CN102724000A - Occupied bandwidth test system and method - Google Patents

Abstract

The invention discloses an occupied bandwidth test system and a method, and the system comprises a power calculation device, a parameter setting device and a tested device. The power calculation device includes a power calculation module for calculating, according to parameters set by the parameter setting device, the power of input signals from the tested device and the frequency point of occupied bandwidth of the input signals; and a parameter feedback module for feeding back the power and the frequency point to the parameter setting device. The parameter setting device includes a parameter setting module for adjusting set parameters according to the power and the frequency point, and sending the adjusted parameters to the power calculating module; and an occupied bandwidth test module for calculating the occupied bandwidth of the input signals according to the power and the frequency point. The occupied bandwidth test system has advantages of wide test bandwidth, high test precision and short scanning time. In addition, the test system can be implemented by modifying test software without changing hardware structure of a conventional spectrum analyzer, thus having strong commonality.

Description

Occupied bandwidth test macro and method

Technical field

The present invention relates to the communications field, in particular to a kind of occupied bandwidth test macro and method.

Background technology

Along with development of wireless communication devices, the more and more data demand causes the bandwidth of signal of communication constantly to increase.Adopted carrier aggregation technology in the LTE-A standard, signal bandwidth can be extended to 100MHz, and the scan width of testing big bandwidth signal occupied bandwidth can become very big.

For the spectrum analyzer of memory limited, number of scan points is limited.When scanning mode, local oscillator scans between 2 frequencies, and under sweep time (Sweep Time) certain situation, the distance between these 2 frequencies is to be confirmed by scan width (SPAN).Resolution bandwidth (Resolution Band Width abbreviates RBW as) is decided by the bandwidth of the intermediate-frequency filter of tester, and it has determined the ability of spectrum analyzer resoluting signal.

For spectrum analyzer; Resolution bandwidth is more little good more; Because can tell 2 frequencies very near signal of being separated by so better; But in fact the size of resolution bandwidth has directly influenced the length of sweep time, then directly determines sweep time spectrum analyzer to accomplish the used time of test 1 time.

Do not considering under the level and smooth situation of video; Be video bandwidth than under the roomy situation of resolution belt; The sweep time of spectrum analyzer is always relevant with resolution bandwidth (RBW), and in spectrum analyzer, intermediate-frequency filter is type of employing Gaussian filter generally; Usually adopt about 4 grades simultaneous tuning filter to realize the intermediate-frequency filter of frequency response in the spectrum analyzer, therefore can be similar to the intermediate-frequency filter that comes the analysis spectrum analyzer with the characteristic of Gaussian filter near Gaussian filter.

The sweep time of spectrum analyzer, scan width, resolution bandwidth, video bandwidth are interactional; For fear of introducing test error; These parameters (coupling) are provided with certain mode " association " each other during operate as normal; Promptly as long as change wherein any one, all the other parameters all can change according to above formula thereupon automatically.In the spectrum analyzer of reality, can be provided with automatically sweep time, also can manually be provided with, if the user has selected be automatic (auto) pattern sweep time, spectrum analyzer will be set to minimum value automatically sweep time so.

Under certain scan width (SPAN), resolution bandwidth (RBW) is narrow more, and the sweep time that needs is long more.For example, under the situation of SPAN=1MHz, RBW=100Hz, be at least 100s the sweep time that needs.In order to shorten sweep time, just need reduce scan width (SPAN).

But, in the correlation technique, can't satisfy the demand of scan width and resolution bandwidth simultaneously, thereby sweep time is longer.

Summary of the invention

Thereby propose the present invention to demand long problem sweep time that can't satisfy scan width and resolution bandwidth in the correlation technique simultaneously, for this reason, main purpose of the present invention is to provide a kind of occupied bandwidth test macro and method, to address the above problem.

To achieve these goals, according to an aspect of the present invention, a kind of occupied bandwidth test macro is provided.

Occupied bandwidth test macro according to the present invention comprises output computation device, parameter setting apparatus and equipment under test; Wherein, Output computation device comprises: power computation module; Be used for the parameter according to the parameter setting apparatus setting, calculating is from the power of the input signal of equipment under test and the frequency of input signal occupied bandwidth; The parameter feedback module is used for to parameter setting apparatus feedback power and frequency; Parameter setting apparatus comprises: parameter setting module, be used for according to power and frequency, and the parameter that adjustment is set, and send to power computation module; The occupied bandwidth test module is used for according to power and frequency, calculates the occupied bandwidth of input signal.

