CN101377409A - Method for detecting surface appearance of glasses lens - Google Patents
Method for detecting surface appearance of glasses lens Download PDFInfo
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- CN101377409A CN101377409A CNA2007102015001A CN200710201500A CN101377409A CN 101377409 A CN101377409 A CN 101377409A CN A2007102015001 A CNA2007102015001 A CN A2007102015001A CN 200710201500 A CN200710201500 A CN 200710201500A CN 101377409 A CN101377409 A CN 101377409A
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Abstract
The invention provides a surface appearance detecting method of lens, comprising the following steps: the detecting lens which has a detecting surface is provided, and reflection increasing film with uniform thickness is coated on the detecting surface. The appearance detection for the detecting lens with reflection increasing film should be processed by reflection typed interferometer. The lens surface appearance detecting method in the technical proposal has high accuracy.
Description
Technical field
The present invention relates to a kind of detection technique of eyeglass, relate in particular to a kind of lens surface appearance detecting method.
Background technology
The processing technology of conventional lenses generally includes operations such as selection, cutting, round as a ball, moulding, thickness mill and polishing.Selection is meant selects suitable material to be processed into eyeglass, cutting action is meant the processing base substrate that cuts suitable size after the selection from the optical glass base substrate of monoblock, round as a ball being meant utilizes emery wheel to wear into the process of circular profile the base substrate after the cutting, moulding is meant that modes such as adopting turning, grinding is processed into the base substrate after round as a ball the sphere or the aspheric process of predetermined bend radius, the purpose of thickness mill and polishing process is that further retrofit is carried out on the optical module surface after the moulding, the knife mark on the elimination eyeglass, slight crack layer etc.In polishing process and after the polishing, need the surface topography of traditional glass eyeglass be detected, adhere to specification to guarantee the eyeglass of making.Resin lens also needs the lens surface pattern is detected in injection moulding, after wiping out cast gate.
Gagnon, people such as N. were published in April, 2005; Microwaves, Antennas and Propagation, the document of IEEProceedings " Accurate phase measurement of passive non-reciprocalquasi-optical components " has disclosed the method for the passive collimating optical element shape of a kind of accurate measurement nonreciprocal.As a rule, can adopt testplate to detect, then need adopt reflective interferometer to detect the higher eyeglass of surface topography accuracy requirement to the lower eyeglass of surface topography accuracy requirement.
Reflective interferometer comprises light source, light-splitting device and reference surface, wherein, the light beam that light-splitting device sends light source is divided into the detection light beam of directive with reference to the reference beams and the directive examined object on surface, be referenced the reference beams of surface reflection and produced interference pattern by the detection light beam that examined object reflects because of phase differential, reflective interferometer can be analyzed the surface topography of object to be detected according to interference pattern.Reflective interferometer belongs to non-contact measuring device, not only can not damage being detected object surfaces, and testing result has high resolution, can detect and analyzing and processing bigger surface.Therefore, only need object to be detected must have certain reflectivity, can reflect enough light beams to form interference pattern clearly, reflective interferometer can analyze testing result comparatively accurately.
Yet eyeglass is made by glass or resin usually, and the reflectivity of light beam is no more than 7% usually.That is to say, when adopting reflective interferometer to detect the surface topography of eyeglass, only there is the detection light beam of minute quantity can be reflected back toward reflective interferometer direction, the detection light beam that those are reflected be not enough to form interference pattern or be not enough to form clearly, analyzable interference pattern, thereby cause reflective interferometer can not analyze or can not accurately analyze the surface topography of eyeglass.
Therefore, be necessary to provide a kind of lens surface appearance detecting method with high accuracy.
Summary of the invention
Below, will a kind of lens surface appearance detecting method with high accuracy be described with embodiment.
A kind of lens surface appearance detecting method comprises step:
Eyeglass to be detected is provided, and it has a surface to be detected;
Increase anti-film uniformly in described coating surface thickness to be detected;
With reflective interferometer eyeglass to be detected is coated with the surface to be detected that increases anti-film and carries out the pattern detection.
The lens surface appearance detecting method of the technical program comprises that one plates the step that increases anti-film on the surface to be detected of eyeglass to be detected, to increase considerably the reflectivity of eyeglass to be detected, form enough interference pattern clearly thereby make reflective interferometer can receive more folded light beam.Therefore, reflective interferometer can be made than accurate analytical results the surface topography of eyeglass to be detected according to this enough interference pattern clearly, that is, the lens surface appearance detecting method of the technical program has improved the accuracy that the lens surface pattern is detected.
Description of drawings
Fig. 1 is the process flow diagram of the lens surface appearance detecting method that provides of the technical program embodiment.
Fig. 2 is the synoptic diagram of the eyeglass to be detected that provides of the technical program embodiment.
Fig. 3 is the synoptic diagram behind the anti-film of eyeglass to be detected plating increasing that provides of the technical program embodiment.
