handle so that apply to subsequent analysis.
Method as shown in Figure 2, above-mentioned, said step 101 comprises the steps:
Step 1011, on the power output circuit of said embedded system serial connection one high precision, little resistance resistance R Sense, the size of this resistance should guarantee that working currents all in the circuit can both flow through this resistance, and this resistance too conference too much consumes ability, and too little measured value is difficult for accurately, and a reference value is 0.1 Europe.；
Step 1012, to resistance R SenseThe voltage difference at two ends (analog quantity) is carried out mould/number conversion (voltage is an analog quantity, must become concrete magnitude of voltage through mould/number conversion, could in software, calculate), obtains the numerical value of this voltage difference delta V;
Step 1013, evaluation work electric current: I=Δ V/R Sense
Method as shown in Figure 3, above-mentioned, said step 102, at the appointed time in n sampling period T, the sample rate current that obtains is I 1, I 2... I n, average working current I = ( Σ 0 n T * I n ) / T * n , Simplify the back formula I = ( Σ 0 n I n ) / n . , Average current is exactly interior during this period of time watt current, is used for calculating the electric weight of this section period internal consumption.Specifically comprise the steps:
Step 1021, obtain working current, calculate maximum, minimum, average working current in the fixed time with said SF;
Step 1022, on the screen of embedded system, show the working current curve, this current curve can intuitively reflect the power consumption situation of embedded system;
Step 1023, the working current data of obtaining are stored in embedded file system in chronological order, handle so that these data are further carried out subsequent analysis.
Above-mentioned method is characterized in that, said step 1021 comprises the steps:
Step 10211, confirm suitable SF according to embedded system, here roughly according to the SF about 10Hz;
Step 10212, working current in a period of time is calculated integration current (when SF was enough little, the mode that can use sampling period and sample value product to sue for peace was again calculated integration current);
Step 10213, integration current and the corresponding time average working current in this time of acquisition that is divided by;
Step 10214, write down the minimum and maximum working current in this period.
Above-mentioned method, said maximum, minimum, average working current all are interior to a period of time.
Here step 1021,1022 and 1023 promptly is provided with the beginning and the end of fixed time section through mobile phone menu in mobile phone time service environment, mobile phone obtains working current automatically, and is kept at the result on the mobile phone.According to different purpose the different time section is set, just can obtains the power consumption situation of mobile phone in the time service process.Embedded device step 1022,1023 to not having screen, embedded file system can be omitted, and step 1021 just can be known the embedded device power consumption situation after obtaining average working current basically.
The present invention can realize not using instrument just can obtain Embedded working current through realizing the analysis of embedded system electrical performance indexes, can obtain the power consumption situation of embedded system in actual working environment.Because breadboard embedded running environment and actual motion environment difference are very big; Also there is very big difference in the power consumption situation of embedded system; This invention has been broken away from the embedded system electrical performance indexes and can only used instrument to obtain situation in the laboratory, and the electrical performance indexes that obtains is objective reality more.Be the basis of improving the design of embedded system electrical property, increase embedded system user's satisfaction.
Certainly; The present invention also can have other various embodiments; Under the situation that does not deviate from spirit of the present invention and essence thereof; Those of ordinary skill in the art can make various corresponding changes and distortion according to the present invention, but these corresponding changes and distortion all should belong to the protection domain of the appended claim of the present invention.

Claims (6)

1. a method that on embedded system, realizes analysis of electrical performance indexes is characterized in that, does not use instrument, may further comprise the steps:
(1) detects the working current that flows through said embedded system;
Said step (1) comprising:
(11) serial connection one resistance on the power output circuit of said embedded system, the size of this resistance guarantees that all working currents can both flow through this resistance in the circuit;
(12) the analog electrical pressure reduction to these resistance two ends carries out mould/number conversion, obtains the numerical value of this voltage difference;
(13) numerical evaluation according to said resistance value and voltage difference obtains working current;
(2) according to the average working current in the fixed time of the SF acquisition embedded system that is provided with; The embedded system that screen, file system are arranged is passed through embedded system screen display electric current curve over time, prepare against subsequent analysis through embedded system store operational current data.
2. the method for claim 1 is characterized in that, said step (2) comprising:
(21) according to maximum, minimum, average working current in the fixed time of the SF acquisition embedded system that is provided with;
(22) on the screen of embedded system, show working current change curve in time, the power consumption situation of reflection embedded system;
(23) the working current data of obtaining are stored in the embedded system in chronological order, and use these data to carry out subsequent analysis and handle.
3. the method for claim 1 is characterized in that, the size of said resistance is 0.1 ohm.
4. method as claimed in claim 2 is characterized in that, said step (21) comprising:
(211) confirm suitable SF according to embedded system;
(212) working current in a period of time is carried out integral and calculating to obtain integration current;
(213) be divided by according to said integration current and corresponding time and obtain the average working current in this time;
(214) write down interior minimum and maximum working current of this time simultaneously.
5. method as claimed in claim 4 is characterized in that, SF is 10Hz in the said step (211).
6. method as claimed in claim 4; It is characterized in that; Calculate integration current in the said step (212) and adopt following mode: when SF is enough little, the mode that working current in a period of time uses sampling period and sample value product to sue for peace is again calculated integration current.
CN200810088018A 2008-03-27 2008-03-27 Method for realizing analysis of electrical performance indexes in embedded type system Expired - Fee Related CN101545935B (en)

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CN105187608B (en) * 2014-06-17 2019-08-13 腾讯科技（深圳）有限公司 The method and apparatus of application program power consumption on a kind of acquisition mobile terminal
CN112731030A (en) * 2020-12-23 2021-04-30 深圳市优必选科技股份有限公司 Electronic component detection method and device, terminal equipment and storage medium

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* Cited by examiner, † Cited by third party
Title
南利平等.手机消耗电流的自动测试.《电子测量与仪器学报》.2004,第174－178页. *

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