Further, parameter setting module comprises: the first adjustment submodule, be used for according to power and frequency, and adjustment is used for the parameter of the bigness scale examination of occupied bandwidth test, and will test the frequency range segmentation; The second adjustment submodule is used for according to power and frequency, and adjustment is used for the parameter of the accurate measurement examination of occupied bandwidth test; Send submodule, be used for the parameter of bigness scale examination and the parameter of accurate measurement examination are alternately sent to power computation module.

Further; The first adjustment submodule is according to following mode; Adjustment is used for the parameter of the bigness scale examination of occupied bandwidth test: fr11=fr21; Fr12=fr22, N1＞1, wherein fr11 is that output low frequency section initial frequency, fr12 are that the output low frequency section stops frequency, fr21 is that output high band initial frequency, fr22 are that the output high band stops frequency, N1 is the output frequency segments.

Further, the second adjustment submodule is according to following mode, and adjustment is used for the parameter of the accurate measurement examination of occupied bandwidth test:

Wherein, f _R11Be input low-frequency range initial frequency, f _R12Be that the input low-frequency range stops frequency, m _R1Be the useless power proportions of input low-frequency range, m _R2Be that the useless power proportions of input high band, Nc are incoming frequency segments, P ₁～P _NBe each frequency band power of input, f ₁Be low frequency, the f of input occupied bandwidth ₂Be high frequency points, the m of input occupied bandwidth _P1Be the useless power proportions of output low frequency section, m _P2Be the useless power proportions of output high band, f _P11Be output low frequency section initial frequency, f _P12Be that the output low frequency section stops frequency, f _P21Be output high band initial frequency, f _P22Be that the output high band stops frequency, N ₂It is the output frequency segments.

Further, the measurement result the n time measurement is BW _RBW1, f _R11, f _R12, f _R21, f _R22, N ₁, m _R1, m _R2Situation under, the measurement result of measuring for the n+1 time is: BW _RBW2, f _P11, f _P12, f _P21, f _P22, N ₂, m _P1, m _P2,

Wherein, BW _RBW1Be input resolution bandwidth, the f of the n time measurement _R11Be input low-frequency range initial frequency, the f of the n time measurement _R12The input low-frequency range that is the n time measurement stops frequency, f _R21Be input high band initial frequency, the f of the n time measurement _R22The input high band that is the n time measurement stops frequency, N ₁Be incoming frequency segments, the m of the n time measurement _R1Be the useless power proportions of input low-frequency range, the m of the n time measurement _R2Be the useless power proportions of input high band, the BW of the n time measurement _RBW2Be input resolution bandwidth, the f of the n+1 time measurement _P11Be input low-frequency range initial frequency, the f of the n+1 time measurement _P12The input low-frequency range that is the n+1 time measurement stops frequency, f _P21Be input high band initial frequency, the f of the n+1 time measurement _P22The input high band that is the n+1 time measurement stops frequency, N ₂Be incoming frequency segments, the m of the n+1 time measurement _P1Be the useless power proportions of input low-frequency range, the m of the n+1 time measurement _P2It is the useless power proportions of input high band of the n+1 time measurement.

Further, the segmented mode of incoming frequency is comprised one of following: linear segmented mode, non-linear segmented mode.

Further, the resolution bandwidth of accurate measurement examination is less than the resolution bandwidth of bigness scale examination.

Further, sending submodule also is used for the parameter of bigness scale examination is sent to the second adjustment submodule.

Further, relation below the parameter of parameter feedback module feedback satisfies:

Wherein, N is incoming frequency segments, BW _RBWBe input resolution bandwidth, f ₁₁Be input low-frequency range initial frequency, f ₁₂Be that the input low-frequency range stops frequency, f ₂₁Be input high band initial frequency, f ₂₂Be that the input high band stops frequency, m ₁Be the useless power proportions of input low-frequency range, m ₂Be the useless power proportions of input high band, f ₁Be low frequency point, the f of output occupied bandwidth ₂Be high-frequency point, the P of output occupied bandwidth ₁～P _NBe that each frequency band power of output, Nc are the output frequency segments.

To achieve these goals, according to another aspect of the present invention, a kind of occupied bandwidth method of testing is provided.

