CN101540205B - Method for scanning flash memory - Google Patents
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- CN101540205B CN101540205B CN 200810087810 CN200810087810A CN101540205B CN 101540205 B CN101540205 B CN 101540205B CN 200810087810 CN200810087810 CN 200810087810 CN 200810087810 A CN200810087810 A CN 200810087810A CN 101540205 B CN101540205 B CN 101540205B
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Abstract
The invention provides a method for scanning a flash memory, which comprises the following steps of: selecting a scanning grade; scanning the flash memory according to the selected scanning grade to obtain information on good blocks and bad blocks in the flash memory to form a scanning result; and outputting the scanning result according to the selected scanning grade. The method can improve the efficiency for scanning the flash memory when scanning different flash memories a plurality of set different grades of scanning.
Description
Technical field
The present invention relates to the erasable and programable memory field, particularly the scan method of flash media.
Background technology
Along with the technology development, flash memory is also more and more wider as the field that storer uses, and the user is also more and more higher to the capacity requirement of flash memory simultaneously.In order to satisfy the different requirement of user, to the also thereupon raising of scan efficiency of flash memory.Existing flash memory scanning determines bad piece of piece, adopts the single scanning method flash memory to be scanned real bad block management.
At present general way is: all piece data writings in the flash memory at first, again data writing is read and judged bad piece of piece, although the single scanning method can satisfy the user to the requirement of flash memory sweep test, but owing to thisly do not have differentiated scanning requirement often to scan to carry out the mass data exchange, thereby make sweep velocity lower.Concerning the less demanding user of flash memory, adopting this kind method to reduce scan efficiency for those, is to meet the demands.More can't satisfy the user to the requirement of flash memory scan efficiency, select as required the different scanning method that flash memory is scanned, check out fast the bad piece of depositing in the flash memory.
Summary of the invention
The technical matters that the present invention solves provides a kind of scan method, adopts many grades scan method that flash memory is scanned, and determines fast bad piece of piece, can improve the flash memory scan efficiency.
A kind of method for scanning flash memory of the present invention is determined the good piece of flash memory and bad piece by flash memory is scanned, and the method comprising the steps of: select the scanning grade; According to the scanning grade of selecting flash memory is scanned, obtain good piece and bad block message in the flash memory, form scanning result; Export the scanning result of above-mentioned formation.
Preferably, according to the scanning grade of selecting flash memory is scanned, obtain good piece and bad block message in the flash memory, before the formation scanning result, at first flash memory is wiped, again by reading fast each blocks of data of flash memory, determine initial good piece and bad piece.
Preferably, described each the blocks of data step of flash memory that reads fast comprises: partial data in the flash block is read; The result judges according to reading out data, to determine initial good piece and bad piece; Whether flash data read completely judge, produce scanning result; The output scanning result.
Preferably, described scanning grade comprises: the first scanning grade, the second scanning grade and the 3rd scanning grade.
Preferably, when selecting the scanning grade to be the first scanning grade, initial good piece and bad block message are as a result of exported.
Preferably, when selecting the scanning grade to be the second scanning grade, select in the initial good piece at least one page, to described at least one page data writing, and read data in described at least one page, and redefined piece and bad piece, the good piece and the bad block message that redefine are exported as scanning result.
Preferably, when selecting the scanning grade to be the second scanning grade, all pages data writing in the initial good piece is selected initial good piece middle part paging and is read wherein data, redefined piece and bad piece, the good piece and the bad block message that redefine have been exported as scanning result.
Preferably, when selecting the scanning grade to be the second scanning grade, all pages data writing in the initial good piece reads the data in all pages, has redefined piece and bad piece, and the good piece and the bad block message that redefine are exported as scanning result.
Preferably, when selecting the scanning grade to be the 3rd scanning grade, all pages data writing in the initial good piece of flash memory reads the data in all pages, determines final good piece and bad piece, will redefine piece and bad block message is exported as scanning result.
Preferably, the second scanning grade and/or the 3rd scanning grade are only carried out data writing and reading out data scanning to initial good piece.
Preferably, scan in the process, take page or leaf as unit, as long as when having a page or leaf to be judged as bad page or leaf, just stop to scan page or leaf remaining in this piece, this piece is labeled as bad piece.
