CN101435765A - Method for tracing wave length value to natural reference of spectrum analyzer for measuring - Google Patents
Method for tracing wave length value to natural reference of spectrum analyzer for measuring Download PDFInfo
- Publication number
- CN101435765A CN101435765A CNA2008100728812A CN200810072881A CN101435765A CN 101435765 A CN101435765 A CN 101435765A CN A2008100728812 A CNA2008100728812 A CN A2008100728812A CN 200810072881 A CN200810072881 A CN 200810072881A CN 101435765 A CN101435765 A CN 101435765A
- Authority
- CN
- China
- Prior art keywords
- spectrum
- element lamp
- ordinate
- spectrum analyzer
- tracing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Spectrometry And Color Measurement (AREA)
Abstract
The invention discloses a method for tracing wavelength value of a spectrum analyzer used for measurement to a natural benchmark. The method comprises the following steps: a replaceable element lamp is arranged in a spectrum analyzer; the element lamp is turned on; a spectrum scanning device in a spectrometer scans the full-frequency spectrum of radiation light of the element lamp and inputs a light intensity signal into a computer; full-frequency spectrograms obtained after scanning is over are simultaneously displayed on a spectrum display screen with an abscissa and an ordinate, wherein the abscissa represents the measurement unit (nanometer) of wavelength, and the ordinate represents light radiation intensity; 1 to 7 peak value points with high peak values and clear resolution are selected from atomic characteristic peaks of the full-frequency spectrograms on the display screen; the selected points are positioned in a tracing spectrum range between 200 and 900 nanometers on the abscissa; by taking the points as reference points, the spectrum analyzer is adjusted so as to enable measurement coordinates thereof to approach the positions of the reference points; and then the wavelength value of the spectrum analyzer can be calibrated and traced to the natural benchmark.
Description
Technical field
The invention belongs to the scaling method of spectroanalysis instrument wavelength value, especially for the method for the tracing wave length value to natural reference of spectrum analyzer that measures.
Background technology
Spectral instrument is the instrument that material is carried out qualitative and quantitative analysis according to the characteristic spectrum of material.At present, the vertification regulation of China's spectrometric instrument is the accuracy that defines spectrometric instrument by the accuracy of measuring this instrument emission spectrum.Existing vertification regulation is examined and determine spectrometric instrument spectral line accuracy with interference filter.Along with this very fast development of spectroanalysis instrument device in several years, various spectrometric instruments have become the main means of physico-chemical analysis, measurement standard interference filter as spectrometric instrument more and more can not adapt to the requirement of examining and determine spectrometric instrument, the problem that mainly has the following aspects: first, the interference filter measuring accuracy can not satisfy the technical indicator of modern spectrometric instrument needs calibration, because its spectral bandwidth is too big, as the band merit (2nm following) of its band merit of standard (6-8nm) no more than many tested spectrometric instruments, the basic width of occurring in nature atomic spectral line is 0.001nm.The second, interference filter measurement range and applicability can not satisfy the needs of novel spectrometric instrument, the spectrometric instrument that exploitation is now used, light channel structure changes various, its data acquisition and the mode that reads adapt to light channel structure, also more convenient, interference filter just can't adapt to its variation, and is just lack scope for their abilities.Three, do not read luminous energy when analytical instrument, when directly providing whole level such as the concentration of material or the content of material index, various optical filters all can be ineffective; Because the processor of instrument is not read the power and optical transmission ratio of light, even optical filter is put into by the light path of test examination instrument, instrument can not be discerned this variation, makes optical filter finally can not satisfy the needs of calibration operation.And also there is the big problem of error in the transmission of quantity value with the spectral line accuracy of interference filter calibrating spectroanalysis instrument.
Summary of the invention
The object of the present invention is to provide a kind of method of the tracing wave length value to natural reference of spectrum analyzer that is used to measure, not only can reduce the error in the transmission of quantity value, and can improve the accuracy of measuring of spectroanalysis instrument wavelength greatly.
The object of the present invention is achieved like this: a kind of method of the tracing wave length value to natural reference of spectrum analyzer that is used to measure, removable element lamp is housed in spectroanalysis instrument, the open element lamp, scan and light intensity signal is imported in the computing machine by the radiant light full range spectrum of the spectral scan device in the spectrometer element lamp, the full range spectrogram that obtains behind the end of scan be simultaneously displayed on have horizontal stroke, on the spectrum display screen of ordinate, wherein horizontal ordinate is represented the measurement unit nm of wavelength, and ordinate is represented light radiation intensity; Select the peak value height the atomic features peak of the full range spectrogram from display screen, differentiate 1-7 peak points clearly, these points of choosing are positioned at the frequency spectrum 200nm-900nm scope of tracing to the source on the horizontal ordinate, with these the point as reference point, adjust spectroanalysis instrument by computing machine and make its metering coordinate, can demarcate and make it to be traceable to natural reference the wavelength value of spectroanalysis instrument near said reference point locations.
