CN101464575B - Liquid crystal display panel test method - Google Patents
Liquid crystal display panel test method Download PDFInfo
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- CN101464575B CN101464575B CN2009100007673A CN200910000767A CN101464575B CN 101464575 B CN101464575 B CN 101464575B CN 2009100007673 A CN2009100007673 A CN 2009100007673A CN 200910000767 A CN200910000767 A CN 200910000767A CN 101464575 B CN101464575 B CN 101464575B
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- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 12
- 238000010998 test method Methods 0.000 title claims description 11
- 238000012360 testing method Methods 0.000 claims abstract description 67
- 238000005538 encapsulation Methods 0.000 claims abstract description 44
- 230000003068 static effect Effects 0.000 claims abstract description 6
- 239000011159 matrix material Substances 0.000 claims description 10
- 230000008034 disappearance Effects 0.000 claims description 8
- 230000002035 prolonged effect Effects 0.000 claims description 4
- 238000000034 method Methods 0.000 abstract description 6
- 238000010586 diagram Methods 0.000 description 11
- 239000000047 product Substances 0.000 description 9
- 239000000758 substrate Substances 0.000 description 8
- 239000002390 adhesive tape Substances 0.000 description 7
- 230000002950 deficient Effects 0.000 description 5
- 239000000523 sample Substances 0.000 description 4
- 239000004020 conductor Substances 0.000 description 3
- 238000011031 large-scale manufacturing process Methods 0.000 description 3
- 239000012467 final product Substances 0.000 description 2
- 239000012530 fluid Substances 0.000 description 2
- 230000008676 import Effects 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012353 t test Methods 0.000 description 1
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Abstract
The invention provides a liquid crystal display panel which comprises a line electrode, a column electrode, connecting lines, an auxiliary testing electrode and an integrated circuit input electrode; the line electrode is formed on a base plate; the column electrode is formed on the base plate and is perpendicular to the line electrode, wherein, an LCD display area is formed commonly by the line electrode and the column electrode; the connecting lines are arranged between the line electrode and an integrate circuit and between the column electrode and the integrate circuit, wherein, a fully-selected testing area is formed by the line electrode, the column electrode and the connecting lines of the integrate circuit; the auxiliary testing electrode is positioned under the encapsulation area of the integrate circuit and comprises a line auxiliary testing electrode and a column auxiliary testing electrode; and the integrated circuit input electrode is formed on the base plate. The method comprises the following steps: firstly, applying static, square wave or sine wave drive signals to the fully-selected testing area formed by the line electrode, the column electrode and the connecting lines of the integrate circuit and displaying all lattices in the display area, namely fully-displaying test; and secondly, applying static, square wave or sine wave drive signals to a partially-displaying test circuit under the encapsulation area of the integrate circuit and displaying half lattices at intervals in the display area, namely partially-displaying test.
Description
Technical field
The present invention relates to technical field of liquid crystal display, particularly a kind of display panels and method of testing thereof.
Background technology
LCD (LCD) comprises the liquid crystal layer and the outer polarizing layer of two display panels of the dielectric anisotropy between two display panels, two display panels.
The more display panels of current application generally is divided into active display panels and passive-type display panels.Active display panels mainly refers to the film transistor type LCD, and its display unit is by independently transistor controls GTG demonstration.The passive-type display panel mainly realizes that by the row liquid crystal control electrode display unit that is used to select the column electrode of liquid crystal dots and be used to make liquid crystal to deflect that is formed at the mutually insulated on the substrate GTG shows.
The passive-type display panels forms column electrode and row electrode respectively on two display panels, and the row, column electrode extended (utmost point that is connected that forms row, column electrode and integrated circuit) to integrated circuit (IC) encapsulation region respectively, on one side being formed with integrated circuit, the integrated circuit encapsulation region imports electrode with connection signal.Integrated circuit gives the row, column electrode drive signal to obtain specific display pattern by connection electrode during work.
Display panels for high integration, the connecting circuit very dense of row, column electrode and integrated circuit encapsulation region, electrode separation is very little, is generally 10～80 microns, in manufacture course of products, unavoidably can form a spot of inter-electrode short-circuit or the product that opens circuit.
Relatively the method for this class display panels electrical property defective of Chang Yong test is to give integrated circuit encapsulation region or other row, column electrode connection electrode driving voltages by the vertical conduction adhesive tape, tests out the electrical defective of product by driving voltage optionally.Because of the vertical conduction adhesive tape by the conduction of the conductive materials in the adhesive tape, need to guarantee certain clearance between its conductive materials, generally all more than 50 microns, thereby for electrode separation the product below 50 microns can not Validity Test go out all bad.In recent years have and develop the littler vertical conduction bar in conductive materials gap, but because of its cost is too high, the test confidence level is not enough and be not durable, and is difficult to use in the large-scale production of LCD.