The present invention scans flash memory according to different scanning grades by selecting the scanning grade, can quick and precisely scan flash memory, determines bad piece of piece.
Description of drawings
Fig. 1 is embodiment of the invention scan method process flow diagram;
Fig. 2 is the concrete scanning process figure of the embodiment of the invention;
Fig. 3 is that the initial good piece of the embodiment of the invention carries out scanning process figure;
Fig. 4 is embodiment of the invention rapid scanning process flow diagram;
Fig. 5 is embodiment of the invention data writing process flow diagram;
Fig. 6 is embodiment of the invention reading out data flow process figure;
Fig. 7 is the embodiment of the invention the 3rd scanning grade process flow diagram.
The realization of the object of the invention, functional characteristics and advantage are described further with reference to accompanying drawing in connection with embodiment.
Embodiment
The present invention proposes the first embodiment and by a plurality of different scanning grades are set flash memory is scanned, and according to scanning classification scan mode, thereby can realize rapid scanning to flash memory, determines piece and bad piece, improves scan efficiency.
As shown in Figure 1, be the present embodiment method for scanning flash memory schematic flow sheet, by the scanning grade of selecting, thereby determine scan mode, according to scan mode flash memory is scanned, and the output scanning result.This scan method comprises step:
Step S101 selects the scanning grade, is provided with different scanning grades in the system, and each scanning grade is to there being different scan modes, and the user can select different scanning grades as required;
Step S102 scans according to the scanning grade of selecting, and selects scan mode that flash memory is scanned, and reads data in flash memory, obtains in the flash memory the bad piece block message of becoming reconciled, and forms scanning result;
Step S103 exports the scanning result of above-mentioned formation, and this scanning result comprises the bad block message block message of becoming reconciled.
The present invention also proposes the second embodiment on the basis of the first embodiment, by the data in the first erasing flash memory, reads flash data again, the piece thereby definite flash memory bad block is become reconciled.
Be illustrated in figure 2 as the present embodiment scanning particular flow sheet, according to scanning classification scan mode the piece in the flash memory scanned, thereby determine piece and bad piece, this flow process comprises:
Step S200 obtains the scanning class information, according to the scanning class information of selecting flash memory is scanned;
Step S201, the data in the erasing flash memory on all pieces;
Step S202, whether the data on each piece of rapid scanning flash memory have wiped totally, read the data on every of the flash memory, determine initial good piece and bad piece;
Step S203 determines the scanning grade;
Step S204, according to step S203, when the scanning grade is the first scanning during grade, execution in step S209 then, with initial good piece and bad block message as final good piece and bad block message;
Step S205, according to step S203, when the scanning grade is the second scanning grade, execution in step S207;
Step S206, according to step S203, when the scanning grade is the 3rd scanning grade, execution in step S208;
Step S207 according to initial good piece and the bad block message of determining, scans wherein good piece, and this scanning according to scanning result, has redefined piece and bad block message by the part page or leaf in the above-mentioned good piece is carried out data writing and read data operation;
Step S208 according to initial good piece and the bad block message of determining, scans wherein good piece, and this scanning according to scanning result, has redefined piece and bad block message by all pages in the above-mentioned good piece are carried out data writing and read data operation;
Step S209 is according to selecting respectively output scanning result of the first scanning grade, the second scanning grade and the 3rd scanning grade.
Specifically, above-mentioned steps S200 obtains the scanning class information, and the user arranges different scanning grades as required, when needs scan flash memory, by user selection scanning grade.This scanning grade can comprise: the first scanning grade, and read flash memory and wipe the result, initial good piece and bad block message are as a result of exported; The second scanning grade selects initial good piece middle part paging to carry out data writing and reading result scans, and no longer initial bad blocks is scanned, and has redefined piece and bad piece, and the good piece and the bad block message that redefine are exported as scanning result; The 3rd scanning grade all will scan all pages or leaves in the initial good piece of flash memory, no longer initial bad blocks is scanned, and data writing and reading result are determined final good piece and bad piece, and the good piece and the bad block message that redefine are exported as scanning result.
Data on all pieces of above-mentioned steps S201 erasing flash memory, wherein step S201 is that step S102 specializes to step S208.
