Summary of the invention
In view of the foregoing, the technical problem to be solved in the present invention provides the method for testing of a kind of MBMS UE error rate under high-speed motion state.
The method of testing of a kind of MBMS UE error rate under high-speed motion state may further comprise the steps:
Test environment parameter and frequency are set;
Using system simulator, noise source and UE set up test link;
Set up and call out connection, and make dut terminal enter test pattern, wherein, described test pattern is loopback mode or Ack/Nack test pattern;
It is high-speed motion state that reduction emulator is set; And
Measure the error rate of the professional respective channels of MBMS;
Wherein, described reduction emulator is exported to a synthesizer with the signal of system simulator output, and the noise that described noise source produces also inputs to this synthesizer, again by exporting to dut terminal behind the synthesizer synthetic a tunnel.。
Wherein, described calling step of connecting also comprises the parameters that calling is set, and described parameters need be followed the requirement of required test channel, at the corresponding spreading rate of corresponding pattern, selects corresponding transmission rate.
Wherein, be fdd mode as transmission mode, then described test pattern is made as the loopback test pattern; If tdd mode, then described test pattern is made as loopback test pattern or Ack/Nack test pattern.
Wherein, the professional respective channels of described MBMS is MCCH channel or MTCH channel.
According to method provided by the present invention, can record the error rate of MBMS UE under high-speed motion state, thereby make Terminal Design manufacturer can optimize the performance of terminal according to bit error rate information accurately.
Other features and advantages of the present invention will be set forth in the following description, and, partly from specification, become apparent, perhaps understand by implementing the present invention.Purpose of the present invention and other advantages can realize and obtain by specifically noted structure in the specification of being write, claims and accompanying drawing.
Embodiment
Below in conjunction with accompanying drawing the preferred embodiments of the present invention are described, should be appreciated that preferred embodiment described herein only is used for description and interpretation the present invention, and be not used in qualification the present invention.
UE may further comprise the steps in the method for testing of the high-speed motion state error rate under a kind of tdd mode:
1. test environment parameter and frequency are set.
The test environment parameter here comprises temperature and voltage etc.When testing under following temperature conditions, UE should be in normal operating conditions:
General temperature conditions is :+15 ℃ to+35 ℃ (relative humidity is 25% to 75%)
Special temperature conditions is :-10 ℃ to+55 ℃.
That is to say that in the ordinary course of things, the temperature conditions of terminal test is+15 ℃ to+35 ℃.If need the performance of test terminal under specific condition, the scope that temperature then should be set is-10 ℃ to+55 ℃.So test sometimes only needs to carry out when low temperature (10 ℃) and high temperature (+55 ℃).
More than be general temperature setting, UE test needs the temperature conditions that satisfies to be as the criterion with the standard of different areas and different operator under some special environment.
For the alternating voltage in when test, each manufacturer all should be when UE dispatches from the factory regulation ceiling voltage (H) and minimum voltage (L), the extreme voltage when shutting down in addition.Voltage setting in the test should not overshoot value.
For the cell voltage condition, each manufacturer all should be when UE dispatches from the factory regulation ceiling voltage, minimum voltage, nominal voltage and overcurrent protection voltage.Battery for other special occasions uses or special purpose should be followed its distinctive regulation.
The frequency range of test is as follows:
1) fdd mode frequency band range such as following table:
2) the tdd mode frequency band range is as follows:
A) 1900-1920MHz: uplink and downlink transmission
2010-2025MHz uplink and downlink transmission
B) 1850-1910MHz: uplink and downlink transmission
1930-1990MHz: uplink and downlink transmission
C) 1910-1930MHz: uplink and downlink transmission
D) 2570-2620MHz: uplink and downlink transmission
2. set up test link.
Referring to Fig. 1, in the present embodiment, using system simulator, reduction emulator, synthesizer, noise source and UE make up test link.