Occupied bandwidth method of testing according to the present invention comprises: the parameter that the power computation module in the output computation device is set according to parameter setting apparatus, and calculating is from the power of the input signal of equipment under test and the frequency of input signal occupied bandwidth; Parameter feedback module in the output computation device is to parameter setting apparatus feedback power and frequency; Parameter setting module in the parameter setting apparatus is adjusted the parameter of setting, and is sent to power computation module according to power and frequency; Occupied bandwidth test module in the parameter setting apparatus calculates the occupied bandwidth of input signal according to power and frequency.

Further; Parameter setting module in the parameter setting apparatus is according to power and frequency; The parameter that adjustment is set, and send to power computation module and comprise: the adjustment of first in parameter setting apparatus submodule is according to power and frequency, and adjustment is used for the parameter of the bigness scale examination of occupied bandwidth test; In the parameter setting apparatus second adjustment submodule is according to power and frequency, and adjustment is used for the parameter of the accurate measurement examination of occupied bandwidth test; Transmission submodule in the parameter setting apparatus alternately sends to power computation module with the parameter of bigness scale examination and the parameter of accurate measurement examination.

The present invention has advantages such as test tape is wide, measuring accuracy is high, sweep time is short through the mutual calculating that realizes the input signal occupied bandwidth of the circulation of output computation device and parameter setting apparatus.In addition, the present invention can realize highly versatile through revising testing software on the basis that does not change existing frequency spectrograph hardware configuration.

Description of drawings

Accompanying drawing described herein is used to provide further understanding of the present invention, constitutes the application's a part, and illustrative examples of the present invention and explanation thereof are used to explain the present invention, do not constitute improper qualification of the present invention.In the accompanying drawings:

Fig. 1 is the structured flowchart according to the occupied bandwidth test macro of the embodiment of the invention;

Fig. 2 is the structured flowchart of parameter setting module according to the preferred embodiment of the invention;

Fig. 3 is the flow chart according to the occupied bandwidth method of testing of the embodiment of the invention.

Embodiment

Need to prove that under the situation of not conflicting, embodiment and the characteristic among the embodiment among the application can make up each other.Below with reference to accompanying drawing and combine embodiment to specify the present invention.

The invention provides a kind of occupied bandwidth test macro.Fig. 1 is the structured flowchart according to the occupied bandwidth test macro of the embodiment of the invention; As shown in Figure 1; Comprise output computation device 12, parameter setting apparatus 14 and equipment under test 16, wherein, output computation device 12 comprises power computation module 122 and parameter feedback module 124; Parameter setting apparatus 14 comprises parameter setting module 142 and occupied bandwidth test module 144, is described in detail in the face of its structure down.

Power computation module 122 is used for the parameter according to parameter setting apparatus 14 settings, and calculating is from the power of the input signal of equipment under test 16 and the frequency of input signal occupied bandwidth; Parameter feedback module 124 is connected to power computation module 122, is used for to parameter setting apparatus 14 feedback power and frequency; Parameter setting module 142 is connected to parameter feedback module 124, is used for power and frequency according to parameter feedback module 124 feedbacks, the parameter that adjustment is set, and send to power computation module 122; Occupied bandwidth test module 144 is connected to parameter feedback module 124, is used for power and frequency according to parameter feedback module 124 feedbacks, calculates the occupied bandwidth of input signal.

In the correlation technique, can't satisfy the demand of scan width and resolution bandwidth simultaneously, thereby sweep time is longer.In the embodiment of the invention,, have advantages such as test tape is wide, measuring accuracy is high, sweep time is short through the mutual calculating that realizes the input signal occupied bandwidth of the circulation of output computation device and parameter setting apparatus.In addition, the present invention can realize highly versatile through revising testing software on the basis that does not change existing frequency spectrograph hardware configuration.

Preferably, parameter setting module 142 comprises the first adjustment submodule, 1422, the second adjustment submodules 1424 and sends submodule 1426, is described in detail in the face of its structure down.

The first adjustment submodule 1422 is connected to parameter feedback module 124, is used for power and frequency according to parameter feedback module 124 feedbacks, and adjustment is used for the parameter of the bigness scale examination of occupied bandwidth test; The second adjustment submodule 1424 is connected to parameter feedback module 124, is used for power and frequency according to parameter feedback module 124 feedbacks, and adjustment is used for the parameter of the accurate measurement examination of occupied bandwidth test; Send submodule 1426; Be connected to the first adjustment submodule 1422 and the second adjustment submodule 1424, be used for the parameter that the accurate measurement with the parameter of the bigness scale examination of first adjustment submodule 1422 adjustment and 1424 adjustment of the second adjustment submodule tries and alternately send to power computation module 122.