Whether the data on each piece of above-mentioned steps S202 rapid scanning flash memory have wiped totally, read the data on every of the flash memory, determine initial good piece and bad piece.For flash memory, wiped the data on the piece after, each position of this good piece should be 1, through after wiping, if data are not entirely on the piece, illustrates that then this piece do not wipe fully at 1 o'clock, thinks that this piece is bad piece.If data are 1 o'clock entirely on the piece, then this piece has been wiped totally, thinks that this piece has been piece, determines initial good piece and bad piece, and this bad piece no longer carries out scan operation.
Above-mentioned steps S203 determines the scanning grade, adopts different scan modes that flash memory is scanned according to the scanning grade.
Above-mentioned steps S204, when above-mentioned scanning grade was the first scanning grade, step S202 was that the initial good piece of determining is final good piece.
Above-mentioned steps S205 determines that the scanning grade is the second scanning grade.
Above-mentioned steps S206 determines that the scanning grade is the 3rd scanning grade.
Above-mentioned steps S207, the scanning grade of determining according to step S205 is that the initial good piece middle part paging of determining scans to step S202, data writing and reading out data have redefined piece and bad piece according to data writing and reading out data result, then do not need to scan for initial bad blocks.Can select initial good piece middle part paging to carry out data writing and reading section data, can also select in the initial good piece all pages or leaves to carry out data writing and read all page datas, redefined piece and bad piece, the good piece and the bad block message that redefine have been exported as scanning result.
Above-mentioned steps S208, the scanning grade of determining according to step S206 scans all pages or leaves in the definite initial good piece of step S202, data writing and reading out data, redefined piece according to data writing and reading out data result, being a good piece determines also just to have determined then not need bad piece to scan for initial bad blocks.
Above-mentioned steps S209 is according to the first scanning grade of determining, the second scanning grade and the 3rd scanning grade difference output scanning result.
As shown in Figure 3, for the initial good piece of the present embodiment carries out scanning process figure, the good piece of determining according to above-mentioned steps S207 scans, and has redefined piece and bad piece by scanning, and this step comprises:
Step S2071, the good piece that flash memory is initially determined scans, and when being the second scanning grade according to step S205 scanning grade, data being write initial good piece middle part paging, and carry out the data that write are read, and scans;
Step S2072 has redefined piece and bad piece according to scanning result, to flash memory data writing and reading out data scanning, has redefined piece and bad piece according to step S2071.
Scan period of step S2071 and S2072, different according to the requirement of scanning, can increase or reduce the scan period.
Among the above-mentioned S2071 data having been write in the piece, is to carry out according to block address and the length of the main frame appointment that flash memory is scanned, and this block address and length are used for determining the starting block of beginning data writing and continuous write-in block quantity.In the follow up scan process, scan according to this physical block address and length.
As shown in Figure 4, be the present embodiment rapid scanning process flow diagram, this flow process is determined this piece quality by reading fast in the flash memory data on the piece, and this step comprises:
Step S400 establishes the variable i be used to the piece that records current scanning block number, and the variable i initial value is 0;
Step S401 reads the information of i piece, reading section data from the i piece, such as first page, middle one page and last page, do not need the data of all pages in the piece are read, the page or leaf of choosing also only need read wherein several bytes, does not also need all data in the page or leaf are all read;
Whether step S402 is 1 to judge to reading out data entirely, if the data that read are 1 entirely, and execution in step S404 then, if the data that read are not to be 1 entirely, execution in step S403 then;
Step S403 is not 1 according to step S402 to the data that read entirely, and this piece is labeled as bad piece;
Step S404, read one after, variable i is added 1, next piece is read;
Step S405, judge whether to have read flash data, add 1 according to step S404 variable i, judge whether to have scanned all pieces in the flash memory, when variable i adds after 1 more than or equal to the block address of above-mentioned main frame appointment and length, in the flash memory during quantity of set piece, judge that the data in this flash memory read fully, then carry out next step, when variable i adds after 1 less than the block address of main frame appointment and length, judge that this flash data is not read fully, also need to read, return step S401 and re-execute step S401 to step S405;
Step S406 returns bad piece and becomes reconciled block message to system, according to step S405 judged result, when flash memory scans fully, returns bad piece and becomes reconciled block message to system and withdraw from.