Also there is the probe scanning of use to test the instrument of this class display panels electrical property defective; but because of it relies on the scanning of metal probe contact; cause the scuffing of electrode easily; the consumption of probe is very fast simultaneously; cost is higher, test speed is slow; generally only be used for sample testing, be difficult to realize that the scale test of product is to guarantee the zero-fault of product turnout.
Other has the instrument that uses image comparison method test fluid LCD panel electrode defects, this method generally is applicable to the test of single chip liquid crystal display panel, for the display panels behind the one-tenth box, can't test out the defective of inter-electrode short-circuit and integrated circuit encapsulation region electrode.
Summary of the invention
The objective of the invention is to overcome the shortcoming of prior art, a kind of display panels and method of testing thereof of simplifying its test is provided.The testing efficiency and the test confidence level of display panels have greatly been improved, as only needing the electrical property defective that common vertical conduction bar can quick, accurate, undamaged test fluid LCD panel.
Full display panels and the method for testing thereof that shows the test section and the apparent test section of branch is set in the integrated circuit encapsulation region is set on row-column electrode and integrated circuit connecting line.
Column electrode is with the connecting line of integrated circuit, and the row electrode is with the connecting line of integrated circuit, and wherein the row, column electrode partly forms a full test section that shows with the connecting line of integrated circuit,
Be positioned at the subtest electrode of integrated circuit encapsulation region, comprise capable subtest electrode, row subtest electrode,
Be formed at the integrated circuit input electrode on the substrate,
During display panels work, by integrated circuit input electrode input signal, integrated circuit distributes drive signal to give each column electrode and row electrode, forms predetermined display pattern.Predetermined display pattern is the display pattern of determining according to input signal, promptly imports which kind of signal, promptly shows which kind of pattern.Not in scope of the present invention, there is not concrete pattern.
The connection line of column electrode and integrated circuit is drawn from its any end, and extends in the integrated circuit encapsulation region by the layout of less expensive; The connection line of row electrode and integrated circuit is drawn from the nearer side of distance integrated circuit, directly extends in the integrated circuit encapsulation region.
The connecting circuit of row, column electrode and integrated circuit in the integrated circuit encapsulation region width and the gap by the parameter layout of corresponding integrated circuit requirement.
The connection line of row, column electrode and integrated circuit in the integrated circuit encapsulation region, alternately prolong (odd number row, column electrode prolong or even number row, column electrode prolong all can), form subtest circuit (divide and show test circuit).
A kind of display panels method of testing when testing, at first drives all row, column electrodes, secondly, only drives the electrode with prolongation;
Comprise complete show test and the apparent test of branch; Test time-division two steps:
The first step, the row, column electrode is applied static state, square wave or sine wave drive signal with the full test section that shows that the connecting line of integrated circuit partly forms, all row, column of liquid crystal display displays zone promptly are driven, and the viewing area will show all dot matrix (Fig. 2), and promptly complete showing tests.
Second step, branch in the integrated circuit encapsulation region is shown test circuit apply static state, square wave or sine wave drive signal, the row, column electrode in liquid crystal display displays zone is driven at interval by the selectivity part, and the dot matrix Alternation Display (Fig. 3) of viewing area promptly divides to show (half shows) test.
A kind of display panels comprises:
Be formed at the column electrode on the substrate,
Be formed at row electrode vertical with column electrode on the substrate, wherein row-column electrode is formed the viewing area of LCD jointly,
The connection line of column electrode, row electrode and integrated circuit all alternately prolongs in the integrated circuit encapsulation region,
Column electrode is with the connecting line of integrated circuit, and the row electrode is with the connecting line of integrated circuit, and wherein the row, column electrode partly forms a full test section that shows with the connecting line of integrated circuit,
Be positioned at the subtest electrode of integrated circuit encapsulation region, comprise capable subtest electrode, row subtest electrode,
Be formed at the integrated circuit input electrode on the substrate.
Described display panels, by integrated circuit input electrode input signal, integrated circuit distributes drive signal to give each column electrode and row electrode, forms predetermined display pattern.
The connection line of described column electrode and integrated circuit is drawn from its any end, and extends in the integrated circuit encapsulation region by the layout of less expensive; The connection line of row electrode and integrated circuit is drawn from the nearer side of distance integrated circuit, directly extends in the integrated circuit encapsulation region.