Preferably, the first adjustment submodule 1422 is according to following mode, and adjustment is used for the parameter of the bigness scale examination of occupied bandwidth test: f _R11=f _R21, f _R12=f _R22, N ₁＞1, f wherein _R11Be output low frequency section initial frequency, f _R12Be that the output low frequency section stops frequency, f _R21Be output high band initial frequency, f _R22Be that the output high band stops frequency, N ₁It is the output frequency segments.

Preferably, the second adjustment submodule 1424 is according to following mode, and adjustment is used for the parameter of the accurate measurement examination of occupied bandwidth test:

Wherein, f _R11Be input low-frequency range initial frequency, f _R12Be that the input low-frequency range stops frequency, m _R1Be the useless power proportions of input low-frequency range, m _R2Be that the useless power proportions of input high band, Nc are incoming frequency segments, P ₁～P _NBe each frequency band power of input, f ₁Be low frequency, the f of input occupied bandwidth ₂Be high frequency points, the m of input occupied bandwidth _P1Be the useless power proportions of output low frequency section, m _P2Be that the useless power proportions of output high band, fp11 are output low frequency section initial frequency, f _P12Be that the output low frequency section stops frequency, f _P21Be output high band initial frequency, f _P22Be that the output high band stops frequency, N ₂It is the output frequency segments.

Preferably, the measurement result the n time measurement is BW _RBW1, f _R11, f _R12, f _R21, f _R22, N ₁, m _R1, m _R2Situation under, the measurement result of measuring for the n+1 time is: BW _RBW2, f _P11, f _P12, f _P21, f _P22, N ₂, m _P1, m _P2, wherein, BW _RBW1Be input resolution bandwidth, the f of the n time measurement _R11Be input low-frequency range initial frequency, the f of the n time measurement _R12The input low-frequency range that is the n time measurement stops frequency, f _R21Be input high band initial frequency, the f of the n time measurement _R22The input high band that is the n time measurement stops frequency, N ₁Be incoming frequency segments, the m of the n time measurement _R1Be the useless power proportions of input low-frequency range, the m of the n time measurement _R2Be the useless power proportions of input high band, the BW of the n time measurement _RBW2Be input resolution bandwidth, the f of the n+1 time measurement _P11Be input low-frequency range initial frequency, the f of the n+1 time measurement _P12The input low-frequency range that is the n+1 time measurement stops frequency, f _P21Be input high band initial frequency, the f of the n+1 time measurement _P22The input high band that is the n+1 time measurement stops frequency, N ₂Be incoming frequency segments, the m of the n+1 time measurement _P1Be the useless power proportions of input low-frequency range, the m of the n+1 time measurement _P2It is the useless power proportions of input high band of the n+1 time measurement.

Need to prove; The present invention utilizes the big resolution bandwidth of bigness scale examination to test whole signal bandwidth power; And the little resolution bandwidth that utilizes the accurate measurement examination comes the signal power of test frequency section; Confirm the useless power proportions of accurate measurement examination according to the proportionate relationship of frequency band signal power, the occupied bandwidth of the power calculation picked up signal that carries out through accurate measurement examination output parameter.

Preferably, the segmented mode of incoming frequency is comprised one of following: linear segmented mode, non-linear segmented mode.

Preferably, the resolution bandwidth of accurate measurement examination is less than the resolution bandwidth of bigness scale examination.

Preferably, parameter feedback module 124 feeds back to parameter setting module 142 with the test parameter of power computation module 122.

Preferably, relation below the test parameter of feedback satisfies:

Wherein, N is incoming frequency segments, BW _RBWBe input resolution bandwidth, f ₁₁Be input low-frequency range initial frequency, f ₁₂Be that the input low-frequency range stops frequency, f ₂₁Be input high band initial frequency, f ₂₂Be that the input high band stops frequency, m ₁Be the useless power proportions of input low-frequency range, m ₂Be the useless power proportions of input high band, f ₁Be output occupied bandwidth low frequency point, f ₂Be output occupied bandwidth high-frequency point, P ₁～P _NBe that each frequency band power of output, Nc are the output frequency segments.

Preferably, equipment under test 16 comprises one of following: cellular basestation, cellular handset.

To combine instance that the implementation procedure of the embodiment of the invention is described in detail below.