Therefore in the present embodiment, only read and seldom measure data, determine whether to be 1 entirely, for a good piece, its each position all should be 1 after wiping, and is not that the piece at 1 place, position is thought bad piece, also can read as required whole all data of page or leaf, determines fine or not piece.
As shown in Figure 5, be the present embodiment data writing process flow diagram, this process step comprises:
Step S500 determines block address and block length according to the order that main frame sends, and is used to specify from certain BOB(beginning of block) and carries out write operation, writes continuously how many pieces;
Step S501, it is 0 that initial offset is set, and carries out take page or leaf as unit during data writing;
Step S502, data are write the specific page in the piece of appointment, as required data are write in the specific page, wherein specific page, then only needs the paging of data write section if select the second scanning grade according to the scanning classification, for example write two pages of fronts, two pages and last two pages of centres, if what select is that the scanning grade is the 3rd scanning grade, then need every one page all to write, until write full this piece;
Step S503, side-play amount increases, according to step S502, write finish one after, will be offset increase by 1;
Step S504, whether side-play amount is judged more than or equal to block length, according to step S503, side-play amount after increasing and the length of appointment are compared judgement, if judge side-play amount more than or equal to the length of appointment, then this time write operation finishes, if side-play amount is less than the length of appointment, then return step S502 and continue next piece is carried out write operation, until write the piece of setting.
As shown in Figure 6, be the present embodiment reading out data flow process figure, this flow process comprises step:
Step S600, the block address of Receiving Host appointment and length, this block address and length are used for determining to begin to read piece and read continuously number of blocks;
Step S601 arranges side-play amount and is initially 0;
Step S602 according to bad piece of scanning classification, such as the second scanning grade, then only need read the part page or leaf in the initial good piece, if the 3rd scanning grade then needs to read all pages or leaves in the initial good piece, thereby determines piece and bad piece;
Step S603, according to step S602, read one after, side-play amount is increased by 1;
Step S604, according to the side-play amount among the step S603, this side-play amount is judged, if side-play amount is during more than or equal to the main frame designated length, reading out data finishes, with good piece and the output of bad block message, if side-play amount is during less than the length of main frame appointment, then continue to read next piece, until read physical block.
Shown in 7, be the present embodiment tertiary gradient scanning process figure, judge reading section page data in the flowchart process at bad piece, data in flash memory can be read out and compare, also can only the data that read be defeated by flash memory main control chip internal memory, and need not compare, judge by error correcting code (ECC) module that hardware carries record reads whether data mistake has occured in the process.Can reading out data mistake specified scope be set by the user, when reading out data error code during in specified scope, think that this piece has been piece.If the data that read all are 0, hardware also can arrange corresponding register.Describe in the internal memory of flash memory main control chip with a reading out data among the present invention.
This flow process describes with the 3rd scanning grade, scans in the process, take page or leaf as unit, as long as when having a page or leaf to be judged as bad page or leaf, just stop to scan page or leaf remaining in this piece, this piece is labeled as bad piece in scanning process, and this flow process comprises step:
Step S700 establishes be used to the variable i that records current page number, and its initial value is 0;
Step S701, read the data on the i page or leaf, the scan mode different according to the different scanning classification, when if the scanning grade is the 3rd scanning grade, read all pages or leaves that scanned in the piece, as long as it is bad having a page or leaf to judge, just stop to read remaining page or leaf in this piece of scanning, this piece is labeled as bad piece;
Step S702, whether system is error correction to judge to the data that read, if make a mistake, determines whether this mistake is what can correct, if mistake cannot be corrected, then execution in step S707 is labeled as bad piece with this piece; If mistake can be corrected, then carry out next step;
Whether step S703 judges greater than specified scope the error in data that reads, according to step S702, when the error in data that reads is that cannot correct or wrong greater than specified scope, with regard to execution in step S707, this piece is labeled as bad piece, finish simultaneously this other pages of piece scanning; If mistake is that can correct and wrong during less than the number of errors set, execution in step S704;
Step S704, whether be 0 to judge entirely to the data that read, for some page or leaf, when wherein writing the data of non-full 0, the result who reads all is 0, and this moment, ECC thought that it is right, cause S702, S703 can not check out that all this is a bad page or leaf, the data of the non-full 0 that writes for system, if the hardware record it be full 0, then the piece at this page of mark place is bad piece, otherwise carries out next step;
Step S705, the page number variable i increases 1, and lower one page is scanned;
Step S706, according to step S705, after the page number variable i increased 1, the length of system's appointment compares judgement, if this page variable i is more than or equal to the length of system's appointment, end operation, if this this page variable i is less than the length of system's appointment, then return step S701, lower one page is carried out step S701 to step S705 operation, until the page number variable i increases the page or leaf at 1 rear place more than or equal to the length of system's appointment.Can scan flash memory fast by selecting the scanning grade, improve scan efficiency;
Step S707 is designated as bad piece with current block, finishes the scanning to this piece.