Base station in the system simulator analog communication links, the noise that produces in the noise source analog communication channel (for the noise that produces at random), synthesizer be self damping simulator and synthesize a tunnel from the two-way input of noise source and export to UE in the future.Transmission signals is after the output of system simulator transmitting terminal, export through reduction emulator, output signal enters synthesizer with the noise signal of noise source simulation, synthesize one the tunnel through synthesizer and export to UE, send to the receiving terminal of system simulator after the UE output, signal sends from the transmitting terminal of system simulator again then, forms the loopback of signal with this.
3. set up and call out, and the parameters of calling is set.
Set up when calling out and to follow general call setup flow process.The parameter setting of each device in the link should be followed the requirement of various test channel, according to the requirement of every kind of different channels corresponding transmitted data rates is set.3G is divided into FDD (Frequency Division Duplexing (FDD)) and TDD (time division duplex) pattern on the whole:
1) to fdd mode, general spreading rate is 3.84Mcps, and the speed setting of respective channel should be 12.2kbit/s, 64kbit/s, and 144kbit/s, 384kbit/s, and draw measured value under each speed.
2), three kinds of spreading rate: 1.28Mcps are arranged, 3.84Mcps, 7.68Mcps to tdd mode
When spreading rate was 1.28Mcps or 3.84Mcps, the speed setting of respective channel should be 12.2kbit/s, 64kbit/s, and 144kbit/s, 384kbit/s, and draw measured value under each speed.
When spreading rate was 7.68Mcps, the speed setting of respective channel should be 12.2kbit/s, and drew the measured value under this speed.
The UE initial condition should be arranged on general radio frequency testing state, and test should be inserted among the UE with usim card (or claiming subscriber identification module or mobile phone card).
4. for UE test pattern is set and makes UE enter this pattern work.
If the test under the fdd mode, test pattern should be made as the loopback test pattern and begin the test of loopback test call by pattern; If the test under the tdd mode, then test pattern should be set to loopback test pattern or Ack/Nack (replying/non-replying) test pattern.
The loopback test pattern helps the diagnostic test of device or equipment.Under the loopback test pattern, the signal that transceiver will transmit through network or one section particular link postbacks an other end that send equipment by an end foldback of transceiver.To compare from the signal at two ends.Difference between the two helps the tracking of fault.
When being operated in ACK/NACK test pattern following time, after the recipient correctly receives data, can send ACK information to transmit leg by corresponding channel, otherwise send nack message, be convenient to transmit leg like this and accurately and timely understand and whether need to retransmit.
5. it is high-speed motion state that reduction emulator is set.
The attenuation type of reduction emulator analog communication channel, its effect are the frequencies that changes input signal according to the movement velocity of terminal, with variation (decay) state that simulates transmission signals under the high-speed motion state.The movement velocity that is input as UE of reduction emulator is output as the signal after the decay.Path attenuation has its special attribute with the decay difference of UE in other situations under high-speed motion state.The model attributes of high-speed motion state is described below:
The difference of high-speed motion state and other communication channels mainly is the variation of signal spectrum in the high speed.Formula (1) is followed in the skew of frequency spectrum, and is as follows:
f
s(t)=f
dCos θ (t) formula (1)
F wherein
s(t) be Doppler frequency shift; f
dBe maximum doppler frequency; Shown in the maximum following formula of Doppler frequency displacement (2):
Formula (2)
Wherein, c is the light velocity, and unit is a meter per second, and v is the movement velocity of UE, and unit is a meter per second; f
cBe frequency input signal.θ (t) can be expressed as by following formula (3):
Formula (3)
Wherein, D
s/ 2 expression terminals are with the initial distance of base station, and unit is a rice; D
MinBe the air line distance between base station and the terminal, unit is a rice; T is running time, and unit is second.
Illustrate the situation of change of frequency spectrum below.Be provided with the parameter of above-mentioned two formula as follows:
Parameter |
Value |
D
s |
300m |
D
min |
2m |
v |
300km/h |
The scope that draws Doppler frequency shift thus for (600Hz ,+600Hz).
6. measure the error rate of MBMS respective channels.
The channel of MBMS correspondence comprises: control channel (MCCH), transmission channel (MTCH).Select channel wherein and test its error rate.