Method of the present invention has creatively proposed with the spectral line of element lamp spectroanalysis instrument to be carried out the demarcation of wavelength exact value, the computer program of spectroanalysis instrument inside is remembered atomic spectral line in machine, and, carry out the comparison of spectrum value with the spectral class instrument that uses in the atomic spectral line calibration operation accurately.The spectral line of atomic lamp is the basic physical unit of occurring in nature, the wavelength measurement unit of spectroanalysis instrument has been traceable to basic physical unit, can save and measure the middle-of-chain link of tracing to the source, it directly has been traceable to natural reference, this method reduced trace to the source and transmission of quantity value in error, improved the accuracy of measuring of spectroanalysis instrument wavelength value greatly.Method of the present invention has changed widely used traditional calibration method and mindset in present stage China's metering field, is the once innovation that the spectroanalysis instrument spectral line is determined means, has outstanding creativeness.
Embodiment
Embodiment 1: a kind of method of the tracing wave length value to natural reference of spectrum analyzer that is used to measure, and Mercury element lamp or sodium element lamp are housed in spectroanalysis instrument or use other element lamp instead, element lamp is in order to provide atomic spectral line.Open this element lamp, scan and light intensity signal is imported in the computing machine by the grating in the spectrometer or prism monochromator radiant light full range spectrum element lamp, the full range spectrogram that obtains behind the end of scan be simultaneously displayed on have horizontal stroke, on the spectrum display screen of ordinate, wherein horizontal ordinate is represented the measurement unit nm of wavelength, and ordinate is represented light radiation intensity.Select the peak value height the atomic features peak of the full range spectrogram from display screen, differentiate 3 peak points clearly, these points of choosing are positioned at the frequency spectrum 200nm-900nm scope of tracing to the source on the horizontal ordinate, as reference point, the stop position of adjusting in the spectroanalysis instrument by computing machine makes it near said reference point with these points.Promptly adopt the numerical value approach method to approach standard value gradually by computer program, the raster coordinate that makes spectroanalysis instrument is near said reference point locations.From handbook, check in the characteristic peak standard value of atom then, can demarcate and make it the wavelength value of spectroanalysis instrument near natural reference-atomic spectral line.Spectral scan in the above-mentioned steps can be carried out repeatedly, till can reaching the condition of demarcating wavelength value satisfactorily.
Embodiment 2: a kind of method of the tracing wave length value to natural reference of spectrum analyzer that is used to measure, making the luminous energy receptacle by the CCD charge-coupled device in the spectrometer scans and light intensity signal is imported in the computing machine the radiant light full range spectrum of element lamp, the full range spectrogram that obtains behind the end of scan be simultaneously displayed on have horizontal stroke, on the spectrum display screen of ordinate, the wavelength value of spectrum is evenly distributed between the video beam coordinate position of CCD, wherein horizontal ordinate is represented the measurement unit nm of wavelength, and ordinate is represented light radiation intensity; Select the peak value height the atomic features peak of the full range spectrogram from display screen, differentiate 7 peak points clearly, these points of choosing are positioned at the frequency spectrum 200nm-900nm scope of tracing to the source on the horizontal ordinate, with these the point as reference point, adjust the video beam coordinate of CCD by computing machine, adopt the numerical value approach method to approach standard value gradually by computer program, the CCD video beam coordinate that makes spectroanalysis instrument is near said reference point locations.The characteristic peak standard value of atom can be found in relevant handbook.Can demarcate and make it the wavelength value of spectroanalysis instrument near natural reference-atomic spectral line.