The above only is the preferred embodiments of the present invention; be not so limit claim of the present invention; every equivalent structure or equivalent flow process conversion that utilizes instructions of the present invention and accompanying drawing content to do; or directly or indirectly be used in other relevant technical fields, all in like manner be included in the scope of patent protection of the present invention.
Claims (10)
1. a method for scanning flash memory by to the definite good piece of flash memory of flash memory scanning and bad piece, is characterized in that, the method comprising the steps of:
Select the scanning grade;
According to the scanning grade of selecting flash memory is scanned, obtain good piece and bad block message in the flash memory, form scanning result;
Export the scanning result of above-mentioned formation.
2. method for scanning flash memory according to claim 1, it is characterized in that, according to the scanning grade of selecting flash memory is scanned, obtain good piece and bad block message in the flash memory, before forming scanning result, at first flash memory is wiped, again by reading fast each blocks of data of flash memory, determined initial good piece and bad piece.
3. method for scanning flash memory according to claim 2 is characterized in that, described each the blocks of data step of flash memory that reads fast comprises:
Partial data in the flash block is read;
The result judges according to reading out data, to determine initial good piece and bad piece;
Whether flash data read completely judge, produce scanning result;
The output scanning result.
4. according to claim 2 or the described method for scanning flash memory of 3 any one, it is characterized in that, described scanning grade comprises: the first scanning grade, the second scanning grade and/or the 3rd scanning grade.
5. method for scanning flash memory according to claim 4 is characterized in that, when selecting the scanning grade to be the first scanning grade, initial good piece and bad block message is as a result of exported.
6. method for scanning flash memory according to claim 4, it is characterized in that, when selecting the scanning grade to be the second scanning grade, select initial good piece middle part paging, to described part page or leaf data writing, and read data from described part page or leaf, and redefined piece and bad piece, the good piece and the bad block message that redefine are exported as scanning result.
7. method for scanning flash memory according to claim 6, it is characterized in that, when selecting the scanning grade to be the second scanning grade, all pages data writing in the initial good piece, read the data in all pages, redefined piece and bad piece, the good piece and the bad block message that redefine have been exported as scanning result.
8. method for scanning flash memory according to claim 4, it is characterized in that, when selecting the scanning grade to be the 3rd scanning grade, all pages data writing in the initial good piece of flash memory, read the data in all pages, determine final good piece and bad piece, will redefine piece and bad block message is exported as scanning result.
9. method for scanning flash memory according to claim 4 is characterized in that, described the second scanning grade and/or the 3rd scanning grade are only carried out data writing and reading out data scanning to initial good piece.
10. according to claim 1 to the described method for scanning flash memory of 3 any one, it is characterized in that, scan in the process, take page or leaf as unit, as long as when having a page or leaf to be judged as bad page or leaf, just stop to scan page or leaf remaining in this piece, this piece is labeled as bad piece.
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| CN101540205B true CN101540205B (en) | 2013-03-27 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103927128A (en) * | 2013-07-11 | 2014-07-16 | 威盛电子股份有限公司 | Data storage device and flash memory control method |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN101562051B (en) * | 2008-04-18 | 2013-05-01 | 深圳市朗科科技股份有限公司 | Flash memory medium scan method |
| CN105975409A (en) * | 2016-04-29 | 2016-09-28 | 深圳市硅格半导体股份有限公司 | NandFlash scanning method and system |
| CN113126916A (en) * | 2021-03-29 | 2021-07-16 | 广州安凯微电子股份有限公司 | Data restoration method and device after abnormal power failure |
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