Preferred embodiment one

This preferred embodiment one adopts segmented mode test occupied bandwidth.

For present LTE-A system, when adopting carrier aggregation technology, signal bandwidth can reach 100MHz.

As shown in Figure 1, the occupied bandwidth test macro of this preferred embodiment one comprises output computation device 12 and parameter setting apparatus 14, and connects through low loss cable.During test, the output computation device 12 in the occupied bandwidth test macro and equipment under test 16 link to each other through low loss cable.

Preferably, output computation device 12 can adopt frequency spectrograph to realize that parameter setting apparatus 14 can adopt computer realization.

Fig. 2 is the structured flowchart of parameter setting module according to the preferred embodiment of the invention; As shown in Figure 2; Comprise bigness scale examination (corresponding to the above-mentioned first adjustment submodule), accurate measurement examination (corresponding to the above-mentioned second adjustment submodule) and parameter output, wherein the input signal of parameter setting is from said accurate measurement examination input, and said accurate measurement examination exports said parameter output to; Said bigness scale examination exports said parameter output and the examination of said accurate measurement to, and said parameter setting output signal is the output of parameter output.

Parameter setting is alternately exported the output parameter of bigness scale examination and accurate measurement examination and is given power calculation; Its input comprises occupied bandwidth low frequency point f1, occupied bandwidth high-frequency point f2, each frequency band power P1～PN and the output frequency segments Nc of power calculation feedback; If Nc=1; The expression power calculation has been accomplished dependence test according to accurate measurement examination output parameter, and occupied bandwidth is f2-f1; If Nc＞1; The expression power calculation has been accomplished dependence test according to bigness scale examination output parameter; The low frequency f2 that stops frequency f r12, the useless power proportions mr1 of input low-frequency range, the useless power proportions mr2 of input high band, incoming frequency segments Nc, the low frequency f1 that imports each frequency band power P1～PN, input occupied bandwidth, input occupied bandwidth according to input low-frequency range initial frequency fr11, input low-frequency range confirms that the useless power proportions mp1 of output low frequency section, the useless power proportions mp2 of output high band, output low frequency section initial frequency fp11, output low frequency section stop frequency f p12, output high band initial frequency fp21, output high band and stop frequency f p22, output frequency segments N2, relation below parameter satisfies:

$f_{r12}-f_{r11}=\underset{j=1}{\overset{N_c}{\mathrm{\Σ}}}(f_{r12}^j-f_{r11}^j),$

Nf1=j (when $f_{r11}^j\≤f_1\≤f_{r12}^j,$ J ∈ 1～N _c),

Nf2=j (when $f_{11}^j\≤f_2\≤f_{12}^j,$ J ∈ 1～N _c),

$m_{p1}=(m_{r1}\×\underset{j=1}{\overset{N_c}{\mathrm{\Σ}}}{P}_j-\underset{j=1}{\overset{\mathrm{Nf}1-1}{\mathrm{\Σ}}}{P}_j)/P_{\mathrm{Nf}1},$

$m_{p2}=(m_{r2}\×\underset{j=1}{\overset{N_c}{\mathrm{\Σ}}}{P}_j-\underset{j=\mathrm{Nf}2+1}{\overset{N_c}{\mathrm{\Σ}}}{P}_j)/P_{\mathrm{Nf}2},$

$f_{p11}=f_{r11}^{\mathrm{Nf}1},$ $f_{p12}=f_{r12}^{\mathrm{Nf}1},$ $f_{p21}=f_{r11}^{\mathrm{Nf}2},$ $f_{p22}=f_{r12}^{\mathrm{Nf}2},$ N ₂＝1。

The resolution bandwidth BWRBW2 of the accurate measurement examination of parameter setting is less than the resolution bandwidth BWRBW1 of bigness scale examination.

Working in 1900MHz～2000MHz frequency range, adopt carrier aggregation technology below, support that the LTE-A base station of 100MHz bandwidth output signal is an example, describe the method for testing of big bandwidth signal occupied bandwidth in conjunction with Fig. 1 and Fig. 2.

Said LTE-A base station is connected to the power statistic in the test macro, and test macro is set and the LTE-A base station parameter makes test macro and LTE-A base station be in normal operating conditions, LTE-A base station output signal remains unchanged.

Regulate the frequency segmentation of the bigness scale examination of parameter setting and count N1, resolution bandwidth BWRBW1, low-frequency range initial frequency fr11, low-frequency range termination frequency f r12, high band initial frequency fr21, high band termination frequency f r22, the useless power proportions mr1 of low-frequency range, the useless power proportions mr2 of high band.