Claims (3)
1, a kind of method of the tracing wave length value to natural reference of spectrum analyzer that is used to measure, it is characterized in that in spectroanalysis instrument, being equipped with removable element lamp, the open element lamp, scan and light intensity signal is imported in the computing machine by the radiant light full range spectrum of the spectral scan device in the spectrometer element lamp, the full range spectrogram that obtains behind the end of scan be simultaneously displayed on have horizontal stroke, on the spectrum display screen of ordinate, wherein horizontal ordinate is represented the measurement unit nm of wavelength, and ordinate is represented light radiation intensity; Select the peak value height the atomic features peak of the full range spectrogram from display screen, differentiate 1-7 peak points clearly, these points of choosing are positioned at the frequency spectrum 200nm-900nm scope of tracing to the source on the horizontal ordinate, with these the point as reference point, adjust spectroanalysis instrument by computing machine and make its metering coordinate, can demarcate and make it to be traceable to natural reference the wavelength value of spectroanalysis instrument near said reference point locations.
2, method according to claim 1 is characterized in that: said element lamp is Mercury element lamp or sodium element lamp.
3, method according to claim 1 is characterized in that: said spectral scan device is grating or prism monochromator or CCD charge-coupled device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2008100728812A CN101435765A (en) | 2008-05-20 | 2008-05-20 | Method for tracing wave length value to natural reference of spectrum analyzer for measuring |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2008100728812A CN101435765A (en) | 2008-05-20 | 2008-05-20 | Method for tracing wave length value to natural reference of spectrum analyzer for measuring |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101435765A true CN101435765A (en) | 2009-05-20 |
Family
ID=40710315
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNA2008100728812A Pending CN101435765A (en) | 2008-05-20 | 2008-05-20 | Method for tracing wave length value to natural reference of spectrum analyzer for measuring |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101435765A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111912815A (en) * | 2019-12-20 | 2020-11-10 | 南开大学 | Near infrared spectrum analysis method for evaluating quality of oil crops |
-
2008
- 2008-05-20 CN CNA2008100728812A patent/CN101435765A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111912815A (en) * | 2019-12-20 | 2020-11-10 | 南开大学 | Near infrared spectrum analysis method for evaluating quality of oil crops |
| CN111912815B (en) * | 2019-12-20 | 2023-03-14 | 南开大学 | Near infrared spectrum analysis method for evaluating quality of oil crops |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Hutsebaut et al. | Evaluation of an accurate calibration and spectral standardization procedure for Raman spectroscopy | |
| US9194797B2 (en) | Method and system for detecting moisture in a process gas involving cross interference | |
| CN101408503B (en) | Method for automatically detecting and dynamically substracting stray light of spectrometer and spectrometer | |
| CN103245414B (en) | Cross-spectral calibrating device and method for monochromator and imaging spectrometer | |
| CN107748142A (en) | A kind of dual-beam based on miniature beam-splitting optical system becomes light path sample spectra analytical equipment | |
| CN106770058A (en) | The quick special purpose device and its application method of the soil nitrate-N based on infrared spectrum | |
| CN101819140A (en) | Continuous monitoring device and method of gaseous elemental mercury concentration | |
| CN103175822A (en) | Method for eliminating table difference of Raman spectrometer | |
| CN106596499A (en) | Real-time Raman spectrum calibration method | |
| CN103900977A (en) | Full-spectrum detector for rapidly detecting foods and detection method of detector | |
| CN111965140A (en) | Wavelength point recombination method based on characteristic peak | |
| CN101813519B (en) | Stray light correction method of spectrograph | |
| CN202110132U (en) | Self calibrating device of accuracy of ultraviolet-visible light-near infrared wavelength coverage spectral line | |
| CN101435765A (en) | Method for tracing wave length value to natural reference of spectrum analyzer for measuring | |
| CN102023135A (en) | Method for analyzing slanting peak locating spectrum | |
| CN107462525A (en) | A kind of spectral signature parameter method of testing of linear variable filter | |
| CN111380838A (en) | Handheld device for in-situ determination of soil nitrate nitrogen and detection method thereof | |
| CN102262055B (en) | Method for measuring residual quantity of acrylamide monomer in polyacrylamide substances | |
| CN101403687B (en) | Method for detecting infrared spectrometer stability based on monocrystaline silicon piece | |
| CN102980877B (en) | Internal standard method used in measuring conventional elements easy to form hydrides through atomic fluorescence | |
| CN103398966A (en) | Method for detecting TMC concentration in organic solution by using spectrometer | |
| CN202710470U (en) | Array type semiconductor laser unit near infrared spectroscopy analysis meter | |
| CN110487404A (en) | A method of eliminating grating spectrograph Advanced Diffraction influences | |
| JPS60205336A (en) | System for removing and processing interference spectrum of mixed material in spectrochemical analyzing apparatus | |
| CN216525301U (en) | Tea leaf detection equipment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C12 | Rejection of a patent application after its publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20090520 |