The connecting circuit of described row, column electrode and integrated circuit in the integrated circuit encapsulation region width and the gap by the parameter layout of corresponding integrated circuit requirement.
The connection line of described column electrode, row electrode and integrated circuit all alternately prolongs in the integrated circuit encapsulation region, forms the subtest circuit.
Described and connection line integrated circuit alternately is extended for the prolongation of odd number row, column electrode in the integrated circuit encapsulation region or even number row, column electrode prolongs.
In the above-mentioned method of testing, the conducting of extraneous drive signal and panel electrode only needs general vertical conduction adhesive tape or full conducting adhesive tape to be connected to get final product, and test speed is fast, and the reliability height is with low cost, the batch testing of product when being particularly suitable for large-scale production.
Beneficial effect
In the method for testing of the present invention, the conducting of extraneous drive signal and panel electrode only needs general vertical conduction adhesive tape or full conducting adhesive tape to be connected to get final product, and test speed is fast, and the reliability height is with low cost, the batch testing of product when being particularly suitable for large-scale production.
Description of drawings
Fig. 1 is the LCD panel structure chart of first embodiment of the invention;
When being not powering up of first embodiment of the invention, Fig. 2 shows synoptic diagram;
The normal synoptic diagram that shows when Fig. 3 is the full choosing test of first embodiment of the invention;
The row electrode synoptic diagram that opens circuit when Fig. 4 is the full choosing test of first embodiment of the invention;
The column electrode synoptic diagram that opens circuit when Fig. 5 is the full choosing test of first embodiment of the invention;
Row electric pole short circuit synoptic diagram when Fig. 6 is the full choosing test of first embodiment of the invention;
Column electrode short circuit synoptic diagram when Fig. 7 is the full choosing test of first embodiment of the invention;
The normal synoptic diagram that shows when Fig. 8 is the full choosing test of second embodiment of the invention;
The row electrode synoptic diagram that opens circuit when Fig. 9 is the full choosing test of second embodiment of the invention;
The column electrode synoptic diagram that opens circuit when Figure 10 is the full choosing test of second embodiment of the invention;
Row electric pole short circuit synoptic diagram when Figure 11 is the full choosing test of second embodiment of the invention;
Column electrode short circuit synoptic diagram when Figure 12 is the full choosing test of second embodiment of the invention.
Embodiment
In conjunction with the accompanying drawings, for those skilled in the art, above-mentioned and other feature of the present invention will be more clear from the description of follow-up exemplary embodiment, wherein,
The LCD panel construction of Fig. 1 comprises
Be formed at the column electrode 101 on the substrate,
Be formed at row electrode 102 vertical with column electrode on the substrate, wherein row-column electrode is formed the viewing area 100 of LCD jointly,
The connection line of column electrode, row electrode and integrated circuit all alternately prolongs in the integrated circuit encapsulation region,
Column electrode is with the connecting line 201 of integrated circuit, and the row electrode is with the connecting line 202 of integrated circuit, and wherein the row, column electrode partly forms a full test section 203 that shows with the connecting line of integrated circuit
Be positioned at the subtest electrode of integrated circuit encapsulation region 300, comprise capable subtest electrode 301, row subtest electrode 302,
Be formed at the integrated circuit input electrode 401 on the substrate,
Display panels, by integrated circuit input electrode input signal, integrated circuit distributes drive signal to give each column electrode and row electrode, forms predetermined display pattern.
The connecting circuit of row, column electrode 101,102 and integrated circuit in the integrated circuit encapsulation region width and the gap by the parameter layout of corresponding integrated circuit requirement.
The connection line of row, column electrode 101,102 and integrated circuit alternately prolongs in the integrated circuit encapsulation region, forms the subtest circuit.
In the integrated circuit encapsulation region, alternately be extended for prolongation of odd number row, column electrode or the prolongation of even number row, column electrode with the connection line of integrated circuit.
Embodiment one
On panel, form column electrode 101, row electrode 102, the row electrode is connected with integrated circuit encapsulation region 300 design electrodes, the connection line of column electrode and integrated circuit encapsulation region by the viewing area up and down two screens respectively from about cause and be connected, in the integrated circuit encapsulation region, the connecting line of row, column electrode and integrated circuit is prolonged at interval, and the odd number row or column prolongs or the even number row or column prolongs.
Test time-division two steps:
Not during making alive, all dot matrix, promptly the point of crossing of column electrode and row electrode does not all have display pattern, as shown in Figure 2, this figure be for the pattern contrast that demonstration is arranged.