For example: frequency segmentation is counted N1 and is set to 10; Resolution bandwidth BWRBW1 is set to 300KHz; Low-frequency range initial frequency fr11 and high band initial frequency fr21 are set to 1860MHz; Low-frequency range stops frequency f r12 and high band termination frequency f r22 is set to 2060MHz, and useless power proportions mr1 of low-frequency range and the useless power proportions mr2 of high band are set to 0.5%.

If power calculation output frequency segments Nc is greater than 1; According to the test result of power calculation feedback, resolution bandwidth BWRBW2, low-frequency range initial frequency fp11, the low-frequency range of regulating the accurate measurement examination of parameter setting stop frequency f p12, high band initial frequency fp21, high band termination frequency f p22, the useless power proportions mp1 of low-frequency range, the useless power proportions mp2 of high band.

For example: resolution bandwidth BWRBW1 is set to 15KHz.

If power calculation output frequency segments Nc equals 1, then the occupied bandwidth of signal is the low frequency f1 that high frequency points f2 that power calculation output occupied bandwidth equals occupied bandwidth deducts occupied bandwidth.

One of can be in the following manner the control measuring accuracy: it is constant to keep the frequency segmentation of bigness scale examination to count N1, the resolution bandwidth BWRBW1 that the resolution bandwidth BWRBW2 that regulates the accurate measurement examination and bigness scale try; It is constant that the resolution bandwidth BWRBW1 of maintenance bigness scale examination and the frequency segmentation of bigness scale examination are counted N1, regulates the resolution bandwidth BWRBW2 of accurate measurement examination; Keep the resolution bandwidth BWRBW2 of accurate measurement examination constant, the resolution bandwidth BWRBW1 of adjusting bigness scale examination and the frequency segmentation of bigness scale examination are counted N1 and are realized.

One of can be in the following manner the control testing time: it is constant to keep the frequency segmentation of bigness scale examination to count N1, the resolution bandwidth BWRBW1 that the resolution bandwidth BWRBW2 that regulates the accurate measurement examination and bigness scale try; The resolution bandwidth BWRBW1 that the frequency segmentation that keeps bigness scale to try is counted N1 and bigness scale examination is constant, and the resolution bandwidth BWRBW2 that regulates the accurate measurement examination realizes.

If the signal occupied bandwidth greater than 100MHz, then can be realized through the resolution bandwidth BWRBW2 of reduction accurate measurement examination and the resolution bandwidth BWRBW1 of bigness scale examination.

Making occupied bandwidth be not more than 100MHz is in order to satisfy the requirement of standard.

Can obtain the value of big bandwidth signal occupied bandwidth through said method.

The embodiment of the invention also provides a kind of occupied bandwidth method of testing, and this occupied bandwidth method of testing can realize based on above-mentioned occupied bandwidth test macro.Fig. 3 is the flow chart according to the occupied bandwidth method of testing of the embodiment of the invention, and is as shown in Figure 3, comprises that following step S302 is to step S308.

Step S302, the parameter that the power computation module in the output computation device is set according to parameter setting apparatus, calculating is from the power of the input signal of equipment under test and the frequency of input signal occupied bandwidth.

Step S304, the parameter feedback module in the output computation device is to parameter setting apparatus feedback power and frequency.

Step S306, the parameter setting module in the parameter setting apparatus adjust the parameter of setting, and send to power computation module according to power and frequency.

Step S308, the occupied bandwidth test module in the parameter setting apparatus calculate the occupied bandwidth of input signal according to power and frequency.

Preferably; Parameter setting module in the parameter setting apparatus is according to power and frequency; The parameter that adjustment is set, and send to power computation module and comprise: the adjustment of first in parameter setting apparatus submodule is according to power and frequency, and adjustment is used for the parameter of the bigness scale examination of occupied bandwidth test; In the parameter setting apparatus second adjustment submodule is according to power and frequency, and adjustment is used for the parameter of the accurate measurement examination of occupied bandwidth test; Transmission submodule in the parameter setting apparatus alternately sends to power computation module with the parameter of bigness scale examination and the parameter of accurate measurement examination.

Need to prove that the occupied bandwidth method of testing of describing among the method embodiment is corresponding to above-mentioned system embodiment, its concrete implementation procedure had been carried out detailed description in system embodiment, repeat no more at this.

