CN101526570A - Method for automatically testing machine platform - Google Patents
Method for automatically testing machine platform Download PDFInfo
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- CN101526570A CN101526570A CN200810026682A CN200810026682A CN101526570A CN 101526570 A CN101526570 A CN 101526570A CN 200810026682 A CN200810026682 A CN 200810026682A CN 200810026682 A CN200810026682 A CN 200810026682A CN 101526570 A CN101526570 A CN 101526570A
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Abstract
The invention provides a method for automatically testing a machine platform, which is used for testing various machine types of a Dot hill system. The method mainly comprises the following steps: a, beginning testing; b, scanning a part number and a serial number input to the machine platform to be tested; c, judging the machine type according to the part number and calling out corresponding items to be tested; d, inquiring whether each item to be tested has record according to the serial number, and judging the tested items and the non-tested items of the machine platform to be tested; e, if each test item has record, ending the test, and preparing the test for a next machine platform to be tested; and f, if the current test item has no record, testing the non-tested items, judging whether the test is successful, and returning to step a till the test of all non-tested items is ended. The method is not only convenient and quick to test, but also is convenient for a tester to acquire the reason causing test failure.
Description
Technical field
The present invention relates to a kind of method of testing, related in particular to a kind of method for automatically testing machine platform in order to tester table.
Background technology
The test procedure of original Dot hill board to be measured needs the tester manually to import complexity when test and is difficult for the order of memorize, to finish content measurement step by step, and board machine to be measured is various, method of testing and test command at each machine are inequality basically, allowing the tester cause easily obscures, and after test was finished, the log of generation was oversize, was unfavorable for that the tester writes down the reason of test crash.
Summary of the invention
In view of the above problems, the invention provides a kind of method for automatically testing machine platform.
In order to achieve the above object, the present invention has adopted following technical scheme: a kind of method for automatically testing machine platform, and mainly in order to the various machines of test Dot hill system, wherein, this method mainly may further comprise the steps for it:
Step a. begins test;
The item number and the sequence number of step b. scanning input one board to be measured;
Step c is judged machine according to item number, and accesses corresponding project to be tested;
Steps d. whether have record, and judge project that this board to be measured has been tested and the project of not testing according to sequence number if inquiring about each project to be tested;
Step e. then finishes test if each test event all has record, and prepares next board to be measured is tested;
Step f. returns steps d if current test event no record is then tested the project of not test, and judged whether to test successfully, finishes until all project testings of not testing.
Preferable, the invention provides a kind of method for automatically testing machine platform, wherein, also comprise among the described step e:
Step g. if test successfully, then logging test results and demonstration " PASS " finish test;
Step h. then shows " FAIL " and inquires about log as if test crash, with the record failure cause, board to be measured is keeped in repair, and returns step a.
Compared to prior art, method for automatically testing machine platform of the present invention not only can be tested the various machines of Dot hill system quickly and easily, and is convenient to the tester and learns the reason that causes test crash, so that keep in repair.
Description of drawings
Fig. 1 is the present invention's method flow diagram.
Embodiment
Please refer to shown in Figure 1ly, be the present invention's method flow diagram.Method for automatically testing machine platform of the present invention mainly is applicable to the various machines of Dot hill system, various machines in order to test Dot hill system, and the test procedure of the various machines of original Dot hill system is optimized integration, so that the tester finishes content measurement quickly and easily.
Wherein, described method for automatically testing machine platform mainly may further comprise the steps:
Step 101: beginning;
Step 102: the item number (to call PN in the following text) and the sequence number (to call SN in the following text) thereof of scanning input one board to be measured;
Step 103: the PN according to this board to be measured that scans input judges this board to be measured belongs to which machine of Dot hill system, and accesses the corresponding project that needs test according to machine;
Step 104: inquire about each project that need test according to the SN that scans this board to be measured of importing and whether all have record, to judge project that current board to be measured has been tested and the project of not testing;
Step 105: if each project that need test all has record, then this board to be measured is finished test, and prepare next board to be measured is tested;
Step 106: do not have record if work as the project of Pretesting, then the current not project of test is tested, and judge whether to test successfully;
Step 107: if current test event is tested successfully, then logging test results also shows " PASS " printed words;
Step 108: finish test, and prepare next board to be measured is tested;
Step 109: as if test crash, then show " FAIL " printed words and inquire about log, find out the reason of test crash to learn the information of failure;
Step 110: the tester writes down and keeps in repair board to be measured to failure cause;
Step 111: return step 101, finish test until all projects of not testing.
After the above-mentioned steps test, can finish the content measurement of the corresponding machine of board to be measured to each board to be measured easily, reach test purpose.
Claims (2)
1. a method for automatically testing machine platform is characterized in that, this method mainly may further comprise the steps:
Step a. begins test;
The item number and the sequence number of step b. scanning input one board to be measured;
Step c is judged machine according to item number, and accesses corresponding project to be tested;
Steps d. whether have record, and judge project that this board to be measured has been tested and the project of not testing according to sequence number if inquiring about each project to be tested;
Step e. then finishes test if each test event all has record, and prepares next board to be measured is tested;
Step f. returns steps d if current test event no record is then tested the project of not test, and judged whether to test successfully, finishes until all project testings of not testing.