The first step adds alternating voltage to selecting test section 203 entirely, observes under orthogonal polarizers, and the result judges as follows:
All dot matrix, promptly the point of crossing of column electrode and row electrode when all being shown as black pattern, is represented to show normally, does not have electrically bad; As shown in Figure 3.
Certain row electrode does not have demonstration, and when other row electrodes were shown as black, representing that this row electrode has opened circuit, and can be according to the disappearance location determination off position of its display frame; As shown in Figure 4.
Certain column electrode does not have demonstration, and when other column electrodes were shown as black, representing that this column electrode has opened circuit, and can be according to the disappearance location determination off position of its display frame; As shown in Figure 5.
Second step added alternating voltage to the row-column electrode extended line in the integrated circuit encapsulation region, observed under orthogonal polarizers, and the result judges as follows:
If continuous three row or above row electrode are shown as black simultaneously, representing has short circuit between this continuation column electrode, and can judge location of short circuit according to the row electrode present position of continuous demonstration; Shown in Fig. 6.
If triplex row or above column electrode are shown as black simultaneously continuously, representing has short circuit between this continuous column electrode, and can judge location of short circuit according to the column electrode present position of continuous demonstration; As shown in Figure 7.
Whether by above method of testing and step, going out product with regard to decidable has electrical property bad, i.e. short circuit or open circuit.
Embodiment two
On panel, form column electrode 101, row electrode 102, the row electrode is connected with integrated circuit encapsulation region 300 design electrodes, the connection line of the odd-numbered line of column electrode and integrated circuit encapsulation region from the viewing area one side draw, the connection line of even number line and integrated circuit encapsulation region is drawn from the opposite side of viewing area.In the integrated circuit encapsulation region, the connecting line of row electrode and integrated circuit is prolonged at interval (odd-numbered line (row) prolongs or even number line (row) prolongs), the connecting line of column electrode and integrated circuit does not need the interval prolongation.
Test time-division two steps:
The first step adds alternating voltage to selecting test section 203 entirely, observes under orthogonal polarizers, and the result judges as follows:
All dot matrix, promptly the point of crossing of column electrode and row electrode when all being shown as black pattern, is represented to show normally, does not have electrically bad; As shown in Figure 8.
Certain row electrode does not have demonstration, and when other row electrodes were shown as black, representing that this row electrode has opened circuit, and can be according to the disappearance location determination off position of its display frame; As shown in Figure 9.
Certain column electrode does not have demonstration, and when other column electrodes were shown as black, representing that this column electrode has opened circuit, and can be according to the disappearance location determination off position of its display frame; As shown in figure 10.
Second the step, to the row electrode extended line in the integrated circuit encapsulation region and wherein the column electrode extended line of a side add alternating voltage, under orthogonal polarizers, observe, the result judges as follows:
If continuous three row or above row electrode are shown as black simultaneously, representing has short circuit between this continuation column electrode, and can judge location of short circuit according to the row electrode present position of continuous demonstration; As shown in figure 11.
If triplex row or above column electrode are shown as black simultaneously continuously, representing has short circuit between this continuous column electrode, and can judge location of short circuit according to the column electrode present position of continuous demonstration; As shown in figure 12.
Claims (3)
1. a display panels method of testing comprises complete show test and the apparent test of branch; Test time-division two steps:
The first step applies static state, square wave or sine wave drive signal to the row, column electrode with the full test section that shows that the connecting line of integrated circuit partly forms, and all row, column of liquid crystal display displays zone promptly are driven, and the viewing area will show all dot matrix, and promptly complete showing tests;
Second step, the connecting line of row, column electrode in the integrated circuit encapsulation region applied static state, square wave or sine wave drive signal, the row, column electrode in liquid crystal display displays zone is driven at interval by the selectivity part, and the dot matrix Alternation Display of viewing area promptly divides to show test.