Preferably, before step S302, said method also comprises: equipment under test 16 is connected to the occupied bandwidth test macro, and makes occupied bandwidth test macro and equipment under test be in normal operating conditions, equipment under test output signal remains unchanged.

Preferably, the parameter setting module in the parameter setting apparatus is according to power and frequency, and the parameter that adjustment is set comprises: the unwanted signal proportion of equipment under test output signal is set, the gross power of test equipment under test output signal and the useless power of height frequency range; Regulate the occupied bandwidth of parameter testing equipment under test output signal.

Preferably, the unwanted signal proportion that equipment under test output signal is set is to realize through useless power proportions mr1 of low-frequency range and the useless power proportions mr2 of high band that bigness scale examination in the said test macro is set.

Preferably, regulating parameter is to count the resolution bandwidth BWRBW1 of N1, bigness scale examination and the resolution bandwidth BWRBW2 of accurate measurement examination realizes through the frequency segmentation that bigness scale examination in the said test macro is set.

Need to prove; Can in computer system, carry out in the step shown in the flow chart of accompanying drawing such as a set of computer-executable instructions; And; Though logical order has been shown in flow chart, in some cases, can have carried out step shown or that describe with the order that is different from here.

In sum, according to the abovementioned embodiments of the present invention, a kind of occupied bandwidth test macro and method are provided.The present invention has advantages such as test tape is wide, measuring accuracy is high, sweep time is short through the mutual calculating that realizes the input signal occupied bandwidth of the circulation of output computation device and parameter setting apparatus.In addition, the present invention can realize highly versatile through revising testing software on the basis that does not change existing frequency spectrograph hardware configuration.

Obviously, it is apparent to those skilled in the art that above-mentioned each module of the present invention or each step can realize with the general calculation device; They can concentrate on the single calculation element; Perhaps be distributed on the network that a plurality of calculation element forms, alternatively, they can be realized with the executable program code of calculation element; Thereby; Can they be stored in the storage device and carry out, perhaps they are made into each integrated circuit modules respectively, perhaps a plurality of modules in them or step are made into the single integrated circuit module and realize by calculation element.Like this, the present invention is not restricted to any specific hardware and software combination.

The above is merely the preferred embodiments of the present invention, is not limited to the present invention, and for a person skilled in the art, the present invention can have various changes and variation.All within spirit of the present invention and principle, any modification of being done, be equal to replacement, improvement etc., all should be included within protection scope of the present invention.

Claims (11)

1. an occupied bandwidth test macro is characterized in that, comprises output computation device, parameter setting apparatus and equipment under test, wherein,

Said output computation device comprises:

Power computation module is used for the parameter according to said parameter setting apparatus setting, and calculating is from the power of the input signal of equipment under test and the frequency of said input signal occupied bandwidth;

The parameter feedback module is used for feeding back said power and said frequency to said parameter setting apparatus;

Said parameter setting apparatus comprises:

Parameter setting module is used for adjusting the parameter of said setting according to said power and said frequency, and sends to said power computation module;

The occupied bandwidth test module is used for calculating the occupied bandwidth of said input signal according to said power and said frequency.

2. system according to claim 1 is characterized in that, said parameter setting module comprises:

The first adjustment submodule is used for according to said power and said frequency, and adjustment is used for the parameter of the bigness scale examination of occupied bandwidth test, and will test the frequency range segmentation;

The second adjustment submodule is used for according to said power and said frequency, and adjustment is used for the parameter of the accurate measurement examination of occupied bandwidth test;

Send submodule, be used for the parameter of said bigness scale examination and the parameter of said accurate measurement examination are alternately sent to said power computation module.

3. system according to claim 2 is characterized in that, the said first adjustment submodule is according to following mode, and adjustment is used for the parameter of the bigness scale examination of occupied bandwidth test:

f _R11=f _R21, f _R12=f _R22, N ₁＞1, f wherein _R11Be output low frequency section initial frequency, f _R12Be that the output low frequency section stops frequency, f _R21Be output high band initial frequency, f _R22Be that the output high band stops frequency, N ₁It is the output frequency segments.