Light path synoptic diagram when Fig. 4 is the detection that provides of the technical program embodiment eyeglass to be detected.
Embodiment
Below in conjunction with drawings and Examples, the lens surface appearance detecting method of the technical program is described in further detail.
See also Fig. 1, the lens surface appearance detecting method that the technical program embodiment provides may further comprise the steps:
The first step provides eyeglass to be detected, and it has surface to be detected.
Described eyeglass to be detected can for cut, the glass mirror of round as a ball, moulding, thickness mill and polishing, also can also can carry out the complex optics of preparatory processing moulding for other for having wiped out the resin lens of cast gate after the injection moulding.
See also Fig. 2, the eyeglass to be detected 10 that present embodiment provides is the glass mirror after polishing.This eyeglass 10 to be detected comprises main part 11 and periphery 12.Described main part 11 is for playing the part of optical effect in the eyeglass.Described periphery 12 is circular for not playing the part of optical effect in the eyeglass, surrounds and connection main part 11.
Described main part 11 has opposite first 111 and second surface 112, and described first surface 111, second surface 112 all can be surface to be detected.In the present embodiment, be example as surface to be detected only, the lens surface appearance detecting method that present embodiment provides is described with first surface 111.
In second step, increase anti-film uniformly in described coating surface thickness to be detected.
See also Fig. 3, plating one increases anti-film 20 on first surface 111.Describedly increase anti-film 20 thickness uniformities, therefore, the surface topography that increases anti-film 20 promptly is equal to the surface topography of first surface 111.And the thickness that increases anti-film 20 is between 60 ~ 500 nanometers, causes substantial effect with the surface accuracy to first surface 111 not.
The described reflectivity that increases anti-film 20 promptly, increases 20 pairs of detections of anti-film light beam and has higher reflection potential more than or equal to 20%.
Describedly increase anti-film 20 and can be single-layer membrane structure, and the refractive index of described monofilm is greater than the refractive index of eyeglass 10 to be detected.For example, the refractive index of glass mirror is generally about 1.5, and increasing anti-film 20 can be that about 2.35 zinc sulphide rete, refractive index are that about 2.6 titanium oxide film layer or refractive index are about 2.2 tantalum oxide rete for refractive index.Described refractive index should be (k λ/2-λ/4) greater than the blooming of the single-layer membrane structure of eyeglass 10 to be detected, and wherein, k is a natural number, and λ is for detecting the wavelength of light beam.
Describedly increase anti-film 20 and also can be by the uniform high refractive index layer of thickness and the low-index film multi-layer film structure that forms of stack alternately.For example, described multi-layer film structure can be that about 2.35 zinc sulphide rete and refractive index are that about 1.38 magnesium fluoride rete alternately is formed by stacking by refractive index, and described multi-layer film structure can be that about 2.2 tantalum oxide rete and refractive index are that about 1.48 membranous layer of silicon oxide alternately is formed by stacking by refractive index also.The number of plies of described multi-layer film structure is advisable with 4 ~ 20 layers, and wherein the blooming of high refractive index layer, low-index film all can be λ/4, and wherein, λ is for detecting the wavelength of light beam.
Increase the method that anti-film 20 is plated on the first surface 111 and can be heated type evaporation, ion assist type evaporation or radio frequency sputter described.
In the 3rd step, with reflective interferometer described eyeglass to be detected is coated with the surface to be detected that increases anti-film and carries out the pattern detection.
Described reflective interferometer can be reflection white-light interferometer or reflective laser interferometer, and it comprises light source (figure does not show), light-splitting device (figure does not show) and reference surface (figure does not show).The light beam that light-splitting device sends light source is divided into the detection light beam of directive with reference to the first surface 111 of the reference beams on surface and directive eyeglass 10 to be detected.The reference table mask has higher reflectivity, can fully reflect reference beams.First surface 111 is coated with and increases anti-film 20, and it has the reflectivity more than 20%, can fully reflect the detection light beam, as shown in Figure 4.Thereby the detection light beam that is referenced the reference beams of surface reflection and is increased 20 reflections of anti-film can form enough interference pattern clearly because of phase differential.Reflective interferometer is the surface topography of first surface 111 according to the surface topography that interference pattern analysis clearly increases anti-film 20, can obtain than accurate analytical results.
Certainly, dissimilar interferometers has different detection performances, and the interferometer that has can detect than the microscopic defect on the flat surface, and the interferometer that has can detect comparatively coarse surface topography, and the interferometer that has can detect the curvature on whole surface.No matter be the interferometer of which kind of type, the detection method that provides according to the technical program only is provided, plating one increases anti-film on the surface to be detected of eyeglass to be detected, can increase considerably the reflectivity of eyeglass to be detected, thereby make reflective interferometer can receive more folded light beam and form enough interference pattern clearly, thereby improve the accuracy that interferometer detects the lens surface pattern.