2. method for automatically testing machine platform according to claim 1 is characterized in that, also comprises among the described step f:
Step g. if test successfully, then logging test results and demonstration " PASS " finish test;
Step h. then shows " FAIL " and inquires about log as if test crash, with the record failure cause, board to be measured is keeped in repair, and returns step a.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200810026682A CN101526570A (en) | 2008-03-07 | 2008-03-07 | Method for automatically testing machine platform |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN200810026682A CN101526570A (en) | 2008-03-07 | 2008-03-07 | Method for automatically testing machine platform |
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| CN101526570A true CN101526570A (en) | 2009-09-09 |
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| CN200810026682A Pending CN101526570A (en) | 2008-03-07 | 2008-03-07 | Method for automatically testing machine platform |
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Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102035921A (en) * | 2010-11-17 | 2011-04-27 | 太仓市同维电子有限公司 | Method for preventing missing test or repeating test in mobile phone production |
| CN102455961A (en) * | 2010-10-29 | 2012-05-16 | 鸿富锦精密工业（深圳）有限公司 | System and method for managing and controlling mainboard testing process |
| CN104765663A (en) * | 2014-01-03 | 2015-07-08 | 神讯电脑(昆山)有限公司 | Automatic testing method for appearance detection |
| CN105161439A (en) * | 2015-07-22 | 2015-12-16 | 上海华力微电子有限公司 | Wafer testing management system and method |
| CN105738742A (en) * | 2016-04-06 | 2016-07-06 | 江苏雷特电机股份有限公司 | Reactor on-line detection device |
| CN106771693A (en) * | 2015-11-20 | 2017-05-31 | 神讯电脑(昆山)有限公司 | Aging Auto-Test System and method |
| US9804953B2 (en) | 2014-11-18 | 2017-10-31 | Semiconductor Manufacturing International (Shanghai) Corporation | Method and device for testing semiconductor manufacturing equipment automation program |
| CN107305512A (en) * | 2016-04-21 | 2017-10-31 | 佛山市顺德区顺达电脑厂有限公司 | The method that repeatedly continuous SLT is tested |
| CN107506833A (en) * | 2017-07-21 | 2017-12-22 | 深圳市信维通信股份有限公司 | A kind of method of testing |
| CN107782987A (en) * | 2016-08-24 | 2018-03-09 | 神讯电脑(昆山)有限公司 | The charge function method of testing of board |
| CN109961112A (en) * | 2017-12-22 | 2019-07-02 | 神讯电脑(昆山)有限公司 | The detection method of display panel title |
| CN109960641A (en) * | 2017-12-22 | 2019-07-02 | 神讯电脑(昆山)有限公司 | To the test method of the OS Type of input |
-
2008
- 2008-03-07 CN CN200810026682A patent/CN101526570A/en active Pending
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102455961A (en) * | 2010-10-29 | 2012-05-16 | 鸿富锦精密工业（深圳）有限公司 | System and method for managing and controlling mainboard testing process |
| CN102035921A (en) * | 2010-11-17 | 2011-04-27 | 太仓市同维电子有限公司 | Method for preventing missing test or repeating test in mobile phone production |
| CN104765663A (en) * | 2014-01-03 | 2015-07-08 | 神讯电脑(昆山)有限公司 | Automatic testing method for appearance detection |
| CN104765663B (en) * | 2014-01-03 | 2018-02-27 | 神讯电脑(昆山)有限公司 | Outward appearance detects automatic test approach |
| US9804953B2 (en) | 2014-11-18 | 2017-10-31 | Semiconductor Manufacturing International (Shanghai) Corporation | Method and device for testing semiconductor manufacturing equipment automation program |
| CN105161439A (en) * | 2015-07-22 | 2015-12-16 | 上海华力微电子有限公司 | Wafer testing management system and method |
| CN105161439B (en) * | 2015-07-22 | 2018-06-26 | 上海华力微电子有限公司 | Wafer test manages system and method |
| CN106771693A (en) * | 2015-11-20 | 2017-05-31 | 神讯电脑(昆山)有限公司 | Aging Auto-Test System and method |
| CN105738742A (en) * | 2016-04-06 | 2016-07-06 | 江苏雷特电机股份有限公司 | Reactor on-line detection device |
| CN107305512A (en) * | 2016-04-21 | 2017-10-31 | 佛山市顺德区顺达电脑厂有限公司 | The method that repeatedly continuous SLT is tested |
| CN107305512B (en) * | 2016-04-21 | 2020-12-08 | 佛山市顺德区顺达电脑厂有限公司 | Method for multiple continuous SLT test |
| CN107782987A (en) * | 2016-08-24 | 2018-03-09 | 神讯电脑(昆山)有限公司 | The charge function method of testing of board |
| CN107506833A (en) * | 2017-07-21 | 2017-12-22 | 深圳市信维通信股份有限公司 | A kind of method of testing |
| CN109961112A (en) * | 2017-12-22 | 2019-07-02 | 神讯电脑(昆山)有限公司 | The detection method of display panel title |
| CN109960641A (en) * | 2017-12-22 | 2019-07-02 | 神讯电脑(昆山)有限公司 | To the test method of the OS Type of input |
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Open date: 20090909 |