4. system according to claim 2 is characterized in that, the said second adjustment submodule is according to following mode, and adjustment is used for the parameter of the accurate measurement examination of occupied bandwidth test:

Wherein, f _R11Be input low-frequency range initial frequency, f _R12Be that the input low-frequency range stops frequency, m _R1Be the useless power proportions of input low-frequency range, m _R2Be the useless power proportions of input high band, N _cBe incoming frequency segments, P ₁～P _NBe each frequency band power of input, f ₁Be low frequency, the f of input occupied bandwidth ₂Be high frequency points, the m of input occupied bandwidth _P1Be the useless power proportions of output low frequency section, m _P2Be the useless power proportions of output high band, f _P11Be output low frequency section initial frequency, f _P12Be that the output low frequency section stops frequency, f _P21Be output high band initial frequency, f _P22Be that the output high band stops frequency, N ₂It is the output frequency segments.

5. system according to claim 2 is characterized in that,

Measurement result the n time measurement is BW _RBW1, f _R11, f _R12, f _R21, f _R22, N ₁, m _R1, m _R2Situation under, the measurement result of measuring for the n+1 time is: BW _RBW2, f _P11, f _P12, f _P21, f _P22, N ₂, m _P1, m _P2,

Wherein, BWR _BW1Be input resolution bandwidth, the f of the n time measurement _R11Be input low-frequency range initial frequency, the f of the n time measurement _R12The input low-frequency range that is the n time measurement stops frequency, f _R21Be input high band initial frequency, the f of the n time measurement _R22The input high band that is the n time measurement stops frequency, N ₁Be incoming frequency segments, the m of the n time measurement _R1Be the useless power proportions of input low-frequency range, the m of the n time measurement _R2Be the useless power proportions of input high band, the BWR of the n time measurement _BW2Be input resolution bandwidth, the f of the n+1 time measurement _P11Be input low-frequency range initial frequency, the f of the n+1 time measurement _P12The input low-frequency range that is the n+1 time measurement stops frequency, f _P21Be input high band initial frequency, the f of the n+1 time measurement _P22The input high band that is the n+1 time measurement stops frequency, N ₂Be incoming frequency segments, the m of the n+1 time measurement _P1Be the useless power proportions of input low-frequency range, the m of the n+1 time measurement _P2It is the useless power proportions of input high band of the n+1 time measurement.

6. system according to claim 2 is characterized in that, the segmented mode of incoming frequency is comprised one of following: linear segmented mode, non-linear segmented mode.

7. system according to claim 2 is characterized in that, the resolution bandwidth of said accurate measurement examination is less than the resolution bandwidth of said bigness scale examination.

8. system according to claim 2 is characterized in that, said transmission submodule also is used for the parameter of said bigness scale examination is sent to the said second adjustment submodule.

9. system according to claim 1 is characterized in that, relation below the parameter of said parameter feedback module feedback satisfies:

Wherein, N is incoming frequency segments, BW _RBWBe input resolution bandwidth, f ₁₁Be input low-frequency range initial frequency, f ₁₂Be that the input low-frequency range stops frequency, f ₂₁Be input high band initial frequency, f ₂₂Be that the input high band stops frequency, m ₁Be the useless power proportions of input low-frequency range, m ₂Be the useless power proportions of input high band, f ₁Be low frequency point, the f of output occupied bandwidth ₂Be high-frequency point, the P of output occupied bandwidth ₁～P _NBe each frequency band power of output, N _cIt is the output frequency segments.

10. an occupied bandwidth method of testing is characterized in that, comprising:

The parameter that power computation module in the said output computation device is set according to said parameter setting apparatus, calculating is from the power of the input signal of equipment under test and the frequency of said input signal occupied bandwidth;

Parameter feedback module in the said output computation device feeds back said power and said frequency to parameter setting apparatus;

Parameter setting module in the said parameter setting apparatus is adjusted the parameter of said setting according to said power and said frequency, and sends to said power computation module;

Occupied bandwidth test module in the said parameter setting apparatus calculates the occupied bandwidth of said input signal according to said power and said frequency.

11. method according to claim 10 is characterized in that, the parameter setting module in the said parameter setting apparatus is adjusted the parameter of said setting according to said power and said frequency, and sends to said power computation module and comprise:

In the said parameter setting apparatus first adjustment submodule is according to said power and said frequency, and adjustment is used for the parameter of the bigness scale examination of occupied bandwidth test;

In the said parameter setting apparatus second adjustment submodule is according to said power and said frequency, and adjustment is used for the parameter of the accurate measurement examination of occupied bandwidth test;

Transmission submodule in the said parameter setting apparatus alternately sends to said power computation module with the parameter of said bigness scale examination and the parameter of said accurate measurement examination.

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