The lens surface appearance detecting method of the technical program is applicable to the sampling Detection that becomes batch sample, and can have testing result more accurately.
Be understandable that, for the person of ordinary skill of the art, can make other various corresponding changes and distortion by technical conceive according to the present invention, and all these change the protection domain that all should belong to claim of the present invention with distortion.
Claims (10)
- [claim 1] a kind of lens surface appearance detecting method comprises step:Eyeglass to be detected is provided, and it has surface to be detected;Increase anti-film uniformly in described coating surface thickness to be detected;With reflective interferometer eyeglass to be detected is coated with the surface to be detected that increases anti-film and carries out the pattern detection.
- [claim 2] lens surface appearance detecting method as claimed in claim 1 is characterized in that, the described reflectivity of anti-film that increases is more than or equal to 20%.
- [claim 3] lens surface appearance detecting method as claimed in claim 1 is characterized in that, the described thickness that increases anti-film is 60 ~ 500 nanometers.
- [claim 4] lens surface appearance detecting method as claimed in claim 1, it is characterized in that the method that the coating surface to be detected that is set forth in increases anti-film is to be selected from a kind of in heated type evaporation, electron gun heated type evaporation, ion assist type evaporation and the radio frequency sputter.
- [claim 5] lens surface appearance detecting method as claimed in claim 1 is characterized in that, described to increase anti-film be monofilm, and the refractive index of described monofilm is greater than the refractive index of eyeglass to be detected.
- [claim 6] lens surface appearance detecting method as claimed in claim 5 is characterized in that, the material of described monofilm is to be selected from a kind of in zinc sulphide, titania and the tantalum oxide.
- [claim 7] lens surface appearance detecting method as claimed in claim 5 is characterized in that, the blooming of described monofilm is (k λ/2-λ/4), and wherein, k is a natural number, and λ is for detecting the wavelength of light beam.
- [claim 8] lens surface appearance detecting method as claimed in claim 1 is characterized in that, the described multi-layer film structure of anti-film for alternately being superposeed and form by high refractive index layer and low-index film that increase.
- [claim 9] lens surface appearance detecting method as claimed in claim 8 is characterized in that, the material of described low-index film is magnesium fluoride or monox, and the material of described high refractive index layer is zinc sulphide, titania or tantalum oxide.
- [claim 10] lens surface appearance detecting method as claimed in claim 1 is characterized in that, described reflective interferometer is reflection white-light interferometer or reflective laser interferometer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2007102015001A CN101377409A (en) | 2007-08-28 | 2007-08-28 | Method for detecting surface appearance of glasses lens |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2007102015001A CN101377409A (en) | 2007-08-28 | 2007-08-28 | Method for detecting surface appearance of glasses lens |
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| CN101377409A true CN101377409A (en) | 2009-03-04 |
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| CNA2007102015001A Pending CN101377409A (en) | 2007-08-28 | 2007-08-28 | Method for detecting surface appearance of glasses lens |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103644852A (en) * | 2013-12-11 | 2014-03-19 | 江苏大学 | Lens film thickness automatic detection system |
| CN103765185A (en) * | 2011-06-16 | 2014-04-30 | 庄臣及庄臣视力保护公司 | Method of determining the optimal wavelength for inspecting ophthalmic lenses |
| CN104520671B (en) * | 2012-07-31 | 2017-04-26 | 埃西勒国际通用光学公司 | Method and system for identification of given geometrical feature of optical component |
| CN115096849A (en) * | 2022-08-24 | 2022-09-23 | 江苏浩纳光电股份有限公司 | Nondestructive testing device for refractive index of optical lens |
-
2007
- 2007-08-28 CN CNA2007102015001A patent/CN101377409A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103765185A (en) * | 2011-06-16 | 2014-04-30 | 庄臣及庄臣视力保护公司 | Method of determining the optimal wavelength for inspecting ophthalmic lenses |
| CN103765185B (en) * | 2011-06-16 | 2016-10-12 | 庄臣及庄臣视力保护公司 | The method determining optimal wavelength for checking ophthalmic lens |
| CN104520671B (en) * | 2012-07-31 | 2017-04-26 | 埃西勒国际通用光学公司 | Method and system for identification of given geometrical feature of optical component |
| CN103644852A (en) * | 2013-12-11 | 2014-03-19 | 江苏大学 | Lens film thickness automatic detection system |
| CN115096849A (en) * | 2022-08-24 | 2022-09-23 | 江苏浩纳光电股份有限公司 | Nondestructive testing device for refractive index of optical lens |
| CN115096849B (en) * | 2022-08-24 | 2023-01-06 | 江苏浩纳光电股份有限公司 | Nondestructive testing device for refractive index of optical lens |
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Application publication date: 20090304 |