2. display panels method of testing according to claim 1, it is characterized in that, on panel, form column electrode (101), row electrode (102), the electrode that row electrode and integrated circuit encapsulation region (300) is interior is connected, the connecting line of column electrode and integrated circuit by the viewing area up and down two screens respectively from about draw and be connected, in the integrated circuit encapsulation region, the connecting line of row, column electrode and integrated circuit is prolonged at interval, odd number row or column electrode prolongs, and perhaps even number row or column electrode prolongs;
Test time-division two steps:
Not during making alive, all dot matrix, promptly the point of crossing of column electrode and row electrode does not all have display pattern,
The first step adds alternating voltage to the full test section (203) that shows, and observes under orthogonal polarizers, and the result judges as follows:
All dot matrix, promptly the point of crossing of column electrode and row electrode when all being shown as black pattern, is represented to show normally, does not have electrically bad;
Certain row electrode does not have demonstration, and when other row electrodes were shown as black, representing that this row electrode has opened circuit, and can be according to the disappearance location determination off position of its display frame;
Certain column electrode does not have demonstration, and when other column electrodes were shown as black, representing that this column electrode has opened circuit, and can be according to the disappearance location determination off position of its display frame;
Second step added alternating voltage to the row, column electrode extended line in the integrated circuit encapsulation region, observed under orthogonal polarizers, and the result judges as follows:
If continuous three row or above row electrode are shown as black simultaneously, representing has short circuit between this continuation column electrode, and can judge location of short circuit according to the row electrode present position of continuous demonstration;
If triplex row or above column electrode are shown as black simultaneously continuously, representing has short circuit between this continuous column electrode, and can judge location of short circuit according to the column electrode present position of continuous demonstration;
Whether by above method of testing and step, going out product with regard to decidable has electrical property bad, i.e. short circuit or open circuit.
3. display panels method of testing according to claim 1, it is characterized in that, on panel, form column electrode (101), row electrode (102), the electrode that row electrode and integrated circuit encapsulation region (300) is interior is connected, the odd-numbered line of column electrode and the connecting line of integrated circuit from the viewing area one side draw, the connecting line of even number line and integrated circuit is drawn from the opposite side of viewing area; In the integrated circuit encapsulation region, the connecting line of row electrode and integrated circuit is prolonged at interval, odd column prolongs or even column prolongs, and the connecting line of column electrode and integrated circuit is not done prolongation at interval;
Test time-division two steps:
The first step adds alternating voltage to the full test section (203) that shows, and observes under orthogonal polarizers, and the result judges as follows:
All dot matrix, promptly the point of crossing of column electrode and row electrode when all being shown as black pattern, is represented to show normally, does not have electrically bad;
Certain row electrode does not have demonstration, and when other row electrodes were shown as black, representing that this row electrode has opened circuit, and can be according to the disappearance location determination off position of its display frame;
Certain column electrode does not have demonstration, and when other column electrodes were shown as black, representing that this column electrode has opened circuit, and can be according to the disappearance location determination off position of its display frame;
Second the step, to the row electrode extended line in the integrated circuit encapsulation region and wherein the column electrode of a side add alternating voltage, under orthogonal polarizers, observe, the result judges as follows:
If continuous three row or above row electrode are shown as black simultaneously, representing has short circuit between this continuation column electrode, and can judge location of short circuit according to the row electrode present position of continuous demonstration;
If triplex row or above column electrode are shown as black simultaneously continuously, representing has short circuit between this continuous column electrode, and can judge location of short circuit according to the column electrode present position of continuous demonstration.
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| CN2009100007673A CN101464575B (en) | 2009-01-12 | 2009-01-12 | Liquid crystal display panel test method |
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| CN2009100007673A CN101464575B (en) | 2009-01-12 | 2009-01-12 | Liquid crystal display panel test method |
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| CN104820134A (en) * | 2015-04-29 | 2015-08-05 | 业成光电（深圳）有限公司 | Line detection device and method and applied line thereof |
| CN105093757B (en) * | 2015-09-02 | 2018-03-30 | 京东方科技集团股份有限公司 | A kind of display panel and preparation method thereof, display device |
| US10180745B2 (en) | 2015-12-25 | 2019-01-15 | Shanghai Avic Optoelectronics Co., Ltd. | Display panel and display device with narrow bezel |
| CN105607360B (en) * | 2015-12-25 | 2019-07-05 | 上海中航光电子有限公司 | A kind of display panel and display device |
| CN107068046A (en) * | 2017-04-19 | 2017-08-18 | 京东方科技集团股份有限公司 | Display panel and display device |
| CN107144710B (en) * | 2017-06-27 | 2019-08-27 | 深圳市宇顺工业智能科技有限公司 | A kind of PCB test board cabling of liquid crystal display pin |
| CN112526791A (en) * | 2020-11-09 | 2021-03-19 | 信利（惠州）智能显示有限公司 | Display panel and display device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN201335927Y (en) * | 2009-01-12 | 2009-10-28 | 深圳市宇顺电子股份有限公司 | Liquid crystal display device |
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| CN201335927Y (en) * | 2009-01-12 | 2009-10-28 | 深圳市宇顺电子股份有限公司 | Liquid crystal display device |
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